December 1996 Order Number: 290434-006
SERIES 2 FLASH MEMORY CARDS
iMC002FLSA, iMC004FLSA, iMC010FLSA, iMC020FLSA
Extended Temperature Specifications Included
Y2, 4, 10 and 20 Megabyte Capacities
YPCMCIA 2.1/JEIDA 4.1 68-Pin Standard
Ð Hardwired Card Information
Structure
Ð Byte- or Word-Wide Selectable
YComponent Management Registers for
Card Status/Control and Flexible
System Interface
YAutomatic Erase/Write
Ð Monitored with Ready/Busy Output
YCard Power-Down Modes
Ð Deep-Sleep for Low Power
Applications
YMechanical Write Protect Switch
YSolid-State Reliability
YIntel FlashFileTM Architecture
YHigh-Performance Read Access
Ð 150 ns Maximum
YHigh-Performance Random Writes
Ð6 ms Typical Word Write
YErase Suspend to Read Command
Ð Keeps Erase as Background Task
YNonvolatility (Zero Retention Power)
Ð No Batteries Required for Back-up
YETOXTM V 0.4mFlash Memory
Technology
Ð 5V Read, 12V Erase/Write
Ð High-Volume Manufacturing
Experience
YExtended Temperature Version
Ðb40§Ctoa
85§C
Intel’s Series 2 Flash Memory Card facilitates high-performance disk emulation in mobile PCs and dedicated
equipment. Manufactured with Intel’s ETOXTM III 0.8m, FlashFile Memory devices, the Series 2 Card allows
code and data retention while erasing and/or writing other blocks. Additionally, the Series 2 Flash Memory
Card features low power modes, flexible system interfacing and a 150 ns read access time. When coupled with
Intel’s low-power microprocessors, these cards enable high-performance implementations of mobile comput-
ers and systems.
Series 2 Cards conform to the Personal Computer Memory Card International Association (PCMCIA 2.1)/Jap-
anese Electronics Industry Development Association (JEIDA 4.1) 68-pin standard, providing electrical and
physical compatibility.
Data file management software, Flash Translation Layer (FTL), provides data file storage and memory man-
agement, much like a disk operating system. Intel’s Series 2 Flash Memory Cards, coupled with flash file
management software, effectively provide a removable, all-silicon mass storage solution with higher perform-
ance and reliability than disk-based memory architectures.
Designing with Intel’s FlashFile Architecture enables OEM system manufacturers to design and manufacture a
new generation of mobile PCs and dedicated equipment where high performance, ruggedness, long battery
life and lighter weight are a requirement. For large user groups in workstation environments, the Series 2
Cards provide a means to securely store user data and backup system configuration/status information.
SERIES 2 FLASH MEMORY CARDS
Table 1. Series 2 Flash Memory Card Pinout
Pin Signal I/O Function Active
1 GND Ground
2DQ
3I/O Data Bit 3
3DQ
4I/O Data Bit 4
4DQ
5I/O Data Bit 5
5DQ
6I/O Data Bit 6
6DQ
7I/O Data Bit 7
7CE
1
ÝI Card Enable 1 LO
8A
10 I Address Bit 10
9OE
ÝI Output Enable LO
10 A11 I Address Bit 11
11 A9I Address Bit 9
12 A8I Address Bit 8
13 A13 I Address Bit 13
14 A14 I Address Bit 14
15 WEÝI Write Enable LO
16 RDY/BSYÝReady-Busy HI/LO
17 VCC Supply Voltage
18 VPP1 Supply Voltage
19 A16 I Address Bit 16
20 A15 I Address Bit 15
21 A12 I Address Bit 12
22 A7I Address Bit 7
23 A6I Address Bit 6
24 A5I Address Bit 5
25 A4I Address Bit 4
26 A3I Address Bit 3
27 A2I Address Bit 2
28 A1I Address Bit 1
29 A0I Address Bit 0
30 DQ0I/O Data Bit 0
31 DQ1I/O Data Bit 1
32 DQ2I/O Data Bit 2
33 WP O Write Protect HI
34 GND Ground
Pin Signal I/O Function Active
35 GND Ground
36 CD1ÝO Card Detect 1 LO
37 DQ11 I/O Data Bit 11
38 DQ12 I/O Data Bit 12
39 DQ13 I/O Data Bit 13
40 DQ14 I/O Data Bit 14
41 DQ15 I/O Data Bit 15
42 CE2ÝI Card Enable 2 LO
43 VS1O Voltage Sense 1 N.C.
44 RFU Reserved
45 RFU Reserved
46 A17 I Address Bit 17
47 A18 I Address Bit 18
48 A19 I Address Bit 19
49 A20 I Address Bit 20
50 A21 I Address Bit 21
51 VCC Supply Voltage
52 VPP2 Supply Voltage
53 A22 I Address Bit 22
54 A23 I Address Bit 23
55 A24 I Address Bit 24
56 A25 No Connect
57 VS2O Voltage Sense 2 N.C.
58 RST I Reset HI
59 WAITÝO Extend Bus Cycle LO
60 RFU Reserved
61 REGÝI Register Select LO
62 BVD2O Batt. Volt Det 2
63 BVD1O Batt. Volt Det 1
64 DQ8I/O Data Bit 8
65 DQ9I/O Data Bit 9
66 DQ10 I/O Data Bit 10
67 CD2ÝO Card Detect 2 LO
68 GND Ground
2
SERIES 2 FLASH MEMORY CARDS
Table 2. Series 2 Flash Memory Card Pin Descriptions
Symbol Type Name and Function
A0–A25 IADDRESS INPUTS: A0through A25 are address bus lines which enable direct
addressing of 64 megabytes of memory on a card. A0is not used in word
access mode. A24 is the most significant address bit. Note: A25 is a no-connect
but should be provided on host side.
DQ0–DQ15 I/O DATA INPUT/OUTPUT: DQ0through DQ15 constitute the bidirectional data
bus. DQ15 is the most significant bit.
CE1Ý,CE
2
ÝICARD ENABLE 1, 2: CE1Ýenables even bytes, CE2Ýenables odd bytes.
Multiplexing A0,CE
1
Ýand CE2Ýallows 8-bit hosts to access all data on DQ0
through DQ7. (See Table 3 for a more detailed description.)
OEÝIOUTPUT ENABLE: Active low signal gating read data from the memory card.
WEÝIWRITE ENABLE: Active low signal gating write data to the memory card.
RDY/BSYÝOREADY/BUSY OUTPUT: Indicates status of internally timed erase or write
activities. A high output indicates the memory card is ready to accept
accesses. A low output indicates that a device(s) in the memory card is(are)
busy with internally timed activities. See text for an alternate function (READY-
BUSY MODE REGISTER).
CD1Ý&CD
2
ÝOCARD DETECT 1, 2: These signals provide for correct card insertion detection.
They are positioned at opposite ends of the card to detect proper alignment.
The signals are connected to ground internally on the memory card and will be
forced low whenever a card is placed in the socket. The host socket interface
circuitry shall supply 10K or larger pull-up resistors on these signal pins.
WP O WRITE PROTECT: Write Protect reflects the status of the Write-Protect switch
on the memory card. WP set high ewrite protected, providing internal
hardware write lockout to the flash array.
VPP1,V
PP2 WRITE/ERASE POWER SUPPLY: (12V nominal) for erasing memory array
blocks or writing data in the array. They must be 12V to perform an erase/write
operation.
VCC CARD POWER SUPPLY (5V nominal) for all internal circuitry.
GND I GROUND for all internal circuitry.
REGÝIREGISTER SELECT provides access to Series 2 Flash Memory Card registers
and Card Information Structure in the Attribute Memory Plane.
RST I RESET from system, active high. Places card in Power-On Default State.
RESET pulse width must be t200 ns.
WAITÝOWAIT (Extend Bus Cycle) is used by Intel’s I/O cards and is driven high.
BVD1, BVD2OBATTERY VOLTAGE DETECT: Upon completion of the power on reset cycle,
these signals are driven high to maintain SRAM-card compatibility.
RFU RESERVED FOR FUTURE USE
NC NO INTERNAL CONNECTION. Pin may be driven or left floating.
VS1,VS
2VOLTAGE SENSE: Notifies the host Socket of the card’s VCC requirements.
VS1and VS2are both open, indicating a 5V VCC card.
3
SERIES 2 FLASH MEMORY CARDS
2904343
Figure 1. Detailed Block Diagram. The Card Control Logic Provides
Decoding Buffering and Control Signals.
4
SERIES 2 FLASH MEMORY CARDS
APPLICATIONS
Intel’s second generation Series 2 Flash Memory
Cards facilitate high performance disk emulation for
the storage of data files and application programs on
a purely solid-state removable medium. File man-
agement software, Flash Translation Layer (FTL), in
conjunction with the Series 2 Flash Memory Cards,
enable the design of high-performance light-weight
notebook, palmtop, and pen-based PCs that have
the processing power of today’s desktop computers.
Application software stored on the flash memory
card substantially reduces the slow disk-to-DRAM
download process. Replacing the mechanical disk
results in a dramatic enhancement of read perform-
ance and substantial reduction of power consump-
tion, size and weightÐconsiderations particularly
important in portable PCs and equipment. The Se-
ries 2 Card’s high performance read access time al-
lows the use of Series 2 Cards in an ‘‘execute-in-
place’’ (XIP) architecture. XIP eliminates redundancy
associated with DRAM/Disk memory system archi-
tectures. Operating systems stored in Flash Memory
decreases system boot or program load times, en-
abling the design of PCs that boot, operate, store
data files and execute application programs from/to
nonvolatile memory without losing the ability to per-
form an update.
File management systems modify and store data
files by allocating flash memory space intelligently.
Wear leveling algorithms, employed to equally dis-
tribute the number of rewrite cycles, ensure that no
particular block is cycled excessively relative to oth-
er blocks. This provides hundreds of thousands of
hours of power on usage.
This file management software enables the user to
interact with the flash memory card in precisely the
same way as a magnetic disk.
Series 2 Flash Memory Cards provide durable non-
volatile memory storage for mobile PCs on the road,
facilitating simple transfer back into the desktop en-
vironment.
For systems currently using a static RAM/battery
configuration for data acquisition, the Series 2 Flash
Memory Card’s nonvolatility eliminates the need for
battery backup. The concern for battery failure no
longer exists, an important consideration for porta-
ble computers and medical instruments, both requir-
ing continuous operation. Series 2 Cards consume
no power when the system is off, and only 60 mAin
Deep-Sleep mode (2 Megabyte card). Furthermore,
Flash Memory Cards offer a considerable cost and
density advantage over memory cards based on
static RAM with battery backup.
Besides disk emulation, the Series 2 Card’s electri-
cal block-erasure, data writability, and inherent non-
volatility fit well with data accumulation and record-
ing needs. Electrical block-erasure provides design
flexibility to selectively rewrite blocks of data, while
saving other blocks for infrequently updated param-
eters and lookup tables. For example, networks and
systems that utilize large banks of battery-backed
DRAM to store configuration and status benefit from
the Series 2 Flash Card’s nonvolatility and reliability.
SERIES 2 ARCHITECTURE
OVERVIEW
The Series 2 Flash Memory Card contains a 2 to 20
Megabyte Flash Memory array consisting of 2 to 20
28F008SA FlashFile Memory devices. Each
28F008SA contains sixteen individually-erasable, 64
Kbyte blocks; therefore, the Flash Memory Card
contains from 32 to 320 device blocks. It also con-
tains two Card Control Logic devices that manage
the external interface, address decoding, and com-
ponent management logic. (Refer to Figure 1 for a
block diagram.)
To support PCMCIA-compatible word-wide access,
devices are paired so that each accessible memory
block is 64 KWords (see Figure 2). Card logic allows
the system to write or read one word at a time, or
one byte at a time by referencing the high or low
byte. Erasure can be performed on the entire block
pair (high and low device blocks simultaneously), or
on the high or low byte portion separately.
Also in accordance with PCMCIA specifications this
product supports byte-wide operation, in which the
flash array is divided into 128K x 8 bit device blocks.
In this configuration, odd bytes are multiplexed onto
the low byte data bus.
5
SERIES 2 FLASH MEMORY CARDS
2904341
Figure 2. Memory Architecture. Each Device Pair Consists of Sixteen 64 KWord Blocks.
Series 2 Flash Memory Cards offer additional fea-
tures over the Bulk Erase Flash Card product family
(refer to iMC001FLKA, iMC002FLKA and
iMC004FLKA data sheets). Some of the more nota-
ble enhancements include: high density capability,
erase blocking, internal write/erase automation,
erase suspension to read, Component Management
Registers that provide software control of device-
level functions and a deep-sleep mode.
Erase blocking facilitates solid-state storage applica-
tions by allowing selective memory reclamation. Mul-
tiple 64 Kbyte blocks may be simultaneously erased
within the memory card as long as not more than
one block per device is erasing. This shortens the
total time required for erasure, but requires addition-
al supply current. A block typically requires 1.6 sec-
onds to erase. Each memory block can be erased
and completely written 100,000 times.
Erase suspend allows the system to temporarily in-
terrupt a block erase operation. This mode permits
reads from alternate device blocks while that same
device contains an erasing block. Upon completion
of the read operation, erasure of the suspended
block must be resumed.
Write/erase automation simplifies the system soft-
ware interface to the card. A two-step command se-
quence initiates write or erase operations and pro-
vides additional data security. Internal device circuits
automatically execute the algorithms and timings
necessary for data-write or block-erase operations,
including verifications for long-term data integrity.
While performing either data-write or block-erase,
the memory card interface reflects this by bringing
its RDY/BSYÝ(Ready/Busy) pin low. This output
goes high when the operation completes. This fea-
ture reduces CPU overhead and allows software
polling or hardware interrupt mechanisms. Writing
memory data is achieved in single byte or word in-
crements, typically in 6 ms.
Read access time is 150 ns or less over the entire
operating temperature range.
The Reset-PowerDown mode reduces power con-
sumption to less than 60 mA to help extend battery
life of portable host systems. Activated through soft-
ware control, this mode optionally affects the entire
flash array (Global Reset-PowerDown Register) or
specific device pairs (Sleep Control Register).
6
SERIES 2 FLASH MEMORY CARDS
PCMCIA/JEIDA INTERFACE
The Series 2 Flash Memory Card interface supports
the PCMCIA 2.1 and JEIDA 4.1 68-pin card format
(see Tables 1 and 2). Detailed specifications are de-
scribed in the PC Card Standard, Release 2.1, July,
1993, published by PCMCIA. The Series 2 Card con-
forms to the requirements of both Release 1 and
Release 2 of the PC Card Standard.
Series 2 Card pin definitions are equivalent to the
Bulk-Erase Flash Card except that certain No Con-
nects are now used. A22 through A24, RST (Reset),
and RDY/BSYÝ(Ready/Busy) have pin assign-
ments as set by the PCMCIA standard.
NOTE: The READY/BUSY signal is abbreviated as
RDY/BSY
Ý
by PCMCIA (card level) and as
RY/BY
Ý
by JEDEC (component level).
The outer shell of the Series 2 card meets all
PCMCIA/JEIDA Type 1 mechanical specifications.
See Figure 19 for mechanical dimensions.
WRITE PROTECT SWITCH
A mechanical write protect switch provides the
card’s memory array with internal write lockout. The
Write-Protect (WP) output pin reflects the status of
this mechanical switch. It outputs a high signal (VOH)
when writes are disabled. This switch does not lock
out writes to the Component Management Regis-
ters.
BATTERY VOLTAGE DETECT
PCMCIA requires two signals, BVD1and BVD2,be
supplied at the interface to reflect card battery con-
dition. Flash Memory Cards do not require batteries.
When the power on reset cycle is complete, BVD1
and BVD2are driven high to maintain compatibility.
CARD DETECT
Two signals, CD1Ýand CD2Ý, allow the host to de-
termine proper socket seating. They reside at oppo-
site ends of the connector and are tied to ground
within the memory card.
DESIGN CONSIDERATIONS
The Series 2 Card consists of two separate memory
planes: the Common Memory Plane (or Main Memo-
ry) and the Attribute Memory Plane. The Common
Memory Plane resides in the banks of device pairs
and represents the user-alterable memory space.
The Component Management Registers (CMR) and
the hardwired Card Information Structure (CIS) re-
side in the Attribute Memory Plane within the Card
Control Logic, as shown in Figure 3. The Card Con-
trol Logic interfaces the PCMCIA connector and the
internal flash memory array and performs address
decoding and data control.
Attribute Memory Plane
accessible with
REG (pin 61) eVIL
2904342
INTEL ePerformance Enhancement Register
PCMCIA eDefined in PCMCIA Release 2.0
Figure 3. Component Management Registers Allow S/W Control of Components within Card
7
SERIES 2 FLASH MEMORY CARDS
ADDRESS DECODE
Address decoding provides the decoding logic for
the 2 to 20 Device Chip Enables and the elements of
the Attribute Memory Plane. REGÝselects between
the Common Memory Plane (REGÝeVIH) and the
Attribute Memory Plane (REGÝeVIL).
NOTE:
The Series 2 Card has
active
address inputs A0to
A24 implying that reading and writing to addresses
beyond 32 Megabytes causes wraparound. Further-
more, reads to illegal addresses (for example, be-
tween 20 and 32 Meg on a 20 Megabyte card) re-
turns Default data (00FFH or FFFFH).
The 28F008SA devices, storing data, applications or
firmware, form the Common Memory Plane ac-
cessed individually or as device pairs. Memory is lin-
early mapped in the Common Memory Plane. Three
memory access modes are available when access-
ing the Common Memory Plane: Byte-Wide, Word
Wide, and Odd-Byte modes.
Additional decoding selects the hardwired PCMCIA
CIS and Component Management Registers
mapped in the Attribute Memory Plane beginning at
address 000000H.
The 512 memory-mapped even-byte CMRs are lin-
early mapped beginning at address 4000H in the At-
tribute Memory Plane.
DATA CONTROL
Data Control Logic selects the path and direction for
accessing the Common or Attribute Memory Plane.
It controls any of the PCMCIA-defined Word-Wide,
Byte-Wide or Odd-Byte modes for either reads or
writes to these areas. As shown in Table 3, input
pins which determine these selections are REGÝ,
A0through A24,WE
Ý
,OE
Ý
,CE
1
Ý
, and CE2Ý.
PCMCIA specifications allow only even-byte access
to the Attribute Memory Plane.
In Byte-Wide mode, bytes contiguous in software ac-
tually alternate between two device blocks of a de-
vice pair. Therefore, erasure of one device block
erases every other contiguous byte. In accordance
with the PCMCIA standard for memory configuration,
the Series 2 Card does not support confining contig-
uous bytes within one flash device when in by-8
mode.
8
SERIES 2 FLASH MEMORY CARDS
Table 3. Data Access Mode Truth Table
Function Mode REGÝCEÝ2CEÝ1A0OEÝWEÝVPP2 VPP1 D15–D8D7–D0
COMMON MEMORY PLANE
STANDBY(1) XHHXXXV
PPL(2) VPPL(2) HIGH-Z HIGH-Z
BYTE READ H H L L L H VPPL(2) VPPL(2) HIGH-Z EVEN-BYTE
HHLHLHV
PPL(2) VPPL(2) HIGH-Z ODD-BYTE
WORD READ H L L X L H VPPL(2) VPPL(2) ODD-BYTE EVEN-BYTE
ODD-BYTE READ H L H X L H VPPL(2) VPPL(2) ODD-BYTE HIGH-Z
BYTE WRITE H H L L H L VPPH VPPH X EVEN-BYTE
HHLHHLV
PPH VPPH X ODD-BYTE
WORD WRITE H L L X H L VPPH VPPH ODD-BYTE EVEN-BYTE
ODD-BYTE WRITE H L H X H L VPPH VPPL(2) ODD-BYTE X
ATTRIBUTE MEMORY PLANE
BYTE READ L H L L L H X(2) X(2) HIGH-Z EVEN-BYTE
LHLHLHX
(2) X(2) HIGH-Z INVALID
WORD READ L L L X L H X(2) X(2) INVALID EVEN-BYTE
DATA(3)
ODD-BYTE READ L L H X L H X(2) X(2) INVALID HIGH-Z
DATA(3)
BYTE WRITE L H L L H L X(2) X(2) X EVEN-BYTE
LHLHHLX
(2) X(2) X INVALID
OPERATION(3)
WORD WRITE L L L X H L X(2) X(2) INVALID EVEN-BYTE
OPERATION(3)
ODD-BYTE WRITE L L H X H L X(2) X(2) INVALID X
OPERATION(3)
NOTES:
1. Standby mode is valid in Common Memory or Attribute Memory access.
2. To meet the low power specifications, VPP eVPPL; however VPPH presents no reliability problems.
3. Odd-Byte data are not valid during access to the Attribute Memory Plane.
4. H eVIH,LeV
IL,XeDon’t Care.
9
SERIES 2 FLASH MEMORY CARDS
PRINCIPLES OF OPERATION
Intel’s Series 2 Flash Memory Card provides electri-
cally-alterable, non-volatile, random-access storage.
Individual 28F008SA devices utilize a Command
User Interface (CUI) and Write State Machine
(WSM) to simplify block-erasure and data write oper-
ations.
COMMON MEMORY ARRAY
Figure 4 shows the Common Memory Plane’s orga-
nization. The first block pair (64 KWords) of Com-
mon Memory, referred to as the Common Memory
Card Information Structure Block,
optionally
extends
the hardwired CIS in the Attribute Memory Plane for
additional card information. This may be written dur-
ing initial card formatting for OEM customization.
Since this CIS Block is part of Common Memory, its
data can be altered. Write access to the Common
Memory CIS Block is controlled by the Write Protect
Control Register which may be activated by system
software after power-up. Additionally, the entire
Common Memory plane (minus the Common Memo-
ry CIS Block) may be software write protected.
Note
that the Common Memory CIS Block is not part of
the Attribute Memory Plane. Do not assert REG
Ý
to
access the Common Memory CIS Block
.
13FFFFFH Device Pair 9
1200000H
1000000H Device Pair 8
0E00000H Device Pair 7
0C00000H Device Pair 6
0A00000H Device Pair 5
0800000H Device Pair 4
0600000H Device Pair 3
0400000H Device Pair 2
0200000H Device Pair 1
0020000H Device Pair 0
0000000H Optional CIS
Figure 4. Common Memory Plane. Use
the Optional Common Memory Plane
CIS for Custom Card Format Information.
HARDWIRED CIS
The card’s structure description resides in the even-
byte locations starting at 0000H and going to the
CIS ending tuple (FNULL) within the Attribute Memo-
ry Plane. Data included in the hardwired CIS con-
sists of tuples. Tuples are a variable-length list of
data blocks describing details such as manufactur-
er’s name, the size of each memory device and the
number of flash devices within the card.
COMPONENT MANAGEMENT
REGISTERS (CMRs)
The CMRs in the Attribute Memory Plane provide
special, software-controlled functionality. Card Con-
trol Logic includes circuitry to access the CMRs.
REG (PCMCIA, pin 61) selects the Attribute Memory
Plane (and therefore the CMRs) when equal to VIL.
CMRs are classified into two categories: those de-
fined by PCMCIA R2.1 and those included by Intel
(referred to as Performance Enhancement Regis-
ters) to enhance the interface between the host sys-
tem and the card’s flash memory array. CMRs (See
Figure 3) provide seven control functionsÐReady-
Busy Interrupt Mode, Device Ready-Busy Status,
Device Ready-Busy Mask, Reset-PowerDown Con-
trol, Software-controlled Write Protection, Card
Status and Soft Reset.
SOFT RESET REGISTER (PCMCIA)
(CONFIGURATION OPTION)
The SOFT RESET REGISTER (Attribute Memory
Plane Address 4000H, Figure 5) is defined in the
PCMCIA Release 2.0 specification as the Configura-
tion Option Register.
Bit 7 is the soft reset bit (SRESET). Writing a 1 to
this bit initiates card reset to the power-on default
state (see Side Bar page 11). This bit must be
cleared to use the CMRs or to access the devices.
SRESET implements in software what the reset pin
implements in hardware. On power-up, the card au-
tomatically assumes default conditions. Similar to
the reset pin (pin 58), this bit clears at the end of a
power-on reset cycle or a system reset cycle.
Bits 0 through 6 are not used by this memory card,
but power up as zeroes for PCMCIA compatibility.
10
SERIES 2 FLASH MEMORY CARDS
SOFT RESET REGISTER
(CONFIGURATION OPTION REGISTER)
(Read/Write Register)
ADDRESS BIT 7 BIT 6 BIT 5 BIT 4 BIT 4 BIT 2 BIT 1 BIT 0
PCMCIA CONFIGURATION INDEX
4000H SRESET RESETS TO ZERO ON POWER UP
1eRESET, CLEAR TO ACCESS CARD
Figure 5. SOFT RESET REGISTER (PCMCIA). Sets the Memory Card in the Power-On Default State.
POWER-ON DEFAULT CONDITIONS
#All Devices Powered Up In Standby Mode
#Common Memory Available For Writes
#All Device Ready/Busy Outputs Unmasked
#PCMCIA Ready/Busy Mode Enabled
#Ready/Busy Output Goes To Ready
Global PowerDown Register (PCMCIA)
(Configuration and Status)
The Global Reset-PowerDown Register (Attribute
Memory Plane Address 4002H, Figure 6) is referred
to as the Configuration and Status Register in the
PCMCIA Release 2.0 specification.
Bit 2 (RP) controls global card power-down. Writing
a 1 to this bit places each device within the card into
‘‘Deep-Sleep’’ mode.
Devices in Deep-Sleep are not
accessible.
Recovery from power-down requires
500 ns for reads and 1 ms for writes.
The RP bit defaults to 0 on card power-up or reset.
Setting or clearing this bit has no affect on the bit
settings of the Sleep Control Register.
The remaining Global Reset-PwrDwn Register bits
are defined for Intel’s family of I/O cards and are
driven low for compatibility.
GLOBAL RESET-POWER-DOWN REGISTER
(CONFIGURATION AND STATUS REGISTER)
(Read/Write Register)
1ePOWER DOWN
ADDRESS BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
4002H ZEROES RP ZEROES
Figure 6. GLOBAL RESET-PWRDWN REGISTER (PCMCIA). The RP
Bit Enables Reset PowerDown of All Flash Memory Devices.
11
SERIES 2 FLASH MEMORY CARDS
CARD STATUS REGISTER
(Read Only Register)
ADDRESS BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
4100H ADM ADS SRESET CMWP RP CISWP WP RDY/BSYÝ
Figure 7. CARD STATUS REGISTER (Intel) Provides a Quick Review of the Card’s Status
CARD STATUS REGISTER (INTEL)
The Read-Only, CARD STATUS REGISTER (Attri-
bute Memory Plane Address 4100H, Figure 7) re-
turns generalized status of the Series 2 Card and its
CMRs.
Bit 0 (RDY/BSYÝ) reflects the card’s RDY/BSYÝ
(Ready-Busy) output. Software polling of this bit pro-
vides data-write or block-erase operation status. A
zero indicates a busy device(s) in the card.
Bit 1 (WP) reports the position of the card’s Write
Protection switch with 1 indicating write protected. It
reports the status of the WP pin.
Bit 2 (CISWP) reflects whether the Common Memo-
ry CIS is write protected using the WRITE PROTECT
REGISTER, with 1 indicating write protected.
Bit 3 (RP) reports whether the entire flash memory
array is in ‘‘Deep-Sleep’’ (Reset-PwrDwn) mode,
with 1 indicating ‘‘Deep-Sleep’’. This bit reflects the
RP bit of the GLOBAL RESET-POWERDOWN REG-
ISTER. Powering down
all
device pairs individually
(using the Sleep Control Register), also sets this bit.
Bit 4 (CMWP) reports whether the Common Memory
Plane (minus Common Memory CIS) is write protect-
ed via the WRITE PROTECT REGISTER with 1 indi-
cating write protected.
Bit 5 (SRESET) reflects the SRESET bit of the SOFT
RESET REGISTER. It reports that the card is in Soft
Reset with 1 indicating reset. When this bit is zero,
the flash memory array and CMRs may be ac-
cessed, otherwise clear it via the SRESET REGIS-
TER.
Bit 6 (ADS, ANY DEVICE SLEEP) is the ‘‘ORed’’
value of the SLEEP CONTROL REGISTER. Power-
ing down any device pair sets this bit.
Bit 7 (ADM, ANY DEVICE MASKED) is the ‘‘ORed’’
value of the READY/BUSY MASK REGISTER.
Masking any device sets this bit.
WRITE PROTECTION REGISTER
(INTEL)
The WRITE PROTECTION REGISTER (Attribute
Memory Plane Address 4104H, Figure 8) selects
whether the optional Common Memory CIS and the
remaining Common Memory blocks are write pro-
tected (see Figure 4).
Enable Common Memory CIS write protection by
writing a 1 to the CISWP Bit (bit 0).
Enable write protection of the remaining Common
Memory blocks by writinga1totheCMWP Bit (bit
1).
In the power-on default state, both bits are 0, and
therefore not write protected.
Reserved bits (2 7) have undefined values and
should be written as zeroes for future compatibility.
12
SERIES 2 FLASH MEMORY CARDS
WRITE PROTECTION REGISTER
(Read/Write Register)
ADDRESS BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
4104H RESERVED FOR FUTURE USE CMWP CISWP
1eWRITE PROTECT
Figure 8. WRITE PROTECTION REGISTER (Intel) Eliminates Accidental Data Corruption
SLEEP CONTROL REGISTER (INTEL)
Unlike the GLOBAL RESET-POWERDOWN REGIS-
TER, which simultaneously resets and places all
flash memory devices into a Deep-Sleep mode, the
SLEEP CONTROL REGISTER (Attribute Memory
Plane Address 4118H 411AH, Figure 9) allows se-
lective power-down control of individual device pairs.
Writinga1toaspecific bit of the SLEEP CONTROL
REGISTER places the corresponding device pair
into the ‘‘Deep-Sleep’’ mode.
Devices in Deep-Sleep
are not accessible
. On cards with fewer than
20 Megabytes (10 device pairs), writing a one to an
absent device pair has no affect and reads back as
zero.
This register contains all zeroes (i.e., not in Deep-
Sleep mode) when the card powers up or after a
hard or soft reset. Furthermore, the Global Reset-
PowerDown Register has no affect on the contents
of this register. Therefore, any bit settings of the
Sleep Control Register will remain unchanged after
returning from a global reset and power down (writ-
ing a zero to the RP bit of the Global Reset-Power-
Down Register).
READY-BUSY STATUS
REGISTER (INTEL)
The bits in the Read-only, READY-BUSY Status
Register (Attribute Memory Plane Address 4130H-
4134H, Figure 10) reflect the status (READYe1,
BUSYe0) of each device’s RY/BYÝoutput. A busy
condition indicates that a device is currently pro-
cessing a data-write or block-erase operation.
These bits are logically ‘‘AND-ed’’ to form the
Ready/Busy output (RDY/BSYÝ, pin 16) of the
PCMCIA interface. On memory cards with fewer
than 20 devices, unused Device RY/BYÝStatus
Register bits appear as ready.
SLEEP CONTROL REGISTER
(Read/Write Register)
ADDRESS BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
411AH RESERVED DEVICES DEVICES
18/19 16/17
4118H DEVICES DEVICES DEVICES DEVICES DEVICES DEVICES DEVICES DEVICES
14/15 12/13 10/11 8/9 6/7 4/5 2/3 0/1
1eSELECTED DEVICE PAIR IN POWER-DOWN MODE AND RESET
Figure 9. SLEEP CONTROL REGISTER (Intel) Allows Specific
Devices to be Reset and Put into Power-Down Mode
13
SERIES 2 FLASH MEMORY CARDS
READY-BUSY STATUS REGISTER
(Read/Write Register)
ADDRESS BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
4134H RESERVED DEVICE DEVICE DEVICE DEVICE
19 18 17 16
4132H DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE
15 14 13 12 11 10 9 8
4130H DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE
76543210
1
e
DEVICE READY, 0 eDEVICE BUSY
Figure 10. READY-BUSY STATUS REGISTER (Intel) Provides
Operation Status of All Flash Memory Devices
READY-BUSY MASK REGISTER
(INTEL)
The bits of the Read/Write READY-BUSY MASK
REGISTER (Attribute Memory Plane Address
4120H 4124H, Figure 11) mask out the correspond-
ing ‘‘AND-ed’’ READY-BUSY STATUS REGISTER
bits from the PCMCIA data bus (RDY/BSYÝ, pin 16)
and the CARD STATUS REGISTER RDY/BSYÝBit
(bit 0).
In an unmasked condition (MASK REGISTER bits e
0), any device RY/BYÝoutput going low pulls the
card’s RDY/BSYÝoutput to VIL (BUSY). In this
case, all devices must be READY to allow the card’s
RDY/BSYÝoutput to be ready (VIH).
This is referred
to as the PCMCIA READY-BUSY MODE. An alter-
nate type of READY-BUSY function is described in
the next section, READY-BUSY MODE REGISTER.
READY-BUSY MASK
(Read/Write Register)
ADDRESS BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
4124H RESERVED DEVICE DEVICE DEVICE DEVICE
19 18 17 16
4122H DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE
15 14 13 12 11 10 9 8
4120H DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE DEVICE
76543210
1
e
MASK ENABLED
Figure 11. READY-BUSY MASK REGISTER (Intel) Essential for Write Optimization
14
SERIES 2 FLASH MEMORY CARDS
If the READY-BUSY MASK REGISTER bits are set
to ones (masked condition), the RDY/BSYÝoutput
and the CARD STATUS REGISTER RDY/BSYÝbit
will reflect a READY condition regardless of the
state of the corresponding devices. The READY-
BUSY MASK REGISTER does not affect the
READY-BUSY STATUS REGISTER allowing soft-
ware polling to determine operation status.
Unmasked is the default condition for the bits in this
register. On memory cards with fewer than 20 devic-
es, unused device mask bits appear as masked.
READY-BUSY MODE REGISTER
(INTEL)
The READY-BUSY MODE REGISTER (Attribute
Memory Plane Address 4140H, Figure 12) provides
the selection of two types of system interfacing for
the busy-to-ready transition of the card’s
RDY/BSYÝpin:
1. The standard PCMCIA READY-BUSY MODE, in
which the card’s RDY/BSYÝsignal generates a
low-to-high transition (from busy to ready) only
after
all
busy devices (not including masked
devices) have completed their data-write or block-
erase operations. This may result in a long inter-
rupt latency.
2. A High-Performance mode that generates a low-
to-high (from busy-to-ready) transition after each
device becomes ready. This provides the host
system with immediate notification that a specific
device’s operation has completed and that de-
vice may now be used. This is particularly useful
in a file management application where a block
pair, containing only deleted files, is being erased
to free up space so new file data may be written.
Enabling the HIGH-PERFORMANCE READY-BUSY
MODE requires a three step sequence:
1. Set all bits in the READY/BUSY MASK REGIS-
TER. This prevents ready devices from triggering
an unwanted interrupt when step 3 is performed.
2. Write 01H to the READY-BUSY MODE REGIS-
TER. This sets the MODE bit.
3. Write 01H to the READY-BUSY MODE REGIS-
TER. This clears the RACK bit.
The MODE and RACK bits
must
be written in the
prescribed sequence,
not
simultaneously. The
card’s circuitry is designed purposely in this manner
to prevent an initial, unwanted busy-to-ready tran-
sition. Note that in Step 2, writing to the RACK bit is
a Don’t Care.
When the High-Performance Mode is enabled, spe-
cific READY-BUSY MASK bits must be cleared after
an operation is initiated on the respective devices.
After each device becomes ready, the RDY/BSYÝ
pin makes a low-to-high transition. To catch the next
device’s completion of an operation, the RACK bit
must be cleared by writing ‘‘01H’’ to the Ready/Busy
Mode Register.
READY-BUSY MODE REGISTER
(Read/Write Register)
ADDRESS BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
4140H RESERVED FOR FUTURE USE RACK MODE
MODE eREADY-BUSY MODE
0ePCMCIA MODE
1eHIGH PERFORMANCE
RACK eREADY ACKNOWLEDGE CLEAR TO
SET UP RDY/BSYÝPIN, THEN CLEAR AFTER
EACH DEVICE BECOMES READY TO ACKNOWL-
EDGE TRANSITION.
Figure 12. High Performance Ready-Busy Mode REGISTER (Intel)
Used to Trigger a Ready Interrupt for Each Device
15
SERIES 2 FLASH MEMORY CARDS
PRINCIPLES OF DEVICE OPERATION
Individual 28F008SA devices include a Command
User Interface (CUI) and a Write State Machine
(WSM) to manage write and erase functions in each
device block.
The CUI serves as the device’s interface to the Card
Control Logic by directing commands to the appro-
priate device circuitry (Table 4). It allows for fixed
power supplies during block erasure and data writes.
The CUI handles the WEÝinterface into the device
data and address latches, as well as system soft-
ware requests for status while the WSM is operating.
The CUI itself does not occupy an addressable
memory location. The CUI provides a latch used to
store the command and address and data informa-
tion needed to execute the command. Erase Setup
and Erase Confirm commands require both appropri-
ate command data and an address within the block
to be erased. The Data Write Setup command re-
quires both appropriate command data and the ad-
dress of the location to be written, while the Data
Write command consists of the data to be written
and the address of the location to be written.
The CUI initiates flash memory writing and erasing
operations only when VPP is at 12V. Depending on
the application, the system designer may choose to
make the VPP power supply switchable (available
when writes and erases are required) or hardwired to
VPPH. When VPP eVPPL, power savings are in-
curred and memory contents cannot be altered. The
CUI architecture provides protection from unwanted
write and erase operations even when high voltage
is applied to VPP. Additionally, all functions are dis-
abled whenever VCC is below the write lockout volt-
age VLKO, or when the card’s Deep-Sleep modes
are enabled. The WSM automates the writing and
erasure of blocks within a device. This on-chip state
machine controls block erase and data-write, freeing
the host processor for other tasks. After receiving
the Erase Setup and Erase Confirm commands from
the CUI, the WSM controls block-erase. Progress is
monitored via the device’s status register, the card’s
control logic, and the RDY/BSYÝpin of the
PCMCIA interface. Data-write is similarly controlled,
after destination address and expected data are
supplied.
Table 4. Device Command Set
28F008SA Command(1) Cycles
Req’d
Bus First Bus Ccyle Second Bus Cycle
Operation Addr(2) Data Operation Addr(2) Data
x8 Mode x16 Mode x8 Mode x16 Mode
Read Array/Reset 1 Write DA FFH FFFFH
Intelligent Identifer 3 Write DA 90H 9090H Read IA IID(3) IID(3)
Read Device Status Register 2 Write DA 70H 7070H Read DA SRD(4) SRD(4)
Clear Device Status Register 1 Write DA 50H 5050H
Erase Setup/Erase Confirm 2 Write BA 20H 2020H Write BA D0H D0D0H
Erase Suspend/ 2 Write DA B0H B0B0H Write DA D0H D0D0H
Erase Resume
Write Setup/Write 2 Write WA 40H 4040H Write WA WD(5) WD(5)
Alternate Write Setup/Write(6) 2 Write WA 10H 1010H Write WA WD(5) WD(5)
NOTES:
1. Commands other than those shown above are reserved by Intel for future device implementations and should not be
used.
2. DA eA device-level (or device pair) address within the card.
BA eAddress within the block of a specific device (device pair) being erased.
WA eAddress of memory location to be written.
IA eA device-level address; 00H for manufacturer code, 01 for device code.
3. Following the intelligent identifier command, two read operations access manufacturer (89H) and device codes (A2H).
4. SRD eData read from Device Status Register.
5. WD eData to be written at location WA. Data is latched on the rising edge of WEÝ.
6. Either 40H or 10H are recognized by the WSM as the Write Setup command.
16
SERIES 2 FLASH MEMORY CARDS
COMMAND DEFINITIONS
Read Array (FFH) Ð
Upon initial card power-up, after exit from the Deep-
Sleep modes, and whenever illegal commands are
given, individual devices default to the Read Array
mode. This mode is also entered by writing FFH into
the CUI. In this mode, microprocessor read cycles
retrieve array data. Devices remain enabled for
reads until the CUI receives an alternate command.
Once the internal WSM has started a block-erase or
data-write operation within a device, that device will
not recognize the Read Array command until the
WSM has completed its operation (or the Erase Sus-
pend command is issued during erase).
Intelligent Identifier (90H) Ð
After executing this command, the intelligent identifi-
er values can be read. Only address A0of each de-
vice is used in this mode, all other address inputs
are reserved and should be cleared to 0. [(Manufac-
turer code e89H for A0e0), (Device code eA2H
for A0e1)]. The device will remain in this mode
until the CUI receives another command.
This information is useful by system software in de-
termining what type of flash memory device is con-
tained within the card and allows the correct match-
ing of device to write and erase algorithms. System
software that fully utilizes the PCMCIA specification
will not use the intelligent identifier mode, as this
data is available within the Card Information Struc-
ture (refer to section on PCMCIA Card Information
Structure).
Read Status Register (70H)
After writing this command, a device read outputs
the contents of its Status Register, regardless of the
address presented to that device. The contents of
this register are latched on the falling edge of OEÝ,
CE1Ý(and/or CE2Ý), whichever occurs last in the
read cycle. This prevents possible bus errors which
might occur if the contents of the Status Register
changed while reading its contents. CE1Ý(and
CE2Ýfor odd-byte or word access) or OEÝmust be
toggled with each subsequent status read, or the
completion of a write or erase operation will not be
evident. This command is executable while the
WSM is operating, however, during a block-erase or
data-write operation, reads from the device will auto-
matically return status register data. Upon comple-
tion of that operation, the device remains in the
Status Register read mode until the CUI receives
another command.
The read Status Register command functions when
VPP eVPPL or VPPH.
Clear Status Register (50H)
The Erase Status and Write Status bits may be set
to ‘‘1’’s by the WSM and can only be reset by the
Clear Status Register Command. These bits indicate
various failure conditions. By allowing system soft-
ware to control the resetting of these bits, several
operations may be performed (such as cumulatively
writing several bytes or erasing multiple blocks in
sequence). The device’s Status Register may then
be polled to determine if an error occurred during
that sequence. This adds flexibility to the way the
device may be used.
Additionally, the VPP Status bit (SR.3) MUST be re-
set by system software (Clear Status Register com-
mand) before further block-erases are attempted
(after an error).
The Clear Status Register command functions when
VPP eVPPL or VPPH. This command puts the device
in the Read Array mode.
Write Setup/Write
A two-command sequence executes a data-write
operation. After the system switches VPP to VPPH,
the write setup command (40H) is written to the CUI
of the appropriate device, followed by a second
write specifying the address and write data (latched
on the rising edge of WEÝ). The device’s WSM con-
trols the data-write and write verify algorithms inter-
nally. After receiving the two-command write se-
quence, the device automatically outputs Status
Register data when read (see Figure 13). The CPU
detects the completion of the write operation by an-
alyzing card-level or device-level indicators. Card-
level indicators include the RDY/BSYÝpin and the
READY-BUSY STATUS REGISTER; while device-
level indicators include the specific device’s Status
Register. Only the Read Status Register command
is valid while the write operation is active. Upon
completion of the data-write sequence (see section
on Status Register) the device’s Status Register re-
flects the result of the write operation. The device
remains in the Read Status Register mode until the
CUI receives an alternate command.
17
SERIES 2 FLASH MEMORY CARDS
Erase Setup/Erase Confirm
Commands (20H)
Within a device, a two-command sequence initiates
an erase operation on one device block at a time.
After the system switches VPP to VPPH, an Erase
Setup command (20H) prepares the CUI for the
Erase Confirm command (D0H). The device’s WSM
controls the erase algorithms internally. After receiv-
ing the two-command erase sequence, the device
automatically outputs Status Register data when
read (see Figure 14). If the command after erase
setup is not an Erase Confirm command, the CR
sets the Write Failure and Erase Failure bits of the
Status Register, places the device into the Read
Status Register mode, and waits for another com-
mand. The Erase Confirm command enables the
WSM for erase (simultaneously closing the address
latches for that device’s block (A16–A19). The CPU
detects the completion of the erase operation by an-
alyzing card-level or device-level indicators. Card-
level indicators include the RDY/BSY pin and the
READY-BUSY STATUS REGISTER; while device-
level indicators include the specific device’s Status
Register. Only the Read Status Register and Erase
Suspend command is valid during an active erase
operation. Upon completion of the erase sequence
(see section on Status Register) the device’s Status
Register reflects the result of the erase operation.
The device remains in the Read Status Register
mode until the CUI receives an alternate command.
The two-step block-erase sequence ensures that
memory contents are not accidentally erased. Erase
attempts while VPPL kVPPkVPPH produce spuri-
ous results and are not recommended. Reliable
block erasure only occurs when VPP eVPPH.Inthe
absence of this voltage, memory contents are pro-
tected against erasure. If block erase is attempted
while VPP eVPPL, the VPP Status bit will be set to
‘‘1’’.
When erase completes, the Erase Status bit should
be checked. If an erase error is detected, the de-
vice’s Status Register should be cleared. The CUI
remains in Read Status Register mode until receiv-
ing an alternate command.
Erase Suspend (B0H)/Erase Resume
(D0H)
Erase Suspend allows block erase interruption to
read data from another block of the device or to
temporarily conserve power for another system op-
eration. Once the erase process starts, writing the
Erase Suspend command to the CUI (see Figure 15)
requests the WSM to suspend the erase sequence
at a predetermined point in the erase algorithm. In
the erase suspend state, the device continues to
output Status Register data when read.
Polling the device’s RY/BYÝand Erase Suspend
Status bits (Status Register) will determine when the
erase suspend mode is valid. It is important to note
that the card’s RDY/BSYÝpin will also transition to
VOH and will generate an interrupt if this pin is con-
nected to a system-level interrupt. At this point, a
Read Array command can be written to the device’s
CUI to read data from blocks other than those
which are suspended. The only other valid com-
mands at this time are Read Status Register (70H)
and Erase Resume (D0H). If VPP goes low during
Erase Suspend, the VPP Status bit is set in the
Status Register and the erase operation is aborted.
The Erase Resume command clears the Erase Sus-
pend state and allows the WSM to continue with the
erase operation. The device’s RY/BYÝStatus and
Erase Suspend Status bits and the card’s READY-
BUSY Status Register are automatically updated to
reflect the erase resume condition. The card’s RDY/
BSYÝpin also returns to VOL.
Invalid/Reserved
These are unassigned commands having the same
effect as the Read Array command. Do not issue
any command other than the valid commands speci-
fied above. Intel reserves the right to redefine these
codes for future functions.
18
SERIES 2 FLASH MEMORY CARDS
DEVICE STATUS REGISTER
Each 28F008SA device in the Series 2 Card con-
tains a Status Register which displays the condition
of its Write State Machine. The Status Register is
read at any time by writing the Read Status com-
mand to the CUI. After writing this command, all sub-
sequent Read operations output data from the
Status Register, until another command is written to
the CUI.
Bit 7ÐWSM Status
This bit reflects the Ready/Busy condition of the
WSM. A ‘‘1’’ indicates that read, block-erase or
data- write operations are available. A ‘‘0’’ indicates
that write or erase operations are in progress.
Bit 6ÐErase Suspend Status
If an Erase Suspend command is issued during the
erase operation, the WSM halts execution and sets
the WSM Status bit and the Erase Suspend Status
bit to a ‘‘1’’. This bit remains set until the device
receives an Erase Resume command, at which point
the CUI resets the WSM Status bit and the Erase
Suspend Status bit.
Bit 5ÐErase Status
This bit will be cleared to 0 to indicate a successful
block-erasure. When set to a ‘‘1’’, the WSM has
been unsuccessful at performing an erase verifica-
tion. The device’s CUI only resets this bit to a ‘‘0’’ in
response to a Clear Status Register command.
Bit 4ÐWrite Status
This bit will be cleared to a 0 to indicate a successful
data-write operation. When the WSM fails to write
data after receiving a write command, the bit is set
to a ‘‘1’’ and can only be reset by the CUI in re-
sponse to a Clear Status Register command.
Bit 3ÐVPP Status
During block-erase and data-write operations, the
WSM monitors the output of the device’s internal
VPP detector. In the event of low VPP, the WSM sets
(‘‘1’’) the VPP Status bit, the status bit for the opera-
tion in progress (either write or erase). The CUI re-
sets these bits in response to a Clear Status Regis-
ter command. Also, the WSM RY/BYÝbit will be set
to indicate a device ready condition. This bit MUST
be reset by system software (Clear Status Register
command) before further data writes or block erases
are attempted.
Device Status Register (Read Only Register)
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
WSM Erase Erase Write VPP
Reserved
Status Suspend Status Status Status
Status
19
SERIES 2 FLASH MEMORY CARDS
29043417
Bus Command x8 Mode x16 Mode
Operation
Write Write Setup Data e40H Data e4040H
Address eByte Address eWord
Within Card to be Within Card to be
Written Written
Write Data Write Data to be Written Data to be Written
Address eByte Address eWord
Within Card to be Within Card to be
Written Written
Read Defaults to Status Register Status Register
Device Sta- Data. Toggle OEÝ, Data. Toggle OEÝor
tus Register CE1Ýor CE2Ýto (CE1Ýand CE2Ý)
Read Mode update Status to update Status
Register Registers
Standby Check SR Bit 7 Check SR Bits
1eReady, 7 and 15
0eBusy 1 eReady,
0eBusy
FULL STATUS CHECK
PROCEDURE
29043418
Bus Command x8 Mode x16 Mode
Operation
Standby Check SR Bit 3 Check SR Bits
1eVPP Detected 3 and 11
Low 1 eVPP Detected
Low
Standby Check SR Bit 4 Check SR Bits
1eData Write Error 4 and 12
1eData Write Error
Figure 13. Device-Level Automated Write Algorithm
NOTES:
1. Repeat for subsequent data writes.
2. In addition, the card’s READY-BUSY STATUS REGISTER or the RDY/BSYÝpin may be used.
3. Full device-level status check can be done after each data write or after a sequence of data writes.
4. Write FFH (or FFFFH) after the last data write operation to reset the device(s) to Read Array Mode.
5. If a data write operation fails due to a low VPP (setting SR Bit 3), the Clear Status Register command MUST be issued
before further attempts are allowed by the Write State Machine.
6. If a data write operation fails during a multiple write sequence, SR Bit 4 (Write Status) will not be cleared until the
Command User Interface receives the Clear Status Register command.
20
SERIES 2 FLASH MEMORY CARDS
29043419
Bus Command x8 Mode x16 Mode
Operation
Write Erase Data e20H Data e2020H
Setup Address eBlock Address eBlock Pair
Within Card to be Within Card to be
Erased Erased
Write Erase Data eD0H Data eD0D0H
Address eBlock Address eBlock
Within Card to be Pair Within Card to
Erased be Erased
Read Defaults to Status Register Status Register
Device Sta- Data. Toggle OEÝ, Data. Toggle OEÝor
tus Register CE1Ýor CE2Ýto (CE1Ýand CE2Ý)
Read Mode update Status to update Status
Register Register
Standby Check SR Bit 7 Check SR Bits 7 and 15
1eReady, 1 eReady,
0eBusy 0 eBusy
FULL STATUS CHECK PROCEDURE
29043420
Bus Command x8 Mode x16 Mode
Operation
Standby Check SR Bit 3 Check SR Bits
1eVPP Detected 3 and 11
Low Either Bit 1 eVPP
Detected Low
Standby Check SR Bits 4 and 5 Check SR Bits 4, 5,
Both 1 eCommand 12, 13
Sequence Error All 1 eCommand
Sequence Error
Standby Check SR Bit 5 Check SR Bits
1eBlock Erase 5 and 13
Error Both 1 eBlock
Erase Failure
Figure 14. Device-Level Automated Erase Algorithm
NOTES:
1. Repeat for subsequent data writes.
2. In addition, the card’s READY-BUSY STATUS REGISTER or the RDY/BSYÝpin may be used.
3. Full device-level status check can be done after each block erase or after a sequence of block erases.
4. Write FFH (or FFFFH) after the last block erase operation to reset the device(s) to Ready Array Mode.
5. If a block erase operation fails due to a low VPP (setting SR Bit 3), the Clear Status Register command MUST be issued
before further attempts are allowed by the Write State Machine.
6. If a block erase operation fails during a multiple block erase sequence, SR Bit 4 (Write Status) will not be cleared until the
Command User Interface receives the Clear Status Register command.
21
SERIES 2 FLASH MEMORY CARDS
29043427
Bus Command x8 Mode x16 Mode
Operation
Write Suspend Data eB0H, Data eB0B0H,
Erase Address eDesired Address eDesired
Block to Erase Block Pair to Erase
Suspend Suspend
Read Status Register Status Register
Data. Toggle OEÝ, Data. Toggle OEÝor
CE1Ýor CE2Ýto (CE1Ýand CE2Ý)
update Status to update Status
Register Register
Standby Check SR Bit 7 Check SR Bit 7 and 15
1eReady, 1 eReady,
0eBusy 0 eBusy
Standby Check SR Bit 6 Check SR Bit 6 and 14
1eSuspended, 1 eSuspended,
0eIn Progress 0 eIn Progress
Write Rd Array Data eFFH Data eFFFFH
Cmd
Read Read Data Read Data
until finished until finished
Write Erase Data eD0H, Data eD0D0H,
Resume Address eValid Address eValid
Block Address. Block Pair Address.
Figure 15. Erase Suspend/Resume Algorithm. Allows Reads to Interrupt Erases.
POWER CONSUMPTION
STANDBY MODE
In most applications, software will only be accessing
one device pair at a time. The Series 2 Card is de-
fined to be in the standby mode when one device
pair is in the Read Array Mode while the remaining
devices are in the Deep-Sleep Mode. The Series 2
Card’s CE1Ýand CE2Ýinput signals must also be
at VIH. In standby mode, much of the card’s circuitry
is shut off, substantially reducing power consump-
tion. Typical power consumption for a 20 Megabyte
Series 2 card in standby mode is 65 mA.
SLEEP MODE
Writing a ‘‘1’’ to the PWRDWN bit of the GLOBAL
POWERDOWN REGISTER places all FlashFile
Memory devices into a Deep-Sleep mode. This dis-
ables most of the 28F008SA’s circuitry and reduces
current consumption to 0.2 mA per device. Addition-
ally, when the host system pulls ASIC control logic
high and latches all address and data lines (i.e., not
toggling), the card’s total current draw is reduced to
approximately 5 mA (CMOS input levels) for a 20
Megabyte card. On writing a ‘‘0’’ to the PWRDWN bit
(Global PowerDown Register) or any individual de-
vice pair (Sleep Control Register), a Deep-Sleep
mode recovery period must be allowed for
28F008SA device circuitry to power back on.
22
SERIES 2 FLASH MEMORY CARDS
SYSTEM DESIGN CONSIDERATIONS
POWER SUPPLY DECOUPLING
Flash memory power-switching characteristics re-
quire careful device decoupling. System designers
are interested in three supply current issuesÐstand-
by, active and transient current peaks, produced by
rising and falling edges of CE1Ýand CE2Ý. The
capacitive and inductive loads on the card and inter-
nal flash memory device pairs determine the magni-
tudes of these peaks.
The Flash Memory Card features on-card ceramic
decoupling capacitors connected between VCC and
GND, and between VPP1/VPP2 and GND to help
transient voltage peaks.
On the host side, the card connector should also
have a 4.7 mF electrolytic capacitor between VCC
and GND, as well as between VPP1/VPP2 and GND.
The bulk capacitors will overcome voltage slumps
caused by printed-circuit-board trace inductance,
and will supply charge to the smaller capacitors as
needed.
POWER UP/DOWN PROTECTION
Each device in the Flash Memory Card is designed
to offer protection against accidental erasure or writ-
ing, caused by spurious system-level signals that
may exist during power transitions. The card will
power-up into the Read Array Mode.
A system designer must guard against active writes
for VCC voltages above VLKO when VPP is active.
Since both WEÝand CE1Ý(and/or CE2Ý) must be
low for a command write, driving either to VIH will
inhibit writes. With its Command User Interface, al-
teration of device contents only occurs after suc-
cessful completion of the two-step command se-
quences.
While these precautions are sufficient for most appli-
cations, an alternative approach would allow VCC to
reach its steady state value before raising VPP1/
VPP2 above VCC a2.0V. In addition, upon power-
ing-down, VPP1/VPP2 should be below VCC a2.0V,
before lowering VCC.
HOT INSERTION/REMOVAL
The capability to remove or insert PC cards while the
system is powered on (i.e., hot insertion/removal)
requires careful design approaches on the system
and card levels. To design for this capability consid-
er card overvoltage stress, system power droop and
control line stability.
A PCMCIA/JEIDA specified socket properly se-
quences the power supplies to the flash memory
card via shorter and longer pins. This assures that
hot insertion and removal will not result in card dam-
age or data loss.
PCMCIA CARD INFORMATION
STRUCTURE
The Card Information Structure (CIS) starts at ad-
dress zero of the card’s Attribute Memory Plane. It
contains a variable-length chain of data blocks (tu-
ples) that conform to a basic format as shown in
Table 5. This section describes each tuple contained
within the Series 2 Flash Memory Card.
The Device Information Tuple
This tuple (CISTPLÐDEV e01H) contains informa-
tion pertaining to the card’s speed and size. The Se-
ries 2 Card is offered with a 150 nanosecond access
time. Card sizes range between 2 and 20 Mega-
bytes.
Table 5. Tuple Format
Bytes Data
0 Tuple Code: CISTPLÐxxx. The tuple code 0FFH indicates no more tuples in the list.
1 Tuple Link: TPLÐLlNK. Link to the next tuple in the list. This can be viewed as the number of
additional bytes in tuple, excluding this byte. If the link field is zero, the tuple body is empty. If the
link field contains 0FFH, this tuple is the last tuple in the list.
2bn Bytes specific to this tuple.
23
SERIES 2 FLASH MEMORY CARDS
The Device Geometry Tuple
This tuple (CISTPLÐDEVlCEGEO e1EH) is con-
ceptually similar to a DOS disk geometry tuple
(CISTPLÐGEOMETRY), except it is not a format-
dependent property; this deals with the fixed archi-
tecture of the memory device(s).
Fields are defined as follows:
DGTPL BUSÐValue en, where system bus width
e2(nb1) bytes. N e2 for standard PCMClA Re-
lease 1.0/2.0 cards.
DGTPL EBSÐValue en, where the memory array’s
physical memory segments have a minimum erase
block size of 2(nb1) address increments of
DGTPLÐBUS-wide accesses.
DGTPL RBSÐValue en, where the memory ar-
ray’s physical memory segments have a minimum
read block size of 2(nb1) address increments of
DGTPLÐBUS-wide accesses.
DGTPL WBSÐValue en, where the memory ar-
ray’s physical memory segments have a minimum
write block size of 2(nb1) address increments of
DGTPLÐBUS-wide accesses.
DGTPL PARTÐValue en, where the memory ar-
ray’s physical memory segments can have partitions
subdividing the arrays in minimum granularity of
2(nb1) number of erase blocks.
FL DEVICE INTERLEAVEÐValue en, where card
architectures employ a multiple of 2(nb1) times inter-
leaving of the entire memory arrays with the above
characteristics. Non-interleaved cards have values
ne1.
Jedec Programming
Information Tuple
This tuple (CISTPLÐJEDEC e18H) contains the
Intel manufacturing identifier (89H) and the
28F008SA device ID (A2H).
Level 1 Version/Product
Information Tuple
This tuple (CISTPLÐVERI e15H) contains Level-1-
version compliance and card-manufacturer informa-
tion. Fields are described as follows:
TPLLV1 MAJORÐMajor version number e04H.
TPLLV1 MINORÐMinor version number e01H for
release 2.0.
TPLLV1 INFOÐ
Name of manufacturer eintel;
Name of product eSERIES2-‘‘Card size’’;
Card type e2;
Speed e150 ns or 200 ns
Register Base eREGBASE 4000H
Test Codes eDBBDRELP
Legalities eCOPYRIGHT intel
Corporation 1991
The Configurable Card Tuple
This tuple (ClSTPLÐCONF e1AH) describes the
interface supported by the card and the locations of
the Card Configuration Registers and the Card Con-
figuration Table.
Fields are described as follows:
TPCC SZÐSize of fields byte e01H.
TPCC LASTÐIndex number of the last entry in the
Card Configuration Table e00H.
TPCC RADRÐConfiguration Registers Base Ad-
dress in Reg Space e4000H.
TPCC RMSKÐConfiguration Registers Present
Mask e03H.
The End-Of-List Tuple
The end-of-list tuple (CISTPLÐEND eFFH) marks
the end of a tuple chain. Upon encountering this tu-
ple, continue tuple processing as if a long-link to ad-
dress 0 of common memory space were encoun-
tered.
24
SERIES 2 FLASH MEMORY CARDS
Tuple Value Description
Address
00H 01H CISTPLÐDEV
02H 03H TPLÐLINK
04H 53H DEVICEÐINFO e
FLASH 150 ns
52H DEVICEÐINFO e
FLASH 200 ns
CARD SIZE
06H 06H 2M
0EH 4M
26H 10M
4EH 20M
08H FFH END OF
DEVICE
0AH 1EH CISTPLÐ
DEVICEGEO
0CH 06H TPLÐLINK
0EH 02H DGTPLÐBUS
10H 11H DGTPLÐEBS
12H 01H DGTPLÐRBS
14H 01H DGPLÐWBS
16H 03H DGTPLÐPART
18H 01H FLÐDEVICE
INTERLEAVE
1AH 18H CISTPLÐJEDEC
1CH 02H TPLÐLINK
1EH 89H INTEL J-ID
20H A2H 28F008 J-ID
22H 15H CISTPLÐVER1
24H 50H TPLÐLINK
26H 04H TPLLV1
MAJOR
28H 01H TPLLV1
MINOR
2AH 69H TPLLV1 INFO
i
2CH 6EH n
2EH 74H t
30H 65H e
Tuple Value Description
Address
32H 6CH l
34H 00H END TEXT
36H 53H S
38H 45H E
3AH 52H R
3CH 49H I
3EH 45H E
40H 53H S
42H 32H 2
44H 2DH Ð
46H 30H 2M e0
30H 4M e0
31H 10M e1
32H 20M e2
48H 32H 2M e2
34H 4M e4
30H 10M e0
30H 20M e0
4AH 20H SPACE
4CH 00H END TEXT
4EH 32H CARD TYPE 2
50H 41H A e2M, 150 ns
42H B e4M, 150 ns
45H E e10M, 150 ns
5AH Z e20M, 150 ns
48H H e2M, 200 ns
49H I e4M, 200 ns
4CH L e10M, 200 ns
4FH O e20M, 200 ns
25
SERIES 2 FLASH MEMORY CARDS
Tuple Value Description
Address
52H 20H SPACE
54H 52H REGBASE-R
56H 45H E
58H 47H G
5AH 42H B
5CH 41H A
5EH 53H S
60H 45H E
62H 20H SPACE
4000h
64H 34H 4
66H 30H 0
68H 30H 0
6AH 30H 0
6CH 68H h
6EH 20H SPACE
70H 44H D
72H 42H B
74H 42H B
76H 44H D
78H 52H R
7AH 45H E
7CH 4CH L
7EH 50H P
80H 00H END TEXT
COPYRIGHT
82H 43H C
84H 4FH O
86H 50H P
88H 59H Y
8AH 52H R
8CH 49H I
8EH 47H G
90H 48H H
92H 54H T
94H 20H SPACE
Tuple Value Description
Address
96H 69H i
98H 6EH n
9AH 74H t
9CH 65H e
9EH 6CH l
A0H 20H SPACE
CORPORATION
A2H 43H C
A4H 4FH O
A6H 52H R
A8H 50H P
AAH 4FH O
ACH 52H R
AEH 41H A
B0H 54H T
B2H 49H I
B4H 4FH O
B6H 4EH N
B8H 20H SPACE
BAH 31H 1
BCH 39H 9
BEH 39H 9
C0H 31H 1
C2H 00H END TEXT
C4H FFH END OF LIST
C6H 1AH CISTPLÐCONF
C8H 06H TPLÐLINK
CAH 01H TPCCÐSZ
CCH 00H TPCCÐLAST
CEH 00H TPCCÐRADR
D0H 40H TPCCÐRADR
D2H 03H TPCCÐRMSK
D4H FFH END OF LIST
D6H FFH CISTPLÐEND
D8H 00H INVALID ECIS
ADDRESS
26
SERIES 2 FLASH MEMORY CARDS
OPERATING SPECIFICATlONS
ABSOLUTE MAXIMUM RATINGS*
Storage TemperatureÀÀÀÀÀÀÀÀÀÀÀÀb40§Ctoa
85§C
Voltage on Any Pin with
Respect to Ground ÀÀÀÀÀb2.0V to VCC a2.0V(1)
VPP1/VPP2 Supply Voltage with
Respect to Ground ÀÀÀÀÀÀÀb2.0V to a14.0V(1, 2)
VCC Supply Voltage with
Respect to Ground ÀÀÀÀÀÀÀÀÀÀÀÀb0.5V to a7.0V
NOTICE: This data sheet contains preliminary infor-
mation on new products in production. The specifica-
tions are subject to change without notice. Verify with
your local Intel Sales office that you have the latest
data sheet before finalizing a design.
*
WARNING: Stressing the device beyond the ‘‘Absolute
Maximum Ratings’’ may cause permanent damage.
These are stress ratings only. Operation beyond the
‘‘Operating Conditions’’ is not recommended and ex-
tended exposure beyond the ‘‘Operating Conditions’’
may affect device reliability.
NOTES:
1. Minimum DC input voltage is b0.5V. During transitions, inputs may undershoot to b2.0V tor periods of less than 20 ns.
Maximum DC voltage on output pins is VCC a0.5V. The voltage may overshoot to VCC a2.0V for periods of less than 20
ns.
2. Maximum DC input voltage on VPP1/VPP2 may overshoot to a14.0V for periods of less than 20 ns.
COMMERCIAL TEMPERATURE OPERATING CONDITIONS
These operating conditions apply to commercial temperature devices.
Symbol Parameter Min Max Unit
TAOperating Temperature 0 70 §C
VCC VCC Supply Voltage (5%) 4.75 5.25 V
EXTENDED TEMPERATURE OPERATING CONDITIONS
These operating conditions apply to extended temperature devices.
Symbol Parameter Min Max Unit
TAOperating Temperature b40 85 §C
VCC VCC Supply Voltage (5%) 4.75 5.25 V
CHARACTERISTICS
All AC and DC characteristics apply to both commercial and extended temperature devices.
COMMON DC CHARACTERISTICS, CMOS and TTL
Symbol Parameter Notes Min Typ Max Unit Test Condition
ILI Input Leakage Current 1, 3 g1g20 mAV
CC eVCC Max
VIN eVCC or GND
ILO Output Leakage Current 1 g1g20 mAV
CC eVCC Max
VOUT eVCC or GND
VIL Input Low Voltage 1 b0.5 0.8 V
VIH Input High Voltage (TTL) 12.4 VCC a0.3 V
Input High Voltage (CMOS) 0.7 VCC VCC a0.3
VOL Output Low Voltage 1 VSS 0.4 V VCC eVCC Min
IOL e3.2 mA
VOH Output High Voltage 1 4.0 VCC VV
CC eVCC Min
IOH eb
2.0 mA
VPPL VPP during Read Only Operations 1, 2 0.0 6.5 V
VPPH VPP during Read/Write Operations 1 11.4 12.6 V
VLKO VCC Erase/Write Lock Voltage 1 2.0 V
NOTES:
1. Values are the same for byte and word wide modes and for all card densities.
2. Block Erases/Data Writes are inhibited when VPP eVPPL and not guaranteed in the range between VPPH and VPPL.
3. Exceptions: With VIN eGND, the leakage on CE1Ý,CE
2
Ý
, REGÝ,OE
Ý
,WE
Ý
, will be s500 mA due to internal pullup
resistors and, with VIN eVCC, RST leakage will be s500 mA due to internal pulldown resistor.
27
SERIES 2 FLASH MEMORY CARDS
DC CHARACTERISTICS, CMOS
Symbol Parameter Notes Byte Wide Mode Word Wide Mode Unit Test Condition
Min Typ Max Min Typ Max
ICCR VCC Read Current 1, 3 45 85 65 120 mA VCC eVCC Max,
Control Signals
eGND
tCYCLE e200 ns,
IOUT e0mA
I
CCW VCC Write Current 1, 3 35 80 45 110 mA Data Write
in Progress
ICCE VCC Erase Current 1, 2, 3 35 80 45 110 mA Block (Pair) Erase
in Progress
ICCS VCC Standby Current 2 Meg
1, 4, 6
110 420 110 420
mA
VCC eVCC Max,
Control Signals
4 Meg 160 620 160 620 eVIH
10 Meg 310 1220 310 1220
20 Meg 560 2200 560 2200
ICCSL VCC Sleep Current 2 Meg
1, 4, 5
60 60
mA
4 Meg 100 100
10 Meg 260 260
20 Meg 460 460
IPPW VPP Write 1, 3 15 30 mA Data Write
Current (VPP eVPPH) in Progress
IPPE VPP Erase 1, 3 15 30 mA Block (Pair) Erase
Current (VPP eVPPH) in Progress
IPPSL VPP Sleep Current 2 Meg
1, 5
0.2 10 0.2 10
mA
4 Meg 0.4 20 0.4 20
10 Meg 1 50 1 50
20 Meg 2 100 2 100
IPPS1 VPP Standby or 2 Meg
1, 6
2.0 20 2.0 20
mA
Read Current 4 Meg 2.2 30 2.2 30
(VPP sVCC)
10 Meg 2.8 60 2.8 60
20 Meg 3.8 110 3.8 110
IPPS2 VPP Standby or 2 Meg
1, 6
20 400 20 400
mA
Read Current 4 Meg 40 800 40 800
(VPP lVCC)
10 Meg 100 2000 100 2000
20 Meg 200 4000 200 4000
NOTES:
1. All currents are in RMS unless otherwise noted. Typical values at VCC e5.0V, VPP e12.0V, T e25§C.
2. The Data Sheet specification for the 28F008SA in Erase Suspend (ICCES) is 5 mA typical and 10 mA max with the device
deselected. If the device(s) are read while in Erase Suspend Mode, current draw is the sum of ICCES and ICCR.
3. Standby or Sleep currents are not included for non-accessed devices.
4. Address and data inputs to card static. Control line voltages equal to VIH or VIL.
5. All 28F008SA devices in Deep-Sleep (Reset-PowerDown) mode.
6. In Byte and Word Mode, all but two devices in Deep-Sleep.
28
SERIES 2 FLASH MEMORY CARDS
DC CHARACTERISTICS, TTL
Symbol Parameter Notes Byte Wide Mode Word Wide Mode Unit Test Condition
Min Typ Max Min Typ Max
ICCR VCC Read Current 1, 3 70 135 90 170 mA VCC eVCC Max,
Control Signals eGND
tCYCLE e200 ns,
IOUT e0mA
I
CCW VCC Write Current 1, 3 60 130 70 160 mA Data Write
in Progress
ICCE VCC Erase Current 1, 2, 3 60 130 70 160 mA Block (Pair) Erase
in Progress
ICCS VCC Standby Current 2 Meg
1, 4, 6 20 100 20 100 mA
VCC eVCC Max,
Control Signals
4 Meg eVIH
10 Meg
20 Meg
ICCSL VCC Sleep Current 2 Meg
4 Meg 1, 4, 5 20 100 20 100 mA
10 Meg
20 Meg
IPPW VPP Write 1, 3 10 30 20 60 mA Data Write
Current (VPP eVPPH) in Progress
IPPE VPP Erase 1, 3 10 30 20 60 mA Block (Pair) Erase
Current (VPP eVPPH) in Progress
IPPSL VPP Sleep Current 2 Meg
1, 5
0.2 10 0.2 10
mA
4 Meg 0.4 20 0.4 20
10 Meg 1.0 50 1.0 50
20 Meg 2.0 100 2.0 100
IPPS1 VPP Standby or 2 Meg
1, 6
2.0 20 2.0 20
mA
Read Current 4 Meg 2.2 30 2.2 30
(VPP sVCC)
10 Meg 2.8 60 2.8 60
20 Meg 3.8 110 3.8 110
IPPS2 VPP Standby or 2 Meg
1, 6
20 400 20 400
mA
Read Current 4 Meg 40 800 40 800
(VPP lVCC)
10 Meg 100 2000 100 2000
20 Meg 200 4000 200 4000
NOTES:
1. All currents are in RMS unless otherwise noted. Typical values at VCC e5.0V, VPP e12.0V, T e25§C.
2. The Data Sheet specification for the 28F008SA in Erase Suspend (ICCES) is 5 mA typical and 10 mA max with the device
deselected. If the device(s) are read while in Erase Suspend Mode, current draw is the sum of ICCES and ICCR.
3. Standby or Sleep currents are not included for non-accessed devices.
4. Address and data inputs to card static. Control line voltages equal to VIH or VIL.
5. All 28F008SA devices in Deep-Sleep (Reset-PowerDown) mode.
6. In Byte and Word Mode, all but two devices in Deep-Sleep.
7. The current consumption from the 28F008SA is insignificant in relation to the ASIC’s.
29
SERIES 2 FLASH MEMORY CARDS
AC CHARACTERISTICS
AC Timing Diagrams and characteristics are guaran-
teed to meet or exceed PCMCIA Release 2.0 speci-
fications. PCMCIA allows a 300 ns access time for
Attribute Memory. Note that read and write access
timings to the Series 2 Flash Memory Card’s Com-
mon and Attribute Memory Planes are identical at
150 ns. Furthermore, there is no delay in switching
between the Common and Attribute Memory Planes.
COMMON AND ATTRIBUTE MEMORY, AC CHARACTERISTICS: Read-Only Operations
Symbol Parameter Notes Min Max Unit
JEDEC PCMCIA
tAVAV tRC Read Cycle Time 150 ns
tAVQV ta(A) Address Access Time 150 ns
tELQV ta(CE) Card Enable Access Time 150 ns
tGLQV ta(OE) Output Enable Access Time 75 ns
tEHQX tdis (CE) Output Disable Time from CEÝ75 ns
tGHQZ tdis (CE) Output Disable Time from OEÝ75 ns
tGLQX ten (CE) Output Enable Time from CEÝ5ns
t
ELQX ten (OE) Output Enable Time from OEÝ5ns
t
AXQX tv(A) Data Valid from Add Change 0 ns
tRHQV Reset-PwrDwn Recovery to Output Delay 500 ns
tsu (VCC) CE Setup Time on Power-Up 1 ms
First Access after Reset 500 ns
29043428
Transient Input/Output Reference Waveform (VCC e5.0V) for Standard Test Configuration
29043429
Transient Input/Output Reference Waveform (VCC e3.3V) for Standard Test Configuration
30
SERIES 2 FLASH MEMORY CARDS
Figure 16. AC Waveform for Read Operations
29043421
NOTE:
1. The hatched area may be either high or low.
31
SERIES 2 FLASH MEMORY CARDS
COMMON AND ATTRIBUTE MEMORY, AC CHARACTERISTICS: Write Operations(1)
Symbol Parameter Notes Min Max Unit
JEDEC PCMCIA
tAVAV tWC Write Cycle Time 150 ns
tWLWH tw(WE) Write Pulse Width 80 ns
tAVWL tsu (A) Address Setup Time 20 ns
tAVWH tsu (A-WEH) Address Setup Time for WEÝ100 ns
tVPWH tvps VPP Setup to WEÝGoing High 100 ns
tELWH tsu (CE-WEH) Card Enable Setup Time for WEÝ100 ns
tDVWH tsu (D-WEH) Data Setup Time for WEÝ50 ns
tWHDX th(D) Data Hold Time 20 ns
tWHAX trec (WE) Write Recover Time 20 ns
tWHRL WEÝHigh to RDY/BSYÝ120 ns
tWHQV1 Duration of Data Write Operation 6 ms
tWHQV2 Duration of Block Erase Operation 0.3 sec
tQVVL VPP Hold from Operation Complete 2 0 ns
tWHGL th(OE-WE) Write Recovery before Read 10 ns
tRHWL Reset-PwrDwn Recovery to WEÝGoing Low 1 ms
NOTES:
1. Read timing characteristics during erase and data write operations are the same as during read-only operations. Refer to
AC Characteristics for Read-Only operations.
2. Refer to text on Data-Write and Block-Erase Operations.
BLOCK ERASE AND DATA WRITE PERFORMANCE
Parameter Notes Min Typ(3) Max Unit
Block Pair Erase Time(1) 2, 4 1.1 10 sec
Block Pair Write Time 2, 4 0.5 2.1 sec
Byte/Word Write Time 4 4.8 ms6ms3ms
NOTES:
1. Individual blocks can be erased 100,000 times.
2. Excludes System-Level Overhead.
3. 25§C, 12.0 VPP.
4. Monitor Ready/Busy Registers for the completion of a write/erase command.
32
SERIES 2 FLASH MEMORY CARDS
Figure 17. AC Waveform for Write Operations
29043422
NOTE:
By writing the appropriate register, or on power-up, the card control ASIC generates the RPÝsignal to the card’s devices.
33
SERIES 2 FLASH MEMORY CARDS
COMMON AND ATTRIBUTE MEMORY, AC CHARACTERISTICS: CEÝ-Controlled Write Operations(1)
Symbol Parameter Notes Min Max Unit
JEDEC PCMCIA
tAVAV tWC Write Cycle Time 1 150 ns
tELEH tw(WE) Chip Enable Pulse Width 1 80 ns
tAVEL tsu (A) Address Setup Time 1 20 ns
tAVEH tsu (A-WEH) Address Setup Time for CEÝ1 100 ns
tVPEH tvps VPP Setup to CEÝGoing High 1 100 ns
tWLEH tsu (CE-WEH) Write Enable Setup Time for CEÝ1 100 ns
tDVEH tsu (D-WEH) Data Setup Time for CEÝ150 ns
t
EHDX th(D) Data Hold Time 1 20 ns
tEHAX trec (WE) Write Recover Time 1 20 ns
tEHRL CEÝHigh to RDY/BSYÝ1 120 ns
tEHQV1 Duration of Duration of Data Write Operation 1 6 ms
Data Write
tEHQV2 Duration of Duration of Block Erase Operation 1 0.3 sec
Erase
tQVVL VPP Hold from Operation Complete 1, 2 0 ns
tEHGL th(OE-WE) Write Recovery before Read 1 10 ns
tRHEL Reset-PwrDwn Recovery to CEÝGoing Low 1 ms
NOTES:
1. Read timing characteristics during erase and data write operations are the same as during read-only operations. Refer to
AC Characteristics for Read-Only operations.
2. Refer to text on Data-Write and Block-Erase Operations.
34
SERIES 2 FLASH MEMORY CARDS
Figure 18. Alternate AC Waveform for Write Operations
29043423
NOTE:
By writing the appropriate register, or on power-up, the card control ASIC generates the RPÝsignal to the card’s devices.
35
SERIES 2 FLASH MEMORY CARDS
29043424
Figure 19. Series 2 Flash Memory Card Package Dimensions
36
SERIES 2 FLASH MEMORY CARDS
29043425
Figure 20. Card Connector Socket
29043426
L1 MAX L2 L3 REF
0.020 Pin TypeÐSee Table 1 0.024
(0.5) Detect 0.059 (1.5) g0.039 (0.6)
General 0.084 (2.1) g0.064
Power 0.098 (2.5) g0.078
Figure 21. Pin/Socket Contact Length with Wipe
37
SERIES 2 FLASH MEMORY CARDS
Label Dimensions
29043430
NOTES:
Total label dimensions are g0.003×
Total label thickness with adhesive is 0.002×
Card Dimensions with Label
29043431
Figure 22. Label Information
38
SERIES 2 FLASH MEMORY CARDS
Table 5. Capacitance TAe25§C, f e1.0 MHz
Symbol Characteristics Commercial Unit
Min Max
CIN Address/Control Capacitance (A0–A8,CE
1
Ý
,CE
2
Ý
)30pF
Address/Control Capacitance (A9–A24, all others) 20 pF
VCC,V
PP 2mF
COUT Output Capacitance 20 pF
NOTE:
Sampled, not 100% tested.
ORDERING INFORMATION
iMC020FLSA-15
WHERE:
ieINTEL
MC eMEMORY CARD
020 eDENSITY IN MEGABYTES
(002,004,010,020 AVAILABLE)
FL eFLASH TECHNOLOGY
SeBLOCKED ARCHITECTURE
AeSERIES 2
-ET eEXTENDED TEMPERATURE
15 e150 ns
M9508014,SBXXXX
MeMANILA
95 e1995
08 eWEEK 08
014 eLOT Ý
SBXXXX eCUSTOMER IDENTIFIER
ADDITIONAL INFORMATION ORDER NUMBER
28F008SA FlashFileTM Memory Data Sheet 290429
AP-361 ‘‘Implementing the Integrated Registers of the Series 2 Flash Memory Card’’ 292096
AP-364 ‘‘28F008SA Automation and Algorithms’’ 292099
AP-359 ‘‘28F008SA Hardware Interfacing’’ 292094
AP-360 ‘‘28F008SA Software Drivers’’ 292095
AP-606 ‘‘Interchangeability of Series 1/2/2aFlash Memory Cards’’
REVISION HISTORY
Number Description
02 Added 150 ns TUPLE, Deleted 250 ns TUPLE
Corrected Global Power Register Address to 4002H
Corrected Write Protection Register Address to 4104H
Corrected Ready-Busy Mode Register Address to 4140H
ICC Standby Byte Wide Mode MAX/TYP Increased
Added Power-On Timing Spec
Added First Access after Reset Spec
Changed Advanced Information to Preliminary
03 Added 2 MByte card support
Changed write timing waveforms to match PCMCIA
Changed PowerDown (PWD) to Reset-PowerDown (RP)
04 Extended Operating Temperature Range
Added Maximum Byte Write Time
05 Added 150 ns Timings
Change Cover Drawing to Accommodate Label
06 Modified DC characteristics to reflect a conversion to new memory componentsÐthe 0.4m
version of the 28F008SA. The new devices also have improved program and erase
performance.
39