SLAS248D − DECEMBER 1999 − REVISED SEPTEMBER 2005
    
     
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FEATURES
D14-Bit Resolution
D1, 3, and 8 MSPS Speed Grades Available
DDifferential Nonlinearity (DNL) ±0.6 LSB Typ
DIntegral Nonlinearity (INL) ±1.5 LSB Typ
DInternal Reference
DDifferential Inputs
DProgrammable Gain Amplifier
DµP-Compatible Parallel Interface
DTiming Compatible With TMS320C6000 DSP
D3.3-V Single Supply
DPower-Down Mode
DMonolithic CMOS Design
APPLICATIONS
DxDSL Front Ends
DCommunication
DIndustrial Control
DInstrumentation
DAutomotive
DESCRIPTION
The THS1401, THS1403, and THS1408 are 14-bit, 1/3/8
MSPS, single supply analog-to-digital converters (ADCs)
with an internal reference, differential inputs,
programmable input gain, and an on-chip
sample-and-hold amplifier.
Implemented with a CMOS process, the device has
outstanding price/performance and power/speed ratios.
The THS1401, THS1403, and THS1408 are designed for
use with 3.3-V systems, and with a high-speed µP-
compatible parallel interface, making them the first choice
for solutions based on high-performance DSPs such as
the TI TMS320C6000 series.
The THS1401, THS1403, and THS1408 are available in a
TQFP-48 package in standard commercial and industrial
temperature ranges. The THS1401, THS1403, and
THS1408 are also available in a PQFP-48 package in
automotive temperature range, and the THS1408 is
available in a PQFP-48 package in military temperature
range.
PGA
0..7 dB
REF
14-Bit
ADC Buffer
14 15
CONTROL
LOGIC
REF+
REF−
IN+
IN−
D[13:0] + OV bit
A[1:0]
6
CLK
1.5 V
BG
VBG
CS
WR
OE
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All trademarks are the property of their respective owners.
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Copyright 1999−2005, Texas Instruments Incorporated
 *#"-('& '"$*,% " 44 %,, *%#%$))#& %#) )&)- (,)&&
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
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ABSOLUTE MAXIMUM RATINGS
Over operating free-air temperature range unless otherwise noted.(1)
Supply voltage, (AVDD to AGND) 4V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Supply voltage, (DVDD to DGND) 4V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reference input voltage range, VBG − 0.3 V to AV DD + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analog input voltage range − 0.3 V to AV DD + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input voltage range − 0.3 V to DVDD + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: C-suffix 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I-suffix −40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Q-suffix −40°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
M-suffix −55°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, Tstg −65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied.
Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Terminal Functions
TERMINAL
I/O
DESCRIPTION
NAME NO.
I/O
DESCRIPTION
A[1:0] 40, 4 1 IAddress input
AGND 7,8, 44, 45, 46 Analog ground
AVDD 2, 43, 47 Analog power supply
CLK 32 I Clock input
CML 4 Reference midpoint. This pin requires a 0.1-µF capacitor to AGND.
CS 37 I Chip select input. Active low.
DGND 9, 15, 25, 33, 34 Digital ground
DVDD 14, 20, 26, 30, 31, 42 Digital power supply
D[13:0] 11, 12, 13, 16, 17, 18,
19, 21, 22, 23, 24, 27,
28, 29
I/O Data inputs/outputs
NC 38, 39 No connection; do not use. Reserved.
IN+ 48 I Positive differential analog input
IN− 1 I Negative differential analog input
OE 35 I Output enable. Active low.
OV 10 O Out-of-range output
REF+ 5 O Positive reference output. This pin requires a 0.1-µF capacitor to AGND.
REF− 6 O Negative reference output. This pin requires a 0.1-µF capacitor to AGND.
VBG 3 I Reference input. This pin requires a 1-µF capacitor to AGND.
WR 36 I W rite signal. Active low.
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WR
36
35
34
33
32
31
30
29
28
27
26
25
1
2
3
4
5
6
7
8
9
10
11
12
IN−
AVDD
VBG
CML
REF+
REF−
AGND
AGND
DGND
OV
D13
D12
A0
A1
NC
NC
47 46 45 44 4348 42
IN+
AV
AGND
AGND
AGND
D5
D4
D3
DGND
D9
D8
D7
D6
40 39 3841 37
CS
D11
D10
PFB AND PHP PACKAGE
(TOP VIEW)
DD
AV DD
DVDD
DVDD
DVDD
NC − No internal connection
OE
DGND
DGND
CLK
DVDD
DVDD
D0
D1
D2
DVDD
DGND
14 15 16 17 1813 19 21 22 2320 24
AVAILABLE OPTIONS
PACKAGED DEVICE
TATQFP
(PFB) PQFP (Power Pad)
(PHP)
0°C to 70°CTHS1401CPFB,
THS1403CPFB,
THS1408CPFB
−40°C to 85°CTHS1401IPFB,
THS1403IPFB,
THS1408IPFB
−40°C to 125°C THS1401QPHP,
THS1403QPHP,
THS1408QPHP
−55°C to 125°C THS1408MPHP
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THERMAL CHARACTERISTICS(1)
TYP UNIT
Thermal resistance, junction-to-ambient, ΘJA
PFB package 85.9
°C/W
Thermal resistance, junction-to-ambient,
ΘJA PHP package 28.8 °
C/W
Thermal resistance, junction-to-case, ΘJC
PFB package 19.6
°C/W
Thermal resistance, junction-to-case,
ΘJC PHP package 0.79 °
C/W
(1) Thermal resistance is modeled data, is not production tested, and is given for informational purposes only.
RECOMMENDED OPERATING CONDITIONS MIN NOM MAX UNIT
Supply voltage, AVDD, DVDD 3 3.3 3.6 V
High level digital input, VIH 2 3.3 V
Low level digital input, VIL 00.8 V
Load capacitance, CL5 15 pF
THS1401 0.1 1 1 MHz
Clock frequency, f
CLK
THS1403 0.1 3 3 MHz
Clock frequency, fCLK
THS1408 0.1 8 8 MHz
Clock duty cycle
C- and I-suffix 40 50 60
%
Clock duty cycle
Q- and M-suffix 45 50 55
%
C-suffix 0 25 70
Operating free-air temperature
I-suffix −40 25 85
°C
Operating free-air temperature
Q-suffix −40 25 125 °
C
M-suffix −55 25 125
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ELECTRICAL CHARACTERISTICS
Over operating free-air temperature range, AVDD = DVDD = 3.3V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Power Supply
IDDA Analog supply current AVDD = 3.6 V 81 90 mA
IDDD Digital supply current DVDD = 3.6 V 5 10 mA
Power AVDD = DVDD = 3.6 V 270 360 mW
Power down current 20 µA
DC Characteristics
Resolution 14 Bits
DNL Differential nonlinearity ±0.6 ±1 LSB
THS1401 ±1.5 ±2.5
THS1403C/I ±1.5 ±2.5
INL Integral nonlinearity THS1403Q Best fit ±2±3LSB
INL
Integral nonlinearity
THS1408C/I
Best fit
±3±5
LSB
THS1408Q/M ±3.5 ±7.5
Offset error IN+ = IN−, PGA = 0 dB 0.3 %FSR
Gain error
C and I suffix
PGA = 0 dB
1 %FSR
Gain error
Q and M suffix
PGA = 0 dB
1.75 %FSR
AC Characteristics
ENOB Effective number of bits 11.2 11.5 Bits
THS1401/3/8 fi = 100 kHz −81
THD Total harmonic distortion THS1403/8 fi = 1 MHz −78 dB
THD
Total harmonic distortion
THS1408 fi = 4 MHz −77
dB
THS1401/3/8 fi = 100 kHz 72
SNR Signal-to-noise ratio THS1403/8 fi = 1 MHz 70 72 dB
SNR
Signal-to-noise ratio
THS1408 fi = 4 MHz 71
dB
THS1401/3/8 fi = 100 kHz 70
SINAD Signal-to-noise ratio + distortion THS1403/8 fi = 1 MHz 69 70 dB
SINAD
Signal-to-noise ratio + distortion
THS1408 fi = 4 MHz 70
dB
THS1401/3/8 fi = 100 kHz 80
SFDR
Spurious-free dynamic range
THS1403C/I, THS1408C/I
fi = 1 MHz
73 80
dB
SFDR
Spurious-free dynamic range
THS1403Q, THS1408Q/M
f
i
= 1 MHz
71 80
dB
THS1408 fi = 4 MHz 80
Analog input bandwidth 140 MHz
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ELECTRICAL CHARACTERISTICS (Cont.)
Over operating free-air temperature range, AVDD = DVDD = 3.3V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Reference Voltage
Bandgap voltage, internal mode 1.425 1.5 1.575 V
Input impedance 40 k
Positive reference voltage, REF+ 2.5 V
Negative reference voltage, REF− 0.5 V
Reference difference, REF, REF+ − REF− 2 V
Accuracy, in t e r n a l r e ference 5%
Temperature coefficient 40 ppm/°C
Voltage coefficient 200 ppm/V
Analog Inputs
Positive analog input, IN+ 0AVDD V
Negative analog input, IN− 0AVDD V
Analog input voltage difference AIN = IN+ − IN−, VREF = REF+ − REF− −VREF VREF V
Input impedance 25 k
PGA range 0 7 dB
PGA step size 1 dB
PGA gain error ±0.25 dB
Digital Inputs
VIH High-level digital input 2 V
VIL Low-level digital input 0.8 V
Input capacitance 5 pF
Input current ±1µA
Digital Outputs
VOH High-level digital output IOH = 50 µA 2.6 V
VOL Low-level digital output IOL = 50 µA 0.4 V
IOZ Output current, high impedance ±10 µA
Clock T iming (CS low)
THS1401 0.11 1 MHz
f
CLK
Clock frequency THS1403 0.13 3 MHz
fCLK
Clock frequency
THS1408 0.18 8 MHz
tdOutput delay time 25 ns
Latency 9.5 Cycles
This parameter is not production tested for Q- and M-suf fix devices.
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PARAMETER MEASUREMENT INFORMATION
sample timing
The THS1401/3/8 core is based on a pipeline architecture with a latency of 9.5 samples. The conversion results
appear on the digital output 9.5 clock cycles after the input signal was sampled.
S9 S10
S11 S12
CLK
Data
Out
Analog
Input
C1 C2 C3
tw(CLK) tw(CLK)
td
Figure 1. Sample Timing
The parallel interface of the THS1401/3/8 ADC features 3-state buffers, making it possible to directly connect
it to a data bus. The output buffers are enabled by driving the OE input low.
Besides the sample results, it is also possible to read back the values of the control register, the PGA register,
and the offset register. Which register is read is determined by the address inputs A[1,0]. The ADC results are
available at address 0.
The timing of the control signals is described in the following sections.
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PARAMETER MEASUREMENT INFORMATION
read timing (15-pF load)
PARAMETER MIN TYP MAX UNIT
tsu(OE−ACS) Address and chip select setup time 4 ns
ten Output enable 15 ns
tdis Output disable 10 ns
th(A) Address hold time 1 ns
th(CS) Chip select hold time 0 ns
NOTE: All timing parameters refer to a 50% level.
DATA
ADDRESS
CS
OE
D[13:0]
O V
A[1:0] X X
tsu(OE−ACS) ten
th(CS)
tdis
th(A)
Figure 2. Read Timing
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PARAMETER MEASUREMENT INFORMATION
write timing (15-pF load)
PARAMETER MIN TYP MAX UNIT
tsu(WE−CS) Chip select setup time 4 ns
tsu(DA) Data and address setup time 29 ns
th(DA) Data and address hold time 0 ns
th(CS) Chip select hold time 0 ns
twH(WE) Write pulse duration high 15 ns
NOTE: All timing parameters refer to a 50% level.
DATA
ADDRESS
CS
WE
D[13:0]
AX X
X
X
tsu(WE−CS) tsu(DA)
th(CS)
th(DA)
Figure 3. Write Timing
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TYPICAL CHARACTERISTICS
268
270
272
274
276
278
280
282
284
0.1 1 10
Power − mW
f − Frequency − MHz
POWER
vs
FREQUENCY
Figure 4
0
10
20
30
40
50
60
70
80
90
0 50 100 150 200 250 300
− Supply Current − mA
t − Time − ns
SUPPLY CURRENT
vs
TIME
ICC
Figure 5
−100
−140 0 100 200 300
Output − dB
−40
−20
f − Frequency − kHz
FAST FOURIER TRANSFORM
0
400 500
−60
−80
−120
fs = 1 MSPS,
fI = 100 kHz,
−1 dB
Figure 6
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TYPICAL CHARACTERISTICS
−100
−1400.1 0.4 0.7 1
Output − dB
−40
−20
f − Frequency − MHz
FAST FOURIER TRANSFORM
0
1.3
−60
−80
−120
fs = 3 MSPS,
fI = 1 MHz,
−1 dB
Figure 7
−60
−1400.1 0.4 0.7 1 1.6 1.9 2.5
Output − dB
−40
−20
f − Frequency − MHz
FAST FOURIER TRANSFORM
0
2.8 3.1 3.7 4
−80
−100
−120
1.3 2.2 3.4
fs = 8 MSPS,
fI = 1 MHz,
−1 dB
Figure 8
−0.5
−2 0 2048 4096 6144 8192 10240
INL − Integral Nonlinearity − LSB
1
1.5
Samples
INTEGRAL NONLINEARITY
2
12288 14336 16384
0.5
0
−1
−1.5
fs = 1 MSPS
Figure 9
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TYPICAL CHARACTERISTICS
−0.5
−20 2048 4096 6144 8192 10240
INL − Integral Nonlinearity − LSB
1
1.5
Samples
INTEGRAL NONLINEARITY
2
12288 14336 16384
0.5
0
−1
−1.5
fs = 3 MSPS
Figure 10
−2
−4
2
3
4
1
0
−1
−3
0 2048 4096 6144 8192 10240
INL − Integral Nonlinearity − LSB
Samples
INTEGRAL NONLINEARITY
12288 14336 16384
fs = 8 MSPS
Figure 11
−0.2
−1 0 2048 4096 6144 8192 10240
DNL − Differential Nonlinearity − LSB
0.6
0.8
Samples
DIFFERENTIAL NONLINEARITY
1
12288 14336 16384
0.4
0.2
0
−0.4
−0.6
−0.8
fs = 1 MSPS
Figure 12
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TYPICAL CHARACTERISTICS
−0.2
−1 0 2048 4096 6144 8192 10240
DNL − Differential Nonlinearity − LSB
0.6
0.8
Samples
DIFFERENTIAL NONLINEARITY
1
12288 14336 16384
0.4
0.2
0
−0.4
−0.6
−0.8
fs = 3 MSPS
Figure 13
−0.2
−1 0 2048 4096 6144 8192 10240
DNL − Differential Nonlinearity − LSB
0.6
0.8
Samples
DIFFERENTIAL NONLINEARITY
1
12288 14336 16384
0.4
0.2
0
−0.4
−0.6
−0.8
fs = 8 MSPS
Figure 14
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TYPICAL CHARACTERISTICS
−90
−88
−86
−84
−82
−80
−78
−76
−74
−72
−70
10 100 1000 1500
THD − Total Harmonic Distortion − dB
f − Frequency − Hz
TOTAL HARMONIC DISTORTION
vs
FREQUENCY
fs = 3 MSPS,
fI at −1 dB
Figure 15
−90
−88
−86
−84
−82
−80
−78
−76
−74
−72
−70
10 100 1000 4000
THD − Total Harmonic Distortion − dB
f − Frequency − Hz
TOTAL HARMONIC DISTORTION
vs
FREQUENCY
fs = 8 MSPS,
fI at −1 dB
Figure 16
60
62
64
66
68
70
72
74
76
78
80
10 100 1000 1500
SNR − Signal-to-Noise Ratio − dB
f − Frequency − Hz
SIGNAL-TO-NOISE RATIO
vs
FREQUENCY
fs = 3 MSPS,
fI at −1 dB
Figure 17
60
62
64
66
68
70
72
74
76
78
80
10 100 1000 4000
SNR − Signal-to-Noise Ratio − dB
f − Frequency − Hz
SIGNAL-TO-NOISE RATIO
vs
FREQUENCY
fs = 8 MSPS,
fI at −1 dB
Figure 18
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PRINCIPLES OF OPERATION
registers
The device contains several registers. The A register is selected by the values of bits A1 and A0:
A1 A0 Register
0 0 Conversion result
0 1 PGA
1 0 Offset
1 1 Control
Tables 1 and 2 describe how to read the conversion results and how to configure the data converter. The default
values (were applicable) show the state after a power-on reset.
Table 1. Conversion Result Register, Address 0, Read
BIT D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
Function MSB ... LSB
The output can be configured for 2s complement or straight binary format (see D11/control register).
The output code is given by:
2s complement: Straight binary:
−8192 at IN = −REF 0 at IN = −REF
0 at IN = 0 8192 at IN = 0
8191 IN = +REF − 1 LSB 16383 at IN = + REF − 1 LSB
1LSB+2DREF
16384
Table 2. PGA Gain Register, Address 1, Read/Write
BIT D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
Function X X X X X X X X X X X G2 G1 G0
Default 0 0 0 0 0 0 0 0 0 0 0 0 0 0
The PGA gain is determined by writing to G2−0.
Gain (dB) = 1dB × G2−0. max = 7dB. The range of G2−0 is 0 to 7.
Table 3. Offset Register, Address 2, Read/Write
BIT D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
Function X X X X X X MSB LSB
Default 0 0 0 0 0 0 0 0 0 0 0 0 0 0
The offset correction range is from –128 to 127 LSB. This value is added to the conversion results from the ADC.
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PRINCIPLES OF OPERATION
Table 4. Control Register, Address 3, Read
BIT D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
Function PWD REF FOR TM2 TM1 TM0 OFF RES RES RES RES RES RES RES
Table 5. Control Register, Address 3, Write
BIT D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
Function PWD REF FOR TM2 TM1 TM0 OFF RES RES RES RES RES RES RES
Default 0 0 0 0 0 0 0 0 0 0 0 0 0 0
PWD: Power down 0 = normal operation 1 = power down
REF: Reference select 0 = internal reference 1 = external reference
FOR: Output format 0 = straight binary 1 = 2s complement
TM2−0: Test mode 000 = normal operation
001 = both inputs = REF−
010 = IN+ at VCM (Voltage at CML pin), IN− at REF−
011 = IN+ at REF+, IN− at REF−
100 = normal operation
101 = both inputs = REF+
110 = IN+ at REF−, IN− at VCM (Voltage at CML pin)
111 = IN+ at REF−, IN− at REF+
OF: Offset correction 0 = enable 1 = disable
RES Reserved Must be set to 0.
APPLICATION INFORMATION
driving the analog input
The THS1401/3/8 ADCs have a fully differential input. A differential input is advantageous with respect to SNR,
SFDR, and THD performance because the signal peak-to-peak level is 50% of a comparable single-ended
input.
There are three basic input configurations:
DFully differential
DTransformer coupled single-ended to differential
DSingle-ended
fully differential configuration
In this configuration, the ADC converts the difference (IN) of the two input signals on IN+ and IN−.
100 pF IN+
IN−
THS1401/3/8
22
100 pF
22
Figure 19. Differential Input
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17
The resistors and capacitors on the inputs decouple the driving source output from the ADC input and also serve
as first order low pass filters to attenuate out of band noise.
The input range on both inputs is 0 V to AVDD. The full-scale value is determined by the voltage reference. The
positive full-scale output is reached, if IN equals REF, the negative full-scale output is reached, if IN equals
REF.
IN [V] OUTPUT
REF − full scale
0 0
REF + full scale
APPLICATION INFORMATION
transformer coupled single-ended to differential configuration
If the application requires the best SNR, SFDR, and THD performance, the input should be transformer
coupled.
The signal amplitude on both inputs of the ADC is one half as high as in a single-ended configuration thus
increasing the ADC ac performance.
100 pF IN+
IN−
THS1401/3/8
CML
R
100 pF
22
22
+1 µF 0.1 µF
Figure 20. Transformer Coupled
The following table shows the input voltages for negative full-scale output, zero output, and positive full-scale
output:
IN [VPEAK]OUTPUT [PEAK]
REF − full scale
0 0
REF + full scale
n = 1 (winding ratio)
The resistor R of the transformer coupled input configuration must be set to match the signal source impedance
R = n2 Rs, where Rs is the source impedance and n is the transformer winding ratio.
APPLICATION INFORMATION
single-ended configuration
In this configuration, the input signal is level shifted by REF/2.
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18
IN+
IN−
THS1401/3/8
REF+
REF−
+
10 k
100 pF
100 pF
10 k
22
10 k10 k
10 kΩ + 10 k
Figure 21. Single-Ended With Level Shift
The following table shows the input voltages for negative full-scale output, zero output, and positive full-scale
output:
IN+ [ V ] OUTPUT
REF − full scale
0 0
REF + full scale
Note that the resistors of the op-amp and the op-amp all introduce gain and of fset errors. Those errors can be
trimmed by varying the values of the resistors.
Because of the added offset, the op-amp does not necessarily operate in the best region of its transfer curve
(best linearity around zero) and therefore may introduce unacceptable distortion. For ac signals, an alternative
is described in the following section.
APPLICATION INFORMATION
AC-coupled single-ended configuration
If the application does not require the signal bandwidth to include dc, the level shift shown in Figure 21 is not
necessary.
IN+
IN−
THS1401/3/8
REF+
REF−
+
10 nF
10 k
10 k
10 k
10 k
100 pF
100 pF
22
10 k10 k
Figure 22. Single-Ended With Level Shift
Because the signal swing on the op-amp is centered around ground, it is more likely that the signal stays within
the linear region of the op-amp transfer function, thus increasing the overall ac performance.
IN [VPEAK]OUTPUT [PEAK]
REF − full scale
0 0
REF + full scale
Compared to the transformer-coupled configuration, the swing on IN− is twice as big, which can decrease the
ac performance (SNR, SFD, and THD).
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19
APPLICATION INFORMATION
internal/external reference operation
The THS1401/3/8 ADC can either be operated
using the built-in band gap reference or using an
external precision reference in case very high dc
accuracy is needed.
The REF+ and REF+ outputs are given by:
REF )+ VBG
1)2
and REF
If the built-in reference is used, VBG equals 1.5 V
which results in REF+ = 2.5 V, REF− = 0.5 V and
REF = 2 V.
The internal reference can be disabled by writing
1 to D12 (REF) in the control register (address 3).
The band gap reference is then disconnected and
can be substituted by a voltage on the VBG pin.
programmable gain amplifier
The on-chip programmable gain amplifier (PGA)
has eight gain settings. The gain can be changed
by writing to the PGA gain register (address 1).
The range is 0 to 7dB in steps of one dB.
out of range indication
The OV output of the ADC indicates an out of
range condition. Every time the difference on the
analog inputs exceeds the differential reference,
this signal is asserted. This signal is updated the
same way as the digital data outputs and therefore
subject to the same pipeline delay.
offset compensation
With the offset register it is possible to
automatically compensate system offset errors,
including errors caused by additional signal
conditioning circuitry. I f the of fset compensation i s
enabled (D7 (OFF) in the control register), the
value in the offset register (address 2) is
automatically added to the output of the ADC.
In order to set the correct value of the offset
compensation register, the ADC result when the
input signal is 0 must be read by the host
processor and written to the offset register
(address 2).
test modes
The ADC core operation can be tested by
selecting one of the available test modes (see
control register description). The test modes
apply various voltages to the differential input
depending on the setting in the control register.
digital I/O
The digital inputs and outputs of the THS1401/3/8
ADC are 3-V CMOS compatible. In order to avoid
current feed back errors, the capacitive load on
the digital outputs should be as low as possible (50
pF max). Series resistors (100 ) on the digital
outputs can improve the performance by limiting
the current during output transitions.
The parallel interface of the THS1401/3/8 ADC
features 3-state buffers, making it possible to
directly connect it to a data bus. The output bu f fers
are enabled by driving the OE input low.
Refer to the read and write timing diagrams in the
parameter measurement information section for
information on read and write access.
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Revision History
DATE REV PAGE SECTION DESCRIPTION
1 Updated page 1 format and layout.
1 Moved funtional block diagram from page 2.
2 Moved Terminal Function table from page 3.
2 Moved Absolute Maximum table from page 4.
3 Moved package pinout from page 1.
9/05 D 3 Moved Ordering Options table from page 2.
9/05
D
15 Principles of Operation Table 1. In section 2s complement: 8191 DIN = − DREF − 1 LSB changed to
8191 DIN = +DREF − 1 LSB. In section Straight Binary: 16383 at DIN = − DREF
− 1 LSB should be changed to 16383 DIN = +DREF − 1 LSB
16 Principles of Operation
Table 5. In section TM2−0: Test Mode: 010 = IN+ at VREF/2, IN− at REF−,
changed to, 010 = IN+ at VCM (Voltage at CML pin), IN− at REF−. Same section:
110 = IN+ at REF−, IN− at VREF/2, changed to, 110 = IN+ at REF−, IN− at VCM
(Voltage at CML pin)
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
PACKAGE OPTION ADDENDUM
www.ti.com 11-Apr-2013
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead/Ball Finish MSL Peak Temp
(3)
Op Temp (°C) Top-Side Markings
(4)
Samples
5962-0051101NXD ACTIVE HTQFP PHP 48 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-3-260C-168 HR -55 to 125 0051101
NXD
THS1401CPFB OBSOLETE TQFP PFB 48 TBD Call TI Call TI 0 to 70
THS1401IPFB ACTIVE TQFP PFB 48 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 TJ1401
THS1401IPFBG4 ACTIVE TQFP PFB 48 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 TJ1401
THS1403CPFB OBSOLETE TQFP PFB 48 TBD Call TI Call TI 0 to 70
THS1403IPFB ACTIVE TQFP PFB 48 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 TJ1403
THS1403IPFBG4 ACTIVE TQFP PFB 48 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 TJ1403
THS1403QPHP ACTIVE HTQFP PHP 48 Green (RoHS
& no Sb/Br) CU NIPDAU Level-3-260C-168 HR -40 to 125 THS1403Q
THS1408CPFB OBSOLETE TQFP PFB 48 TBD Call TI Call TI 0 to 70
THS1408IPFB ACTIVE TQFP PFB 48 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 TJ1408
THS1408IPFBG4 ACTIVE TQFP PFB 48 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 TJ1408
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
PACKAGE OPTION ADDENDUM
www.ti.com 11-Apr-2013
Addendum-Page 2
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) Multiple Top-Side Markings will be inside parentheses. Only one Top-Side Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a
continuation of the previous line and the two combined represent the entire Top-Side Marking for that device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF THS1408, THS1408M :
Catalog: THS1408
Enhanced Product: THS1408-EP, THS1408-EP
Military: THS1408M
NOTE: Qualified Version Definitions:
Catalog - TI's standard catalog product
Enhanced Product - Supports Defense, Aerospace and Medical Applications
Military - QML certified for Military and Defense Applications
MECHANICAL DATA
MTQF019A – JANUARY 1995 – REVISED JANUARY 1998
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PFB (S-PQFP-G48) PLASTIC QUAD FLATPACK
4073176/B 10/96
Gage Plane
0,13 NOM
0,25
0,45
0,75
Seating Plane
0,05 MIN
0,17
0,27
24
25
13
12
SQ
36
37
7,20
6,80
48
1
5,50 TYP
SQ
8,80
9,20
1,05
0,95
1,20 MAX 0,08
0,50 M
0,08
0°–7°
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-026
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