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FAN3216 / FAN3217 Dual 2-A, High-Speed, Low-Side Gate Drivers Features Industry-Standard Pinouts Internal Resistors Turn Driver Off If No Inputs TTL Input Thresholds 4.5-V to 18-V Operating Range 3-A Peak Sink/Source at VDD = 12 V 2.4-A Sink / 1.6-A Source at VOUT = 6 V Inverting Configuration (FAN3216) and Non-Inverting Configuration (FAN3217) 12-ns / 9-ns Typical Rise/Fall Times (1 nF Load) 20-ns Typical Propagation Delay Time Matched within 1 ns to the Other Channel MillerDriveTM Technology Double Current Capability by Paralleling Channels Standard SOIC-8 Package Rated from -40C to +125C Ambient Automotive Qualified to AEC-Q100 (F085 Versions) Applications Switch-Mode Power Supplies Description The FAN3216 and FAN3217 dual 2 A gate drivers are designed to drive N-channel enhancement-mode MOSFETs in low-side switching applications by providing high peak current pulses during the short switching intervals. They are both available with TTL input thresholds. Internal circuitry provides an undervoltage lockout function by holding the output LOW until the supply voltage is within the operating range. In addition, the drivers feature matched internal propagation delays between A and B channels for applications requiring dual gate drives with critical timing, such as synchronous rectifiers. This also enables connecting two drivers in parallel to effectively double the current capability driving a single MOSFET. The FAN3216/17 drivers incorporate MillerDriveTM architecture for the final output stage. This bipolarMOSFET combination provides high current during the Miller plateau stage of the MOSFET turn-on / turn-off process to minimize switching loss, while providing railto-rail voltage swing and reverse current capability. The FAN3216 offers two inverting drivers and the FAN3217 offers two non-inverting drivers. Both are offered in a standard 8-pin SOIC package. High-Efficiency MOSFET Switching Synchronous Rectifier Circuits DC-to-DC Converters Motor Control Automotive-Qualified Systems (F085 Versions) Figure 1. FAN3216 Pin Configuration (c) 2013 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 Figure 2. FAN3217 Pin Configuration www.fairchildsemi.com FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers April 2013 Input Threshold Package Packing Method Quantity per Reel Dual Inverting Channels TTL SOIC-8 Tape & Reel 2,500 Dual Inverting Channels TTL SOIC-8 Tape & Reel 2,500 Dual Non-Inverting Channels TTL SOIC-8 Tape & Reel 2,500 SOIC-8 Tape & Reel 2,500 Part Number Logic FAN3216TMX FAN3216TMX_F085 (1) FAN3217TMX FAN3217TMX_F085(1) Dual Non-Inverting Channels TTL All standard Fairchild Semiconductor products are RoHS compliant and many are also "Green" or going green. Green means the products are RoHS compliant AND they have limits on additional substances of Chlorine, Bromine and Antimony. For additional information on Fairchild's "green" Eco Status, please visit: http://www.fairchildsemi.com/company/green/rohs_green.html. Note: 1. Qualified to AEC-Q100 Package Outlines Figure 3. SOIC-8 (Top View) Thermal Characteristics(2) Package 8-Pin Small Outline Integrated Circuit (SOIC) JL(3) JT(4) JA(5) JB(6) JT(7) Unit 40 31 89 43 3.0 C/W Notes: 2. Estimates derived from thermal simulation; actual values depend on the application. 3. Theta_JL (JL): Thermal resistance between the semiconductor junction and the bottom surface of all the leads (including any thermal pad) that are typically soldered to a PCB. 4. Theta_JT (JT): Thermal resistance between the semiconductor junction and the top surface of the package, assuming it is held at a uniform temperature by a top-side heatsink. 5. Theta_JA (JA): Thermal resistance between junction and ambient, dependent on the PCB design, heat sinking, and airflow. The value given is for natural convection with no heatsink using a 2S2P board, as specified in JEDEC standards JESD51-2, JESD51-5, and JESD51-7, as appropriate. 6. Psi_JB (jB): Thermal characterization parameter providing correlation between semiconductor junction temperature and an application circuit board reference point for the thermal environment defined in Note 5. For the SOIC-8 package, the board reference is defined as the pcb copper adjacent to pin 6. 7. Psi_JT (jT): Thermal characterization parameter providing correlation between the semiconductor junction temperature and the center of the top of the package for the thermal environment defined in Note 5. (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 2 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Ordering Information Figure 4. FAN3216 Figure 5. FAN3217 Pin Definitions Pin Name Pin Description 1 NC No Connect. This pin can be grounded or left floating. 2 INA Input to Channel A. 3 GND Ground. Common ground reference for input and output circuits. 4 INB Input to Channel B. 5 (FAN3216) OUTB Gate Drive Output B (inverted from the input): Held LOW unless required input is present and VDD is above UVLO threshold. 5 (FAN3217) OUTB Gate Drive Output B: Held LOW unless required input(s) are present and VDD is above UVLO threshold. 6 VDD 7 (FAN3216) OUTA Gate Drive Output A (inverted from the input): Held LOW unless required input is present and VDD is above UVLO threshold. 7 (FAN3217) OUTA Gate Drive Output A: Held LOW unless required input(s) are present and VDD is above UVLO threshold. 8 NC Supply Voltage. Provides power to the IC. No Connect. This pin can be grounded or left floating. Output Logic FAN3216 (x=A or B) INx 0 1(8) FAN3217 (x=A or B) INx OUTx 1 0 (8) 0 1 OUTx 0 1 Note: 8. Default input signal if no external connection is made. (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 3 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Pin Configurations FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Block Diagrams Figure 6. FAN3216 Block Diagram Figure 7. FAN3217 Block Diagram (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 4 Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. Symbol Parameter Min. Max. Unit -0.3 20.0 V VDD VDD to PGND VIN INA and INB to GND GND - 0.3 VDD + 0.3 V OUTA and OUTB to GND GND - 0.3 VDD + 0.3 V VOUT TL Lead Soldering Temperature (10 Seconds) TJ Junction Temperature TSTG Storage Temperature +260 C -55 +150 C -65 +150 C Recommended Operating Conditions The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to Absolute Maximum Ratings. Symbol Parameter VDD Supply Voltage Range VIN Input Voltage INA and INB TA Operating Ambient Temperature (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 Min. Max. Unit 4.5 18.0 V 0 VDD V -40 +125 C www.fairchildsemi.com 5 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Absolute Maximum Ratings Unless otherwise noted, VDD=12 V, TJ=-40C to +125C. Currents are defined as positive into the device and negative out of the device. Symbol Parameter Conditions Min. Typ. Max. Unit 18.0 V 0.75 1.20 mA Supply VDD Operating Range 4.5 IDD Supply Current, Inputs Not Connected VON Turn-On Voltage INA=VDD, INB=0 V 3.45 3.90 4.35 V VOFF Turn-Off Voltage INA=VDD, INB=0 V 3.25 3.70 4.15 V FAN3216TMX_F085, FAN3217TMX_F085 (Automotive-Qualified Versions) VON Turn-On Voltage(11) INA=VDD, INB=0 V 3.40 3.90 4.60 V VOFF (11) INA=VDD, INB=0 V 3.20 3.70 4.30 V 0.8 1.2 Turn-Off Voltage Inputs VIL_T INx Logic Low Threshold VIH_T INx Logic High Threshold VHYS_T TTL Logic Hysteresis Voltage 0.2 V 1.6 2.0 V 0.4 0.8 V FAN3216TMX, FAN3217TMX IIN+ Non-inverting Input Current IN from 0 to VDD -1.0 175 A IIN- Inverting Input Current IN from 0 to VDD -175.0 1.0 A 1.5 A A FAN3216TMX_F085, FAN3217TMX_F085 (Automotive-Qualified Versions) IINx_T Non-inverting Input Current(11) IN=0 V -1.5 IINx_T (11) Non-inverting Input Current IN=VDD 90 120 175.0 IINx_T Inverting Input Current (11) IN=0 V -175.0 -120 -90 A IINx_T Inverting Input Current(11) IN=VDD -1.5 1.5 A Outputs OUT Current, Mid-Voltage, Sinking(9) OUTx at VDD/2, CLOAD=0.22 F, f=1 kHz 2.4 A ISOURCE OUT Current, Mid-Voltage, Sourcing(9) OUTx at VDD/2, CLOAD=0.1 F, f=1 kHz -1.6 A IPK_SINK OUT Current, Peak, Sinking(9) CLOAD=0.1 F, f=1 kHz 3 A CLOAD=0.1 F, f=1 kHz -3 A CLOAD=1000 pF 12 22 ns CLOAD=1000 pF 9 17 ns 19 34 ns 1 2 ns ISINK IPK_SOURCE tRISE tFALL tD1, tD2 IRVS (9) OUT Current, Peak, Sourcing (10) Output Rise Time (10) Output Fall Time (10) Output Propagation Delay, TTL Inputs 0 - 5 VIN, 1V/ns Slew Rate Propagation Matching Between Channels INA=INB, OUTA and OUTB at 50% Point Output Reverse Current Withstand(9) 10 500 mA Continued on the following page... (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 6 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Electrical Characteristics Unless otherwise noted, VDD=12 V, TJ=-40C to +125C. Currents are defined as positive into the device and negative out of the device. Symbol Parameter Conditions Min. Typ. Max. Unit 4.5 19.0 34.0 ns Outputs (continued) FAN3216TMX_F085, FAN3217TMX_F085 (Automotive-Qualified Versions) Output Propagation Delay, TTL Inputs(11) 0 - 5 VIN, 1 V/ns Slew Rate Propagation Matching Between Channels(11) INA=INB, OUTA and OUTB at 50% Point 2 4 ns VOH High Level Output Voltage(11) VOH =VDD -VOUT, IOUT=-1 mA 15 35 mV VOL Low Level Output Voltage(11) IOUT=1 mA 10 25 mV tD1, tD2 Notes: 9. Not tested in production. 10. See Timing Diagrams of Figure 8 and Figure 9. 11. Apply to only F085 Version Figure 8. Non-Inverting Timing Diagram (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 Figure 9. Inverting Timing Diagram www.fairchildsemi.com 7 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Electrical Characteristics (Continued) Typical characteristics are provided at TA=25C and VDD=12 V unless otherwise noted. Figure 10. IDD (Static) vs. Supply Voltage(12) Figure 11. IDD (Static) vs. Temperature(12) Figure 12. IDD (No-Load) vs. Frequency Figure 13. IDD (1 nF Load) vs. Frequency Figure 14. Input Thresholds vs. Supply Voltage Figure 15. Input Thresholds vs. Temperature (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 8 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Typical Performance Characteristics FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Typical Performance Characteristics Typical characteristics are provided at TA=25C and VDD=12 V unless otherwise noted. Figure 16. UVLO Threshold vs. Temperature Figure 17. Propagation Delay vs. Supply Voltage Figure 18. Propagation Delay vs. Supply Voltage Figure 19. Propagation Delays vs. Temperature Figure 20. Propagation Delays vs. Temperature (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 9 Typical characteristics are provided at TA=25C and VDD=12 V unless otherwise noted. Figure 21. Fall Time vs. Supply Voltage Figure 22. Rise Time vs. Supply Voltage Figure 23. Rise and Fall Times vs. Temperature Figure 24. Rise/Fall Waveforms with 2.2 nF Load (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 Figure 25. Rise/Fall Waveforms with 10 nF Load www.fairchildsemi.com 10 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Typical Performance Characteristics Typical characteristics are provided at TA=25C and VDD=12 V unless otherwise noted. Figure 26. Quasi-Static Source Current with VDD=12 V(13) Figure 27. Quasi-Static Sink Current with VDD=12 V(13) Figure 28. Quasi-Static Source Current with VDD=8 V(13) Figure 29. Quasi-Static Sink Current with VDD=8 V(13) Notes: 12. For any inverting inputs pulled low, non-inverting inputs pulled high, or outputs driven high; static IDD increases by the current flowing through the corresponding pull-up/down resistor shown in Figure 6 and Figure 7. 13. The initial spike in each current waveform is a measurement artifact caused by the stray inductance of the current-measurement loop. Test Circuit Figure 30. Quasi-Static IOUT / VOUT Test Circuit (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 11 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Typical Performance Characteristics Input Thresholds The FAN3216 and the FAN3217 drivers consist of two identical channels that may be used independently at rated current or connected in parallel to double the individual current capacity. The input thresholds meet industry-standard TTL-logic thresholds independent of the VDD voltage, and there is a hysteresis voltage of approximately 0.4 V. These levels permit the inputs to be driven from a range of input logic signal levels for which a voltage over 2 V is considered logic HIGH. The driving signal for the TTL inputs should have fast rising and falling edges with a slew rate of 6 V/s or faster, so a rise time from 0 to 3.3 V should be 550 ns or less. With reduced slew rate, circuit noise could cause the driver input voltage to exceed the hysteresis voltage and retrigger the driver input, causing erratic operation. Figure 31. MillerDriveTM Output Architecture Under-Voltage Lockout The FAN321x startup logic is optimized to drive groundreferenced N-channel MOSFETs with an under-voltage lockout (UVLO) function to ensure that the IC starts up in an orderly fashion. When VDD is rising, yet below the 3.9 V operational level, this circuit holds the output LOW, regardless of the status of the input pins. After the part is active, the supply voltage must drop 0.2 V before the part shuts down. This hysteresis helps prevent chatter when low VDD supply voltages have noise from the power switching. This configuration is not suitable for driving high-side P-channel MOSFETs because the low output voltage of the driver would turn the P-channel MOSFET on with VDD below 3.9 V. Static Supply Current In the IDD (static) typical performance characteristics shown in Figure 10 and Figure 11, each curve is produced with both inputs floating and both outputs LOW to indicate the lowest static IDD current. For other states, additional current flows through the 100k resistors on the inputs and outputs shown in the block diagram of each part (see Figure 6 and Figure 7). In these cases, the actual static IDD current is the value obtained from the curves plus this additional current. MillerDriveTM Gate Drive Technology FAN3216 and FAN3217 gate drivers incorporate the MillerDriveTM architecture shown in Figure 31. For the output stage, a combination of bipolar and MOS devices provide large currents over a wide range of supply voltage and temperature variations. The bipolar devices carry the bulk of the current as OUT swings between 1/3 to 2/3 VDD and the MOS devices pull the output to the HIGH or LOW rail. VDD Bypass Capacitor Guidelines To enable this IC to turn a device ON quickly, a local high-frequency bypass capacitor, CBYP, with low ESR and ESL should be connected between the VDD and GND pins with minimal trace length. This capacitor is in addition to bulk electrolytic capacitance of 10 F to 47 F commonly found on driver and controller bias circuits. A typical criterion for choosing the value of CBYP is to keep the ripple voltage on the VDD supply to 5%. This is often achieved with a value 20 times the equivalent load capacitance CEQV, defined here as QGATE/VDD. Ceramic capacitors of 0.1 F to 1 F or larger are common choices, as are dielectrics, such as X5R and X7R, with good temperature characteristics and high pulse current capability. The purpose of the MillerDriveTM architecture is to speed up switching by providing high current during the Miller plateau region when the gate-drain capacitance of the MOSFET is being charged or discharged as part of the turn-on / turn-off process. For applications with zero voltage switching during the MOSFET turn-on or turn-off interval, the driver supplies high peak current for fast switching even though the Miller plateau is not present. This situation often occurs in synchronous rectifier applications because the body diode is generally conducting before the MOSFET is switched ON. If circuit noise affects normal operation, the value of CBYP may be increased, to 50-100 times the CEQV, or CBYP may be split into two capacitors. One should be a larger value, based on equivalent load capacitance, and the other a smaller value, such as 1-10 nF mounted closest to the VDD and GND pins to carry the higherfrequency components of the current pulses. The bypass capacitor must provide the pulsed current from both of the driver channels and, if the drivers are switching simultaneously, the combined peak current sourced from the CBYP would be twice as large as when a single channel is switching. The output pin slew rate is determined by VDD voltage and the load on the output. It is not user adjustable, but a series resistor can be added if a slower rise or fall time at the MOSFET gate is needed. (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 12 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Applications Information The FAN3216 and FAN3217 gate drivers incorporate fast-reacting input circuits, short propagation delays, and powerful output stages capable of delivering current peaks over 2 A to facilitate voltage transition times from under 10 ns to over 150 ns. The following layout and connection guidelines are strongly recommended: Keep high-current output and power ground paths separate from logic input signals and signal ground paths. This is especially critical for TTL-level logic thresholds at driver input pins. Keep the driver as close to the load as possible to minimize the length of high-current traces. This reduces the series inductance to improve highspeed switching, while reducing the loop area that can radiate EMI to the driver inputs and surrounding circuitry. If the inputs to a channel are not externally connected, the internal 100 k resistors indicated on block diagrams command a low output. In noisy environments, it may be necessary to tie inputs of an unused channel to VDD or GND using short traces to prevent noise from causing spurious output switching. Many high-speed power circuits can be susceptible to noise injected from their own output or other external sources, possibly causing output retriggering. These effects can be obvious if the circuit is tested in breadboard or non-optimal circuit layouts with long input or output leads. For best results, make connections to all pins as short and direct as possible. FAN3216 and FAN3217 are pin-compatible with many other industry-standard drivers. The turn-on and turn-off current paths should be minimized, as discussed in the following section. Figure 32. Current Path for MOSFET Turn-On Figure 33 shows the current path when the gate driver turns the MOSFET OFF. Ideally, the driver shunts the current directly to the source of the MOSFET in a small circuit loop. For fast turn-off times, the resistance and inductance in this path should be minimized. Figure 33. Current Path for MOSFET Turn-Off Figure 32 shows the pulsed gate drive current path when the gate driver is supplying gate charge to turn the MOSFET on. The current is supplied from the local bypass capacitor, CBYP, and flows through the driver to the MOSFET gate and to ground. To reach the high peak currents possible, the resistance and inductance in the path should be minimized. The localized CBYP acts to contain the high peak current pulses within this driverMOSFET circuit, preventing them from disturbing the sensitive analog circuitry in the PWM controller. (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 13 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Layout and Connection Guidelines At power-up, the driver output remains LOW until the VDD voltage reaches the turn-on threshold. The magnitude of the OUT pulses rises with VDD until steady-state VDD is reached. The non-inverting operation illustrated in Figure 34 shows that the output remains LOW until the UVLO threshold is reached, then the output is in-phase with the input. The inverting configuration of startup waveforms are shown in Figure 35. With IN+ tied to VDD and the input signal applied to IN-, the OUT pulses are inverted with respect to the input. At power-up, the inverted output remains LOW until the VDD voltage reaches the turn-on threshold, then it follows the input with inverted phase. Figure 34. Non-Inverting Startup Waveforms Figure 35. Inverting Startup Waveforms (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 14 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Operational Waveforms In the forward converter with synchronous rectifier shown in the typical application diagrams, the FDMS8660S is a reasonable MOSFET selection. The gate charge for each SR MOSFET would be 60 nC with VGS = VDD = 7V. At a switching frequency of 500 kHz, the total power dissipation is: Gate drivers used to switch MOSFETs and IGBTs at high frequencies can dissipate significant amounts of power. It is important to determine the driver power dissipation and the resulting junction temperature in the application to ensure that the part is operating within acceptable temperature limits. The total power dissipation in a gate driver is the sum of two components, PGATE and PDYNAMIC: PTOTAL = PGATE + PDYNAMIC (1) Gate Driving Loss: The most significant power loss results from supplying gate current (charge per unit time) to switch the load MOSFET on and off at the switching frequency. The power dissipation that results from driving a MOSFET at a specified gatesource voltage, VGS, with gate charge, QG, at switching frequency, fSW, is determined by: PGATE = QG * VGS * fSW * n (5) PDYNAMIC = 3 mA * 7 V * 2 = 0.042 W (6) PTOTAL = 0.46 W (7) The SOIC-8 has a junction-to-board thermal characterization parameter of JB = 43C/W. In a system application, the localized temperature around the device is a function of the layout and construction of the PCB along with airflow across the surfaces. To ensure reliable operation, the maximum junction temperature of the device must be prevented from exceeding the maximum rating of 150C; with 80% derating, TJ would be limited to 120C. Rearranging Equation 4 determines the board temperature required to maintain the junction temperature below 120C: (2) where n is the number of driver channels in use (1 or 2). Dynamic Pre-Drive / Shoot-through Current: A power loss resulting from internal current consumption under dynamic operating conditions, including pin pull-up / pull-down resistors, can be obtained using the graphs in Typical Performance Characteristics to determine the current IDYNAMIC drawn from VDD under actual operating conditions: PDYNAMIC = IDYNAMIC * VDD * n PGATE = 60 nC * 7 V * 500 kHz * 2 = 0.42 W TB = TJ - PTOTAL * JB (8) TB = 120C - 0.46 W * 43C/W = 100C (9) (3) Once the power dissipated in the driver is determined, the driver junction rise with respect to circuit board can be evaluated using the following thermal equation, assuming JB was determined for a similar thermal design (heat sinking and air flow): TJ = PTOTAL * JB + TB (4) where: TJ = driver junction temperature; JB = (psi) thermal characterization parameter relating temperature rise to total power dissipation; and = board temperature in location as defined in TB the Thermal Characteristics table. (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 15 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Thermal Guidelines Figure 36. Forward Converter with Synchronous Rectification Figure 37. Primary-Side Dual Driver in a Push-Pull Converter Figure 38. Phase-Shifted Full-Bridge with Two Gate Drive Transformers (Simplified) (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 16 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Typical Application Diagrams Type Part Number Single 1 A FAN3111C Gate Drive(14) Input (Sink/Src) Threshold +1.1 A / -0.9 A CMOS (15) Logic Package Single Channel of Dual-Input/Single-Output SOT23-5, MLP6 Single Non-Inverting Channel with External Reference SOT23-5, MLP6 Single 1 A FAN3111E +1.1 A / -0.9 A External Single 2 A FAN3100C +2.5 A / -1.8 A CMOS Single Channel of Two-Input/One-Output SOT23-5, MLP6 Single 2 A FAN3100T +2.5 A / -1.8 A TTL Single Channel of Two-Input/One-Output SOT23-5, MLP6 Single 2 A FAN3180 +2.4 A / -1.6 A TTL Single Non-Inverting Channel + 3.3-V LDO Dual 2 A FAN3216T +2.4 A / -1.6 A TTL Dual Inverting Channels Dual 2 A FAN3217T +2.4 A / -1.6 A TTL Dual 2 A FAN3226C +2.4 A / -1.6 A CMOS Dual Inverting Channels + Dual Enable SOIC8, MLP8 Dual 2 A FAN3226T +2.4 A / -1.6 A TTL Dual Inverting Channels + Dual Enable SOIC8, MLP8 Dual 2 A FAN3227C +2.4 A / -1.6 A CMOS Dual Non-Inverting Channels + Dual Enable SOIC8, MLP8 Dual 2 A FAN3227T +2.4 A / -1.6 A TTL Dual Non-Inverting Channels + Dual Enable SOIC8, MLP8 Dual 2 A FAN3228C +2.4 A / -1.6 A CMOS Dual Channels of Two-Input/One-Output, Pin Config.1 SOIC8, MLP8 Dual 2 A FAN3228T +2.4 A / -1.6 A TTL Dual Channels of Two-Input/One-Output, Pin Config.1 SOIC8, MLP8 Dual 2 A FAN3229C +2.4 A / -1.6 A CMOS Dual Channels of Two-Input/One-Output, Pin Config.2 SOIC8, MLP8 Dual 2 A FAN3229T +2.4 A / -1.6 A TTL Dual Channels of Two-Input/One-Output, Pin Config.2 SOIC8, MLP8 Dual 2 A FAN3268T +2.4 A / -1.6 A TTL 20 V Non-Inverting Channel (NMOS) and Inverting Channel (PMOS) + Dual Enables SOIC8 Dual 2 A FAN3278T +2.4 A / -1.6 A TTL 30 V Non-Inverting Channel (NMOS) and Inverting Channel (PMOS) + Dual Enables SOIC8 Dual 4 A FAN3213T +2.5 A / -1.8 A TTL Dual Inverting Channels SOIC8 Dual 4 A FAN3214T +2.5 A / -1.8 A TTL Dual Non-Inverting Channels SOIC8 Dual 4 A FAN3223C +4.3 A / -2.8 A CMOS Dual Inverting Channels + Dual Enable SOIC8, MLP8 Dual 4 A FAN3223T +4.3 A / -2.8 A TTL Dual Inverting Channels + Dual Enable SOIC8, MLP8 Dual 4 A FAN3224C +4.3 A / -2.8 A CMOS Dual Non-Inverting Channels + Dual Enable SOIC8, MLP8 Dual 4 A FAN3224T +4.3 A / -2.8 A TTL Dual Non-Inverting Channels + Dual Enable SOIC8, MLP8 Dual 4 A FAN3225C +4.3 A / -2.8 A CMOS Dual Channels of Two-Input/One-Output SOIC8, MLP8 Dual 4 A FAN3225T +4.3 A / -2.8 A TTL Dual Channels of Two-Input/One-Output SOIC8, MLP8 Single 9 A FAN3121C +9.7 A / -7.1 A CMOS Single Inverting Channel + Enable SOIC8, MLP8 Single 9 A FAN3121T +9.7 A / -7.1 A TTL Single Inverting Channel + Enable SOIC8, MLP8 Single 9 A FAN3122T +9.7 A / -7.1 A CMOS Single Non-Inverting Channel + Enable SOIC8, MLP8 Single 9 A FAN3122C +9.7 A / -7.1 A TTL Single Non-Inverting Channel + Enable SOIC8, MLP8 Dual 12 A FAN3240 +12.0 A TTL Dual-Coil Relay Driver, Timing Config. 0 SOIC8 Dual 12 A FAN3241 +12.0 A TTL Dual-Coil Relay Driver, Timing Config. 1 SOIC8 Dual Non-Inverting Channels SOT23-5 SOIC8 SOIC8 Notes: 14. Typical currents with OUTx at 6 V and VDD=12 V. 15. Thresholds proportional to an externally supplied reference voltage. (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 17 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Table 1. Related Products 5.00 4.80 A 0.65 3.81 5 8 B 6.20 5.80 PIN ONE INDICATOR 1.75 4.00 3.80 1 5.60 4 1.27 (0.33) 0.25 M 1.27 C B A LAND PATTERN RECOMMENDATION 0.25 0.10 SEE DETAIL A 1.75 MAX 0.25 0.19 C 0.10 0.51 0.33 0.50 x 45 0.25 R0.10 C OPTION A - BEVEL EDGE GAGE PLANE R0.10 OPTION B - NO BEVEL EDGE 0.36 NOTES: UNLESS OTHERWISE SPECIFIED 8 0 0.90 0.406 A) THIS PACKAGE CONFORMS TO JEDEC MS-012, VARIATION AA, ISSUE C, B) ALL DIMENSIONS ARE IN MILLIMETERS. C) DIMENSIONS DO NOT INCLUDE MOLD FLASH OR BURRS. D) LANDPATTERN STANDARD: SOIC127P600X175-8M. E) DRAWING FILENAME: M08AREV13 SEATING PLANE (1.04) DETAIL A SCALE: 2:1 Figure 39. 8-Lead Small Outline Integrated Circuit (SOIC) Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild's worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products. Always visit Fairchild Semiconductor's online packaging area for the most recent package drawings: http://www.fairchildsemi.com/packaging/. (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 18 FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers Physical Dimensions FAN3216 / FAN3217 -- Dual 2-A, High-Speed, Low-Side Gate Drivers (c) 2009 Fairchild Semiconductor Corporation FAN3216 / FAN3217 * Rev. 1.0.3 www.fairchildsemi.com 19 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor's product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. 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