Keysight Technologies
E4982A LCR Meter
1 MHz to 300 MHz/500 MHz/1 GHz/3 GHz
Data Sheet
2
Warranted performance. Specifications include guardbands to ac-
count for the expected statistical performance distribution, measure-
ment uncertainties, and changes in performance due to environmental
conditions. Supplemental information is intended to provide information
that is helpful for using the instrument but that is not guaranteed by the
product warranty.
Describes performance that will be met by a minimum of 80% of all
products. It is not guaranteed by the product warranty.
Represents the value of a parameter that is most likely to occur; the
expected mean or average. It is not guaranteed by the product warranty.
A general, descriptive term that does not imply a level of performance.
3
Basic Measurement Characteristic
Source Characteristics
Measurement parameters
Impedance parameters |Z|, |Y|, Ls, Lp, Cs, Cp, Rs, Rp, X, G, B, D, Q, Øz [°], Øz [rad], Øy [°], Øy [rad],
Measurement range
Impedance parameters
Frequency
Oscillator level
Cable Length = 1m:
Cable Length = 2m (When option 002 is used):
Output impedance
4
Measurement Accuracy
– 23 °C ± 5 °C
– 7-mm connector of 3.5-mm-7-mm adapter connected to 3.5-mm terminal of test heads
Measurement uncertainty
Z,Y
L, C, X, B
R, G
a b
x
E + E
at D tan < 1
100
Q
a b
x
E + E
at Q tan < 1
100
a b
E + E
± rad
100
(
)
a b
± E + E %
(
)
2
a b x
± E + E × (1 + D ) %
(
)
2
a b x
± E + E × (1 + Q ) %
(
)
ab
E + E
±
100
2
ab
x
E + E
Q
100
±
x
Especially, at D 0.1
x
a b
10
Especially, at Q 10
E + E
2b b
x
b b
x
E + E
1 + D tan
100
±
E + E
1 D tan
100
±
(
)
2b b
x
b b
x
E + E
1 + Q tan
100
±
E + E
1 Q tan
100
±
(
)
5
Measurement uncertainty
Z,Y
L, C, X, B
R, G
Q
a b
± E + E %
(
)
c
E
± rad
100
c
E
±
100
2c
x
E
Q
100
±
2 2
a b c x
± E + E + E D %
(
)
(
)
2 2
a b c x
± E + E + E Q %
(
)
(
)
x100
2c
x
c
x
E
1 + D tan 100
± E
1 D tan 100
m
(
)
c
x
E
at Q tan < 1
100
2c
x
c
x
E
1 + Q tan
100
± E
1 Q tan
100
±
(
)
6
-
7
-
-
-
|Zx| : Measurement value of |Z|
(
)
F : Frequency MHz
(
)
8
-
-
-
-
-
-
-
-
-
9
-
-
characteristics.
10
Examples of Calculated Impedance Measurement Accuracy
0.1
1
10
100
1000
10000
110 100 1000
|Z| [Ω]
[MHz]
0.8%
1%
2%
5%
10%
0.1
1
10
100
1000
10000
110 100 1000
|Z| [Ω]
[MHz]
0.8%
1%
2%
5%
10%
0.1
1
10
100
1000
10000
110 100 1000
|Z| [Ω]
[MHz]
0.8%
1%
2%
5%
10%
0.1
1
10
100
1000
10000
110 100 1000
|Z| [Ω]
[MHz]
0.8%
1%
2%
5%
10%
0.1
1
10
100
1000
10000
110 100 1000
|Z| [Ω]
[MHz]
0.8%
1%
2%
5%
10%
0.1
1
10
100
1000
10000
110 100 1000
|Z| [Ω]
[MHz]
0.8%
1%
2%
5%
10%
-
11
Timing Chart and Measurement Time (SPD)
Cycle Time
Figure 7.
Timing chart of handler interface signal
T1 T3
T2
Trigger signal
/INDEX
/EOM
/READY_FOR_TRIG
T4 T5 T6 T7
Test condition Timing
Mode 1 (1 MHz) Mode 1 (100 MHz) Mode 2 Mode 3
Screen Setting
Rdc meas.
Comparator
Min.
Median
Max.
Min.
Median
Max.
Min.
Median
Max.
Min.
Median
Max.
— — — — — — — — —
— —
—
—
—
— —
—
—
—
1
meas
-
—
ms
ms
ms
ms
ms
ms
ms
ms
On —
ms
ms
ms
ms
ms
ms
ms
ms
1
meas
-
—
ms
ms
ms
ms
ms
ms
ms
ms
On —
ms
ms —
ms
ms —
ms
ms —
ms
ms
1
Ls-Q
—
ms
ms —
ms
ms —
ms
ms —
ms
ms
On —
ms
ms —
ms
ms —
ms
ms —
ms
ms
On —
ms
ms —
ms
ms —
ms
ms —
ms
ms
On On —
ms
ms —
ms
ms —
ms
ms —
ms
ms
— — — 0 — — 0 — — 0 — — 0 — —
12
Figure 8. Measurement time T4 for single point measurement
T4
Ts Tt Tp Tr Tm
T5
/INDEX
/EOM
Sorting result
output
Internal
process
Meas.
condition
setup
Meas. point
delay time
(User’s setup)
Trigger delay time
(User’s setup)
Rdc
meas. Measurement Meas. data
math.
(Previous sorting results) Sorting results
Test condition for Measurement Time
The measurement time of E4982A is scattered to some extent by an overhead of the internal operation system and other
NOTE
an extremely large overhead in handler interface timings. The table excludes such special cases, thus you can
sometimes see timing over the maximum value data shown in the table. If you make a handshake using the
such an irregular measurement time drift.
2. If your system communicates with external devices, you will see longer timing results than those on the table.
the test cycle time for yourself, because the system performance depends heavily on the system parameters.
Of course, you will see much longer test cycle times from your system software overhead.
13
Figure 9. Measurement time T4 for list measurement
T4
Ts Tt Tp
Meas. point 1Meas. point 2Meas. point N
Tr Tm Ts Tp Tm Ts Tp Tm
T5
/INDEX
Sorting result
output
Internal
process
Meas.
condition
setup
Meas.
condition
setup
Rdc
meas. Measurement Measurement
Numbers of meas.
Point in the table
N:
Meas. point
delay time
(User’s setup)
Meas. point
delay time
(User’s setup)
Meas.
condition
setup
Trigger delay time
(User’s setup)
Meas. data
math.
(Previous sorting results) Sorting results
/EOM
Data transfer format Number of measurement
points
Required time for FETCh? command (ms)
GPIB USB LAN (Socket)
1
2
1
2
List Measurement
Data transfer time (Typical)
Mode 3
14
Measurement Support Functions
Error correction function
Available calibration and compensation
Calibration/compensation data measurement point
DC resistance (Rdc) measurement
-
Trigger function
Measurement time
Averaging function
List measurement function
15
Tp
Positive trigger signal Negative trigger signal
Tp Tp
5V
0V
0V
5V
Tp
Rear panel
External reference signal input connector
Internal reference signal output connector
Test signal level monitor function
Measurement terminal (at test head)
External trigger signal input connector
Front panel
1
1
16
Figure 11. Pin assignment
Interface
GPIB
Handler interface
17
EMC, safety, environment and compliance
EMC
Line power
18
Safety
Environment
Compliance
19
Figure 12. Front view
Operating environment
Non-operating environment
Dimensions, weight
20
Figure 13. Rear view
Figure 14. Side view
21
Figure 15. Test head
22 | Keysight | E4982A LCR Meter - Data Sheet
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