TS68040VR33A - Atmel - Product.Network

Visit our website: www.e2v.com

for the latest version of the datasheet

e2v semiconductors SAS 2007

TS68040

Third-Generation 32-bit Microprocessor

Datasheet

0851B–HIREL–06/07

Features

•26-42 MIPS Integer Performance

•3.5-5.6 MFLOPS Floating-Point-Performance

•IEEE® 754-Compatible FPU

•Independent Instruction and Data MMUs

•4K bytes Physical Instruction Cache and 4K bytes Physical Data Cache Accessed

Simultaneously

•32-bit, Nonmultiplexed External Address and Data Buses with Synchronous Interface

•User-Object-Code Compatibility with All Earlier TS68000 Microprocessors

•Multimaster/Multiprocessor Support via Bus Snooping

•Concurrent Integer Unit, FPU, MMU, Bus Controller, and Bus Snooper Maximize

Throughput

•4G bytes Direct Addressing Range

•Software Support Including Optimizing C Compiler and UNIX® System V Port

•IEEE P 1149-1 Test Mode (JTAG)

•f = 25 MHz, 33 MHz; VCC = 5V ± 5%; PD = 7W

•The Use of the TS88915T Clock Driver is Suggested

Description

The TS68040 is e2v’s third generation of 68000-compatible, high-performance, 32-bit microprocessors. The TS68040 is a

virtual memory microprocessor employing multiple, concurrent execution units and a highly integrated architecture to pro-

vide very high performance in a monolithic HCMOS device. On a single chip, the TS68040 integrates a 68030-compatible

integer unit, an IEEE 754-compatible floating-point unit (FPU), and fully independent instruction and data demand-paged

memory management units (MMUs), including 4K bytes independent instruction and data caches. A high degree of instruc-

tion execution parallelism is achieved through the use of multiple independent execution pipelines, multiple internal buses,

and a full internal Harvard architecture, including separate physical caches for both instruction and data accesses. The

TS68040 also directly supports cache coherency in multimaster applications with dedicated on-chip bus snooping logic.

The TS68040 is user-object-code compatible with previous members of the TS68000 Family and is specifically optimized

to reduce the execution time of compiler-generated code. The 68040 HCMOS technology, provides an ideal balance

between speed, power, and physical device size.

Figure 1-1 on page 2 is a simplified block diagram of the TS68040. Instruction execution is pipelined in both the integer unit

and FPU. Independent data and instruction MMUs control the main caches and the address translation caches (ATCs).

The ATCs speed up logical-to-physical address translations by storing recently used translations. The bus snooper circuit

ensures cache coherency in multimaster and multiprocessing applications.

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

Screening

•MIL-STD-883

• DESC. Drawing 5962-93143

• e2v Standards

1. Block Diagram

Figure 1-1. Simplified Block Diagram

2. Introduction

The TS68040 is an enhanced, 32-bit, HCMOS microprocessor that combines the integer unit processing

capabilities of the TS68030 microprocessor with independent 4K bytes data and instruction caches and

an on-chip FPU. The TS68040 maintains the 32-bit registers available with the entire TS68000 Family as

well as the 32-bit address and data paths, rich instruction set, and versatile addressing modes. Instruc-

tion execution proceeds in parallel with accesses to the internal caches, MMU operations, and bus

controller activity. Additionally, the integer unit is optimized for high-level language environments.

The TS68040 FPU is user-object-code compatible with the TS68882 floating-point coprocessor and con-

forms to the ANSI/IEEE Standard 754 for binary floating-point arithmetic. The FPU has been optimized

to execute the most commonly used subset of the TS68882 instruction set, and includes additional

instruction formats for single and double-precision rounding of results. Floating-point instructions in the

FPU execute concurrently with integer instructions in the integer unit.

INSTRUCTION

CACHE

DATA

CACHE

DATA MEMORY UNIT

INSTRUCTION MEMORY UNIT

INSTRUCTION

ATC

DATA

ATC

INSTRUCTION

FETCH

DECODE

EFFECTIVE

ADDRESS

CALCULATE

EXECUTE

EFFECTIVE

ADDRESS

FETCH

INSTRUCTION

MMU/CACHE/SNOOP

CONTROLLER

BUS

CONTROL

SIGNALS

DATA

BUS

ADDRESS

BUS

DATA

MMU/CACHE/SNOOP

CONTROLLER

OPERAND DATA BUS

INSTRUCTION DATA BUS

INSTRUCTION

ADDRESS

DATA

ADDRESS

WRITE

BACK

INTEGER

UNIT

CONVERT

EXECUTE

WRITE

BACK

FLOATING-

POINT

UNIT

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

The MMUs support multiprocessing, virtual memory systems by translating logical addresses to physical

addresses using translation tables stored in memory. The MMUs store recently used address mappings

in two separate ATCs-on-chip.

When an ATC contains the physical address for a bus cycle requested by the processor, a translation

table search is avoided and the physical address is supplied immediately, incurring no delay for address

translation. Each MMU has two transparent translation registers available that define a one-to-one map-

ping for address space segments ranging in size from 16M bytes to 4G bytes each.

Each MMU provides read-only and supervisor-only protections on a page basis. Also, processes can be

given isolated address spaces by assigning each a unique table structure and updating the root pointer

upon a task swap. Isolated address spaces protect the integrity of independent processes.

The instruction and data caches operate independently from the rest of the machine, storing information

for fast access by the execution units. Each cache resides on its own internal address bus and internal

data bus, allowing simultaneous access to both. The data cache provides write through or copyback

write modes that can be configured on a page-by-page basis.

The TS68040 bus controller supports a high-speed, non multiplexed, synchronous external bus inter-

face, which allows the following transfer sizes: byte, word (2 bytes), long word (4 bytes), and line

(16 bytes). Line accesses are performed using burst transfers for both reads and writes to provide high

data transfer rates.

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

3. Pin Assignments

3.1 PGA 179

Figure 3-1. Bottom View

Table 3-1. Power Supply Affectation to PGA Body

GND VCC

PLL S8

Internal Logic C6, C7, C9, C11,C13, K3, K16, L3, M16, R4, R11, R13,

S10, T4, S9, R6, R10

C5, C8, C10, C12, C14, H3, H16, J3, J16, L16, M3, R5,

R12, R8

Output Drivers B2, B4, B6, B8, B10, B13, B15, B17, D2, D17, F2, F17,

H2, H17, L2, L17, N2, N17, Q2, Q17, S2, S15, S17

B5, B9, B14, C2, C17, G2, G17, M2, M17, R2, R17,

S16

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

3.2 CQFP 196

Figure 3-2. Pin Assignments

Table 3-2. Power Supply Affectation to CQFP Body

GND VCC

PLL 127

Internal Logic 4, 9, 10, 19, 32, 45, 73, 88, 113, 119, 121, 122, 124,

125, 129, 130, 141, 159, 172

3, 18, 31, 40, 46, 60, 72, 87, 114, 126, 137, 158, 173,

186

Output Drivers

7, 15, 22, 28, 35, 42, 49, 50, 51, 57, 63, 69, 76, 77, 83,

84, 91, 97, 98, 99, 105, 106, 146, 147, 148, 149, 155,

162, 163, 169, 176, 182, 183, 189, 195, 196

12, 25, 38, 54, 66, 80, 94, 102, 152, 166, 179, 192

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

4. Signal Description

Figure 3-1 and Table 3-1 describe the signals on the TS68040 and indicate signal functions. The test

signals, TRST, TMS, TCK, TDI, and TDO, comply with subset P-1149.1 of the IEEE testability bus

standard.

Figure 4-1. Functional Signal Groups

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

Table 4-1. Signal Index

Signal Name Mnemonic Function

Address Bus A31-A0 32-bit address bus used to address any of 4G bytes

Data Bus D31-D0 32-bit data bus used to transfer up to 32 bits of data per bus transfer

Transfer Type TT1, TT0 Indicates the general transfer type: normal, MOVE 16, alternate logical function

code, and acknowledge

Transfer Modifier TM2, TM0 Indicates supplemental information about the access

Transfer Line Number TLN1, TLN0 Indicates which cache line in a set is being pushed or loaded by the current line

transfer

User Programmable Attributes UPA1, UPA0 User-defined signals, controlled by the corresponding user attribute bits from the

address translation entry

Read Write R/W Identifies the transfer as a read or write

Transfer Size SIZ1, SIZ0 Indicates the data transfer size. These signals, together with A0 and A1, define the

active sections of the data bus

Bus Lock LOCK Indicates a bus transfer is part of a read-modify-write operation, and that the

sequence of transfers should not be interrupted

Bus Lock End LOCKE Indicates the current transfer is the last in a locked sequence of transfer

Cache Inhibit Out CIOUT Indicates the processor will not cache the current bus transfer

Transfer Start TS Indicates the beginning of a bus transfer

Transfer in Progress TIP Asserted for the duration of a bus transfer

Transfer Acknowledge TA Asserted to acknowledge a bus transfer

Transfer Error Acknowledge TEA Indicates an error condition exists for a bus transfer

Transfer Cache Inhibit TCI Indicates the current bus transfer should not be cached

Transfer Burst Inhibit TBI Indicates the slave cannot handle a line burst access

Data Latch Enable DLE Alternate clock input used to latch input data when the processor is operating in

DLE mode

Snoop Control SC1, SC0 Indicates the snooping operation required during an alternate master access

Memory Inhibit MI Inhibits memory devices from responding to an alternate master access during

snooping operations

Bus Request BR Asserted by the processor to request bus mastership

Bus Grant BG Asserted by an arbiter to grant bus mastership to the processor

Bus Busy BB Asserted by the current bus master to indicate it has assumed ownership of the bus

Cache Disable CDIS Dynamically disables the internal caches to assist emulator support

MMU Disable MDIS Disables the translation mechanism of the MMUs

Reset In RSTI Processor reset

Reset Out RSTO Asserted during execution of the RESET instruction to reset external devices

Interrupt Priority Level IPL2-IPL0 Provides an encoded interrupt level to the processor

Interrupt Pending IPEND Indicates an interrupt is pending

Autovector AVEC Used during an interrupt acknowledge transfer to request internal generation of the

vector number

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

5. Scope

This drawing describes the specific requirements for the microprocessor TS68040 - 25 MHz and 33

MHz, in compliance with MIL-STD-883 class B or e2v standard screening.

6. Applicable Documents

6.1 MIL-STD-883

1. MIL-STD-883: test methods and procedures for electronics.

2. MIL-I-38535: general specifications for microcircuits.

3. DESC 5962-93143.

7. Requirements

7.1 General

The microcircuits are in accordance with the applicable document and as specified herein.

7.2 Design and Construction

7.2.1 Terminal Connections

See Figure 2-1 and Figure 2-2.

7.2.2 Lead Material and Finish

Lead material and finish shall be as specified in MIL-STD-883 (see enclosed “MIL-STD-883 C and Inter-

nal Standard” on page 46).

Processor Status PST3-PST0 Indicates internal processor status

Bus Clock BCLK Clock input used to derive all bus signal timing

Processor Clock PCLK Clock input used for internal logic timing. The PCLK frequency is exactly 2X the

BCLK frequency

Test Clock TCK Clock signal for the IEEE P1149.1 test access port (TAP)

Test Mode Select TMS Selects the principle operations of the test-support circuitry

Test Data Input TDI Serial data input for the TAP

Test Data Output TDO Serial data output for the TAP

Test Reset TRST Provides an asynchronous reset of the TAP controller

Power Supply VCC Power supply

Ground GND Ground connection

Table 4-1. Signal Index (Continued)

Signal Name Mnemonic Function

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

7.2.3 Package

The macro circuits are packaged in hermetically sealed ceramic packages which conform to case out-

lines of MIL-STD-1835-or as follow:

• CMGA 10-179-PAK pin grid array, but see “179 pins – PGA” on page 43.

• Similar to CQCC1-F196C-U6 ceramic uniform lead chip carrier package with ceramic nonconductive

tie-bar but use e2v’s internal drawing, see “196 pins – Tie Bar CQFP Cavity Up (on request)” on page

44.

• Gullwing shape CQFP see “196 pins – Gullwing CQFP cavity up” on page 45.

The precise case outlines are described at the end of the specification (See “Package Mechanical Data”

on page 43.) and into MIL-STD-1835.

7.3 Electrical Characteristics

7.3.1 Absolute Maximum Ratings

Stresses above the absolute maximum rating may cause permanent damage to the device. Extended

operation at the maximum levels may degrade performance and affect reliability.

Note: 1. This device is not tested at TC = +125°C. Testing is performed by setting the junction temperature Tj = +125°C and allowing

the case and ambient temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.

Table 7-1. Absolute Maximum Ratings

Symbol Parameter Condition Min Max Unit

VCC Supply Voltage Range -0.3 7.0 V

VIInput Voltage Range -0.3 7.0 V

PDPower Dissipation Large buffers enabled 7.7 W

Small buffers enabled 6.3 W

TCOperating Temperature -55 TJ°C

Tstg Storage Temperature Range -65 +150 °C

TJJunction Temperature(1) +125 °C

Tlead Lead Temperature Max.10 sec soldering +300 °C

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

Note: 1. This device is not tested at TC = +125°C. Testing is performed by setting the junction temperature TJ = +125°C and allowing

the case and ambient temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.

7.4 Thermal Considerations

7.4.1 General Thermal Considerations

This section is only given as user information.

As microprocessors are becoming more complex and requiring more power, the need to efficiently cool

the device becomes increasingly more important. In the past, the TS68000 Family, has been able to pro-

vide a 0-70°C ambient temperature part for speeds less than 40 MHz. However, the TS68040, which has

a 50 MHz arithmetic logic unit (ALU) speed, is specified with a maximum power dissipation for a particu-

lar mode, a maximum junction temperature, and a thermal resistance from the die junction to the case.

This provides a more accurate method of evaluating the environment, taking into consideration both the

air-flow and ambient temperature available. This also allows a user the information to design a cooling

method which meets both thermal performance requirements and constraints of the board environment.

This section discusses the device characteristics for thermal management, several methods of thermal

management, and an example of one method of cooling the TS68040.

7.4.2 Thermal Device Characteristics

The TS68040 presents some inherent characteristics which should be considered when evaluating a

method of cooling the device. The following paragraphs discuss these die/package and power

considerations.

7.4.3 Die and Package

The TS68040 is being placed in a cavity-down alumina-ceramic 179-pin PGA that has a specified ther-

mal resistance from junction to case of 1°C/W. This package differs from previous TS68000 Family PGA

packages which were cavity up. This cavity-down design allows the die to be attached to the top surface

of the package, which increases the ability of the part to dissipate heat through the package surface or

an attached heat sink. The maximum perimeter that the TS68040 allows for a heat sink on its surface

without interfering with the capacitor pads is 1.48" x 1.48". The specific dimensions and design of the

particular heat sink will need to be determined by the system designer considering both thermal perfor-

mance requirements and size requirements.

Table 7-2. Recommended Conditions of Use

Unless otherwise stated, all voltages are referenced to the reference terminal

Symbol Parameter Min Typ Max Unit

VCC Supply Voltage Range +4.75 +5.25 V

VIL Logic Low Level Input Voltage Range GND

- 0.3 0.8 V

VIH Logic High Level Input Voltage Range +2.0 VCC + 0.3 V

VOH High Level Output Voltage 2.4 V

VOL Low Level Output Voltage 0.5 V

fcClock Frequency -25 MHz Version 25 MHz

-33 MHz Version 33 MHz

TCCase Operating Temperature Range(1) -55 TJmax °C

TJMaximum Operating Junction Temperature +125 °C

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

7.4.4 Power Considerations

The TS68040 has a maximum power rating, which varies depending on the operating frequency and the

output buffer mode combination being used. The large buffer output mode dissipates more power than

the small, and the higher frequencies of operation dissipate more power than the lower frequencies. The

following paragraphs discuss trade-offs in using the different output buffer modes, calculation of specific

maximum power dissipation for different modes, and the relationship of thermal resistances and

temperatures.

7.4.5 Output Buffer Mode

The 68040 is capable of resetting to enable for a combination of either large buffers or small buffers on

the outputs of the miscellaneous control signals, data bus, and address bus/transfer attribute pins. The

large buffers offer quicker output times, which allow for an easier logic design. However, they do so by

driving about 11 times as much current as the small buffers (refer to TS68040 Electrical specifications for

current output). The designer should consider whether the quicker timings present enough advantage to

justify the additional consideration to the individual signal terminations, the die power consumption, and

the required cooling for the device. Since the TS68040 can be powered-up in one of eight output buffer

modes upon reset, the actual maximum power consumption for TS68040 rated at a particular maximum

operating frequency is dependent upon the power up mode.

Therefore, the TS68040 is rated at a maximum power dissipation for either the large buffers or small

buffers at a particular frequency (refer to TS68040 Electrical specifications). This allows the possibility of

some of the thermal management to be controlled upon reset. The following equation provides a rough

method to calculate the maximum power consumption for a chosen output buffer mode:

PD = PDSB + (PDLB - PDSB) · (PINSLB/PINSCLB) (1)

where:

PD = Max. power dissipation for output buffer mode

selected

PDSB = Max. power dissipation for small buffer mode

(all outputs)

PDLB = Max. power dissipation for large buffer mode

(all outputs)

PINSLB = Number of pins large buffer mode

PINSCLB = Number of pins capable of the large buffer

mode

Table 6-3 shows the simplified relationship on the maximum power dissipation for eight possible configu-

rations of output buffer modes.

Table 7-3. Maximum Power Dissipation for Output Buffer Mode Configurations

Output Configuration Maximum Power Dissipation

Data Bus

Address Bus and

Transfer Attrib. Misc. Control Signals PD

Small Buffer Small Buffer Small Buffer PDSB

Small Buffer Small Buffer Large Buffer PDSB + (PDLB - PDSB) · 13%

Small Buffer Large Buffer Small Buffer PDSB + (PDLB - PDSB) · 52%

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

To calculate the specific power dissipation of a specific design, the termination method of each signal

must be considered. For example, a signal output that is not connected would not dissipate any addi-

tional power if it were configured in the large buffer rather than the small buffer mode.

7.4.6 Relationships Between Thermal Resistances and Temperatures

Since the maximum operating junction temperature has been specified to be 125°C. The maximum case

temperature, TC, in °C can be obtained from:

TC = TJ - PD · ΦJC (2)

where:

TC= Maximum case temperature

TJ= Maximum junction temperature

PD= Maximum power dissipation of the device

ΦJC = Thermal resistance between the junction of the die and the case

In general, the ambient temperature, TA, in °C is a function of the following formula:

TA = TJ - PD · ΦJC - PD · ΦCA (3)

Where the thermal resistance from case to ambient, ΦCA, is the only user-dependent parameter once a

buffer output configuration has been determined. As seen from equation (3), reducing the case to ambi-

ent thermal resistance increases the maximum operating ambient temperature. Therefore, by utilizing

such methods as heat sinks and ambient air cooling to minimize the ΦCA, a higher ambient operating

temperature and/or a lower junction temperature can be achieved.

However, an easier approach to thermal evaluation uses the following formulas:

TA = TJ - PD · ΦJA (4)

or alternatively,

TJ = TA - PD · ΦJA (5)

where:

ΦJA = thermal resistance from the junction to the ambient (ΦJC + ΦCA).

This total thermal resistance of a package, ΦJA, is a combination of its two components, ΦJC and ΦCA.

These components represent the barrier to heat flow from the semiconductor junction to the package

(case) surface (ΦJC) and from the case to the outside ambient (ΦJC). Although ΦJC is device related and

cannot be influenced by the user, ΦCA is user dependent. Thus, good thermal management by the user

can significantly reduce ΦCA achieving either a lower semiconductor junction temperature or a higher

ambient operating temperature.

Small Buffer Large Buffer Large Buffer PDSB + (PDLB - PDSB) · 65%

Large Buffer Small Buffer Small Buffer PDSB + (PDLB - PDSB) · 35%

Large Buffer Small Buffer Large Buffer PDSB + (PDLB - PDSB) · 48%

Large Buffer Large Buffer Small Buffer PDSB + (PDLB - PDSB) · 87%

Large Buffer Large Buffer Large Buffer PDSB + (PDLB - PDSB) · 100%

Table 7-3. Maximum Power Dissipation for Output Buffer Mode Configurations (Continued)

Output Configuration Maximum Power Dissipation

Data Bus

Address Bus and

Transfer Attrib. Misc. Control Signals PD

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

7.4.7 Thermal Management Techniques

To attain a reasonable maximum ambient operating temperature, a user must reduce the barrier to heat

flow from the semiconductor junction to the outside ambient (ΦJA). The only way to accomplish this is to

significantly reduce ΦCA by applying such thermal management techniques as heat sinks and ambient

air cooling.

The following paragraphs discuss some results of a thermal study of the TS68040 device without using

any thermal management techniques; using only air-flow cooling, using only a heat sink, and using heat

sink combined with air-flow cooling.

7.4.8 Thermal Characteristics in Still Air

A sample size of three TS68040 packages was tested in free-air cooling with no heat sink. Measure-

ments showed that the average ΦJA was 22.8°C/W with a standard deviation of 0.44°C/W. The test was

performed with 3W of power being dissipated from within the package. The test determined that ΦJA will

decrease slightly for the increasing power dissipation range possible. Therefore, since the variance in

ΦJA within the possible power dissipation range is negligible, it can be assumed for calculation purposes

that ΦJA is valid at all power levels. Using the formulas introduced previously, Table 6-4 shows the

results of a maximum power dissipation of 3 and 5W with no heat sink or air-flow (refer to Table 6-3 to

calculate other power dissipation values).

As seen by looking at the ambient temperature results, most users will want to implement some type of

thermal management to obtain a more reasonable maximum ambient temperature.

7.4.9 Thermal Characteristics in Forced Air

A sample size of three TS68040 packages was tested in forced air cooling in a wind tunnel with no heat

sink. This test was performed with 3W of power being dissipated from within the package. As previously

mentioned, since the variance in ΦJA within the possible power range is negligible, it can be assumed

for calculation purposes that ΦJA is constant at all power levels. Using the previous formulas, Table 6-5

shows the results of the maximum power dissipation at 3 and 5W with air-flow and no heat sink (refer to

Table 6-3 to calculate other power dissipation values).

Table 7-4. Thermal Parameters With No Heat Sink or Air-flow

Defined Parameters Measured Calculated

PDTJΦJC ΦJA ΦCA = ΦJA - ΦJC TC = TJ - PD * ΦJC TA = TJ - PD * ΦJA

3 Watts 125°C 1°C/W 21.8°C/W 20.8°C/W 122°C 59.6°C

5 Watts 125°C 1°C/W 21.8°C/W 20.8°C/W 120°C 16°C

Table 7-5. Thermal Parameters With Forced Air Flow and No Heat Sink

Thermal Mgmt.

Technique Defined Parameters Measured Calculated

Air-flow velocity PDTJΦJC ΦJA ΦCA TCTA

100 LFM 3W 125°C 1°C/W 11.7°C/W 10.7°C/W 122°C 89.9°C

250 LFM 3W 125°C 1°C/W 10°C/W 9°C/W 122°C 95°C

500 LFM 3W 125°C 1°C/W 8.9°C/W 7.9°C/W 122°C 98.3°C

750 LFM 3W 125°C 1°C/W 8.5°C/W 7.5°C/W 122°C 99.5°C

1000 LFM 3W 125°C 1°C/W 8.3°C/W 7.3°C/W 122°C 100.1°C

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

By reviewing the maximum ambient operating temperatures, it can be seen that by using the all-small-

buffer configuration of the TS68040 with a relatively small amount of air flow (100 LFM), a 0-70°C ambi-

ent operating temperature can be achieved. However, depending on the output buffer configuration and

available forced-air cooling, additional thermal management techniques may be required.

7.4.10 Thermal Characteristics with a Heat Sink

In choosing a heat sink the designer must consider many factors: heat sink size and composition,

method of attachment, and choice of a wet or dry connection. The following paragraphs discuss the rela-

tionship of these decisions to the thermal performance of the design noticed during experimentation.

The heat sink size is one of the most significant parameters to consider in the selection of a heat sink.

Obviously a larger heat sink will provide better cooling. However, it is less obvious that the most benefit

of the larger heat sink of the pin fin type used in the experimentation would be at still air conditions.

Under forced-air conditions as low as 100 LFM, the difference between the ΦCA becomes very small

(0.4°C/W or less). This difference continues to decrease as the forced air flow increases. The particular

heat sink used in our testing fit the perimeter package surface area available within the capacitor pads

on the TS68040 (1.48" x 1.48") and showed a nice compromise between height and thermal perfor-

mance needs. The heat sink base perimeter area was 1.24" x 1.30" and its height was 0.49". It was a

pin-fin-type (i.e. bed of nails) design composed of Al alloy. The heat sink is shown in Figure 6-1 can be

obtained through Thermalloy Inc. by referencing part number 2338B.

100 LFM 5W 125°C 1°C/W 11.7°C/W 10.7°C/W 120°C 66.5°C

250 LFM 5W 125°C 1°C/W 10°C/W 9°C/W, 120°C 75°C

500 LFM 5W 125°C 1°C/W 8.9°C/W 7.9°C/W 120°C 80.5°C

750 LFM 5W 125°C 1°C/W 8.5°C/W 7.5°C/W 120°C 82.5°C

1000 LFM 5W 125°C 1°C/W 8.3°C/W 7.3°C/W 120°C 83.5°C

Table 7-5. Thermal Parameters With Forced Air Flow and No Heat Sink (Continued)

Thermal Mgmt.

Technique Defined Parameters Measured Calculated

Air-flow velocity PDTJΦJC ΦJA ΦCA TCTA

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

Figure 7-1. Heat Sink Example

All pin fin heat sinks tested were made from extrusion Al products. The planar face of the heat sink mat-

ing to the package should have a good degree of planarity; if it has any curvature, the curvature should

be convex at the central region of the heat sink surface to provide intimate physical contact to the PGA

surface. All heat sinks tested met this criteria. Nonplanar, concave curvature the central regions of the

heat sink will result in poor thermal contact to the package. A specification needs to be determined for

the planarity of the surface as part of any heat sink design.

Although there are several ways to attach a heat sink to the package, it was easiest to use a demount-

able heat sink attach called “E-Z attach for PGA packages” developed by Thermalloy (see Figure 6-2).

The heat sink is clamped to the package with the help of a steel spring to a plastic frame (or plastic

shoes Besides the height of the heat sink and plastic frame, no additional height added to the package.

The interface between the ceramic package and the heat sink was evaluated for both dry and wet (i.e.,

thermal grease) interfaces in still air. The thermal grease reduced the ΦCA quite significantly (about 2.5

°C/W) in still air. Therefore, it was used in all other testing done with the heat sink. According to other

testing, attachment with thermal grease provided about the same thermal performance as if a thermal

epoxy were used.

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

Figure 7-2. Heat Sink with Attachment

A sample size of one TS68040 package was tested in still air with the heat sink and attachment method

previously described. This test was performed with 3W of power being dissipated from within the pack-

age. Since the variance in ΦJA within the possible power range is negligible, it can be assumed for

calculation purposes that ΦJA is constant at all power levels. Table 6-6 shows the result assuming a max-

imum power dissipation of the part at 3 and 5W (refer to Table 6-3 to calculate other power dissipation

values).

7.4.11 Thermal Characteristics with a Heat Sink and Forced Air

A sample size of three TS68040 packages was tested in forced-air cooling in a wind tunnel with a heat

sink. This test was performed with 3W of power being dissipated from within the package. As mentioned

previously, the variance in ΦJA within the possible power range is negligible; it can be assumed for calcu-

lation purposes that ΦJA is valid at all power levels. Table 6-7 shows the results, assuming a maximum

power dissipation at 3 and 5W with air flow and heat sink thermal management (refer to Table 6-3 to cal-

culate other power dissipation values).

Table 7-6. Thermal Parameters With Heat Sink and No Air Flow

Thermal Mgmt.

Technique Defined Parameters Measured Calculated

Heat Sink PDTJΦJC ΦJA ΦCA TCTA

2338B 3W 125°C 1°C/W 14°C/W 13°C/W 122°C 83°C

2338B 5W 125°C 1°C/W 14°C/W 13°C/W 120°C 55°C

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

7.4.12 Thermal Testing Summary

Testing proved that a heat sink in combination with a relatively small amount of air-flow (100 LFM or

less) will easily realize a 0-70°C ambient operating temperature for the TS68040 with almost any config-

uration of the output buffers. A heat sink alone may be capable of providing all necessary cooling,

depending on the particular heat sink height/size restraints, the maximum ambient operating tempera-

ture required, and the output buffer configuration chosen. Also forced air cooling alone may attain a 0-

70°C ambient operating temperature. However this factor is highly dependent on the output buffer con-

figuration chosen and the available forced air for cooling. Figure 6-3 is a summary of the test results of

the relationship between ΦJA and air-flow for the TS68040.

Figure 7-3. Relationship of ΦJA Air-Flow for PGA

Table 7-7. Thermal Parameters with Heat Sink and Air Flow

Thermal Mgmt. Technique Defined Parameters Measured Calculated

Air-flow Heat sink PDTJΦJC ΦJA ΦCA TCTA

100 LFM 2338B 3W 125°C 1°C/W 3.1°C/W 2.1°C/W 122°C 115.7°C

250 LFM 2338B 3W 125°C 1°C/W 2.2°C/W 1.2°C/W 122°C 118.4°C

500 LFM 2338B 3W 125°C 1°C/W 1.7°C/W 0.7°C/W 122°C 119.9°C

750 LFM 2338B 3W 125°C 1°C/W 1.5°C/W 0.5°C/W 122°C 120.5°C

1000 LFM 2338B 3W 125°C 1°C/W 1.4°C/W 0.4°C/W 122°C 120.8°C

100 LFM 2338B 5W 125°C 1°C/W 3.1°C/W 2.1°C/W 120°C 109.5°C

250 LFM 2338B 5W 125°C 1°C/W 2.2°C/W 1.2°C/W 120°C 114°C

500 LFM 2338B 5W 125°C 1°C/W 1.7°C/W 0.7°C/W 120°C 116.5°C

750 LFM 2338B 5W 125°C 1°C/W 1.5°C/W 0.5°C/W 120°C 117.5°C

1000 LFM 2338B 5W 125°C 1°C/W 1.4°C/W 0.4°C/W 120°C 118°C

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

7.5 Mechanical and Environment

The microcircuits shall meet all mechanical environmental requirements of either MIL-STD-883 for class

B devices or for e2v standard screening.

7.6 Marking

The document where are defined the marking are identified in the related reference documents. Each

microcircuit are legible and permanently marked with the following information as minimum:

• e2v Logo

• Manufacturer’s Part Number

• Class B Identification

• Date-code Of Inspection Lot

• ESD Identifier If Available

• Country Of Manufacturing

8. Quality Conformance Inspection

8.1 DESC/MIL-STD-883

Is in accordance with MIL-M-38535 and method 5005 of MIL-STD-883. Group A and B inspections are

performed on each production lot. Groups C and D inspection are performed on a periodical basis.

9. Electrical Characteristics

9.1 General Requirements

All static and dynamic electrical characteristics specified for inspection purposes and the relevant mea-

surement conditions are given below:

•Table 8-1: Static electrical characteristics for the electrical variants.

•Table 8-2: Dynamic electrical characteristics for TS68040 (25 MHz, 33 MHz).

For static characteristics (Table 8-1), test methods refer to IEC 748-2 method number, where existing.

For dynamic characteristics (Table 8-2), test methods refer to clause “Static Characteristics” on page 19

of this specification.

Indication of “min.” or “max.” in the column «test temperature» means minimum or maximum operating

temperature as defined in sub-clause Table 6-2 here above.

Table 7-8. Characteristics Guaranteed

Package Symbol Parameter Value Unit

PGA 179 θJ-A Thermal Resistance Junction-to-ambient See Figure 6-3 °C/W

θJ-C Thermal Resistance Junction-to-case 1 °C/W

CQFP 196 θJ-A Thermal Resistance Junction-to-ambient TBD °C/W

θJ-C Thermal Resistance Junction-to-case 1 °C/W

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

9.2 Static Characteristics

Notes: 1. All testing to be performed using worst-case test conditions unless otherwise specified.

2. Maximum operating junction temperature (TJ) = +125°. Minimum case operating temperature (TC) = -55°. This device is not

tested at TC = +125°. Testing is performed by setting the junction temperature TJ = +125°and allowing the case and ambient

temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.

3. Capacitance is periodically sampled rather than 100% tested.

4. Power dissipation may vary in between limits depending on the application.

Table 9-1. Electrical Characteristics

-55°C ≤ TC ≤ TJmax; 4.75V ≤ VCC ≤ 5.25V unless otherwise specified(1)(2)(3)(4)

Symbol Characteristic Min Max Unit

VIH Input High Voltage 2 VCC V

VIL Input Low Voltage GND 0.8 V

VUUndershoot - 0.8 V

Iin

Input Leakage Current

at 0.5/2.4V

AVEC, BCLK BG, CDIS,

IPLn, MDIS, PCLK, RSTI, SCn,

TBI, TCI, TCK, TEA

-20 20 µA

ITSI

Hi-z (Off-state) Leakage Current

at 0.5/2.4V

An, BB, CIOUT, Dn, LOCK,

LOCKE, R/W, SIZn, TA, TDO,

TIP

, TLNn, TMn, TS, TTn, UPAn

-20 20 µA

IIL Signal Low Input Current

VIL = 0.8V

TMS, TDI, TRST -1.1 -0.18 mA

IIH Signal High Input Current

VIH = 2.0V

TMS, TDI, TRST -0.94 -0.16 mA

VOH

Output High Voltage

Larger Buffers - IOH = 35 mA

Small Buffers - IOH = 5 mA

2.4 V

VOL

Output Low Voltage

Larger buffers - IOL = 35 mA

Small buffers - IOL = 5 mA

0.5 V

Power Dissipation (TJ = 125°C)

Larger Buffers Enabled

Small Buffers Enabled

7.7

6.3 W

Cin Capacitance - Note 4

Vin = 0V, f = 1 MHz 25 pF

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

9.3 Dynamic Characteristics

Notes: 1. All testing to be performed using worst-case test conditions unless otherwise specified.

2. Maximum operating junction temperature (TJ) = +125°. Minimum case operating temperature (TC) = -55°. This device is not

tested at TC = +125°. Testing is performed by setting the junction temperature TJ = +125°and allowing the case and ambient

temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.

3. Specification value at maximum frequency of operation.

4. If not tested, shall be guaranteed to the limits specified.

Figure 9-1. Clock Input Timing

Table 9-2. Clock AC Timing Specifications (see Figure 8-1)

-55°C ≤ TC ≤ TJmax; 4.75V ≤ VCC ≤ 5.25V unless otherwise specified(1)(2)(3)(4)

Num Characteristic

25 MHz 33 MHz

UnitMinMaxMinMax

Frequency of Operation 20 25 20 33 MHz

1 PCLK Cycle Time 20 25 15 25 ns

2 PCLK Rise Time(4) 1.7 1.7 ns

3 PCLK Fall Time(4) 1.6 1.6 ns

4 PCLK Duty Cycle Measured at 1.5V(4) 47.5 52.5 46.67 53.33 %

4a PCLK Pulse Width High Measured at 1.5V(3)(4) 9.5 10.5 7 8 ns

4b PCLK Pulse Width Low Measured at 1.5V(3)(4) 9.5 10.5 7 8 ns

5 BCLK Cycle Time 40 50 30 60 ns

6, 7 BCLK Rise and Fall Time 4 3 ns

8 BCLK Duty Cycle Measured at 1.5V(4) 40 60 40 60 %

8a BCLK Pulse Width High Measured at 1.5V(4) 16 24 12 18 ns

8b BCLK Pulse Width Low Measured at 1.5V(4) 16 24 12 18 ns

9 PCLK, BCLK Frequency Stability(4) 1000 1000 ppm

10 PCLK to BCLK Skew 9 n/a ns

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

Notes: 1. Output timing is specified for a valid signal measured at the pin. Large buffer timing is specified driving a 50Ω transmission

line with a length characterized by a 2.5 ns one-way propagation delay, terminated through 50Ω to 2.5V. Large buffer output

impedance is typically 3Ω, resulting in incident wave switching for this environment. Small buffer timing is specified driving an

unterminated 30Ω transmission line with a length characterized by a 2.5 ns one-way propagation delay. Small buffer output

impedance is typically 30Ω; the small buffer specifications include approximately 5 ns for the signal to propagate the length

of the transmission line and back.

2. All testing to be performed using worst-case test conditions unless otherwise specified.

3. The following pins are active low: AVEC, BG, BS, BR, CDIS, CIOUT, IPEND, IPLO, IPL1, IPL2, LOCK, LOCKE, MDIS, MI,

RST0, RSTI, TA, TBI, TCI, TEA, TIP, TRST, TS and W of R/W.

4. Maximum operating junction temperature (TJ) = +125°. Minimum case operating temperature (TC) = -55°. This device is not

tested at TC = +125°. Testing is performed by setting the junction temperature TJ = +125°and allowing the case and ambient

temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.

Table 9-3. Output AC Timing Specifications(1) (Figure 8-2 to Figure 8-8)

These output specifications are only for 25 MHz. They must be scaled for lower operating frequencies. Refer to

TS6804DH/AD for further information. -55°C ≤ TC ≤ TJmax; 4.75V ≤ VCC ≤ 5.25V unless otherwise specified.(2)(3)(4)

Num Characteristic

25 MHz 33 MHz

Unit

Large Buffer(1) Small Buffer(1) Large Buffer(1) Small Buffer(1)

Min Max Min Max Min Max Min Max

BCLK to address CIOUT, LOCK,

LOCKE, R/W, SIZn, TLN, TMn, UPAn

valid(5) 9 21 9 306.50186.5025ns

12 BCLK to output invalid (output hold) 9 9 6.50 6.50 ns

13 BCLK to TS valid 9 21 9 306.50186.5025ns

14 BCLK to TIP valid 9 21 9 306.50186.5025ns

18 BCLK to data-out valid(6) 9 23 9 326.50206.5027ns

19 BCLK to data-out invalid (output hold)(6) 9 9 6.50 6.50 ns

20 BCLK to output low impedance(5)(6) 9 9 6.50 6.50 ns

21 BCLK to data-out high impedance 9 20 9 20 6.50 17 6.50 17 ns

26 BCLK to multiplexed address valid(5) 19 31 19 40 14 26 14 33 ns

27 BCLK to multiplexed address driven(5) 19 19 14 14 ns

28 BCLK to multiplexed address high

impedance(5)(6) 9 18 9 186.50156.5015ns

29 BCLK to multiplexed data driven(6) 19 19 14 20 14 20 ns

30 BCLK to multiplexed data valid(6) 19 33 19 42 14 28 14 35 ns

BCLK to address CIOUT, LOCK, LOCKE,

R/W, SIZn, TS, TLNn, TMn, TTn, UPAn

high impedance(5) 9 18 9 186.50156.5015ns

39 BCLK to BB, TA, TIP high impedance 1928192814231423ns

40 BCLK to BR, BB valid 9 21 9 306.50186.5025ns

43 BCLK to MI valid 9 21 9 306.50186.5025ns

48 BCLK to TA valid 9 21 9 306.50186.5025ns

50 BCLK to IPEND, PSTn, RSTO valid 9 21 9 306.50186.5025ns

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

5. Timing specifications 11, 20 and 38 for address bus output timing apply when normal bus operation is selected. Specifica-

tions 26, 27 and 28 should be used when the multiplexed bus mode of operation is enabled.

6. Timing specifications 18 and 19 for data bus output timing apply when normal bus operation is selected. Specifications 28

and 29 should be used when the multiplexed bus mode of operation is enabled.

Table 9-4. Input AC Timing Specifications (Figure 8-2 to Figure 8-8)

-55°C ≤ TC ≤ TJmax; 4.75V ≤ VCC ≤ 5.25V unless otherwise specified(1)(2)(3)(4)

Num Characteristic

25 MHz 33 MHz

UnitMin. Max. Min. Max.

15 Data-in Valid to BCLK (Setup) 5 4 ns

16 BCLK to Data-in Invalid (Hold) 4 4 ns

17 BCLK to Data-in High Impedance (Read Followed By Write) 49 36.5 ns

22a TA Valid to BCLK (Setup) 10 10 ns

22b TEA Valid to BCLK (Setup) 10 10 ns

22c TCI Valid to BCLK (Setup) 10 10 ns

22d TBI Valid to BCLK (Setup) 11 10 ns

23 BCLK to TA, TEA, TCI, TBI Invalid (Hold) 2 2 ns

24 AVEC Valid to BCLK (Setup) 5 5 ns

25 BCLK to AVEC Invalid (Hold) 2 2 ns

31 DLE Width High 8 8 ns

32 Data-in Valid to DLE (Setup) 2 2 ns

33 DLE to Data-in Invalid (Hold) 8 8 ns

34 BCLK to DLE Hold 3 3 ns

35 DLE High to BCLK 16 12 ns

36 Data-in Valid to BCLK (DLE Mode Setup) 5 5 ns

37 BCLK Data-in Invalid (DLE Mode Hold) 4 4 ns

41a BB Valid to BCLK (Setup) 7 7 ns

41b BG Valid to BCLK (Setup) 8 7 ns

41c CDIS, MDIS Valid to BCLK (Setup) 10 8 ns

41d IPLn Valid to BCLK (Setup) 4 3 ns

42 BCLK to BB, BG, CDIS, IPLn, MDIS Invalid (Hold) 2 2 ns

44a Address Valid to BCLK (Setup) 8 7 ns

44b SIZn Valid BCLK (Setup) 12 8 ns

44c TTn Valid to BCLK (Setup) 6 8.5 ns

44d R/W Valid to BCLK (Setup) 6 5 ns

44e SCn Valid to BCLK (Setup) 10 11 ns

45 BCLK to Address SIZn, TTn, R/W, SCn Invalid (Hold) 2 2 ns

46 TS Valid to BCLK (Setup) 5 9 ns

47 BCLK to TS Invalid (Hold) 2 2 ns

49 BCLK to BB High Impedance (68040 Assumes Bus Mastership) 9 9 ns

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

Notes: 1. All testing to be performed using worst-case test conditions unless otherwise specified.

2. The following pins are active low: AVEC, BG, BS, BR, CDIS, CIOUT, IPEND, IPLO, IPL1, IPL2, LOCK, LOCKE, MDIS, MI,

RST0, RSTI, TA, TBI, TCI, TEA, TIP, TRST, TS and W of R/W.

3. Maximum operating junction temperature (TJ) = +125°. Minimum case operating temperature (TC) = -55°. This device is not

tested at TC = +125°. Testing is performed by setting the junction temperature TJ = +125°and allowing the case and ambient

temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.

4. The levels on CDIS, MDIS, and the IPL2-IPL0 signals enable or disable the multiplexed bus mode, data latch enable mode,

and driver impedance selection respectively.

Figure 9-2. Read/Write Timing

Note: Transfer attribute signals UPAN, SIZN, TTN, TMN, TLNN, R/W, LOCK, LOCKE, CIOUT

51 RSTI Valid to BCLK 5 4 ns

52 BCLK to RSTI Invalid 2 2 ns

53 Mode Select Setup to RSTI Negated(4) 20 20 ns

54 RSTI Negated to Mode Selects Invalid(4) 22ns

Table 9-4. Input AC Timing Specifications (Figure 8-2 to Figure 8-8) (Continued)

-55°C ≤ TC ≤ TJmax; 4.75V ≤ VCC ≤ 5.25V unless otherwise specified(1)(2)(3)(4)

Num Characteristic

25 MHz 33 MHz

UnitMin. Max. Min. Max.

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

Notes: 1. All testing to be performed using worst-case test conditions unless otherwise specified.

2. Maximum operating junction temperature (TJ) = +125°. Minimum case operating temperature (TC) = -55°. This device is not

tested at TC = +125°. Testing is performed by setting the junction temperature TJ = +125° and allowing the case and ambient

temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.

Table 9-5. JTAG Timing Application (Figure 8-9 to Figure 8-12)

-55°C ≤ TC ≤ TJmax; 4.75V ≤ VCC ≤ 5.25V unless otherwise specified(1)(2)

Num Characteristic Min Max Unit

TCK Frequency 010MHz

1 TCK Cycle Time 100 ns

2 TCK Clock Pulse Width Measured at 1.5V 40 ns

3 TCK Rise and Fall Times 0 10 ns

4TRST

Setup Time to TCK Falling Edge 40 ns

5TRST

Assert Time 100 ns

6 Boundary Scan Input Data Setup Time 50 ns

7 Boundary Scan Input Data Hold Time 50 ns

8 TCK to Output Data Valid 0 50 ns

9 TCK to Output High Impedance 0 50 ns

10 TMS, TDI Data Setup Time 20 ns

11 TMS, TDI Data Hold Time 5 ns

12 TCK to TDO Data Valid 0 20 ns

13 TCK to TDO High Impedance 0 20 ns

Table 9-6. Boundary Scan Instruction Codes

Bit 2 Bit 1 Bit 0 Instruction Selected Test Data Register Accessed

0 0 0 Extest Boundary Scan

0 0 1 Highz Bypass

0 1 0 Sample/Preload Boundary Scan

0 1 1 DRVCTLT Boundary Scan

1 0 0 Shutdown Bypass

1 0 1 Private Bypass

1 1 0 DRVCTLS Boundary Scan

1 1 1 Bypass Bypass

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

9.4 Switching Test Circuit and Waveforms

Figure 9-3. Address and Data Bus Timing — Multiplexed Bus Mode

Figure 9-4. DLE Timing Burst Access

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

Figure 9-5. Bus Arbitration Timing

Figure 9-6. Snoop Hit Timing

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

Figure 9-7. Snoop Miss Timing

Figure 9-8. Other Signal Timing

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

Figure 9-9. Clock Input Timing Diagram

Figure 9-10. TRST Timing Diagram

Figure 9-11. Boundary Scan Timing Diagram

Figure 9-12. Test Access Port Timing Diagram

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

10. Functional Description

10.1 Programming Model

The TS68040 integrates the functions of the integer unit, MMU, and FPU. As shown in Figure 9-1, the

registers depicted in the programming model provide access and control for the three units. The regis-

ters are partitioned into two levels of privilege: user and supervisor. User programs, executing in the user

mode, can only use the resources of the user model. System software, executing in the supervisor

mode, has unrestricted access to all processor resources.

The integer portion of the user programming model, consisting of 16, general-purpose, 32-bit registers

and two control registers, is the same as the user programming model of the TS68030. The TS68040

user programming model also incorporates the TS68882 programming model consisting of eight, float-

ing-point, 80-bit data registers, a floating-point control register, a floating-point status register, and a

floating-point instruction address register.

The supervisor programming model is used exclusively by TS68040 system programmers to implement

operating system functions, I/O control, and memory management subsystems. This supervisor/user

distinction in the TS68000 architecture was carefully planned so that all application software can be writ-

ten to execute in the nonprivileged user mode and migrate to the TS68040 from any TS68000 platform

without modification. Since system software is usually modified by system designers when porting to a

new design, the control features are properly placed in the supervisor programming model. For example,

the transparent translation registers of the TS68040 can only be read or written by the supervisor soft-

ware; the programming resources of user application programs are unaffected by the existence of the

transparent translation registers

Registers D0-D7 are data registers containing operands for bit and bit field (1- to 32-bit), byte (8-bit),

word (16-bit), long-word (32-bit), and quad-word (64-bit) operations. Registers A0-A6 and the stack

pointer registers (user, interrupt, and master) are address registers that may be used as software stack

pointers or base address registers. Register A7 is the user stack pointer in user mode, and is either the

interrupt or master stack pointer (A7’ or A7’’) in supervisor mode. In supervisor mode, the active stack

pointer (interrupt or master) is selected based on a bit in the status register (SR). The address registers

may be used for word and long-word operations, and all of the 16 general-purpose registers (D0-D7, A0-

A7 in Figure 9-1) may be used as index registers.

The eight, 80-bit, floating-point data registers (FP0-FP7) are analogous to the integer data registers (D0-

D7) of all TS68000 Family processors. Floating-point data registers always contain extended-precision

numbers. All external operands, regardless of the data format, are converted to extended-precision val-

ues before being used in any floating-point calculation or stored in a floating-point data register.

The program counter (PC) usually contains the address of the instruction being executed by the

TS68040. During instruction execution and exception processing, the processor automatically incre-

ments the contents of the PC or places a new value in the PC, as appropriate. The status register (SR in

the supervisor programming model) contains the condition codes that reflect the results of a previous

operation and can be used for conditional instruction execution in a program. The lower byte of the SR is

accessible in user mode as the condition code register (CCR). Access to the upper byte of the SR is

restricted to the supervisor mode.

As part of exception processing, the vector number of the exception provides an index into the exception

vector table. The base address of the exception vector table is stored in the vector base register (VBR).

The displacement of an exception vector is added to the value in the VBR when the TS68040 accesses

the vector table during exception processing.

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

Alternate function code registers, SFC and DFC (source and destination), contain 3-bit function codes.

Function codes can be considered extensions of the 32-bit linear address. Function codes are automati-

cally generated by the processor to select address spaces for data and program accesses at the user

and supervisor modes. The alternate function code registers are used by certain instructions to explicitly

specify the function codes for various operations. The cache control register (CACR) controls enabling of

the on-chip instruction and data caches of the TS68040.

The supervisor root pointer (SRP) and user root pointer (URP) registers point to the root of the address

translation table tree to be used for supervisor mode and user mode accesses. The URP is used if FC2

of the logical address is zero, and the SRP is used if FC2 is one.

The translation control register (TC) enables logical-to-physical address translation and selects either 4K

or 8K page sizes. As shown in Figure 9-1, there are four transparent translation registers - ITT0 and ITT1

for instruction accesses and DTT0 and DTT1 for data accesses. These registers allow portions of the

logical address space to be transparently mapped and accessed without the use of resident descriptors

in an ATC. The MMU status register (MMUSR) contains status information from the execution of a

PTEST instruction. The PTEST instruction searches the translation tables for the logical address as

specified by this instruction’s effective address field and the DFC.

The 32-bit floating-point control register (FPCR) contains an exception enable byte that enables disables

traps for each class of floating-point exceptions and a mode byte that sets the user-selectable modes.

The FPCR can be read or written to by the user and is cleared by a hardware reset or a restore operation

of the null state. When cleared, the FPCR provides the IEEE 754 standard defaults. The floating-point

status register (FPSR) contains a condition code byte, quotient bits, an exception status byte, and an

accrued exception byte. All bits in the FPSR can be read or written by the user. Execution of most float-

ing-point instructions modifies this register.

For the subset of the FPU instructions that generate exception traps, the 32-bit floating-point instruction

address register (FPIAR) is loaded with the logical address of an instruction before the instruction is exe-

cuted. This address can then be used by a floating-point exception handler to locate a floating-point

instruction that has caused an exception. The move floating-point data register (FMOVE) instruction (to

from the FPCR, FPSR, or FPIAR) and the move multiple data registers (FMOVEN) instruction cannot

generate floating-point exceptions; therefore, these instructions do not modify the FPIAR. Thus, the

FMOVE and FMOVEM instructions can be used to read the FPIAR in the trap handler without changing

the previous value.

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

Figure 10-1. Programming Model

10.2 Data Types and Addressing Modes

The TS68040 supports the basic data types shown in Table 9-1. Some data types apply only to the inte-

ger unit, some only to the FPU, and some to both the integer unit and the FPU. In addition, the

instruction set supports operations on other data types such as memory addresses.

Note: 1. IU = Integer Unit.

Table 10-1. Data Types

Operand Data Type Size Execution Unit (IU(1), FPU) Notes

Bit 1-bit IU

Bit Field 1-32 bits IU Field of consecutive bits

BCD 32 bits IU Packaged: 2 digits byte

Unpacked: 1 digit byte

Byte Integer 8 bits IU, FPU

Word Integer 16 bits IU, FPU

Long-word Integer 32 bits IU, FPU

Quad-word Integer 64 bits IU Any two data registers

16-byte 128 bits IU Memory-only, aligned 16-byte boundary

Single-precision Real 32 bits FPU 1-bit sign, 8-bit exponent, 23-bit mantissa

Double-precision Real 64 bits FPU 1-bit sign, 11-bit exponent, 52-bit mantissa

Extended-precision Real 80 bits FPU 1-bit sign, 15-bit exponent, 64-bit mantissa

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

The three integer data formats that are common to both the integer unit and the FPU (byte, word, and

long word) are the standard twos-complement data formats defined in the TS68000 Family architecture.

Whenever an integer is used in a floating-point operation, the integer is automatically converted by the

FPU to an extended-precision floating-point number before being used. The ability to effectively use inte-

gers in floating-point operations saves user memory because an integer representation of a number

usually requires fewer bits than the equivalent floating-point representation.

Single- and double-precision floating-point data formats are implemented in the FPU as defined by the

IEEE standard. These data formats are the main floating-point formats and should be used for most cal-

culations involving real numbers.

The extended-precision data format is also in conformance with the IEEE standard, but the standard

does not specify this format to the bit level as it does for single- and double-precision. The memory for-

mat for the FPU consists of 96 bits (three long words). Only 80 bits are actually used; the other 16 bits

are reserved for future use and for long-word alignment of the floating-point data structures in memory.

The extended-precision format has a 15-bit exponent, a 64-bit mantissa, and a 1-bit mantissa sign.

Extended-precision numbers are intended for use as temporary variables, intermediate values, or where

extra precision is needed.

The TS68040 addressing modes are shown in Table 9-2. The register indirect addressing modes sup-

port post-increment, predecrement, offset, and indexing, which are particularly useful for handling data

structures common to sophisticated applications and high-level languages. The program counter indirect

mode also has indexing and offset capabilities; this addressing mode is typically required to support

position-independent software. In addition to these addressing modes, the TS68040 provides index siz-

ing and scaling features that enhance software performance. Data formats are supported orthogonally

by all arithmetic operations and by all appropriate addressing modes.

Table 10-2. Addressing Modes

Addressing Modes Syntax

Date Register Direct

Address Register Direct

Address Register Indirect

Address Register Indirect With Postincrement

Address Register Indirect With Predecrement

Address Register Indirect With Displacement

(An)

(d16, An)

Address Register Indirect With Index (8-bit Displacement)

Address Register Indirect With Index (Base Displacement)

(d8, An, Xn)

(bd, An, Xn)

Memory Indirect

Memory Indirect Postincrement

Memory Indirect Preindexed

([bd, An], Xn, od)

([bd, An, Xn], od)

Program Counter Indirect With Displacement (d16, PC)

Program Counter Indirect With Index

PC Indirect With Index (8-bit Displacement)

PC Indirect With Index (Base Displacement

(d8, PC, Xn)

(bd, PC, Xn)

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

Note:

DN = Data register, D0-D7

AN = Address register, A0-A7

d8, d16 = A twos-complement or sign-extended displacement; added as part of the effective address calculation;

size is 8 (d8) or 16 (d16) bits; when omitted, assemblers use a value of zero.

Xn = Address or data register used as an index register; form is Xn, SIZE*SCALE, where SIZE is W or L

(indicates index register size) and SCALE is 1, 2, 4 or 8 (index register os multiplied by SCALE); use of

SIZE and or SCALE is optional.

bd = A twos-complement base displacement; when present, size can be 16 or 32 bits.

od = Outer displacement added as part of effective address calculation after any memory indirection; use is

optional with a size of 16 or 32 bits.

PC = Program counter.

(data) = Immediate value of 8, 16 or 32 bits.

( ) = Effective address.

[ ] = Used as indirect address to long-word address.

Program Counter Memory Indirect

PC Memory Indirect Postindexed

PC Memory Indirect Preindexed

([bd, PC], Xn, od)

([bd, PC, Xn], od)

Absolute

Absolute Short

Absolute Long

xxx.W

xxx.L

Immediate # (data)

Table 10-2. Addressing Modes (Continued)

Addressing Modes Syntax

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

– Instruction Set Overview

The instruction provided by the TS68040 are listed in Table 9-3 on page 34. The instruction set has been

tailored to support high-level languages and is optimized for those instructions most commonly executed

(however, all instructions listed are fully supported). Many instructions operate on bytes, words, and long

words, and most instructions can use any of the addressing modes of Table 9-2 on page 32.

Table 10-3. Instruction Set Summary

Mnemonic Description

ABCD

ADD

ADDA

ADDI

ADDQ

ADDX

AND

ANDI

ASL, ASR

Add Decimal With Extend

Add

Add Address

Add Immediate

Add Quick

Add With Extend

Logical AND

Logical AND Immediate

Arithmetic Shift Left And Right

Bcc

BCHG

BCLR

BFCHG

BFCLR

BFEXTS

BFEXTU

BFFFO

BFINS

BFSET

BFTST

BKPT

BRA

BSET

BSR

BTST

Branch Conditionally

Test Bit And Change

Test Bit And Clear

Test Bit Field And Change

Test Bit Field And Clear

Signed Bit Field Extract

Unsigned Bit Field Extract

Bit Field Find First One

Bit Field Insert

Test Bit Field And Set

Test Bit Field

Breakpoint

Branch

Test Bit And Set

Branch To Subroutine

Test Bit

CAS

CAS2

CHK

CHK2

CINV(1)

CLR

CMP

CMPA

CMPI

CMPM

CMP2

CPUSH(1)

Compare And Swap Operands

Compare And Swap Dual Operands

Check Register Against Bounds

Check Register Against Upper And Lower Bounds

Invalidate Cache Entries

Clear

Compare

Compare Address

Compare Immediate

Compare Memory To Memory

Compare Register Against Upper And Lower Bounds

Push Then Invalidate Cache Entries

DBCC

DIVS, DIVSL

DIVU, DIVUL

Test Condition, Decrement And Branch

Signed Divide

Unsigned Divide

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

EOR

EORI

EXG

EXT, EXTB

Logical Exclusive OR

Logical Exclusive OR Immediate

Exchange Registers

Sign Extend

ILLEGAL Take Illegal Instruction Trap

JMP

JSR

Jump

Jump To Subroutine

LEA

LINK

LSL, LSR

Load Effective Address

Link And Allocate

Logical Shift Left And Right

MOVE

MOVE16(1)

MOVEA

MOVE CCR

MOVE SR

MOVE USP

MOVEC(1)

MOVEM

MOVEP

MOVEQ

MOVES(1)

MULS

MULU

Move

16-byte Block Move

Move Address

Move Condition Code Register

Move Status Register

Move User Stack Pointer

Move Control Register

Move Peripheral

Move Quick

Move Alternate Address Space

Move Multiply

Signed Multiply

Unsigned Multiply

NBCD

NEG

NEGX

NOP

NOT

Negate decimal with extend

Negate

Negate with extend

No operation

Logical complement

ORI

Logical Inclusive OR

Logical Inclusive OR Immediate

PACK

PEA

PFLUSH(1)

PTEST(1)

Pack BCD

Push Effective Address

Flush Entry(ies) In The ATCs

Test A Logical Address

RESET

ROL, ROR

ROXL, ROXR

RTD

RTE

RTR

RTS

Reset External Devices

Rotate Left And Right

Rotate With Extend Left And Right

Return And Deallocate

Return From Exception

Return And Restore Codes

Return From Subroutine

Table 10-3. Instruction Set Summary (Continued)

Mnemonic Description

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

Note: 1. TS6840 additions or alterations to the TS68030 and TS68881/TS68882 instructions sets.

The TS68040 floating-point instructions, a commonly used subset of the TS68882 instruction set, are

implemented in hardware. The remaining unimplemented instructions are less frequently used and are

efficiently emulated in software, maintaining compatibility with the TS68881/TS68882 floating-point

coprocessors.

The TS68040 instruction set includes MOVE16, a new user instruction that allows high-speed transfers

of 16-byte blocks between external devices such as memory to memory or coprocessor to memory.

SBCD

Scc

STOP

SUB

SUBA

SUBI

SUBQ

SUBX

SWAP

Substract Decimal With Extend

Set Conditionally

Stop

Subtract

Subtract Address

Subtract Immediate

Subtract Quick

Subtract With Extend

Swap Register Words

TAS

TRAP

TRAPcc

TRAPV

TST

Test Operand And Set

Trap

Trap Conditionally

Trap On Overflow

Trap Operand

UNLK

UNPK

Unlink

Unpack BCD

Table 10-4. Floating-point instructions

Mnemonic Description

FABS(1)

FADD(1)

FBcc

FCMP

FDBcc

FDIV(1)

FMOVE(1)

FMOVEM

FMUL(1)

FNEG(1)

FRESTORE

FSAVE

FScc

FSQRT(1)

FSUB(1)

FTRAPcc

FTST

Floating-point Absolute Value

Floating-point Add

Branch On Floating-point Condition

Floating-point Compare

Floating-point Decrement And Branch

Floating-point Divide

Move Floating-point Register

Move Multiple Floating-point Registers

Floating-point Multiply

Floating-point Negate

Restore Floating-point Internal State

Save Floating-point Internal State

Set According To Floating-point Condition

Floating-point Square Root

Floating-point Substract

Trap On Floating-point Condition

Floating-point Test

Table 10-3. Instruction Set Summary (Continued)

Mnemonic Description

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

10.3 Instruction and Data Caches

Studies have shown that typical programs spend much of their execution time in a few main routines or

tight loops. Earlier members of the TS68000 Family took advantage of this locality of reference phenom-

enon to varying degrees. The TS68040 takes further advantage of cache technology with its two,

independent, on-chip, physical address space caches, one for instructions and one for data. The caches

reduce the processor’s external bus activity and increase CPU throughput by lowering the effective

memory access time. For a typical system design, the large caches of the TS68040 yield a very high hit

rate, providing a substantial increase in system performance. Additionally, the caches are automatically

burstfilled from the external bus whenever a cache miss occurs.

The autonomous nature of the caches allows instruction-stream fetches, data-stream fetches, and a

third external access to occur simultaneously with instruction execution. For example, if the TS68040

requires both an instruction-stream access and an external peripheral access and if the instruction is

resident in the on-chip cache, the peripheral access proceeds unimpeded rather than being queued

behind the instruction fetch. If a data operand is also required and if it is resident in the data cache, it can

also be accessed without hindering either the instruction access from its cache or the peripheral access

external to the chip. The parallelism inherent in the TS68040 also allows multiple instructions that do not

require any external accesses to execute concurrently while the processor is performing an external

access for a previous instruction.

10.3.1 Cache Organization

The instruction and data caches are four-way set-associative with 64 sets of four, 16-byte lines for a total

cache storage of 4K bytes each. As shown in Figure 9-2, each 16-byte line contains an address tag and

state information. State information for each entry consists of a valid flag for the entire line in both

instruction and data caches and write status for each long word in the data cache. The write status in the

data cache signifies whether or not the long-word data is dirty (meaning that the data in the cache has

been modified but has not been written back to external memory) for data in copyback pages.

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

Figure 10-2. Cache Organization Overview

The caches are accessed by physical addresses from the on-chip MMUs. The translation of the upper

bits of the logical address occurs concurrently with the accesses into the set array in the cache by the

lower address bits. The output of the ATC is compared with the tag field in the cache to determine if one

of the lines in the selected set matches the translated physical address. If the tag matches and the entry

is valid, then the cache has a hit.

If the cache hits and the access is a read, the appropriate long word from the cache line is multiplexed

onto the appropriate internal bus. If the cache hits and the access is a write, the data, regardless of size,

is written to the appropriate portion of the corresponding longword entry in the cache.

When a data cache miss occurs and a previously valid cache line is needed to cache the new line, any

dirty data in the old line will be internally buffered and copied back to memory after the new cache line

has been loaded.

Pushing of dirty data can be forced by the CPUSH instruction.

Cachability of data in each memory page is controlled by two bits in the page descriptor for each page.

Cachable pages may be either write through or copyback, with no write-allocate for misses to write

through pages. Non-cachable pages may also be specified as non-cachable I/O, forcing accesses to

these pages to occur in order of instruction execution.

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

10.3.2 Cache Coherency

The TS68040 has the ability to snoop the external bus during accesses by other bus masters to maintain

coherency between the TS68040’s caches and external memory systems. External write cycles are

snooped by both the instruction cache and data cache; whereas, external read cycles are snooped only

by the data cache. In addition, external cycles can be flagged on the bus as snoopable or non snoop-

able. When an external cycle is marked as snoopable, the bus snooper checks the caches for a

coherency conflict based on the state of the corresponding cache line and the type of external cycle.

Although the internal execution units and the bus snooper circuit all have access to the on-chip caches,

the snooper has priority over the execution units to allow the snooper to resolve coherency discrepan-

cies immediately.

10.3.3 Cache Instructions

The TS68040 supports the following instructions for cache maintenance. Both instructions may selec-

tively operate on the data or instruction cache.

CINV: Invalidates a single line, all lines in a physical page, or the entire cache.

CPUSH: Pushes selected dirty data cache lines to memory, then invalidates all selected lines.

10.4 Operand Transfer Mechanisms

The TS68040 external synchronous bus supports multiple masters and overlaps arbitration with data

transfers. The bus is optimized to perform high-speed transfers to and from an external cache or mem-

ory. The data and address buses are each 32 bits wide.

10.4.1 Transfer Types

The TS68040 provides two signals (TT1-TT0) that define four types of bus transfers: normal access,

MOVE16 access, alternate access, and interrupt acknowledge access. Normal accesses identify normal

memory references: MOVE16 accesses are memory accesses by a MOVE16 instruction; and alternate

accesses identify accesses to the undefined address spaces (function code values of 0, 3, 4, 7). The

interrupt acknowledge access is used to fetch an interrupt vector during interrupt exception processing.

10.4.2 Burst Transfer Operation

During burst read write to cache transfers, the values on the address and transfer type signals do not

change; they are the address of the first requested item of the cache line. When the TS68040 request a

burst read transfer of a cache line, the address bus indicates the address of the long word in the line

needed first, but the memory system is expected to provide data in the following order (modulo 4): 0, 1,

2, 3 (long-word offsets). The first address needed may not be from offset 0; nevertheless, all four long

words must be transferred. Burst writes occur in a similar manner.

10.4.3 Bus Snooping

Bus snooping ensures that data in main memory is consistent with data in the on-chip caches. If an alter-

nate bus master is performing a read transfer on the bus and snooping is enabled, and if the snoop logic

determines that the on-chip data cache has dirty data (data valid but not consistent with memory) for this

transfer, the memory is prevented from responding to the read request, and the TS68040 supplies the

data directly to the master. If the alternate master is performing a write transfer on the bus and snooping

is enabled, and if the snooper determines that one of the on-chip caches has a valid line for this request,

then the snooper may either invalidate or update the line as selected by the snoop control signals.

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

10.5 Exception Processing

The TS68040 provides the same extensions to the exception stacking process as the TS68030. If the M

bit in the status register is set, the master stack pointer is used for all task-related exceptions. When a

nontask-related exception occurs (i.e., an interrupt), the M bit is cleared, and the interrupt stack pointer is

used. This feature allows a task’s stack area to be carried within a single processor control block, and

new tasks may be initiated by simply reloading the master stack pointer and setting the M bit.

The externally generated exceptions are interrupts, bus errors, and reset conditions. The interrupts are

requests from external devices for processor action; whereas, the bus error and reset signals are used

for access control and processor initialization. The internally generated exceptions come from instruc-

tions, address errors, tracing, or breakpoints. The TRAP, TRAPcc, TRAPVcc, FTRAPcc, CHK, CHK2,

and DIV instructions can all generate exceptions as part of their instruction execution. Tracing behaves

like a very high-priority, internally generated interrupt whenever it is processed. The other internally gen-

erated exceptions are caused by unimplemented floating-point instructions, illegal instructions,

instruction fetches from odd addresses, and privilege violations. Finally, the MMU can generate excep-

tions, for access violations and for when invalid descriptors are encountered during table searches.

Exception processing for the TS68040 occurs on the following sequence:

1. an internal copy is made of the status register,

2. the vector number of the exception is determined,

3. current processor status is saved,

4. the exception vector offset is determined by multiplying the vector number by four.

This offset is then added to the contents of the VBR to determine the memory address of the exception

vector. The instruction at the address given in the exception vector is fetched, and normal instruction

decoding and execution is started.

10.6 Memory Management Units

The full addressing range of the TS68040 is 4G bytes (4,294,967,296 bytes). However, most TS68040

systems implement a much smaller physical memory. Nonetheless, by using virtual memory techniques,

the system can be made to appear to have a full 4G bytes of physical memory available to each user

program. The independent instruction and data MMUs fully support demand paged virtual-memory oper-

ating systems with either 4K or 8K page sizes. In addition to its main function of memory management,

each MMU protects supervisor areas from accesses by user programs and also provides write protection

on a page-by-page basis. For maximum efficiency, each MMU operates in parallel with other processor

activities.

10.6.1 Translation Mechanism

Because logical-to-physical address translation is one of the most frequently executed operations of the

TS68040 MMUs, this task has been optimized. Each MMU initiates address translation by searching for

a descriptor containing the address translation information in the ATC. If the descriptor does not reside in

the ATC, then the MMU performs external bus cycles via the bus controller to search the translation

tables in physical memory. After being located, the page descriptor is loaded into the ATC, and the

address is correctly translated for the access, provided no exception conditions are encountered.

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

10.6.2 Address Translation Cache

An integral part of the translation function previously described is the dual cache memory that stores

recently used logical-to-physical address translation information (page descriptors) for instruction and

date accesses. These caches are 64-entry, four-way, set associative. Each ATC compare the logical

address of the incoming access against its entries. If one of the entries matches, there is a hit, and the

ATC sends the physical address to the bus controller, which then starts the external bus cycle (provided

there was no hit in the corresponding cache for the access).

10.6.3 Translation Tables

The translation tables of the TS68040 have a three level tree structure and reside in main memory.

Since only a portion of the complete tree needs to exist at any one time, the tree structure minimizes the

amount of memory necessary to set up the tables for most programs. As shown in Figure 9-1, either the

user root pointer or the supervisor root pointer points to the first level table, depending on the values of

the function code for an access. Table entries at the second level of the tree (pointer tables) contain

pointers to the third level (page tables). Entries in the page tables contain either page descriptors or indi-

rect pointers to page descriptors. The mechanism for performing table search operations uses portions

of the logical address (as indices) at each level of the search. All addresses in the translation table

entries are physical addresses.

Figure 10-3. Translation Table Structure

There are two variations of table searches for both 4K and 8K page sizes: normal searches and indirect

searches. An indirect search differs in that the entry in the third level page table contains a pointer to a

page descriptor rather than the page descriptor itself.

Entries in the translation tables contain control and status information on addition to the physical address

information. Control bits specify write protection, limit access to supervisor only, and determine cachabil-

ity of data in each memory page. Each page descriptor also has two user-programmable bits that appear

on the UPA0 and UPA1 signals during an external access for use as address modifier bits.

A global bit can be set in each page descriptor to prevent flushing of the ATC entry for that page by some

PFLUSH instruction variants, allowing system ATC entries to remain resident during task swaps. If these

special PFLUSH instructions are not used, this bit can be user defined. The MMUs automatically main-

tain access history information for the pages by updating the used (U) and modified (M) status bits.

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

10.6.4 MMU Instructions

The MMU instructions supported by the TS68040 are as follows:

PFLUSH: Allows flushing of either selected ATC entries by function code and logical address or the

entire ATCs.

PTEST: Takes an address and function code and searches the translation tables for the corresponding

entry, which is then loaded into the ATC. The results of the search are available in the MMU status reg-

ister and are often useful in determining the cause of a fault.

All of the TS68040 MMU instructions are privileged and can only be executed from the supervisor mode.

10.6.5 Transparent Translation

Four transparent translation registers, two each for instruction and data accesses, have been provided

on the TS68040 MMU to allow portions of the logical address space to be transparently mapped and

accessed without the need for corresponding entries resident in the ATC. Each register can be used to

define a range of logical addresses from 16M bytes to 4G bytes with a base address and a mask. All

addresses within these ranges are not mapped, and are optionally protected against user or supervisor

accesses and write accesses. Logical addresses in these areas become the physical addresses for

memory access. The transparent translation feature allows rapid movement of large blocks of data in

memory or I/O space without disturbing the context of the on-chip ATCs or incurring delays associated

with translation table searches.

11. Preparation For Delivery

11.1 Packaging

Microcircuits are prepared for delivery in accordance with MIL-M-38510 or e2v standard.

11.2 Certificate of Compliance

e2v offers a certificate of compliances with each shipment of parts, affirming the products are in compli-

ance either with MIL-STD-883 or e2v standard and guarantying the parameters not tested at

temperature extremes for the entire temperature range.

12. Handling

MOS devices must be handled with certain precautions to avoid damage due to accumulation of static

charge. Input protection devices have been designed in the chip to minimize the effect of this static

buildup. However, the following handling practices are recommended:

a) Devices should be handled on benches with conductive and grounded surfaces.

b) Ground test equipment, tools and operator.

c) Do not handle devices by the leads.

d) Store devices in conductive foam or carriers.

e) Avoid use of plastic, rubber, or silk in MOS areas.

f) Maintain relative humidity above 50 percent if practical.

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

13. Package Mechanical Data

13.1 179 pins – PGA

Dim

Millimeters Inches

Min Max Min Max

A 46.863 47.625 1.845 1.875

B 46.863 47.625 1.845 1.875

C 2.3876 1.875 0.094 0.116

D 4.318 4.826 0.170 0.190

E 1.143 1.4 0.045 0.055

F 1.143 1.4 0.045 0.055

G 2.54 BSC 0.100 BSC

H(1) 0.432 0.483 0.017 0.019

Note: 1. For untinned leads (gold)

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

13.2 196 pins – Tie Bar CQFP Cavity Up (on request)

Dim Millimeters Inches

A 3.30 max 0.130 max

B 0.23 +0.05

0.23 -0.038

0.009 +0.002

0.009 -0.015

C 0.635 typ. .025 typ.

D1 33.91 ± 0.25 1.335 ± 0.01

J 0.89 ± 0.13 0.035 ± 0.005

L 63.5 ± 0.51 2.5 ± 0.02

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

13.3 196 pins – Gullwing CQFP cavity up

* Reduce pin count shown for clarity, 49 pins per side

Symbol Millimeters Inches

A 4.19 max 0.165 max

A1 0.673 ± 0.2 .0265 ±.008

b0.23 +0.05

0.23 -0.038

.009 +.002

.009 -.0015

c0.127 +0.05 .005 +.002

0.127 -0.025 .005 -.001

D/E 33.91 ±0.25 1.335 ±.01

e .635 BSC .025 BSC

e1 30.48 ±0.13 1.2 ±.005

HD/HE 38.8 ±0.18 1.528 ±.007

L 0.813 ±0.2 .032 ±.008

N 196 196

R 0.55 ±0.25 .022 ±.01

R1 0.23 min .009 min

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

14. Ordering Information

14.1 MIL-STD-883 C and Internal Standard

Notes: 1. For availability of the different versions, contact your local e2v sales office.

2. The letter X in the part number designates a "Prototype" product that has not been qualified by e2v. Reliability of a PCX part-

number is not guaranteed and such part-number shall not be used in Flight Hardware. Product changes may still occur while

shipping prototypes.

Table 14-1. Standard Microcircuit Drawing (SMD) Cross-Reference

e2v Orderable

Part-Number

Standard

Microcircuit

Drawing (SMD)

Number Standard Package

Lead-

Finish Temperature

Frequency

(MHz)

TS68040MRB/C25A 5962-9314301MXC MIL-PRF-38535 PGA 179 Gold -55°C/+125°C 25

TS68040MRB/C33A 5962-9314302MXC MIL-PRF-38535 PGA 179 Gold -55°C/+125°C 33

TS68040MR1B/C25A 5962-9314301MXA MIL-PRF-38535 PGA 179 Sn63Pb37 -55°C/+125°C 25

TS68040MR1BC33A 5962-9314302MXA MIL-PRF-38535 PGA 179 Sn63Pb37 -55°C/+125°C 33

TS68040MFTBC25A 5962-9314301MYC MIL-PRF-38535 CQFP 196 Flat+

Tie-Bar Gold -55°C/+125°C 25

TS68040MFTBC33A 5962-9314302MYC MIL-PRF-38535 CQFP 196 Flat+

Tie-Bar Gold -55°C/+125°C 33

TS68040MFB/C25A 5962-9314301MZC MIL-PRF-38535 CQFP 196 Gold -55°C/+125°C 25

TS68040MFB/C33A 5962-9314302MZC MIL-PRF-38535 CQFP 196 Gold -55°C/+125°C 33

TS68040MF1B/C25A 5962-9314301MZA MIL-PRF-38535 CQFP 196 Sn63Pb37 -55°C/+125°C 25

TS68040MF1B/C33A 5962-9314302MZA MIL-PRF-38535 CQFP 196 Sn63Pb37 -55°C/+125°C 33

M: Tc = -55; TJ = +125˚C

V: Tc = -40; TJ = +110˚C

F: CQFP/Gullwing leads

R: PGA

FT: CQFP Flat tie-bar

BC: QML class Q

Blank: Internal standard

1: Hot solder dip(1)

Blank: Gold

TS xx y68040

Part

Identifier

Product

Code(1)

TS(X) 68040

Temperature

Range (1) Screening Level

Lead finish Operating

Frequency

Ax x nnn

(1)

Package (1)

Revision

Level

25: 25 MHz

33: 33 MHz

(2)

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

15. Document Revision History

Table 14-1 provides a revision history for this hardware specification.

Table 15-1. Document Revision History

Revision

Number Date Substantive Change(s)

B 04/2007 Name change from Atmel to e2v

Ordering information update

A 09/2002 Initial revision

0851B–HIREL–06/07

e2v semiconductors SAS 2007

TS68040

Table of Contents

Features .................................................................................................... 1

Description ............................................................................................... 1

Screening ................................................................................................. 2

1 Block Diagram........................................................................................... 2

2 Introduction .............................................................................................. 2

3 Pin Assignments ...................................................................................... 4

3.1 PGA 179 ..................................................................................................................4

3.2 CQFP 196 ...............................................................................................................5

4 Signal Description ................................................................................... 6

5 Scope ........................................................................................................ 8

6 Applicable Documents ............................................................................ 8

6.1 MIL-STD-883 ...........................................................................................................8

7 Requirements ........................................................................................... 8

7.1 General ....................................................................................................................8

7.2 Design and Construction .........................................................................................8

7.3 Electrical Characteristics .........................................................................................9

7.4 Thermal Considerations ........................................................................................10

7.5 Mechanical and Environment ................................................................................18

7.6 Marking ..................................................................................................................18

8 Quality Conformance Inspection ......................................................... 18

8.1 DESC/MIL-STD-883 ..............................................................................................18

9 Electrical Characteristics ...................................................................... 18

9.1 General Requirements ..........................................................................................18

9.2 Static Characteristics .............................................................................................19

9.3 Dynamic Characteristics ........................................................................................20

9.4 Switching Test Circuit and Waveforms ..................................................................25

10 Functional Description .......................................................................... 29

10.1 Programming Model ............................................................................................29

10.2 Data Types and Addressing Modes ....................................................................31

10.3 Instruction and Data Caches ...............................................................................37

0851B–HIREL–06/07

TS68040

e2v semiconductors SAS 2007

10.4 Operand Transfer Mechanisms ...........................................................................39

10.5 Exception Processing ..........................................................................................40

10.6 Memory Management Units ................................................................................40

11 Preparation For Delivery ....................................................................... 42

11.1 Packaging ............................................................................................................42

11.2 Certificate of Compliance ....................................................................................42

12 Handling ................................................................................................. 42

13 Package Mechanical Data ..................................................................... 43

13.1 179 pins – PGA ...................................................................................................43

13.2 196 pins – Tie Bar CQFP Cavity Up (on request) ...............................................44

13.3 196 pins – Gullwing CQFP cavity up ...................................................................45

14 Ordering Information ............................................................................. 46

14.1 MIL-STD-883 C and Internal Standard ................................................................46

15 Document Revision History .................................................................. 47

Table of Contents ...................................................................................... i

Whilst e2v has taken care to ensure the accuracy of the information contained herein it accepts no responsibility for the consequences of any

use thereof and also reserves the right to change the specific ation of goods without notice. e2v accepts no liability beyond that set out in its stan-

dard conditions of sale in respect of infringement of third party patents arising from the use of tubes or other devices in accorda nce w ith inform a-

tion contained herein.

How to reach us

Home page: www.e2v.com

Sales Office:

Northern Europe

e2v ltd

106 Waterhouse Lane

Chelmsford

Essex CM1 2QU

England

Te l: +44 (0)1245 493493

Fax: +44 (0)1245 492492

E-Mail: enquiries@e2v.com

Southern Europe

e2v sas

16 Burospace

F-91572 Bièvres

Cedex

France

Te l: +33 (0) 16019 5500

Fax: +33 (0) 16019 5529

E-Mail: enquiries-fr@e2v.com

Germany and Austria

e2v gmbh

Industriestraße 29

82194 Gröbenzell

Germany

Te l: +49 (0) 8142 41057-0

Fax: +49 (0) 8142 284547

E-Mail: enquiries-de@e2v.com

Americas

e2v inc.

4 Westchester Plaza

Elmsford

NY 10523-1482

USA

Tel: +1 (914) 592 6050 or

1-800-342-5338,

Fax: +1 (914) 592-5148

E-Mail: enquiries-na@e2v.com

Asia Pacific

e2v

Bank of China Tower

30th floor office 7

1 Garden Rd Central

Hong Kong

Tel: +852 2251 8227/8/9

Fax: +852 2251 8238

E-Mail: enquiries-hk@e2v.com

Product Contact:

e2v

Avenue de Rochepleine

BP 123 - 38521 Saint-Egrève Cedex

France

Tel: +33 (0)4 76 58 30 00

Hotline:

std-hotline@e2v.com

0851B–HIREL–06/07

e2v semiconductors SAS 2007