TC74LCX08F/FK
2018-08-02
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© 2018
Toshiba Electronic Devices & Storage Corporation
TOS HIBA CMO S Dig ital Inte grate d Circuit Silicon M o n olithic
TC74LCX08F, TC74LCX08FK
Low-Voltage Quad 2-Input AND Gate with 5-V Tolerant Inputs and Outputs
The TC74LCX08 is a high-performance CMOS 2-input AND gate.
Designed for use in 3.3-V systems, it achieves high-speed operation
while maintaining the CMOS low power dissipation.
The device is designed for low-voltage (3.3 V) VCC applications, but it
could be used to interface to 5-V supply environment for inputs.
All inputs are equipped with protection circuits against static
discharge.
Features
Low-voltage operation: VCC = 2.0 to 3.6 V
High-speed operation: tpd = 5.5 ns (max) (VCC = 3.0 to 3.6 V)
Output current: |IOH|/IOL = 24 mA (min) (VCC = 3.0 V)
Latch-up performance: 500 mA
Available in JEITA S O P, VSSOP (US)
Power-down protection provided on all inputs and outputs
Pin and function compatible with the 74 series
(74AC/VHC/HC/F/ALS/LS etc.) 08 type
TC74LCX08F
TC74LCX08FK
Weight
SOP14
-P-300-1.27A : 0.18 g ( typ.)
VSSOP14-P-0030-0.50 : 0.02 g ( typ.)
Start of commercial production
1994-10
TC74LCX08F/FK
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Toshiba Electronic Devices & Storage Corporation
Pin Assignment (top view) IEC Logic Symbol
Truth Table
Inputs Outputs
A B Y
L L L
L H L
H L L
H H H
Absolute Maximum Ratings (No te 1)
Characteristics Symbol Rating Unit
Power supply voltage VCC
0.5 to 7.0 V
DC input voltage VIN 0.5 to 7.0 V
DC output voltage VOUT 0.5 to 7.0 (Not e 2) V
0.5 to VCC + 0.5
(Note 3)
Input diode current IIK
50 mA
Output diode current IOK ±50 (Note 4) mA
DC output current IOUT ±50 mA
Power dissipation PD 180 mW
DC VCC/ground current ICC/IGND
±100 mA
Storage temperature Tstg 65 to 150 °C
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even
destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant
change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the
operating ranges.
Please d esign the appr o priate reliability upo n r ev iew ing t he Toshiba Semicon du ctor Re liabili ty H andboo k (“H a ndl ing
Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated
failure rate, etc).
Note 2: VCC = 0 V
Note 3: High or low state. IOUT absolute maximum rating must be observed.
Note 4: VOUT < GND, VOUT > VCC
VCC
14
4B
4A
4Y
3B
3A
13
12
11
10
9
8
1A
1
2
3
4
5
6
7
1B
1Y
2A
2B
2Y
GND
3Y
&
1B
1A
2B
2A
3B
3A
4B
4A
3
6
8
11
1Y
2Y
3Y
4Y
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Operating Ranges (Note 1)
Characteristics Symbol Rating Unit
Power Supply voltage VCC 2.0 to 3.6 V
1.5 to 3.6 (Note 2)
Input volt age VIN 0 to 5.5 V
Output voltage VOUT 0 to 5.5 (Note 3)
V
0 to VCC (Note 4)
Output current IOH/IOL ±24 (Note 5) mA
±12 (Note 6)
Operating temperature Topr 40 to 85 °C
Input rise and fall time dt/dv 0 to 10 (Note 7) ns/V
Note 1: The operating ranges must be maintain ed to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Note 2: Data retention only
Note 3: VCC = 0 V
Note 4: High or low state
Note 5: VCC = 3.0 to 3.6 V
Note 6: VCC = 2.7 to 3.0 V
Note 7: VIN = 0.8 to 2.0 V, VCC = 3.0 V
Electrical Characteristics
DC Characteristics (Ta = 40 to 85°C)
Characteristics Symbol Test Condition Min Max Unit
VCC (V)
Input volt age H-level VIH 2.7 to 3.6 2.0 V
L-level VIL 2.7 to 3.6 0.8
Output voltage
H-level VOH VIN = VIH
IOH = 100 µA 2.7 to 3.6 VCC
0.2
V
IOH = 12 mA 2.7 2.2
IOH = 18 mA 3.0 2.4
IOH = 24 mA 3.0 2.2
L-level VOL VIN = VIH or VIL
IOL = 100 µA 2.7 to 3.6 0.2
IOL = 12 mA 2.7 0.4
IOL = 16 mA 3.0 0.4
IOL = 24 mA 3.0 0.55
Input leakage current IIN VIN = 0 to 5.5 V 2.7 to 3.6 ±5.0 µA
Power-off leakage current IOFF VIN/VOUT = 5.5 V 0 10.0 µA
Quiescent supply current ICC VIN = VCC or GND 2.7 to 3.6 10.0
µA
VIN = 3.6 to 5.5 V 2.7 to 3.6 ±10.0
Increase in ICC per input ICC VIH = VCC 0.6 V (per 1 input) 2.7 to 3.6 500
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AC Characteristics (Ta = 40 to 85°C)
Characteristics Symbol Test Condition Min Max Unit
VCC (V)
Propagation delay time tpLH
tpHL Figure 1, Figure 2 2.7 6.2 ns
3.3 ± 0.3 1.5 5.5
Output to output skew tosLH
tosHL (Note)
2.7 ns
3.3 ± 0.3 1.0
Note: Parameter guaranteed by design.
(tosLH = |tpLHm tpLHn|, tosHL = |tpHLm tpHLn|)
Dynamic Switching Characteristics (Ta = 25°C, input: tr = tf = 2.5 ns, CL = 50 pF, RL = 500 )
Characteristics Symbol Test Condition Typ. Unit
VCC (V)
Quiet output maximum dynamic VOL VOLP VIH = 3.3 V, VIL = 0 V 3.3 0.8 V
Quiet output minimum dynamic VOL |VOLV| VIH = 3.3 V, VIL = 0 V 3.3 0.8 V
Capacitive Characteristics (Ta = 25°C)
Characteristics Symbol Test Condition Typ. Unit
VCC (V)
Input capacitance CIN 3.3 7 pF
Output capacitance COUT 0 8 pF
Power dissipation capacitance CPD fIN = 10 MHz (Note)
3.3 25 pF
Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current
consumptio n w ithout loa d.
Average operating current can be obtained by the equation:
ICC (opr) = CPDVCCfIN + ICC/4 (per gate)
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Toshiba Electronic Devices & Storage Corporation
AC Test Circuit
AC Waveform
Output
Measure
C
L = 50 pF
R
L = 500
RL
CL
Figure 1
90%
10%
Output
Input
VOL
VOH
GND
2.7 V
1.5 V
tpLH
tpHL
tr 2.5 ns
tf 2.5 ns
1.5 V
Figure 2 tpLH, tpHL
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Package Dimensions
Weight: 0.18 g (typ.)
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Toshiba Electronic Devices & Storage Corporation
Package Dimensions
Weight : 0.02 g (typ.)
TC74LCX08F/FK
2018-08-02
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© 2018
Toshiba Electronic Devices & Storage Corporation
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