85
CAPACITORS
4
RELIABILITY DATA 3/3
According to JIS C 5102 Clause 9. 9.
Multilayer:
Preconditioning: Voltage treatment (Class 2)
Temperature: 40M2C
Humidity: 90 to 95% RH
Duration: 500 hrs
Applied voltage: Rated voltage
Charge and discharge current: 50mA max. (Class 1,2)
Recovery: Recovery for the following period under the standard
condition after the removal from test chamber.
24M2 hrs (Class 1)
48M4 hrs (Class 2)
High-Frequency Multilayer:
Temperature: 60M2C
Humidity: 90 to 95% RH
Duration: 500 hrs
Applied voltage: Rated voltage
Charge and discharge current: 50mA max.
Recovery: 24M2 hrs of recovery under the standard condi-
tion after the removal from test chamber.
According to JIS C 5102 clause 9.10.
Multilayer:
Preconditioning: Voltage treatment (Class 2)
Temperature:125M3CfClass 1, Class 2: B, BJfX7Rgg
85M2C (Class 2: BJ,F)
Duration: 1000 hrs
Applied voltage: Rated voltageP2, , P1.5(Table.4)
Recovery: Recovery for the following period under the stan-
dard condition after the removal from test chamber.
As for Ni product, thermal treatment shall be performed
prior to the recovery.
24M2 hrs (Class 1)
48M4 hrs (Class 2)
High-Frequency Multilayer:
Temperature: 125M3C (Class 1)
Duration: 1000 hrs
Applied voltage: Rated voltageP2
Recovery: 24M2 hrs of recovery under the standard condi-
tion after the removal from test chamber.
16.Loading under Damp Heat
17.Loading at High Tempera-
ture
Appearance: No abnor-
mality
Capacitance change:
CT2 pF: Within M0.4 pF
CX2 pF: Within M0.75
pF
CD Nominal capaci-
tance
Insulation resistance:
500 ME min.
Appearance: No abnor-
mality
Capacitance change:
Within M3% or
M0.3pF, whichever is
larger.
Insulation resistance:
1000 ME min.
Appearance: No abnor-
mality
Capacitance change:
Within M7.5% or
M0.75pF, whichever is
larger.
Q: CU30 pF: QU200
C<30 pF: QU100 +
10C/3
CD Nominal capaci-
tance
Insulation resistance:
500 ME min.
Appearance: No abnor-
mality
Capacitance change:
Within M3% or
M0.3pF, whichever is
larger.
Q: CU30 pF : QU350
10TC<30 pF: QU275
+ 2.5C
C<10 pF: QU200 +
10C
CD Nominal
capacitance
Insulation resistance:
1000 ME min.
Appearance: No abnor-
mality
Capacitance change:
BJ: Within M12.5%
(50V, 35V, 25V)
Within M15.0% (16V
and under)
F: Within M30%
tan d: BJ:
5.0% max.
7.5% max.F
20.0% max.F
F:
11.0% max.
7.5% max.F
16.0% max.F
19.5% max.F
25.0% max.F
FSee Table.2
Insulation resistance:
25 MEAF or 500 ME,
whichever is the smaller.
Appearance: No abnormality
Capacitance change:
BJ: Within M12.5%
F: Within M30%
tan d: 5.0% max.
7.5% max.F
20.0% max.F
F: 11.0% max.
7.5% max.F
16.0% max.F
19.5% max.F
25.0% max.F
FSee Table.2
Insulation resistance: 50
MEAF or 1000 ME, which-
ever is smaller.
Appearance: No abnor-
mality
Capacitance change:
B: Within M12.5%
F: Within M30%
tan d: B: 5.0% max.
F: 7.5% max.
Insulation resistance:
25 MEAF or 500 ME,
whichever is the smaller.
Appearance: No abnor-
mality
Capacitance change:
B: Within M12.5%
F: Within M30%
tan d:
B: 4.0% max.
F: 7.5% max.
Insulation resistance:
50 MEAF or 1000 ME,
whichever is smaller.
Item Temperature Compensating (Class 1)
Standard
Specified Value
Test Methods and RemarksHigh Permittivity (Class 2)
High ValueStandard Note1High Frequency Type
+24
K
0
+24
K
0
+48
K
0
Note 1: For 105 type, specified in "High value".
Note 2: Thermal treatment (Multilayer): 1 hr of thermal treatment at 150 J0 /K10 C followed by 48M4 hrs of recovery under the standard condition shall be performed before the measurement.
Note 3:
Voltage treatment (Multilayer): 1 hr of voltage treatment under the specified temperature and voltage for testing followed by 48M4 hrs of recovery under the standard condition shall be performed before the measurement.
+48
K
0
Note on standard condition: "standard condition" referred to herein is defined as follows: 5 to 35C of temperature, 45 to 85% relative humidity, and 86 to 106kPa of air pressure.
When there are questions concerning measurement results: In order to provide correlation data, the test shall be conducted under condition of 20M2C of temperature, 65 to 70% relative humidity,
and 86 to 106kPa of air pressure. Unless otherwise specified, all the tests are conducted under the "standard condition."
Multilayer Ceramic Capacitor Chips
Table. 1 tand(D. F.) Table. 2 tand(D. F.)
Note 4: Specified value for Instration Resistance of Table.3 only: 100MEAF or more.
Item
BJ: LMK type; 063 type
105 type (CT0.047AF)
107 type (CT0.47AF)
212 type (CT1AF)
316 / 325 / 432 type
EMK type;
105 / 107/ 212 / 316 / 325 type
TMK type; 316 type(C > 0.47AF)
325 / 432 type
GMK type;212 type (CU0.22AF)
316 type (CU0.68AF)
325 type
UMK type;212 type (C > 0.1AF)
316 type (CU0.47AF)
325 type (C T1AF)
BJ: JMK type; 063 type
107 type (C > 2.2AF)
212type (C > 10AF)
316type (C > 22AF)
325type (C > 47AF)
432type (C > 100AF)
LMK type; 105 type (CU0.056AF)
107 type (C > 0.47AF)
212 type (C > 1AF)
J4K, E4K, L4K, J2K, L2K type
F: 105 type (50V, 25V)
F: LMK type; 212 type
316 type
(
CW10AF
)
D汎用
(
CW4.7AF
)D低背
325 type
(C > 10AF)
EMK type;105 type (C U0.068AF)
UMK type; 325 type (C U4.7AF)
BJ: Table. 3
F: LMK type; 105 type (C W0.22AF)
F:
JMK type; 105 / 107 / 212 / 316 / 325 / 432 type
LMK type;
107 type,
325 type
432 type,316 type (C > 10AF)
F: JMK type; 105 type (C W1AF)
AMK type; 063 type
tand
3.5%max.
5.0% max.
9.0% max.
10.0% max.
11.0% max.
16.0% max.
20.0% max.
Item
BJ: JMK type; 107 type (C > 2.2AF)
212type (C > 10AF)
316type (C > 22AF)
325type (C > 47AF)
432type (C > 100AF)
LMK type; 063 type
105 type (CU0.056AF)
107 type (CU0.47AF)
212 type (C > 1AF)
J4K, E4K, L4K, J2K, L2K type
F: 105 type(50V, 25V)
F: LMK type; 105 type (CW0.22AF)
F:
JMK type; 105 / 107 / 212 / 316 / 325 / 432 type
LMK type; 107 type
432 type
BJ: Tabie.3
F: JMK type; 105 type (C W1AF)
AMK type; 063 type
tand
7.5% max.
16.0% max.
19.5% max.
20.0% max.
25.0% max.
Table. 3
Item
BJ: JMK type; 105 type (C W1AF)
107(C>1.0μF)
212(C>4.7μF)
316(C>10μF)
325(C>22μF)
432(C>4.7μF)
Table. 4
Item
BJ: 105(C>0.1μF)
107(C>1.0μF)
212(C>4.7μF)
316(C>10μF)
325(C>22μF)
432(C>47μF)
F: 105(C>0.47μF)
212(C>4.7μF)
325(C>22μF)
432(C>47μF)