
Notes:
1. VIH(max) = VCC + 3.0V for pulse width less than 10ns.
2. VIL(min) = VSS - 3.0V for pulse width less than 10ns.
3. Over/Undershoot specifications are characterized, not 100% tested.
4. Typical values are included for reference only and are not guaranteed or tested.
Typical valued are measured at VCC = VCC(TYP.) and TA= 25ºC
CAPACITANCE (TA= 25 , f℃= 1.0MHz)
PARAMETER SYMBOL MIN. MAX UNIT
CecnaticapaCtupnI IN -6 pF
Input/Output Capacitance CI/O -8 pF
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
VotV2.0sleveLesluPtupnI CC - 0.2V
sn3semiTllaFdnaesiRtupnI
Input and Output Timing Reference Levels 1.5V
CdaoLtuptuO L=30pF + 1TTL, IOH/IOL = -1mA/2mA
AC ELECTRICAL CHARACTERISTICS
(1) READ CYCLE AS6C1008-55
PARAMETER SYM. MIN. MAX. UNIT
Read Cycle Time tRC 55 - ns
Address Access Time tAA - 55 ns
Chip Enable Access Time tACE - 55 ns
Output Enable Access Time tOE - 30 ns
Chip Enable to Output in Low-Z tCLZ* 10 - ns
Output Enable to Output in Low-Z tOLZ* 5 - ns
Chip Disable to Output in High-Z tCHZ* - 20 ns
Output Disable to Output in High-Z tOHZ* - 20 ns
Output Hold from Address Change tOH 10 - ns
(2) WRITE CYCLE
PARAMETER SYM. MIN. MAX. UNIT
Write Cycle Time tWC 55 - ns
Address Valid to End of Write tAW 50 - ns
Chip Enable to End of Write tCW 50 - ns
Address Set-up Time tAS 0 - ns
Write Pulse Width tWP 45 - ns
Write Recovery Time tWR 0 - ns
Data to Write Time Overlap tDW 25 - ns
Data Hold from End of Write Time tDH 0 - ns
Output Active from End of Write tOW* 5 - ns
Write to Output in High-Z tWHZ* - 20 ns
*These parameters are guaranteed by device characterization, but not production tested.
AS6C1008-55
®
128K X 8 BIT LOW POWER CMOS SRAM