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20130822a
IXBOD1
IXYS reserves the right to change limits, test conditions and dimensions. Data according ot IEC 60747 and per semiconductor unless otherwise specifi ed
BOD1 Ratings
Symbol Defi nitions Conditions min. typ. max.
IDdrain current VD = 0.8·VBO TVJ = 125°C 20 µA
VBO breakover voltage VBO (TVJ) = VBO, 25°C [1 + KT (TVJ - 25°C)] V
IRMS RMS current f = 50 Hz T
amb = 50°C
pins soldered to printed circuit (conductor 0.035x2mm)
1.4 A
IFAVM maximum average forward current 0.9 A
ISM maximum pulsed source current tp = 0.1 ms; non repetitive T
amb = 50°C 200 A
I2tI2t value for fusing tp = 0.1 ms T
amb = 50°C 2 A2s
KT
KP
temperature coeffi cient of VBO
coeffi cient for energy per pulse EP (material constant)
2·10-3
700
K-1
K/Ws
RthJA thermal resistance junction to ambient natural convection
with air speed 2 m/s
60
45
K/W
K/W
IBO breakover current TVJ = 25°C 15 mA
IHholding current TVJ = 25°C 30 mA
VHholding voltage TVJ = 25°C 4 8 V
(dv/dt)cr critical rate of rise of voltage VD = 0.67·(VBO +100 V) TVJ = 50°C 1000 V/µs
(di/dt)cr critical rate of rise of curent VD = VBO; IT = 80 A; f = 50 Hz TVJ = 125°C 200 A/µs
tqturn-off time VD = 0.67·VBO; VR = 0 V; IT = 80 A TVJ = 125°C
dv/dt(lin.) = 200 V/µs; di/dt = -10 A/µs
150 µs
VTforward voltage drop IT = 5 A TVJ = 125°C 1.7 V
VT0
rT
threshold voltage
slope resistance for power-loss calculation only TVJ = 125°C 1.1
0.12
V
Ω