
Fig. 5: Relative variation of holding current
versus gate-cathode resistance (typical values).
Fig. 6: Relative variation of dV/dt immunity
versus gate-cathode resistance (typical values).
Tj=25 ºC
1E-2 1E-1 1E+0 1E-1
5
4
3
2
1
0
Tj = 125°C
10.00
1.00
0.10
0.01
0 0.2 0.6 0.8 1.0 1.20.4 1.4 1.6 1.8 2.0
VD = 0.67xVDRM
RGK=(kW)
IH [RGK] / IH[RGK = 1kW]
RGK=(kW)
dV/dt [RGK] / dV/dt [RGK = 220W]
Fig. 1: Maximum average power dissipation
versus average on-state current
SENSITIVE GATE SCR
Fig. 2: Average and D.C. on-state current
versus case temperature
1
0.8
0.6
0.4
0.2
0
I T(AV) (A)
020 40 60 80 100 120 140
DC
a = 180
º
T lead (ºC)
Fig. 3: Relative variation of thermal impedance
junction to case versus pulse duration
1.0
[Zth(j-c) / Rth (j-c)]
1E-3 1E-2 1E-1 1E+0
tp (s)
0.5
0.2
0.1
IGT, IH (Tj) / IGT, IH (Tj = 25 ºC)
Tj (ºC)
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
-40 -20 20 60 80 1000 40 120 140
I
H
& IL
Fig. 4: Relative variation of gate trigger
current, holding and latching current versus
junction temperature
I GT
FS01...A/B
1
0.8
0.6
0.4
0.2
0
0
P (W)
a
360
º
0.60.40.2 0.8 1.0
Mar - 05