Product Specification
PE42556
Page 3 of 10
Document No. 70-0289-06 │www.psemi.com ©2009-2012 Peregrine Semiconductor Corp. All rights reserved.
Table 2. Bump Descriptions
Table 4. Absolute Maximum Ratings
Electrostatic Discharge (ESD) Precautions
When handling this UltraCMOS® device, observe the
same precautions that you would use with other ESD-
sensitive devices. Although this device contains
circuitry to protect it from damage due to ESD,
precautions should be taken to avoid exceeding the
rating specified.
Latch-Up Avoidance
Unlike conventional CMOS devices, UltraCMOS®
devices are immune to latch-up.
Figure 3. Bump Configuration (Bumps Up)
Bump
No.
Bump
Name Description
1 VSS Negative supply voltage or GND
connection (Note 3)
2, 13, 14 D-GND Digital Ground
3, 5, 7, 9 GND Ground
4 RF2 RF Port 2
6 RFC RF Common
8 RF1 RF Port 1
10 LS
Logic Select - Used to determine the
definition for the CTRL pin (see Table 5)
11 VDD Nominal 3.3V supply connection
12 CTRL CMOS logic level
Table 5. Control Logic Truth Table
Exceeding absolute maximum ratings may cause
permanent damage. Operation should be restricted to
the limits in the Operating Ranges table. Operation
between operating range maximum and absolute
maximum for extended periods may reduce reliability.
Table 3. Operating Ranges
Notes: 5. Please consult Figures 4 and 5 (low-frequency graphs) for
recommended low-frequency operating power level.
6. Human Body Model (HBM, MIL_STD 883 Method 3015.7)
Logic Select (LS)
The Logic Select feature is used to determine the
definition for the CTRL pin.
Note: 3. Use VSS (bump 1, VSS = -VDD) to bypass and disable internal
negative voltage generator. Connect VSS (bump 1) to GND (VSS = 0V) to
enable internal negative voltage generator.
LS CTRL RFC-RF1 RFC-RF2
0 0 off on
0 1 on off
1 0 on off
1 1 off on
Symbol Parameter/Conditions Min Max Units
VDD Power supply voltage -0.3 4.0 V
VI Voltage on any input except
for CTRL and LS inputs -0.3 VDD+
0.3 V
VCTRL Voltage on CTRL input 4.0 V
VLS Voltage on LS input 4.0 V
TST Storage temperature range -65 150 °C
TOP Operating temperature range -40 85 °C
PIN5 (50Ω) 9 kHz ≤ 1 MHz
1 MHz ≤ 13.5 GHz Fig. 4,5
30
dBm
dBm
VESD ESD voltage (HBM)6
ESD voltage (Machine Model) 4000
300
V
V
Parameter Min Typ Max Units
VDD Positive Power Supply
Voltage 3.0 3.3 3.6 V
VDD Negative Power Supply
Voltage -3.6 -3.3 -3.0 V
IDD Power Supply Current
(Vss = -3.3V, VDD = 3.0 to
3.6V, -40 to +85 °C)
8.0 12.5 μA
Control Voltage High 0.7xVDD V
Control Voltage Low 0.3xVDD V
PIN RF Power In4 (50Ω):
9 kHz ≤ 1 MHz
1 MHz ≤ 13.5 GHz
Fig. 4,5
30
dBm
dBm
IDD Power Supply Current
(Vss = 0V, VDD = 3.0 to 3.6V,
-40 to +85 °C)
21.5 29.0 μA
ISS Negative Power Supply
Current
(Vss = -3.3V, VDD = 3.0 to
3.6V, -40 to +85 °C)
-18.0 -24.0 μA
Vdd Vss
GND
CT RL
LS
RF1 RF2
RF C
D- GND D- GND
DGND GND
GND GND
1
2
3
4
5
11
10
9
8
7
12
13
14
6
Flip Chip Packaging
Switching Frequency
The PE42556 has a maximum 25 kHz switching rate
when the internal negative voltage generator is used
(bump1 = GND). The rate at which the PE42556 can
be switched is only limited to the switching time
(Table 1) if an external negative supply is provided
(bump1 = VSS).
Spurious Performance
The typical spurious performance of the PE42556 is
-116 dBm when VSS = 0V (bump 1 = GND). If further
improvement is desired, the internal negative voltage
generator can be disabled by setting VSS = -VDD.
Note: 4. Please consult Figures 4 and 5 (low-frequency graphs) for recommended
low-frequency operating power level.