SQJA84EP
www.vishay.com Vishay Siliconix
S16-1730-Rev. A, 29-Aug-16 2Document Number: 75017
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Notes
a. Pulse test; pulse width 300 μs, duty cycle 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
SPECIFICATIONS (TC = 25 °C, unless otherwise noted)
PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
Static
Drain-Source Breakdown Voltage VDS VGS = 0, ID = 250 μA 80 - - V
Gate-Source Threshold Voltage VGS(th) VDS = VGS, ID = 250 μA 1.5 2.0 2.5
Gate-Source Leakage IGSS VDS = 0 V, VGS = ± 20 V - - ± 100 nA
Zero Gate Voltage Drain Current IDSS
VGS = 0 V VDS = 80 V - - 1
μA VGS = 0 V VDS = 80 V, TJ = 125 °C - - 50
VGS = 0 V VDS = 80 V, TJ = 175 °C - - 150
On-State Drain Current a ID(on) VGS = 10 V VDS 5 V 30 - - A
Drain-Source On-State Resistance a RDS(on)
VGS = 10 V ID = 10 A - 0.0102 0.0125
VGS = 4.5 V ID = 8 A - 0.0131 0.0160
VGS = 10 V ID = 10 A, TJ = 125 °C - - 0.0207
VGS = 10 V ID = 10 A, TJ = 175 °C - - 0.0258
Forward Transconductance b gfs VDS = 15 V, ID = 10 A - 50 - S
Dynamic b
Input Capacitance Ciss
VGS = 0 V VDS = 25 V, f = 1 MHz
- 1565 2100
pF Output Capacitance Coss - 785 1100
Reverse Transfer Capacitance Crss -3550
Total Gate Charge c Qg
VGS = 10 V VDS = 40 V, ID = 5 A
-2135
nC Gate-Source Charge c Qgs -4-
Gate-Drain Charge c Qgd -3-
Gate Resistance Rgf = 1 MHz 0.18 0.40 0.62
Turn-On Delay Time c td(on)
VDD = 40 V, RL = 8
ID 5 A, VGEN = 10 V, Rg = 1
-1118
ns
Rise Time c tr-510
Turn-Off Delay Time c td(off) -2335
Fall Time c tf-715
Source-Drain Diode Ratings and Characteristics b
Pulsed Current a ISM --100A
Forward Voltage VSD IF = 10 A, VGS = 0 - 0.82 1.2 V