SUP70040E
www.vishay.com Vishay Siliconix
S13-0736-Rev. A, 13-Apr-15 2Document Number: 62996
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Notes
a. Pulse test; pulse width 300 μs, duty cycle 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
Static
Drain-Source Breakdown Voltage VDS VGS = 0 V, ID = 250 μA 100 - - V
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250 μA 2.5 - 4
Gate-Body Leakage IGSS VDS = 0 V, VGS = ± 20 V - - ± 250 nA
Zero Gate Voltage Drain Current IDSS
VDS = 100 V, VGS = 0 V - - 1 μA
VDS = 100 V, VGS = 0 V, TJ = 125 °C - - 150
VDS = 100 V, VGS = 0 V, TJ = 175 °C - - 5 mA
On-State Drain Current aID(on) V
DS 10 V, VGS = 10 V 120 - - A
Drain-Source On-State Resistance aRDS(on)
VGS = 10 V, ID = 20 A - 0.0032 0.0040
VGS = 7.5 V, ID = 15 A - 0.0035 0.0046
Forward Transconductance agfs VDS = 15 V, ID = 20 A - 82 - S
Dynamic b
Input Capacitance Ciss
VGS = 0 V, VDS = 50 V, f = 1 MHz
- 5100 -
pFOutput Capacitance Coss - 2025 -
Reverse Transfer Capacitance Crss - 165 -
Total Gate Charge cQg
VDS = 50 V, VGS = 10 V, ID = 20 A
-76120
nCGate-Source Charge cQgs -23-
Gate-Drain Charge cQgd -17-
Gate Resistance Rgf = 1 MHz 0.6 3.3 6.6
Turn-On Delay Time ctd(on)
VDD = 50 V, RL = 5
ID 10 A, VGEN = 10 V, Rg = 1
-1530
ns
Rise Time ctr-2240
Turn-Off Delay Time ctd(off) -55100
Fall Time ctf-1530
Drain-Source Body Diode Ratings and Characteristics b (TC = 25 °C)
Pulsed Current ISM --480A
Forward Voltage aVSD IF = 10 A, VGS = 0 V - 0.8 1.5 V