
POE International Corp
M01-00-E-07
SPECIFICATION OF HIGH OHMIC CHIP RESISTOR
Ver: 1
Page: 5 of 7
CATALOGUE NUMBERS
The resistors have a catalogue number starting with :
WF06 G 226_ J T _
Size code
WF12 : 1206
WF08 : 0805
WF06 : 0603
WF04 : 0402
Type code
G : High ohmic >10MΩ
Resistance code
E24:
2 significant digits followed by
no. of zeros and a blank
11MΩ =116_
22MΩ =226_
30MΩ =306_
(“_” means a blank)
Tolerance
J : ±5%
Packaging code
T : 7” Reeled taping
B : Bulk
Termination code
_ = SnPb base (“_”
means a blank)
L = Sn base (lead
free)
1. Reeled tape packaging : 8mm width paper taping 5000pcs per 7” reel for 1206, 0805, 0603 ( 10,000pcs for 0402 )
2. Bulk packaging : 5000pcs per polybag
TEST AND REQUIREMENTS
TEST PROCEDURE REQUIREMENT
Temperature
Coefficient of
Resistance
(TCR )
Natural resistance change per change in degree centigrade.
( )
6
121
12 10×
−
ttR RR (ppm/°C)
R1 : Resistance at reference temperature
R2 : Resistance at test temperature
t1 : 25°C
Test temperature –55~+125°C
≤±300ppm/°C
Short time
overload (STOL ) Permanent resistance change after a 5second application of a
voltage 2.5 times RCWV or the maximum overload voltage
specified in the above list, whichever is less.
∆R/R max. ±(3%+0.10Ω)
Resistance to
soldering heat Unmounted chips 10±1 seconds, 260±5ºC no visible damage
∆ R/R max. ±(2%+0.10Ω)
Solderability Termination SnPb base : Unmounted chips completely
immersed for 2±0.5 sec. in a solder bath at 230±5ºC
Termination Sn base (lead free) : Unmounted chip completely
immersed in a lead free solder bath, 245°C±5°C, 3±1 sec
good tinning (>95% covered)
no visible damage
Temperature
cycling 1. 30 minutes at -55°C±3°C,
2. 2~3 minutes at room temperature,
3. 30 minutes at +125°±3°C,
4. 2~3 minutes at room temperature,
Total 5 continuous cycles
no visible damage
∆R/R max. ±(3%+0.10Ω)