IRF7484Q
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Parameter Min. Typ. Max. Units Conditions
ISContinuous Source Current MOSFET symbol
(Body Diode) showing the
ISM Pulsed Source Current integral reverse
(Body Diode) p-n junction diode.
VSD Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 2.3A, VGS = 0V
trr Reverse Recovery Time ––– 59 89 ns TJ = 25°C, IF = 2.3A
Qrr Reverse Recovery Charge ––– 110 170 nC di/dt = 100A/µs
Source-Drain Ratings and Characteristics
A
110
Repetitive rating; pulse width limited by
max. junction temperature.
Pulse width ≤ 400µs; duty cycle ≤ 2%.
Surface mounted on 1 in square Cu board.
Starting TJ = 25°C, L = 2.3mH, RG = 25Ω,
IAS = 14A. (See Figure 12).
Notes:
ISD ≤ 14A, di/dt ≤ 140A/µs, VDD ≤ V(BR)DSS,
TJ ≤ 150°C.
Limited by TJmax , see Fig.16c, 16d, 19, 20 for typical repetitive
avalanche performance.
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 40 ––– ––– V VGS = 0V, ID = 250µA
∆V(BR)DSS/∆TJBreakdown Voltage Temp. Coefficient ––– 0.040 ––– V/°C Reference to 25°C, ID = 1mA
RDS(on) Static Drain-to-Source On-Resistance ––– ––– 10 mΩVGS = 7.0V, ID = 14A
VGS(th) Gate Threshold Voltage 1.0 ––– 2.0 V VDS = VGS, ID = 250µA
gfs Forward Transconductance 40 ––– ––– S VDS = 10V, ID = 14A
––– ––– 20 VDS = 40V, VGS = 0V
––– ––– 250 VDS = 32V, VGS = 0V, TJ = 125°C
Gate-to-Source Forward Leakage ––– ––– 200 VGS = 8.0V
Gate-to-Source Reverse Leakage ––– ––– -200 VGS = -8.0V
QgTotal Gate Charge ––– 69 100 ID = 14A
Qgs Gate-to-Source Charge ––– 9.0 ––– nC VDS = 32V
Qgd Gate-to-Drain ("Miller") Charge ––– 16 ––– VGS = 7.0V
td(on) Turn-On Delay Time ––– 9.3 ––– VDD = 20V
trRise Time ––– 5.0 ––– ID = 1.0A
td(off) Turn-Off Delay Time ––– 180 ––– RG = 6.2Ω
tfFall Time ––– 58 ––– VGS = 7.0V
Ciss Input Capacitance ––– 3520 ––– VGS = 0V
Coss Output Capacitance ––– 660 ––– pF VDS = 25V
Crss Reverse Transfer Capacitance ––– 76 ––– ƒ = 1.0MHz
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
IGSS
µA
IDSS Drain-to-Source Leakage Current
nA
ns
S
D
G
2.3