AC READ CHARACTERISTICS
Over Operating Range (See Above)
SYMBOL PARAMETER WS27C256L-12 WS27C256L-15 WS27C256L-20 UNITS
MIN MAX MIN MAX MIN MAX
tACC Address to Output Delay 120 150 200
tCE CE to Output Delay 120 150 200
tOE OE to Output Delay 35 40 40
tDF Output Disable to Output Float 35 40 40 ns
(Note 3)
Output Hold From Addresses,
tOH CE or OE, Whichever Occurred 0 0 0
First (Note 3)
DC READ CHARACTERISTICS
Over Operating Range. (See Above)
SYMBOL PARAMETER TEST CONDITIONS MIN MAX UNITS
VIL Input Low Voltage –0.5 0.8 V
VIH Input High Voltage 2.0 VCC + 1 V
VOL Output Low Voltage IOL = 2.1 mA 0.4 V
VOH Output High Voltage IOH = –400 µA 3.5 V
ISB1 VCC Standby Current (CMOS) CE = VCC ± 0.3 V (Note 2) 100 µA
ISB2 VCC Standby Current CE = VIH 1mA
I
CC VCC Active Current CE = OE = VIL F = 5 MHz 40 mA
(Note 1) F = 8 MHz 50 mA
IPP VPP Supply Current VPP = VCC 100 µA
VPP VPP Read Voltage VCC –0.4 VCC V
ILI Input Leakage Current VIN = 5.5 V or Gnd –10 10 µA
ILO Output Leakage Current VOUT = 5.5 V or Gnd –10 10 µA
WS27C256L
4-20
OPERATING RANGE
RANGE TEMPERATURE VCC
Military –55°C to +125°C +5V ± 10%
ABSOLUTE MAXIMUM RATINGS*
Storage Temperature............................–65° to + 150°C
Voltage on any Pin with
Respect to Ground ....................................–0.6V to +7V
VPP with Respect to Ground...................–0.6V to + 14V
VCC Supply Voltage with
Respect to Ground ....................................–0.6V to +7V
ESD Protection..................................................>2000V
NOTES: 1. The supply current is the sum of ICC and IPP. The maximum current value is with Outputs O0to O7unloaded.
2. CMOS inputs: VIL = GND ± 0.3V, VIH = VCC ± 0.3 V.
*NOTICE:
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at these or any other conditions above
those indicated in the operational sections of this
specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of
time may affect device reliability.
NOTE: 3.
This parameter is only sampled and is not 100% tested. Output Float is defined as the point where data is no longer driven – see timing
diagram.