GS61008P
100V enhancement mode GaN transistor
Preliminary Datasheet
© 2009-2015 GaN Systems Inc.
This information applies to a product under development. Its characteristics and specifications are subject to change without notice.
Electrical Characteristics (Typical values at TCASE= 25°C unless otherwise noted)
Parameters Symbol Value Units Conditions (Note 3)
Drain-to-Source Breakdown Voltage BVDSS 100 V
GS
Drain-to-Source On Resistance (TJ = 25°C)
RDS(ON)
7.4 mΩ
GS
J
Drain-to-Source On Resistance (TJ = 150°C) 18.5 mΩ
GS
J
D
Gate Threshold Voltage VGS(th) 1.6 V
DS
GS
Drain to Source Leakage Current (TJ = 25°C)
IDSS
0.5 µA
DS
= 100V
VGS = 0V, TJ = 25°C
Drain to Source Leakage Current (TJ = 150°C) 100 µA
DS
= 100V
VGS = 0V, TJ = 150°C
Gate to Source Current IGS 200 µA VGS=6V, VDS=0V
Gate Resistance RG 1.5 Ω f=1MHz, open drain
Input Capacitance CISS 610
pF
VDS = 80V
VGS = 0V
f = 1MHz
Output Capacitance COSS 250
Reverse Transfer Capacitance CRSS 15
Effective Output Capacitance, Energy Related (Note 4) CO(ER) 293 pF
GS
Effective Output Capacitance, Time Related (Note 5) CO(TR) 360 pF
D
VGS =0V
Total Gate Charge QG(TOT) 12.0 nC
VGS=0 to 6V
VDS=50V
ID=27A
Gate-to-Source Charge QGS 2.0 nC
Gate-to -Drain Charge QGD 2.2 nC
Reverse Recovery Charge QRR 0 nC
Output Charge QOSS 21 nC
Gate plateau voltage Vplat 3.0 V VDS = 80V
Source-Drain Reverse Voltage VSD 0.15 V
GS
J
Source-Drain Reverse Voltage VSD 2.0 V
GS
J
(3) All parameters are specified with the substrate and thermal pad connected to the source
(4) Co(ER) is the fixed capacitance that would give the same stored energy as COSS while VDS is rising from 0V to the stated VDS
(5) Co(TR) is the fixed capacitance that would give the same charging time as COSS while VDS is rising from 0V to the stated VDS