IRF7306QPbF
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Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage -30 V VGS = 0V, ID = -250µA
∆V(BR)DSS/∆TJBreakdown Voltage Temp. Coefficient -0.037 V/°C Reference to 25°C, ID = -1mA
0.10 VGS = -10V, ID = -1.8A
0.16 VGS = -4.5V, ID = -1.5A
VGS(th) Gate Threshold Voltage -1.0 V VDS = VGS, ID = -250µA
gfs Forward Transconductance 2.5 S VDS = -24V, ID = -1.8A
-1.0 VDS = -24V, VGS = 0V
-25 VDS = -24V, VGS = 0V, TJ = 125°C
Gate-to-Source Forward Leakage -100 VGS = -20V
Gate-to-Source Reverse Leakage 100 VGS = 20V
QgTotal Gate Charge 25 ID = -1.8A
Qgs Gate-to-Source Charge 2.9 nC VDS = -24V
Qgd Gate-to-Drain ("Miller") Charge 9.0 VGS = -10V, See Fig. 6 and 12
td(on) Turn-On Delay Time 11 VDD = -15V
trRise Time 17 ID = -1.8A
td(off) Turn-Off Delay Time 25 RG = 6.0Ω
tfFall Time 18 RD = 8.2Ω, See Fig. 10
Between lead tip
and center of die contact
Ciss Input Capacitance 440 VGS = 0V
Coss Output Capacitance 200 pF VDS = -25V
Crss Reverse Transfer Capacitance 93 = 1.0MHz, See Fig. 5
Notes:
Parameter Min. Typ. Max. Units Conditions
ISContinuous Source Current MOSFET symbol
(Body Diode) showing the
ISM Pulsed Source Current integral reverse
(Body Diode) p-n junction diode.
VSD Diode Forward Voltage -1.0 V TJ = 25°C, IS = -1.8A, VGS = 0V
trr Reverse Recovery Time 53 80 ns TJ = 25°C, IF = -1.8A
Qrr Reverse RecoveryCharge 66 99 nC di/dt = 100A/µs
ton Forward Turn-On Time
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
ISD ≤ -1.8A, di/dt ≤ 90A/µs, VDD ≤ V(BR)DSS,
TJ ≤150°C
Pulse width ≤ 300µs; duty cycle ≤ 2%.
Source-Drain Ratings and Characteristics
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
-14
-2.5
A
IGSS
IDSS Drain-to-Source Leakage Current
LSInternal Source Inductance 6.0
LDInternal Drain Inductance 4.0
nH
ns
nA
µA
Ω
RDS(ON) Static Drain-to-Source On-Resistance
S
D
G
S
D
G
Surface mounted on FR-4 board, t ≤ 10sec.