2
RF Device Data
Freescale Semiconductor, Inc.
MMRF1007HR5 MMRF1007HSR5
Table 2. Thermal Characteristics
Characteristic Symbol Value (1) Unit
Thermal Resistance, Junction to Case
Case Temperature 67C, 1000 W Peak, 128 sec Pulse Width, 10% Duty Cycle,
50 Vdc, IDQ = 150 mA
Case Temperature 62C, Mode--S Pulse Train, 80 Pulses of 32 sec On, 18 sec
Off, Repeated Every 40 msec, 6.4% Overall Duty Cycle, 50 Vdc, IDQ = 150 mA
ZJC
0.02
0.07
C/W
Table 3. ESD Protection Characteristics
Test Methodology Class
Human Body Model (per JESD22--A114) 1B
Machine Model (per EIA/JESD22--A115) B
Charge Device Model (per JESD22--C101) IV
Table 4. Electrical Characteristics (TA=25C unless otherwise noted)
Characteristic Symbol Min Typ Max Unit
Off Characteristics (2)
Gate--Source Leakage Current
(VGS =5Vdc,V
DS =0Vdc)
IGSS — — 10 Adc
Drain--Source Breakdown Voltage
(VGS =0Vdc,I
D= 165 mA)
V(BR)DSS 110 — — Vdc
Zero Gate Voltage Drain Leakage Current
(VDS =50Vdc,V
GS =0Vdc)
IDSS — — 10 Adc
Zero Gate Voltage Drain Leakage Current
(VDS = 100 Vdc, VGS =0Vdc)
IDSS — — 100 Adc
On Characteristics
Gate Threshold Voltage (2)
(VDS =10Vdc,I
D= 1000 Adc)
VGS(th) 0.9 1.6 2.4 Vdc
Gate Quiescent Voltage (3)
(VDD =50Vdc,I
D= 150 mAdc, Measured in Functional Test)
VGS(Q) 1.5 2.2 3Vdc
Drain--Source On--Voltage (2)
(VGS =10Vdc,I
D=2.7Adc)
VDS(on) —0.15 —Vdc
Dynamic Characteristics (2)
Reverse Transfer Capacitance
(VDS =50Vdc30 mV(rms)ac @ 1 MHz, VGS =0Vdc)
Crss —1.27 —pF
Output Capacitance
(VDS =50Vdc30 mV(rms)ac @ 1 MHz, VGS =0Vdc)
Coss —86.7 —pF
Input Capacitance
(VDS =50Vdc,V
GS =0Vdc30 mV(rms)ac @ 1 MHz)
Ciss —539 —pF
Functional Tests (3) (In Freescale Test Fixture, 50 ohm system) VDD =50Vdc,I
DQ = 150 mA, Pout = 1000 W Peak (100 W Avg.),
f = 1030 MHz, 128 sec Pulse Width, 10% Duty Cycle
Power Gain Gps 19 20 22 dB
Drain Efficiency D54 56 — %
Input Return Loss IRL —-- 2 3 -- 9 dB
1. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes -- AN1955.
2. Each side of device measured separately.
3. Measurement made with device in push--pull configuration. (continued)