SST39VF010-90-4C-B3KE - Silicon Storage Technology, Inc.

S71150-03-000 2/02 395

The SST logo and SuperFlash are registered trademarks of Silicon Storage Technology, Inc.

Multi-Purpose Flash and MPF are trademarks of Silicon Storage Technology, Inc.

These specifications are subject to change without notice.

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit (x8) Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FEATURES:

• Organized as 64K x8 / 128K x8 / 256K x8 / 512K x8

• Single Voltage Read and Write Operations

– 3.0-3.6V for SST39LF512/010/020/040

– 2.7-3.6V for SST39VF512/010/020/040

• Superior Reliability

– Endurance: 100,000 Cycles (typical)

– Greater than 100 years Data Retention

• Low Power Consumption:

– Active Current: 10 mA (typical)

– Standby Current: 1 µA (typical)

• Sector-Erase Capability

– Uniform 4 KByte sectors

• Fast Read Access Time:

– 45 ns for SST39LF512/010/020/040

– 55 ns for SST39LF020/040

– 70 and 90 ns for SST39VF512/010/020/040

• Latched Address and Data

• Fast Erase and Byte-Program:

– Sector-Erase Time: 18 ms (typical)

– Chip-Erase Time: 70 ms (typical)

– Byte-Program Time: 14 µs (typical)

– Chip Rewrite Time:

1 second (typical) for SST39LF/VF512

2 seconds (typical) for SST39LF/VF010

4 seconds (typical) for SST39LF/VF020

8 seconds (typical) for SST39LF/VF040

• Automatic Write Timing

– Internal VPP Generation

• End-of-Write Detection

– Toggle Bit

– Data# Polling

• CMOS I/O Compatibility

• JEDEC Standard

– Flash EEPROM Pinouts and command sets

• Packages Available

– 32-lead PLCC

– 32-lead TSOP (8mm x 14mm)

– 48-ball TFBGA (6mm x 8mm) for 1 Mbit

PRODUCT DESCRIPTION

The SST39LF512/010/020/040 and SST39VF512/010/

020/040 are 64K x8, 128K x8, 256K x8 and 5124K x8

CMOS Multi-Purpose Flash (MPF) manufactured with

SST’s proprietary, high performance CMOS SuperFlash

technology. The split-gate cell design and thick oxide tun-

neling injector attain better reliability and manufacturability

compared with alternate approaches. The SST39LF512/

010/020/040 devices write (Program or Erase) with a 3.0-

3.6V power supply. The SST39VF512/010/020/040

devices write with a 2.7-3.6V power supply. The devices

conform to JEDEC standard pinouts for x8 memories.

Featuring high performance Byte-Program, the

SST39LF512/010/020/040 and SST39VF512/010/020/

040 devices provide a maximum Byte-Program time of 20

µsec. These devices use Toggle Bit or Data# Polling to indi-

cate the completion of Program operation. To protect

against inadvertent write, they have on-chip hardware and

Software Data Protection schemes. Designed, manufac-

tured, and tested for a wide spectrum of applications, they

are offered with a guaranteed endurance of 10,000 cycles.

Data retention is rated at greater than 100 years.

The SST39LF512/010/020/040 and SST39VF512/010/

020/040 devices are suited for applications that require

convenient and economical updating of program, configu-

ration, or data memory. For all system applications, they

significantly improves performance and reliability, while low-

ering power consumption. They inherently use less energy

during Erase and Program than alternative flash technolo-

gies. The total energy consumed is a function of the

applied voltage, current, and time of application. Since for

any given voltage range, the SuperFlash technology uses

less current to program and has a shorter erase time, the

total energy consumed during any Erase or Program oper-

ation is less than alternative flash technologies. These

devices also improve flexibility while lowering the cost for

program, data, and configuration storage applications.

The SuperFlash technology provides fixed Erase and Pro-

gram times, independent of the number of Erase/Program

cycles that have occurred. Therefore the system software

or hardware does not have to be modified or de-rated as is

necessary with alternative flash technologies, whose Erase

and Program times increase with accumulated Erase/Pro-

gram cycles.

To meet surface mount requirements, the SST39LF512/

010/020/040 and SST39VF512/010/020/040 devices are

offered in 32-lead PLCC and 32-lead TSOP packages. The

39LF/VF010 is also offered in a 48-ball TFBGA package.

See Figures 1 and 2 for pinouts.

SST39LF/VF512 / 010 / 020 / 0403.0 & 2.7V 512Kb / 1Mb / 2Mb / 4Mb (x8) MPF memories

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

Device Operation

Commands are used to initiate the memory operation func-

tions of the device. Commands are written to the device

using standard microprocessor write sequences. A com-

mand is written by asserting WE# low while keeping CE#

low. The address bus is latched on the falling edge of WE#

or CE#, whichever occurs last. The data bus is latched on

the rising edge of WE# or CE#, whichever occurs first.

Read

The Read operation of the SST39LF512/010/020/040 and

SST39VF512/010/020/040 device is controlled by CE#

and OE#, both have to be low for the system to obtain data

from the outputs. CE# is used for device selection. When

CE# is high, the chip is deselected and only standby power

is consumed. OE# is the output control and is used to gate

data from the output pins. The data bus is in high imped-

ance state when either CE# or OE# is high. Refer to the

Read cycle timing diagram for further details (Figure 4).

Byte-Program Operation

The SST39LF512/010/020/040 and SST39VF512/010/

020/040 are programmed on a byte-by-byte basis. Before

programming, the sector where the byte exists must be

fully erased. The Program operation is accomplished in

three steps. The first step is the three-byte load sequence

for Software Data Protection. The second step is to load

byte address and byte data. During the Byte-Program

operation, the addresses are latched on the falling edge of

either CE# or WE#, whichever occurs last. The data is

latched on the rising edge of either CE# or WE#, whichever

occurs first. The third step is the internal Program operation

which is initiated after the rising edge of the fourth WE# or

CE#, whichever occurs first. The Program operation, once

initiated, will be completed, within 20 µs. See Figures 5 and

6 for WE# and CE# controlled Program operation timing

diagrams and Figure 15 for flowcharts. During the Program

operation, the only valid reads are Data# Polling and Tog-

gle Bit. During the internal Program operation, the host is

free to perform additional tasks. Any commands written

during the internal Program operation will be ignored.

Sector-Erase Operation

The Sector-Erase operation allows the system to erase the

device on a sector-by-sector basis. The sector architecture

is based on uniform sector size of 4 KByte. The Sector-

Erase operation is initiated by executing a six-byte com-

mand sequence with Sector-Erase command (30H) and

sector address (SA) in the last bus cycle. The sector

address is latched on the falling edge of the sixth WE#

pulse, while the command (30H) is latched on the rising

edge of the sixth WE# pulse. The internal Erase operation

begins after the sixth WE# pulse. The End-of-Erase can be

determined using either Data# Polling or Toggle Bit meth-

ods. See Figure 9 for timing waveforms. Any commands

written during the Sector-Erase operation will be ignored.

Chip-Erase Operation

The SST39LF512/010/020/040 and SST39VF512/010/

020/040 devices provide a Chip-Erase operation, which

allows the user to erase the entire memory array to the ‘1’s

state. This is useful when the entire device must be quickly

erased.

The Chip-Erase operation is initiated by executing a six-

byte Software Data Protection command sequence with

Chip-Erase command (10H) with address 5555H in the last

byte sequence. The internal Erase operation begins with

the rising edge of the sixth WE# or CE#, whichever occurs

first. During the internal Erase operation, the only valid read

is Toggle Bit or Data# Polling. See Table 4 for the command

sequence, Figure 10 for timing diagram, and Figure 18 for

the flowchart. Any commands written during the Chip-

Erase operation will be ignored.

Write Operation Status Detection

The SST39LF512/010/020/040 and SST39VF512/010/

020/040 devices provide two software means to detect the

completion of a Write (Program or Erase) cycle, in order to

optimize the system write cycle time. The software detec-

tion includes two status bits: Data# Polling (DQ7) and Tog-

gle Bit (DQ6). The End-of-Write detection mode is enabled

after the rising edge of WE# which initiates the internal Pro-

gram or Erase operation.

The actual completion of the nonvolatile write is asynchro-

nous with the system; therefore, either a Data# Polling or

Toggle Bit read may be simultaneous with the completion

of the Write cycle. If this occurs, the system may possibly

get an erroneous result, i.e., valid data may appear to con-

flict with either DQ7 or DQ6. In order to prevent spurious

rejection, if an erroneous result occurs, the software routine

should include a loop to read the accessed location an

additional two (2) times. If both reads are valid, then the

device has completed the Write cycle, otherwise the rejec-

tion is valid.

Data Sheet
512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash
SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040
SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040
3
©2002 Silicon Storage Technology, Inc. S71150-03-000 2/02 395
Data# Polling (DQ7)
When the SST39LF512/010/020/040 and SST39VF512/
010/020/040 are in the internal Program operation, any
attempt to read DQ7 will produce the complement of the
true data. Once the Program operation is completed, DQ7
will produce true data. Note that even though DQ7 may
have valid data immediately following completion of an
internal Write operation, the remaining data outputs may
still be invalid: valid data on the entire data bus will appear
in subsequent successive Read cycles after an interval of 1
µs. During internal Erase operation, any attempt to read
DQ7 will produce a “0”. Once the internal Erase operation is
completed, DQ7 will produce a “1”. The Data# Polling is
valid after the rising edge of fourth WE# (or CE#) pulse for
Program operation. For Sector- or Chip-Erase, the Data#
Polling is valid after the rising edge of sixth WE# (or CE#)
pulse. See Figure 7 for Data# Polling timing diagram and
Figure 16 for a flowchart.
Toggle Bit (DQ6)
During the internal Program or Erase operation, any con-
secutive attempts to read DQ6 will produce alternating ‘0’s
and ‘1’s, i.e., toggling between 0 and 1. When the internal
Program or Erase operation is completed, the toggling will
stop. The device is then ready for the next operation. The
Toggle Bit is valid after the rising edge of fourth WE# (or
CE#) pulse for Program operation. For Sector- or Chip-
Erase, the Toggle Bit is valid after the rising edge of sixth
WE# (or CE#) pulse. See Figure 8 for Toggle Bit timing dia-
gram and Figure 16 for a flowchart. 
Data Protection
The SST39LF512/010/020/040 and SST39VF512/010/
020/040 provide both hardware and software features to
protect nonvolatile data from inadvertent writes.
Hardware Data Protection
Noise/Glitch Protection: A WE# or CE# pulse of less than 5
ns will not initiate a Write cycle.
VDD Power Up/Down Detection: The Write operation is
inhibited when VDD is less than 1.5V.
Write Inhibit Mode: Forcing OE# low, CE# high, or WE#
high will inhibit the Write operation. This prevents inadvert-
ent writes during power-up or power-down.
Software Data Protection (SDP)
The SST39LF512/010/020/040 and SST39VF512/010/
020/040 provide the JEDEC approved Software Data Pro-
tection scheme for all data alteration operation, i.e., Pro-
gram and Erase. Any Program operation requires the
inclusion of a series of three-byte sequence. The three-byte
load sequence is used to initiate the Program operation,
providing optimal protection from inadvertent Write opera-
tions, e.g., during the system power-up or power-down.
Any Erase operation requires the inclusion of six-byte load
sequence. These devices are shipped with the Software
Data Protection permanently enabled. See Table 4 for the
specific software command codes. During SDP command
sequence, invalid commands will abort the device to read
mode, within TRC.
Product Identification
The Product Identification mode identifies the devices as
the SST39LF/VF512, SST39LF/VF010, SST39LF/VF020
and SST39LF/VF040 and manufacturer as SST. This
mode may be accessed by software operations. Users
may use the Software Product Identification operation to
identify the part (i.e., using the device ID) when using multi-
ple manufacturers in the same socket. For details, see
Table 4 for software operation, Figure 11 for the Software
ID Entry and Read timing diagram, and Figure 17 for the
Software ID entry command sequence flowchart.
Product Identification Mode Exit/Reset
In order to return to the standard Read mode, the Software
Product Identification mode must be exited. Exit is accom-
plished by issuing the Software ID Exit command
sequence, which returns the device to the Read operation.
Please note that the Software ID Exit command is ignored
during an internal Program or Erase operation. See Table 4
for software command codes, Figure 12 for timing wave-
form, and Figure 17 for a flowchart.
TABLE 1: PRODUCT IDENTIFICATION
Address Data
Manufacturer’s ID 0000H BFH
Device ID
SST39LF/VF512 0001H D4H
SST39LF/VF010 0001H D5H
SST39LF/VF020 0001H D6H
SST39LF/VF040 0001H D7H
T1.1 395

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 1: PIN ASSIGNMENTS FOR 32-LEAD PLCC

Y-Decoder

I/O Buffers and Data Latches

395 ILL B1.1

Address Buffers & Latches

X-Decoder

DQ7 - DQ0

Memory Address

OE#

CE#

WE#

SuperFlash

Memory

Control Logic

FUNCTIONAL BLOCK DIAGRAM

DQ0

A14

A13

A11

OE#

A10

CE#

DQ7

A14

A13

A11

OE#

A10

CE#

DQ7

A14

A13

A11

OE#

A10

CE#

DQ7

A14

A13

A11

OE#

A10

CE#

DQ7

4 3 2 1 32 31 30

A12

A15

VDD

WE#

A12

A15

A16

VDD

WE#

A12

A15

A16

VDD

WE#

A17

A12

A15

A16

A18

VDD

WE#

A17

32-lead PLCC

Top View

395 ILL F02b.3

14 15 16 17 18 19 20

DQ1

DQ2

VSS

DQ3

DQ4

DQ5

DQ6

DQ1

DQ2

VSS

DQ3

DQ4

DQ5

DQ6

DQ1

DQ2

VSS

DQ3

DQ4

DQ5

DQ6

DQ1

DQ2

VSS

DQ3

DQ4

DQ5

DQ6

SST39LF/VF512SST39LF/VF010SST39LF/VF020SST39LF/VF040 SST39LF/VF010 SST39LF/VF020 SST39LF/VF040SST39LF/VF512

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 2: PIN ASSIGNMENTS FOR 32-LEAD TSOP (8MM X 14MM)

FIGURE 3: PIN ASSIGNMENT FOR 48-BALL TFBGA (6MM X 8MM) FOR 1 MBIT

A11

A13

A14

WE#

VDD

A15

A12

A11

A13

A14

WE#

VDD

A16

A15

A12

A11

A13

A14

A17

WE#

VDD

A16

A15

A12

A11

A13

A14

A17

WE#

VDD

A18

A16

A15

A12

SST39LF/VF512SST39LF/VF010SST39LF/VF020SST39LF/VF040 SST39LF/VF010 SST39LF/VF020 SST39LF/VF040SST39LF/VF512

OE#

A10

CE#

DQ7

DQ6

DQ5

DQ4

DQ3

VSS

DQ2

DQ1

DQ0

OE#

A10

CE#

DQ7

DQ6

DQ5

DQ4

DQ3

VSS

DQ2

DQ1

DQ0

OE#

A10

CE#

DQ7

DQ6

DQ5

DQ4

DQ3

VSS

DQ2

DQ1

DQ0

OE#

A10

CE#

DQ7

DQ6

DQ5

DQ4

DQ3

VSS

DQ2

DQ1

DQ0

395 ILL F01.0

Standard Pinout

Top View

Die Up

395 ILL F01a.0.eps

A B C D E F G H

SST39LF/VF010

TOP VIEW (balls facing down)

A14

WE#

A13

A15

A11

A16

A12

DQ5

DQ2

DQ0

A10

DQ3

CE#

DQ6

VDD

OE#

VSS

DQ7

DQ4

DQ1

VSS

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

TABLE 2: PIN DESCRIPTION

Symbol Pin Name Functions

AMS1-A0Address Inputs To provide memory addresses. During Sector-Erase AMS-A12 address lines will select the

sector. During Block-Erase AMS-A16 address lines will select the block.

DQ7-DQ0Data Input/output To output data during Read cycles and receive input data during Write cycles.

Data is internally latched during a Write cycle.

The outputs are in tri-state when OE# or CE# is high.

CE# Chip Enable To activate the device when CE# is low.

OE# Output Enable To gate the data output buffers.

WE# Write Enable To control the Write operations.

VDD Power Supply To provide power supply voltage: 3.0-3.6V for SST39LF512/010/020/040

2.7-3.6V for SST39VF512/010/020/040

VSS Ground

NC No Connection Unconnected pins.

T2.1 395

1. AMS = Most significant address

AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020, and A18 for SST39LF/VF040

TABLE 3: OPERATION MODES SELECTION

Mode CE# OE# WE# DQ Address

Read VIL VIL VIH DOUT AIN

Program VIL VIH VIL DIN AIN

Erase VIL VIH VIL X1

1. X can be VIL or VIH, but no other value.

Sector address,

XXH for Chip-Erase

Standby VIH XXHigh Z X

Write Inhibit X VIL XHigh Z/ D

OUT X

XXV

IH High Z/ DOUT X

Product Identification

Software Mode VIL VIL VIH See Table 4

T3.4 395

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

TABLE 4: SOFTWARE COMMAND SEQUENCE

Command

Sequence

1st Bus

Write Cycle

2nd Bus

Write Cycle

3rd Bus

Write Cycle

4th Bus

Write Cycle

5th Bus

Write Cycle

6th Bus

Write Cycle

Addr1Data Addr1Data Addr1Data Addr1Data Addr1Data Addr1Data

Byte-Program 5555H AAH 2AAAH 55H 5555H A0H BA2Data

Sector-Erase 5555H AAH 2AAAH 55H 5555H 80H 5555H AAH 2AAAH 55H SAX330H

Chip-Erase 5555H AAH 2AAAH 55H 5555H 80H 5555H AAH 2AAAH 55H 5555H 10H

Software ID Entry4,5 5555H AAH 2AAAH 55H 5555H 90H

Software ID Exit6XXH F0H

Software ID Exit65555H AAH 2AAAH 55H 5555H F0H

T4.2 395

1. Address format A14-A0 (Hex),

Address A15 can be VIL or VIH, but no other value, for the Command sequence for SST39LF/VF512.

Addresses AMS-A15 can be VIL or VIH, but no other value, for the Command sequence.

AMS = Most significant address

AMS = A15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020, and A18 for SST39LF/VF040

2. BA = Program Byte address

3. SAX for Sector-Erase; uses AMS-A12 address lines

4. The device does not remain in Software Product ID mode if powered down.

5. With AMS-A1 = 0; SST Manufacturer’s ID = BFH, is read with A0 = 0,

SST39LF/VF512 Device ID = D4H, is read with A0 = 1

SST39LF/VF010 Device ID = D5H, is read with A0 = 1

SST39LF/VF020 Device ID = D6H, is read with A0 = 1

SST39LF/VF040 Device ID = D7H, is read with A0 = 1

6. Both Software ID Exit operations are equivalent

Absolute Maximum Stress Ratings (Applied conditions greater than those listed under “Absolute Maximum

Stress Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation

of the device at these conditions or conditions greater than those defined in the operational sections of this data

sheet is not implied. Exposure to absolute maximum stress rating conditions may affect device reliability.)

Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55°C to +125°C

Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65°C to +150°C

D. C. Voltage on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to VDD+0.5V

Transient Voltage (<20 ns) on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -2.0V to VDD+2.0V

Voltage on A9 Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 13.2V

Package Power Dissipation Capability (Ta = 25°C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.0W

Output Short Circuit Current1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA

1. Outputs shorted for no more than one second. No more than one output shorted at a time.

OPERATING RANGE FOR SST39LF512/010/020/040

Range Ambient Temp VDD

Commercial 0°C to +70°C 3.0-3.6V

OPERATING RANGE FOR SST39VF512/010/020/040

Range Ambient Temp VDD

Commercial 0°C to +70°C 2.7-3.6V

Industrial -40°C to +85°C 2.7-3.6V

AC CONDITIONS OF TEST

Input Rise/Fall Time . . . . . . . . . . . . . . . 5 ns

Output Load

CL = 30 pF for SST39LF512/010/020/040

CL = 100 pF for SST39VF512/010/020/040

See Figures 13 and 14

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

TABLE 5: DC OPERATING CHARACTERISTICS

VDD = 3.0-3.6V FOR SST39LF512/010/020/040 AND 2.7-3.6V FOR SST39VF512/010/020/040

Symbol Parameter

Limits

Test ConditionsMin Max Units

IDD Power Supply Current Address input=VIL/VIH, at f=1/TRC Min

VDD=VDD Max

Read 20 mA CE#=OE#=VIL, WE#=VIH, all I/Os open

Write 20 mA CE#=WE#=VIL, OE#=VIH

ISB Standby VDD Current 15 µA CE#=VIHC, VDD=VDD Max

ILI Input Leakage Current 1 µA VIN=GND to VDD, VDD=VDD Max

ILO Output Leakage Current 10 µA VOUT=GND to VDD, VDD=VDD Max

VIL Input Low Voltage 0.8 V VDD=VDD Min

VIH Input High Voltage 0.7VDD VV

DD=VDD Max

VIHC Input High Voltage (CMOS) VDD-0.3 V VDD=VDD Max

VOL Output Low Voltage 0.2 V IOL=100 µA, VDD=VDD Min

VOH Output High Voltage VDD-0.2 V IOH=-100 µA, VDD=VDD Min

T5.2 395

TABLE 6: RECOMMENDED SYSTEM POWER-UP TIMINGS

Symbol Parameter Minimum Units

TPU-READ1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

Power-up to Read Operation 100 µs

TPU-WRITE1Power-up to Program/Erase Operation 100 µs

T6.1 395

TABLE 7: CAPACITANCE (Ta = 25°C, f=1 Mhz, other pins open)

Parameter Description Test Condition Maximum

CI/O1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

I/O Pin Capacitance VI/O = 0V 12 pF

CIN1Input Capacitance VIN = 0V 6 pF

T7.0 395

TABLE 8: RELIABILITY CHARACTERISTICS

Symbol Parameter Minimum Specification Units Test Method

NEND1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

Endurance 10,000 Cycles JEDEC Standard A117

TDR1Data Retention 100 Years JEDEC Standard A103

ILTH 1Latch Up 100 + IDD mA JEDEC Standard 78

T8.2 395

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

AC CHARACTERISTICS

TABLE 9: READ CYCLE TIMING PARAMETERS

VDD = 3.0-3.6V FOR SST39LF512/010/020/040 AND 2.7-3.6V FOR SST39VF512/010/020/040

Symbol Parameter

SST39LF512-45

SST39LF010-45

SST39LF020-45

SST39LF040-45

SST39LF020-55

SST39LF040-55

SST39VF512-70

SST39VF010-70

SST39VF020-70

SST39VF040-70

SST39VF512-90

SST39VF010-90

SST39VF020-90

SST39VF040-90

UnitsMin Max Min Max Min Max Min Max

TRC Read Cycle Time 45 55 70 90 ns

TCE Chip Enable Access Time 45 55 70 90 ns

TAA Address Access Time 45 55 70 90 ns

TOE Output Enable Access Time 30 30 35 45 ns

TCLZ1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

CE# Low to Active Output 0 0 0 0 ns

TOLZ1OE# Low to Active Output 0 0 0 0 ns

TCHZ1CE# High to High-Z Output 15 15 25 30 ns

TOHZ1OE# High to High-Z Output 15 15 25 30 ns

TOH1Output Hold from Address Change 0000ns

T9.2 395

TABLE 10: PROGRAM/ERASE CYCLE TIMING PARAMETERS

Symbol Parameter Min Max Units

TBP Byte-Program Time 20 µs

TAS Address Setup Time 0 ns

TAH Address Hold Time 30 ns

TCS WE# and CE# Setup Time 0 ns

TCH WE# and CE# Hold Time 0 ns

TOES OE# High Setup Time 0 ns

TOEH OE# High Hold Time 10 ns

TCP CE# Pulse Width 40 ns

TWP WE# Pulse Width 40 ns

TWPH1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

WE# Pulse Width High 30 ns

TCPH1CE# Pulse Width High 30 ns

TDS Data Setup Time 40 ns

TDH1Data Hold Time 0 ns

TIDA1Software ID Access and Exit Time 150 ns

TSE Sector-Erase 25 ms

TSCE Chip-Erase 100 ms

T10.1 395

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 4: READ CYCLE TIMING DIAGRAM

FIGURE 5: WE# CONTROLLED PROGRAM CYCLE TIMING DIAGRAM

395 ILL F03.0

ADDRESS AMS-0

DQ7-0

WE#

OE#

CE# TCE

TRC TAA

TOE

TOLZVIH

HIGH-Z TCLZ TOH

TCHZ

HIGH-Z

DATA VALIDDATA VALID

TOHZ

Note: AMS = Most significant address

AMS =A

15 for SST39LF/VF512, A16 for SST39LF/VF010,

A17 for SST39LF/VF020 and A18 for SST39LF/VF040

395 ILL F04.0

ADDRESS AMS-0

DQ7-0

TDH

TWPH

TDS

TWP

TAH

TAS

TCH

TCS

CE#

SW0 SW1 SW2

5555 2AAA 5555 ADDR

AA 55 A0 DATA

INTERNAL PROGRAM OPERATION STARTS

BYTE

(ADDR/DATA)

OE#

WE#

TBP

Note: AMS = Most significant address

AMS =A

15 for SST39LF/VF512, A16 for SST39LF/VF010,

A17 for SST39LF/VF020 and A18 for SST39LF/VF040

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 6: CE# CONTROLLED PROGRAM CYCLE TIMING DIAGRAM

FIGURE 7: DATA# POLLING TIMING DIAGRAM

395 ILL F05.0

ADDRESS AMS-0

DQ7-0

TDH

TCPH

TDS

TCP

TAH

TAS

TCH

TCS

WE#

SW0 SW1 SW2

5555 2AAA 5555 ADDR

AA 55 A0 DATA

INTERNAL PROGRAM OPERATION STARTS

BYTE

(ADDR/DATA)

OE#

CE#

TBP

Note: AMS = Most significant address

AMS =A

15 for SST39LF/VF512, A16 for SST39LF/VF010,

A17 for SST39LF/VF020 and A18 for SST39LF/VF040

395 ILL F06.0

ADDRESS AMS-0

DQ7DD# D# D

WE#

OE#

CE#

TOEH

TOE

TCE

TOES

Note: AMS = Most significant address

AMS =A

15 for SST39LF/VF512, A16 for SST39LF/VF010,

A17 for SST39LF/VF020 and A18 for SST39LF/VF040

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 8: TOGGLE BIT TIMING DIAGRAM

FIGURE 9: WE# CONTROLLED SECTOR-ERASE TIMING DIAGRAM

395 ILL F07.0

ADDRESS AMS-0

DQ6

WE#

OE#

CE#

TOETOEH

TCE

TOES

TWO READ CYCLES

WITH SAME OUTPUTS

Note: AMS = Most significant address

AMS =A

15 for SST39LF/VF512, A16 for SST39LF/VF010,

A17 for SST39LF/VF020 and A18 for SST39LF/VF040

334 ILL F08.0

ADDRESS AMS-0

DQ7-0

WE#

SW0 SW1 SW2 SW3 SW4 SW5

5555 2AAA 2AAA5555 5555

55 3055AA 80 AA

SAX

OE#

CE#

SIX-BYTE CODE FOR SECTOR-ERASE

TSE

TWP

Note: This device also supports CE# controlled Sector-Erase operation. The WE# and CE# signals are

interchageable as long as minmum timings are met. (See Table 10)

SAX = Sector Address

AMS = Most significant address

AMS =A

15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020 and A18 for SST39LF/VF040

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 10: WE# CONTROLLED CHIP-ERASE TIMING DIAGRAM

FIGURE 11: SOFTWARE ID ENTRY AND READ

334 ILL F17.0

ADDRESS AMS-0

DQ7-0

WE#

SW0 SW1 SW2 SW3 SW4 SW5

5555 2AAA 2AAA5555 5555

55 1055AA 80 AA

5555

OE#

CE#

SIX-BYTE CODE FOR CHIP-ERASE

TSCE

TWP

Note: This device also supports CE# controlled Chip-Erase operation. The WE# and CE# signals are

interchageable as long as minmum timings are met. (See Table 10)

AMS = Most significant address

AMS =A

15 for SST39LF/VF512, A16 for SST39LF/VF010, A17 for SST39LF/VF020 and A18 for SST39LF/VF040

395 ILL F09.2

Note: Device ID = D4H for SST39LF/VF512, D5H for SST39LF/VF010, D6H for SST39LF/VF020, and D7H for SST39LF/VF040.

ADDRESS A14-0

TIDA

DQ7-0

WE#

SW0 SW1 SW2

5555 2AAA 5555 0000 0001

OE#

CE#

Three-byte sequence for

Software ID Entry

TWP

TWPH TAA

Device ID

55AA 90

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 12: SOFTWARE ID EXIT AND RESET

395 ILL F10.0

ADDRESS A14-0

DQ7-0

TIDA

TWP

T WHP

WE#

SW0 SW1 SW2

5555 2AAA 5555

THREE-BYTE SEQUENCE FOR

SOFTWARE ID EXIT AND RESET

OE#

CE#

AA 55 F0

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 13: AC INPUT/OUTPUT REFERENCE WAVEFORMS

FIGURE 14: A TEST LOAD EXAMPLE

395 ILL F12.1

REFERENCE POINTS OUTPUTINPUT VIT

VIHT

VILT

VOT

AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points

for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.

Note: VIT - VINPUT Tes t

VOT - VOUTPUT Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

395 ILL F11.1

TO TESTER

TO DUT

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 15: BYTE-PROGRAM ALGORITHM

395 ILL F13.1

Start

Load data: AAH

Address: 5555H

Load data: 55H

Address: 2AAAH

Load data: A0H

Address: 5555H

Load Byte

Address/Byte

Data

Wait for end of

Program (TBP,

Data# Polling

bit, or Toggle bit

operation)

Program

Completed

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 16: WAIT OPTIONS

395 ILL F14.0

Wait TBP,

TSCE, or TSE

Byte-Program/

Erase

Initiated

Internal Timer Toggle Bit

Ye s

Program/Erase

Completed

Does DQ6

match?

Read same

byte

Data# Polling

Program/Erase

Completed

Program/Erase

Completed

Read byte

Is DQ7 =

true data?

Read DQ7

Byte-Program/

Erase

Initiated

Byte-Program/

Erase

Initiated

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 17: SOFTWARE ID COMMAND FLOWCHARTS

395 ILL F15.2

Load data: AAH

Address: 5555H

Software ID Entry

Command Sequence

Load data: 55H

Address: 2AAAH

Load data: 90H

Address: 5555H

Wait TIDA

Read Software ID

Load data: AAH

Address: 5555H

Software ID Exit &

Reset Command Sequence

Load data: 55H

Address: 2AAAH

Load data: F0H

Address: 5555H

Load data: F0H

Address: XXH

Return to normal

operation

Wait TIDA

Return to normal

operation

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

FIGURE 18: ERASE COMMAND SEQUENCE

395 ILL F16.1

Load data: AAH

Address: 5555H

Chip-Erase

Command Sequence

Load data: 55H

Address: 2AAAH

Load data: 80H

Address: 5555H

Load data: 55H

Address: 2AAAH

Load data: 10H

Address: 5555H

Load data: AAH

Address: 5555H

Wait TSCE

Chip erased

to FFH

Load data: AAH

Address: 5555H

Sector-Erase

Command Sequence

Load data: 55H

Address: 2AAAH

Load data: 80H

Address: 5555H

Load data: 55H

Address: 2AAAH

Load data: 30H

Address: SAX

Load data: AAH

Address: 5555H

Wait TSE

Sector erased

to FFH

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

PRODUCT ORDERING INFORMATION

Device Speed Suffix1 Suffix2

SST39xFxxx -XX -XX-XX

Package Modifier

H = 32 leads

K = 48 balls

Package Type

B3 = TFBGA (0.8mm pitch, 6mm x 8mm)

N = PLCC

W = TSOP (type 1, die up, 8mm x 14mm)

Temperature Range

C = Commercial = 0°C to +70°C

I = Industrial = -40°C to +85°C

Minimum Endurance

4 = 10,000 cycles

Read Access Speed

45 = 45 ns

55 = 55 ns

70 = 70 ns

90 = 90 ns

Device Density

040 = 4 Mbit

020 = 2 Mbit

010 = 1 Mbit

512 = 512 Kbit

Voltage

L = 3.0-3.6V

V = 2.7-3.6V

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

Valid combinations for SST39LF512

SST39LF512-45-4C-NH SST39LF512-45-4C-WH

Valid combinations for SST39VF512

SST39VF512-70-4C-NH SST39VF512-70-4C-WH

SST39VF512-90-4C-NH SST39VF512-90-4C-WH

SST39VF512-70-4I-NH SST39VF512-70-4I-WH

SST39VF512-90-4I-NH SST39VF512-90-4I-WH

Valid combinations for SST39LF010

SST39LF010-45-4C-NH SST39LF010-45-4C-WH SST39LF010-45-4C-B3K

Valid combinations for SST39VF010

SST39VF010-70-4C-NH SST39VF010-70-4C-WH SST39VF010-70-4C-B3K

SST39VF010-90-4C-NH SST39VF010-90-4C-WH SST39VF010-90-4C-B3K

SST39VF010-70-4I-NH SST39VF010-70-4I-WH SST39VF010-70-4I-B3K

SST39VF010-90-4I-NH SST39VF010-90-4I-WH SST39VF010-90-4I-B3K

Valid combinations for SST39LF020

SST39LF020-45-4C-NH SST39LF020-45-4C-WH

SST39LF020-55-4C-NH SST39LF020-55-4C-WH

Valid combinations for SST39VF020

SST39VF020-70-4C-NH SST39VF020-70-4C-WH

SST39VF020-90-4C-NH SST39VF020-90-4C-WH

SST39VF020-70-4I-NH SST39VF020-70-4I-WH

SST39VF020-90-4I-NH SST39VF020-90-4I-WH

Valid combinations for SST39LF040

SST39LF040-45-4C-NH SST39LF040-45-4C-WH

SST39LF040-55-4C-NH SST39LF040-55-4C-WH

Valid combinations for SST39VF040

SST39VF040-70-4C-NH SST39VF040-70-4C-WH

SST39VF040-90-4C-NH SST39VF040-90-4C-WH

SST39VF040-70-4I-NH SST39VF040-70-4I-WH

SST39VF040-90-4I-NH SST39VF040-90-4I-WH

Note: Valid combinations are those products in mass production or will be in mass production. Consult your SST sales

representative to confirm availability of valid combinations and to determine availability of new combinations.

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

PACKAGING DIAGRAMS

32-LEAD PLASTIC LEAD CHIP CARRIER (PLCC)

SST PACKAGE CODE: NH

.040

.030

.021

.013

.530

.490

.095

.075

.140

.125

.032

.026

.032

.026

.029

.023

.453

.447

.553

.547

.595

.585

.495

.485 .112

.106

.042

.048

.042

.015 Min.

TOP VIEW SIDE VIEW BOTTOM VIEW

1232

.400

BSC

32-plcc-NH-3

Note: 1. Complies with JEDEC publication 95 MS-016 AE dimensions, although some dimensions may be more stringent.

2. All linear dimensions are in inches (max/min).

3. Dimensions do not include mold flash. Maximum allowable mold flash is .008 inches.

4. Coplanarity: 4 mils.

.050

BSC

.050

BSC

Optional

Pin #1

Identifier .020 R.

MAX. R.

x 30˚

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

32-LEAD THIN SMALL OUTLINE PACKAGE (TSOP) 8MM X 14MM

SST PACKAGE CODE: WH

32-tsop-WH-7

Note: 1. Complies with JEDEC publication 95 MO-142 BA dimensions,

although some dimensions may be more stringent.

2. All linear dimensions are in millimeters (max/min).

3. Coplanarity: 0.1 mm

4. Maximum allowable mold flash is 0.15 mm at the package ends, and 0.25 mm between leads.

1.20

max.

1mm

Pin # 1 Identifier

12.50

12.30

14.20

13.80

0.70

0.50

8.10

7.90 0.27

0.17

0.50

BSC

1.05

0.95

0.15

0.05

0.70

0.50

0˚- 5˚

DETAIL

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash

SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040

SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040

48-BALL THIN-PROFILE, FINE-PITCH BALL GRID ARRAY (TFBGA) 6MM X 8MM

SST PACKAGE CODE: B3K

A1 CORNER

H G F E D C B A

A B C D E F G H

BOTTOM VIEW

TOP VIEW

SIDE VIEW

SEATING PLANE

0.35 ± 0.05

1.10 ± 0.10

0.12

6.00 ± 0.20

0.45 ± 0.05

(48X)

A1 CORNER

8.00 ± 0.20

0.80

4.00

0.80

5.60

48-tfbga-B3K-6x8-450mic-2

Note: 1. Complies with JEDEC Publication 95, MO-210, variant 'AB-1',

although some dimensions may be more stringent.

2. All linear dimensions are in millimeters.

3. Coplanarity: 0.12 mm

4. The actual shape of the corners may be slightly different than as portrayed in the drawing.

1mm

Silicon Storage Technology, Inc. • 1171 Sonora Court • Sunnyvale, CA 94086 • Telephone 408-735-9110 • Fax 408-735-9036