FDH / FDLL 600
High Conductance Ultra Fast Diode
Sourced from Process 1R. See MMBD1201-1205 for characteristics.
Absolute Maximum Ratings* TA = 25°C unless otherwise noted
Symbol Parameter Value Units
WIV Workin g Inverse Voltage 50 V
IOAverage Rectified Current 200 mA
IFDC Forwa rd Current 400 mA
ifRecurrent Peak Forward Current 600 mA
if(surge) Peak Forward Surge Curren t
Pulse width = 1.0 second
Pulse width = 1.0 microsecond 1.0
4.0 A
A
Tstg Storage Temperature Range -65 to +200 °C
TJOperating Junction Temperature 175 °C
*These ratings are limiting values above which the serviceability of any semiconductor device may be impaired.
NOTES:
1) These ratings are based on a maximum junction temperature of 200 degrees C.
2) These are steady state limits. The factory should be consulted on applications involving pulsed or low duty cycle operations.
Thermal Characteristics TA = 25°C unless otherwise noted
Symbol Characteristic Max Units
FDH/FDLL 60 0
PDTotal D evice Dissipation
Derate above 25°C500
3.33 mW
mW/°C
RθJA Thermal Resistance, Junction to Ambient 300 °C/W
LL-34
THE PLACEMENT OF THE EXPANSION GAP
HAS NO RELATIONSHIP TO THE LOCATION
OF THE CATHODE TERMINAL
DO-35
COLOR BAND MARKING
DEVICE 1ST BA ND 2ND BAND
FDLL600 RED WHITE
FDH600 / FDLL600
Discrete POWER & Signal
Technologies
ã1997 Fairchild Semiconductor Corporation
Electrical Characteristics TA = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min Max Units
BVBreakdown Voltage IR = 5.0
µ
A75 V
IRReverse Current VR = 50 V
VR = 50 V, TA = 150°C100
100 nA
µ
A
VFForward Vol tage IF = 1.0 mA
IF = 10 mA
IF = 50 mA
IF = 100 mA
IF = 200 mA
650
790
860
920
1.0
mV
mV
mV
mV
V
CODiode Capacitance VR = 0, f = 1.0 MHz 2.5 pF
TRR Reverse Recovery Time IF = IR = 10 mA, Irr = 1.0 mA,
RL = 100 Ω
IF = IR = 200 mA, Irr = 20 mA,
RL = 100 Ω
4.0
6.0
nS
nS
FDH600 / FDLL600
High Conductance Ultra Fast Diode
(continued)
TRADEMARKS
ACEx™
CoolFET™
CROSSVOLT™
E2CMOSTM
FACT™
FACT Quiet Series™
FAST®
FASTr™
GTO™
HiSeC™
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As used herein:
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QS™
Quiet Series™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
TinyLogic™
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user.
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be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
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