1SS403
TO SHIBA Diode Silic on Ep itaxia l Planar Type
1SS403
High Voltage Switching Applications
AEC-Q101 Qualified (Note1)
Two-pin small packages are suitable for higher mounting densities.
Excellent in forward current and forward voltage
characteristics : VF (2) = 0.90V (typ.)
Fast reverse recovery time : trr = 60ns (max)
Small total capacitance : CT = 1.5pF (typ.)
Note1: For detail information, please contact to our sales.
Absolute Maximum Ratings (Ta = 25°C)
Characteristic Symbol Rating Unit
Maximum (peak) reverse voltage VRM 250 V
Reverse voltage VR 200 V
Maximum (peak) forward current IFM 300 mA
Average forward current IO 100 mA
Surge current (10ms) IFSM 2 A
Power dissipation P 200 * mW
Junction temperature Tj 125 °C
Storage temperature range Tstg 55 to 125 °C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operat ing temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e . reliabil ity test
report and estimated failure rate, etc).
*: When mounted on a glass epoxy board PCB: 20 mm × 20 mm ,
with copper pad 4 mm × 4 mm.
Electrical Characteristics (Ta = 25°C)
Characteristic Symbol Test
Circuit
Test Condition Min Typ. Max Unit
Forward voltage VF (1) IF = 10mA 0.72 1.0 V
VF (2)
IF = 100mA 0.90 1.2
Reverse current IR (1) VR = 50V 0.1 μA
IR (2) VR = 200V 1.0
Total capacitance CT VR = 0, f = 1MHz 1.5 3.0 pF
Reverse recovery tim e trr IF = 10mA (Fig. 1 ) 10 60 ns
JEDEC
JEITA
TOSHIBA
1-1E1A
Weight: 0.0045g (typ.)
Unit: mm
Start of commercial production
1998-10
2015-01-09
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1SS403
Fig.1 Reverse Recover y Ti me (trr) Test Circuit
Equivalent Circuit (Top View) Marking
2015-01-09
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1SS403
2015-01-09
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1SS403
RESTRICTIONS ON PRODUCT USE
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in this document, and related hardware, software and systems (collect i vely "Product") without notice.
This document and any information herein may not be reproduced without pri or written permission from TOSHIBA. Even with
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Though TOS HIBA work s c ontinually t o improve Product 's qual it y and reliability, Product can malfuncti on or fail. Cust omers are
responsibl e for compl ying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimi ze risk and avoid situations in which a malfunction or fail ure of Product could cause loss of hum an life, bodily
injury or damage to property, including data loss or corruption. Before custom ers use the Product, create designs including the
Product, or incorporat e the Product into thei r own applicati ons, c ustomers m ust also refer t o and comply with (a) the latest versions of
all relevant TOSHIBA i nformation, i ncluding without limitation, this document, the specifications, the data sheets and application notes
for Product and the precautions and conditions set fort h i n the "TOSHIBA Semiconductor Reliability Handbook " and (b) the
instruct i ons for the applicati on with which the Product will be used with or for. Customers are solely responsi bl e for all aspects o f their
own product design or applications, includi ng but not limit ed to (a) determini ng the appropri at eness of t he use of t his Product i n such
design or applications; (b) evaluat ing and determ i ni ng the applic ability of any information contained i n this docum ent, or in charts,
diagrams, programs, al gorithms , sample application circuits, or any other referenced documents; and (c) val i dat i ng al l operati ng
parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILI TY FOR CUSTOMERS' PRODUCT DESIGN OR
APPLICATIONS.
PRODUCT IS NEI THE R INTENDE D NO R WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS TH AT REQUIRE
EXTRAORDINARI LY HIGH LEVELS OF QUALITY AND/OR REL IABILITY, AND/OR A MALFUNCTI O N OR FAILURE O F WHICH
MAY CAUSE LOSS OF HUMAN LIFE, BODILY I NJURY, SERIOUS PROPERTY DAMAGE AND/OR SERIOUS PUBLIC IMPACT
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OCCURRING AS A RESULT OF NONCOMPLIANCE WIT H APPLICAB L E LAWS AND REGULATIONS.
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