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RF Device Data
NXP Semiconductors
MRF6V2010N MRF6V2010NB MRF6V2010GN
PRODUCT DOCUMENTATION AND SOFTWARE
Refer to the following resources to aid your design process.
Application Notes
AN1907: Solder Reflow Attach Method for High Power RF Devices in Plastic Packages
AN1955: Thermal Measurement Methodology of RF Power Amplifiers
AN3263: Bolt Down Mounting Method for High Power RF Transistors and RFICs in Over--Molded Plastic Packages
AN3789: Clamping of High Power RF Transistors and RFICs in Over--Molded Plastic Packages
Engineering Bulletins
EB212: Using Data Sheet Impedances for RF LDMOS Devices
Software
Electromigration MTTF Calculator
RF High Power Model
To Download Resources Specific to a Given Part Number:
1. Go to http://www.nxp.com/RF
2. Search by part number
3. Click part number link
4. Choose the desired resource from the drop down menu
REVISION HISTORY
The following table summarizes revisions to this document.
Revision Date Description
0Feb. 2007 Initial release of data sheet
1May 2007 Corrected Test Circuit Component part numbers in Table 6, Component Designations and Values for C1,
C8, C11, C18, C4, C13, C5, and C14, p. 3
Corrected Series Impedance Zsource and Zload values, Fig. 13, Series Equivalent Source and Load
Impedance, p. 7
2Aug. 2007 Replaced Case Outline 1265--08 with 1265--09, Issue K, p. 1, 12--14. Corrected cross hatch pattern in
bottom view and changed its dimensions (D2 and E3) to minimum value on source contact (D2 changed
from Min--Max .290--.320 to .290 Min; E3 changed from Min--Max .150--.180 to .150 Min). Added JEDEC
Standard Package Number.
Replaced Case Outline 1337--03 with 1337--04, p. 1, 15--17. Issue D: Removed Drain--ID label from View
Y--Y on Sheet 2. Renamed E2 to E3. Added cross--hatch region dimensions D2 and E2.
Corrected Test Circuit Component part number in Table 6, Component Designations and Values for R1, p. 3
Added Figure 12, Power Gain and Drain Efficiency versus CW Output Power, p. 6
Corrected plot points to show 50 Ohms in Figure 14, Series Equivalent Source and Load Impedance, p. 7
Added Figures 15--17, Test Circuit Component Layout and Tables 7--9, Test Circuit Component
Designations and Values to show 130, 450 and 64 MHz, respectively, p. 8--10
Added Figure 18, Series Equivalent Source and Load Impedance to show 64, 130, 220 and 450 MHz plot
points, p. 11
3Feb. 2008 Added Case Operating Temperature limit to the Maximum Ratings table and set limit to 150C, p. 1
Corrected Ciss test condition to indicate AC stimulus on the VGS connection versus the VDS connection,
Dynamic Characteristics table, p. 2
Replaced Case Outline 1337--04, Issue D, with 1337--04, Issue E, p. 15--17. Corrected document number
98ASA99191D on Sheet 3.
4Mar. 2008 Corrected Zsource (37.5 + j15.1) and Zload (94.5 + j16.7) 64 MHz values and replotted both, p. 11
Added S--Parameter table, p. 12, 13
(continued)