2SK2796(L), 2SK2796(S)
Silicon N Channel MOS FET
High Speed Power Switching
ADE-208-534C (Z)
4th. Edition
Jul. 1998
Features
Low on-resistance
RDS(on) = 0.12typ.
4V gate drive devices.
High speed switching
Outline
123
44
123
1. Gate
2. Drain
3. Source
4. Drain
DPAK |1
D
G
S
2SK2796(L), 2SK2796(S)
2
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage VDSS 60 V
Gate to source voltage VGSS ±20 V
Drain current ID5A
Drain peak current ID(pulse)Note1 20 A
Body-drain diode reverse drain current IDR 5A
Avalanche current IAP Note3 5A
Avalanche energy EAR Note3 2.14 mJ
Channel dissipation Pch Note2 20 W
Channel temperature Tch 150 °C
Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10µs, duty cycle 1 %
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg 50
2SK2796(L), 2SK2796(S)
3
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage V(BR)DSS 60——V I
D
= 10mA, VGS = 0
Gate to source breakdown voltage V(BR)GSS ±20——V I
G
= ±100µA, VDS = 0
Zero gate voltege drain current IDSS ——10µAV
DS = 60 V, VGS = 0
Gate to source leak current IGSS ——±10 µAV
GS = ±16V, VDS = 0
Gate to source cutoff voltage VGS(off) 1.0 2.0 V ID = 1mA, VDS = 10V
Static drain to source on state
resistance RDS(on) 0.12 0.16 ID = 3 A, VGS = 10V Note4
Static drain to source on state
resistance RDS(on) 0.16 0.25 ID = 3A, VGS = 4V Note4
Forward transfer admittance |yfs| 2.5 4.0 S ID = 3A, VDS = 10V Note4
Input capacitance Ciss 180 pF VDS = 10V
Output capacitance Coss 90 pF VGS = 0
Reverse transfer capacitance Crss 30 pF f = 1MHz
Turn-on delay time td(on) —9 —nsV
GS = 10V, ID = 3A
Rise time tr 25 ns RL = 10
Turn-off delay time td(off) —35—ns
Fall time tf—55—ns
Body–drain diode forward voltage VDF 1.0 V IF = 5A, VGS = 0
Body–drain diode reverse
recovery time trr 40 ns IF = 5A, VGS = 0
diF/ dt =50A/µs
Note: 4. Pulse test
2SK2796(L), 2SK2796(S)
4
Main Characteristics
0.2 0.5 1 2 10 20 100
5
4
3
2
1
0246810
5
4
3
2
1
0246810
D
10 V 6 V
40
30
20
10
050 100 150 200
100
30
10
3
1
0.3
0.1
3.5 V
4 V
5 V
V = 2 V
GS
2.5 V
3 V Tc = 75°C
25°C
–25°C
Channel Dissipation Pch (W)
Ambient Temperature Ta (°C)
Power vs. Temperature Derating
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Maximum Safe Operation Area
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Typical Output Characteristics
Gate to Source Voltage V (V)
GS
Drain Current I (A)
Typical Transfer Characteristics
V = 10 V
Pulse Test
DS
550
Ta = 25°C
1 ms
PW = 10 ms (1shot)
DC Operation (Tc = 25°C)
Operation in
this area is
limited by R
DS(on)
100 µs
10 µs
Pulse Test
2SK2796(L), 2SK2796(S)
5
2.0
1.6
1.2
0.8
0.4
02468 10 0.1 3 1000.3 30
5
2
1
0.2
0.5
0.1
0.05
0.5
0.4
0.3
0.2
0.1
–40 0 40 80 120 160
00.1 0.2 0.5 1 2 5 10
10
5
1
2
0.2
0.5
0.1
101
I = 5 A
D
V = 4 V
GS
10 V
1, 2 A
I = 5 A
D
2 A
1 A
V = 4 V
GS
10 V
1 A
2 A
5 A
25 °C
Tc = –25 °C
75 °C
Gate to Source Voltage V (V)
GS
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
V (V)
DS(on)
Drain to Source Saturation Voltage
Drain Current I (A)
D
Drain to Source On State Resistance
R ( )W
DS(on)
Static Drain to Source on State Resistance
vs. Drain Current
Case Temperature Tc (°C)
R ( )
DS(on)
Static Drain to Source on State Resistance
W
Static Drain to Source on State Resistance
vs. Temperature
Drain Current I (A)
D
Forward Transfer Admittance |y | (S)
fs
Forward Transfer Admittance vs.
Drain Current
Pulse Test
Pulse Test Pulse Test
V = 10 V
Pulse Test
DS
2SK2796(L), 2SK2796(S)
6
0.1 0.2 0.5 1 2 5 10 01020304050
1000
200
500
100
10
20
50
100
80
60
40
20
0
20
16
12
8
4
246810
0
100
50
10
20
2
5
1
500
200
50
100
10
20
5
di / dt = 50 A / µs
V = 0, Ta = 25 °C
GS
V = 0
f = 1 MHz
GS
Ciss
Coss
Crss
I = 5 A
D
V
GS
V
DS
V = 50 V
25 V
10 V
DD
V = 10 V
25 V
50 V
DD
0.1 0.2 0.5 1 2 5 10
V = 10 V, V = 30 V
PW = 5 µs, duty < 1 %
GS DD
tfr
t
d(on)
t
d(off)
t
Reverse Drain Current I (A)
DR
Reverse Recovery Time trr (ns)
Body–Drain Diode Reverse
Recovery Time
Capacitance C (pF)
Drain to Source Voltage V (V)
DS
Typical Capacitance vs.
Drain to Source Voltage
Gate Charge Qg (nc)
Drain to Source Voltage V (V)
DS
Gate to Source Voltage V (V)
GS
Dynamic Input Characteristics
Drain Current I (A)
D
Switching Time t (ns)
Switching Characteristics
2SK2796(L), 2SK2796(S)
7
10
8
6
4
2
00.4 0.8 1.2 1.6 2.0
V = 0, –5 V
GS
10 V
5 V
Source to Drain Voltage V (V)
SD
Reverse Drain Current I (A)
DR
Reverse Drain Current vs.
Source to Drain Voltage
Pulse Test
2.5
2.0
1.5
1.0
0.5
25 50 75 100 125 150
0
Channel Temperature Tch (°C)
Repetitive Avalanche Energy E (mJ)
AR
Maximun Avalanche Energy vs.
Channel Temperature Derating
D. U. T
Rg
I
Monitor
AP
V
Monitor
DS
V
DD
50W
Vin
15 V
0
I
D
V
DS
I
AP
V
(BR)DSS
L
V
DD
E = • L • I •
2
1V
V – V
AR AP DSS
DSS DD
2
Avalanche Test Circuit Avalanche Waveform
I = 5 A
V = 25 V
duty < 0.1 %
Rg > 50
AP
DD
W
2SK2796(L), 2SK2796(S)
8
Vin Monitor
D.U.T.
Vin
10 V
RL
V
= 30 V
DD
tr
td(on)
Vin
90% 90%
10%
10%
Vout
td(off)
Vout
Monitor
50W
90%
10%
tf
Switching Time Test Circuit Waveform
3
1
0.3
0.1
0.03
0.01
10 µ 100 µ 1 m 10 m 100 m 1 10
DM
P
PW
T
D = PW
T
ch – c(t) = s (t) • ch – c
ch – c = 6.25 °C/W, Tc = 25 °C
q g q
q
D = 1
0.5
0.2
0.01
0.02
0.1
0.05
1 shot Pulse
Tc = 25°C
Pulse Width PW (S)
Normalized Transient Thermal Impedance
s (t)
g
Normalized Transient Thermal Impedance vs. Pulse Width
2SK2796(L), 2SK2796(S)
9
Package Dimensions
Hitachi Code
JEDEC
EIAJ
Mass
(reference value)
DPAK (L)-(1)
Conforms
0.42 g
6.5 ± 0.5 2.3 ± 0.2
0.55 ± 0.1
1.2 ± 0.3
0.55 ± 0.1
5.5 ± 0.5 1.7 ± 0.5
16.2 ± 0.5
3.1 ± 0.5
5.4 ± 0.5
1.15 ± 0.1
2.29 ± 0.5 2.29 ± 0.5
0.8 ± 0.1
As of January, 2001
Unit: mm
2SK2796(L), 2SK2796(S)
10
Hitachi Code
JEDEC
EIAJ
Mass
(reference value)
DPAK (S)-(1),(2)
Conforms
0.28 g
As of January, 2001
Unit: mm
6.5 ± 0.5
5.4 ± 0.5 2.3 ± 0.2
0.55 ± 0.1
0 – 0.25
0.55 ± 0.1
1.7 ± 0.5
5.5 ± 0.5
2.5 ± 0.5
1.15 ± 0.1
0.8 ± 0.1
2.29 ± 0.5
2.29 ± 0.5
1.2 Max
(4.9)
(5.3)
2SK2796(L), 2SK2796(S)
11
Hitachi Code
JEDEC
EIAJ
Mass
(reference value)
DPAK (S)-(3)
Conforms
0.28 g
As of January, 2001
Unit: mm
6.5 ± 0.5
5.4 ± 0.5 2.3 ± 0.2
0.55 ± 0.1
0 – 0.25
0.55 ± 0.1
1.5 ± 0.5
5.5 ± 0.5
2.5 ± 0.5
1.15 ± 0.1
0.8 ± 0.1
2.29 ± 0.5
2.29 ± 0.5
1.2 Max
(5.1)
(5.1)
(0.1)(0.1)
2SK2796(L), 2SK2796(S)
12
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4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
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failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-
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