Absolute Maximum Ratings
Parameter Units
ID @ VGS = 10V, TC = 25°C Continuous Drain Current 16*
ID @ VGS = 10V, TC = 100°C Continuous Drain Current 16*
IDM Pulsed Drain Current 156
PD @ TC = 25°C Max. Power Dissipation 100 W
Linear Derating Factor 0.8 W/°C
VGS Gate-to-Source Voltage ±20 V
EAS Single Pulse Avalanche Energy 100 mJ
IAR Avalanche Current 16* A
EAR Repetitive Avalanche Energy 10 mJ
dv/dt Peak Diode Recovery dv/dt 4.5 V/ns
TJOperating Junction -55 to 150
TSTG Storage Temperature Range
Lead Temperature 300(0.063in./1.6mm from case for 10 sec)
Weight 3.3 (Typical) g
PD - 94181
HEXFET® MOSFET technology is the key to International
Rectifier’s advanced line of power MOSFET transistors. The
efficient geometry design achieves very low on-state re-
sistance combined with high transconductance. HEXFET
transistors also feature all of the well-established advan-
tages of MOSFETs, such as v oltage control, very fast switch-
ing, ease of paralleling and electrical parameter temperature
stability. They are w ell-suited for applications such as switch-
ing power supplies, motor controls, inverters, choppers,
audio amplifiers, high energy pulse circuits, and virtually
any application where high reliability is required. The
HEXFET transistor’s totally isolated package eliminates the
need for additional isolating material between the device
and the heatsink. This improves thermal efficiency and
reduces drain capacitance.
oC
A
POWER MOSFET
THRU-HOLE (TO-257AA)
4/18/01
www.irf.com 1
60V, N-CHANNEL
HEXFET
®
MOSFET TECHNOLOGY
TO-257AA
Product Summary
Part Number RDS(on) IDEyelets
IRFY044 0.040 16*A Glass
IRFY044M 0.040 16*A Glass
Features:
nSimple Drive Requirements
nEase of Paralleling
nHermetically Sealed
nElectrically Isolated
nGlass Eyelets
nFor Space Level Applications
Refer to Ceramic Version Part
Numbers IRFY044C, IRFY044CM
For footnotes refer to the last page
IRFY044,IRFY044M
* Current is limited by pin diameter
IRFY044, IRFY044M
2www.irf.com
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter M in Typ Max Un its T e st Co nditions
BVDSS Drain-to-Source Breakdown Voltage 60 V VGS = 0V, ID = 1.0mA
BVDSS/TJTemperature Coefficient of Breakdown 0.68 V/°C Reference to 25°C, ID = 1.0mA
Voltage
RDS(on) Static Drain-to-Source On-State 0.04 VGS = 10V, ID = 16A
Resistance
VGS(th) Gate Threshold Voltage 2.0 4.0 V VDS = VGS, ID = 250µA
gfs Forward Transconductance 17 S ( )V
DS > 15V, IDS = 16A
IDSS Zero Gate Voltage Drain Current 25 VDS= 48V ,VGS=0V
250 VDS = 48V,
VGS = 0V, TJ = 125°C
IGSS Gate-to-Source Leakage Forward 100 VGS = 20V
IGSS Gate-to-Source Leakage Reverse -100 VGS = -20V
QgTotal Gate Charge 88 VGS =10V, ID = 16A
Qgs Gate-to-Source Charge 15 nC VDS = 30V
Qgd Gate-to-Drain (‘Miller’) Charge 52
td(on) Turn-On Delay Time 23 VDD = 30V, ID = 16A,
trRise Time 130 RG = 9.1
td(off) Turn-Off Delay Time 81
tfFall Time 79
LS + LDTotal Inductance 6.8
Ciss Input Capacitance 2400 VGS = 0V, VDS = 25V
Coss Output Capacitance 1100 pF f = 1.0MHz
Crss Reverse Transfer Capacitance 230
nA
nH
ns
µA
Measured from drain lead (6mm/0.25in. from
package) to source lead (6mm/0.25in. from
package)
Note: Corresponding Spice and Saber models are available on the G&S Website.
For footnotes refer to the last page
Thermal Resistance
Parameter Min Typ Max Units T est Conditions
RthJC Junction-to-Case 1.25
RthCS Case-to-sink 0.21
RthJA Junction-to-Ambient 80 Typical socket mount
°C/W
Source-Drain Diode Ratings and Characteristics
Parameter Min Typ Max Units T est Conditions
ISContinuous Source Current (Body Diode) 16*
ISM Pulse Source Current (Body Diode) 156
VSD Diode Forward Voltage 2.5 V Tj = 25°C, IS = 16A, VGS = 0V
trr Reverse Recovery Time 220 nS Tj = 25°C, IF = 16A, di/dt 100A/µs
QRR Reverse Recovery Charge 1.6 µC VDD 50V
ton Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD.
A
* Current is limited by pin diameter
www.irf.com 3
IRFY044, IRFY044M
Fig 4. Normalized On-Resistance
Vs. Temperature
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
ID=16A
IRFY044, IRFY044M
4www.irf.com
Fig 8. Maximum Safe Operating Area
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
Fig 7. Typical Source-Drain Diode
Forward Voltage
3
ID=16A
13a
13a
www.irf.com 5
IRFY044, IRFY044M
Fig 10a. Switching Time Test Circuit
V
DS
90%
10%
V
GS t
d(on)
t
r
t
d(off)
t
f
Fig 10b. Switching Time Waveforms
VDS
Pulse Width 1 µs
Duty Factor ≤ 0.1 %
RD
VGS
RGD.U.T.
10V
+
-
VDD
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 9. Maximum Drain Current Vs.
Case Temperature
IRFY044, IRFY044M
6www.irf.com
Q
G
Q
GS
Q
GD
V
G
Charge
D.U.T. VDS
ID
IG
3mA
VGS
.3µF
50K
.2µF
12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-
10 V
Fig 13b. Gate Charge Test Circuit
Fig 13a. Basic Gate Charge Waveform
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Fig 12b. Unclamped Inductive Waveforms
Fig 12a. Unclamped Inductive Test Circuit
tp
V
(BR)DSS
I
AS
R
G
I
AS
0.01
t
p
D.U.T
L
VDS
+
-V
DD
DRIVER
A
15V
20V
.
1
0
www.irf.com 7
IRFY044, IRFY044M
ISD 16A, di/dt 100A/µs,
VDD 60V, TJ 150°C
Pulse width 300 µs; Duty Cycle 2%
Repetitive Rating; Pulse width limited by
maximum junction temperature.
VDD = 25V, star ting TJ = 25°C, L= 0.78mH
Peak IL = 16A, VGS = 10V
Foot Notes:
Case Outline and Dimensions — TO-257AA
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.
Data and specifications subject to change without notice. 04/01