LMV761
,
LMV762
,
LMV762Q-Q1
www.ti.com
SNOS998I –FEBRUARY 2002–REVISED OCTOBER 2015
6.2 ESD Ratings: LMV761, LMV762 VALUE UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(2) ± 2000
V(ESD) Electrostatic discharge(1) V
Machine model ± 200
(1) Unless otherwise specified human body model is 1.5 kΩin series with 100 pF. Machine model 200 pF.
(2) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
6.3 ESD Ratings: LMV762Q-Q1 VALUE UNIT
Human-body model (HBM), per AEC Q100-002(1) ± 2000
V(ESD) Electrostatic discharge V
Machine model ± 200
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
6.4 Recommended Operating Conditions MIN MAX UNIT
Supply voltage (V+– V−) 2.7 5.25 V
Temperature range −40 125 °C
6.5 Thermal Information LMV761 LMV762, LMV762Q-Q1
THERMAL METRIC(1) D (SOIC) DBV (SOT-23) DGK (VSSOP) UNIT
8 PINS 6 PINS 8 PINS
RθJA Junction-to-ambient thermal resistance (2) 190 265 235 °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
(2) The maximum power dissipation is a function of TJ(MAX),θJA, and TA. The maximum allowable power dissipation at any ambient
temperature is PD= (TJ(MAX) – TA) RθJA. All numbers apply for packages soldered directly into a PCB.
6.6 2.7-V Electrical Characteristics
Unless otherwise specified, all limited ensured for TJ= 25°C, VCM = V+/ 2, V+= 2.7 V, V−= 0 V−.
PARAMETER TEST CONDITIONS MIN(1) TYP(2) MAX(1) UNIT
0.2
VOS Input offset voltage mV
apply at the temperature extremes(3) 1
IBInput bias current(4) 0.2 50 pA
IOS Input offset current(4) 0.001 5 pA
Common-mode rejection
CMRR 0 V < VCM < VCC – 1.3 V 80 100 dB
ratio
PSRR Power supply rejection ratio V+= 2.7 V to 5 V 80 110 dB
Input common-mode voltage apply at the temperature
CMVR CMRR > 50 dB −0.3 1.5 V
range extremes(3)
Output swing high IL= 2 mA, VID = 200 mV V+– 0.35 V+– 0.1 V
VOOutput swing low IL=−2 mA, VID = –200 mV 90 250 mV
Sourcing, VO= 1.35 V, VID = 200 mV 6 20
ISC Output short circuit current(5) mA
Sinking, VO= 1.35 V, VID = –200 mV 6 15
(1) All limits are specified by testing or statistical analysis.
(2) Typical values represent the most likely parametric norm.
(3) Maximum temperature ensured range is −40°C to +125°C.
(4) Specified by design.
(5) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ= TA. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where TJ> TA. See Recommended Operating Conditions for information on temperature
de-rating of this device. Absolute Maximum Rating indicate junction temperature limits beyond which the device may be permanently
degraded, either mechanically or electrically.
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