
Product Specification
PE4273
Page 3 of 12
©2005-2012 Peregrine Semiconductor Corp. All rights reserved. Document No. 70-0174-05 │www.psemi.com
Table 2. Pin Descriptions
Table 4. Absolute Maximum Ratings
Electrostatic Discharge (ESD) Precautions
When handling this UltraCMOS® device, observe
the same precautions that you would use with
other ESD-sensitive devices. Although this
device contains circuitry to protect it from damage
due to ESD, precautions should be taken to avoid
exceeding the rating specified in Table 4.
Latch-Up Avoidance
Unlike conventional CMOS devices, UltraCMOS®
devices are immune to latch-up.
Table 3. DC Electrical Specifications
Figure 3. Pin Configuration (Top View)
1
2
3 4
5
6
V2
RFC
V1
RF1
GND
RF2
273
pin 1
Pin No. Pin Name Description
1 RF1
RF Port1 1
2 GND
Ground connection. Traces should be
physically short and connected to ground
plane for best performance.
3 RF2
RF Port2 1
4 V1 Switch control input, CMOS logic level.
5 RFC
RF Common 1
6 V2
This pin supports two interface options:
Single-pin control mode. A nominal 3-volt
supply connection is required.
Complementary-pin control mode. A com-
plementary CMOS control signal to V1
is supplied to this pin.
Symbol Parameter/Conditions Min Max Units
VDD Power supply voltage -0.3 4.0 V
VI Voltage on any input -0.3 VDD+
0.3 V
TST Storage temperature range -65 150 °C
TOP Operating temperature
range -40 85 °C
PIN
Input power (50 Ω)
100 - 3000 MHz
5 - 100 MHz
+34
+32
dBm
dBm
VESD
ESD Voltage (HBM,
ML_STD 883 Method
3015.7)
1500 V
ESD Voltage (MM, JEDEC,
JESD22-A114-B) 100 V
Parameter Min Typ Max Units
VDD Power Supply
Voltage 2.7 3.0 3.3 V
IDD Power Supply Current
(V1 = 3V, V2= 3V) 8 50 µA
Control Voltage High 0.7x VDD V
Control Voltage Low 0.3x VDD V
Note: 1. All RF pins must be DC blocked with an external series
capacitor or held at 0 VDC
Absolute Maximum Ratings are those values
listed in the above table. Exceeding these values
may cause permanent device damage.
Functional operation should be restricted to the
limits in the DC Electrical Specifications table.
Exposure to absolute maximum ratings for
extended periods may affect device reliability.