MMA2301D Motorola Sensor Device Data
4
PRINCIPLE OF OPERATION
The Motorola accelerometer is a surface-micromachined
integrated-circuit accelerometer.
The device consists of a surface micromachined capacitive
sensing cell (g-cell) and a CMOS signal conditioning ASIC
contained in a single integrated circuit package. The sensing
element is sealed hermetically at the wafer level using a bulk
micromachined cap wafer.
The g-cell is a mechanical structure formed from
semiconductor materials (polysilicon) using semiconductor
proc esses (maski ng and etch ing). It c an be model ed as a se t of
beams a tta ched to a mov able centr al mass t hat move b etween
fixed beams. The movable beams can be deflected from their
rest position by subjecting the system to an acceleration
(Figure 2).
As the beams attached to the central mass move, the
dist ance from them to the fixed beams on one side will increase
by the same amount that the distance to the fixed beams on the
other side decreases. The change in distance is a measure of
acceleration.
The g-cell plates form two back-to-back capacitors
(Figure 2). As the central mass moves with acceleration, the
dist anc e betw e en the bea ms chan ge and each capac ito r' s
value will change, (C = NAε/D). Where A is the area of the
facing side of the beam, ε is the dielectric constan t, D is the
dist anc e betw e en the bea ms , and N is the numbe r of beams .
The CMOS ASIC uses switched capacitor techniques to
measur e the g-cell capac itors and extract the accel eration data
from the dif feren ce be twee n the two ca pac itors. The AS IC al so
signal conditions and filters (switched capacitor) the signal,
providing a high level output voltage that is ratiometric and
proportional to acceleration.
Figure 2. Simplified Transducer Physical Model versus
Transd ucer Physi cal Model
SPECIAL FEATURES
Filtering
The Motorola accelerometers contain an onboard 4-pole
switched capacitor filter. A Bessel implementation is used
because it provides a maximally flat delay response (linear
phase) th us preserving puls e shape integrit y . Because the fil ter
is realized using switched capacitor techniques, there is no
requirement for external passive components (resistors and
capacitors) to set the cut-off frequency.
Self-Test
The sensor provides a self-test feature that allows the
verification of the mechanical and electrical integrity of the
accelerometer at any time before or after installation. This
feature is critical in applications such as automotive airbag
systems where system integrity must be ensured over the life of
the vehicle. A fourth plate is used in the g-cell as a self-test
plate. When the user applies a logic high input to the self-test
pin, a calibrated potential is applied across the self-test plate
and the moveable plate. The resulting electrostatic force
(Fe = 1/2AV2/d2) causes the center plate to deflect. The
result ant deflec tion is m easured by the a cceleromete r's control
ASIC and a prop ortiona l outp ut vol tag e resu lts . This procedure
assures that both the mechanical (g-cell) and electronic
sections of the accelerometer are functioning.
Ratiometricity
Ratiometricity simply means that the output offset voltage
and sensitivity will scale linearly with applied supply voltage.
That is, as you increase su pply voltage the sensitivity a nd offset
inc rease linea rly; as supply vo ltage d ecrea ses, offset and
sensitivity decrease linearly. This is a key feature when
interfacing to a microcontroller or an A/D converter because it
provides system level cancellation of supply induced erro rs in
the analog to digital conversion process.
Status
Motorola acceleromet ers include fault detection circuitry and
a fault latch. The Status pin is an output from the fault latch,
OR'd with self-test, and is set high whenever one (or more) of
the following events occur:
• Supply voltage falls below the Low Voltage Detect (LVD)
voltage threshold
• Clock oscillator falls below the clock monitor minimum
frequency
• Parity of the EPROM bits becomes odd in number.
The fault latch can be reset by a rising edge on the self-test
input pin, unless one (or more) of the fault conditions continues
to exist.
Acceleration
Freescale Semiconductor, I
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
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