ALD110904 - Advanced Linear Devices

EPAD

ADVANCED

LINEAR

DEVICES, INC.

ALD110804/ALD110904

ORDERING INFORMATION

*N/C pins are internally connected.

Connect to V- to reduce noise

PC, SC PACKAGES

PA, SA PACKAGES

PIN CONFIGURATION

GENERAL DESCRIPTION

ALD110804/ALD110904 are monolithic quad/dual N-Channel MOSFETs

matched at the factory using ALD’s proven EPAD® CMOS technology.

These devices are intended for low voltage, small signal applications.

The ALD110804/ALD110904 MOSFETs are designed and built for ex-

ceptional device electrical characteristics matching. Since these devices

are on the same monolithic chip, they also exhibit excellent tempco tracking

characteristics. They are versatile circuit elements useful as design com-

ponents for a broad range of analog applications, such as basic building

blocks for current sources, differential amplifier input stages, transmis-

sion gates, and multiplexer applications. For most applications, connect

V- and N/C pins to the most negative voltage potential in the system and

V+ pin to the most positive voltage potential (or left open unused). All

other pins must have voltages within these voltage limits.

The ALD1 10804/ALD1 10904 devices are built for minimum offset voltage

and differential thermal response, and they are suited for switching and

amplifying applications in <+0.1V to +10V systems where low input bias

current, low input capacitance and fast switching speed are desired, as

these devices exhibit well controlled turn-off and sub-threshold charac-

teristics and can be biased and operated in the sub-threshold region.

Since these are MOSFET devices, they feature very large (almost infi-

nite) current gain in a low frequency, or near DC, operating environment.

The ALD110804/ALD110904 are suitable for use in very low operating

voltage or very low power (nanowatt), precision applications which re-

quire very high current gain, beta, such as current mirrors and current

sources. The high input impedance and the high DC current gain of the

Field Effect Transistors result from extremely low current loss through

the control gate. The DC current gain is limited by the gate input leakage

current, which is specified at 30pA at room temperature. For example,

DC beta of the device at a drain current of 3mA and input leakage current

of 30pA at 25°C is = 3mA/30pA = 100,000,000.

FEATURES

• Enhancement-mode (normally off)

• Precision Gate Threshold Voltage of +0.40V

• Matched MOSFET to MOSFET characteristics

• Tight lot to lot parametric control

• Low input capacitance

• VGS(th) match (VOS) to 10mV

• High input impedance — 1012Ω typical

• Positive, zero, and negative VGS(th) temperature coefficient

• DC current gain >108

• Low input and output leakage currents

Operating Temperature Range*

0°C to +70°C0°C to +70°C

16-Pin 16-Pin 8-Pin 8Pin

Plastic Dip SOIC Plastic Dip SOIC

Package Package Package Package

ALD110804PC ALD110804SC ALD110904PA ALD110904SA

APPLICATIONS

• Ultra low power (nanowatt) analog and digital

circuits

• Ultra low operating voltage(<0.4V) circuits

• Sub-threshold biased and operated circuits

• Precision current mirrors and current sources

• Nano-Amp current sources

• High impedance resistor simulators

• Capacitive probes and sensor interfaces

• Differential amplifier input stages

• Discrete Voltage comparators and level shifters

• Voltage bias circuits

• Sample and Hold circuits

• Analog and digital inverters

• Charge detectors and charge integrators

• Source followers and High Impedance buffers

• Current multipliers

• Discrete Analog switches / multiplexers

QUAD/DUAL N-CHANNEL ENHANCEMENT MODE EPAD®

MATCHED PAIR MOSFET ARRAY VGS(th)= +0.4V

N/C*

314

413

512

N/C*

GN1

DN1

N/C*

DN4

N/C*

GN4

GN3

DN3

DN2

GN2

S34

S12

ALD110804

M 4 M 3

M 1 M 2

V-

GN1

DN1

N/C*

S12

DN2

GN2

ALD110904

M 1 M 2

V-

N/C*

V-

Rev 1.0-0506 ©2 005 Advanced Linear Devices, Inc. 415 Tasman Drive, Sunnyvale, California 94089-1706 Tel: (408) 747-1155 Fax: (408) 747-1286

www.aldinc.com

* Contact factory for industrial or military temp. ranges or user-specified threshold voltage values.

ALD110804/ALD110904 Advanced Linear Devices 2

Notes: 1 Consists of junction leakage currents

ABSOLUTE MAXIMUM RATINGS

Drain-Source voltage, VDS 10.6V

Gate-Source voltage, VGS 10.6V

Power dissipation 500 mW

Operating temperature range PA, SA, PC, SC package 0°C to +70°C

Storage temperature range -65°C to +150°C

Lead temperature, 10 seconds +260°C

OPERATING ELECTRICAL CHARACTERISTICS

V+ = +5V (or open) V- = GND TA = 25°C unless otherwise specified

CAUTION: ESD Sensitive Device. Use static control procedures in ESD controlled environment.

Gate Threshold Voltage VGS(th) 0.38 0.40 0.42 V IDS =1µA

VDS = 0.1V

Offset Voltage VOS 210mV

VGS(th)1-VGS(th)2

Offset VoltageTempco TC ∆VOS 5µV/ °CV

DS1 = VDS2

GateThreshold Voltage Tempco TC∆VGS(th) -1.7 mV/ °CI

D = 1µA

0.0 ID = 20µA, VDS = 0.1V

+1.6 ID = 40µA

On Drain Current IDS (ON) 12.0 mA VGS = + 9.7V

3.0 VGS = + 4.2V

VDS = +5V

Forward T ransconductance GFS 1.4 mmho VGS = + 4.2V

VDS = + 9.2V

Transconductance Mismatch ∆GFS 1.8 %

Output Conductance GOS 68 µmho VGS =+4.2V

VDS = +9.2V

Drain Source On Resistance RDS (ON) 500 ΩVDS = 0.1V

VGS = +4.2V

Drain Source On Resistance ∆RDS (ON) 0.5 %

Mismatch

Drain Source Breakdown BVDSX 10 V IDS = 1.0µA

Voltage VGS = -0.8V

Drain Source Leakage Current1IDS (OFF) 10 100 pA VGS = -0.8V

4nAV

DS =10V, TA = 125 °C

Gate Leakage Current1IGSS 330pAV

DS = 0V VGS = 10V

1nAT

A =125°C

Input Capacitance CISS 2.5 pF

Transfer Reverse Capacitance CRSS 0.1 pF

Turn-on Delay Time ton 10 ns V+ = 5V RL= 5KΩ

Turn-off Delay Time toff 10 ns V+ = 5V RL= 5KΩ

Crosstalk 60 dB f = 100KHz

ALD110804 / ALD110904

Parameter Symbol Min Typ Max Unit Test Conditions