NISSEI-ARCOTRONICS JSN
MKT Series
METALLIZED POLYESTER FILM CAPACITOR
JUMBO CHIP
SERIES CODE: JSN
SIZE TABLE
Rated
Cap. Size
code
H max
mm
Size
code
H max
mm
Size
code
H max
mm
Size
code
H max
mm
Size
code
H max
mm
Size
code
H max
mm
10µF 60.80 4 60.80 6 90.80 5 100.80 4
15µF 60.80 5 90.80 4 60.160 5 90.80 7 100.80 6
22µF 60.160 4 90.80 5 100.80 5 60.210 6 90.160 5 100.160 5
33µF 60.230 4 90.160 4 100.80 7 60.230 7 90.210 6 100.210 6
47µF 60.230 6 90.210 5 100.160 5 90.230 7 100.230 7
68µF 90.230 6 100.210 6
100µF 100.230 7
SIZE CONVERSION
Size
code 60.80 60.160 60.230 90.80 90.160 90.210 90.230 100.80 100.160 100.210 100.230
L max 15.2 15.2 15.2 22.5 22.5 22.5 22.5 26.0 26.0 26.0 26.0
W max 21.2 42.2 59.2 21.2 42.2 49.2 59.2 21.2 42.2 49.2 59.2
ELECTRICAL CHARACTERISTICS
Rated voltage (VR): 63Vdc, 100Vdc
Category Voltage (VC): VC=VR up to 105°C. For temperatures
between +105°C and +125°C a derating factor of 1.25% per °C
has to be applied.
Rated temperature: +105°C
Capacitance range: 10µF to 100µF
Capacitance values: E6 series
Capacitance tolerance (measured at 1kHz):
±10%: ±20%. (Other tolerances are available upon request)
Dissipation Factor (tgδ): ≤ 0.01 at 1kHz – T=25°C±5°C
Insulation Resistance:
Test conditions
T=25°C±5°C
Voltage charge time: 1 min
Voltage charge: 50Vdc for VR = 63Vdc
100Vdc for VR = 100Vdc
Performance
≥250s for VR = 63Vdc
≥100s for VR = 100Vdc
Max pulse rise time (dv/dt): for C≤ 50µF 30V/µs
for C> 50µF 20V/µs
Test voltage between terminations:
1.6 x VR applied for 2s at T=25°C±5
Mounting & Connection:
Electrical welding is preferred.
CAUTION:
Hand assembly
The capacitors are protected against mechanical contact on the
cutting surface and the capacitor body during the handling
operations.
In case of hand assembly with soldering iron the following
recommendations must be taken:
Max temperature on the soldering iron: 250°C for max 5s
Contact between the soldering iron and the body of the capacitor
must be avoided.
TEST METHOD & PERFORMANCE
Damp heat, steady state:
Test conditions
Temperature: 40°C ±2°C
Relative humidity: 93%
Test duration: 56 days
Performance
Capacitance change (∆C/C): ≤ 7%
DF change (tgδ): ≤ 50x10-4 at 1kHz
Insulation resistance: ≥ 50% of limit value
Endurance
Test conditions
Temperature: 125°C ±2°C
Test duration: 2000 h
Voltage applied: 1.25 x VC
Performance
Capacitance change (∆C/C): ≤ 8%
DF change (tgδ): ≤ 50x10-4 at 1kHz
Insulation resistance: ≥ 50% of limit value
Rapid change of temperature
Test conditions
Temperature: 1 h at -55°C; 1 h at +125
Number of cycles: 1000
Performance
Capacitance change (∆C/C): ≤ 5%
DF change (tgδ): ≤ 50x10-4 at 1kHz
Insulation resistance: ≥ limit value
No mechanical damage.
Long term stability (after two years):
Storage: standard environmental conditions.
Performance
Capacitance change (∆C/C): ≤ 3%
Reliability (reference MIL HDB 217)
Failure rate: ≤1 FIT (40°C – 0.5x VR)
Failure criteria
Short or open circuit
Capacitance change (∆C/C) >10%
DF change (tgδ) > 2xinitial limit)
Insulation resistance: < 0.005 x initial value