5.7 kV rms, Signal Isolated, High Working Voltage,
CAN FD Transceiver with ±15kV IEC ESD
Data Sheet ADM3058E
Rev. A Document Feedback
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Tel: 781.329.4700 ©2020 Analog Devices, Inc. All rights reserved.
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FEATURES
5.7 kV rms signal isolated CAN FD transceiver
1500 V peak and dc working voltage to DIN VDE 0884-11
1.7 V to 5.5 V supply and logic side levels
4.5 V to 5.5 V supply on bus side
ISO 11898-2:2016-compliant CAN FD
Data rates up to 12 Mbps for CAN FD
Low maximum loop propagation delay: 155 ns
Extended common-mode range: ±25 V
Bus fault protection (CANH, CANL): ±40 V
ESD protection on the CANH and CANL bus pins
≥±8 kV IEC 61000-4-2 contact discharge
≥±15 kV IEC 61000-4-2 air discharge
Passes EN 55022, Class B by 6 dB
Safety and regulatory approvals (pending)
UL: 5700 V rms for 1-minute per UL 1577
CSA Component Acceptance 5A at 5.7 kV rms
IEC 60601 and IEC 61010
VDE Certificates of Conformity
DIN VDE V 0884-11 (VDE V 0884-11):2017-01
VIORM = 1500 V peak
High common-mode transient immunity: >50 kV/μs
Industrial operating temperature range: −40°C to +125°C
APPLICATIONS
CANOpen, DeviceNet, and other CAN bus implementations
Industrial automation
Process control and building control
Transport and infrastructure
FUNCTIONAL BLOCK DIAGRAM
DOMINANT
TIMEOUT
CAN
TRANSCEIVER
CANH
CANL
R
XD
TXD
GND
2
GND
1
ADM3058E
THERMAL
SHUTDOWN
DIGITAL ISOLATOR
V
DD1
V
DD2
20135-001
Figure 1.
GENERAL DESCRIPTION
The ADM3058E is a 5.7 kV rms isolated controller area
network (CAN) physical layer transceiver with a high perfor-
mance, basic feature set. The ADM3058E fully meets the CAN
flexible data rate (CAN FD) ISO 11898-2:2016 requirements and is
further capable of supporting data rates as high as 12 Mbps.
The device employs Analog Devices, Inc., iCoupler® technology
to combine a 2-channel isolator and a CAN transceiver into a
single small outline integrated circuit (SOIC) surface-mount
package. The ADM3058E is a fully isolated solution for CAN
and CAN FD applications. The ADM3058E provides isolation
between the CAN controller and physical layer bus. Safety and
regulatory approvals (pending) for a 5.7 kV rms withstand voltage
and a 1500 V peak working voltage ensure that the ADM3058E
meets application isolation requirements.
Low loop propagation delays and the extended common-mode
range of ±25 V support robust communication on longer bus
cables. Dominant timeout functionality protects against bus
lock up in a fault condition, and current limiting and thermal
shutdown features protect against output short circuits. The
CAN bus input and output pins are protected to ±40 V against
accidental connection to a +24 V bus supply. The device is fully
specified over the −40°C to +125°C industrial temperature range.
ADM3058E Data Sheet
Rev. A | Page 2 of 18
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications ...................................................................................... 1
Functional Block Diagram .............................................................. 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Specifications .................................................................................... 3
Timing Specifications .................................................................. 5
Insulation and Safety Related Specifications ............................ 6
Package Characteristics ............................................................... 6
Regulatory Information ............................................................... 6
DIN V VDE V 0884-11 (VDE V 0884-11) Insulation
Characteristics (Pending) ............................................................ 7
Absolute Maximum Ratings ........................................................... 8
Thermal Resistance ...................................................................... 8
Electrostatic Discharge (ESD) Ratings ...................................... 8
ESD Caution.................................................................................. 8
Pin Configuration and Function Descriptions ............................ 9
Typical Performance Characteristics ........................................... 10
Test Circuits .................................................................................... 12
Terminology .................................................................................... 13
Theory of Operation ...................................................................... 14
CAN Transceiver Operation .................................................... 14
Signal Isolation ........................................................................... 14
Integrated and Certified IEC Electromagnetic Compatibility
(EMC) Solution .......................................................................... 14
±40 V Miswire Protection ......................................................... 14
Dominant Timeout .................................................................... 14
Fail-Safe Features ....................................................................... 14
Thermal Shutdown .................................................................... 15
Applications Information ............................................................. 16
Radiated Emissions and PCB Layout ...................................... 16
PCB Layout ................................................................................. 16
Thermal Analysis ....................................................................... 16
Insulation Lifetime ..................................................................... 16
Surface Tracking ......................................................................... 16
Insulation Wear Out .................................................................. 16
Calculation and Use of Parameters Example ......................... 17
Outline Dimensions ....................................................................... 18
Ordering Guide .......................................................................... 18
REVISION HISTORY
8/2020—Rev. 0 to Rev. A
Changes to Data Sheet Title and Features Section ...................... 1
6/2020—Revision 0: Initial Version
Data Sheet ADM3058E
Rev. A | Page 3 of 18
SPECIFICATIONS
All voltages are relative to their respective ground, 1.7 V ≤ VDD1 ≤ 5.5 V, 4.5 V ≤ VDD2 ≤ 5.5 V, and −40°C ≤ TA ≤ +125°C, unless
otherwise noted. Typical specifications are at VDD1 = VDD2 = 5 V and TA = 25°C, unless otherwise noted.
Table 1.
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
SUPPLY CURRENT
Bus Side IDD2
Recessive State 5.3 7 mA TXD high, load resistance (RL) = 60 Ω
Dominant State 63 75 mA Limited by transmit dominant timeout (tDT),
see the Theory of Operation section, RL = 60 Ω
70% Dominant/30% Recessive Worst case, see the Theory of Operation section,
RL = 60 Ω
1 Mbps 45 58 mA
5 Mbps 49 60 mA
12 Mbps 58 65 mA
Logic Side iCoupler Current IDD1 5.5 mA TXD high, low, or switching
DRIVER
Differential Outputs See Figure 17
Recessive State Voltage TXD high, RL, and common-mode filter
capacitor (CF) open
CANH, CANL VCANL,
VCANH
2.0 3.0 V
Differential Output VOD −500 +50 mV
Dominant State Voltage TXD low, CF open
CANH VCANH 2.75 4.5 V 50 Ω ≤ RL ≤ 65 Ω
CANL VCANL 0.5 2.0 V 50 Ω ≤ RL ≤ 65 Ω
Differential Output VOD 1.5 3.0 V 50 Ω ≤ RL ≤ 65 Ω
1.4 3.3 V 45 Ω ≤ RL ≤ 70 Ω
1.5 5.0 V RL = 2240 Ω
Output Symmetry (VDD2 − VCANH to
VCANL)
VSYM −0.55 +0.55 V RL = 60 Ω, CF = 4.7 nF
Short-Circuit Current |ISC| RL open
Absolute
CANH 115 mA VCANH = −3 V
CANL 115 mA VCANL = 18 V
Steady State
CANH 115 mA VCANH = −24 V
CANL 115 mA VCANL = 24 V
Logic Input TXD
Input Voltage
High VIH 0.65 ×
VDD1
V
Low VIL
0.35 ×
VDD1
V
Complementary Metal-Oxide
Semiconductor (CMOS) Logic Input
Currents
|IIH|, |IIL| 10 μA Input high or low
RECEIVER
Differential Inputs
Differential Input Voltage Range VID
See Figure 18, RXD capacitance (CRXD) open,
−25 V < VCANL, VCANH < +25 V
Recessive −1.0 +0.5 V
Dominant 0.9 5.0 V
ADM3058E Data Sheet
Rev. A | Page 4 of 18
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
Input Voltage Hysteresis VHYS 150 mV
Unpowered Input Leakage Current |IIN (OFF)| 10 μA VCANH, VCANL = 5 V, VDD2 = 0 V
Input Resistance
CANH, CANL RINH, RINL 6 25 See Figure 21
Differential RDIFF 20 100 See Figure 20
Input Resistance Matching mR −0.03 +0.03 mR = 2 × (RINH − RINL)/(RINH + RINL)
Input Capacitance
CANH, CANL CINH, CINL 35 pF See Figure 21
Differential CDIFF 12 pF See Figure 20
Logic Output (RXD)
Output Voltage
Low VOL 0.2 0.4 V Output impedance (IOUT) = 2 mA
High VOH VDD1
0.2
V IOUT = −2 mA
Short-Circuit Current IOS 7 85 mA Output voltage (VOUT) = GND1 or VDD1
COMMON-MODE TRANSIENT IMMUNITY1 Common-mode voltage (VCM) ≥ 1 kV, transient
magnitude ≥ 800 V
Input High, Recessive |CMH| 50 100 kV/μs
Input voltage (VIN) = VDD1 (TXD) or CANH/CANL
recessive
Input Low, Dominant |CML| 50 100 kV/μs VIN = 0 V (TXD) or CANH/CANL dominant
1 |CMH| is the maximum common-mode voltage slew rate that can be sustained while maintaining CANH/CANL recessive or RXD ≥ VDD1 0.2 V. |CML| is the maximum
common-mode voltage slew rate that can be sustained while maintaining CANH/CANL dominant or RXD ≤ 0.4 V. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Data Sheet ADM3058E
Rev. A | Page 5 of 18
TIMING SPECIFICATIONS
All voltages are relative to their respective ground, 1.7 V ≤ VDD1 ≤ 5.5 V, 4.5 V ≤ VDD2 ≤ 5.5 V, and −40°C ≤ TA ≤ +125°C, unless
otherwise noted. Typical specifications are at VDD1 = VDD2 = 5 V and TA = 25°C, unless otherwise noted.
Table 2.
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
DRIVER See Figure 2 and Figure 17, tBIT_TXD1 = 200 ns, RL = 60 Ω,
load capacitance (CL) = 100 pF
Maximum Data Rate 12 Mbps
Propagation Delay from TXD to Bus
Recessive to Dominant tTXD_DOM 35 60 ns
Dominant to Recessive tTXD_REC 45 70 ns
Transmit Dominant Timeout tDT 1175 4000 μs TXD low, see Figure 3
RECEIVER See Figure 2 and Figure 19, tBIT_TXD = 200 ns, RL = 60 Ω,
CL = 100 pF, CRXD = 15 pF
Loop Propagation Delay
Falling Edge (TXD to RXD) tLOOP_FALL 155 ns
Rising Edge (TXD to RXD) tLOOP_RISE 155 ns
Loop Delay Symmetry (Minimum
Recessive Bit Width)
tBIT_RXD
2 Mbps 450 550 ns tBIT_TXD = 500 ns
5 Mbps 160 220 ns tBIT_TXD = 200 ns
8 Mbps 85 140 ns tBIT_TXD = 125 ns
12 Mbps 50 91.6 ns tBIT_TXD = 83.3 ns
1 tBIT_TXD is the bit time at the TXD pin as transmitted by the CAN controller.
Timing Diagrams
TXD
0.3VDD1 0.3VDD1
0.3VDD1
0.7
V
DD1
0.5V 0.9V
VDD1
VDD1
0V
0V
5 × tBIT_TXD
tTXD_REC tTXD_DOM
tBIT_BUS
tBIT_RXD
tBIT_TXD
tLOOP_FALL
tLOOP_RISE
RXD
V
OD/VID
0.7VDD1
20135-002
Figure 2. Transceiver Timing Diagram
TXD
V
OD
t
DT
20135-003
Figure 3. Dominant Timeout, tDT
ADM3058E Data Sheet
Rev. A | Page 6 of 18
INSULATION AND SAFETY RELATED SPECIFICATIONS
For additional information, see www.analog.com/icouplersafety.
Table 3.
Parameter Symbol Value Unit Test Conditions/Comments
Rated Dielectric Insulation Voltage 5700 V rms 1-minute duration
Minimum External Air Gap (Clearance) L (I01) 8.3 mm min Measured from input terminals to output terminals, shortest
distance through air
Minimum External Tracking (Creepage) L (I02) 8.3 mm min Measured from input terminals to output terminals, shortest
distance path along body
Minimum Clearance in the Plane of the
Printed Circuit Board (PCB) Clearance
L (PCB) 8.3 mm min Measured from input terminals to output terminals, shortest
distance through air, line of sight, in the PCB mounting plane
Minimum Internal Gap (Internal
Clearance)
40 μm min Insulation distance through insulation
Tracking Resistance (Comparative
Tracking Index)
CTI >600 V DIN IEC 112/VDE 0303 Part 1
Material Group I Material group (DIN VDE 0110, 1/89, Table 1)
PACKAGE CHARACTERISTICS
Table 4.
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
Resistance (Input to Output)1 R
I-O 1013 Ω
Capacitance (Input to Output)1 CI-O 0.9 pF f = 1 MHz
Input Capacitance2 C
I 4.0 pF
1 The device is considered a 2-terminal device: Pin 1 through Pin 4 are shorted together, and Pin 5 through Pin 8 are shorted together.
2 Input capacitance is from any input data pin to ground.
REGULATORY INFORMATION
See Table 10 and the Insulation Lifetime section for the recommended maximum working voltages for specific cross isolation waveforms
and insulation levels. The ADM3058E is pending approval by the organizations listed in Table 5.
Table 5.
UL (Pending) CSA (Pending) VDE (Pending) CQC (Pending)
UL1577 Component
Recognition Program1
Approved under CSA Component
Acceptance Notice 5A
DIN V VDE V 0884-11
(VDE V 0884-11):2017-012
Certified under CQC11-
471543-2012
Single Protection, 5.7 kV rms
Isolation Voltage
CSA 60950-1-07+A1+A2 and
IEC 60950-1, second edition, +A1+A2:
Reinforced insulation,
1500 V peak, VIOTM = 8000 V
GB4943.1-2011
Basic insulation at 830 V rms (1137 V peak) Basic insulation at 830 V rms
(1137 V peak)
Reinforced insulation at 415 V rms
(587 V peak)
Reinforced insulation at
415 V rms (587 V peak)
IEC 60601-1 Edition 3.1:
Reinforced insulation (2 means of patient
protection (MOPP)), 261V rms (291 V dc)
CSA 61010-1-12 and IEC 61010-1 third edition:
Basic insulation at: 300 V rms mains, 830 V
secondary (1174 V peak)
Reinforced insulation at: 300 V rms mains,
415 V secondary (587 V peak)
File E214100 File 205078 File 2471900-4880-0001 File (pending)
1 In accordance with UL 1577, each ADM3058E is proof tested by applying an insulation test voltage ≥ 6840 V rms for 1 sec.
2 In accordance with DIN V VDE V 0884-11, each product is proof tested by applying an insulation test voltage ≥ 2813 V peak for 1 sec (partial discharge detection limit =
5 pC). The * marking branded on the component designates DIN V VDE V 0884-11 approval.
Data Sheet ADM3058E
Rev. A | Page 7 of 18
DIN V VDE V 0884-11 (VDE V 0884-11) INSULATION CHARACTERISTICS (PENDING)
These isolators are suitable for reinforced electrical isolation only within the safety limit data. Protective circuits ensure the maintenance
of the safety data.
Table 6. ADM3058E VDE Characteristics
Description Test Conditions/Comments Symbol Characteristic Unit
Installation Classification per DIN VDE 0110
For Rated Mains Voltage ≤ 150 V rms I to IV
For Rated Mains Voltage ≤ 300 V rms I to IV
For Rated Mains Voltage ≤ 600 V rms I to IV
Climatic Classification 40/125/21
Pollution Degree per DIN VDE 0110, Table
1
2
Maximum Working Insulation Voltage
Reinforced VIORM 1500 V peak
Basic, DC Working Voltage See the Absolute Maximum Ratings section and Table 10
for the maximum continuous working voltage for ac
bipolar, ac unipolar, and dc voltages, basic and
reinforced insulation, and 50-year lifetime to 1% failure
VIORM 1500 V peak
Input to Output Test Voltage, Method B1 VIORM × 1.875 = Vpd (m), 100% production test, tini = tm =
1 sec, partial discharge < 5 pC
Vpd (m) 2813 V peak
Input to Output Test Voltage, Method A Vpd (m)
After Environmental Tests Subgroup 1 VIORM × 1.5 = Vpd (m), tini = 60 sec, tm = 10 sec,
partial discharge < 5 pC
2250 V peak
After Input and/or Safety Test
Subgroup 2 and Subgroup 3
VIORM × 1.2 = Vpd (m), tini = 60 sec, tm = 10 sec,
partial discharge < 5 pC
1800 V peak
Highest Allowable Overvoltage VIOTM 8000 V peak
Impulse 1.2 μs rise time, 50 μs, 50% fall time in air to the
preferred sequence
VIMPULSE 8000 V peak
Surge Isolation Test Voltage Peak voltage (VPEAK) = 12.8 kV, 1.2 μs rise time, 50 μs, and
50% fall time
VIOSM 8000 V peak
Safety Limiting Values Maximum value allowed in the event of a failure (see
Figure 4)
Maximum Junction Temperature TS 150 °C
Total Power Dissipation at 25°C PS 1.28 W
Insulation Resistance at TS Test voltage = 500 V RS >109 Ω
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
0 50 100 150 200
SAFE LIMITING POWER (W)
AMBIENT TEMPERATURE (°C)
20135-004
Figure 4. Thermal Derating Curve, Dependence of Safety Limiting Values
with Ambient Temperature per DIN V VDE V 0884-11 (See the Thermal
Resistance Section for Additional Information)
ADM3058E Data Sheet
Rev. A | Page 8 of 18
ABSOLUTE MAXIMUM RATINGS
Pin voltages with respect to GND1/GND2 are on same side,
unless otherwise noted.
Table 7.
Parameter Rating
VDD1, VDD2 −0.5 V to +6 V
Logic Side Input and Output: TXD, RXD −0.5 V to VDD1 + 0.5 V
CANH, CANL −40 V to +40 V
Temperature
Industrial Operating Range −40°C to +125°C
Storage Range −65°C to +150°C
Maximum Junction (TJ) 150°C
Moisture Sensitivity Level (MSL) 3
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
THERMAL RESISTANCE
Thermal performance is directly linked to PCB design and
operating environment. Careful attention to PCB thermal
design is required.
θJA is the natural junction to ambient thermal resistance
measured in a one cubic foot sealed enclosure.
Table 8. Thermal Resistance
Package Type1 θ
JA Unit
RI-8-1 97 °C/W
1 The thermocouple is located at the center of the package underside, and the
test was conducted on a 4-layer board with thin traces. See the Thermal
Analysis section for the thermal model definitions.
ELECTROSTATIC DISCHARGE (ESD) RATINGS
The following ESD information is provided for handling of
ESD sensitive devices in an ESD protected area only.
Human body model (HBM) per ANSI/ESDA/JEDEC JS-001.
International Electrotechnical Commission (IEC) electromagnetic
compatibility: Part 4-2 (IEC) per IEC 61000-4-2.
ESD Ratings for ADM3058E
Table 9. ADM3058E, 8-Lead SOIC_IC
ESD Model Withstand Threshold (V) Class
HBM1 ±4 kV 3A
IEC2 ±8 kV (across isolation barrier with
respect to GND1
Level 4
IEC3 ±8 kV (contact discharge with respect to
GND2)
Level 4
±15 kV (air discharge with respect to
GND2
Level 4
1 All pins, 1.5 kΩ, 100 pF.
2 Across the isolation barrier, GND2 to GND1.
3 CANH/CANL.
ESD CAUTION
Table 10. Maximum Continuous Working Voltage1
Parameter Insulation Rating (20-Year Lifetime)2 VDE 0884-11 Lifetime Conditions Fulfilled
AC Voltage
Bipolar Waveform
Reinforced Insulation 1060 V peak Lifetime limited by insulation lifetime per VDE-0884-11
DC Voltage
Basic Insulation 1660 V peak Lifetime limited by package creepage per IEC 60664-1
Reinforced Insulation 830 V peak Lifetime limited by package creepage per IEC 60664-1
1 The maximum continuous working voltage refers to the continuous voltage magnitude imposed across the isolation barrier. See the Insulation Lifetime section for
more details.
2 Insulation capability without regard to creepage limitations. Working voltage may be limited by the PCB creepage when considering rms voltages for components
soldered to a PCB (assumes Material Group I up to 1250 V rms), or by the SOIC_IC package creepage of 8.3 mm, when considering rms voltages for Material Group II.
Data Sheet ADM3058E
Rev. A | Page 9 of 18
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
V
DD1 1
TXD
2
RXD
3
GND
14
V
DD2
8
CANH
7
CANL
6
GND
2
5
20135-005
ADM3058E
(Not to Scale)
TOP VIEW
Figure 5. Pin Configuration
Table 11. Pin Function Descriptions
Pin No. Mnemonic Description
1 VDD1 Power Supply, Logic Side, 1.7 V to 5.5 V. VDD1 requires a 0.1 μF decoupling capacitor.
2 TXD Driver Input Data.
3 RXD Receiver Output Data.
4 GND1 Ground, Logic Side.
5 GND2 Ground, Bus Side.
6 CANL CAN Low Input and Output.
7 CANH CAN High Input and Output.
8 VDD2 Power Supply, Bus Side, 4.5 V to 5.5 V. VDD2 requires a 0.1 μF decoupling capacitor.
Table 12. Operational Truth Table
VDD1 V
DD2 TXD Mode RXD CANH or CANL
On On Low Normal Low Dominant (limited by tDT)
On On High Normal High per bus Recessive and set by bus
Off On Don’t care Normal Indeterminate Recessive and set by bus
On Off Don’t care Transceiver off High High-Z
ADM3058E Data Sheet
Rev. A | Page 10 of 18
TYPICAL PERFORMANCE CHARACTERISTICS
25
30
35
40
45
50
55
60
0123456789101112131415
SUPPLY CURRENT, I
DD2
(mA)
DATA RATE (Mbps)
V
DD2
= 4.5V
V
DD2
= 5V
V
DD2
= 5.5V
20135-007
Figure 6. Supply Current (IDD2) vs. Data Rate
80
90
100
110
120
130
140
150
160
170
180
–55 –35 –15 5 25 45 65 85 105 125
RECEIVER INPUT HYSTERESIS (mV)
TEMPERATURE (°C)
20135-008
Figure 7. Receiver Input Hysteresis vs. Temperature
27
29
31
33
35
37
39
41
43
45
–55 –35 –15 5 25 45 65 85 105 125
t
TXD_DOM
(ns)
TEMPERATURE C)
V
DD1
= 5.0V
V
DD1
= 3.3V
V
DD1
= 2.5V
V
DD1
= 1.8V
20135-009
Figure 8. tTXD_DOM vs. Temperature
–55 –35 –15 5 25 45 65 85 105 125
TEMPERATURE C)
39
41
43
45
47
49
51
53
t
TXD_REC
(ns)
V
DD1
= 1.8V
V
DD1
= 2.5V
V
DD1
= 3.3V
V
DD1
= 5.0V
20135-010
Figure 9. tTXD_REC vs. Temperature
–55 –35 –15 5 25 45 65 85 105 125
TEMPERATURE C)
t
LOOP_RISE (ns)
100
105
110
115
120
125
130
135
VDD1 = 1.8V
VDD1 = 2.5V
VDD1 = 3.3V
VDD1 = 5.0V
20135-011
Figure 10. tLOOP_RISE vs. Temperature
–55 –35 –15 5 25 45 65 85 105 125
TEMPERATURE C)
tLOOP_FALL
(ns)
100
105
110
115
120
125
V
DD1
= 1.8V
V
DD1
= 2.5V
V
DD1
= 3.3V
V
DD1
= 5.0V
20135-012
Figure 11. tLOOP_FALL vs. Temperature
Data Sheet ADM3058E
Rev. A | Page 11 of 18
2.14
2.16
2.18
2.20
2.22
2.24
2.26
2.28
2.30
2.32
2.34
–55 –5 45 95
DIFFERENTI
A
L OUTPUT V
O
LTAGE (V)
TEMPERATURE (°C)
20135-013
Figure 12. Differential Output Voltage vs. Temperature, RL = 60 Ω
1.5
1.7
1.9
2.1
2.3
2.5
2.7
4.5 4.7 4.9 5.1 5.3 5.5
DIFFERENTIAL OUTPUT VOLTAGE (V)
SUPPLY VOLTAGE, V
DD2
(V)
20135-014
Figure 13. Differential Output Voltage vs. Supply Voltage (VDD2), RL = 60 Ω
1.4
1.6
1.8
2.0
2.2
2.4
2.6
2.8
–55 –35 –15 5 25 45 65 85 105 125
SUPPLY CURRENT, I
DD1
(mA)
TEMPERATURE (°C)
V
DD1
= 1.8V
V
DD1
= 2.5V
V
DD1
= 3.3V
V
DD1
= 5.0V
20135-015
Figure 14. Supply Current (IDD1) vs. Temperature
–55 –35 –15 5 25 45 65 85 105 125
TEMPERATURE C)
32.5
33.0
33.5
34.0
34.5
35.0
35.5
36.0
SUPPLY CURRENT, IDD2 (mA)
20135-016
Figure 15. Supply Current (IDD2) vs. Temperature
2100
2200
2300
2400
2500
2600
2700
2800
2900
–55 –35 –15 5 25 45 65 85 105 125
DOMINANT TIMEOUT,
t
DT
(µs)
TEMPERATUREC)
20135-017
Figure 16. Dominant Timeout (tDT) vs. Temperature
ADM3058E Data Sheet
Rev. A | Page 12 of 18
TEST CIRCUITS
T
XD
C
F
GND
1
GND
2
V
OD
V
CANH
V
CANL
R
L
R
L
2
2
20135-018
Figure 17. Driver Voltage Measurement
CRXD
RXD
GND1GND2
CANH
CANL
VID
20135-019
Figure 18. Receiver Voltage Measurement
C
RXD
RXD
GND
1
GND
2
TXD
CANH
R
L
C
L
CANL
NOTES
1. 1% TOLERANCE FOR ALL RESISTORS AND CAPACITORS.
20135-020
Figure 19. Switching Characteristics Measurements
R
DIFF
C
DIFF
GND
2
CANH
CANL
20135-021
Figure 20. RDIFF and CDIFF Measured in Recessive State, Bus Disconnected
R
INH
C
INH
R
INL
C
INL
GND
2
CANH
CANL
20135-022
Figure 21. Input Resistance (RINx) and Input Capacitance (CINx) Measured in
Recessive State, Bus Disconnected
Data Sheet ADM3058E
Rev. A | Page 13 of 18
TERMINOLOGY
IDD1
IDD1 is the current drawn by the VDD1 pin.
IDD2
IDD2 is the current drawn by the VDD2 pin.
VOD and VID
VOD and VID are the differential voltages from the transmitter or
at the receiver on the CANH and CANL pins.
tTXD_DOM
tTXD_DOM is the propagation delay from a low signal on TXD to
transition the bus to a dominant state.
tTXD_REC
tTXD_REC is the propagation delay from a high signal on TXD to
transition the bus to a recessive state.
tLOOP_FALL
tLOOP_FALL is the propagation delay of a low signal on the TXD pin to
the bus dominant. tLOOP_FALL transitions low on the RXD pin.
tLOOP_RISE
tLOOP_RISE is the propagation delay of a high signal on TXD to the
bus recessive. tLOOP_RISE transitions high on the RXD pin.
tBIT_TXD
tBIT_TXD is the bit time at the TXD pin as transmitted by the CAN
controller. See Figure 2 for level definitions.
tBIT_BUS
tBIT_BUS is the bit time as transmitted by the transceiver to the
bus. When compared with a given tBIT_TXD, a measure of bit
symmetry from the TXD digital isolation channel and CAN
transceiver can be determined. See Figure 2 for level definitions.
tBIT_RXD
tBIT_RXD is the bit time on the RXD output pin, which can be
compared with tBIT_TXD for a round trip measure of pulse width
distortion through the TXD digital isolation channel, the CAN
transceiver, and back through the RXD isolation channel.
ADM3058E Data Sheet
Rev. A | Page 14 of 18
THEORY OF OPERATION
CAN TRANSCEIVER OPERATION
The ADM3058E facilitates communication between a CAN
controller and the CAN bus. The CAN controller and the
ADM3058E communicate with standard 1.8 V, 2.5 V, 3.3 V,
or 5.0 V CMOS levels. The internal transceiver translates the
CMOS levels to and from the CAN bus.
The CAN bus has two states: dominant and recessive. The
recessive state is present on the bus when the differential voltage
between CANH and CANL is less than 0.5 V. In the recessive
state, both the CANH pin and CANL pin are set to high
impedance and are loosely biased to a single-ended voltage of
2.5 V. A dominant state is present on the bus when the
differential voltage between CANH and CANL is greater than
1.5 V. The transceiver transmits a dominant state by driving the
single-ended voltage of the CANH line to 3.5 V and the CANL
pin to 1.5 V. The recessive and dominant states correspond to
CMOS high and CMOS low, respectively, on the RXD pin and
TXD pin.
A dominant state from another node overwrites a recessive
state on the bus. A CAN frame can be set for higher priority by
using a longer string of dominant bits to gain control of the
CAN bus during the arbitration phase. While transmitting, a
CAN transceiver also reads back the state of the bus. When a
CAN controller receives a dominant state while transmitting a
recessive state during arbitration, the CAN controller surrenders
the bus to the node still transmitting the dominant state. The node
that gains control during the arbitration phase reads back only
its own transmission. This interaction between recessive and
dominant states allows competing nodes to negotiate for
control of the bus while avoiding contention between nodes.
Industrial applications can have long cable runs. These long
runs may have differences in local earth potential. Different
sources may also power nodes. The ADM3058E transceiver
has a ±25 V common-mode range (CMR) that exceeds the
ISO11898-2 requirement and further increases the tolerance
to ground variation.
See the AN-1123 Application Note for additional information
on CAN.
SIGNAL ISOLATION
The ADM3058E device provides galvanic signal isolation imple-
mented on the logic side of the interface. The RXD and TXD
channels are isolated using a low propagation delay on/off
keying (OOK) architecture with iCoupler digital isolation
technology.
The low propagation delay isolation, quick transceiver
conversion speeds, and integrated form factor are critical for
longer cable lengths, higher data speeds, and reducing the total
solution board space. The ADM3058E isolated transceiver
reduces solution board space while increasing data transfer
rates over discrete optocoupler and transceiver solutions.
INTEGRATED AND CERTIFIED IEC
ELECTROMAGNETIC COMPATIBILITY (EMC)
SOLUTION
Typically, designers must add protections against harsh operating
environments while also making the product as small as possible.
To reduce the board space and the design efforts needed to meet
system level ESD standards, the ADM3058E isolated transceiver
has robust protection circuitry on chip for the CANH and
CANL lines.
±40 V MISWIRE PROTECTION
High voltage miswire events commonly occur when the system
power supply is connected directly to the CANH and the CANL
bus lines during assembly. Supplies can also be shorted by
accidental damage to the field bus cables while the system is
operating. Accounting for inductive kick and switching effects,
the ADM3058E isolated transceiver CAN bus lines are protected
against these miswire or shorting events in systems with up to
nominal 24 V supplies. The CANH and CANL signal lines can
withstand a continuous supply short with respect to GND2 or
between the CAN bus lines without damage. This level of
protection applies when the device is either powered or
unpowered.
DOMINANT TIMEOUT
The ADM3058E features a dominant timeout (tDT in Figure 3). A
TXD line shorted to ground or malfunctioning CAN controller
are examples of how a single node can indefinitely prevent further
bus traffic. tDT limits how long the dominant state can transmit
to the CAN bus by the transceiver. The TXD function restores
when the line is presented with a logic low.
The tDT minimum also inherently creates a minimum data rate.
Under normal operation, the CAN protocol allows five consecutive
bits of the same polarity before stuffing a bit of opposite polarity
into the transmitting bit sequence. When an error is detected, the
CAN controller purposely violates the bit stuffing rules by
producing six consecutive dominant bits. At any given data rate,
the CAN controller must transmit as many as 11 consecutive
dominant bits to effectively limit the ADM3058E minimum
data rate to 9600 bps.
FAIL-SAFE FEATURES
In cases where the TXD input pin is allowed to float to prevent
bus traffic interruption, the TXD input channel has an internal
pull-up to the VDD1 pin. The pull-up holds the transceiver in the
recessive state.
Data Sheet ADM3058E
Rev. A | Page 15 of 18
THERMAL SHUTDOWN
The integrated transceiver is designed with thermal shutdown
circuitry to protect the device from excessive power dissipation
during fault conditions. Shorting the driver outputs to a low
impedance source can result in high driver currents. The thermal
sensing circuitry detects the increase in die temperature under
this condition and disables the driver outputs. The circuitry
disables the driver outputs when the die temperature reaches
175°C. The drivers are enabled after the die has cooled.
ADM3058E Data Sheet
Rev. A | Page 16 of 18
APPLICATIONS INFORMATION
RADIATED EMISSIONS AND PCB LAYOUT
The ADM3058E isolated CAN transceivers with integrated
dc-to-dc converters pass EN 55022, Class B by 6 dB on a simple
2-layer PCB design. Neither stitching capacitance nor high
voltage surface-mount technology (SMT) safety capacitors are
required to meet this emission level.
PCB LAYOUT
The ADM3058E isolated CAN transceiver requires no external
interface circuitry for the logic interfaces. Power supply
bypassing is required at the logic input supply (VDD1), and the
shared CAN transceiver and digital isolator supply pin (VDD2).
The recommended bypass capacitor value is 0.1 μF. Note that
low effective series resistance (ESR) bypass capacitors are
required and must be placed as close to the chip pads as possible.
The total lead length between both ends of the capacitor and
the input power supply pin must not exceed 10 mm.
In applications involving high common-mode transients,
minimize board coupling across the isolation barrier. Design
the board layout so that any coupling that does occur equally
affects all pins on a given component side. Failure to ensure this
equal coupling can cause voltage differences between pins
exceeding the absolute maximum ratings of the device, thereby
leading to latch-up or permanent damage.
0.1µ
F
0.1µ
F
1
TXD2
RXD3
GND1
4
VDD1 VDD2 8
CANH 7
CANL 6
GND25
20135-023
ADM3058E
Figure 22. Recommended PCB Layout
THERMAL ANALYSIS
The ADM3058E device consists of three internal die attached to a
split lead frame. For the purposes of thermal analysis, the die are
treated as a thermal unit, with the highest junction temperature
reflected in the θJA value from Table 8. The θJA value is based on
measurements taken with the devices mounted on a JEDEC
standard, 4-layer board with fine width traces and still air.
INSULATION LIFETIME
All insulation structures eventually break down when subjected
to voltage stress over a sufficiently long period of time. The rate
of insulation degradation is dependent on the characteristics of
the voltage waveform applied across the insulation as well as on
the materials and material interfaces.
The two types of insulation degradation of primary interest are
breakdown along surfaces exposed to air and insulation wear
out. Surface breakdown is the phenomenon of surface tracking
and is the primary determinant of surface creepage
requirements in system level standards. Insulation wear out
is the phenomenon where charge injection or displacement
currents inside the insulation material cause long-term
insulation degradation.
SURFACE TRACKING
Surface tracking is addressed in electrical safety standards by
setting a minimum surface creepage based on the working
voltage, the environmental conditions, and the properties of the
insulation material. Safety agencies perform characterization
testing on the surface insulation of components, allowing the
components to be categorized in different material groups.
Lower material group ratings are more resistant to surface
tracking and can therefore provide adequate lifetime with
smaller creepage. The minimum creepage for a given working
voltage and material group is in each system level standard and
is based on the total rms voltage across the isolation, pollution
degree, and material group.
The material group and creepage for the ADM3058E isolator is
listed in Table 3 for the 8-lead, wide body SOIC package.
INSULATION WEAR OUT
The lifetime of insulation caused by wear out is determined by
its thickness, material properties, and the voltage stress applied.
It is important to verify that the product lifetime is adequate at
the application working voltage. The working voltage supported by
an isolator for wear out may not be the same as the working
voltage supported for tracking. The working voltage applicable
to tracking is specified in most standards.
Testing and modeling have shown that the primary driver of
long-term degradation is displacement current in the polyimide
insulation causing incremental damage. The stress on the
insulation can be broken down into broad categories, such as
dc stress, which causes little wear out because there is no
displacement current, and an ac component time varying voltage
stress, which causes wear out.
The ratings in certification documents are usually based on
60 Hz sinusoidal stress because this reflects isolation from line
voltage. Many practical applications have combinations of 60 Hz
ac and dc across the barrier, as shown in Equation 1. Because
only the ac portion of the stress causes wear out, the equation
can be rearranged to solve for the ac rms voltage, as shown in
Equation 2. For insulation wear out with the polyimide materials
used in this product, the ac rms voltage determines the product
lifetime.
22
RMS AC RMS DC
VV V
(1)
or
22
DCRMSRMSAC VVV
(2)
where:
VRMS is the total rms working voltage.
VAC RMS is the time varying portion of the working voltage.
VDC is the dc offset of the working voltage.
Data Sheet ADM3058E
Rev. A | Page 17 of 18
CALCULATION AND USE OF PARAMETERS
EXAMPLE
The following example frequently arises in power conversion
applications. Assume that the line voltage on one side of the
isolation is 240 V ac rms and a 400 V dc bus voltage is present
on the other side of the isolation barrier. The isolator material
is polyimide. To establish the critical voltages in determining
the creepage, clearance, and lifetime of a device, see Figure 23
and the following equations.
ISOLATION VOLTAGE
TIME
V
AC RMS
V
RMS
V
DC
V
PEAK
20135-024
Figure 23. Critical Voltage Example
The working voltage across the barrier from Equation 1 is
22
RMS AC RMS DC
VV V
22 400240
RMS
V
VRMS = 466 V
This VRMS value is the working voltage used together with the
material group and pollution degree when looking up the creepage
required by a system standard.
To determine if the lifetime is adequate, obtain the time varying
portion of the working voltage. To obtain the ac rms voltage,
VAC RMS, use Equation 2.
22
DCRMSRMSAC VVV
22 400466
RMSAC
V
VAC RMS = 240 V rms
In this case, VAC RMS is simply the line voltage of 240 V rms. This
calculation is more relevant when the waveform is not sinusoidal.
The value is compared to the limits for working voltage in Table 10
for the expected lifetime, which is less than a 60 Hz sine wave,
and is well within the limit for a 50-year service life.
Note that the dc working voltage limit is set by the creepage of
the package as specified in IEC 60664-1. This value can differ
for specific system level standards.
ADM3058E Data Sheet
Rev. A | Page 18 of 18
OUTLINE DIMENSIONS
09-17-2014-B
85
4
1
SEATING
PLANE
COPLANARITY
0.10
1.27 BSC
1.04
BSC
6.05
5.85
5.65
7.60
7.50
7.40
2.65
2.50
2.35
0.75
0.58
0.40
0.30
0.20
0.10
2.45
2.35
2.25
10.51
10.31
10.11
0.51
0.41
0.31
PIN 1
MARK
0.33
0.27
0.20
0.75
0.50
0.25
45°
Figure 24. 8-Lead Standard Small Outline Package, with Increased Creepage [SOIC_IC]
Wide Body
(RI-8-1)
Dimensions shown in millimeters
ORDERING GUIDE
Model1 Temperature Range Package Description Package Option
ADM3058EBRIZ −40°C to +125°C 8-Lead Standard Small Outline Package [SOIC_IC] RI-8-1
ADM3058EBRIZ-RL −40°C to +125°C 8-Lead Standard Small Outline Package [SOIC_IC] RI-8-1
EVAL-ADM3058EEBZ Evaluation Board
1 Z = RoHS Compliant Part.
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registered trademarks are the property of their respective owners.
D20135-8/20(A)