NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
1
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Features
DDR 512M bit, Die C, based on 90nm design rules
Double data rate architecture: two data transfers per
clock cycle
Bidirectional data strobe (DQS) is transmitted and
received with data, to be used in capturing data at the
receiver
DQS is edge-aligned with data for reads and is center-
aligned with data for writes
Differential clock inputs (CK and CK)
Four internal banks for concurrent operation
Data mask (DM) for write data
Support industrial grade (-6KI/-5TI)
DLL aligns DQ and DQS transitions with CK transitions
Commands entered on each positive CK edge; data and
data mask referenced to both edges of DQS
Burst lengths: 2, 4, or 8
CAS Latency: 2.5, 3
Auto Precharge option for each burst access
Auto Refresh and Self Refresh Modes
7.8µs Maximum Average Periodic Refresh Interval
2.5V (SSTL_2 compatible) I/O
VDD = VDDQ = 2.6V ± 0.1V (DDR400)
VDD = VDDQ = 2.5V ± 0.2V (DDR333)
HSF (Hazardous Substances Free) compliance
Description
Die C of 512Mb SDRAM devices based using DDR interface.
They are all based on Nanya’s 90 nm design process.
The 512Mb DDR SDRAM is a high-speed CMOS, dynamic
random-access memory containing 536,870,912 bits. It is
internally configured as a quad-bank DRAM.
The 512Mb DDR SDRAM uses a double-data-rate architec-
ture to achieve high-speed operation. The double data rate
architecture is essentially a 2n prefetch architecture with an
interface designed to transfer two data words per clock cycle
at the I/O pins. A single read or write access for the 512Mb
DDR SDRAM effectively consists of a single 2n-bit wide, one
clock cycle data transfer at the internal DRAM core and two
corresponding n-bit wide, one-half-clock-cycle data transfers
at the I/O pins.
A bidirectional data strobe (DQS) is transmitted externally,
along with data, for use in data capture at the receiver. DQS
is a strobe transmitted by the DDR SDRAM during Reads
and by the memory controller during Writes. DQS is edge-
aligned with data for Reads and center-aligned with data for
Writes.
The 512Mb DDR SDRAM operates from a differential clock
(CK and CK; the crossing of CK going high and CK going
LOW is referred to as the positive edge of CK). Commands
(address and control signals) are registered at every positive
edge of CK. Input data is registered on both edges of DQS,
and output data is referenced to both edges of DQS, as well
as to both edges of CK.
Read and write accesses to the DDR SDRAM are burst ori-
ented; accesses start at a selected location and continue for
a programmed number of locations in a programmed
sequence. Accesses begin with the registration of an Active
command, which is then followed by a Read or Write com-
mand. The address bits registered coincident with the Active
command are used to select the bank and row to be
accessed. The address bits registered coincident with the
Read or Write command are used to select the bank and the
starting column location for the burst access.
The DDR SDRAM provides for programmable Read or Write
burst lengths of 2, 4, or 8 locations. An Auto Precharge func-
tion may be enabled to provide a self-timed row precharge
that is initiated at the end of the burst access.
As with standard SDRAMs, the pipelined, multibank architec-
ture of DDR SDRAMs allows for concurrent operation,
thereby providing high effective bandwidth by hiding row pre-
charge and activation time.
An auto refresh mode is provided along with a power-saving
Power Down mode. All inputs are compatible with the JEDEC
Standard for SSTL_2. All outputs are SSTL_2, Class II com-
patible.
The functionality described and the timing specifications
included in this data sheet are for the DLL Enabled mode of
operation.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
2
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Ordering Information
Org. Part Number Package
Speed
Comments
Clock (MHz) CL-tRCD-tRP
STANDARD GRADE
128M x 4
NT5DS128M4CS-5T
66 pin TSOP-II
200 3-3-3 DDR400
NT5DS128M4CS-6K 166 2.5-3-3 DDR333
64M x 8
NT5DS64M8CS-5T 200 3-3-3 DDR400
NT5DS64M8CS-6K 166 2.5-3-3 DDR333
NT5DS64M8CG-5T 60ball BGA
0.8mmx1.0mm
Pitch
200 3-3-3 DDR400
NT5DS64M8CG-6K 166 2.5-3-3 DDR333
32M x 16
NT5DS32M16CS-5T
66 pin TSOP-II
200 3-3-3 DDR400
NT5DS32M16CS-6K 166 2.5-3-3 DDR333
INDUSTRIAL GRADE
64M x 8
NT5DS64M8CS-5TI
66 pin TSOP-II
200 3-3-3 DDR400
NT5DS64M8CS-6KI 166 2.5-3-3 DDR333
32Mx16
NT5DS32M16CS-5TI 200 3-3-3 DDR400
NT5DS32M16CS-6KI 166 2.5-3-3 DDR333
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
3
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Pin Configuration - 400mil TSOP II (x4 / x8 / x16)
1
2
3
4
5
6
9
10
11
12
13
14
7
8
15
16
17
18
19
20
21
22
66
65
64
63
62
61
58
57
56
55
54
53
60
59
52
51
50
49
48
47
46
45
23
24
25
44
43
42
26
27
41
40
28
29
30
31
32
33
39
38
37
36
35
34
VDD
DQ0
VDDQ
NC
DQ1
VSSQ
VDDQ
NC
DQ3
VSSQ
NC
NC
NC
DQ2
VDDQ
NC
NC
VDD
NU
NC
WE
CAS
RAS
CS
NC
BA0
BA1
VSS
DQ7
VSSQ
NC
DQ6
VDDQ
VSSQ
NC
DQ4
VDDQ
NC
NC
NC
DQ5
VSSQ
DQS
NC
VREF
VSS
DM*
CK
CK
CKE
NC
A12
A11
A9
VDD
NC
VDDQ
NC
DQ0
VSSQ
VDDQ
NC
DQ1
VSSQ
NC
NC
NC
NC
VDDQ
NC
NC
VDD
NU
NC
WE
CAS
RAS
CS
NC
BA0
BA1
VSS
NC
VSSQ
NC
DQ3
VDDQ
VSSQ
NC
DQ2
VDDQ
NC
NC
NC
NC
VSSQ
DQS
NC
VREF
VSS
DM*
CK
CK
CKE
NC
A12
A11
A9
A10/AP
A0
A1
A2
A3
VDD
A10/AP
A0
A1
A2
A3
VDD
A8
A7
A6
A5
A4
VSS
A8
A7
A6
A5
A4
VSS
Column Address Table
Organization Column Address
128Mb x 4 A0-A9, A11, A12
64Mb x 8 A0-A9, A11
32Mb x 16 A0-A9
*DM is internally loaded to match DQ and DQS identically.
128Mb x 4
64Mb x 8
66-pin Plastic TSOP-II 400mil
32Mb x 16
VDD
DQ0
VDDQ
DQ1
DQ2
VSSQ
VDDQ
DQ5
DQ6
VSSQ
DQ7
NC
DQ3
DQ4
VDDQ
LDQS
NC
VDD
NU
LDM*
WE
CAS
RAS
CS
NC
BA0
BA1
A10/AP
A0
A1
A2
A3
VDD
VSS
DQ15
VSSQ
DQ14
DQ13
VDDQ
VSSQ
DQ10
DQ9
VDDQ
DQ8
NC
DQ12
DQ11
VSSQ
UDQS
NC
VREF
VSS
UDM*
CK
CK
CKE
NC
A12
A11
A9
A8
A7
A6
A5
A4
VSS
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
4
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Pin Configuration - 60 balls 0.8mmx1.0mm Pitch CSP Package
<Top View >
See the balls through the package.
A
B
C
D
E
F
G
H
J
K
L
M
128 X 4
1
VSSQ
NC
NC
NC
NC
VREF
NC
VDDQ
VSSQ
VDDQ
VSSQ
VSS
CLK
A12
A11
A8
A6
A4
2
VSS
DQ3
NC
DQ2
DQS
DQM
CLK
CKE
A9
A7
A5
VSS
3
VDD
DQ0
NC
DQ1
NC
NC
WE
RAS
BA1
A0
A2
VDD
7
NC
VSSQ
VDDQ
VSSQ
VDDQ
VDD
CAS
CS
BA0
A10/
AP
A1
A3
8
VDDQ
NC
NC
NC
NC
NC
9
A
B
C
D
E
F
G
H
J
K
L
M
64 X 8
VSSQ
NC
NC
NC
NC
VREF
1
DQ7
VDDQ
VSSQ
VDDQ
VSSQ
VSS
CLK
A12
A11
A8
A6
A4
2
VSS
DQ6
DQ5
DQ4
DQS
DQM
CLK
CKE
A9
A7
A5
VSS
3
VDD
DQ1
DQ2
DQ3
NC
NC
WE
RAS
BA1
A0
A2
VDD
7
DQ0
VSSQ
VDDQ
VSSQ
VDDQ
VDD
CAS
CS
BA0
A10/
AP
A1
A3
8
VDDQ
NC
NC
NC
NC
NC
9
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
5
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Pin Configuration - 60 balls 0.8mmx1.0mm Pitch CSP Package
<Top View >
See the balls through the package.
A
B
C
D
E
F
G
H
J
K
L
M
32 X 16
1
VSSQ
DQ14
DQ12
DQ10
DQ8
VREF
DQ15
VDDQ
VSSQ
VDDQ
VSSQ
VSS
CLK
A12
A11
A8
A6
A4
2
VSS
DQ13
DQ11
DQ9
UDQS
UDM
CLK
CKE
A9
A7
A5
VSS
3
VDD
DQ2
DQ4
DQ6
LDQS
LDM
WE
RAS
BA1
A0
A2
VDD
7
DQ0
VSSQ
VDDQ
VSSQ
VDDQ
VDD
CAS
CS
BA0
A10/
AP
A1
A3
8
VDDQ
DQ1
DQ3
DQ5
DQ7
NC
9
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
6
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Input/Output Functional Description
Symbol Type Function
CK, CK Input
Clock: CK and CK are differential clock inputs. All address and control input signals are sampled
on the crossing of the positive edge of CK and negative edge of CK. Output (read) data is refer-
enced to the crossings of CK and CK (both directions of crossing).
CKE Input
Clock Enable: CKE HIGH activates, and CKE Low deactivates, internal clock signals and device
input buffers and output drivers. Taking CKE Low provides Precharge Power Down and Self
Refresh operation (all banks idle), or Active Power Down (row Active in any bank). CKE is syn-
chronous for power down entry and exit, and for self refresh entry. CKE is asynchronous for self
refresh exit. CKE must be maintained high throughout read and write accesses. Input buffers,
excluding CK, CK and CKE are disabled during Power Down. Input buffers, excluding CKE, are
disabled during self refresh. The standard pinout includes one CKE pin.
CS Input
Chip Select: All commands are masked when CS is registered high. CS provides for external
bank selection on systems with multiple banks. CS is considered part of the command code. The
standard pinout includes one CS pin.
RAS, CAS, WE Input Command Inputs: RAS, CAS and WE (along with CS) define the command being entered.
DM Input
Input Data Mask: DM is an input mask signal for write data. Input data is masked when DM is
sampled high coincident with that input data during a Write access. DM is sampled on both edges
of DQS. Although DM pins are input only, the DM loading matches the DQ and DQS loading. Dur-
ing a Read, DM can be driven high, low, or floated.
BA0, BA1 Input
Bank Address Inputs: BA0 and BA1 define to which bank an Active, Read, Write or Precharge
command is being applied. BA0 and BA1 also determines if the mode register or extended mode
register is to be accessed during a MRS or EMRS cycle.
A0 - A12 Input
Address Inputs: Provide the row address for Active commands, and the column address and
Auto Precharge bit for Read/Write commands, to select one location out of the memory array in
the respective bank. A10 is sampled during a Precharge command to determine whether the Pre-
charge applies to one bank (A10 low) or all banks (A10 high). If only one bank is to be precharged,
the bank is selected by BA0, BA1. The address inputs also provide the op-code during a Mode
Register Set command.
DQ Input/Output Data Input/Output: Data bus.
DQS Input/Output Data Strobe: Output with read data, input with write data. Edge-aligned with read data, centered
in write data. Used to capture write data.
NC - No Connect: No internal electrical connection is present.
NU - Not Useable:Electrical connection is present. Should not be connected at second level of assem-
bly.
VDDQ Supply DQ Power Supply: 2.6V ± 0.1V (DDR400); 2.5V ± 0.2V (DDR333)
VSSQ Supply DQ Ground
VDD Supply Power Supply: 2.6V ± 0.1V (DDR400); 2.5V ± 0.2V (DDR333)
VSS Supply Ground
VREF Supply SSTL_2 reference voltage
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
7
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Block Diagram (128Mb x 4)
Receivers
1
DQS
CK, CK
DLL
RAS
CAS
CK
CS
WE
CK
Control Logic
Column-Address
Counter/Latch
Mode
12
Command
Decode
A0-A12,
BA0, BA1
CKE
13
15
I/O Gating
DM Mask Logic
Bank0
Memory
Array
(8192 x 2048 x 8)
Sense Amplifiers
Bank1 Bank2 Bank3
13
11
1
2
2
Refresh Counter
4
4
4
Input
Register 1
1
1
11
8
8
2
8
clk
out
Data
Mask
Data
CK,
COL0
COL0
COL0
clk
in
MUX
DQS
Generator
4
4
4
44
8
DQ0-DQ3,
DM
DQS
1
Read Latch
Write
FIFO
&
Drivers
Note: This Functional Block Diagram is intended to facilitate user understanding of the operation of
the device; it does not represent an actual circuit implementation.
Note: DM is a unidirectional signal (input only), but is internally loaded to match the load of the bidi-
rectional DQ and DQS signals.
Column
Decoder
2048
(x8)
Row-Address MUX
Registers
13
16384
Bank0
Row-Address Latch
& Decoder
8192
Address Register
Drivers
Bank Control Logic
15
CK
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
8
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Block Diagram (64Mb x 8)
Receivers
1
DQS
CK, CK
DLL
RAS
CAS
CK
CS
WE
CK
Control Logic
Column-Address
Counter/Latch
Mode
11
Command
Decode
A0-A12,
BA0, BA1
CKE
15
15
I/O Gating
DM Mask Logic
Bank0
Memory
Array
(8192 x 1024 x 16)
Sense Amplifiers
Bank1 Bank2 Bank3
13
10
1
2
2
Refresh Counter
8
8
8
Input
Register1
1
1
11
16
16
2
16
clk
out
Data
Mask
Data
CK,
COL0
COL0
COL0
clk
in
MUX
DQS
Generator
8
8
8
88
16
DQ0-DQ7,
DM
DQS
1
Read Latch
Write
FIFO
&
Drivers
Note: This Functional Block Diagram is intended to facilitate user understanding of the operation of
the device; it does not represent an actual circuit implementation.
Note: DM is a unidirectional signal (input only), but is internally loaded to match the load of the bidi-
rectional DQ and DQS signals.
Column
Decoder
1024
(x16)
Row-Address MUX
Registers
13
16384
Bank0
Row-Address Latch
& Decoder
8192
Address Register
Drivers
Bank Control Logic
13
CK
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
9
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Block Diagram (32Mb x 16)
Receivers
1
DQS
CK, CK
DLL
RAS
CAS
CK
CS
WE
CK
Control Logic
Column-Address
Counter/Latch
Mode
10
Command
Decode
A0-A12,
BA0, BA1
CKE
15
15
I/O Gating
DM Mask Logic
Bank0
Memory
Array
(8192 x 512 x 32)
Sense Amplifiers
Bank1 Bank2 Bank3
13
9
1
2
2
Refresh Counter
16
16
16
Input
Register 1
1
1
11
32
32
2
32
clk
out
Data
Mask
Data
CK,
COL0
COL0
COL0
clk
in
MUX
DQS
Generator
16
16
16
16 16
32
DQ0-DQ15,
LDM, UDM
LDQS,UDQS
2
Read Latch
Write
FIFO
&
Drivers
Note: This Functional Block Diagram is intended to facilitate user understanding of the operation of
the device; it does not represent an actual circuit implementation.
Note: UDM and LDM are unidirectional signals (input only), but is internally loaded to match the
load of the bidirectional DQ, UDQS, and LDQS signals.
Column
Decoder
512
(x32)
Row-Address MUX
Registers
13
16384
Bank0
Row-Address Latch
& Decoder
8192
Address Register
Drivers
Bank Control Logic
13
CK
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
10
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Functional Description
The 512Mb DDR SDRAM is a high-speed CMOS, dynamic random-access memory containing 536,870,912 bits. The 512Mb
DDR SDRAM is internally configured as a quad-bank DRAM.
The 512Mb DDR SDRAM uses a double-data-rate architecture to achieve high-speed operation. The double-data-rate architec-
ture is essentially a 2n prefetch architecture, with an interface designed to transfer two data words per clock cycle at the I/O
pins. A single read or write access for the 512Mb DDR SDRAM consists of a single 2n-bit wide, one clock cycle data transfer at
the internal DRAM core and two corresponding n-bit wide, one-half clock cycle data transfers at the I/O pins.
Read and write accesses to the DDR SDRAM are burst oriented; accesses start at a selected location and continue for a pro-
grammed number of locations in a programmed sequence. Accesses begin with the registration of an Active command, which is
then followed by a Read or Write command. The address bits registered coincident with the Active command are used to select
the bank and row to be accessed (BA0, BA1 select the bank; A0-A12 select the row). The address bits registered coincident
with the Read or Write command are used to select the starting column location for the burst access.
Prior to normal operation, the DDR SDRAM must be initialized. The following sections provide detailed information covering
device initialization, register definition, command descriptions and device operation.
Initialization
Only one of the following two conditions must be met.
• No power sequencing is specified during power up or power down given the following criteria:
VDD and VDDQ are driven from a single power converter output
VTT meets the specification
A minimum resistance of 42 ohms limits the input current from the VTT supply into any pin and
VREF tracks VDDQ /2
or
• The following relationships must be followed:
VDDQ is driven after or with VDD such that VDDQ < VDD + 0.3V
VTT is driven after or with VDDQ such that VTT < VDDQ + 0.3V
VREF is driven after or with VDDQ such that VREF < VDDQ + 0.3V
The DQ and DQS outputs are in the High-Z state, where they remain until driven in normal operation (by a read access). After
all power supply and reference voltages are stable, and the clock is stable, the DDR SDRAM requires a 200µs delay prior to
applying an executable command.
Once the 200µs delay has been satisfied, a Deselect or NOP command should be applied, and CKE must be brought HIGH.
Following the NOP command, a Precharge ALL command must be applied. Next a Mode Register Set command must be
issued for the Extended Mode Register, to enable the DLL, then a Mode Register Set command must be issued for the Mode
Register, to reset the DLL, and to program the operating parameters. 200 clock cycles are required between the DLL reset and
any read command. A Precharge ALL command should be applied, placing the device in the “all banks idle” state
Once in the idle state, two auto refresh cycles must be performed. Additionally, a Mode Register Set command for the Mode
Register, with the reset DLL bit deactivated (i.e. to program operating parameters without resetting the DLL) must be performed.
Following these cycles, the DDR SDRAM is ready for normal operation.
DDR SDRAM’s may be reinitialized at any time during normal operation by asserting a valid MRS command to either the base
or extended mode registers without affecting the contents of the memory array. The contents of either the mode register or
extended mode register can be modified at any valid time during device operation without affecting the state of the internal
address refresh counters used for device refresh.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
11
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Register Definition
Mode Register
The Mode Register is used to define the specific mode of operation of the DDR SDRAM. This definition includes the selection of
a burst length, a burst type, a CAS latency, and an operating mode. The Mode Register is programmed via the Mode Register
Set command (with BA0 = 0 and BA1 = 0) and retains the stored information until it is programmed again or the device loses
power (except for bit A8, which is self-clearing).
Mode Register bits A0-A2 specify the burst length, A3 specifies the type of burst (sequential or interleaved), A4-A6 specify the
CAS latency, and A7-A12 specify the operating mode.
The Mode Register must be loaded when all banks are idle, and the controller must wait the specified time before initiating the
subsequent operation. Violating either of these requirements results in unspecified operation.
Burst Length
Read and write accesses to the DDR SDRAM are burst oriented, with the burst length being programmable. The burst length
determines the maximum number of column locations that can be accessed for a given Read or Write command. Burst lengths
of 2, 4, or 8 locations are available for both the sequential and the interleaved burst types.
Reserved states should not be used, as unknown operation or incompatibility with future versions may result.
When a Read or Write command is issued, a block of columns equal to the burst length is effectively selected. All accesses for
that burst take place within this block, meaning that the burst wraps within the block if a boundary is reached. The block is
uniquely selected by A1-Ai when the burst length is set to two, by A2-Ai when the burst length is set to four and by A3-Ai when
the burst length is set to eight (where Ai is the most significant column address bit for a given configuration). The remaining
(least significant) address bit(s) is (are) used to select the starting location within the block. The programmed burst length
applies to both Read and Write bursts.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
12
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Mode Register Operation
A3 Burst
Type
0 Sequential
1 Interleave
A8 A7 A6 A5 A4
CAS Latency
A3 A2 A1 A0
Burst LengthBT
Address Bus
CAS Latency
A6 A5 A4 Latency
0 0 0 Reserved
0 0 1 Reserved
0 1 0 Reserved
0 1 1 3
1 0 0 Reserved
1 0 1 Reserved
110 2.5
1 1 1 Reserved
Burst Length
A2 A1 A0 Burst Length
0 0 0 Reserved
0 0 1 2
0 1 0 4
0 1 1 8
1 0 0 Reserved
1 0 1 Reserved
1 1 0 Reserved
1 1 1 Reserved
BA1 BA0 A11 A10 A9
0* 0* Mode Register
Operating Mode
* BA0 and BA1 must be 0, 0 to select the Mode Register
(vs. the Extended Mode Register).
A12 - A9 A8 A7 A6 - A0 Operating Mode
0 0 0 Valid Normal operation
Do not reset DLL
0 1 0 Valid Normal operation
in DLL Reset
0 0 1 VS** Vendor-Specific
Test Mode
Reserved
VS** Vendor Specific
A12
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Notes:
1. For a burst length of two, A1-A i selects the two-data-element block; A0 selects the first access within the block.
2. For a burst length of four, A2-A i selects the four-data-element block; A0-A1 selects the first access within the block.
3. For a burst length of eight, A3-A i selects the eight-data- element block; A0-A2 selects the first access within the block.
4. Whenever a boundary of the block is reached within a given sequence above, the following access wraps within the block.
Burst Type
Accesses within a given burst may be programmed to be either sequential or interleaved; this is referred to as the burst type
and is selected via bit A3. The ordering of accesses within a burst is determined by the burst length, the burst type and the start-
ing column address, as shown in Burst Definition on page 13.
Read Latency
The Read latency, or CAS latency, is the delay, in clock cycles, between the registration of a Read command and the availability
of the first burst of output data. The latency can be programmed 3 clocks for DDR400.
If a Read command is registered at clock edge n, and the latency is m clocks, the data is available nominally coincident with
clock edge n + m.
Reserved states should not be used as unknown operation or incompatibility with future versions may result.
Burst Definition
Burst Length
Starting Column Address Order of Accesses Within a Burst
A2 A1 A0 Type = Sequential Type = Interleaved
2
0 0-1 0-1
1 1-0 1-0
4
0 0 0-1-2-3 0-1-2-3
0 1 1-2-3-0 1-0-3-2
1 0 2-3-0-1 2-3-0-1
1 1 3-0-1-2 3-2-1-0
8
0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7
0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6
0 1 0 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5
0 1 1 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4
1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3
1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2
1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1
1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0
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Operating Mode
The normal operating mode is selected by issuing a Mode Register Set Command with bits A7-A12 to zero, and bits A0-A6 set
to the desired values. A DLL reset is initiated by issuing a Mode Register Set command with bits A7 and A9-A12 each set to
zero, bit A8 set to one, and bits A0-A6 set to the desired values. A Mode Register Set command issued to reset the DLL should
always be followed by a Mode Register Set command to select normal operating mode.
All other combinations of values for A7-A12 are reserved for future use and/or test modes. Test modes and reserved states
should not be used as unknown operation or incompatibility with future versions may result.
CAS Latencies
NOP NOP NOP NOP NOPRead
CAS Latency = 3, BL = 4
Shown with nominal t AC , t DQSCK , and t DQSQ .
CK
CK
Command
DQS
DQ
Do not care
CL=3
NOP NOP NOP NOP NOPRead
CAS Latency = 2.5, BL = 4
CK
CK
Command
DQS
DQ
CL=2.5
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Extended Mode Register
The Extended Mode Register controls functions beyond those controlled by the Mode Register; these additional functions
include DLL enable/disable, bit A0; output drive strength selection, bit A1; and QFC output enable/disable, bit A2 (NTC
optional). These functions are controlled via the bit settings shown in the Extended Mode Register Definition. The Extended
Mode Register is programmed via the Mode Register Set command (with BA0 = 1 and BA1 = 0) and retains the stored informa-
tion until it is programmed again or the device loses power. The Extended Mode Register must be loaded when all banks are
idle, and the controller must wait the specified time before initiating any subsequent operation. Violating either of these require-
ments result in unspecified operation.
DLL Enable/Disable
The DLL must be enabled for normal operation. DLL enable is required during power up initialization, and upon returning to nor-
mal operation after having disabled the DLL for the purpose of debug or evaluation. The DLL is automatically disabled when
entering self refresh operation and is automatically re-enabled upon exit of self refresh operation. Any time the DLL is enabled,
200 clock cycles must occur to allow time for the internal clock to lock to the externally applied clock before a Read command
can be issued. This is the reason for introducing timing parameter tXSRD for DDR SDRAM’s (Exit Self Refresh to Read Com-
mand). Non- Read commands can be issued 2 clocks after the DLL is enabled via the EMRS command (tMRD) or 10 clocks after
the DLL is enabled via self refresh exit command (tXSNR, Exit Self Refresh to Non-Read Command).
Output Drive Strength
The normal drive strength for all outputs is specified to be SSTL_2, Class II.
QFC Enable/Disable (Not support in this product; Only for information)
The QFC signal is an optional DRAM output control used to isolate module loads (DIMMs) from the system memory bus by
means of external FET switches when the given module (DIMM) is not being accessed. The QFC function is an optional feature
for NANYA and is not included on all DDR SDRAM devices.
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Extended Mode Register Definition
A8A7A6A5A4A3A2A1A0Address Bus
Drive Strength
A1Drive Strength
0 Normal
1 Reserved
BA1 BA0
Operating Mode
A11 A10 A9
0*1*
* BA0 and BA1 must be 1, 0 to select the Extended Mode Register
Mode Register
Extended
DS DLL
A0DLL
0 Enable
1 Disable
A12 - A3 A2 - A0 Operating Mode
0 Valid Normal Operation
All other states
Reserved
(vs. the base Mode Register)
QFC
A2QFC
0 Disable
1Enable (Not
Support)
A12
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Commands
Truth Tables 1a and 1b provide a reference of the commands supported by DDR SDRAM devices. A verbal description of each
commands follows.
Truth Table 1a: Commands
Name (Function) CS RAS CAS WE Address MNE Notes
Deselect (Nop) H X X X X NOP 1, 9
No Operation (Nop) L H H H X NOP 1, 9
Active (Select Bank And Activate Row) L L H H Bank/Row ACT 1, 3
Read (Select Bank And Column, And Start Read Burst) L H L H Bank/Col Read 1, 4
Write (Select Bank And Column, And Start Write Burst) L H L L Bank/Col Write 1, 4
Burst Terminate L H H L X BST 1, 8
Precharge (Deactivate Row In Bank Or Banks) L L H L Code PRE 1, 5
Auto Refresh Or Self Refresh (Enter Self Refresh Mode) L L L H X AR / SR 1, 6, 7
Mode Register Set L L L L Op-Code MRS 1, 2
1. CKE is high for all commands shown except Self Refresh.
2. BA0, BA1 select either the Base or the Extended Mode Register (BA0 = 0, BA1 = 0 selects Mode Register; BA0 = 1, BA1 = 0 selects
Extended Mode Register; other combinations of BA0-BA1 are reserved; A0-A12 provide the op-code to be written to the selected Mode
Register.)
3. BA0-BA1 provide bank address and A0-A12 provide row address.
4. BA0, BA1 provide bank address; A0-Ai provide column address (where i = 9 for x8 and 9, 11 for x4); A10 high enables the Auto Pre-
charge feature (non-persistent), A10 low disables the Auto Precharge feature.
5. A10 LOW: BA0, BA1 determine which bank is precharged.
A10 HIGH: all banks are precharged and BA0, BA1 are “Don’t Care.”
6. This command is auto refresh if CKE is high; Self Refresh if CKE is low.
7. Internal refresh counter controls row and bank addressing; all inputs and I/Os are “Don’t Care” except for CKE.
8. Applies only to read bursts with Auto Precharge disabled; this command is undefined (and should not be used) for read bursts with Auto
Precharge enabled or for write bursts
9. Deselect and NOP are functionally interchangeable.
Truth Table 1b: DM Operation
Name (Function) DM DQs Notes
Write Enable L Valid 1
Write Inhibit H X 1
1. Used to mask write data; provided coincident with the corresponding data.
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Deselect
The Deselect function prevents new commands from being executed by the DDR SDRAM. The DDR SDRAM is
effectively deselected. Operations already in progress are not affected.
No Operation (NOP)
The No Operation (NOP) command is used to perform a NOP to a DDR SDRAM. This prevents unwanted commands from
being registered during idle or wait states. Operations already in progress are not affected.
Mode Register Set
The mode registers are loaded via inputs A0-A12, BA0 and BA1 while issuing the Mode Register Set Command. See mode reg-
ister descriptions in the Register Definition section. The Mode Register Set command can only be issued when all banks are idle
and no bursts are in progress. A subsequent executable command cannot be issued until tMRD is met.
Active
The Active command is used to open (or activate) a row in a particular bank for a subsequent access. The value on the BA0,
BA1 inputs selects the bank, and the address provided on inputs A0-A12 selects the row. This row remains active (or open) for
accesses until a Precharge (or Read or Write with Auto Precharge) is issued to that bank. A Precharge (or Read or Write with
Auto Precharge) command must be issued and completed before opening a different row in the same bank.
Read
The Read command is used to initiate a burst read access to an active (open) row. The value on the BA0, BA1 inputs selects
the bank, and the address provided on inputs A0-Ai, Aj (where [i = 9, j = don’t care] for x8; where [i = 9, j = 11] for x4) selects the
starting column location. The value on input A10 determines whether or not Auto Precharge is used. If Auto Precharge is
selected, the row being accessed is precharged at the end of the Read burst; if Auto Precharge is not selected, the row remains
open for subsequent accesses.
Write
The Write command is used to initiate a burst write access to an active (open) row. The value on the BA0, BA1 inputs selects
the bank, and the address provided on inputs A0-Ai, Aj (where [i = 9, j = don’t care] for x8; where [i = 9, j = 11] for x4) selects the
starting column location. The value on input A10 determines whether or not Auto Precharge is used. If Auto Precharge is
selected, the row being accessed is precharged at the end of the Write burst; if Auto Precharge is not selected, the row remains
open for subsequent accesses. Input data appearing on the DQs is written to the memory array subject to the DM input logic
level appearing coincident with the data. If a given DM signal is registered low, the corresponding data is written to memory; if
the DM signal is registered high, the corresponding data inputs are ignored, and a Write is not executed to that byte/column
location.
Precharge
The Precharge command is used to deactivate (close) the open row in a particular bank or the open row(s) in all banks. The
bank(s) will be available for a subsequent row access a specified time (tRP) after the Precharge command is issued. Input A10
determines whether one or all banks are to be precharged, and in the case where only one bank is to be precharged, inputs
BA0, BA1 select the bank. Otherwise BA0, BA1 are treated as “Don’t Care.” Once a bank has been precharged, it is in the idle
state and must be activated prior to any Read or Write commands being issued to that bank. A precharge command is treated
as a NOP if there is no open row in that bank, or if the previously open row is already in the process of precharging.
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512Mb DDR SDRAM
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Auto Precharge
Auto Precharge is a feature which performs the same individual-bank precharge function described above, but without requiring
an explicit command. This is accomplished by using A10 to enable Auto Precharge in conjunction with a specific Read or Write
command. A precharge of the bank/row that is addressed with the Read or Write command is automatically performed upon
completion of the Read or Write burst. Auto Precharge is non-persistent in that it is either enabled or disabled for each individual
Read or Write command. Auto Precharge ensures that the precharge is initiated at the earliest valid stage within a burst. This is
determined as if an explicit Precharge command was issued at the earliest possible time without violating tRAS(min). The user
must not issue another command to the same bank until the precharge (tRP) is completed.
The NTC DDR SDRAM devices supports the optional tRAS lockout feature. This feature allows a Read command with Auto Pre-
charge to be issued to a bank that has been activated (opened) but has not yet satisfied the tRAS(min) specification. The tRAS
lockout feature essentially delays the onset of the auto precharge operation until two conditions occur. One, the entire burst
length of data has been successfully prefetched from the memory array; and two, tRAS(min) has been satisfied.
As a means to specify whether a DDR SDRAM device supports the tRAS lockout feature, a new parameter has been defined,
tRAP (RAS Command to Read Command with Auto Precharge or better stated Bank Activate to Read Command with Auto Pre-
charge). For devices that support the tRAS lockout feature, tRAP = tRCD(min). This allows any Read Command (with or without
Auto Precharge) to be issued to an open bank once tRCD(min) is satisfied.
Burst Terminate
The Burst Terminate command is used to truncate read bursts (with Auto Precharge disabled). The most re-cently registered
Read command prior to the Burst Terminate command is truncated, as shown in the Operation section of this data sheet. Write
burst cycles are not to be terminated with the Burst Terminate command.
tRAP Definition
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Auto Refresh
Auto Refresh is used during normal operation of the DDR SDRAM and is analogous to CAS Before RAS (CBR) Refresh in pre-
vious DRAM types. This command is nonpersistent, so it must be issued each time a refresh is required.
The refresh addressing is generated by the internal refresh controller. This makes the address bits “Don’t Care” during an Auto
Refresh command. The 512Mb DDR SDRAM requires Auto Refresh cycles at an average periodic interval of 7.8µs (maximum).
Self Refresh
The Self Refresh command can be used to retain data in the DDR SDRAM, even if the rest of the system is powered down.
When in the self refresh mode, the DDR SDRAM retains data without external clocking. The Self Refresh command is initiated
as an Auto Refresh command coincident with CKE transitioning low. The DLL is automatically disabled upon entering Self
Refresh, and is automatically enabled upon exiting Self Refresh (200 clock cycles must then occur before a Read command can
be issued). Input signals except CKE (low) are “Don’t Care” during Self Refresh operation.
The procedure for exiting self refresh requires a sequence of commands. CK (and CK) must be stable prior to CKE returning
high. Once CKE is high, the SDRAM must have NOP commands issued for tXSNR because time is required for the completion of
any internal refresh in progress. A simple algorithm for meeting both refresh and DLL requirements is to apply NOPs for 200
clock cycles before applying any other command.
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Operations
Bank/Row Activation
Before any Read or Write commands can be issued to a bank within the DDR SDRAM, a row in that bank must be “opened”
(activated). This is accomplished via the Active command and addresses A0-A12, BA0 and BA1 (see Activating a Specific Row
in a Specific Bank), which decode and select both the bank and the row to be activated. After opening a row (issuing an Active
command), a Read or Write command may be issued to that row, subject to the tRCD specification. A subsequent Active com-
mand to a different row in the same bank can only be issued after the previous active row has been “closed” (precharged). The
minimum time interval between successive Active commands to the same bank is defined by tRC. A subsequent Active com-
mand to another bank can be issued while the first bank is being accessed, which results in a reduction of total row-access
overhead. The minimum time interval between successive Active commands to different banks is defined by tRRD.
Activating a Specific Row in a Specific Bank
RA
BA
HIGH
RA = row address.
BA = bank address.
CK
CK
CKE
CS
RAS
CAS
WE
A0-A12
BA0, BA1 Don’t Care
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Reads
Subsequent to programming the mode register with CAS latency, burst type, and burst length, Read bursts are initiated with a
Read command.
The starting column and bank addresses are provided with the Read command and Auto Precharge is either enabled or dis-
abled for that burst access. If Auto Precharge is enabled, the row that is accessed starts precharge at the completion of the
burst, provided tRAS has been satisfied. For the generic Read commands used in the following illustrations, Auto Precharge is
disabled.
During Read bursts, the valid data-out element from the starting column address is available following the CAS latency after the
Read command. Each subsequent data-out element is valid nominally at the next positive or negative clock edge (i.e. at the
next crossing of CK and CK). The following timing figure entitled “Read Burst: CAS Latencies (Burst Length=4)” illustrates the
general timing for each supported CAS latency setting. DQS is driven by the DDR SDRAM along with output data. The initial low
state on DQS is known as the read preamble; the low state coincident with the last data-out element is known as the read post-
amble. Upon completion of a burst, assuming no other commands have been initiated, the DQs and DQS goes High-Z. Data
from any Read burst may be concatenated with or truncated with data from a subsequent Read command. In either case, a con-
tinuous flow of data can be maintained. The first data element from the new burst follows either the last element of a completed
burst or the last desired data element of a longer burst which is being truncated. The new Read command should be issued x
cycles after the first Read command, where x equals the number of desired data element pairs (pairs are required by the 2n
prefetch architecture). This is shown in timing figure entitled “Consecutive Read Bursts: CAS Latencies (Burst Length =4 or 8)”.
A Read command can be initiated on any positive clock cycle following a previous Read command. Nonconsecutive Read data
is shown in timing figure entitled “Non-Consecutive Read Bursts: CAS Latencies (Burst Length = 4)”. Full-speed Random Read
Accesses: CAS Latencies (Burst Length = 2, 4 or 8) within a page (or pages) can be performed as shown on page 27.
tRCD and tRRD Definition
ROW
ACT NOP
COLROW
BA y BA yBA x
ACT NOP NOP
CK
CK
Command
A0-A12
BA0, BA1
Don’t Care
RD/WR
tRCD
tRRD
RD/WR NOP NOP
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Read Command
BA
HIGH
CA = column address
BA = bank address
CKE
CS
RAS
CAS
WE
A10
BA0, BA1
Don’t Care
CA
x4: A0-A9, A11
x8: A0-A9
EN AP
DIS AP
EN AP = enable Auto Precharge
DIS AP = disable Auto Precharge
CK
CK
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Read Burst: CAS Latencies (Burst Length = 4)
CAS Latency = 3
NOP NOP NOP NOP NOPRead
CK
CK
Command
Address
DQS
DQ
CAS Latency = 2.5
Dont Care
BA a,COL n
CL=2.5
NOP NOP NOP NOP NOPRead
CK
CK
Command
Address
DQS
DQ
BA a,COL n
DOa-n
DO a-n = data out from bank a, column n.
3 subsequent elements of data out appear in the programmed order following DO a -n.
Shown with nominal t AC , t DQSCK , and t DQSQ .
QFC
QFC
(Optional)
tQCH
(Optional)
tQCS
QFC is an open drain driver. The output high level is achieved through an external pull up resistor connected to V DDQ .
CL=3
DOa-n
tQCS tQCH
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Consecutive Read Bursts: CAS Latencies (Burst Length = 4 or 8)
CAS Latency = 3
NOP Read NOP NOP NOPRead
CK
CK
Command
Address
DQS
DQ
BAa, COL n BAa, COL b
Dont Care
DO a-n (or a-b ) = data out from bank a, column n (or bank a, column b).
When burst length = 4, the bursts are concatenated.
When burst length = 8, the second burst interrupts the first.
3 subsequent elements of data out appear in the programmed order following DO a-n.
3 (or 7) subsequent elements of data out appear in the programmed order following DO a-b.
Shown with nominal t
AC, tDQSCK , and t
DQSQ.
CAS Latency = 2.5
NOP Read NOP NOP NOPRead
CK
CK
Command
Address
DQS
DQ
CL=2.5
BAa, COL n BAa,COL b
DOa- n DOa- b
CL=3
DOa-n DOa-b
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Non-Consecutive Read Bursts: CAS Latencies (Burst Length = 4)
CAS Latency = 3
NOP NOP Read NOP NOPRead
BAa, COL n BAa, COL b
CL=3
CK
CK
Command
Address
DQS
DQ
NOP
DO n (or b) = Data out from Column n (or Column b)
Burst Length = 4
3 subsequent elements of Data out appear in the programmed order following DO n (and following DO b)
DO a-n DOa-b
Don’t Care
CAS Latency = 2.5
NOP NOP Read NOP NOPRead
DO a-n DOa- b
BAa, COL n BAa, COL b
CL=2.5
NOP
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Random Read Accesses: CAS Latencies (Burst Length = 2, 4 or 8)
Don’t Care
CAS Latency = 3
Read Read Read NOP NOPRead
CK
CK
Command
Address
DQS
DQ
BAa, COL n BAa, COL x BAa, COL b BAa, COL g
CL=3
DOa- n DOa- bDOa- n' DOa- x DOa- x'
DOa-n
CAS Latency = 2.5
Read Read Read NOP NOPRead
DOa-bDOa-n' DOa-x DOa-x' DOa-b’
CK
CK
Address
DQS
DQ
BAa, COL n BAa, COL x BAa, COL b BAa, COL g
CL=2.5
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Data from any Read burst may be truncated with a Burst Terminate command, as shown in timing figure entitled
Terminating a Read Burst: CAS Latencies (Burst Length = 8) on page 29. The Burst Terminate latency is equal to
the read (CAS) latency, i.e. the Burst Terminate command should be issued x cycles after the Read command,
where x equals the number of desired data element pairs.
Data from any Read burst must be completed or truncated before a subsequent Write command can be issued. If
truncation is necessary, the Burst Terminate command must be used, as shown in timing figure entitled Read to
Write: CAS Latencies (Burst Length = 4 or 8) on page 30. The example is shown for tDQSS(min). The tDQSS(max)
case, not shown here, has a longer bus idle time. tDQSS(min) and tDQSS(max) are defined in the section on Writes.
A Read burst may be followed by, or truncated with, a Precharge command to the same bank (provided that Auto
Precharge was not activated). The Precharge command should be issued x cycles after the Read command,
where x equals the number of desired data element pairs (pairs are required by the 2n prefetch architecture). This
is shown in timing figure on page 24 for Read latencies of 3. Following the Precharge command, a subsequent
command to the same bank cannot be issued until tRP is met. Note that part of the row precharge time is hidden
during the access of the last data elements.
In the case of a Read being executed to completion, a Precharge command issued at the optimum time (as
described above) provides the same operation that would result from the same Read burst with Auto Precharge
enabled. The disadvantage of the Precharge command is that it requires that the command and address busses
be available at the appropriate time to issue the command. The advantage of the Precharge command is that it can
be used to truncate bursts.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Terminating a Read Burst: CAS Latencies (Burst Length = 8)
NOP NOP NOP NOP NOPRead
CK
CK
Command
Address
DQS
DQ
BA a,COL n
CL=3
DOa-n
No Further Output data after this point.
CAS Latency = 2.5
NOP BST NOP NOP NOPRead
CK
DQS
DQ DOa-n
CK
BAa, COL n
CL=2.5
No further output data after this point.
DQS tristated.
DO a-n = data out from bank a, column n.
Cases shown are bursts of 8 terminated after 4 data elements.
3 subsequent elements of data out appear in the programmed order following DO a-n.
Shown with nominal tAC, tDQSCK, and tDQSQ.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Read to Write: CAS Latencies (Burst Length = 4 or 8)
Command
CAS Latency = 3
BST NOP Write NOP NOPRead
CK
CK
Address
DQS
DQ
DM
BAa, COL n BAa, COL b
CL=3
DI a-b
DOa -n
t
DQSS
(min)
DO a-n = data out from bank a, column n
1 subsequent elements of data out appear in the programmed order following DO a-n.
Data In elements are applied following Dl a-b in the programmed order, according to burst length.
Don’t Care
CAS Latency = 2.5
BST NOP NOP Write NOPRead
CK
CK
Command
Address
DQS
DQ
DM
DOa-n
BAa, COL n BAa, COL b
CL=2.5 t
DQSS
(min)
Dla-b
Shown with nominal t
AC
, t
DQSCK
, and t
DQSQ
.
.
DI a-b = data in to bank a, column b
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Read to Precharge: CAS Latencies (Burst Length = 4 or 8)
CAS Latency = 3
NOP PRE NOP NOP ACTRead
CK
CK
Command
Address
DQS
DQ
BA a, COL n BA a or all BA a, ROW
CL=3
tRP
DOa-n
DO a-n = data out from bank a, column n.
Cases shown are either uninterrupted bursts of 4 or interrupted bursts of 8.
3 subsequent elements of data out appear in the programmed order following DO a-n.
Shown with nominal tAC, tDQSCK, and tDQSQ.Don’t Care
CL=2.5
CAS Latency = 2.5
NOP PRE NOP NOP ACTRead
CK
CK
Command
Address
DQS
DQ DOa-n
tRP
BA a, COL n BA a or all BA a, ROW
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512Mb DDR SDRAM
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Writes
Write bursts are initiated with a Write command, as shown in timing figure Write Command on page 33.
The starting column and bank addresses are provided with the Write command, and Auto Precharge is either enabled or dis-
abled for that access. If Auto Precharge is enabled, the row being accessed is precharged at the completion of the burst. For
the generic Write commands used in the following illustrations, Auto Precharge is disabled.
During Write bursts, the first valid data-in element is registered on the first rising edge of DQS following the write command, and
subsequent data elements are registered on successive edges of DQS. The Low state on DQS between the Write command
and the first rising edge is known as the write preamble; the Low state on DQS following the last data-in element is known as
the write postamble. The time between the Write command and the first corresponding rising edge of DQS (tDQSS) is specified
with a relatively wide range (from 75% to 125% of one clock cycle), so most of the Write diagrams that follow are drawn for the
two extreme cases (i.e. tDQSS(min) and tDQSS(max)). Timing figure Write Burst (Burst Length = 4) on page 34 shows the two
extremes of tDQSS for a burst of four. Upon completion of a burst, assuming no other commands have been initiated, the DQs
and DQS enters High-Z and any additional input data is ignored.
Data for any Write burst may be concatenated with or truncated with a subsequent Write command. In either case, a continuous
flow of input data can be maintained. The new Write command can be issued on any positive edge of clock following the previ-
ous Write command. The first data element from the new burst is applied after either the last element of a completed burst or
the last desired data element of a longer burst which is being truncated. The new Write command should be issued x cycles
after the first Write command, where x equals the number of desired data element pairs (pairs are required by the 2n prefetch
architecture). Timing figure Write to Write (Burst Length = 4) on page 35 shows concatenated bursts of 4. An example of non-
consecutive Writes is shown in timing figure Write to Write: Max DQSS, Non-Consecutive (Burst Length = 4) on page 36. Full-
speed random write accesses within a page or pages can be performed as shown in timing figure Random Write Cycles (Burst
Length = 2, 4 or 8) on page 37. Data for any Write burst may be followed by a subsequent Read command. To follow a Write
without truncating the write burst, tWTR (Write to Read) should be met as shown in timing figure Write to Read: Non-Interrupting
(CAS Latency = 3; Burst Length = 4) on page 38.
Data for any Write burst may be truncated by a subsequent (interrupting) Read command. This is illustrated in timing figures
“Write to Read: Interrupting (CAS Latency =2; Burst Length = 8)”, “Write to Read: Minimum DQSS, Odd Number of Data (3 bit
Write), Interrupting (CAS Latency = 2; Burst Length = 8)”, and “Write to Read: Nominal DQSS, Interrupting (CAS Latency = 2;
Burst Length = 8)”. Note that only the data-in pairs that are registered prior to the tWTR period are written to the internal array,
and any subsequent data-in must be masked with DM, as shown in the diagrams noted previously.
Data for any Write burst may be followed by a subsequent Precharge command. To follow a Write without truncating the write
burst, tWR should be met as shown in timing figure Write to Precharge: Non-Interrupting (Burst Length = 4) on page 42.
Data for any Write burst may be truncated by a subsequent Precharge command, as shown in timing figures Write to Pre-
charge: Interrupting (Burst Length = 4 or 8) on page 43 to Write to Precharge: Nominal DQSS (2 bit Write), Interrupting (Burst
Length = 4 or 8) on page 45. Note that only the data-in pairs that are registered prior to the tWR period are written to the internal
array, and any subsequent data in should be masked with DM. Following the Precharge command, a subsequent command to
the same bank cannot be issued until tRP is met.
In the case of a Write burst being executed to completion, a Precharge command issued at the optimum time (as described
above) provides the same operation that would result from the same burst with Auto Precharge. The disadvantage of the Pre-
charge command is that it requires that the command and address busses be available at the appropriate time to issue the com-
mand. The advantage of the Precharge command is that it can be used to truncate bursts.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Write Command
BA
HIGH
CA = column address
BA = bank address
CKE
CS
RAS
CAS
WE
A10
BA0, BA1
Don’t Care
CA
A0-A9
EN AP
DIS AP
EN AP = enable Auto Precharge
DIS AP = disable Auto Precharge
CK
CK
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512Mb DDR SDRAM
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Write Burst (Burst Length = 4)
T1 T2 T3 T4
tDQSS (max)
NOP NOP NOPWrite
DI a-b = data in for bank a, column b.
3 subsequent elements of data in are applied in the programmed order following DI a-b.
A non-interrupted burst is shown.
A10 is Low with the Write command (Auto Precharge is disabled).
CK
CK
Command
Address
DQS
DQ
DM
Don’t Care
Maximum DQSS
BA a, COL b
T1 T2 T3 T4
tDQSS (min)
NOP NOP NOPWrite
CK
CK
Command
Address
DQS
Minimum DQSS
BA a, COL b
DQ
DM
Dla-b
Dla-b
QFC
tQCSW(max) tQCHW(min)
(Optional)
QFC
tQCSW(max) tQCHW(max)
QFC is an open drain driver. Its output high level is achieved through an externally connected pull up resistor connected to VDDQ.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
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Write to Write (Burst Length = 4)
T1 T2 T3 T4 T5 T6
tDQSS (max)
Maximum DQSS
NOP Write NOP NOP NOPWrite
DI a-b = data in for bank a, column b, etc.
3 subsequent elements of data in are applied in the programmed order following DI a-b.
3 subsequent elements of data in are applied in the programmed order following DI a-n.
A non-interrupted burst is shown.
Each Write command may be to any bank.
CK
CK
Command
Address
DQS
DQ
DM
Don’t Care
T1 T2 T3 T4 T5 T6
Minimum DQSS
NOP Write NOP NOP NOPWrite
CK
CK
Command
Address
DQS
DQ
DM
BAa, COL b BAa, COL n
BA, COL b BA, COL n
tDQSS (min)
DI a-b DI a-n
DI a-b DI a-n
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NT5DS128M4CS
512Mb DDR SDRAM
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Write to Write: Max DQSS, Non-Consecutive (Burst Length = 4)
T1 T2 T3 T4 T5
tDQSS (max)
NOP NOP Write NOPWrite
DI a-b, etc. = data in for bank a, column b, etc.
3 subsequent elements of data in are applied in the programmed order following DI a-b.
3 subsequent elements of data in are applied in the programmed order following DI a-n.
A non-interrupted burst is shown.
Each Write command may be to any bank.
CK
CK
Command
Address
DQS
DQ
DM
Don’t Care
BAa, COL b BAa, COL n
DI a-b DI a-n
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512Mb DDR SDRAM
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Random Write Cycles (Burst Length = 2, 4 or 8)
T1 T2 T3 T4 T5
tDQSS (max)
Maximum DQSS
Write Write Write Write
Write
DI a-b DI a-n
DI a-b, etc. = data in for bank a, column b, etc.
b', etc. = odd or even complement of b, etc. (i.e., column address LSB inverted).
Each Write command may be to any bank.
DI a-b’ DI a-x DI a-x’ DI a-n’ DI a-a DI a-a’
CK
CK
Command
Address
DQS
DQ
DM
Don’t Care
BAa, COL b BAa, COL x BAa, COL n BAa, COL a BAa, COL g
T1 T2 T3 T4 T5
Minimum DQSS
Write Write Write Write
Write
DI a-b DI a-nDI a-b’ DI a-x DI a-x’ DI a-n’ DI a-a DI a-a’
CK
CK
Command
Address
DQS
DQ
DM
BAa, COL b BAa, COL x BAa, COL n BAa, COL a BAa, COL g
tDQSS (min)
DI a-g
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Write to Read: Non-Interrupting (CAS Latency = 3; Burst Length = 4)
CL = 3
T1 T2 T3 T4 T5 T6
tWTR
NOP NOP NOP ReadWrite
DI a-b
NOP
DI a-b = data in for bank a, column b.
3 subsequent elements of data in are applied in the programmed order following DI a-b.
A non-interrupted burst is shown.
tWTR is referenced from the first positive CK edge after the last data in pair.
A10 is Low with the Write command (Auto Precharge is disabled).
The Read and Write commands may be to any bank.
CK
CK
Command
Address
DQS
DQ
DM
Don’t Care
Maximum DQSS
BAa, COL b BAa, COL n
T1 T2 T3 T4 T5 T6
tWTR
NOP NOP NOP ReadWrite NOP
CK
CK
Command
Address
Minimum DQSS
BAa, COL b BAa, COL n
tDQSS (max)
DI a-b
DQS
DQ
DM
tDQSS (min)
CL = 3
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Write to Read: Interrupting (CAS Latency = 3; Burst Length = 8)
T1 T2 T3 T4 T5 T6
tDQSS (max)
Maximum DQSS
NOP NOP NOP ReadWrite NOP
DI a-b = data in for bank a, column b.
An interrupted burst is shown, 4 data elements are written.
3 subsequent elements of data in are applied in the programmed order following DI a-b.
tWTR is referenced from the first positive CK edge after the last data in pair.
The Read command masks the last 2 data elements in the burst.
A10 is Low with the Write command (Auto Precharge is disabled).
The Read and Write commands are not necessarily to the same bank.
DIa- b
CK
CK
Command
Address
DQS
DQ
DM
Don’t Care
BAa, COL b BAa, COL n
tWTR
CL = 3
T1 T2 T3 T4 T5 T6
Minimum DQSS
NOP NOP NOP ReadWrite NOP
CK
CK
Command
Address BAa, COL b BAa, COL n
tWTR
DI a-b
DQS
DQ
DM
CL = 3
tDQSS (min)
1 = These bits are incorrectly written into the memory array if DM is low.
1 1
1 1
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Write to Read: Minimum DQSS, Odd Number of Data (3 bit Write), Interrupting (CAS
Latency = 3; Burst Length = 8)
DI a-b = data in for bank a, column b.
An interrupted burst is shown, 3 data elements are written.
2 subsequent elements of data in are applied in the programmed order following DI a-b.
tWTR is referenced from the first positive CK edge after the last desired data in pair (not the last desired data in element)
The Read command masks the last 2 data elements in the burst.
A10 is Low with the Write command (Auto Precharge is disabled).
The Read and Write commands are not necessarily to the same bank.
Don’t Care
T1 T2 T3 T4 T5 T6
NOP NOP NOP ReadWrite NOP
CK
CK
Command
Address BAa, COL b BAa, COL n
tWTR
DI a-b
DQS
DQ
CL = 3
tDQSS (min)
DM 1 2 2
1 = This bit is correctly written into the memory array if DM is low.
2 = These bits are incorrectly written into the memory array if DM is low.
NT5DS32M16CS
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NT5DS128M4CS
512Mb DDR SDRAM
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Write to Read: Nominal DQSS, Interrupting (CAS Latency = 3; Burst Length = 8)
T1 T2 T3 T4 T5 T6
tDQSS (nom)
NOP NOP NOP ReadWrite NOP
DI a-b = data in for bank a, column b.
An interrupted burst is shown, 4 data elements are written.
3 subsequent elements of data in are applied in the programmed order following DI a-b.
tWTR is referenced from the first positive CK edge after the last desired data in pair.
The Read command masks the last 2 data elements in the burst.
A10 is Low with the Write command (Auto Precharge is disabled).
The Read and Write commands are not necessarily to the same bank.
DI a-b
CK
CK
Command
Address
DQS
DQ
DM
Don’t Care
BAa, COL b BAa, COL n
tWTR
CL = 3
1 = These bits are incorrectly written into the memory array if DM is low.
11
NT5DS32M16CS
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NT5DS128M4CS
512Mb DDR SDRAM
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Write to Precharge: Non-Interrupting (Burst Length = 4)
T1 T2 T3 T4 T5 T6
tDQSS (max)
NOP NOP NOP NOPWrite
DI a-b
PRE
DI a-b = data in for bank a, column b.
3 subsequent elements of data in are applied in the programmed order following DI a-b.
A non-interrupted burst is shown.
tWR is referenced from the first positive CK edge after the last data in pair.
A10 is Low with the Write command (Auto Precharge is disabled).
CK
CK
Command
Address
DQS
DQ
DM
Don’t Care
BA a, COL b BA (a or all)
tWR
Maximum DQSS
T1 T2 T3 T4 T5 T6
NOP NOP NOP NOPWrite PRE
CK
CK
Command
Address BA a, COL b BA (a or all)
tWR
Minimum DQSS
DI a-b
DQS
DQ
DM
tDQSS (min)
tRP
tRP
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NT5DS128M4CS
512Mb DDR SDRAM
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Write to Precharge: Interrupting (Burst Length = 4 or 8)
DI a-b = data in for bank a, column b.
An interrupted burst is shown, 2 data elements are written.
1 subsequent element of data in is applied in the programmed order following DI a-b.
tWR is referenced from the first positive CK edge after the last desired data in pair.
The Precharge command masks the last 2 data elements in the burst, for burst length = 8.
A10 is Low with the Write command (Auto Precharge is disabled).
1 = Can be don't care for programmed burst length of 4.
2 = For programmed burst length of 4, DQS becomes don't care at this point. Don’t Care
T1 T2 T3 T4 T5 T6
NOP NOP NOP PREWrite NOP
CK
CK
Command
Address
Maximum DQSS
DI a-b
1 1
2
DQS
DQ
DM
tDQSS (max) tRP
T1 T2 T3 T4 T5 T6
NOP NOP NOP PREWrite NOP
CK
CK
Command
Address BA a, COL b BA (a or all)
Minimum DQSS
tWR
tRP
DI a-b
1 1
DQS
DQ
DM
tDQSS (min) 2
BA a, COL b BA (a or all)
tWR
3 = These bits are incorrectly written into the memory array if DM is low.
33
33
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
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Write to Precharge: Minimum DQSS, Odd Number of Data (1 bit Write), Interrupting
(Burst Length = 4 or 8)
DI a-b = data in for bank a, column b.
An interrupted burst is shown, 1 data element is written.
tWR is referenced from the first positive CK edge after the last desired data in pair.
The Precharge command masks the last 2 data elements in the burst.
A10 is Low with the Write command (Auto Precharge is disabled).
1 = Can be don't care for programmed burst length of 4.
2 = For programmed burst length of 4, DQS becomes don't care at this point.
Don’t Care
T1 T2 T3 T4 T5 T6
NOP NOP NOP PREWrite NOP
CK
CK
Command
Address BA a, COL b BA (a or all)
tWR
tRP
DI a-b
DQS
DQ
tDQSS (min) 2
1 1
DM 3 4 4
3 = This bit is correctly written into the memory array if DM is low.
4 = These bits are incorrectly written into the memory array if DM is low.
NT5DS32M16CS
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NT5DS128M4CS
512Mb DDR SDRAM
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Write to Precharge: Nominal DQSS (2 bit Write), Interrupting (Burst Length = 4 or 8)
DI a-b = Data In for bank a, column b.
An interrupted burst is shown, 2 data elements are written.
1 subsequent element of data in is applied in the programmed order following DI a-b.
tWR is referenced from the first positive CK edge after the last desired data in pair.
The Precharge command masks the last 2 data elements in the burst.
A10 is Low with the Write command (Auto Precharge is disabled).
1 = Can be don't care for programmed burst length of 4.
2 = For programmed burst length of 4, DQS becomes don't care at this point. Don’t Care
T1 T2 T3 T4 T5 T6
NOP NOP NOP PREWrite NOP
CK
CK
Command
Address BA a, COL b BA (a or all)
tRP
tDQSS (nom)
DI a-b
1
2
DQS
DQ
DM 1
tWR
33
3 = These bits are incorrectly written into the memory array if DM is low.
NT5DS32M16CS
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NT5DS128M4CS
512Mb DDR SDRAM
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Precharge
The Precharge command is used to deactivate the open row in a particular bank or the open row in all banks. The
bank(s) is available for a subsequent row access some specified time (tRP) after the Precharge command is
issued. Input A10 determines whether one or all banks are to be precharged, and in the case where only one bank
is to be precharged, inputs BA0, BA1 select the bank. When all banks are to be precharged, inputs BA0, BA1 are
treated as “Don’t Care.” Once a bank has been precharged, it is in the idle state and must be activated prior to any
Read or Write commands being issued to that bank.
Precharge Command
BA
HIGH
BA = bank address
CK
CK
CKE
CS
RAS
CAS
WE
A10
BA0, BA1
Don’t Care
All Banks
One Bank
(if A10 is Low, otherwise Don’t Care).
A0-A9, A11
NT5DS32M16CS
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512Mb DDR SDRAM
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Power Down
Power Down is entered when CKE is registered low (no accesses can be in progress). If Power Down occurs when all banks
are idle, this mode is referred to as Precharge Power Down; if Power Down occurs when there is a row active in any bank, this
mode is referred to as Active Power Down. Entering Power Down deactivates the input and output buffers, excluding CK, CK
and CKE. The DLL is still running in Power Down mode, so for maximum power savings, the user has the option of disabling the
DLL prior to entering Power Down. In that case, the DLL must be enabled after exiting Power Down, and 200 clock cycles must
occur before a Read command can be issued. In Power Down mode, CKE Low and a stable clock signal must be maintained at
the inputs of the DDR SDRAM, and all other input signals are “Don’t Care”. However, Power Down duration is limited by the
refresh requirements of the device, so in most applications, the self refresh mode is preferred over the DLL-disabled Power
Down mode.
The Power Down state is synchronously exited when CKE is registered high (along with a Nop or Deselect command). A valid,
executable command may be applied one clock cycle later.
Power Down
tIS
tIS
CK
CK
CKE
Command
No column
access in
progress
VALID NOP VALID
Don’t Care
Exit
power down
mode
Enter Power Down mode
(Burst Read or Write operation
must not be in progress)
NOP
tPDEX
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Truth Table 2: Clock Enable (CKE)
1. CKE n is the logic state of CKE at clock edge n: CKE n-1 was the state of CKE at the previous clock edge.
2. Current state is the state of the DDR SDRAM immediately prior to clock edge n.
3. Command n is the command registered at clock edge n, and action n is a result of command n.
4. All states and sequences not shown are illegal or reserved.
Current State
CKE n-1 CKEn
Command n Action n Notes
Previous
Cycle
Current
Cycle
Self Refresh L L X Maintain Self-Refresh
Self Refresh L H Deselect or NOP Exit Self-Refresh 1
Power Down L L X Maintain Power Down
Power Down L H Deselect or NOP Exit Power Down
All Banks Idle H L Deselect or NOP Precharge Power Down Entry
All Banks Idle H L Auto Refresh Self Refresh Entry
Bank(s) Active H L Deselect or NOP Active Power Down Entry
H H
See “Truth Table 3: Current State
Bank n - Command to Bank n (Same
Bank)” on page 49
1. Deselect or NOP commands should be issued on any clock edges occurring during the Self Refresh Exit (tXSNR) period. A minimum of
200 clock cycles are needed before applying a read command to allow the DLL to lock to the input clock.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
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NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Truth Table 3: Current State Bank n - Command to Bank n (Same Bank)
Current State CS RAS CAS WE Command Action Notes
Any H X X X Deselect NOP. Continue previous operation 1-6
L H H H No Operation NOP. Continue previous operation 1-6
Idle
L L H H Active Select and activate row 1-6
L L L H Auto Refresh 1-7
L L L L Mode Register Set 1-7
Row Active
L H L H Read Select column and start Read burst 1-6, 10
L H L L Write Select column and start Write burst 1-6, 10
L L H L Precharge Deactivate row in bank(s) 1-6, 8
Read
(Auto Precharge
Disabled)
L H L H Read Select column and start new Read burst 1-6, 10
L L H L Precharge Truncate Read burst, start Precharge 1-6, 8
L H H L Burst Terminate Burst Terminate 1-6, 9
Write
(Auto Precharge
Disabled)
L H L H Read Select column and start Read burst 1-6, 10, 11
L H L L Write Select column and start Write burst 1-6, 10
L L H L Precharge Truncate Write burst, start Precharge 1-6, 8, 11
1. This table applies when CKE n-1 was high and CKE n is high (see Truth Table 2: Clock Enable (CKE) and after tXSNR / tXSRD has been
met (if the previous state was self refresh).
2. This table is bank-specific, except where noted, i.e., the current state is for a specific bank and the commands shown are those allowed
to be issued to that bank when in that state. Exceptions are covered in the notes below.
3. Current state definitions:
Idle: The bank has been precharged, and tRP has been met.
Row Active: A row in the bank has been activated, and tRCD has been met. No data bursts/accesses and no register accesses are in
progress.
Read: A Read burst has been initiated, with Auto Precharge disabled, and has not yet terminated or been terminated.
Write: A Write burst has been initiated, with Auto Precharge disabled, and has not yet terminated or been terminated.
4. The following states must not be interrupted by a command issued to the same bank.
Precharging: Starts with registration of a Precharge command and ends when tRP is met. Once tRP is met, the bank is in the idle
state.
Row Activating: Starts with registration of an Active command and ends when tRCD is met. Once tRCD is met, the bank is in the “row
active” state.
Read w/Auto Precharge Enabled: Starts with registration of a Read command with Auto Precharge enabled and ends when tRP has been
met. Once tRP is met, the bank is in the idle state.
Write w/Auto Precharge Enabled: Starts with registration of a Write command with Auto Precharge enabled and ends when tRP has been
met. Once tRP is met, the bank is in the idle state.
Deselect or NOP commands, or allowable commands to the other bank should be issued on any clock edge occurring during these
states. Allowable commands to the other bank are determined by its current state and according to Truth Table 4.
5. The following states must not be interrupted by any executable command; Deselect or NOP commands must be applied on each positive
clock edge during these states.
Refreshing: Starts with registration of an Auto Refresh command and ends when tRFC is met. Once tRFC is met, the DDR SDRAM is
in the “all banks idle” state.
Accessing Mode Register: Starts with registration of a Mode Register Set command and ends when tMRD has been met. Once tMRD is
met, the DDR SDRAM is in the “all banks idle” state.
Precharging All: Starts with registration of a Precharge All command and ends when tRP is met. Once tRP is met, all banks is in the idle
state.
6. All states and sequences not shown are illegal or reserved.
7. Not bank-specific; requires that all banks are idle.
8. May or may not be bank-specific; if all/any banks are to be precharged, all/any must be in a valid state for precharging.
9. Not bank-specific; Burst terminate affects the most recent Read burst, regardless of bank.
10. Reads or Writes listed in the Command/Action column include Reads or Writes with Auto Precharge enabled and Reads or Writes with
Auto Precharge disabled.
11. Requires appropriate DM masking.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Truth Table 4: Current State Bank n - Command to Bank m (Different bank)
(Part 1 of 2)
Current State CS RAS CAS WE Command Action Notes
Any
H X X X Deselect NOP/continue previous operation 1-6
L H H H No Operation NOP/continue previous operation 1-6
Idle X X X X Any Command Otherwise
Allowed to Bank m 1-6
Row Activating,
Active, or
Precharging
L L H H Active Select and activate row 1-6
L H L H Read Select column and start Read burst 1-7
L H L L Write Select column and start Write burst 1-7
L L H L Precharge 1-6
Read
(Auto Precharge
Disabled)
L L H H Active Select and activate row 1-6
L H L H Read Select column and start new Read burst 1-7
L L H L Precharge 1-6
Write
(Auto Precharge
Disabled)
L L H H Active Select and activate row 1-6
L H L H Read Select column and start Read burst 1-8
L H L L Write Select column and start new Write burst 1-7
L L H L Precharge 1-6
1. This table applies when CKE n-1 was high and CKE n is high (see Truth Table 2: Clock Enable (CKE) and after tXSNR / tXSRD has been
met (if the previous state was self refresh).
2. This table describes alternate bank operation, except where noted, i.e., the current state is for bank n and the commands shown are
those allowed to be issued to bank m (assuming that bank m is in such a state that the given command is allowable). Exceptions are cov-
ered in the notes below.
3. Current state definitions:
Idle: The bank has been precharged, and tRP has been met.
Row Active: A row in the bank has been activated, and tRCD has been met. No data bursts/accesses and no register accesses are
in progress.
Read: A Read burst has been initiated, with Auto Precharge disabled, and has not yet terminated or been terminated.
Write: A Write burst has been initiated, with Auto Precharge disabled, and has not yet terminated or been terminated.
Read with Auto Precharge Enabled: See note 10.
Write with Auto Precharge Enabled: See note 10.
4. Auto Refresh and Mode Register Set commands may only be issued when all banks are idle.
5. A Burst Terminate command cannot be issued to another bank; it applies to the bank represented by the current state only.
6. All states and sequences not shown are illegal or reserved.
7. Reads or Writes listed in the Command/Action column include Reads or Writes with Auto Precharge enabled and Reads or Writes with
Auto Precharge disabled.
8. Requires appropriate DM masking.
9. A Write command may be applied after the completion of data output.
10. The Read with Auto Precharge enabled or Write with Auto Precharge enabled states can each be broken into two parts: the access
period and the precharge period. For Read with Auto Precharge, the precharge period is defined as if the same burst was executed with
Auto Precharge disabled and then followed with the earliest possible Precharge command that still accesses all of the data in the burst.
For Write with Auto Precharge, the precharge period begins when tWR ends, with tWR measured as if Auto Precharge was disabled. The
access period starts with registration of the command and ends where the precharge period (or tRP) begins. During the precharge period
of the Read with Auto Precharge Enabled or Write with Auto Precharge Enabled states, Active, Precharge, Read, and Write commands to
the other bank may be applied; during the access period, only Active and Precharge commands to the other bank may be applied. In
either case, all other related limitations apply (e.g. contention between Read data and Write data must be avoided).
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Read (With
Auto Precharge)
L L H H Active Select and activate row 1-6
L H L H Read Select column and start new Read burst 1-7,10
L H L L Write Select column and start Write burst 1-7,9,10
L L H L Precharge 1-6
Write (With
Auto Precharge)
L L H H Active Select and activate row 1-6
L H L H Read Select column and start Read burst 1-7,10
L H L L Write Select column and start new Write burst 1-7,10
L L H L Precharge 1-6
Truth Table 4: Current State Bank n - Command to Bank m (Different bank)
(Part 2 of 2)
Current State CS RAS CAS WE Command Action Notes
1. This table applies when CKE n-1 was high and CKE n is high (see Truth Table 2: Clock Enable (CKE) and after tXSNR / tXSRD has been
met (if the previous state was self refresh).
2. This table describes alternate bank operation, except where noted, i.e., the current state is for bank n and the commands shown are
those allowed to be issued to bank m (assuming that bank m is in such a state that the given command is allowable). Exceptions are cov-
ered in the notes below.
3. Current state definitions:
Idle: The bank has been precharged, and tRP has been met.
Row Active: A row in the bank has been activated, and tRCD has been met. No data bursts/accesses and no register accesses are
in progress.
Read: A Read burst has been initiated, with Auto Precharge disabled, and has not yet terminated or been terminated.
Write: A Write burst has been initiated, with Auto Precharge disabled, and has not yet terminated or been terminated.
Read with Auto Precharge Enabled: See note 10.
Write with Auto Precharge Enabled: See note 10.
4. Auto Refresh and Mode Register Set commands may only be issued when all banks are idle.
5. A Burst Terminate command cannot be issued to another bank; it applies to the bank represented by the current state only.
6. All states and sequences not shown are illegal or reserved.
7. Reads or Writes listed in the Command/Action column include Reads or Writes with Auto Precharge enabled and Reads or Writes with
Auto Precharge disabled.
8. Requires appropriate DM masking.
9. A Write command may be applied after the completion of data output.
10. The Read with Auto Precharge enabled or Write with Auto Precharge enabled states can each be broken into two parts: the access
period and the precharge period. For Read with Auto Precharge, the precharge period is defined as if the same burst was executed with
Auto Precharge disabled and then followed with the earliest possible Precharge command that still accesses all of the data in the burst.
For Write with Auto Precharge, the precharge period begins when tWR ends, with tWR measured as if Auto Precharge was disabled. The
access period starts with registration of the command and ends where the precharge period (or tRP) begins. During the precharge period
of the Read with Auto Precharge Enabled or Write with Auto Precharge Enabled states, Active, Precharge, Read, and Write commands to
the other bank may be applied; during the access period, only Active and Precharge commands to the other bank may be applied. In
either case, all other related limitations apply (e.g. contention between Read data and Write data must be avoided).
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Simplified State Diagram
Self
Auto
Idle
MRS
EMRS
Row
Precharge
Power
Write
Power
ACT
Read A
Read
REFS
REFSX
REFA
CKEL
MRS
CKEH
CKEH
CKEL
Write
Power
Applied
Automatic Sequence
Command Sequence
Read A
Write A
Read
PRE PRE
PRE
PRE
Refresh
Refresh
Down
Power
Down
Active
On
A
Read
A
Read
A
Write A
Burst Stop
Preall
Active
Precharge
Precharge
Preall
Read
Write
PREALL = Precharge All Banks
MRS = Mode Register Set
EMRS = Extended Mode Register Set
REFS = Enter Self Refresh
REFSX = Exit Self Refresh
REFA = Auto Refresh
CKEL = Enter Power Down
CKEH = Exit Power Down
ACT = Active
Write A = Write with Autoprecharge
Read A = Read with Autoprecharge
PRE = Precharge
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
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Absolute Maximum Ratings
Symbol Parameter Rating Units
VIN, VOUT Voltage on I/O pins relative to VSS 0.5 to VDDQ+ 0.5 V
VIN Voltage on Inputs relative to VSS 1.0 to +3.6 V
VDD Voltage on VDD supply relative to VSS 1.0 to +3.6 V
VDDQ Voltage on VDDQ supply relative to VSS 1.0 to +3.6 V
TAOperating Temperature (Ambient) 0 to +70 (Standard Grade)
40 to +85 (Industrial Grade) °C
TSTG Storage Temperature (Plastic) 55 to +150 °C
PDPower Dissipation 1.0 W
IOUT Short Circuit Output Current 50 mA
Note: Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rat-
ing only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this speci-
fication is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Capacitance
Parameter Symbol Min. Max. Units Notes
Input Capacitance: CK, CK CI12.0 3.0 pF 1
Delta Input Capacitance: CK, CK delta CI10.25 pF 1
Input Capacitance: All other input-only pins (except DM) CI22.0 3.0 pF 1
Delta Input Capacitance: All other input-only pins (except DM) delta CI20.5 pF 1
Input/Output Capacitance: DQ, DQS, DM CIO 4.0 5.0 pF 1, 2
Delta Input/Output Capacitance: DQ, DQS, DM delta CIO 0.5 pF 1
1. VDDQ = VDD = 2.5V ± 0.2V (minimum range to maximum range), f = 100MHz, TA = 25°C, VODC = VDDQ/2, VOPeak -Peak = 0.2V.
2. Although DM is an input-only pin, the input capacitance of this pin must model the input capacitance of the DQ and DQS pins. This is
required to match input propagation times of DQ, DQS and DM in the system.
DC Electrical Characteristics and Operating Conditions
(0 °C TA 70 °C; VDDQ = VDD = + 2.6V ± 0.1V(DDR400), VDDQ = VDD = + 2.5V ± 0.2V(DDR333), see AC Characteristics)
Symbol Parameter Min Max Units Notes
VDD Supply Voltage DDR333 2.3 2.7 V 1
VDD Supply Voltage DDR400 2.5 2.7 V 1
VDDQ I/O Supply Voltage DDR333 2.3 2.7 V 1
VDDQ I/O Supply Voltage DDR400 2.5 2.7 V 1
VREF I/O Reference Voltage 0.49 x VDDQ 0.51 x VDDQ V 1, 2
VTT I/O Termination Voltage (System) VREF 0.04 VREF + 0.04 V 1, 3
VIH(DC) Input High (Logic1) Voltage VREF + 0.15 VDDQ + 0.3 V 1
VIL(DC) Input Low (Logic0) Voltage 0.3 VREF 0.15 V 1
VIN(DC) Input Voltage Level, CK and CK Inputs 0.3 VDDQ + 0.3 V 1
VID(DC) Input Differential Voltage, CK and CK Inputs 0.36 VDDQ + 0.6 V 1, 4
VIX(DC) Input Crossing Point Voltage, CK and CK Inputs 0.30 VDDQ + 0.6 V 1, 4
VIRatio V-I Matching Pullup Current to Pulldown Current Ratio 0.71 1.4 5
II
Input Leakage Current
Any input 0V VIN VDD; (All other pins not under test = 0V) 2 2 µA 1
IOZ
Output Leakage Current
(DQs are disabled; 0V Vout VDDQ
5 5 µA 1
IOH Output Current: Nominal Strength Driver
High current (VOUT= VDDQ -0.373V, min VREF, min VTT)
Low current (VOUT= 0.373V, max VREF, max VTT)
16.2
mA 1
IOL 16.2
1. Inputs are not recognized as valid until VREF stabilizes.
2. VREF is expected to be equal to 0.5 VDDQ of the transmitting device, and to track variations in the DC level of the same. Peak-to-peak
noise on VREF may not exceed ± 2% of the DC value.
3. VTT is not applied directly to the device. VTT is a system supply for signal termination resistors, is expected to be set equal to VREF
, and
must track variations in the DC level of VREF
.
4. VID is the magnitude of the difference between the input level on CK and the input level on CK.
5. The ratio of the pullup current to the pulldown current is specified for the same temperature and voltage, over the entire temperature and
voltage range, for device drain to source voltages for 0.25 volts to 1.0 volts. For a given output, it represents the maximum difference
between pullup and pulldown drivers due to process variation.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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July 2009
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Normal Strength Driver Pulldown and Pullup Characteristics
1. The full variation in driver pulldown current from minimum to maximum process, temperature and voltage will lie within the
outer bounding lines of the V-I curve.
2. It is recommended that the “typical” IBIS pulldown V-I curve lie within the shaded region of the V-I curve.
3. The full variation in driver pullup current from minimum to maximum process, temperature and voltage will lie within the
outer bounding lines of the V-I curve.
4. It is recommended that the “typical” IBIS pullup V-I curve lie within the shaded region of the V-I curve.
5. The full variation in the ratio of the maximum to minimum pullup and pulldown current will not exceed 1.7, for device drain
to source voltages from 0.1 to 1.0.
6. The full variation in the ratio of the “typical” IBIS pullup to “typical” IBIS pulldown current should be unity + 10%, for device
drain to source voltages from 0.1 to 1.0. This specification is a design objective only. It is not guaranteed.
7. These characteristics are intended to obey the SSTL_2 class II standard.
8. This specification is intended for DDR SDRAM only.
Normal Strength Driver Pulldown Characteristics
Normal Strength Driver Pullup Characteristics
02.70
140
IOUT (mA)
VOUT (V)
Maximum
Typical High
Typical Low
Minimum
Maximum
Typical High
Typical Low
Minimum
VOUT (V)
2.70
0
-200
IOUT (mA)
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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July 2009
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Normal Strength Driver Pulldown and Pullup Currents
Pulldown Current (mA) Pullup Current (mA)
Voltage (V) Typical
Low
Typical
High Min Max Typical
Low
Typical
High Min Max
0.1 6.0 6.8 4.6 9.6 -6.1 -7.6 -4.6 -10.0
0.2 12.2 13.5 9.2 18.2 -12.2 -14.5 -9.2 -20.0
0.3 18.1 20.1 13.8 26.0 -18.1 -21.2 -13.8 -29.8
0.4 24.1 26.6 18.4 33.9 -24.0 -27.7 -18.4 -38.8
0.5 29.8 33.0 23.0 41.8 -29.8 -34.1 -23.0 -46.8
0.6 34.6 39.1 27.7 49.4 -34.3 -40.5 -27.7 -54.4
0.7 39.4 44.2 32.2 56.8 -38.1 -46.9 -32.2 -61.8
0.8 43.7 49.8 36.8 63.2 -41.1 -53.1 -36.0 -69.5
0.9 47.5 55.2 39.6 69.9 -43.8 -59.4 -38.2 -77.3
1.0 51.3 60.3 42.6 76.3 -46.0 -65.5 -38.7 -85.2
1.1 54.1 65.2 44.8 82.5 -47.8 -71.6 -39.0 -93.0
1.2 56.2 69.9 46.2 88.3 -49.2 -77.6 -39.2 -100.6
1.3 57.9 74.2 47.1 93.8 -50.0 -83.6 -39.4 -108.1
1.4 59.3 78.4 47.4 99.1 -50.5 -89.7 -39.6 -115.5
1.5 60.1 82.3 47.7 103.8 -50.7 -95.5 -39.9 -123.0
1.6 60.5 85.9 48.0 108.4 -51.0 -101.3 -40.1 -130.4
1.7 61.0 89.1 48.4 112.1 -51.1 -107.1 -40.2 -136.7
1.8 61.5 92.2 48.9 115.9 -51.3 -112.4 -40.3 -144.2
1.9 62.0 95.3 49.1 119.6 -51.5 -118.7 -40.4 -150.5
2.0 62.5 97.2 49.4 123.3 -51.6 -124.0 -40.5 -156.9
2.1 62.9 99.1 49.6 126.5 -51.8 -129.3 -40.6 -163.2
2.2 63.3 100.9 49.8 129.5 -52.0 -134.6 -40.7 -169.6
2.3 63.8 101.9 49.9 132.4 -52.2 -139.9 -40.8 -176.0
2.4 64.1 102.8 50.0 135.0 -52.3 -145.2 -40.9 -181.3
2.5 64.6 103.8 50.2 137.3 -52.5 -150.5 -41.0 -187.6
2.6 64.8 104.6 50.4 139.2 -52.7 -155.3 -41.1 -192.9
2.7 65.0 105.4 50.5 140.8 -52.8 -160.1 -41.2 -198.2
Normal Strength Driver Evaluation Conditions
Typical Minimum Maximum
Temperature (Tambient)25 °C 70 °C 0 °C
VDDQ 2.5V 2.3V 2.7V
Process conditions typical process slow-slow process fast-fast process
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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AC Characteristics
(Notes 1-5 apply to the following Tables; Electrical Characteristics and DC Operating Conditions, AC Operating Conditions, IDD
Specifications and Conditions, and Electrical Characteristics and AC Timing.)
1. All voltages referenced to VSS.
2. Tests for AC timing, IDD, and electrical, AC and DC characteristics, may be conducted at nominal reference/supply voltage
levels, but the related specifications and device operation are guaranteed for the full voltage range specified.
3. Outputs measured with equivalent load. Refer to the AC Output Load Circuit below.
4. AC timing and IDD tests may use a VIL to VIH swing of up to 1.5V in the test environment, but input timing is still referenced
to VREF (or to the crossing point for CK, CK), and parameter specifications are guaranteed for the specified AC input levels
under normal use conditions. The minimum slew rate for the input signals is 1V/ns in the range between VIL(AC) and
VIH(AC).
5. The AC and DC input level specifications are as defined in the SSTL_2 Standard (i.e. the receiver effectively switches as a
result of the signal crossing the AC input level, and remains in that state as long as the signal does not ring back above
(below) the DC input low (high) level.
AC Output Load Circuit Diagrams
50
Timing Reference Point
Output
(VOUT)
30pF
VTT
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
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AC Input Operating Conditions
(0 °C TA 70 °C; VDDQ = VDD = + 2.6V ± 0.1V(DDR400), VDDQ = VDD = + 2.5V ± 0.2V(DDR333); See AC Characteristics)
Symbol Parameter/Condition Min Max Unit Notes
VIH(AC) Input High (Logic 1) Voltage, DQ, DQS, and DM Signals VREF + 0.31 V 1, 2
VIL(AC) Input Low (Logic 0) Voltage, DQ, DQS, and DM Signals VREF 0.31 V 1, 2
VID(AC) Input Differential Voltage, CK and CK Inputs 0.7 VDDQ + 0.6 V 1, 2, 3
VIX(AC) Input Crossing Point Voltage, CK and CK Inputs 0.5*VDDQ 0.2 0.5*VDDQ + 0.2 V 1, 2, 4
1. Input slew rate = 1V/ns.
2. Inputs are not recognized as valid until VREF stabilizes.
3. VID is the magnitude of the difference between the input level on CK and the input level on CK.
4. The value of VIX is expected to equal 0.5*VDDQ of the transmitting device and must track variations in the DC level of the same.
IDD Specifications and Conditions
(0 °C TA 70 °C; VDDQ = VDD = + 2.6V ± 0.1V(DDR400), VDDQ = VDD = + 2.5V ± 0.2V(DDR333); See AC Characteristics)
Symbol Parameter/Condition
DDR333
(-6K/-6KI)
tCK=6ns
DDR400
(-5T/-5TI)
tCK=5ns
Unit Note
s
IDD0
Operating Current: one bank; active / precharge; tRC = tRC (min); DQ, DM, and
DQS inputs changing twice per clock cycle; address and control inputs changing
once per clock cycle
x4/x8 70 75 mA
x16 85 90 mA 1
IDD1
Operating Current: one bank; active / read / precharge; Burst = 2; tRC = tRC (min);
CL = 2.5; IOUT = 0mA; address and control inputs changing once per clock cycle
x4/x8 80 85 mA
x16 95 110 mA 1
IDD2P
Precharge Power Down Standby Current: all banks idle; Power Down mode; CKE VIL
(max) 4.6 4.6 mA 1
IDD2F
Idle Standby Current: CS VIH (min); all banks idle; CKE VIH (min);
address and control inputs changing once per clock cycle 25 30 mA 1
IDD2Q
Precharge floating standby current: CS VIH (min); all banks idle; CKE VIH (min);
address and control inputs changing once per clock cycle
22 23 mA 1
IDD3P
Active Power Down Standby Current: one bank active; Power Down mode; CKE VIL
(max) 15 16 mA 1
IDD3N
Active Standby Current: one bank; active / precharge; CS VIH (min);
CKE VIH (min); tRC = tRAS (max); DQ, DM, and DQS inputs changing twice per
clock cycle; address and control inputs changing once per clock cycle
x4/x8 37 42 mA
x16 40 45 mA 1
IDD4R
Operating Current: one bank; Burst = 2; reads; continuous burst; address and
control inputs changing once per clock cycle; DQ and DQS outputs changing twice
per clock cycle; CL = 2.5; IOUT = 0mA
x4/x8 85 90 mA
x16 115 135 mA 1
IDD4W
Operating Current: one bank; Burst = 2; writes; continuous burst; address and
control inputs changing once per clock cycle; DQ and DQS inputs changing twice
per clock cycle; CL = 2.5
x4/x8 90 95 mA
x16 120 135 mA 1
IDD5 Auto-Refresh Current: tRC = tRFC (min) 175 190 mA 1
IDD6 Self-Refresh Current: CKE 0.2V 5 5 mA 1, 2
IDD7
Operating current: four bank; four bank interleaving with BL = 4, address and con-
trol inputs randomly changing; 50% of data changing at every transfer;
t RC = t RC (min); I OUT = 0mA.
x4/x8 205 230 mA
x16 230 250 mA 1
1. IDD specifications are tested after the device is properly initialized.
2. Enables on-chip refresh and address counters.
Values are averaged from high and low temp values using x16 devices.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
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NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Electrical Characteristics & AC Timing - Absolute Specifications
(0 °C TA 70 °C; VDDQ = VDD = + 2.6V ± 0.1V(DDR400), VDDQ = VDD = + 2.5V ± 0.2V(DDR333); See AC Characteristics)
Symbol Parameter
DDR333 (-6K/-6KI) DDR400 (-5T/-5TI)
Unit Notes
Min Max Min Max
tAC DQ output access time from CK/CK - 0.7 + 0.7 0.7 + 0.7 ns
tDQSCK DQS output access time from CK/CK - 0.6 + 0.6 0.6 + 0.6 ns
tCH CK high-level width 0.45 0.55 0.45 0.55 tCK
tCL CK low-level width 0.45 0.55 0.45 0.55 tCK
tCK Clock cycle time
CL = 3.0 5 7.5 ns
CL = 2.5 6 12 ns 3
tDH DQ and DM input hold time 0.45 0.4 ns 4
tDS DQ and DM input setup time 0.45 0.4 ns 4
tIPW Input pulse width 2.2 2.2 ns 5
tDIPW DQ and DM input pulse width (each input) 1.75 1.75 ns 5
tHZ Data-out high-impedance time from CK/CK + 0.7 + 0.7 ns 6
tLZ Data-out low-impedance time from CK/CK - 0.7 + 0.7 0.7 + 0.7 ns 6
tDQSQ DQS-DQ skew
(DQS & associated DQ signals)
TSOP Package + 0.45 + 0.4
BGA Package + 0.4 + 0.4
tHP Minimum half clk period for any given cycle;
defined by clk high (tCH) or clk low (tCL) time
min
(tCL, tCH)
min
(tCL, tCH)tCK 1,2
tQH Data output hold time from DQS tHP - tQHS tHP - tQHS ns
tQHS Data hold Skew Factor TSOP Package 0.55 0.5 ns
BGA Package 0.5 0.5 ns
tDQSS Write command to 1st DQS latching
transition 0.75 1.25 0.72 1.25 tCK
tDQSH DQS input high pulse width (write cycle) 0.35 0.35 tCK
tDQSL DQS input low pulse width (write cycle) 0.35 0.35 tCK
tDSS DQS falling edge to CK setup time (write cycle) 0.2 0.2 tCK
tDSH DQS falling edge hold time from CK (write cycle) 0.2 0.2 tCK
tMRD Mode register set command cycle time 2 2 tCK
tWPRES Write preamble setup time 0 0 ns
tWPST Write postamble 0.4 0.6 0.40 0.60 tCK 9
tWPRE Write preamble 0.25 max(0.25
tCK, 1.5ns) tCK 8
tIH Address and control input hold time
(fast slew rate) 0.75 0.6 ns 5, 10-12
tIS Address and control input setup time
(fast slew rate) 0.75 0.6 ns 5, 10-12
tIH Address and control input hold time
(slow slew rate) 0.8 0.7 ns 5, 11-13
tIS Address and control input setup time
(slow slew rate) 0.8 0.7 ns 5, 11-13
tRPRE Read preamble 0.9 0.9 1.1 tCK 14
tRPST Read postamble 0.4 0.6 0.4 0.6 tCK
tRAS Active to Precharge command 42 70,000 40 70,000 ns
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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tRC Active to Active/Auto-refresh command period 60 55 ns
tRFC Auto-refresh to Active/Auto-refresh command period 72 70 ns
tRCD Active to Read or Write delay 18 15 ns
tRAP Active to Read Command with Autoprecharge
min
(tRCD, tRAS)min
(tRCD, tRAS)ns
tRP Precharge command period 18 15 ns
tRRD Active bank A to Active bank B command 12 10 ns
tWR Write recovery time 15 15 ns
tDAL Auto precharge write recovery + precharge time -- -- tCK 15
tWTR Internal write to read command delay 1 2 tCK
tXSNR Exit self-refresh to non-read command 75 75 ns 16
tXSRD Exit self-refresh to read command 200 200 tCK
tREFI Average Periodic Refresh Interval 7.8 7.8 µs 4, 17
Electrical Characteristics & AC Timing - Absolute Specifications
(0 °C TA 70 °C; VDDQ = VDD = + 2.6V ± 0.1V(DDR400), VDDQ = VDD = + 2.5V ± 0.2V(DDR333); See AC Characteristics)
Symbol Parameter
DDR333 (-6K/-6KI) DDR400 (-5T/-5TI)
Unit Notes
Min Max Min Max
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Component Notes
1. Min (tCL, tCH) referes to the smaller of the actual clock low time and actual clock high time as provided to the
device. (i.e. this value can be greater than the minimum specification limits for tCL and tCH).
2. tQH = tHP - tQHS, where tHP = minimum half clock period for any given cycle and is defined by clock high or
clock low (tCH, tCL). tQHS accounts for 1) The pulse duration distortion of on-chip clock circuits; and 2) The
worst case push-out of DQS on one transition followed by the worst case pull-in of DQ on the next transition,
both of which are, separately, due to data pin skew and output pattern effects, and p-channel to n-channel
variation of the output drivers.
3. The only time that the clock frequency is allowed to change is during self-refresh mode.
4. If refresh time or tDS/tDH is viloated, data corruption may occur and the data must be re-written with valid
data before a valid READ can be executed.
5. These parameters quarantee device timing, but they are not necessarily tested on each device. They may be
guaranteed by device design or tester correlation.
6. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters
are reference to a specific voltage level that specifies when the device output is no longer driving (tHZ) or
begins driving (tLZ) by measuring the signal at two different voltages. The actual voltage measurement points
are not critical as long as the calculation is consistent.
7. tDQSQ consists of datapin skew and output pattern effects and p-channel to n-channel variation of the output
drivers for any given cycle.
8. The specific requirement is that DQS be valid (High, Low, or at same point on a valid transition) on or before
this CK edge. A valid transition is defined as monotonic and meeting the input slew rate specifications of the
device. When no writes were previously in progress on the bus, DQS will be transitioning from High-Z to logic
Low. If a previous write was in process, DQS could be HIGH, LOW, or transitioning from High to Low at this
time, depending on DQSS.
9. The maximum limit for this parameter is not a device limit. The device will operate with a greater value for this
parameter, but system performance (bus turn-arround) will degrade accordingly.
10. For command/address input slew rate >= 1.0V/ns.
11. For CK & CK slew rate >= 1.0V/ns (single-ended).
12. Slew Rate is measured between VOH(ac) and VOL(ac).
13. For command/address input slew rate >= 0.5V/ns and <1.0V/ns.
14. tRPST end point and tRPRE begin point are not reference to a specific voltage level but specify when the
device output is no longer driving (tRPRE) by measuring the signal at two different voltages. The actual
voltage measurement points are not critical as long as the calculation is consistent.
15. tDAL = (tWR/tCK) + (tRP/tCK)
16. In all circumstances, tXSNR can be satisfied using tXSNR = tRFCmin + 1*tCK.
17. A maximum of eight Auto Refresh commands can be posted to any given DDR SDRAM.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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July 2009
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Data Input (Write) (Timing Burst Length = 4)
Data Output (Read) (Timing Burst Length = 4)
tDH
tDS
tDH
tDS
tDSL
DI n = Data In for column n.
3 subsequent elements of data in are applied in programmed order following DI n.
DI n
DQS
DQ
DM
Don’t Care
tDSH
tDQSQ (max) occurs when DQS is the earliest among DQS and DQ signals to transition.
DQS
DQ t
DQSQ
t
DQSQ
Data Output hold time from Data Strobe is shown as tQH. tQH is a function of the clock high or low time (tHP)
t
QH2
t
QH1
t
DQSQ
t
QH3
t
QH4
t
DQSQ
CK
CK t
HP
t
HP
t
HP
t
HP1
t
HP2
t
HP3
t
HP4
tHP is the half cycle pulse width for each half cycle clock. tHP is referenced to the clock duty cycle only
and not to the data strobe (DQS) duty cycle.
for that given clock cycle. Note correlation of tHP to tQH in the diagram above (tHP1 to tQH1, etc.).
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
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Initialize and Mode Register Sets
tIH
200µs
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tMRD
tRFC
tRFC
tRP
tMRD
tMRD
tCL
tCK
tCH
tVTD
PRE EMRS MRS PRE AR AR MRSNOP ACT
CODE CODE CODE RA
CODE CODE CODE RA
BA0=L BA0=L BA
High-Z
High-Z
Power-up:
VDD and CK
stable
Extended Mode
Register Set
Load Mode
Register, Reset DLL
Load Mode
Register
(with A8 = L)
VDD
VDDQ
VTT (System*)
VREF
CK
CKE
Command
DM
A0-A9, A11
A10
BA0, BA1
DQS
DQ
LVCMOS LOW LEVEL
ALL BANKS
BA0=H
BA1=L BA1=L BA1=L
ALL BANKS
* VTT is not applied directly to the device, however tVTD must be
** tMRD is required before any command can be applied and
The two Autorefresh commands may be moved to follow the first MRS,
greater than or equal to zero to avoid device latchup.
200 cycles of CK are required before a Read command can be applied.
but precede the second Precharge All command.
Don’t Care
200 cycles of CK**
CK
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Power Down Mode
tIH
tIS
tIH
tIS
tIS
tIS
tIH
tIS
tCL
tCH
tCK
NOP VALIDVALID*
VALID VALID
Enter Power
Down Mode
Exit Power
Down Mode
No column accesses are allowed to be in progress at the time power down is entered.
* = If this command is a Precharge (or if the device is already in the idle state) then the power down mode
shown is Precharge power down. If this command is an Active (or if at least one row is already active), then
the power down mode shown is Active power down.
CKE
Command
ADDR
DQS
DQ
DM
Don’t Care
CK
CK
NOP
tPDEX
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Auto Refresh Mode
tIH
tIS
tIH
tIS
tIH
tIS
tRFC
tRP
tCL
tCH
tCK
PRE NOP NOP AR NOP AR NOPNOP NOP
RA
RA
BA
PRE = Precharge; ACT = Active; RA = Row address; BA = Bank address; AR = Autorefresh.
NOP commands are shown for ease of illustration; other valid commands may be possible at these times.
DM, DQ, and DQS signals are all don't care/high-Z for operations shown.
VALID VALID
ACT
RA
CKE
Command
A0-A8
A9, A11,A12
A10
BA0, BA1
DQS
DQ
DM
BANK(S)
Don’t Care
ALL BANKS
ONE BANK
tRFC
CK
CK
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Self Refresh Mode
200 cycles
tIH
tIS
tXSRD, tXSRN
tIH
tIS
tIS
tIS
tIH
tIS
tRP*
tCK
tCL
tCH
AR VALIDNOP
VALID
Enter Self
Refresh Mode
Exit Self
Refresh Mode
NOP
* = Device must be in the all banks idle state before entering Self Refresh Mode.
** = tXSNR is required before any non-read command can be applied, and tXSRD (200 cycles of CK).
CKE
Command
ADDR
DQS
DQ
DM
Don’t Care
are required before a Read command can be applied.
CK
CK
Clock must be stable before exiting Self Refresh Mode
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
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Read without Auto Precharge (Burst Length = 4)
tHZ (max)
tLZ (max)
tHZ (min)
tRPST
tLZ (min)
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIH
tIS
tRP
tCL
tCH
tCK
PRE NOP NOP ACT NOP NOP NOPNOP
DO n = data out from column n.
3 subsequent elements of data out are provided in the programmed order following DO n.
* = Don't care if A10 is High at this point.
PRE = Precharge; ACT = Active; RA = Row address; BA = Bank address.
NOP commands are shown for ease of illustration; other commands may be valid at these times.
BA x BA x
VALID VALID VALID
NOP Read
COL n RA
RA
BA x*
DO n
CKE
Command
A10
BA0, BA1
DM
DQS
DQ
DQS
DQ
A0-A9, A11, A12
ALL BANKS
ONE BANK
tDQSCK (max)
tRPRE
CL=2
tRPRE
Don’t Care
Case 1:
tAC/tDQSCK = min
Case 2:
tAC/tDQSCK = max tRPST
tAC (max)
tLZ (max)
tDQSCK (min)
tAC (min)
DO n
CK
CK
DIS AP
DIS AP = Disable Auto Precharge.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Read with Auto Precharge (Burst Length = 4)
tHZ (max)
tLZ (max)
tHZ (min)
tRPST
tLZ (min)
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIH
tIS
tRP
tCL
tCH
tCK
NOP NOP NOP ACT NOP NOP NOPNOP
DO n = data out from column n.
3 subsequent elements of data out are provided in the programmed order following DO n.
EN AP = enable Auto Precharge.
ACT = active; RA = row address.
NOP commands are shown for ease of illustration; other commands may be valid at these times.
BA x
VALID VALID VALID
NOP Read
COL n RA
RA
DO n
CKE
Command
A10
BA0, BA1
DM
DQS
DQ
DQS
DQ
A0-A9, A11, A12
tDQSCK (max)
tRPRE
CL=2
tRPRE
Don’t Care
Case 1:
tAC/tDQSCK = min
Case 2:
tAC/tDQSCK = max tRPST
tAC (max)
tLZ (max)
tDQSCK (min)
tAC (min)
DO n
EN AP
BA x
CK
CK
tHZ (min)
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Bank Read Access (Burst Length = 4)
tHZ (max)
tLZ (max)
tHZ (min)
tRPST
tLZ (min)
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tCL
tCH
tCK
Read NOP PRE NOP NOP ACT NOPNOP
BA x BA x*
VALID
NOP ACT
RA RA
BA x
DO n
CK
CK
CKE
Command
A10
BA0, BA1
DM
DQS
DQ
DQS
DQ
tDQSCK (max)
tRPRE
CL=2CL=2
tRPRE
Don’t Care
Case 1:
tAC/tDQSCK = min
Case 2:
tAC/tDQSCK = max tRPST
tAC (max)
tLZ (max)
tDQSCK (min)
tAC (min)
DO n
COL n
RARA
ALL BANKS
RA
ONE BANKDIS AP
BA x
tRP
DO n = data out from column n.
3 subsequent elements of data out are provided in the programmed order following DO n.
DIS AP = disable Auto Precharge.
* = Don't care if A10 is High at this point.
PRE = Precharge; ACT = Active; RA = Row address; BA = Bank address.
NOP commands are shown for ease of illustration; other commands may be valid at these times.
tRCD
A0-A9, A11, A12
tRAS
tRC
tLZ (min)
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Write without Auto Precharge (Burst Length = 4)
tIH
tWPST
tDQSL
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tRP
tCL
tCH
tCK
NOP NOP NOP PRE NOP NOP ACT
NOP
BA x BA
NOP Write
COL n RA
RA
BA x*
VALID
DIn = Data in for column n.
3 subsequent elements of data in are applied in the programmed order following DIn.
DIS AP = Disable Auto Precharge.
* = Don't care if A10 is High at this point.
PRE = Precharge; ACT = Active; RA = Row address; BA = Bank address.
NOP commands are shown for ease of illustration; other valid commands may be possible at these times.
DIn
CK
CK
CKE
Command
A10
BA0, BA1
DQS
DQ
DM
DIS AP
ALL BANKS
ONE BANK
tWR
tWPRES tDQSH
Don’t Care
A0-A9, A11, A12
tDQSS = min.
tDQSS
tWPRE tDSH
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Write with Auto Precharge (Burst Length = 4)
NOP commands are shown for ease of illustration; other valid commands may be possible at these times.
ACT = Active; RA = Row address; BA = Bank address.
tIH
tWPST
tDQSL
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tIS
tRP
tCL
tCH
tCK
NOP NOP NOP NOP NOP NOP ACT
NOP
BA x BA
NOP Write
COL n RA
RA
VALID
DIn = Data in for column n.
3 subsequent elements of data in are applied in the programmed order following DIn.
EN AP = Enable Auto Precharge.
CK
CK
CKE
Command
A10
BA0, BA1
DQS
DQ
DM
tWR
tDQSS
tWPRES
tDQSH
Don’t Care
VALID VALID
EN AP
A0-A9, A11, A12
tDAL
tDQSS = min.
tDSH
tWPRE
DIn
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
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Bank Write Access (Burst Length = 4)
tWPST
tDQSL
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tIH
tIS
tCL
tCH
tCK
tRAS
Write NOP NOP NOP NOP PRE NOPNOP
BA x
NOP ACT
RA
RA
DI n = data in for column n.
3 subsequent elements of data in are applied in the programmed order following DI n.
DIS AP = Disable Auto Precharge.
* = don't care if A10 is High at this point.
PRE = Precharge; ACT = Active; RA = Row address.
NOP commands are shown for ease of illustration; other valid commands may be possible at these times.
DIn
VALID
BA x
CKE
Command
A10
BA0, BA1
DQS
DQ
DM
CK
CK
tWPRES tWR
tRCD
ALL BANKS
ONE BANK
DIS AP
Don’t Care
A0-A9, A11, A12 Col n
BA x
tDQSS
tDQSH
tDSH
tWPRE
tDQSS = min.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
73
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Write DM Operation (Burst Length = 4)
tIH
tWPST
tDQSL
tIH
tIS
tIH
tIS
tIS
tRP
tCL
tCH
tCK
NOP NOP NOP PRE NOP NOP ACT
NOP
NOP Write
COL n RA
DIn
CK
CK
CKE
Command
A10
BA0, BA1
DQS
DQ
DM
tWR
tDQSS
Don’t Care
VALID
tIH
tIS
tIH
tIS
BA x BA
RA
BA x*
ALL BANKS
ONE BANK
DIS AP
DI n = data in for column n.
3 subsequent elements of data in are applied in the programmed order following DI n (the second element of the 4 is masked).
DIS AP = Disable Auto Precharge.
* = Don't care if A10 is High at this point.
PRE = Precharge; ACT = Active; RA = Row address; BA = Bank address.
NOP commands are shown for ease of illustration; other valid commands may be possible at these times.
A0-A9, A11, A12
tDQSH tDSH
tDQSS = min.
tWPRES
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
74
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Package Dimensions (60 balls; 0.8mmx1.0mm Pitch; wBGA Package)
0.80
10.0
1.00
12.0
0.25 min.
0.40 max.
1.20 max.
Dia.
0.40 min.
0.50 max.
Note : All dimensions are typical unless otherwise stated.
Unit : Millimeters
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
75
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Package Dimensions (400mil; 66 lead TSOP Package)
1.025
3.900
+/- 0.100
133
34
66
9.600 +/- 0.050
22.22 +/- 0.10
0.71 0.65 0.30 +0.03
-0.08
1.20 Max.
0.06 Min.
10.16 +/- 0.13
11.76 +/- 0.20
0.127
0.80
0.50 +/- 0.10
0.250
0.50 +/- 0.10
7 Max.
Unit: mm
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
76
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Revision Log
Rev Date Modification
0.1 Jan 2004 Preliminary Release
0.2 Dec 2007 Support NT5DS64M8CG, NT5DS64M8CS, NT5DS32M16CG, NT5DS32M16CS
0.3 Dec 2007 Support NT5DS128M4CS
1.0 Dec 2007 Official Release
1.1 July 2009
1. Removed following part numbers:
NT5DS128M4CG-5T/-6K
NT5DS32M16CG-5T/-6K
2. Added x8/x16 industrial grade products on Ordering Information table page 2.
NT5DS32M16CS
NT5DS64M8CS/NT5DS64M8CG
NT5DS128M4CS
512Mb DDR SDRAM
REV 1.1
July 2009
77
© NANYA TECHNOLOGY CORP. All rights reserved.
NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.
Nanya Technology Corporation.
All rights reserved.
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Other company, product and service names may be trademarks or service marks of others.
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of its semiconductor products and related software to the specifications applicable at the time of sale in accordance with NTC’s
standard warranty. Testing and other quality control techniques are utilize to the extent NTC deems necessary to support this
warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government
requirements.
Certain applications using semiconductor products may involve potential risks of death, personal injury, or severe property or
environmental damage (“Critical Applications”).
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FOR USE IN LIFE-SUPPORT APPLICATIONS, DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS.
Inclusion of NTC products in such applications is understood to be fully at the risk of the customer. Use of NTC products in such
applications requires the written approval of an appropriate NTC officer. Question concerning potential risk applications should
be directed to NTC through a local sales office.
In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards should be
provided by customer to minimize the inherent or procedural hazards.
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machine, or process in which such semiconductor products or services might be or are used.
NANYA TECHNOLOGY CORPORATION
HWA YA Technology Park
669, FU HSING 3rd Rd., Kueishan,
Taoyuan, Taiwan, R.O.C.
The NANYA TECHNOLOGY CORPORATION home page can be found at: http:\\www.nanya.com
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