INCH-POUND MIL-M-38510/10D 16 February 2005 SUPERSEDING MIL-M-38510/10C 3 March 1986 MILITARY SPECIFICATION MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, DECODERS MONOLITHIC SILICON Inactive for new design after 7 September 1995. This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535 1. SCOPE 1.1 Scope. This specification covers the detail requirements for monolithic silicon, TTL, microcircuit decoders. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.4). 1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535. 1.2.1 Device types. The device types are as follows: Device type 01 02 03 04 05 06 07 08 09 Circuit BCD-to-decimal decoder Excess-3-to-decimal decoder Excess-3-gray-to-decimal decoder BCD-to-decimal decoder/driver (30 volt, open collector output) BCD-to-decimal decoder/driver (15 volt, open collector output) BCD-to-seven segment decoder/driver (30 volt, open collector output) BCD-to-seven segment decoder/driver (15 volt, open collector output) BCD-to-seven segment decoder/driver BCD-to-seven segment decoder/driver (5.5 volt, open collector output) 1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535. 1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style A B C D E F GDFP5-F14 or CDFP6-F14 GDFP4-F14 GDIP1-T14 or CDIP2-T14 GDFP1-F14 or CDFP2-F14 GDIP1-T16 or CDIP2-T16 GDFP2-F16 or CDFP3-F16 14 14 14 14 16 16 Flat pack Flat pack Dual-in-line Flat pack Dual-in-line Flat pack Comments, suggestions, or questions on this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to bipolar@dscc.dla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at http://assist.daps.dla.mil. AMSC N/A FSC 5962 MIL-M-38510/10D 1.3 Absolute maximum ratings. Supply voltage range .............................................................................. Input voltage range ................................................................................. Storage temperature range .................................................................... Maximum power dissipation (PD): 1/ Device types 01, 02 and 03 .............................................................. Device types 04 and 05 .................................................................... Device types 06, 07, 08 and 09 ........................................................ Lead temperature (soldering, 10 seconds) ....................................... Thermal resistance, junction to case (JC): Cases A, B, C, D, E and F ................................................................ Junction temperature (TJ) 2/ ................................................................... Maximum current into any output (output off): Device types 04, 05, 06, 07 and 09 .................................................. -0.5 V dc to +7.0 V dc -1.5 V dc at -12 mA to +5.5 V dc -65 to +150C 226 mW 341 mW 467 mW +300C (See MIL-STD-1835) 175C 1 mA 1.4 Recommended operating conditions. Supply voltage (VCC) ............................................................................... 4.5 V dc minimum to 5.5 V dc maximum Minimum high level input voltage (VIH) ................................................... 2.0 V dc Maximum low level input voltage (VIL) .................................................... 0.8 V dc Sink current capability by device type: Device types 01, 02, 03 .................................................................... 16 mA Device types 04, 05 .......................................................................... 20 mA Device types 06, 07 Outputs A - G ............................................................................. 40 mA BI/RBO node .............................................................................. 8 mA Device type 08 Outputs A - G ............................................................................. 6.4 mA BI/RBO node .............................................................................. 8 mA Device type 09 .................................................................................. 10 mA Case operating temperature range (TC) ................................................. -55 to +125C 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. _______ 1/ Must withstand the added PD due to short-circuit test (e.g., IOS). 2/ Maximum junction temperature should not be exceeded except in accordance with allowable short duration burn-in screening condition in accordance with MIL-PRF-38535. 2 MIL-M-38510/10D 2.2 Government documents. 2.2.1 Specifications and standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard for Microelectronics. Interface Standard Electronic Component Case Outlines (Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and 6.3). 3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. This slash sheet has been modified to allow the manufacturer to use the alternate die/fabrication requirements of paragraph A.3.2.2 of MIL-PRF-38535 or other alternative approved by the qualifying activity. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein. 3.3.1 Case outlines. The case outlines shall be as specified in 1.2.3. 3.3.2 Logic diagrams and terminal connections. The logic diagrams and terminal connections shall be as specified on figures 1 and 2. 3.3.3 Truth tables. The truth tables shall be as specified on figure 3. 3.3.4 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity upon request. 3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6). 3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and apply over the full recommended case operating temperature range, unless otherwise specified. 3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III. 3 MIL-M-38510/10D TABLE I. Electrical performance characteristics, device types 01, 02 and 03. Test Symbol Conditions -55C TC +125C unless otherwise specified High level output voltage VOH VCC = 4.5 V, IOH = -0.8 mA Low level output voltage VOL VCC = 4.5 V, IOL = 16 mA, Limits Min Unit Max 2.4 V 0.4 V -1.5 V -1.6 mA VIN = 0.8 V and 2.0 V Input clamp voltage VI C VCC = 4.5 V, IIN = -12 mA Low level input current IIL VCC = 5.5 V, VIN = 0.4 V 1/ High level input current IIH1 VCC = 5.5 V, VIN = 2.4 V 2/ 40 A IIH2 VCC = 5.5 V, VIN = 5.5 V 2/ 100 A Short circuit output current IOS VCC = 5.5 V 3/ -55 mA Supply current ICC VCC = 5.5 V, VIN = 0 V 41 mA Propagation delay time through tPHL 5 39 ns 5 39 ns tPHL 5 46 ns tPLH 5 46 ns -20 RL = 390 5% two logic levels Propagation delay time through CL = 50 pF minimum, -0.7 tPLH (Figure 4) two logic levels Propagation delay time through three logic levels Propagation delay time through three logic levels 1/ All unspecified inputs at 5.5 volts. 2/ All unspecified inputs grounded. 3/ Not more than one output should be shorted at one time. 4 MIL-M-38510/10D TABLE I. Electrical performance characteristics, device types 04 and 05. Test Symbol Conditions -55C TC +125C unless otherwise specified Limits Min Unit Max Low level output voltage VOL1 VCC = 4.5 V, IOL = 80 mA 0.9 V Low level output voltage VOL2 VCC = 4.5 V, IOL = 20 mA 0.4 V Input clamp voltage VI C VCC = 4.5 V, IIN = -12 mA -1.5 V Maximum collector cut-off current ICEX VCC = 4.5 V, VOH = max 1/ Low level input current IIL VCC = 5.5 V, VIN = 0.4 V 2/ High level input current IIH1 Supply current mA VCC = 5.5 V, VIN = 2.4 V 3/ 40 A IIH2 VCC = 5.5 V, VIN = 5.5 V 3/ 100 A ICC VCC = 5.5 V, VIN = 0 V 62 mA 5 73 ns 5 73 ns CL = 50 pF minimum, -0.7 A -1.6 Propagation delay time to a high tPLH RL = 390 5% logic level Propagation delay time to a low 250 tPHL (Figure 5) logic level 1/ Device type 04 maximum VOH = 30 V. Device type 05 maximum VOH = 15 V. 2/ All unspecified inputs at 5.5 volts. 3/ All unspecified inputs grounded. 5 MIL-M-38510/10D TABLE I. Electrical performance characteristics, device types 06 and 07. Test Symbol Conditions -55C TC +125C unless otherwise specified Limits Min Unit Max Low level output voltage 1/ VOL1 VCC = 4.5 V, IOL = 40 mA 0.4 V Low level output voltage 2/ VOL2 VCC = 4.5 V, IOL = 8 mA 0.4 V Input clamp voltage VI C VCC = 4.5 V, IIN = -12 mA -1.5 V High level output voltage 2/ VOH VCC = 4.5 V, IOH = -0.2 mA Maximum collector cut-off current 3/ ICEX VCC = 4.5 V, VOH = max 3/ Low level input current 4/ IIL1 VCC = 5.5 V, VIN = 0.4 V 5/ -0.4 -1.6 mA Low level input current 2/ IIL2 VCC = 5.5 V, VIN = 0.4 V 5/ -1.7 -4.2 mA High level input current 4/ IIH1 VCC = 5.5 V, VIN = 2.4 V 6/ 40 A IIH2 VCC = 5.5 V, VIN = 5.5 V 6/ 100 A Short circuit output current 1/ IOS VCC = 5.5 V 6/ -4 mA Supply current ICC VCC = 5.5 V, VIN = 5.5 V 85 mA 8 144 ns 8 144 ns 8 144 ns 8 144 ns Propagation delay time from any tPLH V 250 A RL = 120 5% 1/ input except RBI to any output Propagation delay time from CL = 50 pF minimum, 2.4 tPLH RBI to any output RL = 560 5% 2/ (Figure 6) Propagation delay time from any tPHL input except RBI to any output Propagation delay time from tPHL RBI to any output 1/ Outputs A through G only. 2/ BI/RBO node only. 3/ Device type 06 maximum VOH = 30 V. Device type 07 maximum VOH = 15 V. 4/ Any input except BI/RBO node. 5/ All unspecified inputs at 5.5 volts. 6/ All unspecified inputs grounded. 6 MIL-M-38510/10D TABLE I. Electrical performance characteristics, device types 08. Test Symbol Conditions -55C TC +125C unless otherwise specified Limits Min Unit Max High level output voltage 1/ VOH1 VCC = 4.5 V, IOH = -0.4 mA 2.4 V High level output voltage 2/ VOH2 VCC = 4.5 V, IOH = -0.2 mA 2.4 V Low level output voltage 1/ VOL1 VCC = 4.5 V, IOL = 6.4 mA 0.4 V Low level output voltage 2/ VOL2 VCC = 4.5 V, IOL = 8 mA 0.4 V Input clamp voltage VI C VCC = 4.5 V, IIN = -12 mA -1.5 V Low level input current 3/ IIL1 VCC = 5.5 V, VIN = 0.4 V 4/ -0.4 -1.6 mA Low level input current 3/ IIL2 VCC = 5.5 V, VIN = 0.4 V 4/ -1.7 -4.2 mA High level input current 3/ IIH1 VCC = 5.5 V, VIN = 2.4 V 5/ 40 A IIH2 VCC = 5.5 V, VIN = 5.5 V 5/ 100 A Short circuit output current IOS VCC = 5.5 V -4 mA Supply current ICC VCC = 5.5 V, VIN = 0 V 76 mA 8 144 ns 8 144 ns 8 144 ns 8 144 ns Propagation delay time from any tPLH RL = 750 5% 1/ input except RBI to any output Propagation delay time from CL = 50 pF minimum, tPLH RBI to any output RL = 560 5% 2/ (Figure 7) Propagation delay time from any tPHL input except RBI to any output Propagation delay time from tPHL RBI to any output 1/ 2/ 3/ 4/ 5/ Outputs A through G only. BI/RBO node only. Any input except BI/RBO node. All unspecified inputs at 5.5 volts. All unspecified inputs grounded. 7 MIL-M-38510/10D TABLE I. Electrical performance characteristics, device types 09. Test Symbol Conditions -55C TC +125C unless otherwise specified Limits Min Unit Max Low level output voltage VOL VCC = 4.5 V, IOL = 10 mA 0.4 V Input clamp voltage VI C VCC = 4.5 V, IIN = -12 mA -1.5 V Maximum collector cut-off current ICEX VCC = 4.5 V, VOH = 5.5 V Low level input current IIL VCC = 5.5 V, VIN = 0.4 V 1/ High level input current IIH1 250 -1.6 mA VCC = 5.5 V, VIN = 2.4 V 2/ 40 A IIH2 VCC = 5.5 V, VIN = 5.5 V 2/ 100 A Supply current ICC VCC = 5.5 V, VIN = 0 V 47 mA Propagation delay time from any tPLH CL = 50 pF minimum, 8 144 ns 8 144 ns RL = 470 5% input to any output Propagation delay time from any -0.4 A tPHL (Figure 8) input to any output 1/ All unspecified inputs at 5.5 volts. 2/ All unspecified inputs grounded. 8 MIL-M-38510/10D TABLE II. Electrical test requirements. Subgroups (see table III) Class S Class B devices devices 1 1 MIL-PRF-38535 test requirements Interim electrical parameters Final electrical test parameters Group A test requirements Group B electrical test parameters when using the method 5005 QCI option Group C end-point electrical parameters Group D end-point electrical parameters 1*, 2, 3, 7 9, 10, 11 1, 2, 3, 7, 8 9, 10, 11 1, 2, 3, 9, 10, 11 1, 2, 3, 9, 10, 11 1, 2, 3 1*, 2, 3, 7, 9 1, 2, 3, 7, 8, 9, 10, 11 N/A 1, 2, 3 1, 2, 3 *PDA applies to subgroup 1. 3.7 Marking. Marking shall be in accordance with MIL-PRF-38535. 3.7.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. For class Q product built in accordance with A.3.2.2 of MIL-PRF-38535 or other alternative approved by the qualifying activity, the "QD" certification mark shall be used in place of the "QML" or "Q" certification mark. 3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 4 (see MIL-PRF-38535, appendix A). 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to qualification and conformance inspection. The following additional criteria shall apply: a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer. c. Additional screening for space level product shall be as specified in MIL-PRF-38535. 9 MIL-M-38510/10D 4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. 4.4 Technology Conformance Inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 shall be omitted. 4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535. 4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. 4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point electrical parameters shall be as specified in table II herein. 4.5 Methods of inspection. Methods of inspection shall be specified as follows: 4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are conventional and positive when flowing into the referenced terminal. 10 MIL-M-38510/10D Device type 01, 02, 03, 04, and 05 Device type 06 and 07 Device type 08 Device type 09 Cases Cases Cases Cases E and F E and F E and F A, B, C, and D 1 OUT 0 IN B IN B IN B 2 OUT 1 IN C IN C IN C 3 OUT 2 LT LT BI 4 OUT 3 RBO RBO/B1 IN D 5 OUT 4 RBI RBI IN A 6 OUT 5 IN D IN D OUT E 7 OUT 6 IN A IN A GND 8 GND GND GND OUT D 9 OUT 7 OUT E OUT E OUT C 10 OUT 8 OUT D OUT D OUT B 11 OUT 9 OUT C OUT C OUT A 12 IN D OUT B OUT B OUT G 13 IN C OUT A OUT A OUT F 14 IN B OUT G OUT G VCC 15 IN A OUT F OUT F 16 VCC VCC VCC Terminal number LT = Lamp Test BI = Blanking Input RBO = Ripple-blanking Output RBI = Ripple-blanking Input FIGURE 1. Terminal connections. 11 MIL-M-38510/10D FIGURE 2. Logic diagrams. 12 MIL-M-38510/10D FIGURE 2. Logic diagrams - Continued. 13 MIL-M-38510/10D FIGURE 2. Logic diagrams - Continued. 14 MIL-M-38510/10D FIGURE 2. Logic diagrams - Continued. 15 MIL-M-38510/10D FIGURE 2. Logic diagrams - Continued. 16 MIL-M-38510/10D FIGURE 2. Logic diagrams - Continued. 17 MIL-M-38510/10D Device types 01, 04, and 05 INPUTS OUTPUTS D C B A 0 1 2 3 4 5 6 7 8 9 L L L L L H H H H H H H H H L L L H H L H H H H H H H H L L H L H H L H H H H H H H L L H H H H H L H H H H H H L H L L H H H H L H H H H H L H L H H H H H H L H H H H L H H L H H H H H H L H H H L H H H H H H H H H H L H H H L L L H H H H H H H H L H H L L H H H H H H H H H H L H L H L H H H H H H H H H H H L H H H H H H H H H H H H H H L L H H H H H H H H H H H H L H H H H H H H H H H H H H H L H H H H H H H H H H H H H H H H H H H H H H H H FIGURE 3. Truth tables. 18 MIL-M-38510/10D Device type 02 INPUTS D OUTPUTS C B A 0 1 2 L L H L H L L H L 3 4 5 6 7 8 9 H L H H H H H H H H H L H L H H H H H H H H L H H H L H H H H H H H H H L H H H L H H H H H H L H H H H H H H L H H H H H H L L L H H H H H L H H H H H L L H H H H H H H L H H H H L H L H H H H H H H L H H H L H H H H H H H H H H L H H H L L H H H H H H H H H L H H L H H H H H H H H H H H H H H L H H H H H H H H H H H H H H H H H H H H H H H H L L L L H H H H H H H H H H L L L H H H H H H H H H H H L L H L H H H H H H H H H H Device type 03 INPUTS OUTPUTS D C B A 0 1 2 3 4 5 6 7 8 9 L L H L L H H H H H H H H H L H H L H L H H H H H H H H L H H H H H L H H H H H H H L H L H H H H L H H H H H H L H L L H H H H L H H H H H H H L L H H H H H L H H H H H H L H H H H H H H L H H H H H H H H H H H H H H L H H H H H L H H H H H H H H L H H L H L H H H H H H H H H L H L H H H H H H H H H H H H H L L H H H H H H H H H H H H L L L H H H H H H H H H H L L L L H H H H H H H H H H L L L H H H H H H H H H H H L L H H H H H H H H H H H H FIGURE 3. Truth tables - Continued. 19 MIL-M-38510/10D Device types 06 and 07 INPUTS OUTPUTS DECIMAL OR FUNCTION LT RBI D C B A BI/RBO A B C D E F G NOTE 0 H H L L L L H L L L L L L H 1 1 H X L L L H H H L L H H H H 1 2 H X L L H L H L L H L L H L 3 H X L L H H H L L L L H H L 4 H X L H L L H H L L H H L L 5 H X L H L H H L H L L H L L 6 H X L H H L H H H L L L L L 7 H X L H H H H L L L H H H H 8 H X H L L L H L L L L L L L 9 H X H L L H H L L L H H L L 10 H X H L H L H H H H L L H L 11 H X H L H H H H H L L H H L 12 H X H H L L H H L H H H L L 13 H X H H L H H L H H L H L L 14 H X H H H L H H H H L L L L 15 H X H H H H H H H H H H H H BI X X X X X X L H H H H H H H 2 RBI H L L L L L L H H H H H H H 3 LT L X X X X X H L L L L L L L 4 NOTES: 1. BI/RBO is wire-OR logic serving as blanking input (BI) and/or ripple-blanking output (RBO). The blanking input must be open or held at a high logic level when output functions 0 through 15 are desired, and rippleblanking input (RBI) must be open or at a high logic level during the decimal 0 output. X = input may be high or low. 2. When a low logic level is applied to the blanking input (forced condition) all segment outputs go to a low logic level regardless of the state of any other input condition. 3. When ripple-blanking input (RBI) is at a low logic level, lamp test input is at high logic level and A = B = C = D = low logic level, all segment outputs go to a low logic level and the ripple-blanking output goes to a low logic level (response condition). 4. When blanking input/ripple-blanking output is open or held at a high logic level, and a low logic level is applied to lamp test input, all segment outputs go to a high logic level. FIGURE 3. Truth tables - Continued. 20 MIL-M-38510/10D Device type 08 INPUTS OUTPUTS DECIMAL OR FUNCTION LT RBI D C B A BI/RBO A B C D E F G NOTE 0 H H L L L L H H H H H H H L 1 1 H X L L L H H L H H L L L L 1 2 H X L L H L H H H L H H L H 3 H X L L H H H H H H H L L H 4 H X L H L L H L H H L L H H 5 H X L H L H H H L H H L H H 6 H X L H H L H L L H H H H H 7 H X L H H H H H H H L L L L 8 H X H L L L H H H H H H H H 9 H X H L L H H H H H L L H H 10 H X H L H L H L L L H H L H 11 H X H L H H H L L H H L L H 12 H X H H L L H L H L L L H H 13 H X H H L H H H L L H L H H 14 H X H H H L H L L L H H H H 15 H X H H H H H L L L L L L L BI X X X X X X L L L L L L L L 2 RBI H L L L L L L L L L L L L L 3 LT L X X X X X H H H H H H H H 4 NOTES: 1. BI/RBO is wire-OR logic serving as blanking input (BI) and/or ripple-blanking output (RBO). The blanking input must be open or held at a high logic level when output functions 0 through 15 are desired, and rippleblanking input (RBI) must be open or at a high logic level during the decimal 0 output. X = input may be high or low. 2. When a low logic level is applied to the blanking input (forced condition) all segment outputs go to a low logic level regardless of the state of any other input condition. 3. When ripple-blanking input (RBI) is at a low logic level, lamp test input is at high logic level and A = B = C = D = low logic level, all segment outputs go to a low logic level and the ripple-blanking output goes to a low logic level (response condition). 4. When blanking input/ripple-blanking output is open or held at a high logic level, and a low logic level is applied to lamp test input, all segment outputs go to a high logic level. FIGURE 3. Truth tables - Continued. 21 MIL-M-38510/10D Device type 09 INPUTS OUTPUTS DECIMAL OR FUNCTION D C B A BI A B C D E F G NOTE 0 L L L L H H H H H H H L 1 1 L L L H H L H H L L L L 2 L L H L H H H L H H L H 3 L L H H H H H H H L L H 4 L H L L H L H H L L H H 5 L H L H H H L H H L H H 6 L H H L H L L H H H H H 7 L H H H H H H H L L L L 8 H L L L H H H H H H H H 9 H L L H H H H H L L H H 10 H L H L H L L L H H L H 11 H L H H H L L H H L L H 12 H H L L H L H L L L H H 13 H H L H H H L L H L H H 14 H H H L H L L L H H H H 15 H H H H H L L L L L L L BI X X X X L L L L L L L L 2 NOTES: 1. The blanking input must be open or held at a high logic level when output functions 0 through 15 are desired. 2. When a low logic level is applied to the blanking input all segment outputs go to a low logic level regardless of the state of any other input condition. X = input may be high or low. FIGURE 3. Truth tables - Continued. 22 MIL-M-38510/10D NOTES: 1. The pulse generator has the following characteristics: VGEN = 3.0 V minimum, tTLH (0.7 V to 2.7 V) and tTHL (2.7 V to 0.7 V) 10 ns, PRR = 1 MHz, and minimum duty cycle = 50%. 2. CL includes probe and jig capacitance. 3. Input - output waveform combination in accordance with the truth tables (see figure 3). 4. All diodes are 1N3064 or equivalent. FIGURE 4. Switching times for device types 01, 02, and 03. 23 MIL-M-38510/10D NOTES: 1. The pulse generator has the following characteristics: VGEN = 3.0 V minimum, tTLH (0.7 V to 2.7 V) and tTHL (2.7 V to 0.7 V) 10 ns, PRR = 1 MHz, and minimum duty cycle = 50%. 2. CL includes probe and jig capacitance. 3. Input - output waveform combination in accordance with the truth tables (see figure 3). FIGURE 5. Switching times for device types 04 and 05. 24 MIL-M-38510/10D NOTES: 1. The pulse generator has the following characteristics: VGEN = 3.0 V minimum, tTLH (0.7 V to 2.7 V) and tTHL (2.7 V to 0.7 V) 10 ns, PRR = 1 MHz, and minimum duty cycle = 50%. 2. CL includes probe and jig capacitance. 3. Input - output waveform combination in accordance with the truth tables (see figure 3). 4. RL = 120 5% for outputs A thru G; RL = 560 5% for output BI/RBO. FIGURE 6. Switching times for device types 06 and 07. 25 MIL-M-38510/10D NOTES: 1. The pulse generator has the following characteristics: VGEN = 3.0 V minimum, tTLH (0.7 V to 2.7 V) and tTHL (2.7 V to 0.7 V) 10 ns, PRR = 1 MHz, and minimum duty cycle = 50%. 2. CL includes probe and jig capacitance. 3. All diodes are 1N3064 or equivalent. 4. Input - output waveform combination in accordance with the truth tables (see figure 3). 5. RL = 750 5% for outputs A thru G; RL = 560 5% for output BI/RBO. FIGURE 7. Switching times for device type 08. 26 MIL-M-38510/10D NOTES: 1. The pulse generator has the following characteristics: VGEN = 3.0 V minimum, tTLH (0.7 V to 2.7 V) and tTHL (2.7 V to 0.7 V) 10 ns, PRR = 1 MHz, and minimum duty cycle = 50%. 2. CL includes probe and jig capacitance. 3. Input - output waveform combination in accordance with the truth tables (see figure 3). FIGURE 8. Switching times for device type 09. 27 TABLE III. Group A inspection for device type 01. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 1 Tc = 25C 883 method 3006 " " " " " " " " " 3007 " " " " " " " " " 1 2 3 4 5 6 7 8 9 10 11 Test no. 0 1 2 3 4 5 6 GND 7 8 9 1 -0.8 mA GND 2 -0.8 mA " 3 -0.8 mA " 4 -0.8 mA " 5 -0.8 mA " 6 -0.8 mA " 7 -0.8 mA " 8 " 9 " 10 " VOL 11 16 mA " 12 16 mA " 13 16 mA " 14 16 mA " 15 16 mA " 16 16 mA " 17 16 mA " 18 " 19 " 20 " VI C 21 " 22 " 23 " 24 " IIH1 3010 25 " " 26 " " 27 " " 28 " IIH2 3010 29 " " 30 " " 31 " " 32 " IIL 3009 33 " " 34 " " 35 " " 36 " IOS 3011 37 GND " " 38 GND " " 39 GND " " 40 GND " " 41 GND " " 42 GND " " 43 GND " " 44 " " 45 " " 46 " I CC 3005 47 " Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. See footnotes at end of device type 01. -0.8 mA -0.8 mA -0.8 mA 16 mA 16 mA 16 mA 12 13 14 15 D C B A VCC 2.0 V " " " " " " " " " 0.8 V " " " " " " " 2.0 V 2.0 V 2.0 V " " " " " " " " " 0.8 V " " " 2.0 V " " " 0.8 V 0.8 V 2.0 V " " " " " " " " " 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V " " " " " " " " " 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V -12 mA 4.5 V " " " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " -12 mA -12 mA GND GND GND 16 -12 mA GND " " 2.4 V GND " " 5.5 V " " " 0.4 V 5.5 V " " " " " " " " " GND GND GND 2.4 V GND " " 5.5 V GND 5.5 V 5.5 V 0.4 V 5.5 V 5.5 V " " " " " " " " " GND GND 2.4 V GND " " 5.5 V GND GND 5.5 V 0.4 V 5.5 V 5.5 V 5.5 V " " " " " " " " " GND 2.4 V GND " " 5.5 V GND " " 0.4 V 5.5 V " " 5.5 V " " " " " " " " " GND Measured terminal Limits Min 0 1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 6 7 8 9 A B C D A B C D A B C D A B C D 0 1 2 3 4 5 6 7 8 9 VCC Unit Max 2.4 V " " " " " " " " " -0.7 " " " -20 " " " " " " " " " 0.4 V " " " " " " " " " -1.5 " " " 40 " " " 100 " " " -1.6 " " " -55 " " " " " " " " " 41 V " " " " " " " " " V " " " " " " " " " V " " " A " " " A " " " mA " " " mA " " " " " " " " " mA MIL-M-38510/10D 28 2 3 VOH Cases E, F TABLE III. Group A inspection for device type 01. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 7 Tc = 25C 8 Truth table test 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Test no. 0 1 2 3 4 5 6 GND 7 8 9 D C B A VCC H " " " " L H " " " " " " " " " H " " " " " L H " " " " " " " " GND " " " " " " " " " " " " " " " H " " " " " " L H " " " " " " " H " " " " " " " L H " " " " " " H " " " " " " " " L H " " " " " GND " " " " " " " 5.0 V " " " " " " " GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V " " " " " " " " " " " " " " " GND " " " " " " " 5.0 V 5.0 V GND " " " IN " " " " " " GND " " " " " " " 5.0 V 5.0 V GND " " " IN " " " " " " GND GND 5.0 V GND 5.0 V GND IN " " " " " " " GND 5.0 V " " " GND " " " 5.0 V GND 5.0 V GND IN " " " " " " " GND 5.0 V " " " GND GND GND GND 5.0 V IN " " 5.0 V 5.0 V GND " " " 5.0 V " " GND GND 5.0 V 5.0 V GND " " " 5.0 V IN " " 5.0 V 5.0 V GND " " " 5.0 V " " GND GND 5.0 V 5.0 V GND GND IN " " 5.0 V GND GND GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN " " 5.0 V GND GND GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 thru 79 L H H H H H L H " " " H L " " " " H L " " " " H L " " " " H " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Same tests as subgroup 7, except TC = +125C. 80 thru 95 Same tests as subgroup 7, except TC = -55C. 3003 96 & 97 OUT (Fig. 4) 98 & 99 OUT " 100 & 101 " 102 & 103 OUT " 104 & 105 OUT " 106 & 107 OUT " 108 & 109 OUT " 110 & 111 OUT " 112 & 113 " 114 & 115 " 116 & 117 OUT " 118 & 119 " 120 & 121 " 122 & 123 " 124 & 125 OUT " 126 & 127 OUT " 128 & 129 " 130 & 131 " 132 & 133 " 134 & 135 " 136 & 137 10 tPHL 3003 138 & 139 OUT (Fig. 4) 140 & 141 OUT Tc = 125C tPLH " 142 & 143 " 144 & 145 OUT " 146 & 147 OUT " 148 & 149 OUT " 150 & 151 OUT " 152 & 153 OUT " 154 & 155 " 156 & 157 " 158 & 159 OUT " 160 & 161 " 162 & 163 " 164 & 165 " 166 & 167 OUT " 168 & 169 OUT " 170 & 171 " 172 & 173 " 174 & 175 " 176 & 177 " 178 & 179 11 Same tests, terminal conditions, and limits as subgroup 10, except TC = -55C. 9 Tc = 25C OUT OUT OUT OUT OUT OUT OUT OUT GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT Measured terminal Limits Min Unit Max See note A to 0 A to 1 A to 7 B to 1 B to 4 B to 2 C to 2 C to 3 C to 8 C to 9 C to 4 C to 5 C to 6 C to 7 D to 3 D to 4 D to 5 D to 6 D to 7 D to 8 D to 9 A to 0 A to 1 A to 7 B to 1 B to 4 B to 2 C to 2 C to 3 C to 8 C to 9 C to 4 C to 5 C to 6 C to 7 D to 3 D to 4 D to 5 D to 6 D to 7 D to 8 D to 9 5 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 32 37 37 32 32 37 32 " " " 37 " " " 32 " " " " 37 37 39 46 46 39 39 46 39 " " " 46 " " " 39 " " " " 46 46 NOTE: Output voltages shall be either: (a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator, or (b) H 1.5 V and L 1.5 V when using a high speed checker single comparator. ns " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D 29 Truth table test tPHL tPLH 883 method Cases E, F TABLE III. Group A inspection for device type 02. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 1 Tc = 25C 883 method 3006 " " " " " " " " " 3007 " " " " " " " " " 1 2 3 4 5 6 7 8 9 10 11 Test no. 0 1 2 3 4 5 6 GND 7 8 9 1 -0.8 mA GND 2 -0.8 mA " 3 -0.8 mA " 4 -0.8 mA " 5 -0.8 mA " 6 -0.8 mA " 7 -0.8 mA " 8 " 9 " 10 " VOL 11 16 mA " 12 16 mA " 13 16 mA " 14 16 mA " 15 16 mA " 16 16 mA " 17 16 mA " 18 " 19 " 20 " VI C 21 " 22 " 23 " 24 " IIH1 3010 25 " " 26 " " 27 " " 28 " IIH2 3010 29 " " 30 " " 31 " " 32 " IIL 3009 33 " " 34 " " 35 " " 36 " IOS 3011 37 GND " " 38 GND " " 39 GND " " 40 GND " " 41 GND " " 42 GND " " 43 GND " " 44 " " 45 " " 46 " I CC 3005 47 " Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. See footnotes at end of device type 01. -0.8 mA -0.8 mA -0.8 mA 16 mA 16 mA 16 mA 12 13 14 15 D C B A VCC 2.0 V " " " " " " " " " 0.8 V " " " " " " " 2.0 V 2.0 V 2.0 V " " " " " " " " " 0.8 V " " " 2.0 V " " " 0.8 V 0.8 V 2.0 V " " " " " " " " " 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 2.0 V " " " " " " " " " 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V -12 mA 4.5 V " " " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " -12 mA -12 mA GND GND GND 16 -12 mA GND " " 2.4 V GND " " 5.5 V " " " 0.4 V 5.5 V " " " " " " " " " GND GND GND 2.4 V GND " " 5.5 V GND 5.5 V 5.5 V 0.4 V 5.5 V 5.5 V " " " " " " " " " GND GND 2.4 V GND " " 5.5 V GND GND 5.5 V 0.4 V 5.5 V 5.5 V 5.5 V " " " " " " " " " GND 2.4 V GND " " 5.5 V GND " " 0.4 V 5.5 V " " 5.5 V " " " " " " " " " GND Measured terminal Limits Min 0 1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 6 7 8 9 A B C D A B C D A B C D A B C D 0 1 2 3 4 5 6 7 8 9 VCC Unit Max 2.4 V " " " " " " " " " -0.7 " " " -20 " " " " " " " " " 0.4 V " " " " " " " " " -1.5 " " " 40 " " " 100 " " " -1.6 " " " -55 " " " " " " " " " 41 V " " " " " " " " " V " " " " " " " " " V " " " A " " " A " " " mA " " " mA " " " " " " " " " mA MIL-M-38510/10D 30 2 3 VOH Cases E, F TABLE III. Group A inspection for device type 02. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 7 Tc = 25C 883 method Truth table test 8 3003 (Fig. 4) " " " " " " " " " " " " " " " " " " " " " " Test no. 1 2 3 4 5 0 1 2 3 4 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 thru 79 L H H H H H L H " " " H L " " " " H L " " " " H L " " " " H " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Same tests as subgroup 7, except TC = +125C. 80 thru 95 96 & 97 98 & 99 100 & 101 102 & 103 104 & 105 106 & 107 108 & 109 110 & 111 112 & 113 114 & 115 116 & 117 118 & 119 120 & 121 122 & 123 124 & 125 126 & 127 128 & 129 130 & 131 132 & 133 134 & 135 136 &137 138 & 139 140 & 141 142 & 143 Same tests as subgroup 7, except TC = -55C. OUT 6 7 8 5 6 GND 7 8 9 D C B A VCC H " " " " L H " " " " " " " " " H " " " " " L H " " " " " " " " GND " " " " " " " " " " " " " " " H " " " " " " L H " " " " " " " H " " " " " " " L H " " " " " " H " " " " " " " " L H " " " " " GND " " " " 5.0 V " " " " " " " GND " " GND 5.0 V " " " GND " " " 5.0 V " " " GND " " 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V " " " " " " " " " " " " " " " GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V 5.0 V GND 5.0 V 5.0 V GND 5.0 V 5.0 V GND GND GND 5.0 V IN " " " " " 5.0 V GND 5.0 V GND GND 5.0 V GND 5.0 V 5.0 V GND GND IN " " " " " " 5.0 V 5.0 V GND " " " GND 5.0 V GND 5.0 V GND IN " " " " " 5.0 V GND 5.0 V GND GND 5.0 V GND 5.0 V 5.0 V GND " 5.0 V 5.0 V IN " " " " 5.0 V 5.0 V GND GND GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V 5.0 V GND GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V " " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT OUT OUT OUT See notes at end of device type 02. OUT OUT OUT OUT OUT OUT OUT OUT GND " " " " " " " " " " " " " " " " " " " " " " " 9 10 11 OUT OUT OUT OUT OUT OUT OUT OUT OUT 12 13 14 15 16 Measured terminal Limits Min Unit Max See note A to 1 A to 7 A to 9 A to 0 A to 6 B to 2 B to 6 B to 9 B to 3 B to 7 B to 8 C to 0 C to 5 C to 8 C to 1 C to 2 C to 4 C to 9 D to 3 D to 4 D to 5 D to 6 D to 7 D to 8 5 " " " " " " " " " " " " " " " " " " " " " " " 32 " " 37 37 32 32 32 37 37 37 32 32 32 37 " " " 32 32 37 " " " ns " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D 31 Truth table test 9 tPHL Tc = 25C tPLH Cases E, F TABLE III. Group A inspection for device type 02. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 10 Tc = 125C 11 Cases E, F 1 2 3 4 5 883 Test no. 0 1 2 3 4 method 3003 144 & 145 OUT (Fig. 4) 146 & 147 " 148 & 149 " 150 & 151 OUT " 152 & 153 " 154 & 155 OUT " 156 & 157 " 158 & 159 " 160 & 161 OUT " 162 & 163 " 164 & 165 " 166 & 167 OUT " 168 & 169 " 170 & 171 " 172 & 173 OUT " 174 & 175 OUT " 176 & 177 OUT " 178 & 179 " 180 & 181 OUT " 182 & 183 OUT " 184 & 185 " 186 & 187 " 188 & 189 " 190 & 191 Same tests, terminal conditions, and limits as subgroup 10, except TC = -55C. 6 7 5 6 tPHL tPLH OUT OUT OUT OUT OUT 8 9 10 11 GND 7 8 9 GND " " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT OUT OUT OUT OUT OUT OUT 12 13 14 15 16 D C B A VCC GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V 5.0 V GND 5.0 V 5.0 V GND 5.0 V 5.0 V GND GND GND 5.0 V IN " " " " " 5.0 V GND 5.0 V GND GND 5.0 V GND 5.0 V 5.0 V GND GND IN " " " " " " 5.0 V 5.0 V GND " " " GND 5.0 V GND 5.0 V GND IN " " " " " 5.0 V GND 5.0 V GND GND 5.0 V GND 5.0 V 5.0 V GND " 5.0 V 5.0 V IN " " " " 5.0 V 5.0 V GND GND GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V 5.0 V GND GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V " " " " " " " " " " " " " " " " " " " " " " " Measured terminal A to 1 A to 7 A to 9 A to 0 A to 6 B to 2 B to 6 B to 9 B to 3 B to 7 B to 8 C to 0 C to 5 C to 8 C to 1 C to 2 C to 4 C to 9 D to 3 D to 4 D to 5 D to 6 D to 7 D to 8 Limits Unit Min Max 5 " " " " " " " " " " " " " " " " " " " " " " " 39 " " 46 46 39 39 39 46 46 46 39 39 39 46 " " " 34 34 46 " " " 32 MIL-M-38510/10D NOTE: Output voltages shall be either: (a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator, or (b) H 1.5 V and L 1.5 V when using a high speed checker single comparator. ns " " " " " " " " " " " " " " " " " " " " " " " TABLE III. Group A inspection for device type 03. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 1 Tc = 25C 883 method 3006 " " " " " " " " " 3007 " " " " " " " " " 1 2 3 4 5 6 7 8 9 10 11 Test no. 0 1 2 3 4 5 6 GND 7 8 9 1 -0.8 mA GND 2 -0.8 mA " 3 -0.8 mA " 4 -0.8 mA " 5 -0.8 mA " 6 -0.8 mA " 7 -0.8 mA " 8 " 9 " 10 " VOL 11 16 mA " 12 16 mA " 13 16 mA " 14 16 mA " 15 16 mA " 16 16 mA " 17 16 mA " 18 " 19 " 20 " VI C 21 " 22 " 23 " 24 " IIH1 3010 25 " " 26 " " 27 " " 28 " IIH2 3010 29 " " 30 " " 31 " " 32 " IIL 3009 33 " " 34 " " 35 " " 36 " IOS 3011 37 GND " " 38 GND " " 39 GND " " 40 GND " " 41 GND " " 42 GND " " 43 GND " " 44 " " 45 " " 46 " I CC 3005 47 " Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. See footnotes at end of device type 03. -0.8 mA -0.8 mA -0.8 mA 16 mA 16 mA 16 mA 12 13 14 15 D C B A VCC 0.8 V " " " " " " " " " 0.8 V " " " " 2.0 V " " " " 0.8 V " " " " " " " " " 0.8 V 2.0 V " " " " " " " 0.8 V 0.8 V " " " " " " " " " 2.0 V " " 0.8 V " " " 2.0 V " " 0.8 V " " " " " " " " " 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V -12 mA 4.5 V " " " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " -12 mA -12 mA GND GND GND 16 -12 mA GND " " 2.4 V GND " " 5.5 V " " " 0.4 V GND " " " " " " " " " GND GND GND 2.4 V GND " " 5.5 V GND 5.5 V 5.5 V 0.4 V 5.5 V GND " " " " " " " " " GND GND 2.4 V GND " " 5.5 V GND GND 5.5 V 0.4 V 5.5 V 5.5 V GND " " " " " " " " " GND 2.4 V GND " " 5.5 V GND " " 0.4 V 5.5 V " " GND " " " " " " " " " GND Measured terminal Limits Min 0 1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 6 7 8 9 A B C D A B C D A B C D A B C D 0 1 2 3 4 5 6 7 8 9 VCC Unit Max 2.4 V " " " " " " " " " -0.7 " " " -20 " " " " " " " " " 0.4 V " " " " " " " " " -1.5 " " " 40 " " " 100 " " " -1.6 " " " -55 " " " " " " " " " 41 V " " " " " " " " " V " " " " " " " " " V " " " A " " " " " " " mA " " " mA " " " " " " " " " mA MIL-M-38510/10D 33 2 3 VOH Cases E, F TABLE III. Group A inspection for device type 03. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 7 Tc = 25C 883 method Truth table test 8 3003 (Fig. 4) " " " " " " " " " " " " " " " " " " " " " " " Test no. 1 2 3 4 5 0 1 2 3 4 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 thru 79 L H H H H H L H " " " H L " " " " H L " " " " H L " " " " H " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Same tests as subgroup 7, except TC = +125C. 80 thru 95 96 & 97 98 & 99 100 & 101 102 & 103 104 & 105 106 & 107 108 & 109 110 & 111 112 & 113 114 & 115 116 & 117 118 & 119 120 & 121 122 & 123 124 & 125 126 & 127 128 & 129 130 & 131 132 & 133 134 & 135 136 &137 138 & 139 140 & 141 142 & 143 144 & 145 Same tests as subgroup 7, except TC = -55C. OUT 6 7 8 5 6 GND 7 8 9 D C B A VCC H " " " " L H " " " " " " " " " H " " " " " L H " " " " " " " " GND " " " " " " " " " " " " " " " H " " " " " " L H " " " " " " " H " " " " " " " L H " " " " " " H " " " " " " " " L H " " " " " GND " " " " 5.0 V " " " " " " " GND " " GND 5.0 V " " " " " " " GND " " " " " " 5.0 V 5.0 V 5.0 V GND " " " 5.0 V " " " GND " " " 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V 5.0 V " " " " " " " " " " " " " " " GND 5.0 V GND GND GND 5.0 V 5.0 V GND GND GND 5.0 V 5.0 V GND GND GND 5.0 V 5.0 V 5.0 V IN " " " " " " GND 5.0 V " " " " " GND 5.0 V 5.0 V 5.0 V IN " " " " " " 5.0 V " " " " " GND 5.0 V 5.0 V 5.0 V IN " " " " " " " 5.0 V 5.0 V GND " " " 5.0 V 5.0 V 5.0 V GND GND GND 5.0 V 5.0 V IN IN IN 5.0 V GND GND 5.0 V GND GND 5.0 V GND GND GND 5.0 V GND GND 5.0 V 5.0 V GND 5.0 V 5.0 V GND 5.0 V 5.0 V GND 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT OUT OUT OUT See notes at end of device type 03. OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT GND " " " " " " " " " " " " " " " " " " " " " " " " 9 10 11 OUT OUT OUT OUT OUT OUT 12 13 14 15 16 Measured terminal Limits Min Unit Max See note A to 0 A to 8 A to 2 B to 3 B to 4 B to 5 B to 6 B to 0 B to 1 B to 2 B to 8 C to 9 C to 1 C to 3 C to 4 C to 5 C to 6 C to 7 D to 1 D to 2 D to 4 D to 5 D to 6 D to 7 D to 9 5 " " " " " " " " " " " " " " " " " " " " " " " " 32 32 37 32 " " " 37 " " " 32 37 " " " " " 32 32 32 37 " " " ns " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D 34 Truth table test 9 tPHL Tc = 25C tPLH Cases E, F TABLE III. Group A inspection for device type 03. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 10 Tc = 125C 1 2 3 4 5 35 883 Test no. 0 1 2 3 4 method 3003 146 & 147 OUT (Fig. 4) 148 & 149 " 150 & 151 OUT " 152 & 153 OUT " 154 & 155 OUT " 156 & 157 " 158 & 159 " 160 & 161 OUT " 162 & 163 OUT " 164 & 165 OUT " 166 & 167 " 168 & 169 " 170 & 171 OUT " 172 & 173 OUT " 174 & 175 OUT " 176 & 177 " 178 & 179 " 180 & 181 " 182 & 183 OUT " 184 & 185 OUT " 186 &187 OUT " 188 & 189 " 190 & 191 " 192 & 193 " 194 & 195 Same tests, terminal conditions, and limits as subgroup 10, except TC = -55C. 6 7 5 6 tPHL tPLH OUT OUT OUT OUT OUT OUT 8 9 10 11 GND 7 8 9 GND " " " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT OUT OUT OUT 12 13 14 15 16 D C B A VCC GND 5.0 V GND GND GND 5.0 V 5.0 V GND GND GND 5.0 V 5.0 V GND GND GND 5.0 V 5.0 V 5.0 V IN " " " " " " GND 5.0 V " " " " " GND 5.0 V 5.0 V 5.0 V IN " " " " " " 5.0 V " " " " " GND 5.0 V 5.0 V 5.0 V IN " " " " " " " 5.0 V 5.0 V GND " " " 5.0 V 5.0 V 5.0 V GND GND GND 5.0 V 5.0 V IN IN IN 5.0 V GND GND 5.0 V GND GND 5.0 V GND GND GND 5.0 V GND GND 5.0 V 5.0 V GND 5.0 V 5.0 V GND 5.0 V 5.0 V GND 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " Measured terminal A to 0 A to 8 A to 2 B to 3 B to 4 B to 5 B to 6 B to 0 B to 1 B to 2 B to 8 C to 9 C to 1 C to 3 C to 4 C to 5 C to 6 C to 7 D to 1 D to 2 D to 4 D to 5 D to 6 D to 7 D to 9 Limits Unit Min Max 5 " " " " " " " " " " " " " " " " " " " " " " " " 39 39 46 39 " " " 46 " " " 39 46 " " " " " 39 39 39 46 " " " NOTE: Output voltages shall be either: (a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator, or (b) H 1.5 V and L 1.5 V when using a high speed checker single comparator. ns " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D 11 Cases E, F TABLE III. Group A inspection for device type 04 and 05. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 1 Tc = 25C 883 method 3007 " " " " " " " " " 3007 " " " " " " " " " 1 2 3 4 5 6 7 8 9 10 11 Test no. 0 1 2 3 4 5 6 GND 7 8 9 1 80 mA GND 2 80 mA " 3 80 mA " 4 80 mA " 5 80 mA " 6 80 mA " 7 80 mA " 8 " 9 " 10 " VOL2 11 20 mA " 12 20 mA " 13 20 mA " 14 20 mA " 15 20 mA " 16 20 mA " 17 20 mA " 18 " 19 " 20 " ICEX 21 Y " 1/ 22 Y " 23 Y " 24 Y " 25 Y " 26 Y " 27 Y " 28 " 29 " 30 " VI C 31 " 32 " 33 " 34 " IIL 3009 35 " " 36 " " 37 " " 38 " IIH1 3010 39 " " 40 " " 41 " " 42 " IIH2 3010 43 " " 44 " " 45 " " 46 " I CC 3005 47 " Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. See footnotes at end of device types 04 and 05. 80 mA 80 mA 80 mA 20 mA 20 mA 20 mA Y Y Y 12 13 14 15 16 D C B A VCC 0.8 V " " " " " " " 2.0 V 2.0 V 0.8 V " " " " " " " 2.0 V 2.0 V 2.0 V " " " " " " " " " 0.8 V " " " 2.0 V " " " 0.8 V 0.8 V 0.8 V " " " 2.0 V " " " 0.8 V 0.8 V 2.0 V " " " " " " " " " 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V " " " " " " " " " 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 2.0 V " " " " " " " " " -12 mA 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " -12 mA -12 mA -12 mA 5.5 V " " 0.4 V GND " " 2.4 V GND " " 5.5 V GND 5.5 V 5.5 V 0.4 V 5.5 V GND GND 2.4 V GND " " 5.5 V GND GND 5.5 V 0.4 V 5.5 V 5.5 V GND 2.4 V GND " " 5.5 V GND GND GND 0.4 V 5.5 V " " 2.4 V GND " " 5.5 V GND " " GND Measured terminal Limits Min 0 1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 6 7 8 9 A B C D A B C D A B C D A B C D VCC -0.7 " " " Unit Max 0.9 " " " " " " " " " 0.4 V " " " " " " " " " 250 " " " " " " " " " -1.5 " " " -1.6 " " " 40 " " " 100 " " " 62 V " " " " " " " " " V " " " " " " " " " A " " " " " " " " " V " " " mA " " " A " " " A " " " mA MIL-M-38510/10D 36 2 3 VOL Cases E, F TABLE III. Group A inspection for device type 04 and 05. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 7 Tc = 25C 883 method Truth table test 8 3003 (Fig. 5) " " " " " " " " " " " " " " " " " " " " Test no. 1 2 3 4 5 0 1 2 3 4 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 thru 79 L H H H H H L H " " " H L " " " " H L " " " " H L " " " " H " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Same tests as subgroup 7, except TC = +125C. 80 thru 95 96 & 97 98 & 99 100 & 101 102 & 103 104 & 105 106 & 107 108 & 109 110 & 111 112 & 113 114 & 115 116 & 117 118 & 119 120 & 121 122 & 123 124 & 125 126 & 127 128 & 129 130 & 131 132 & 133 134 & 135 136 &137 138 & 139 Same tests as subgroup 7, except TC = -55C. OUT OUT 6 7 8 5 6 GND 7 8 9 D C B A VCC H " " " " L H " " " " " " " " " H " " " " " L H " " " " " " " " GND " " " " " " " " " " " " " " " H " " " " " " L H " " " " " " " H " " " " " " " L H " " " " " " H " " " " " " " " L H " " " " " GND " " " " " " " 5.0 V " " " " " " " GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND GND GND 5.0 V GND " " " " " " " " 5.0 V 5.0 V IN " " " " " " GND GND 5.0 V GND GND GND 5.0 V IN " " " " " " " GND 5.0 V " " " GND GND GND " " " IN IN IN 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V GND GND 5.0 V 5.0 V GND GND IN " " " 5.0 V GND GND GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V " " " " " " " " " " " " " " " " " " 5.0 V " " " " " " " " " " " " " " " " " " " " " OUT OUT See notes at end of device types 04 and 05. OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT GND " " " " " " " " " " " " " " " " " " " " " 9 10 11 OUT OUT OUT OUT OUT OUT OUT 12 13 14 15 16 Measured terminal Limits Min Unit Max 2/ A to 0 A to 1 A to 5 A to 8 B to 1 B to 2 B to 6 C to 2 C to 3 C to 4 C to 5 C to 6 C to 7 C to 8 C to 9 D to 3 D to 4 D to 5 D to 6 D to 7 D to 8 D to 9 5 " " " " " " " " " " " " " " " " " " " " " 56 " " " " " " " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D 37 Truth table test 9 tPHL Tc = 25C tPLH Cases E, F TABLE III. Group A inspection for device type 04 and 05. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 10 Tc = 125C 1 2 3 4 5 38 883 Test no. 0 1 2 3 4 method 3003 140 & 141 OUT (Fig. 5) 142 & 143 OUT " 144 & 145 " 146 & 147 " 148 & 149 OUT " 150 & 151 OUT " 152 & 153 " 154 & 155 OUT " 156 & 157 OUT " 158 & 159 OUT " 160 & 161 " 162 & 163 " 164 & 165 " 166 & 167 " 168 & 169 " 170 & 171 OUT " 172 & 173 OUT " 174 & 175 " 176 & 177 " 178 & 179 " 180 & 181 " 182 & 183 Same tests, terminal conditions, and limits as subgroup 10, except TC = -55C. 6 7 5 6 tPHL tPLH OUT OUT OUT OUT OUT OUT 8 9 10 11 GND 7 8 9 GND " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT OUT OUT OUT OUT 1/ Y = 30 volts for device type 04 and 15 volts for device type 05. 2/ Output voltages shall be either: (a) H = 2.4 V minimum and L = 0.4 V maximum when using a high speed checker double comparator, or (b) H 1.5 V and L 1.5 V when using a high speed checker single comparator. 12 13 14 15 16 D C B A VCC GND GND GND 5.0 V GND " " " " " " " " 5.0 V 5.0 V IN " " " " " " GND GND 5.0 V GND GND GND 5.0 V IN " " " " " " " GND 5.0 V " " " GND GND GND " " " IN IN IN 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V GND GND 5.0 V 5.0 V GND GND IN " " " 5.0 V GND GND GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V " " " " " " " " " " " " " " " " " " " " " Measured terminal A to 0 A to 1 A to 5 A to 8 B to 1 B to 2 B to 6 C to 2 C to 3 C to 4 C to 5 C to 6 C to 7 C to 8 C to 9 D to 3 D to 4 D to 5 D to 6 D to 7 D to 8 D to 9 Limits Unit Min Max 5 " " " " " " " " " " " " " " " " " " " " " 73 " " " " " " " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D 11 Cases E, F TABLE III. Group A inspection for device type 06 and 07. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 Test no. IN B IN C LT RBO RBI IN D IN A GND OUT E OUT D OUT C OUT B OUT A OUT G OUT F 1 X X 0.8 V X X X GND 2 " " " " " " " 3 " " " " " " " 4 " " " " " " " 5 " " " " " " " 6 " " " " " " " 7 " " " " " " " VOL2 8 0.8 V 0.8 V 2.0 V 8 mA 0.8 V 0.8 V 0.8 V " ICEX 9 " " " " " " " 2/ 10 " " " " " " " 11 " " " " " " " 12 " " " " " " " 13 " " " " " " " 14 " " " " " " " 15 " " " " " " " VOH 3006 16 0.8 V 0.8 V 2.0 V -.2 mA 2.0 V 0.8 V 0.8 V " VI C 17 -12 mA " 18 -12 mA " 19 -12 mA " 20 -12 mA " 21 -12 mA " 22 -12 mA " IIL1 3009 23 4/ 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V " " 23 CKT C 0.4 V 5.5 V 5.5 V " " " " " 24 4/ 5.5 V 0.4 V 5.5 V " " " " " 24 CKT C 5.5 V 0.4 V 5.5 V " " " " " 25 4/ " 5.5 V 0.4 V " " " " " 25 CKT C " 5.5 V 0.4 V " " " " " 26 4/ " " 5.5 V 0.4 V " " " " 26 CKT C " " 5.5 V 0.4 V " " " " 27 4/ " " " 5.5 V 0.4 V " " " 27 CKT C " " " " 0.4 V " " " 28 4/ " " " " 5.5 V 0.4 V " " 28 CKT C " " " " 5.5 V 0.4 V " IIL2 3009 29 " " " 0.4 V 5.5 V 5.5 V 5.5 V " IIH1 3010 30 2.4 V GND GND GND GND GND " " 31 GND 2.4 V GND GND " " " " 32 " GND 2.4 V GND " " " " 33 " " GND 2.4 V " " " " 34 " " GND GND 2.4 V " " " 35 " " GND GND GND 2.4 V " IIH2 3010 36 5.5 V GND GND GND GND GND " " 37 GND 5.5 V GND GND " " " " 38 " GND 5.5 V GND " " " " 39 " " GND 5.5 V " " " " 40 " " " GND 5.5 V " " " 41 " " " GND GND 5.5 V " I OS 3011 42 " " " GND GND GND GND " I CC 3005 43 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V " Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. 40 mA Subgroup Symbol 1 Tc = 25C 39 2 3 VOL1 1/ 883 method 3007 " " " " " " " See footnotes at end of device types 06 and 07. 40 mA 40 mA 40 mA 40 mA 40 mA 40 mA Y Y Y Y Y Y Y 16 Measured terminal VCC 4.5 V " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " Limits Min OUT E OUT D OUT C OUT B OUT A OUT G OUT F RBO OUT E OUT D OUT C OUT B OUT A OUT G OUT F RBO IN B IN C RBO RBI IN D IN A IN B IN B IN C IN C LT LT RBI RBI IN D IN D IN A IN A RBO IN B IN C LT RBI IN D IN A IN B IN C LT RBI IN D IN A RBO VCC Unit Max 0.4 " " " " " " 0.4 250 " " " " " " 2.4 -0.7 -0.4 -0.7 -0.4 -0.7 -0.4 -0.7 -0.4 -0.7 -0.4 -0.7 -0.4 -1.7 -1.5 " " " " " -1.6 -1.3 -1.6 -1.3 -1.6 -1.3 -1.6 -1.3 -1.6 -1.3 -1.6 -1.3 -4.2 40 " " " " " 100 " " " " " -4 85 V " " " " " " " A " " " " " " V " " " " " " mA " " " " " " " " " " " mA A " " " " " A " " " " " mA mA MIL-M-38510/10D Cases E, F MIL-STD- TABLE III. Group A inspection for device type 06 and 07. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 7 Tc = 25C 883 method Truth table test Test no. 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 - 81 82 -100 8 40 3003 (Fig. 6) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 101 & 102 103 & 104 105 & 106 107 & 108 109 & 110 111 & 112 113 & 114 115 & 116 117 & 118 119 & 120 121 & 122 123 & 124 125 & 126 127 & 128 129 & 130 131 & 132 133 & 134 135 & 136 137 & 138 139 & 140 141 & 142 143 & 144 145 & 146 147 & 148 149 & 150 151 & 152 153 & 154 155 & 156 157 & 158 159 & 160 161 & 162 163 & 164 165 & 166 167 & 168 169 & 170 1 2 3 4 5 IN B IN C LT RBO RBI GND GND 5.0 V 5.0 V GND " " X 5.0 V " " " 5.0 V " " " GND 5.0 V " " GND " " " 5.0 V " " " 5.0 V " " " GND GND " " GND " " " 5.0 V " " " 5.0 V " " " GND 5.0 V " " GND " " " 5.0 V " " " 5.0 V " " " X X X GND X GND GND 5.0 V L GND X X GND X Same tests as subgroup 7, except TC = 125C. Same tests as subgroup 7, except TC = -55C. GND GND 5.0 V GND 5.0 V 5.0 V GND GND 5.0 V GND 5.0 V GND 5.0 V 5.0 V GND IN " " " " " " " " " " " " " GND 5.0 V GND GND GND 5.0 V GND 5.0 V " " " GND GND 5.0 V 5.0 V GND GND GND 5.0 V 5.0 V GND GND GND 5.0 V GND 5.0 V GND GND GND 5.0 V 5.0 V 5.0 V GND GND GND IN " " " " " 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " See footnotes at end of device types 06 and 07. OUT 5.0 V " " " " " " " " " " " " " GND 5.0 V " " " " " " " " " " " " " " " " " " " 6 7 8 9 10 11 12 13 14 15 16 IN D IN A GND OUT E OUT D OUT C OUT B OUT A OUT G OUT F VCC GND " " " " " " " 5.0 V " " " " " " " X GND X GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V X GND X GND " " " " " " " " " " " " " " " " " " L H L H H H L H L H L H H H L H H H L L H L L H L L H L H L L H L L H H H L L L H L " " " " " " H L H " " " " " L L " " " " H H L L L H H L H " " " " L L H L L H L H L L L H H H L H " " " L H H L " " " " H L " " " " " " H H H L L H H H L L L H L L H H L L L H H H L 5.0 V " " " " " " " " " " " " " " " " " " GND 5.0 V GND " " " " " " " " " 5.0 V 5.0 V GND 5.0 V GND GND 5.0 V GND 5.0 V GND " " " " " 5.0 V GND 5.0 V GND 5.0 V GND GND 5.0 V IN " " " " " " " " " " " " " " GND 5.0 V GND GND 5.0 V 5.0 V GND 5.0 V GND GND 5.0 V GND " " " " 5.0 V GND GND GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Measured terminal Limits Min Unit Max 3/ IN A to A IN A to A IN A to A IN A to B IN A to B IN A to C IN A to D IN A to D IN A to D IN A to E IN A to E IN A to F IN A to F IN A to G IN A to RBO IN B to A IN B to A IN B to B IN B to B IN B to B IN B to B IN B to C IN B to D IN B to D IN B to E IN B to F IN B to F IN B to F IN B to G IN C to A IN C to C IN C to C IN C to D IN C to E IN C to F 8 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 104 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D Truth table test 9 tPHL Tc = 25C tPLH Cases E, F TABLE III. Group A inspection for device type 06 and 07. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STD- Cases E, F 1 2 3 4 5 41 7 8 9 10 11 12 13 14 15 OUT E OUT D OUT C OUT B OUT A OUT G OUT F VCC OUT 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Subgroup Symbol IN D IN A GND 9 Tc = 25C GND IN IN IN GND " " " " " 5.0 V GND " " " " " " " " " 5.0 V 5.0 V GND 5.0 V GND GND 5.0 V GND 5.0 V GND " " " " " 5.0 V GND 5.0 V GND 5.0 V GND GND 5.0 V GND IN IN IN GND " " " " 5.0 V 5.0 V GND " " " " " " IN " " " " " " " " " " " " " " GND 5.0 V GND GND 5.0 V 5.0 V GND 5.0 V GND GND 5.0 V GND " " " " 5.0 V GND GND GND 5.0 V 5.0 V GND " " " " " " GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 1/ 2/ 3/ 4/ tPHL tPLH OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT X = Input may be high level or low level. Y = 30 volts for device type 05 and 15 volts for device type 07. Output voltages shall be either: (a) H = 2.4 volts minimum and L = 0.4 volts minimum when using high speed checker double comparator, or (b) H 1.5 volts and L 1.5 volts when using a high speed checker single comparator. CKT except C. OUT OUT OUT OUT 16 Measured terminal IN C to F IN D to A IN D to C IN D to G LT to A LT to RBO RBO to A RBI to A RBI to RBO IN A to A IN A to A IN A to A IN A to B IN A to B IN A to C IN A to D IN A to D IN A to D IN A to E IN A to E IN A to F IN A to F IN A to G IN A to RBO IN B to A IN B to A IN B to B IN B to B IN B to B IN B to B IN B to C IN B to D IN B to D IN B to E IN B to F IN B to F IN B to F IN B to G IN C to A IN C to C IN C to C IN C to D IN C to E IN C to F IN C to F IN D to A IN D to C IN D to G LT to A LT to RBO RBO to A RBI to A RBI to RBO Limits Unit Min Max 8 " " " " " " " " 8 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 104 " " " " " " " " 144 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D 883 Test no. IN B IN C LT RBO RBI method 3003 171 & 172 GND IN 5.0 V 5.0 V (Fig. 6) 173 & 174 5.0 V 5.0 V " " " 175 & 176 GND 5.0 V " " " 177 & 178 " GND " " " 179 & 180 " " IN GND " 181 & 182 " " IN OUT GND " 183 & 184 " " 5.0 V IN 5.0 V " 185 & 186 " " " IN " 187 & 188 " " " OUT IN 10 tPHL 3003 189 & 190 " " " 5.0 V (Fig. 6) 191 & 192 " 5.0 V " " Tc = 125C tPLH " 193 & 194 5.0 V " " " " 195 & 196 GND " " " " 197 & 198 5.0 V " " " " 199 & 200 5.0 V GND " " " 201 & 202 GND GND " " " 203 & 204 GND 5.0 V " " " 205 & 206 5.0 V 5.0 V " " " 207 & 208 GND GND " " " 209 & 210 5.0 V GND " " " 211 & 212 GND GND " " " 213 & 214 5.0 V 5.0 V " " " 215 & 216 5.0 V 5.0 V " " " 217 & 218 GND GND " OUT GND " 219 & 220 IN GND " 5.0 V " 221 & 222 " GND " " " 223 & 224 " 5.0 V " " " 225 & 226 " GND " " " 227 & 228 " 5.0 V " " " 229 & 230 " GND " " " 231 & 232 " GND " " " 233 & 234 " GND " " " 235 & 236 " 5.0 V " " " 237 & 238 " 5.0 V " " " 239 & 240 " 5.0 V " " " 241 & 242 " GND " " " 243 & 244 " GND " " " 245 & 246 " GND " " " 247 & 248 GND IN " " " 249 & 250 5.0 V " " " " 251 & 252 GND " " " " 253 & 254 GND " " " " 255 & 256 GND " " " " 257 & 258 5.0 V " " " " 259 & 260 GND 5.0 V " " " 261 & 262 5.0 V 5.0 V " " " 263 & 264 GND 5.0 V " " " 265 & 266 " GND " " " 267 & 268 " " IN GND " 269 & 270 " " IN OUT GND " 271 & 272 " " 5.0 V IN 5.0 V " 273 & 274 " " " IN " 275 & 276 " " " OUT IN 11 Same tests, terminal conditions, and limits as subgroup 10 except TC = -55C. 6 TABLE III. Group A inspection for device type 08. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). 10 11 12 13 14 15 GND OUT E OUT D OUT C OUT B OUT A OUT G OUT F 1 X X 0.8 V X X X GND 2 " " " " " " " 3 " " " " " " " 4 " " " " " " " 5 " " " " " " " 6 " " " " " " " 7 " " " " " " " VOH2 8 0.8 V 0.8 V 2.0 V -.2 mA 0.8 V 0.8 V 0.8 V " VOL1 9 " " " " " " " 10 " " " " " " " 11 " " " " " " " 12 " " " " " " " 13 " " " " " " " 14 " " " " " " " 15 " " " " " " " VOL2 16 0.8 V 0.8 V 2.0 V 8 mA 0.8 V 0.8 V 0.8 V " VI C 17 -12 mA " 18 -12 mA " 19 -12 mA " 20 -12 mA " 21 -12 mA " 22 -12 mA " IIL1 3009 23 2/ 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V " " 23 CKT B 0.4 V 5.5 V 5.5 V " " " " " 24 2/ 5.5 V 0.4 V 5.5 V " " " " " 24 CKT B " 0.4 V 5.5 V " " " " " 25 2/ " 5.5 V 0.4 V " " " " " 25 CKT B " " 0.4 V " " " " " 26 2/ " " 5.5 V 0.4 V " " " " 26 CKT B " " " 0.4 V " " " " 27 2/ " " " 5.5 V 0.4 V " " " 27 CKT B " " " " 0.4 V " " " 28 2/ " " " " 5.5 V 0.4 V " " 28 CKT B " " " " 5.5 V 0.4 V " IIL2 3009 29 " " " 0.4 V 5.5 V 5.5 V 5.5 V " IIH1 3010 30 2.4 V GND GND GND GND GND " " 31 GND 2.4 V GND GND " " " " 32 " GND 2.4 V GND " " " " 33 " " GND 2.4 V " " " " 34 " " GND GND 2.4 V " " " 35 " " GND GND GND 2.4 V " IIH2 3010 36 5.5 V GND GND GND GND GND " " 37 GND 5.5 V GND GND " " " " 38 " GND 5.5 V GND " " " " 39 " " GND 5.5 V " " " " 40 " " " GND 5.5 V " " " 41 " " " GND GND 5.5 V " I OS 3011 42 X X GND X X X " " 43 " " " " " " " " 44 " " " " " " " " 45 " " " " " " " " 46 " " " " " " " " 47 " " " " " " " " 48 " " " " " " " " 49 " " " GND " " " " I CC 3005 50 " " " " " " " Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. -0.4 mA Subgroup Symbol 1 Tc = 25C 42 2 3 VOH1 1/ 883 method 3006 " " " " " " " 3007 " " " " " " 3007 Cases E, F 1 2 3 4 5 6 7 8 Test no. IN B IN C LT RBO RBI IN D IN A See footnotes at end of device types 08. -0.4 mA -0.4 mA -0.4 mA -0.4 mA -0.4 mA -0.4 mA 6.4 mA 6.4 mA 6.4 mA 6.4 mA 6.4 mA 6.4 mA 6.4 mA GND GND GND GND GND GND GND 16 Measured terminal VCC 4.5 V " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Limits Min OUT E OUT D OUT C OUT B OUT A OUT G OUT F RBO OUT E OUT D OUT C OUT B OUT A OUT G OUT F RBO IN B IN C RBO RBI IN D IN A IN B IN B IN C IN C LT LT RBI RBI IN D IN D IN A IN A RBO IN B IN C LT RBI IN D IN A IN B IN C LT RBI IN D IN A OUT A OUT B OUT C OUT D OUT E OUT F OUT G RBO VCC Unit Max 2.4 V " " " " " " " -0.7 -0.4 -0.7 -0.4 -0.7 -0.4 -0.7 -0.4 -0.7 -0.4 -0.7 -0.4 -1.7 0.4 " " " " " " 0.4 -1.5 " " " " " -1.6 -1.3 -1.6 -1.3 -1.6 -1.3 -1.6 -1.3 -1.6 -1.3 -1.6 -1.3 -4.2 40 " " " " " 100 " " " " " -4 " " " " " " " 76 V " " " " " " " " " " " " " " " " " " " " " mA " " " " " " " V " " " mA A " " " " " A " " " " " mA " " " " " " " mA MIL-M-38510/10D 9 MIL-STD- TABLE III. Group A inspection for device type 08. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 7 Tc = 25C 883 method Truth table test Test no. 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 - 89 90 -109 8 43 3003 (Fig. 7) " " " " " " " " " " " " " " " " " " " " " 110 & 111 112 & 113 114 & 115 116 & 117 118 & 119 120 & 121 122 & 123 124 & 125 126 & 127 128 & 129 130 & 131 132 & 133 134 & 135 136 & 137 138 & 139 140 & 141 142 & 143 144 & 145 146 & 147 148 & 149 150 & 151 152 & 153 154 & 155 1 2 3 4 5 IN B IN C LT RBO RBI GND GND 5.0 V 5.0 V GND " " X 5.0 V " " " 5.0 V " " " GND 5.0 V " " GND " " " 5.0 V " " " 5.0 V " " " GND GND " " GND " " " 5.0 V " " " 5.0 V " " " GND 5.0 V " " GND " " " 5.0 V " " " 5.0 V " " " X X X GND X GND GND 5.0 V L GND X X GND X Same tests as subgroup 7, except TC = 125C. Same tests as subgroup 7, except TC = -55C. GND " " " 5.0 V GND 5.0 V GND IN " " " " " " " 5.0 V " " GND GND X GND GND " " " 5.0 V 5.0 V 5.0 V GND " " " " 5.0 V 5.0 V 5.0 V IN IN GND GND 5.0 V GND X GND See footnotes at end of device types 08. 5.0 V " " " " " " " " " " " " " " " " " " " IN GND 5.0 V OUT IN 5.0 V " " " " " " GND 5.0 V " " " " " " " " " " " GND X IN 6 7 8 9 10 11 12 13 14 15 16 IN D IN A GND OUT E OUT D OUT C OUT B OUT A OUT G OUT F VCC GND " " " " " " " 5.0 V " " " " " " " X GND X GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V X GND X GND " " " " " " " " " " " " " " " " " " H L H L " " H L H L H L " " H L " " H H L H H L H H L H L H H L H H L " " H H H L H " " " " " " L H L " " " " " H H " " " " L L H " " L L H L " " " " H H L H H L H L H " " L " " H L " " " H L L H " " " " L H " " " " " " L " " H H L " " H " " L H H L L H " " L " " H 5.0 V " " " " " " " " " " " " " " " " " " GND " " " " " " " " " " 5.0 V GND " " " " IN IN IN GND X GND IN " " " " " " " GND " " " 5.0 V 5.0 V GND " " " " " " X GND GND " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT 5.0 V " " " " " " " " " " " " " " " " " " " " " " Measured terminal Limits Min Unit Max 3/ IN A to A IN A to D IN A to E IN A to F IN A to A IN A to B IN A to D IN A to RBO IN B to C IN B to F IN B to G IN B to A IN B to F IN B to G IN B to E IN C to D IN C to B IN D to A IN D to B IN D to C LT to A RBO to A RBI to A 8 " " " " " " " " " " " " " " " " " " " " " " 104 " " " " " " " " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D Truth table test 9 tPHL Tc = 25C tPLH Cases E, F TABLE III. Group A inspection for device type 08. Terminal conditions (pins not designated may be high 2.4 V or low 0.8 V; or open). MIL-STDSubgroup Symbol 10 Tc = 125C 44 1/ 2/ 3/ 1 2 3 4 5 883 Test no. IN B IN C LT RBO RBI method 3003 156 & 157 GND GND 5.0 V 5.0 V (Fig. 7) 158 & 159 " " " " " 160 & 161 " " " " " 162 & 163 " " " " " 164 & 165 5.0 V 5.0 V " " " 166 & 167 GND 5.0 V " " " 168 & 169 5.0 V 5.0 V " " " 170 & 171 GND GND " OUT GND " 172 & 173 IN " " 5.0 V " 174 & 175 " " " " " 176 & 177 " " " " " 178 & 179 " " " " " 180 & 181 " 5.0 V " " " 182 & 183 " 5.0 V " " " 184 & 185 " 5.0 V " " " 186 & 187 " IN " " " 188 & 189 5.0 V IN " " " 190 & 191 " GND " " " 192 & 193 " GND " " " 194 & 195 GND 5.0 V " " " 196 & 197 GND GND IN GND " 198 & 199 X X GND IN X " 200 & 201 GND GND 5.0 V IN Same tests, terminal conditions, and limits as subgroup 10 except TC = -55C. tPHL tPLH 6 7 8 9 10 11 12 13 14 15 IN D GND " " " " " " " " " " 5.0 V GND " " " " IN IN IN GND X GND IN A GND OUT E OUT D OUT C OUT B OUT A OUT G OUT F IN " " " " " " " GND " " " 5.0 V 5.0 V GND " " " " " " X GND GND " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT X = Input may be high level or low level. CKT except B. Output voltages shall be either: (a) H = 2.4 volts minimum and L = 0.4 volts minimum when using high speed checker double comparator, or (b) H 1.5 volts and L 1.5 volts when using a high speed checker single comparator. OUT OUT OUT 16 Measured terminal VCC 5.0 V " " " " " " " " " " " " " " " " " " " " " " IN A to A IN A to D IN A to E IN A to F IN A to A IN A to B IN A to D IN A to RBO IN B to C IN B to F IN B to G IN B to A IN B to F IN B to G IN B to E IN C to D IN C to B IN D to A IN D to B IN D to C LT to A RBO to A RBI to A Limits Unit Min Max 8 " " " " " " " " " " " " " " " " " " " " " " 144 " " " " " " " " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D 11 Cases E, F TABLE III. Group A inspection for device type 09. Terminal conditions (pins not designated may be high 2.0 V or low 0.8 V or open). Subgroup 1 Tc = 25C Symbol VOL 1/ MIL-STD883 method 3007 " " " " " " ICEX VI C 45 IIH1 IIH2 ICC 2 3 3009 " " " " " " " " " 3010 " " " " 3010 " " " " 3005 2 3 4 5 6 7 8 9 10 11 12 13 14 IN C X " " " " " " 0.8 V " " " " " " BI 0.8 V " " " " " " 2.0 V " " " " " " IN D X " " " " " " 2.0 V " " " " " " IN A X " " " " " " 0.8 V " " " " " " -12 mA OUT E 10 mA GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " OUT D OUT C OUT B OUT A OUT G OUT F VCC 4.5 V " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " 5.5 V -12 mA -12 mA 5.5 V " " " 0.4 V 0.4 V 5.5 V " " " GND GND 2.4 V GND " " " 5.5 V GND " GND -12 mA 5.5 V " " " " " " " 0.4 V 0.4 V GND " " " 2.4 V GND " " " 5.5 V GND 5.5 V " " " " " 0.4 V 0.4 V 5.5 V 5.5 V GND " " 2.4 V GND " " " 5.5 V GND GND 0.4 V 0.4 V 5.5 V " " " " " " " 2.4 V GND " " " 5.5 V GND " " " GND Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. See footnotes at end of device type 09. 10 mA 10 mA 10 mA 10 mA 10 mA 10 mA 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V Measured terminal E D C B A G F E D C B A G F IN A IN B IN C IN D BI IN A IN A IN B IN B IN C IN C IN D IN D BI BI IN A IN B IN C IN D BI IN A IN B IN C IN D BI VCC Limits Min Max 0.4 " " " " " " 250 " " " " " " -1.5 " " " " -0.7 -1.6 -0.4 -1.3 -0.7 -1.6 -0.4 -1.3 -0.7 -1.6 -0.4 -1.3 -0.7 -1.6 -0.4 -1.3 -0.7 -1.6 -0.4 -1.3 40 " " " " 100 " " " " 47 Unit V " " " " " " A " " " " " " " " " " " mA " " " " " " " " " A " " " " A " " " " mA MIL-M-38510/10D IIL Cases 1 A,B,C,D Test no. IN B 1 X 2 " 3 " 4 " 5 " 6 " 7 " 8 0.8 V 9 " 10 " 11 " 12 " 13 " 14 " 15 16 -12 mA 17 18 19 20 2/ 5.5 V 20 CKT C 5.5 V 21 2/ 0.4 V 21 CKT C 0.4 V 22 2/ 5.5 V 22 CKT C " 23 2/ " 23 CKT C " 24 2/ " 24 CKT C " 25 GND 26 2.4 V 27 GND 28 " 29 " 30 " 31 5.5 V 32 GND 33 " 34 " 35 GND TABLE III. Group A inspection for device type 09 - Continued. Terminal conditions (pins not designated may be high 2.0 V or low 0.8 V or open). Subgroup 7 Tc = 25C 8 46 MIL-STD883 method Truth table test Truth table test tPHL tPLH 3003 (Fig 8) Cases A,B,C,D Test no. 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 to 69 70 to 76 77 & 78 79 & 80 81 & 82 83 & 84 85 & 86 87 & 88 89 & 90 91 & 92 93 & 94 95 & 96 97 & 98 99 & 100 101 & 102 103 & 104 105 & 106 107 & 108 109 & 110 111 & 112 113 & 114 115 & 116 See notes at end of device type 09. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 IN B GND " 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V X IN C GND " " " 5.0 V " " " GND " " " 5.0 V " " " X BI IN D GND " " " " " " " 5.0 V " " " " " " " X IN A GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V X OUT E H L H L L L H L H L H L L L H L L GND GND " " " " " " " " " " " " " " " " OUT D H L H H L H H L H L H H L H H L L OUT C H H L H " " " " " " L H L " " " " OUT B H " " " " L L H " " L L H L " " " OUT A H L H H L H L H " " L " " H L " " OUT G L L H " " " " L H " " " " " " L L OUT F H L " " H " " L H H L L H " " L L VCC 5.5 V " " " " " " " " " " " " " " " " GND " " " 5.0 V GND 5.0 V IN " " " " " " GND 5.0 V GND 5.0 V GND GND GND " " " 5.0 V 5.0 V 5.0 V GND " " " 5.0 V 5.0 V 5.0 V IN IN GND GND 5.0 V GND 5.0 V " " " " " " " " " " " " " " " " " " IN GND " " " " " " " " " 5.0 V GND " " " " IN IN IN GND IN " " " " " " GND " " " 5.0 V GND 5.0 V GND GND GND 5.0 V GND GND GND Same tests as subgroup 7, except TC = 125C. Same tests as subgroup 7, except TC = -55C. OUT OUT GND " " " " " " " " " " " " " " " " " " " OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT 5.0 V " " " " " " " " " " " " " " " " " " " Measured terminal Limits Min Max Unit 3/ IN A to A IN A to D IN A to E IN A to F IN A to A IN A to B IN A to D IN B to C IN B to F IN B to G IN B to A IN B to F IN B to E IN B to G IN C to D IN C to B IN D to G IN D to B IN D to C BI to A 8 " " " " " " " " " " " " " " " " " " " 104 " " " " " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D 9 Tc = 25C Symbol TABLE III. Group A inspection for device type 09 - Continued. Terminal conditions (pins not designated may be high 2.0 V or low 0.8 V or open). 47 1/ 2/ 3/ 7 8 9 10 11 12 13 14 GND GND " " " " " " " " " " " " " " " " " " " OUT D OUT C OUT B OUT A OUT OUT G OUT F VCC 5.0 V " " " " " " " " " " " " " " " " " " " Symbol OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT OUT X = Input may be high level or low level. CKT except B. Output voltages shall be either: (a) H = 2.4 volts minimum and L = 0.4 volts minimum when using high speed checker double comparator, or (b) H 1.5 volts and L 1.5 volts when using a high speed checker single comparator. OUT Measured terminal IN A to A IN A to D IN A to E IN A to F IN A to A IN A to B IN A to D IN B to C IN B to F IN B to G IN B to A IN B to F IN B to E IN B to G IN C to D IN C to B IN D to G IN D to B IN D to C BI to A Limits Min Max 8 144 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Unit ns " " " " " " " " " " " " " " " " " " " MIL-M-38510/10D MIL-STDCases 1 2 3 4 5 6 883 A,B,C,D method Test no. IN B IN C BI IN D IN A OUT E GND GND IN 10 tPHL 3003 117 & 118 GND 5.0 V " " " " (Fig 8) 119 & 120 " Tc = 125C tPLH " " " " 121 & 122 " OUT " " " " 123 & 124 " 5.0 V " " 125 & 126 5.0 V " 5.0 V " " 127 & 128 GND " 5.0 V " " 129 & 130 5.0 V " IN GND " GND 131 & 132 " " " " " 133 & 134 " " " " " 135 & 136 " " " 5.0 V " 137 & 138 " " 5.0 V GND 5.0 V 139 & 140 " " 5.0 V " GND 141 & 142 " OUT " 5.0 V " 5.0 V 143 & 144 " IN " GND 145 & 146 GND " IN " GND 147 & 148 5.0 V " GND IN GND 149 & 150 GND " GND IN 5.0 V 151 & 152 5.0 V " 5.0 V IN GND 153 & 154 GND " GND GND GND 155 & 156 GND IN 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. Subgroup MIL-M-38510/10D 5. PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense Agency, or within the military service's system command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity. 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but it is not mandatory) 6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of the specification. b. PIN and compliance identifier, if applicable (see 1.2). c. Requirements for delivery of one copy of the conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. d. Requirements for certificate of compliance, if applicable. e. Requirements for notification of change of product or process to contracting activity in addition to notification to the qualifying activity, if applicable. f. Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883), corrective action, and reporting of results, if applicable. g. Requirements for product assurance options. h. Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should not affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by or direct shipment to the Government. i. Requirements for "JAN" marking. j. Packaging requirements (see 5.1). 6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199. 6.4 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists. 48 MIL-M-38510/10D 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535, MIL-HDBK-1331, and as follows: GND ............................................ Ground zero voltage potential VIN ............................................... Voltage level at an input terminal IIN ................................................. Current flowing into an input terminal 6.6 Logistic support. Lead materials and finishes (see 3.4) are interchangeable. Unless otherwise specified, microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.4). Longer length leads and lead forming should not affect the part number. 6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M-35810 device types and may have slight physical variations in relation to case size. The presence of this information should not be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535. Military device type Generic-industry type 01 02 03 04 05 06 07 08 09 5442 5443 5444 5445 54145 5446 5447 5448 5449 6.8 Manufacturers' designation. Manufacturers' circuits which form a part of this specification are designated with an "X" as shown in table IV herein. TABLE IV. Manufacturers' designations. Device type 01 04 05 06 07 08 Texas Instruments D C C C C B Signetics C A A B B C Circuit National Semiconductor/ Fairchild Semiconductor E E E D D E Motorola Inc. B B B Fairchild A D D A 6.9 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. 49 MIL-M-38510/10D Custodians: Army - CR Navy - EC Air Force - 11 DLA - CC Preparing activity: DLA - CC (Project 5962-2093) Review activities: Army - MI, SM Navy - AS, CG, MC, SH, TD Air Force - 03, 19, 99 NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at http://assist.daps.dla.mil. 50