MOC205M, MOC206M, MOC207M, MOC211M, MOC212M, MOC213M, MOC216M,
MOC217M
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SAFETY AND INSULATION RATINGS (As per DIN EN/IEC 60747−5−5, this optocoupler is suitable for “safe electrical insulation”
only within the safety limit data. Compliance with the safety ratings shall be ensured by means of protective circuits.)
Parameter Characteristics
Installation Classifications per DIN VDE 0110/1.89 Table 1, For Rated Mains
Voltage
<150 VRMS I–IV
<300 VRMS I–III
Climatic Classification 55/100/21
Pollution Degree (DIN VDE 0110/1.89) 2
Comparative Tracking Index 175
Symbol Parameter Value Unit
VPR Input−to−Output Test Voltage, Method A, VIORM x 1.6 = VPR, Type and Sample Test
with tm = 10 s, Partial Discharge < 5 pC
904 Vpeak
Input−to−Output Test Voltage, Method B, VIORM x 1.875 = VPR, 100% Production Test
with tm = 1 s, Partial Discharge < 5 pC
1060 Vpeak
VIORM Maximum Working Insulation Voltage 565 Vpeak
VIOTM Highest Allowable Over−Voltage 4000 Vpeak
External Creepage ≥4 mm
External Clearance ≥4 mm
DTI Distance Through Insulation (Insulation Thickness) ≥0.4 mm
TSCase Temperature (Note 1) 150 °C
IS,INPUT Input Current (Note 1) 200 mA
PS,OUTPUT Output Power (Note 1) 300 mW
RIO Insulation Resistance at TS, VIO = 500 V (Note 1) >109W
1. Safety limit values – maximum values allowed in the event of a failure.
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise noted)
Symbol Rating Value Unit
TOTAL DEVICE
TSTG Storage Temperature −40 to +125 °C
TAAmbient Operating Temperature −40 to +100 °C
TJJunction Temperature −40 to +125 °C
TSOL Lead Solder Temperature 260 for 10 seconds °C
PDTotal Device Power Dissipation @ TA = 25°C 240 mW
Derate above 25°C 2.94 mW/°C
EMITTER
IFContinuous Forward Current 60 mA
IF (pk) Forward Current – Peak (PW = 100 ms, 120 pps) 1.0 A
VRReverse Voltage 6.0 V
PDLED Power Dissipation @ TA = 25°C 90 mW
Derate above 25°C 0.8 mW/°C
DETECTOR
ICContinuous Collector Current 150 mA
VCEO Collector−Emitter Voltage 30 V
VECO Emitter−Collector Voltage 7 V
PDDetector Power Dissipation @ TA = 25°C 150 mW
Derate above 25°C 1.76 mW/°C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.