KMA200 - NXP Semiconductors

1. Product profile

1.1 General description

The KMA200 is an angle sensor system. The MagnetoResistive (MR) element and the

mixed signal Integrated Circuit (IC) are integrated in one package. This angle system is

already pre-programmed, offsets are compensated and therefore, ready to use.

Via the Serial Peripheral Interface (SPI) the KMA200 is user programmable. This allows

user specific adjustments of the maximum angle, zero point, clamping level and a 32-bit

identifier. The data is stored permanently in an Electrically Erasable Programmable

Read-Only Memory (EEPROM).

The device can be programmed to work either in analog or digital (SPI) output mode.

Furthermore, different analog output characteristics are possible. The resolution is better

than 0.05.

The implemented online diagnosis supervises the input and output signals as well as the

data processing. Deviations and failures of the angle value are indicated in the output

signal. Overall temperature supervision is implemented.

1.2 Features and benefits

KMA200

Programmable angle sensor

Rev. 8 — 7 December 2011 Product data sheet

Magnetic field angular sensing One package angle sensor system

High accuracy Resolution better than 0.05

Operating temperature range from

40 C to +160 C

Digital or analog output signals (user

programmable)

Online diagnosis Overvoltage protec tio n at all ext ern al

pins

Bidirectional digital interface (SPI) EEPROM (user programmable)

Programmable maximum angle up

to 180

Programmable zero point

Pre-calibrated, ready to use device

Product data sheet Rev. 8 — 7 December 2011 2 of 33

NXP Semiconductors KMA200

Programmable angle sensor

1.3 Quick reference data

[1] Diagnosis GND and VDD lost only possible with a pull-up resistor of 5 k to 6 k.

[2] Diagnosis VDD lost only possible with a pull-down resistor of 5 k to 6 k.

[3] Load resistor required to enable the diagnosis features. Infinite resistor load permitted for normal operation without the diagnosis

features.

2. Pinning information

[1] The other pins and lead frame parts must not be electrical connected. For operation of the device the

external pins must/have to be used.

3. Ordering information

Table 1. Quick reference data

Symbol Parameter Conditions Min Typ Max Unit

VDD supply voltage normal operation 4.5 5.0 5.5 V

VDD(pr) programming supply voltage EEPROM 12 12.5 13 V

Tamb ambient temperature < 1000 hours in life time

at 160 C40 - +160 C

Tamb(pr) programming ambient temperature EEPROM 10 - 70 C

CLload capacitance at pin 2 and pin 3 0.1 - 27 nF

RL(pu) pull-up load resistance [1] 5- k

RL(pd) pull-down load resistance [2][3] 5- 10k

Cext external capacit a nce between VDD and GND conducted closely to

supply pins of KMA200 82 - 120 nF

Table 2. Pinning

Pin Symbol Description Simplified outline[1]

DD supply voltage

2 DATA/OUT1 data Input/Output (I/O)

analog output 1

3 CLK/OUT2 data clock

analog output 2

4 GND ground

5CS chip select

(used for data transfer I/O)

12345

Table 3. Ordering information

Type number Package

Name Description Version

KMA200 - plastic single-ended multi-chip package;

6 interconnections; 5 in-line leads SOT637

xxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx x xxxxxxxxxxxxxx xxxxxxxxxx xxx xxxxxx xxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxx

xxxxx xxxxxx xx xxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxx xxxxxxx xxxxxxxxxxxxxxxxxxx

xxxxxxxxxxxxxxxx xxxxxxxxxxxxxx xxxxxx xx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxx xxxxxxx

xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxx xxxxx x x

Product data sheet Rev. 8 — 7 December 2011 3 of 33

NXP Semiconductors KMA200

Programmable angle sensor

4. Functional diagram

Fig 1. Functio nal diagram

cosine

bridge

MR-SENSOR

ELEMENT

sine

bridge

INSTR.- AMP. BUFFER 1

MISC DIAGNOSTICS

DIGITAL PART

ΣΔ-MODULATOR

−

006aaa296

BIAS

COUNTER

DEC.-FIL.

CALIBRATION

MICROCONTROLLER

+/−/AND/OR

OSC, OSCFS TEMP.

SENSOR

Vref AUX. ADC

REVERSE

POLARITY

PROTECTION

OVER-VOLTAGE

AND

REVERSE POLARITY

PROTECTION

VOLTAGE

LIMITER

SERIAL

INTERFACE

WATCHDOG-

TIMER

EEPROM

ROM

HV-

PROTECTION

BUFFER 2

H(z)

INSTR.- AMP. ΣΔ-MODULATOR RESISTOR-

STRING D/A

−

ANALOG OUTPUT STAGEANALOG INPUT STAGE

H(z)

DEC.-FIL.

GND

DATA/OUT1

CLK/OUT2

VDD

Product data sheet Rev. 8 — 7 December 2011 4 of 33

NXP Semiconductors KMA200

Programmable angle sensor

5. Functional description

The KMA200 amplifies two orthogonal sinusoidal signals delivered by the MR-sensor

element and converts them into the digital domain. Using the COordinate Rotation DIgital

Computer (CORDIC) algorithm, the angle is calculated. Angle output is either analog or

digital. The KMA200 compris es diagnostic features that ensure a complete online

supervision of all es se ntia l functional blocks including verification of input and output

signals and temperature supervision. In addition, the circuit is protected against reverse

polarity, overvoltage and short circuit at all external pins.

Two instrumentation amplifiers and -modulators convert the amplified signals into two

high-speed digital bit streams. The bit streams are filtered and decimated by two digital

decimation filters to obtain digital signals with higher resolution at a lower speed.

Further processing is done within an on-chip calibration microcontroller. This includes

offset cancellation, calculation of the mechanical angle using the CORDIC algorithm,

zero-angle and angular-range adjustment.

In addition, the calibration microcontroller perfor ms diagnostic tasks to ensure the validity

of its results. The calibration microcontroller takes calibration constants from an on-chip

EEPROM and stores intermediate results in a Random Access Memory (RAM). The

calculated angle is given out either digitally with an SPI-compatible serial inte rface or

analog via the analog output stage. Several output characteristics can be selected.

In case of analog output the analog output stage is used for conversion of the angle

information into two analog output voltages ratiometric to the supply voltages. For this

purpose, the analog outpu t stage cont ains two resistor-string Digital-to-Analog Co nverters

(DACs) which share the same resistor string. The two analog output voltages are buffered

by two offset-compensated amplifiers.

The internal circuitry is protected against overvoltage with special protection circuits.

Protection against reverse polarity is realized with the help of a current limiting circuit.

In addition, there are vari ous support circuits like bias generators, a free-running oscillator

including an oscillator fail-safe circuit and a power-on reset circuit which generates a reset

in dependence of the supply voltage.

Product data sheet Rev. 8 — 7 December 2011 5 of 33

NXP Semiconductors KMA200

Programmable angle sensor

6. Diagnostic features

The KMA200 includes diagnostic features to ensure the validity of its output signals. The

diagnostic features can be configured with the control information words (ctrl) written to

the user-pro g ra mma ble EE PROM .

In the analog output modes a diagnostic error condition is signaled to the user by setting

the outputs into the high-impedance state. The outputs are forced to lie in the upper or

lower diagnostic range by external pull-up or pull-down resistors.

With no external pull-up/pull-down resistors the output signal will be internally pulled up to

upper diagnosis range.

If digital outpu t is selected, an er ror condition can also be signaled by setting the error flag

in the digital output word. The least significant bits show the error code. The Table 4

shows the behavior in detail:

Once a diagnostic error condition is reached, the KMA200 continues to work normally

after a new external power-on reset or by itself, as described in the table below. It is

possible to configure the KMA200 the way that the error condition has to be fulfilled more

than once. The numbe r of error conditions that is necessary can also be programmed with

bits in the control information words.

[1] Reactivation for angular measurement with valid angle information (normal operation mode) only by new

external power-on reset

Temperature supervision

The chip temperature measured within the KMA200 can be used to detect

over-temp er at ure co nd itio ns . Two temperature levels ar e de fin ed : the tem p er at ur e

warning level and the temperature shutdown level.

The user can evaluate the temperature warning if digital output mode is selected. When

the device temperature exceeds the warning level, the error flag in the digital output word

is set. The other data bits st ill show the angle information. In the analog output modes, the

device temperature warning is not available. If the temperature exceeds the

over-temp er at ure sh utdown lev el, th e KMA200 switches off.

Table 4. Summary KMA200 behavior at diagnosis conditi ons in normal operation mode

Error appearance Analog output Digital output

Oscillator fail detection [1] high-impedance state [1] high-impedance state

Cyclic Redundancy Check (CRC) [1] high-impedance state [1] diagnosis bit set

Watchdog [1] high-impedance state [1] high-impedance state

Input stage (including magnet lost) high-impedance state diagnosis bit set

Output stage [1] high-impedance state -

Over-temperature warning - diagnosis bit set

Over-temperature shutdown [1] high-impedance state [1] high-impedance state

Overvoltage high-impedance state high-impedance state

Reverse polarity high-impedance state high-impeda nce state

Product data sheet Rev. 8 — 7 December 2011 6 of 33

NXP Semiconductors KMA200

Programmable angle sensor

Diagnosis of input stage

For diagnosis of the input stage, the calibration microcontroller calculates the expected

signal magnitude using the temperature information and the EEPROM constants and

compares it to the signal magnitude based on the current measurement.

If the difference of the two magnitudes is greater than an allowed deviation, an error

condition is signaled to the user.

The allowed difference depends on the bits DI1 and DI0 in the EEPROM control

information word.

Diagnosis of output stage

Both analog outputs are supervised by the auxiliary ADC which reads the present analog

signal and converts it back to the digital domain with a resolution of 8 bits. The digitized

value is compared to the digital angle value originally sent.

If the difference of these two values is greater than an error bound, an error condition is

signaled by switching off the analog outputs.

The allowed difference depends on the bits DO1 and DO0 in the EEPROM control

information word.

CRC check of EEPROM constants

During normal operation mode a CRC code of the configuration constants taken from the

EEPROM is calculated on a regular basis. This code is compared to a pre-calculated CRC

code from the EEPROM (CRC). If there is a mismatch, an error condition is signaled to

the user by setting the error flag in the digital output word or by switching off the analog

outputs.

The CRC code used is the CRC-16 code (ISO/IEC 3309:1993 and ITU-T V.42)

Watchdog timer

The KMA200 comprises a watchdog timer to supervise the flow of the program. After

reset, the watchdog is automatically activated. During operation the watchdog timer must

be toggled on a regular basis, as otherwise the error condition is signaled. The access to

the watchdog timer is protected against unwanted operations using a fail-safe watchdog

feed sequence.

Product data sheet Rev. 8 — 7 December 2011 7 of 33

NXP Semiconductors KMA200

Programmable angle sensor

Oscillator fail-safe circuit

The function of the free-running oscillator is checked with re-triggered mono flop. If the

mono flop is not triggered, the KMA200 signals an error.

Fig 2. Power supply behavior; the de vice operation dependenc ies to its power supply

voltage

006aaa297

high overvoltage

protection

low overvoltage

protection

operation

low voltage

reverse polarity

protection

power on/off

reset

undefined 32 V

26.5 V

13 V

12 V

7 V

5.5 V

4.5 V

3.1 V

4.45 V

2.9 V

4.4 V

6 V

0 V

−16.5 V

device damage

normal operation area

specification parameters are not valid (*)

(diagnosis functions available)

0.05 V < hysteresis< 0.6 V

switch-on switch-off

overvoltage protection for 400 ms

overvoltage protection for infinite duration

overvoltage protection,

normal programming area, temp within 0 °C to 70 °C

overvoltage protection,

programming area - unsufficient voltage

specification parameters are not valid (*)

(diagnosis functions available)

low voltage (device switched-off)

reverse polarity voltage protection

device damage

reset

off

undefined

operating

weak pull-up

operating

device

situation modes VDD

Product data sheet Rev. 8 — 7 December 2011 8 of 33

NXP Semiconductors KMA200

Programmable angle sensor

7. Outputs of KMA200

The output of the KMA200 is either d igital or analog, dep ending on the control word stor ed

in the EEPROM. The analog output consists of a standard and a programmable output

stage. The programmable output stage allows four different characteristics; mode 1,

mode 2, mode 3 or none output. The digital output has two different modes; mode 5 and

mode 6.

Analog out p ut

In the analog output mode the measured angle value is converted linear into a value that

is ratiometric to the supply voltage VDD. This voltage is driven by the standard output

stage to pin DATA/OUT1. The same value is fed to a second output stage that is

connected to pin CLK/OUT2. This second output stage is programmable to one of four

different output characteristics; mode 1, mode 2, mode 3 or high-impedance state output.

A valid angle value is nominally mapped to an output voltage range of V(CL)l

(default = 5 %) to V(CL)u (default = 95 %) of VDD at the standard output VOUT1

(see Figure 3).

For mode 1 the valid output voltage range at pin CLK/OUT2 is identical to the output

voltage range of the standard analog voltage but the output characteristic is inverted

(see Figure 4).

In mode 2 (see Figure 5) the valid output range at pin CLK/OUT2 is nominally V(CL)l/2 to

V(CL)u/2 of VDD.

A further possibility is to program the VOUT2 (mode 3, thresh) as a comparator dep en ding

from the angle value (see Figure 6).

When the KMA200 detects an error condition, it switches the analog outputs into

high-impedance st ate. The ou tput s are forced to lie in the uppe r or lower d iagnostic ran ge

by the external pull-up or pull-down resistors.

Table 5. Setting the KMA200 output characteristics

Output characteristics Pin assignment Mode setting of EEPROM

(ctrl1)

Mode Type DATA/OUT1 CLK/OUT2 OM2 OM1 OM0

Mode 1 analog standard inverted 1 0 0

Mode 2 analog standard hal f ran ge 1 0 1

Mode 3 analog standard comparator 1 1 0

Mode 4 analog standard high-impedance state 1 1 1

Mode 5 digital serial data (SPI) (clock) 0 0 0

Mode 6 digital bit complement

serial data (SPI) (clock) 001

Product data sheet Rev. 8 — 7 December 2011 9 of 33

NXP Semiconductors KMA200

Programmable angle sensor

Fig 3. Standard analog output mode

Fig 4. Inverted analog output (mode 1)

006aaa298

0°180°

αmax

100 %

96 %

V(CL)u

V(CL)l

4 %

VOUT1/VDD

diagnostics area

(180° − αmax)/2

006aaa299

0°180°

max

100 %

96 %

(CL)u

(CL)l

4 %

OUT2

diagnostics area

(180°

−

max

)

Product data sheet Rev. 8 — 7 December 2011 10 of 33

NXP Semiconductors KMA200

Programmable angle sensor

Fig 5. Half range output mode (mode 2)

Fig 6. Comparator analog output (mode 3)

006aaa300

0°180°

αmax

100 %

50 %

V(CL)u/2

V(CL)l/2

2 %

VOUT2/VDD

diagnostics area

(180° − αmax)/2

006aaa301

0°180°

(180° − αmax)/2

αmax

αthresh

100 %

90 %

10 %

VOUT2/VDD

VOUT1

VOUT2

HIGH

LOW

Product data sheet Rev. 8 — 7 December 2011 11 of 33

NXP Semiconductors KMA200

Programmable angle sensor

8. Digital output (SPI)

Standard digital output

If the standard digital output mode is configured, output data can be read with the serial

interface. Figure 7 shows the timing diagram of an interface access. The access is

enclosed by a HIGH-to-LOW and LOW-to-HIGH transition of CS.

DATA are clocked out at the falling edge of CLK and should be evaluated at the rising

edge. The output data consist of 3 bytes (24 bits). The first two dat a bytes cont ain an error

flag and 13 bits of angle information. The last data byte contains the measured

temperature as 7-bit value. Every byte features a parity bit (odd parity).

The data transmission can be interrupted at any time by deactivating CS. If, for instance,

the temperature information is not desired, the data transfer can be finished by

deactivating CS after reading the first two data bytes.

If the error flag is 0, the 13 angle data bits contain the most significant bits of the

calculated angle. If the error flag is 1, an error condition was detected. The two least

significant angle data bits (A[1:0]) are replaced by an error code. All other angle data bits

(A[12:2]) still show the current measurement value. Depending on the special error case,

the measurement values are reliable or not. Error codes are described in Table 8.

The output driver of the DATA pin is slew-rate limited. The rise and fall times of the DATA

output can be programmed with the SL bit (ctrl EEPROM constant); see Table 12.

Complementary digital output

In complementa ry digital output mode the da ta transmitted is identical to the output dat a in

standard digital output mode except that the angle and temperature information data bits

are logically inverted. The error flag and the error code in b it s A[1:0] when the error flag is

set are coded as in case of standard digital output. The parity bits also use odd parity as

standard digital output mode.

Fig 7. Digital output coding

006aaa302

CLK

DATA

angle (MSBs) angle (LSBs) temperature

DATA HIGH-Z (HIGH by internal weak pullup)

Parity bits (odd parity)

Error flag

13-bit angle data

7-bit temperature data

P2, P1, P0

A12 to A0

T6 to T0

P2 A12 A11EF A7 A6 A5P1 A0 T6 T5P0 T0

Product data sheet Rev. 8 — 7 December 2011 12 of 33

NXP Semiconductors KMA200

Programmable angle sensor

9. Limiting values

Table 6. Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).

Symbol Parameter Conditions Min Max Unit

VDD supply voltage pin VDD versus GND 16.5 +26.5 V

at t < 400 ms - 32 V

VXvoltage on pins CS, DATA/OUT1, CLK/OUT2

versus GND 0100%V

Tamb ambient temperature < 1000 hours in life time at 160 C40 +160 C

Tamb(pr) programming ambient temperature EEPROM 10 70 C

Tstg storage temp erature 50 +150 C

EEPROM

tret retention time Tmax(AV) =50C17-year

Nendu(W_ER) write or erase en durance Tmax(AV) =70C for programming - 500 cycle

Product data sheet Rev. 8 — 7 December 2011 13 of 33

NXP Semiconductors KMA200

Programmable angle sensor

10. Characteristics

Table 7. Characteristics

In homogenous magnetic field at saturation field strength of minimum 35 kA/m and external capacitance Cext between VDD

and GND. Tamb =





C to +160



C; VDD = 4.5 V to 5.5 V.

Symbol Parameter Conditions Min Typ Max Unit

Supply voltage and operation currents

VDD supply voltage normal operati on 4.5 5.0 5.5 V

VDD(pr) programming supply voltage EEPROM 12 12.5 13 V

IDD supply current for normal operation mode 5 - 12 mA

CLload capacitance at pin 2 and pin 3 0.1 - 27 nF

RL(pu) pull-up load resistance [1] 5-k

RL(pd) pull-down load resistance [2][3] 5-10k

Cext external capacitance between

VDD and GND conducted closely to supply pins of

KMA200 82 - 120 nF

Power-on reset

VDDon switch-on threshold voltage KMA200 switches on if

VDD >V

DDon

3.1 3.75 4.45 V

VDDoff switch-off threshold voltage KMA200 switches off if

VDD <V

DDoff

2.9 - 4.4 V

Vhys hysteresis voltage Vhys =V

DDon VDDoff 0.05 - 0.6 V

System performance

Analog output VOUT1: standard output

VOUT1(nom) nominal output voltage range on

pin OUT1 5-95%V

VO(ldr) lower diagnostic range output

voltage on OU T1 0 - 4 %VDD

VO(udr) upper diagnostic range output

voltage on OU T1 96 - 100 %VDD

max maximum angle programmable from 0 to angle

range max EEPROM address 3 0.1 - 180 deg

V(CL)u upper clamping voltage level setting by EEPROM address 9 69.5 - 95 %VDD

V(CL)l lower clamping voltage level setting by EEPROM address 9 5 - 30.5 %VDD

res angle resolution 4608 counts in nominal output

voltage range (clamping level

5%V

DD to 95 %VDD)

[4] - 0.04 0.05 deg

Nooutput noise peak to peak, 25 ms measurement

time [4] - - 0.1 deg

V(CL) clamping voltage variation at 5 %VDD and 95 %VDD [4] 0.3 - +0.3 %VDD

lin angle linearity error normal operation mode, deviation

from reference line [4] 1.65 - +1.65 deg

Tangle temperature drift valid for temperature range 25 C

up to +125 C (3 sigma) [4][5] 0.64 - +0.64 deg

lin microlinearity deviation at an angle step of 1[4] 0.1 - +0.1 deg

hys hysteresis absolute value [4] 0 - 0.088 deg

Product data sheet Rev. 8 — 7 December 2011 14 of 33

NXP Semiconductors KMA200

Programmable angle sensor

Analog programmable output VOUT2: mode 1

VOUT2(nom) nominal output voltage range on

pin OUT2 5-95%V

VO(ldr) lower diagnostic range output

voltage on OU T2 0 - 4 %VDD

VO(udr) upper diagnostic range output

voltage on OU T2 96 - 100 %VDD

max maximum angle programmable from 0 to angle

range max EEPROM address 3 0.1 - 180 deg

V(CL)u upper clamping voltage level setting by EEPROM address 9 69.5 - 95 %VDD

V(CL)l lower clamping voltage level setting by EEPROM address 9 5 - 30.5 %VDD

res angle resolution 4608 counts in nominal output

voltage range (clamping level

5%V

DD to 95 %VDD)

[4] - 0.04 0.05 deg

Nooutput noise peak to peak, 25 ms measurement

time [4] - - 0.1 deg

V(CL) clamping voltage variation at 5 %VDD and 95 %VDD [4] 0.3 - +0.3 %VDD

lin angle linearity error normal operation mode, deviation

from reference line [4] 1.65 - +1.65 deg

Tangle temperature drift valid for temperature range 25 C

up to +125 C (3 sigma) [4][5] 0.64 - +0.64 deg

lin microlinearity deviation at an angle step of 1[4] 0.1 - +0.1 deg

hys hysteresis absolute value [4] 0 - 0.088 deg

Vpl(mode1) plausibility VOUT1 to VOUT2

(mode 1) VOUT1 +V

OUT2 VDD Vpl(mode1) [4] 0.5 - +0.5 %VDD

Table 7. Characteristics …continued

In homogenous magnetic field at saturation field strength of minimum 35 kA/m and external capacitance Cext between VDD

and GND. Tamb =





C to +160



C; VDD = 4.5 V to 5.5 V.

Symbol Parameter Conditions Min Typ Max Unit

Product data sheet Rev. 8 — 7 December 2011 15 of 33

NXP Semiconductors KMA200

Programmable angle sensor

Analog programmable output VOUT2: mode 2

VOUT2(nom) nominal output voltage range on

pin OUT2 2.5 - 47.5 %VDD

VO(ldr) lower diagnostic range output

voltage on OU T2 0 - 2 %VDD

VO(udr) upper diagnostic range output

voltage on OU T2 50 - 100 %VDD

res angle resolution 2304 counts in nominal output

voltage range with clamping level

5%V

DD to 95 %VDD

[4] -0.08-deg

max maximum angle programmable from 0 to angle

range max EEPROM address 3 0.1 - 180 deg

Nooutput noise peak to peak, 25 ms measurement

time [4] - - 0.2 deg

V(CL) clamping voltage variation at 2.5 %VDD and 47.5 % VDD [4] 0.3 - +0.3 %VDD

lin angle linearity error normal operation mode, deviation

from reference line [4] 2.0 - +2.0 deg

Tangle temperature drift valid for temperature range 25 C

up to +125 C (3 sigma) [4][5] 0.64 - +0.64 deg

lin microlinearity deviation at an angle step of 1[4] 0.2 - +0.2 deg

hys hysteresis absolute value [4] 0 - 0.088 deg

Vpl(mode2) plausibility VOUT1 to VOUT2

(mode 2) VOUT1 2VOUT2 Vpl(mode2) 0.7 - +0.7 %VDD

Analog programmable output VOUT2: mode 3

VOUT2(L) LOW -level output voltage on pin

OUT2 0-10%V

VOUT2(H) HIGH-level output voltage on pin

OUT2 90 - 100 %VDD

th(res) threshold angle resolution setting by EEPROM address 4 - - 16 bit

Digital output and complement digital output

res(dig) digital angle resolution - 0.022 - deg/LSB

Ndig digital noise level noise: 10 measurements in

sequence --4LSB

lin angle linearity error normal operation mode from

reference line 1.65 - +1.65 deg

Tangle temper at ure drif t 1.3 - +1.3 deg

valid for temperature range 25 C

up to +125 C (3 sigma) 0.5 - +0.5 deg

lin microlinearity 0.088 - +0.088 deg

hys hysteresis absolute value 0 - 0.088 deg

Table 7. Characteristics …continued

In homogenous magnetic field at saturation field strength of minimum 35 kA/m and external capacitance Cext between VDD

and GND. Tamb =





C to +160



C; VDD = 4.5 V to 5.5 V.

Symbol Parameter Conditions Min Typ Max Unit

Product data sheet Rev. 8 — 7 December 2011 16 of 33

NXP Semiconductors KMA200

Programmable angle sensor

[1] Diagnosis GND and VDD lost only possible with a pull-up resistor of 5 k to 6 k.

[2] Diagnosis VDD lost only possible with a pull-down resistor of 5 k to 6 k.

[3] Load resistor required to enable the diagnosis features. Infinite resistor load permitted for normal operation without the diagnosis

features.

[4] Analog outputs need to be low-pass filtered (corner frequency about 1.3 kHz).

[5] See Figure 9.

On-chip temperature sensor characteristics

Tsen sensor temperature chip temperature 50 - +180 C

Tsen(res) sensor temperatu r e resolution chip temperature - 2 - C/LSB

Tsen sensor temperature accuracy chip temperature 5- +5C

Twarn(res) warning temperature resolution setting by EEPROM address 6 - 2 - C

Tshut(res) shut-down temperature

resolution setting by EEPROM address 6 - 2 - C

SPI characteristics

VIL LOW-level input voltage for VX=CLK, CS, DATA 0 - 25 %VDD

VIH HIGH-level input voltage for VX=CLK, CS, DATA 75 - 100 %VDD

VOL LOW-level output voltage Isink <2mA 0 - 15 %V

VOH HIGH-level output voltage Isource <2mA 85 - 100 %V

IOM peak output current current limitation of the device - - 20 mA

tr(o) output rise time norma l operation mode from

10 %VDD to 90 %VDD, CL= 100 pF

(SL bit = 0) 100 - 400 ns

(SL bit = 1) 500 - 1300 ns

tf(o) output fall time

(SL bit = 0) 100 - 400 ns

(SL bit = 1) 500 - 1300 ns

fclk clock frequency for VX= CLK 1 - 1000 kHz

Dynamics

tpu power-up time until first valid result - - 10 ms

fupd(meas) measurement update rate at oscillator frequency 3 4 5 kHz

tssettling time after ideal input angle step until

analog standard output reaches

90 % of final value, at nominal

oscillator frequency, CL=5nF

-11.8ms

Table 7. Characteristics …continued

In homogenous magnetic field at saturation field strength of minimum 35 kA/m and external capacitance Cext between VDD

and GND. Tamb =





C to +160



C; VDD = 4.5 V to 5.5 V.

Symbol Parameter Conditions Min Typ Max Unit

Product data sheet Rev. 8 — 7 December 2011 17 of 33

NXP Semiconductors KMA200

Programmable angle sensor

11. Error codes

Standard digital output:

(1)

Temperature = 50 C + T[6:0] 2C

Complement digital output:

(2)

Temperature = 50 C+T

[6:0] 2C

Table 8. Error codes

A[1:0] Description Angle valid

00 diagnosis error no

01 diagnosis error (input stage) no

10 over-temperature warning yes

11 (not occupied) -

a A[12:0] 180

213

----------- A[12:0] 0.022=

a A[12:0] 180

213

-----------

A[12:0] 0.022=

Product data sheet Rev. 8 — 7 December 2011 18 of 33

NXP Semiconductors KMA200

Programmable angle sensor

12. Definition of errors

12.1 General

For the accuracy is assumed that the sensor operates in a homogen eous magnetic field at

saturation field strength Hsat. Also, the zer o ang le re gis te r of the KMA200 is set at a

mechanical reference point at room temperature (and zero degree).

This reference line is valid for digital and analog outputs. The maximum angle is set to

180 and the cla mp in g levels ar e pr og ra m m ed to V(CL)l = 5 %VDD and V(CL)u =95%V

DD.

12.2 Linearity error

The deviation from the reference line lin is called angle linearity error and defined as

follows:

lin =lin(ref,Tj)

ref

Tj: any ambient temperature in the specific range

Following formula is used to calculate meas in degree from an analog voltage value:

(3)

VOUT: analog output of KMA200 [%VDD]

For sensors the error of the analog output lin is only defined in the rang e from 5.5 %VDD

to 94.5 %VDD.

ref: reference angle in degree

meas: measured angle of the KMA200 in degree

lin: deviation from reference line in degree

Fig 8. Visualization of linearity behavior

006aaa303

180

output

reference line

meas

(°)

ref

(°)

Δϕ

lin

meas

VOUT 5 %VDD

–

95 %VDD 5 %VDD

–

-------------------------------------------------- 180=

Product data sheet Rev. 8 — 7 December 2011 19 of 33

NXP Semiconductors KMA200

Programmable angle sensor

12.3 Temperature drif t

The temperat ur e dr ift is defined as the en velope deviation of the angle value over th e

temperature range. It is considered as the pure thermal effect.

Following mathematical description is given for temperature drift value:

T=meas(ref,Tj)

meas(ref,Tk)

: temperature drift, deviation over temperature in degree

lin: linearity error measured at different temperatures in degree

Tj, Tk and Tm: any ambient temperature in the specified range (Tamb)

Fig 9. Temperature drift behavior

006aaa304

temperature T

ref

(°)

Δϕ

lin

(°)

Product data sheet Rev. 8 — 7 December 2011 20 of 33

NXP Semiconductors KMA200

Programmable angle sensor

12.4 Microlinearity

Microlinearit y is the de via tio n be twe e n the device output and the reference line at any

angle and for an angle step of 1. The microli nearity is determined at a constant

temperature.

The microlinearity is calculated as follows:

lin =V

meas(ref(i+1))Videal(ref(i+1))

Videal(ref(i+1))=V

meas(ref(i))+m

ideal 1=V

meas(ref(i))+0.5%V

lin: microlinearity

Vmeas(ref(i)): measured voltage [%VDD] for angle position ref(i)

mideal: ideal, theoretical slope; with 90 %VDD and maximum angle 180

The output slopes are monotonic by design. This figures can also be used for the

definition of lin in digital mode, as follows: assume that

Vmeas(ref(i))=meas(ref(i)) and Vmeas(ref(i+1))=meas(ref(i+1)),

whereas meas(X) is the output angle of the KMA200 at the angle position X.

Fig 10. Microlinearity behavior

006aaa305

voltage

meas

(ϕ

ref(i+1)

)

ideal

(ϕ

ref(i+1)

)

meas

(ϕ

ref(i)

)

theoretical slope m

ideal

starting at output

meas

(ϕ

ref(i)

)

Δϕ

ref

= 1° = |ϕ

ref(i)

− ϕ

ref(i+1)

angle

Δϕ

μlin

Product data sheet Rev. 8 — 7 December 2011 21 of 33

NXP Semiconductors KMA200

Programmable angle sensor

12.5 Hysteresis

The hysteresis error is defined as the maximum differen ce between angle values given by

the device output when performing a positive (clockwise) rotation and negative rotation

(counter clockwise) over an angle range of 180.

The hysteresis error is defined as follows:

hys =meas CW(ref)

meas CCW(ref)

hys: hysteresis

meas: CW measured angle for clockwise rotation

meas: CCW measured angle for counter clockwise rotation

13. Programming

The KMA200 comprises two major modes of operation. These modes are:

13.1 Normal operation mode

This is the default mode. The KMA200 starts in this mode without the need of writing to

the serial interface. In this mode a continuous conversion of the input signals into the

corresponding angles takes place. This mode is configured with the on-chip EEPROM.

Once in normal operation mod e, the KMA200 can be r eactivated for comm and mode only

by a new power-on reset.

Fig 11. Hysteresis

006aaa306

180

meas

(°)

ref

(°)

Δϕ

hys

Product data sheet Rev. 8 — 7 December 2011 22 of 33

NXP Semiconductors KMA200

Programmable angle sensor

13.2 Command mode

This mode is used for calibration and programming. The KMA200 is controlled with serial

interface commands.

To activate the command mode, the following initialization procedur e m ust be ex ecu te d

during power-on reset. The pin CS must be constantly held on HIGH level and

pin CLK/OUT2 must be constantly held on LOW level during power-o n. This condition has

to start during reset and must be valid during the following initialization phase of the

KMA200 for at least 1 ms. CS and CLK are internally weak pull-up so that at least CLK

must be actively driven. If these conditions are valid, the KMA200 starts in command

mode. At all other combinations or if the levels are not constant for the minimum time of

1 ms, the KMA200 starts in normal operation mode.

The normal operation mode is configured with sixteen 16-bit constants stored in the

on-chip EEPROM.

13.3 Notes to the programming

The KMA200 sensor is delivered in a pre-calibrated and preprogrammed default

condition.

The EEPROM addres ses 0, 1, 5, C, D and E are device de pendent and pre-calibrate d

for each device. A changing of this contents to another value is not allowed,

because the specified data, influenced by these addresses, are no longer valid.

The EEPROM addresses A and B are used to store production related information.

A changing of th es e valu e s s hould no t be don e.

Definition:

Address A: storage the date code. Date code assembly center: day of the year

(maximum 365) + year (maximum 99)

Fig 12. Command mode

006aaa307

max. 3 ms

min. 1 ms

(ASIC internal

Power-On-Reset)

DATA/OUT1

CLK/OUT2

Product data sheet Rev. 8 — 7 December 2011 23 of 33

NXP Semiconductors KMA200

Programmable angle sensor

Address B: storage the assembly lot no. (maximum 65535)

13.4 Write RAM (0nh), read RAM (1nh)

To write data to the RAM the command byte 0nh (n is the address of the dat a) followed by

the 16-bit dat a ha s to be se nd. To read dat a from the RAM , the co mmand byte 1 nh has to

be send. If CS is activated again, the RAM contents at the specified address is clocked

out. Note that at power-on addresses 00h to 0Fh are read from the EEPROM into the

RAM.

13.5 Calculate CRC-16 and program EEPROM (3 0h)

To program the EEPROM, the configuration data has to be written to the RAM addresses

00h to 0Eh. Afterwards, the command byte 30h has to be sent and the EEPROM

programming voltage has to be applied at the VDD pin. The KMA200 calculates the

CRC-16 check sum and writes the RAM constants at addresses 00h to 0Fh to the

EEPROM. This command is only executed when the EP bit in the control information word

is logic 0 on power-on. If the EP bit is logic 1, this command is ignored.

Ta ble 9. EEPROM content

Address Name Description

0 sensor_offset_1 dependent of individual production calibration results

1 sensor_offset_2 dependent of individual production calibration results

2 zero_angle mechanical 0 position relative to the zero point of the

sensor output; u s ed for zero -an g l e cal i b ra ti on

default value: 0000h (0)

3 angular_range definition of the angular input range that is mapped to the

whole analog output signal ra nge

default value: 0000h (180)

4thresh threshold for programmable output in mode 3

default value: internal CRC of the addresses 0, 1, 5, C, D

and E

5 temp_vref, temp_offs dependent of individual production calibration results

shut(res), Twarn(res) temperature warning and temperature shutdown level; used

for temperature supervis ion default value: FAF8h

(temperature shutdown at 200 C, warning at 198 C)

7 ctrl1 control information word 1 ; used for selection of various

operating modes default value: 4046h (output mode

standard + mode 1)

8 ctrl2 control information word 2; configures the diagnostic

functions default value: 0704h (temperature supervision is

on; input stage diagnosis is on; output stage diagnosis is off)

(CL)l, V(CL)u clamping voltage levels of analog outputs

default value: 00FF h (clamp ing level LOW at 5 %VDD,

clamping level HIGH at 95 %VDD)

A id1 sensor identifier 1; this data is not evaluated by the KMA200

and is used for sensor identification

B id2 sensor identifier 2; this data is not evaluated by the KMA200

and is used for sensor identification

C anom, tc_anom dependent of individual production calibration results

Product data sheet Rev. 8 — 7 December 2011 24 of 33

NXP Semiconductors KMA200

Programmable angle sensor

[1] EP: EEPROM write protection: default value: 0

0EEPROM programming possible

1EEPROM not writable

This bit is evaluated only if the CRC checksum is valid.

[2] SL: rise and fall time of DATA output: default value: 0

0nominal 150 ns

1nominal 750 ns

[3] DO[1:0]: diagnosis of output stage: default value: 00

00 level 0: Vmeas(OUT) Vexp(OUT)<10%V

01 level 1: Vmeas(OUT) Vexp(OUT)<5%V

10 level 2: Vmeas(OUT) Vexp(OUT)<2%V

11 level 3: Vmeas(OUT) Vexp(OUT)<1%V

[4] DI[2:0]: diagnosis of input stage: default value: 000

000 level 0: AMeas ASoll<6.24mV/V

001 level 1: AMeas ASoll<4.68mV/V

010 level 2: AMeas ASoll<3.12mV/V

011 level 3: AMeas ASoll<1.56mV/V

100 level 4: AMeas ASoll<0.78mV/V

[5] OM[2:0]: output mode: default value: 100

000 digital output

001 complement digital output

100 analog output; standard + programmable output mode 1

101 analog output; standard + programmable output mode 2

110 analog output; standard + programmable output mode 3

111 analog output; standard output only

D tc_offset_1 dependent of individual production calibration results

E tc_offset_2 dependent of individual production calibration results

F CRC-16 dependent of individual programming

Ta ble 9. EEPROM content …continued

Address Name Description

Table 10. Format of zero_angle, angular_ra ng e an d thresh

zero_angle = A[15:0]



0.00275



, angular_range = A[15:0]



0.00275



and



thresh = A[15:0]



0.00275



MSB LSB

15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0

A[15] A[14] A[13] A[12] A[11] A[10] A[9] A[8] A[7] A[6] A[5] A[4] A[3] A[2] A[1] A[0]

Table 11. Format of Tshut(res) and Twarn(res)

Tshut(res) =





C + TS[7:0]





C and Twarn(res) =





C+TW[7:0]





MSB LSB

15 14 13 12 11 10 9876543210

Tshut(res) Twarn(res)

[7] TS

[6] TS

[5] TS

[4] TS

[3] TS

[2] TS

[1] TS

[0] TW

[7] TW

[6] TW

[5] TW

[4] TW

[3] TW

[2] TW

[1] TW

[0]

Table 12. Format of ctrl1

MSB LSB

15 14 13[1] 12 11[2] 10[3] 9[3] 8[4] 7[4] 6[5] 5[5] 4[5] 3 2 1 0

0 1 EP 0 SL DO1 DO0 DI1 DI0 OM2 OM1 OM0 0 1 1 0

Product data sheet Rev. 8 — 7 December 2011 25 of 33

NXP Semiconductors KMA200

Programmable angle sensor

[1] DI[2:0]: diagnosis of input stage: default value: 000

000 level 0: AMeas ASoll<6.24mV/V

001 level 1: AMeas ASoll<4.68mV/V

010 level 2: AMeas ASoll<3.12mV/V

011 level 3: AMeas ASoll<1.56mV/V

100 level 4: AMeas ASoll<0.78mV/V

[2] FB: automatic fallback into normal operation mode: default value: 1

0disabled

1enabled

This bit is evaluated only if the CRC checksum is valid.

[3] ETS: enable temperature supervision: default value: 1

0disabled

1enabled

[4] TC[1:0]: error counter temperature supervision: default value: 00

00 0

01 2

10 4

11 8

[5] EDO: enable diagnosis output stage: default value: 0

0disabled

1enabled

[6] CO[1:0]: error counter diagnosis output stage: default value: 00

00 0

01 2

10 4

11 8

[7] EDI: enable diagnosis input stage: default value: 1

0disabled

1enabled

[8] CI[1:0]: error counter diagnosis input stage: default value: 00

00 0

01 2

10 4

11 8

Table 13. Format of ctrl2

MSB LSB

15 14 13 12 11[1] 10 9[2] 8[3] 7[4] 6[4] 5[5] 4[6] 3[6] 2[7] 1[8] 0[8]

0 0 0 0 DI2 1 FB ETS TC1 TC0 EDO CO1 CO0 EDI CI1 CI0

Table 14. Format of V(CL)l and V(CL)u

Lower clamping level output voltage = 5 %VDD +V

(CL)l



0.1 %VDD and

upper clamping level output voltage = 69.5 %VDD +V

(CL)u



0.1 %VDD.

MSB LSB

15 14 13 12 11 10 9876543210

V(CL)l V(CL)u

27262524232221202726252423222120

Product data sheet Rev. 8 — 7 December 2011 26 of 33

NXP Semiconductors KMA200

Programmable angle sensor

14. ElectroMagnetic Interference (EMI)

The following tests are performed with the sensor system KMA200. Details of the

measurements and behavior are available on request.

14.1 Emission (CISPR 25)

Conducted radio disturbance: tests according CISPR 25, chapter 11 (artificial network).

Radiated radio disturbance: test according CISPR 25, chapter 13 (anechoic chamber -

component/module).

14.2 Radiated disturbances (ISO 11452-2, ISO 11452-5)

Immunity against mobile phones and Absorber Lined Chamber an d S trip line (ALCS); strip

line measurements are performed up to 1 GHz.

14.3 Transients - pulses (ISO 7637-1, ISO 7637-3)

Galvanic: line conducted pulse s on the supply lines according ISO 7637-1 pulses 1, 2, 3a,

3b, 4 and 5 (for pulse no. 5 a suitable protection circuit must be used).

Coupled: transient transmission by capacitive and inductive coupling via lines other than

supply lines (interface, analog output) according ISO 7637-3 pulses 3a and 3b.

15. ElectroStatic Discharge (ESD)

15.1 Human body model

The KMA200 must not be damaged at 4000 V, 100 pF, 1.5 k to the human body model.

The test is according to MIL-STD-883D method 3015.7. This protection must be ensured

at all external pins (CLK/OUT2, CS and DA TA/OUT1) including device supply (VDD, GND).

For the interconnects (pins between upper and lower package part), the protection is up to

1500 V.

15.2 Machine model

The KMA200 must not be damage d at 400 V to the machine model. The test is a ccordin g

to MIL-STD-883D method 3015.7. This protection must be ensured at all external pins

(CLK/OUT2, CS and DATA/OUT1) including device supply (VDD, GND). For the

interconnects (pins between upper and lower package part), the protection is up to 100 V.

16. Terminals

Device terminals shall be compatible with laser welding and electrical welding.

Lead frame material: CuZr with 0.1 % Zr, 99.9 % Cu

Lead finish: pure tin, 7 mthickness 11 m

Product data sheet Rev. 8 — 7 December 2011 27 of 33

NXP Semiconductors KMA200

Programmable angle sensor

17. Marking

Package is SOT637

Marking paint: laser on package head and package body

Letter height: 0.8 mm

Marking of package head: batch number

Marking of package body: type no., date code (x yyy z); x: m for manufacturing Manila,

y: day of the year, z: year of production

Product data sheet Rev. 8 — 7 December 2011 28 of 33

NXP Semiconductors KMA200

Programmable angle sensor

18. Package outline

Fig 13. Package outline SOT637

UNIT bpc

min.

REFERENCES

OUTLINE

VERSION EUROPEAN

PROJECTION ISSUE DATE

IEC JEDEC JEITA

mm 1.65

1.45 0.41

0.34

bp1

1.57

1.47

bp2

0.31

0.24 8.1

7.9

4.1

3.9

0.30

0.24 4.75

E1L1

0.5

45°

7.1

6.9 0.85

0.75

0.7

0.5

2.55 0.35

D2D3(1)

max.

0.2

max.

0.95

L4(1)

max.

5.45

5.25

0.85

0.65

3.275

3.075

1.27 21.4

21.0

6.42

6.32 5.85

HE1 HE2

max.

1.2

0.65

0.55

DIMENSIONS (mm are the original dimensions)

SOT637 02-01-18

04-12-10

0 2.5 5 mm

scale

D3(1)

HE1

HE2

bp1 D

L4(1)

Note

1. Terminal dimensions within this zone are uncontrolled to allow for flow of plastic between and besides the leads.

bp2

12345

SOT637

Plastic single-ended multi-chip package; 6 interconnections; 5 in-line leads

SENSOR DIE POSITION

* centre of reading point

view A-B

0.4 vA

Product data sheet Rev. 8 — 7 December 2011 29 of 33

NXP Semiconductors KMA200

Programmable angle sensor

19. Handling information

Dimensions in mm

(1) No bending allowed

(2) Plastic body and interface plastic body - leads: application of bending forces not allowed

Fig 14. Bending recommendation

006aaa246

R 0.25 min

0.7

(1)

0.7

(1)

0.7

(1)

(2)

Product data sheet Rev. 8 — 7 December 2011 30 of 33

NXP Semiconductors KMA200

Programmable angle sensor

20. Revision history

Table 15. Revision history

Document ID Release date Data sheet stat us Change notice Supersedes

KMA200_8 20111207 Product data sheet PCN 201106032F01 KMA200_7

Modifications: •Section 16 “Terminals”: Lead finish dimensions changed

KMA200_7 20080718 Product data sheet - KMA200_6

Modifications: •Section 16: The lead finish thickness has been changed

KMA200_6 20070102 Product data sheet - KMA200_5

KMA200_5 20050816 Product data sheet - KMA200_4

KMA200_4 20020325 Objective specification - KMA200_3

KMA200_3 20010620 Objective specification - KMA200_2

KMA200_2 20000920 Objective specification - KMA200_1

KMA200_1 20000907 Objective specification - -

Product data sheet Rev. 8 — 7 December 2011 31 of 33

NXP Semiconductors KMA200

Programmable angle sensor

21. Legal information

21.1 Data sheet status

[1] Please consult the most recently issued document before initiating or completing a design.

[2] The term ‘short data sheet’ is explained in section “Definitions”.

[3] The product status of de vice(s) descr ibed in th is docume nt may have cha nged since this docume nt was publis hed and ma y dif fer in case of multiple devices. The latest product status

information is available on the Internet at URL http://www.nxp.com.

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Draft — The document is a draft version only. The content is still under

internal review and subject to formal approval, which may result in

modifications or additions. NXP Semiconductors does not give any

representations or warranties as to the accuracy or completeness of

information included herein and shall have no liab ility for the consequences of

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Short data sheet — A short dat a sheet is an extract from a full data sheet

with the same product type number(s) and tit le. A short data sh eet is intended

for quick reference only and shou ld not be rel ied u pon to cont ain det ailed and

full information. For detailed and full information see the relevant full data

sheet, which is available on request via the local NXP Semiconductors sales

office. In case of any inconsistency or conflict with the short data sheet, the

full data sheet shall pre vail.

Product specificatio n — The information and data provided in a Product

data sheet shall define the specification of the product as agreed between

NXP Semiconductors and its customer, unless NXP Semiconductors and

customer have explicitly agreed otherwise in writing. In no event however,

shall an agreement be valid in which the NXP Semiconductors product is

deemed to off er functions and qualities beyond tho se described in the

Product data sheet.

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In no event shall NXP Semiconductors be liable for any indirect, incidental,

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Notwithstanding any damages that customer might incur for any reason

whatsoever, NXP Semiconductors’ aggreg ate and cumulative l iability towards

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Semiconductors product has been qualified for use in automotive

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damage. NXP Semiconductors accepts no liab ility for inclusion and/or use of

NXP Semiconductors products in such equipment or applications and

therefore such inclusion and/or use is at the customer's own risk.

Applications — Applications that are described herein for any of these

products are for il lustrative purposes only. NXP Semiconductors makes no

representation or warranty tha t such application s will be suitable for the

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Customers are responsible for the design and ope ration of their applications

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Limiting values — Stress above one or more limiting values (as defined in

the Absolute Maximum Ratings System of IEC 60134) will cause permanent

damage to the device. Limiting values are stress ratings only and (proper)

operation of the device at these or any other conditions above those given in

the Recommended operating conditions section (if present) or the

Characteristics sections of this document is not warranted. Constant or

repeated exposure to limiting values will permanent ly and irreversibly affect

the quality and reliability of the device.

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products are sold subject to the general terms and conditions of commercial

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agreed in a valid written individua l agreement. In case an individual

agreement is concluded only the ter ms and conditions of the respective

agreement shall apply. NXP Semiconductors hereby expressly objects to

applying the customer’s general terms and conditions with regard to the

purchase of NXP Semiconductors products by customer.

No offer to sell or license — Not hing in this document may be interpret ed or

construed as an of fer t o sell product s that is open for accept ance or t he grant,

conveyance or implication of any license under any copyri ghts, patents or

other industrial or intellectual property rights.

Document status[1][2] Product status[3] Definition

Objective [short] data sheet Development This document contain s data from the objective specification for product development.

Preliminary [short] dat a sheet Qualification This document contains data from the preliminary specification.

Product [short] dat a sheet Production This document contains the product specification.

Product data sheet Rev. 8 — 7 December 2011 32 of 33

NXP Semiconductors KMA200

Programmable angle sensor

Export control — This document as well as the item(s) described herein

may be subject to export control regulations. Export might require a prior

authorization from competent authorities.

Quick reference data — The Quick reference data is an extract of the

product data given in the Limiting values and Characteristics sections of this

document, and as such is not complete, exhaustive or legally binding.

21.4 Trademarks

Notice: All refe renced brands, produc t names, service names and trademarks

are the property of their respect i ve ow ners.

22. Contact information

For more information, please visit: http://www.nxp.com

For sales office addresses, please send an email to: salesaddresses@nxp.com

NXP Semiconductors KMA200

Programmable angle sensor

For more information, please visit: http://www.nxp.co m

For sales office addresses, please send an email to: salesaddresses@nxp.com

Date of release: 7 December 2011

Document identifier: KMA200

Please be aware that important notices concerning this document and the product(s)

described herein, have been included in section ‘Legal information’.

23. Contents

1 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1

1.1 General description . . . . . . . . . . . . . . . . . . . . . 1

1.2 Features and benefits. . . . . . . . . . . . . . . . . . . . 1

1.3 Quick reference data . . . . . . . . . . . . . . . . . . . . 2

2 Pinning information. . . . . . . . . . . . . . . . . . . . . . 2

3 Ordering information. . . . . . . . . . . . . . . . . . . . . 2

4 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 3

5 Functional description . . . . . . . . . . . . . . . . . . . 4

6 Diagnostic features . . . . . . . . . . . . . . . . . . . . . . 5

7 Outputs of KMA200 . . . . . . . . . . . . . . . . . . . . . . 8

8 Digital output (SPI). . . . . . . . . . . . . . . . . . . . . . 11

9 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . 12

10 Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . 13

11 Error codes. . . . . . . . . . . . . . . . . . . . . . . . . . . . 17

12 Definition of errors. . . . . . . . . . . . . . . . . . . . . . 18

12.1 General. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18

12.2 Linearity error . . . . . . . . . . . . . . . . . . . . . . . . . 18

12.3 Temperature drift. . . . . . . . . . . . . . . . . . . . . . . 19

12.4 Microlinearity . . . . . . . . . . . . . . . . . . . . . . . . . 20

12.5 Hysteresis. . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

13 Programming . . . . . . . . . . . . . . . . . . . . . . . . . . 21

13.1 Normal operation mode . . . . . . . . . . . . . . . . . 21

13.2 Command mode. . . . . . . . . . . . . . . . . . . . . . . 22

13.3 Notes to the programming . . . . . . . . . . . . . . . 22

13.4 Write RAM (0nh), read RAM (1nh) . . . . . . . . . 23

13.5 Calculate CRC-16 and program

EEPROM (30h). . . . . . . . . . . . . . . . . . . . . . . . 23

14 ElectroMagnetic Interference (EMI) . . . . . . . . 26

14.1 Emission (CISPR 25) . . . . . . . . . . . . . . . . . . . 26

14.2 Radiated disturbances (ISO 11452-2,

ISO 11452-5) . . . . . . . . . . . . . . . . . . . . . . . . . 26

14.3 Transients - pulses

(ISO 7637-1, ISO 7637-3) . . . . . . . . . . . . . . . 26

15 ElectroStatic Discharge (ESD) . . . . . . . . . . . . 26

15.1 Human body model . . . . . . . . . . . . . . . . . . . . 26

15.2 Machine model. . . . . . . . . . . . . . . . . . . . . . . . 26

16 Terminals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

17 Marking. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

18 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 28

19 Handling information. . . . . . . . . . . . . . . . . . . . 29

20 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 30

21 Legal information. . . . . . . . . . . . . . . . . . . . . . . 31

21.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 31

21.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

21.3 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . 31

21.4 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . 32

22 Contact information . . . . . . . . . . . . . . . . . . . . 32

23 Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33