128M DDR SDRAM
K4D28163HD
- 1 - Rev. 1.4(Aug. 2002)
128Mbit DDR SDRAM
Revision 1.4
August 2002
2M x 16Bit x 4 Banks
Double Data Rate Synchronous DRAM
Samsung Electronics reserves the right to change products or specification without notice.
128M DDR SDRAM
K4D28163HD
- 2 - Rev. 1.4(Aug. 2002)
Revision History
Revision 1.4 (August 13, 2002)
• Changed ICC3P
• Typo corrected
• Changed refresh period of K4D28163HD-TC36/40 from 4K/64ms to 4K/32ms.
Revision 1.3 (May 29, 2002)
• Added K4D28163HD-TC36 (275MHz)
Revision 1.2 (May 8, 2002)
• Typo corrected
Revision 1.1 (January 7, 2002)
• Increased Icc2N by 20mA
Revision 1.0 (December 22, 2001)
• Defined DC spec.
Revision 0.4 (December 10, 2001) - Target Spec
• Removed Full page Burst Length from the spec.
Revision 0.3 (November 6, 2001) - Target Spec
• Removed K4D28163HD-TC45/55 from the spec.
Revision 0.2 (October 25, 2001) - Target Spec
• Removed K4D28163HD-TC33/36 from the spec.
Revision 0.1 (October 12, 2001) - Target Spec
• Changed VDD from 3.3V + 10% to 3.3V + 5%
Revision 0.0 (October 10, 2001) - Target Spec
• Defined Target Specification
128M DDR SDRAM
K4D28163HD
- 3 - Rev. 1.4(Aug. 2002)
The K4D28163HD is 134,217,728 bits of hyper synchronous data rate Dynamic RAM organized as 4 x 2.097,152 words
by 16 bits, fabricated with SAMSUNG’s high performance CMOS technology. Synchronous features with Data Strobe allow
extremely high performance up to 1.1GB/s/chip. I/O transactions are possible on both edges of the clock cycle. Range of
operating frequencies, programmable burst length and programmable latencies allow the device to be useful for a variety
of high performance memory system applications.
• 3.3V + 5% power supply for device operation
• 2.5V + 5% power supply for I/O interface
• SSTL_2 compatible inputs/outputs
• 4 banks operation
• MRS cycle with address key programs
-. Read latency 3 (clock)
-. Burst length (2, 4 and 8)
-. Burst type (sequential & interleave)
• All inputs except data & DM are sampled at the positive
going edge of the system clock
• Differential clock input
• No Wrtie-Interrupted by Read Function
GENERAL DESCRIPTION
FEATURES
• 2 DQS’s ( 1DQS / Byte )
• Data I/O transactions on both edges of Data strobe
• DLL aligns DQ and DQS transitions with Clock transition
• Edge aligned data & data strobe output
• Center aligned data & data strobe input
• DM for write masking only
• Auto & Self refresh
• 32ms refresh period (4K cycle) for -36/-40
• 64ms refresh period (4K cycle) for -50/-60
• 66pin TSOP-II
• Maximum clock frequency up to 275MHz
• Maximum data rate up to 550Mbps/pin
FOR 2M x 16Bit x 4 Bank DDR SDRAM
2M x 16Bit x 4 Banks Double Data Rate Synchronous DRAM
with Bi-directional Data Strobe and DLL
ORDERING INFORMATION
Part NO. Max Freq. Max Data Rate Interface Package
K4D28163HD-TC36 275MHz 550Mbps/pin
SSTL_2 66pin TSOP-II
K4D28163HD-TC40 250MHz 500Mbps/pin
K4D28163HD-TC50 200MHz 400Mbps/pin
K4D28163HD-TC60 166MHz 333Mbps/pin
128M DDR SDRAM
K4D28163HD
- 4 - Rev. 1.4(Aug. 2002)
PIN CONFIGURATION (Top View)
PIN DESCRIPTION
CK,CK Differential Clock Input BA0, BA1 Bank Select Address
CKE Clock Enable A0 ~A11 Address Input
CS Chip Select DQ0 ~ DQ15 Data Input/Output
RAS Row Address Strobe VDD Power
CAS Column Address Strobe VSS Ground
WE Write Enable VDDQ Power for DQ’s
LDQS,UDQS Data Strobe VSSQ Ground for DQ’s
LDM,UDM Data Mask NC No Connection
RFU Reserved for Future Use
1
66 PIN TSOP(II)
(400mil x 875mil)
2
3
4
5
6
7
8
9
10
11
12
20
19
18
17
16
15
14
13
27
26
25
24
23
22
21
54
53
52
51
50
49
48
47
46
45
44
43
35
36
37
38
39
40
41
42
55
56
57
58
59
60
34
(0.65 mm Pin Pitch)
33
32
31
30
29
28
61
62
63
64
65
66
VDD
DQ0
VDDQ
DQ1
DQ2
VSSQ
DQ3
DQ4
VDDQ
DQ5
DQ6
VSSQ
BA0
CS
RAS
CAS
WE
LDM
VDDQ
DQ7
VDD
A3
A2
A1
A0
AP/A10
BA1
NC
LDQS
NC
NC
NC
VDD
VSS
DQ15
VSSQ
DQ14
DQ13
VDDQ
DQ12
DQ11
VSSQ
DQ10
DQ9
VDDQ
A11
CKE
CK
UDM
VREF
VSSQ
DQ8
VSS
A4
A5
A6
A7
A8
A9
NC
UDQS
NC
VSS
CK
NC
NC
128M DDR SDRAM
K4D28163HD
- 5 - Rev. 1.4(Aug. 2002)
INPUT/OUTPUT FUNCTIONAL DESCRIPTION
*1 : The timing reference point for the differential clocking is the cross point of CK and CK.
For any applications using the single ended clocking, apply VREF to CK pin.
Symbol Type Function
CK, CK*1 Input The differential system clock Input.
All of the inputs are sampled on the rising edge of the clock except
DQ’s and DM’s that are sampled on both edges of the DQS.
CKE Input Activates the CK signal when high and deactivates the CK signal
when low. By deactivating the clock, CKE low indicates the Power
down mode or Self refresh mode.
CS Input CS enables the command decoder when low and disabled the com-
mand decoder when high. When the command decoder is disabled,
new commands are ignored but previous operations continue.
RAS Input Latches row addresses on the positive going edge of the CK with
RAS low. Enables row access & precharge.
CAS Input Latches column addresses on the positive going edge of the CK with
CAS low. Enables column access.
WE Input Enables write operation and row precharge.
Latches data in starting from CAS, WE active.
LDQS,(U)DQS Input/Output Data input and output are synchronized with both edge of DQS.
For the x16, LDQS corresponds to the data on DQ0-DQ7 ; UDQS
corresponds to the data on DQ8-DQ15.
LDM,UDM Input Data in Mask. Data In is masked by DM Latency=0 when DM is
high in burst write. For the x16, LDM corresponds to the data on
DQ0-DQ7 ; UDM correspons to the data on DQ8-DQ15.
DQ0 ~ DQ15 Input/Output Data inputs/Outputs are multiplexed on the same pins.
BA0, BA1Input Selects which bank is to be active.
A0 ~ A11 Input Row/Column addresses are multiplexed on the same pins.
Row addresses : RA0 ~ RA11, Column addresses : CA0 ~ CA8.
VDD/VSS Power Supply Power and ground for the input buffers and core logic.
VDDQ/VSSQ Power Supply Isolated power supply and ground for the output buffers to provide
improved noise immunity.
VREF Power Supply Reference voltage for inputs, used for SSTL interface.
NC/RFU No connection/
Reserved for future use This pin is recommended to be left "No connection" on the device
128M DDR SDRAM
K4D28163HD
- 6 - Rev. 1.4(Aug. 2002)
BLOCK DIAGRAM (2Mbit x 16I/O x 4 Bank)
Bank Select
Timing Register
Address Register
Refresh Counter
Row Buffer
Row DecoderCol. Buffer
Data Input Register
Serial to parallel
2Mx16
2Mx16
2Mx16
2Mx16
Sense AMP
2-bit prefetch
Output BufferI/O Control
Column Decoder
Latency & Burst Length
Programming Register
Strobe
Gen.
CK,CK
ADDR
LCKE
CK,CK CKE CS RAS CAS WE LDM
LDMi
CK,CK
LCAS
LRAS LCBR LWE
LWCBR
LRAS
LCBR
CK, CK
32 16
16
LWE
LDMi
x16
DQi
Data Strobe
Intput Buffer
DLL
UDM
128M DDR SDRAM
K4D28163HD
- 7 - Rev. 1.4(Aug. 2002)
• Power-Up Sequence
DDR SDRAMs must be powered up and initialized in a predefined manner to prevent undefined operations.
1. Apply power and keep CKE at low state (All other inputs may be undefined)
- Apply VDD before VDDQ .
- Apply VDDQ before VREF & VTT
2. Start clock and maintain stable condition for minimum 200us.
3. The minimum of 200us after stable power and clock(CK,CK ), apply NOP and take CKE to be high .
4. Issue precharge command for all banks of the device.
5. Issue a EMRS command to enable DLL
*1 6. Issue a MRS command to reset DLL. The additional 200 clock cycles are required to lock the DLL.
*1,2 7. Issue precharge command for all banks of the device.
8. Issue at least 2 or more auto-refresh commands.
9. Issue a mode register set command with A8 to low to initialize the mode register.
*1 The additional 200cycles of clock input is required to lock the DLL after enabling DLL.
*2 Sequence of 6&7 is regardless of the order.
FUNCTIONAL DESCRIPTION
Power up & Initialization Sequence
Command
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
tRP 2 Clock min.
precharge
ALL Banks 2nd Auto
Refresh Mode
Register Set Any
Command
tRFC
1st Auto
Refresh
tRFC
EMRS MRS
2 Clock min.
DLL Reset
~
~~
~~
~
~
~~
~~
~
precharge
ALL Banks
tRP
Inputs must be
stable for 200us
~
~
200 Clock min.
~
~
2 Clock min.
CK,CK
128M DDR SDRAM
K4D28163HD
- 8 - Rev. 1.4(Aug. 2002)
The mode register stores the data for controlling the various operating modes of DDR SDRAM. It programs CAS latency,
addressing mode, burst length, test mode, DLL reset and various vendor specific options to make DDR SDRAM useful for
variety of different applications. The default value of the mode register is not defined, therefore the mode register must be
written after EMRS setting for proper operation. The mode register is written by asserting low on CS, RAS, CAS and
WE(The DDR SDRAM should be in active mode with CKE already high prior to writing into the mode register). The state of
address pins A0 ~ A11 and BA0, BA1 in the same cycle as CS, RAS, CAS and WE going low is written in the mode register.
Minimum two clock cycles are requested to complete the write operation in the mode register. The mode register contents
can be changed using the same command and clock cycle requirements during operation as long as all banks are in the
idle state. The mode register is divided into various fields depending on functionality. The burst length uses A0 ~ A2,
addressing mode uses A3, CAS latency(read latency from column address) uses A4 ~ A6. A7 is used for test mode. A8 is
used for DLL reset. A7,A8, BA0 and BA1 must be set to low for normal MRS operation. Refer to the table for specific codes
for various burst length, addressing modes and CAS latencies.
MODE REGISTER SET(MRS)
Address Bus
Mode Register
CAS Latency
A6A5A4Latency
0 0 0 Reserved
0 0 1 Reserved
0 1 0 Reserved
0 1 1 3
1 0 0 Reserved
1 0 1 Reserved
1 1 0 Reserved
1 1 1 Reserved
Burst Length
A2A1A0Burst Type
Sequential Interleave
0 0 0 Reserve Reserve
0 0 1 2 2
0 1 0 4 4
0 1 1 8 8
1 0 0 Reserve Reserve
1 0 1 Reserve Reserve
1 1 0 Reserve Reserve
1 1 1 Reserve Reserve
Burst Type
A3Type
0Sequential
1Interleave
* RFU(Reserved for future use)
should stay "0" during MRS
cycle.
MRS Cycle
Command
*1 : MRS can be issued only at all banks precharge state.
*2 : Minimum tRP is required to issue MRS command.
CK, CK
Precharge NOP NOPMRS NOPNOP
20 1 53 4 86 7
Any
NOP All Banks Command
tRP tMRD=2 tCK
BA1BA0A11 A10 A9A8A7A6A5A4A3A2A1A0
RFU 0RFU DLL TM CAS Latency BT Burst Length
BA0An ~ A0
0MRS
1EMRS
DLL
A8DLL Reset
0No
1Yes
Test Mode
A7mode
0Normal
1Test
NOP
128M DDR SDRAM
K4D28163HD
- 9 - Rev. 1.4(Aug. 2002)
The extended mode register stores the data for enabling or disabling DLL and selecting output driver
strength. The default value of the extended mode register is not defined, therefore the extened mode register
must be written after power up for enabling or disabling DLL. The extended mode register is written by assert-
ing low on CS, RAS, CAS, WE and high on BA0(The DDR SDRAM should be in all bank precharge with CKE
already high prior to writing into the extended mode register). The state of address pins A0, A2 ~ A5, A7 ~ A11
and BA1 in the same cycle as CS, RAS, CAS and WE going low are written in the extended mode register. A1
and A6 are used for setting driver strength to normal, weak or matched impedance. Two clock cycles are
required to complete the write operation in the extended mode register. The mode register contents can be
changed using the same command and clock cycle requirements during operation as long as all banks are in
the idle state. A0 is used for DLL enable or disable. "High" on BA0 is used for EMRS. All the other address
pins except A0,A1,A6 and BA0 must be set to low for proper EMRS operation. Refer to the table for specific
codes.
A0DLL Enable
0Enable
1Disable
BA0An ~ A0
0MRS
1EMRS
EXTENDED MODE REGISTER SET(EMRS)
Address Bus
Extended
*1 : RFU(Reserved for future use) should stay "0" during EMRS cycle.
A6A1Output Driver Impedence Control
0 1 Weak
1 1 Matched
RFU 1RFU D.I.C RFU D.I.C DLL
BA1BA0A11 A10 A9A8A7A6A5A4A3A2A1A0
Mode Register
128M DDR SDRAM
K4D28163HD
- 10 - Rev. 1.4(Aug. 2002)
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
Note :
POWER & DC OPERATING CONDITIONS(SSTL_2 In/Out)
Recommended operating conditions(Voltage referenced to VSS=0V, TA=0 to 65°C)
Parameter Symbol Min Typ Max Unit Note
Device Supply voltage VDD 3.135 3.3 3.465 V1
Output Supply voltage VDDQ 2.375 2.50 2.625 V1
Reference voltage VREF 0.49*VDDQ -0.51*VDDQ V2
Termination voltage Vtt VREF-0.04 VREF VREF+0.04 V3
Input logic high voltage VIH(DC) VREF+0.15 -VDDQ+0.30 V4
Input logic low voltage VIL(DC) -0.30 -VREF-0.15 V5
Output logic high voltage VOH Vtt+0.76 - - VIOH=-15.2mA
Output logic low voltage VOL - - Vtt-0.76 VIOL=+15.2mA
Input leakage current IIL -5 -5uA 6
Output leakage current IOL -5 -5uA 6
ABSOLUTE MAXIMUM RATINGS
Parameter Symbol Value Unit
Voltage on any pin relative to Vss VIN, VOUT -0.5 ~ 3.6 V
Voltage on VDD supply relative to Vss VDD -1.0 ~ 3.6 V
Voltage on VDD supply relative to Vss VDDQ -0.5 ~ 3.6 V
Storage temperature TSTG -55 ~ +150 °C
Power dissipation PD1.0 W
Short circuit current IOS 50 mA
1. Under all conditions VDDQ must be less than or equal to VDD.
2. VREF is expected to equal 0.50*VDDQ of the transmitting device and to track variations in the DC level of the same. Peak to
peak noise on the VREF may not exceed + 2% of the DC value. Thus, from 0.50*VDDQ, VREF is allowed + 25mV for DC error
and an additional + 25mV for AC noise.
3. Vtt of the transmitting device must track VREF of the receiving device.
4. VIH(max.)= VDDQ +1.5V for a pulse width and it can not be greater than 1/3 of the cycle rate.
5. VIL(mim.)= -1.5V for a pulse width and it can not be greater than 1/3 of the cycle rate.
6. For any pin under test input of 0V < VIN < VDD is acceptable. For all other pins that are not under test VIN=0V.
Note :
128M DDR SDRAM
K4D28163HD
- 11 - Rev. 1.4(Aug. 2002)
DC CHARACTERISTICS
Note : 1. Measured with outputs open.
Parameter Symbol Test Condition Version Unit Note
-36 -40 -50 -60
Operating Current
(One Bank Active) ICC1 Burst Lenth=2 tRC ≥ tRC(min)
IOL=0mA, tCC= tCC(min) 200 190 170 165 mA 1
Precharge Standby Current
in Power-down mode ICC2PCKE ≤ VIL(max), tCC= tCC(min) 5mA
Precharge Standby Current
in Non Power-down mode ICC2NCKE ≥ VIH(min), CS ≥ VIH(min),
tCC= tCC(min) 70 65 60 60 mA
Active Standby Current
power-down mode ICC3PCKE ≤ VIL(max), tCC= tCC(min) 100 90 75 70 mA
Active Standby Current in
in Non Power-down mode ICC3NCKE ≥ VIH(min), CS ≥ VIH(min),
tCC= tCC(min) 130 120 110 90 mA
Operating Current
( Burst Mode) ICC4 tRC ≥ tRFC(min)tRC ≥ tRFC(min)
Page Burst, All Banks activated. 380 350 310 280 mA
Refresh Current ICC5 tRC ≥ tRFC(min) 250 220 210 200 mA
Self Refresh Current ICC6 CKE ≤ 0.2V 2mA
Recommended operating conditions Unless Otherwise Noted, TA=0 to 65°C)
1. VID is the magnitude of the difference between the input level on CK and the input level on CK
2. The value of VIX is expected to equal 0.5*VDDQ of the transmitting device and must track variations in the DC level of the same
Note :
AC INPUT OPERATING CONDITIONS
Recommended operating conditions(Voltage referenced to VSS=0V, VDD=3.3V+ 5%, VDDQ=2.5V+ 5%,TA=0 to 65°C)
Parameter Symbol Min Typ Max Unit Note
Input High (Logic 1) Voltage; DQ VIH VREF+0.35 - - V
Input Low (Logic 0) Voltage; DQ VIL - - VREF-0.35 V
Clock Input Differential Voltage; CK and CK VID 0.7 -VDDQ+0.6 V1
Clock Input Crossing Point Voltage; CK and CK VIX 0.5*VDDQ-0.2 -0.5*VDDQ+0.2 V2
128M DDR SDRAM
K4D28163HD
- 12 - Rev. 1.4(Aug. 2002)
RT=50Ω
Output
CLOAD=30pF
(Fig. 1) Output Load Circuit
Z0=50ΩVREF
=0.5*VDDQ
Vtt=0.5*VDDQ
DECOUPLING CAPACITANCE GUIDE LINE
Recommended decoupling capacitance added to power line at board.
Parameter Symbol Value Unit
Decoupling Capacitance between VDD and VSS CDC1 0.1 + 0.01 uF
Decoupling Capacitance between VDDQ and VSSQ CDC2 0.1 + 0.01 uF
1. VDD and VDDQ pins are separated each other.
All VDD pins are connected in chip. All VDDQ pins are connected in chip.
2. VSS and VSSQ pins are separated each other
All VSS pins are connected in chip. All VSSQ pins are connected in chip.
Note :
AC OPERATING TEST CONDITIONS (VDD=3.3V±5%, TA= 0 to 65°C)
Parameter Value Unit Note
Input reference voltage for CK(for single ended) 0.50*VDDQ V
CK and CK signal maximum peak swing 1.5 V
CK signal minimum slew rate 1.0 V/ns
Input Levels(VIH/VIL)VREF+0.35/VREF-0.35 V
Input timing measurement reference level VREF V
Output timing measurement reference level Vtt V
Output load condition See Fig.1
CAPACITANCE (VDD=3.3V, TA= 25°C, f=1MHz)
Parameter Symbol Min Max Unit
Input capacitance( CK, CK )CIN1 1.0 5.0 pF
Input capacitance(A0~A11, BA0~BA1)CIN2 1.0 4.0 pF
Input capacitance
( CKE, CS, RAS,CAS, WE ) CIN3 1.0 4.0 pF
Data & DQS input/output capacitance(DQ0~DQ31)COUT 1.0 6.5 pF
Input capacitance(DM0 ~ DM3) CIN4 1.0 6.5 pF
128M DDR SDRAM
K4D28163HD
- 13 - Rev. 1.4(Aug. 2002)
AC CHARACTERISTICS
Parameter Sym-
bol -36 -40 -50 -60 Unit Note
Min Max Min Max Min Max Min Max
CK cycle time CL=3 tCK 3.6 64.0 75.0 10 6.0 10 ns
CK high level width tCH 0.45 0.55 0.45 0.55 0.45 0.55 0.45 0.55 tCK
CK low level width tCL 0.45 0.55 0.45 0.55 0.45 0.55 0.45 0.55 tCK
DQS out access time from CK tDQSCK -0.6 0.6 -0.6 0.6 -0.7 0.7 -0.75 0.75 ns
Output access time from CK tAC -0.6 0.6 -0.6 0.6 -0.7 0.7 -0.75 0.75 ns
Data strobe edge to Dout edge tDQSQ -0.4 -0.4 -0.45 -0.5 ns 1
Read preamble tRPRE 0.9 1.1 0.9 1.1 0.9 1.1 0.9 1.1 tCK
Read postamble tRPST 0.4 0.6 0.4 0.6 0.4 0.6 0.4 0.6 tCK
CK to valid DQS-in tDQSS 0.85 1.15 0.85 1.15 0.8 1.2 0.75 1.25 tCK
DQS-In setup time tWPRES 0-0-0-0-ns
DQS-in hold time tWPREH 0.35 -0.35 -0.3 -0.25 -tCK
DQS write postamble tWPST 0.4 0.6 0.4 0.6 0.4 0.6 0.4 0.6 tCK
DQS-In high level width tDQSH 0.4 0.6 0.4 0.6 0.4 0.6 0.4 0.6 tCK
DQS-In low level width tDQSL 0.4 0.6 0.4 0.6 0.4 0.6 0.4 0.6 tCK
Address and Control input setup tIS 0.9 -0.9 -1.0 -1.1 -ns
Address and Control input hold tIH 0.9 -0.9 -1.0 -1.1 -ns
DQ and DM setup time to DQS tDS 0.4 -0.4 -0.45 -0.5 -ns
DQ and DM hold time to DQS tDH 0.4 -0.4 -0.45 -0.5 -ns
Clock half period tHP tCLmin
or
tCHmin -tCLmin
or
tCHmin -tCLmin
or
tCHmin -tCLmin
or
tCHmin -ns 1
Data output hold time from DQS tQH tHP-0.4 -tHP-0.4 -tHP-0.45 -tHP-0.5 -ns 1
Note 1 :
- The JEDEC DDR specification currently defines the output data valid window(tDV) as the time period when the data
strobe and all data associated with that data strobe are coincidentally valid.
- The previously used definition of tDV(=0.35tCK) artificially penalizes system timing budgets by assuming the worst
case
output vaild window even then the clock duty cycle applied to the device is better than 45/55%
- A new AC timing term, tQH which stands for data output hold time from DQS is difined to account for clock duty cycle
variation and replaces tDV
- tQHmin = tHP-X where
. tHP=Minimum half clock period for any given cycle and is defined by clock high or clock low time(tCH,tCL)
. X=A frequency dependent timing allowance account for tDQSQmax
128M DDR SDRAM
K4D28163HD
- 14 - Rev. 1.4(Aug. 2002)
AC CHARACTERISTICS (II)
K4D28163HD-TC36
Frequency Cas Latency tRC tRFC tRAS tRCD tRP tRRD tDAL Unit
275MHz ( 3.6ns ) 3 15 17 10 5 5 2 8 tCK
250MHz ( 4.0ns ) 3 14 16 9 5 5 2 8 tCK
200MHz ( 5.0ns ) 3 12 14 8 4 4 2 7 tCK
166MHz ( 6.0ns ) 3 10 12 7 3 3 2 6 tCK
(Unit : Number of Clock)
AC CHARACTERISTICS (I)
Note : 1. For normal write operation, even numbers of Din are to be written inside DRAM
Parameter Symbol -36 -40 -50 -60 Unit Note
Min Max Min Max Min Max Min Max
Row cycle time tRC 15 -14 -12 -10 -tCK
Refresh row cycle time tRFC 17 -16 -14 -12 -tCK
Row active time tRAS 10 100K 9100K 8100K 7100K tCK
RAS to CAS delay tRCD 5-5-4-3-tCK
Row precharge time tRP 5-5-4-3-tCK
Row active to Row active tRRD 2-2-2-2-tCK
Last data in to Row precharge
@Normal Precharge tWR 3-3-2-2-tCK 1
Last data in to Row precharge
@Auto Precharge tWR_A 3-3-3-3-tCK 1
Last data in to Read command tCDLR 2-2-2-2-tCK 1
Col. address to Col. address tCCD 1-1-1-1-tCK
Mode register set cycle time tMRD 2-2-2-2-tCK
Auto precharge write recovery
+ Precharge tDAL 8-8-7-6-tCK
Exit self refresh to read com- tXSR 200 -200 -200 -200 -tCK
Power down exit time tPDEX 1tCK+tIS -1tCK+tIS -1tCK+tIS -1tCK+tIS -ns
Refresh interval time tREF 7.8 -7.8 -15.6 -15.6 -us
K4D28163HD-TC40
Frequency Cas Latency tRC tRFC tRAS tRCD tRP tRRD tDAL Unit
250MHz ( 4.0ns ) 3 14 16 9 5 5 2 8 tCK
200MHz ( 5.0ns ) 3 12 14 8 4 4 2 7 tCK
166MHz ( 6.0ns ) 3 10 12 7 3 3 2 6 tCK
K4D28163HD-TC50
Frequency Cas Latency tRC tRFC tRAS tRCD tRP tRRD tDAL Unit
200MHz ( 5.0ns ) 3 12 14 8 4 4 2 7 tCK
166MHz ( 6.0ns ) 3 10 12 7 3 3 2 6 tCK
128M DDR SDRAM
K4D28163HD
- 15 - Rev. 1.4(Aug. 2002)
0 1 2 3 4 5 6 7 8
BAa
Ra
Ra
tRCD
ACTIVEA ACTIVEB WRITEA WRITEB
13 14 15 16 17 18 19 20 21
BAa BAb
Ca Cb
BAa
Ca
9 10 11 12
PRECH
BAa
22
Ra
Normal Write Burst
(@ BL=4) Multi Bank Interleaving Write Burst
(@ BL=4)
BAa
Ra
Ra
BAb
Rb
Rb
tRAS
tRC
tRP
tRRD
COMMAND
DQS
DQ
WE
DM
CK, CK
A10/AP
ADDR
(A0~A11)
BA[1:0]
ACTIVEA WRITEA
Da0 Da1 Da2Da3
Simplified Timing @ BL=4
Db0 Db1 Db3Da0 Da1 Da2Da3 Db2
K4D28163HD-TC60
Frequency Cas Latency tRC tRFC tRAS tRCD tRP tRRD tDAL Unit
166MHz ( 6.0ns ) 3 10 12 7 3 3 2 6 tCK
128M DDR SDRAM
K4D28163HD
- 16 - Rev. 1.4(Aug. 2002)
PACKAGE DIMENSIONS (66pin TSOP-II)
Units : Millimeters
0.30±0.080.65TYP(0.71)
22.22±0.10
0.125
(0.80)
10.16±0.10
0×~8×
#1 #33
#66 #34
(1.50)
(1.50)
0.65±0.08
1.00±0.10
1.20MAX
(0.50)(0.50)(10.76)
11.76±0.20
(10×)(10×)
+0.075
-0.035
(0.80)
0.10 MAX
0.075 MAX
[ ]
0.05 MIN
(10×)
(10×)
(R0.15)
0.210±0.05
0.665±0.05
(R0.15)
(4×)
(R0.25)
(R0.2 5)
0.45~0.75
0.25TYP
NOTE
1. ( ) IS REFERENCE
2. [ ] IS ASS’Y OUT QUALITY
