113016 125
MM Series – MLCC for Medical Applications
General Specifications
The AVX MM series is a multi-layer ceramic capacitor designed for
use in medical applications other than implantable/life support.
These components have the design & change control expected for
medical devices and also offer enhanced LAT including reliability
testing and 100% inspection.
APPLICATIONS
Implantable, Non-Life Supporting Medical Devices
• e.g. implanted temporary cardiac monitor, insulin pumps
External, Life Supporting Medical Devices
• e.g. heart pump external controller
External Devices
• e.g. patient monitoring, diagnostic equipment
MM02
Size
MM02 = 0402
MM03 = 0603
MM05 = 0805
MM06 = 1206
MM10 = 1210
MM08 = 1808
MM12 = 1812
MM20 = 2220
Z
Rated
Voltage
Z = 10V
Y = 16V
3 = 25V
5 = 50V
1 = 100V
2 = 200V
V = 250V
7 = 500V
A
Dielectric
Code
A = NP0 (C0G)
C = X7R
100
Capacitance
Code (In pF)
(2 significant
digits + number
of zeros)
for values <10pF:
letter R denotes
decimal point.
Example:
68pF = 680
8.2pF = 8R2
J
Capacitance
Tolerance
B = ±0.1pF
C = ±0.25pF
D = ±0.5pF
F = ±1% (≥10pF)
G = ±2% (≥10pF)
J = ±5%
K = ±10%
M = ±20%
C
Failure Rate
C = Standard
Range
*Contact AVX
for others
T
Termination
Finish
T = Plated Ni & Sn
(NP0 only)
Z = Flexiterm
(X7R only)
HOW TO ORDER
COMMERCIAL VS MM SERIES PROCESS COMPARISON
2
Packaging
2 = 7" Reel
4 = 13" Reel
A
Special
Code
A = Standard
*Contact AVX
for others
Commercial MM Series
Administrative Standard part numbers; no restriction on Specic series part number, used to control
who purchases these parts supply of product
Design Minimum ceramic thickness of 0.020" Minimum ceramic thickness of 0.029" (0.74mm)
on all X7R product
Dicing Side & end margins = 0.003" min Side & end margins = 0.004" min
Cover layers = 0.003" min
Lot Qualification
Destructive Physical As per EIA RS469 Increased sample plan – stricter criteria
Analysis (DPA)
Visual/Cosmetic Quality Standard process and inspection 100% inspection
Standard sampling for accelerated wave Increased sampling for accelerated
Application Robustness solder on X7R dielectrics wave solder on X7R and NP0 followed
by lot by lot reliability testing
AVX will qualify and notify customers before
making any change to the following materials
Required to inform customer of changes in: or processes:
• form • Dielectric formulation, type, or supplier
Design/Change Control • t • Metal formulation, type, or supplier
• function • Termination material formulation, type, or supplier
• Manufacturing equipment type
• Quality testing regime including sample size and
accept/ reject criteria
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126 113016
MM Series – MLCC for Medical Applications
NP0 (C0G) – Specifications & Test Methods
Parameter/Test NP0 Specification Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specified tolerance Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
Q<30 pF: Q≥ 400+20 x Cap Value 1.0 kHz ± 10% for cap > 1000 pF
≥30 pF: Q≥ 1000 Voltage: 1.0Vrms ± .2V
Insulation Resistance 100,000MΩ or 1000MΩ - μF, Charge device with rated voltage for
whichever is less 60 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Appearance No defects Deflection: 2mm
Capacitance Test Time: 30 seconds
Resistance to Variation ±5% or ±.5 pF, whichever is greater
Flexure Q Meets Initial Values (As Above)
Stresses
Insulation ≥ Initial Value x 0.3
Resistance
Solderability ≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC
with fresh solder for 5.0 ± 0.5 seconds
Appearance No defects, <25% leaching of either end terminal
Capacitance
Variation ≤ ±2.5% or ±.25 pF, whichever is greater
Dip device in eutectic solder at 260ºC for 60
Q Meets Initial Values (As Above) seconds. Store at room temperature for 24 ± 2
Resistance to
hours before measuring electrical properties.
Solder Heat Insulation Meets Initial Values (As Above)
Resistance
Dielectric Meets Initial Values (As Above)
Strength
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation ≤ ±2.5% or ±.25 pF, whichever is greater Step 2: Room Temp ≤ 3 minutes
Q Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Thermal
Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Resistance
Dielectric Meets Initial Values (As Above) Repeat for 5 cycles and measure after
Strength 24 hours at room temperature
Appearance No visual defects
Capacitance
Variation ≤ ±3.0% or ± .3 pF, whichever is greater Charge device with twice rated voltage in
≥ 30 pF: Q≥ 350 test chamber set at 125ºC ± 2ºC
Load Life Q≥10 pF, <30 pF: Q≥ 275 +5C/2 for 1000 hours (+48, -0).
(C=Nominal Cap) <10 pF: Q≥ 200 +10C
Insulation ≥ Initial Value x 0.3 (See Above) Remove from test chamber and stabilize at
Resistance room temperature for 24 hours
Dielectric Meets Initial Values (As Above) before measuring.
Strength
Appearance No visual defects
Capacitance
Variation ≤ ±5.0% or ± .5 pF, whichever is greater Store in a test chamber set at 85ºC ± 2ºC/
≥ 30 pF: Q≥ 350 85% ± 5% relative humidity for 1000 hours
Load Q ≥10 pF, <30 pF: Q≥ 275 +5C/2 (+48, -0) with rated voltage applied.
Humidity <10 pF: Q≥ 200 +10C
Insulation ≥ Initial Value x 0.3 (See Above) Remove from chamber and stabilize at
Resistance room temperature for 24 ± 2 hours
Dielectric Meets Initial Values (As Above) before measuring.
Strength
1mm/sec
90 mm
113016 127
MM Series – MLCC for Medical Applications
NP0/C0G Capacitance Range
SIZE 0603 0805 1206
WVDC 16 25 50 100 16 25 50 100 16 25 50 100
Cap 0.5 0R5
(pF) 1.0 1R0
1.2 1R2
1.5 1R5
1.8 1R8
2.2 2R2
2.7 2R7
3.3 3R3
3.9 3R9
4.7 4R7
5.6 5R6
6.8 6R8
8.2 8R2
10 100
12 120
15 150
18 180
22 220
27 270
33 330
39 390
47 470
56 560
68 680
82 820
100 101
120 121
150 151
180 181
220 221
270 271
330 331
390 391
470 471
560 561
680 681
820 821
1000 102
1200 122
1500 152
WVDC 16 25 50 100 16 25 50 100 16 25 50 100
SIZE 0603 0805 1206
PREFERRED SIZES ARE SHADED
128 113016
MM Series – MLCC for Medical Applications
X7R Specifications and Test Methods
Parameter/Test X7R Specification Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specified tolerance
≤ 10% for ≥ 50V DC rating Freq.: 1.0 kHz ± 10%
Dissipation Factor ≤ 12.5% for 25V DC rating Voltage: 1.0Vrms ± .2V
≤ 12.5% for 25V and 16V DC rating
≤ 12.5% for ≤ 10V DC rating
Insulation Resistance 100,000MΩ or 1000MΩ - μF, Charge device with rated voltage for
whichever is less 120 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Appearance No defects Deflection: 2mm
Capacitance Test Time: 30 seconds
Resistance to Variation ≤ ±12%
Flexure Dissipation Meets Initial Values (As Above)
Stresses Factor
Insulation ≥ Initial Value x 0.3
Resistance
Solderability ≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC
with fresh solder for 5.0 ± 0.5 seconds
Appearance No defects, <25% leaching of either end terminal
Capacitance
Variation ≤ ±7.5%
Dip device in eutectic solder at 260ºC for 60
Dissipation Meets Initial Values (As Above) seconds. Store at room temperature for 24 ± 2
Resistance to Factor hours before measuring electrical properties.
Solder Heat Insulation Meets Initial Values (As Above)
Resistance
Dielectric Meets Initial Values (As Above)
Strength
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation ≤ ±7.5% Step 2: Room Temp ≤ 3 minutes
Dissipation Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Thermal Factor
Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Resistance
Dielectric Meets Initial Values (As Above) Repeat for 5 cycles and measure after
Strength 24 ± 2 hours at room temperature
Appearance No visual defects
Capacitance
Variation ≤ ±12.5%
Dissipation ≤ Initial Value x 2.0 (See Above)
Load Life Factor
Insulation ≥ Initial Value x 0.3 (See Above)
Resistance
Dielectric Meets Initial Values (As Above)
Strength
Appearance No visual defects
Capacitance
Variation ≤ ±12.5%
Load Dissipation ≤ Initial Value x 2.0 (See Above)
Humidity Factor
Insulation ≥ Initial Value x 0.3 (See Above)
Resistance
Dielectric Meets Initial Values (As Above)
Strength
Charge device with 1.5 rated voltage (≤ 10V) in
test chamber set at 125ºC ± 2ºC
for 1000 hours (+48, -0)
Remove from test chamber and stabilize
at room temperature for 24 ± 2 hours
before measuring.
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at
room temperature and humidity for
24 ± 2 hours before measuring.
1mm/sec
90 mm
110116 129
MM Series – MLCC for Medical Applications
X7R Capacitance Range
SIZE 0402 0603 0805 1206 1210 1808 1812 2220
WVDC 16 25 50 10 16 25 50 100 200 10 16 25 50 100 200 250 10 16 25 50 100 200 250 500 10 16 25 50 100 200 250 500 50 100 200 50 100 200 250 25 50 100
Cap 220 221
pf 270 271
330 331
390 391
470 471
560 561
680 681
820 821
1000 102
1200 122
1500 152
1800 182
2200 222
2700 272
3300 332
3900 392
4700 472
5600 562
6800 682
8200 822
cap 0.010 103
uf 0.012 123
0.015 153
0.018 183
0.022 223
0.027 273
0.033 333
0.039 393
0.047 473
0.056 563
0.068 683
0.082 823
0.10 104
0.12 124
0.15 154
0.22 224
0.33 334
0.47 474
0.56 564
0.68 684
0.82 824
1.0 105
1.2 125
1.5 155
WVDC 16 25 50 10 16 25 50 100 200 10 16 25 50 100 200 250 10 16 25 50 100 200 250 500 10 16 25 50 100 200 250 500 50 100 200 50 100 200 250 25 50 100
SIZE 0402 0603 0805 1206 1210 1808 1812 2220
PREFERRED SIZES ARE SHADED