5962-9460002MXA - ANALOG DEVICES

REVISIONS

LTR DESCRIPTION DATE (YR-MO-DA) APPROVED

Change in accordance with N.O.R. 5962-R238-94.

94-07-27 M. A. FRYE

Add case outline X. Editorial changes throughout. Redrawn.

95-07-10 M. A. FRYE

Drawing updated to reflect current requirements. - ro

01-11-26 R. MONNIN

REV

SHEET

REV

SHEET

REV STATUS REV C C C C C C C C C C C C

OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12

PMIC N/A PREPARED BY

RICK OFFICER

DEFENSE SUPPLY CENTER COLUMBUS

STANDARD

MICROCIRCUIT

DRAWING

CHECKED BY

RAJESH PITHADIA

COLUMBUS, OHIO 43216

http://www.dscc.dla.mil

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

APPROVED BY

MICHAEL FRYE

MICROCI RCUIT, LINEAR, DUAL PRECISION

CHOPPER STABILIZED OPERATIONAL

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

DRAWING APPROVAL DATE

94-06-08

AMPLIFI ER, MONOLITHIC SILICON

AMSC N/A

REVISION LEVEL

C SIZE

A CAGE CO DE

67268

5962-94600

SHEET

1 OF

DSCC FORM 2233

APR 97 5962-E088-02

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

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APR 97

1. SCOPE

1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and

M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the

Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the

PIN.

1.2 PIN. The PIN is as shown in the following example:

5962 - 94600 01 M G X

Federal

stock class

designator

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Device

class

designator

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

\ /

(see 1.2.3)

Drawing number

1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and

are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A

specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

1.2.2 Device type(s). The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function

01 LTC1051 Dual, precision, chopper stabilized

operational amplifier

02 LTC1051A Dual, precision, chopper stabilized

operational amplifier

1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as

follows:

Device class Device requirements documentation

M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-

JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A

Q or V Certification and qualification to MIL-PRF-38535

1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style

G MACY1-X8 8 Can

P GDIP1-T8 or CDIP2-T8 8 Dual-in-line

X See figure 1 8 Can

1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,

appendix A for device class M.

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1.3 Absolute maximum ratings. 1/

Total supply voltage (+VS to –VS) ....................................................18 V

Input voltage (VIN) ............................................................................(+VS + 0.3 V) to (-VS – 0.3 V)

Output short circuit duration .............................................................Indefinite

Storage temperature range ..............................................................-65°C to +150°C

Lead temperature (soldering, 10 seconds) .......................................+300°C

Thermal resistance, junction-to-case (θJC) :

Cases G and P ..............................................................................See MIL-STD-1835

Case X ..........................................................................................70°C/W

Thermal resistance, junction-to-ambient (θJA) :

Cases G and X ..............................................................................150°C/W

Case P ..........................................................................................100°C/W

1.4 Recommended operating conditions.

Supply voltage (VS) ..........................................................................4.75 V to 16 V

Ambient operating temperature range (TA) ......................................-55°C to +125°C

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a

part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in

the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the

solicitation.

SPECIFICATION

DEPARTMENT OF DEFENSE

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

STANDARDS

DEPARTMENT OF DEFENSE

MIL-STD-883 - Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

HANDBOOKS

DEPARTMENT OF DEFENSE

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization

Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

_____

1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

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3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.

3.3 Electrical performance characteristics and post irradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and post irradiation parameter limits are as specified in table I and shall apply over the

full ambient operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical

tests for each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space

limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the

RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.

Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.

3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535

listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of

compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see

6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this

drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535

and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.

3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for

device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.

3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2

herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.

3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain

the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made

available onshore at the option of the reviewer.

3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in

microcircuit group number 49 (see MIL-PRF-38535, appendix A).

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TABLE I. Electrical performance characteristics.

Test

Symbol

Conditions

-55°C ≤ TA ≤ +125°C

±VS = ±5 V

Group A

subgroups

Device

type

Limits 1/ Unit

unless otherwise specified Min Max

Input offset voltage 2/

VIO T

A = +25°C 1 All -5 +5

µV

+VS = +5 V, -VS = 0 V,

TA = +25°C

-5 +5

Average input offset 2/

drift ∆VIO 1,2,3 All -0.05 +0.05

µV/°C

+VS = +5 V, -VS = 0 V -0.05 +0.05

Input bias current

IIB 1 01 -65 +65 pA

02 -50 +50

2,3 01 -450 +450

02 -500 +500

+VS = +5 V, -VS = 0 V,

VCM = 0 V, TA = +25°C

1 All -50 +50

Input offset current

IIO 1 01 -125 +125 pA

02 -100 +100

2,3 01 -175 +175

02 -150 +150

+VS = +5 V, -VS = 0 V,

VCM = 0 V, TA = +25°C

1 All -80 +80

Common mode rejection

ratio CMRR VCM = -VS to +2.7 V 1 All 114 dB

2,3 110

Differential common mode

rejection ratio ∆CMRR TA = +25°C 1 01 112 dB

See footnotes at end of table.

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TABLE I. Electrical performance characteristics – Continued.

Test

Symbol

Conditions

-55°C ≤ TA ≤ +125°C

±VS = ±5 V

Group A

subgroups

Device

type

Limits 1/ Unit

unless otherwise specified Min Max

Power supply rejection

ratio PSRR VS = ±2.375 to ±7.5 V 1,2,3 01 116 dB

02 120

Large signal voltage

gain AV V

OUT = ±4 V, RL = 10 kΩ 4,5,6 01 116 dB

02 120

Maximum output

voltage swing VOUT R

L = 10 kΩ 1,2,3 01 -4.5 4.5 V

02 -4.7 4.7

Supply current

IS No load 1 01 4.0 mA

02 2.0

2,3 01 5.0

02 2.5

+VS = +5 V, -VS = 0 V, 1,2,3 01 -3 +3

no load 02 -1.5 +1.5

1/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum,

is used in this table. Negative current shall be defined as conventional current flow out of a device terminal.

2/ If not tested, shall be guaranteed to the limits specified in table I herein.

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Case outline X

FIGURE 1. Case ou t line.

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Case outline X

Symbol Dimensions Notes

Inches Millimeters

Min Max Min Max

A .165 .185 4.19 4.70

φb1 .016 .021 .41 .53 2

φb2 .016 .024 .41 .61

φD .335 .370 8.51 9.40

φD1 .305 .335 7.75 8.51

φD2 .110 .160 2.79 4.06

e .230 BSC 5.84 BSC

F --- .040 --- 1.02

k .028 .034 .71 .86

k1 .027 .045 .69 1.14 3

L .500 .750 12.70 19.05 2

L1 --- .050 --- 1.27 2

Q .010 .045 .25 1.14

α 45° BSC 45° BSC 4

Notes 1,5,6

NOTES:

1. The U.S. government preferred system of measurement is the metric SI system. However, since this item was

originally designed using inch-pound units of measurement, in the event of conflict between the metric and

inch-pound units, the inch-pound units shall take precedence.

2. Diameter is uncontrolled in L1 and beyond .500 from the reference plane.

3. Measured from maximum diameter of the product.

4. α is the basic spacing from the centerline of the tab to terminal 1.

5. Leads having a maximum diameter .019 inches measured in gauging plane .054 + .001 - .000 inches below

the base plane of the product shall be within .007 of their true position relative to a maximum width tab.

6. This style package may be measured by direct methods or by gauge.

FIGURE 1. Case ou t line – continued.

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Device types

01 and 02

Case outlines

G, P, and X

Terminal

number Terminal

symbol

OUTPUT A

-INPUT A

+INPUT A

-VS

+INPUT B

-INPUT B

OUTPUT B

+VS

FIGURE 2. Terminal connections.

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4. QUALITY ASSURANCE PROVISIONS

4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with

MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan

shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be

in accordance with MIL-PRF-38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted

on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in

accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.

4.2.1 Additional criteria for device class M.

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

test method 1015.

(2) TA = +125°C, minimum.

b. Interim and final electrical test parameters shall be as specified in table II herein.

4.2.2 Additional criteria for device classes Q and V.

a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the

device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under

document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test

method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table II herein.

c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-38535, appendix B.

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for

groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for

device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed

for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

4.4.1 Group A inspection.

a. Tests shall be as specified in table II herein.

b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.

STANDARD

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TABLE II. Electrical test requirements.

Test requirements Subgroups

(in accordance with

MIL-STD-883,

method 5005, table I)

Subgroups

(in accordance with

MIL-PRF-38535, table III)

Device

class M Device

class Q Device

class V

Interim electrical

parameters (see 4.2) --- --- ---

Final electrical

parameters (see 4.2) 1,2,3,4,5,6 1/ 1,2,3,4, 1/

5,6 1,2,3,4, 1/

5,6

Group A test

requirements (see 4.4) 1,2,3,4,5,6 1,2,3,4,5,6 1,2,3,4,5,6

Group C end-point electrical

parameters (see 4.4) 1,2,3 1,2,3 1,2,3

Group D end-point electrical

parameters (see 4.4) 1,2,3 1,2,3 1,2,3

Group E end-point electrical

parameters (see 4.4) --- --- ---

1/ PDA applies to subgroup 1.

4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.

4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:

a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify

the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method

1005 of MIL-STD-883.

b. TA = +125°C, minimum.

c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The

test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify

the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of

MIL-STD-883.

4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.

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4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness

assured (see 3.5 herein).

a. End-point electrical parameters shall be as specified in table II herein.

b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as

specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to

radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All

device classes must meet the post irradiation end-point electrical parameter limits as defined in table I at TA = +25°C

±5°C, after exposure, to the subgroups specified in table II herein.

c. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied.

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device

classes Q and V or MIL-PRF-38535, appendix A for device class M.

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications

(original equipment), design applications, and logistics purposes.

6.1.1 Replaceability. Mi crocircuits covered by this drawing will replace the same generic device covered by a contractor

prepared specification or drawing.

6.1.2 Substitutability. Device class Q devices will replace device class M devices.

6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.

6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus when a system

application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users

and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering

microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544.

6.4 Comments. Comments on this drawing should be directed to DSCC-VA , Columbus, Ohio 43216-5000, or telephone

(614) 692-0547.

6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in

MIL-PRF-38535 and MIL-HDBK-1331.

6.6 Sources of supply.

6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.

The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to

this drawing.

6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.

The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been

submitted to and accepted by DSCC-VA.

STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 01-11-26

Approved sources of supply for SMD 5962-94600 are listed below for immediate acquisition information only and

shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be

revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a

certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next

dated revision of MIL-HDBK-103 and QML-38535.

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

5962-9460001MGA

3/ LTC1051MH/883

5962-9460001MPA

64155 4/ LTC1051MJ8/883

5962-9460001MXA

64155 4/ LTC1051MH/883

5962-9460002MGA

3/ LTC1051AMH/883

5962-9460002MPA

64155 4/ LTC1051AMJ8/883

5962-9460002MXA

64155 4/ LTC1051AMH/883

1/ The lead finish shown for each PIN representing

a hermetic package is the most readily available

from the manufacturer listed for that part. If the

desired lead finish is not listed contact the vendor

to determine its availability.

2/ Caution. Do not use this number for item acquisition.

Items acquired to this number may not satisfy the

performance requirements of this drawing.

3/ Not available from an approved source of supply.

4/ This device has an end of life date of 31 December 2001.

Vendor CAGE Vendor name

number and address

64155 Linear Technology Corporation

1630 McCarthy Boulevard

Milpitas, CA 95035-7417

The information contained herein is disseminated for convenience only and the

Government assumes no liability whatsoever for any inaccuracies in the

information bulletin.