2RF Device Data
Freescale Semiconductor, Inc.
AFT21H350W03SR6 AFT21H350W04GSR6
Table 1. Maximum Ratings
Rating Symbol Value Unit
Drain--Source Voltage VDSS --0.5, +65 Vdc
Gate--Source Voltage VGS --6.0, +10 Vdc
Operating Voltage VDD 32, +0 Vdc
Storage Temperature Range Tstg --65 to +150 C
Case Operating Temperature Range TC--40 to +125 C
Operating Junction Temperature Range (1,2) TJ--40 to +225 C
CW Operation @ TC=25C
Derate above 25CCW 324
0.79 W
W/C
Table 2. Thermal Characteristics
Characteristic Symbol Value (2,3) Unit
Thermal Resistance, Junction to Case
Case Temperature 79C, 63 W CW, 28 Vdc, IDQA = 750 mA, VGSB = 0.7 Vdc, 2140 MHz RJC 0.49 C/W
Table 3. ESD Protection Characteristics
Test Methodology Class
Human Body Model (per JESD22--A114) 2
Machine Model (per EIA/JESD22--A115) B
Charge Device Model (per JESD22--C101) IV
Table 4. Electrical Characteristics (TA=25C unless otherwise noted)
Characteristic Symbol Min Typ Max Unit
Off Characteristics (4)
Zero Gate Voltage Drain Leakage Current
(VDS =65Vdc,V
GS =0Vdc) IDSS — — 10 Adc
Zero Gate Voltage Drain Leakage Current
(VDS =28Vdc,V
GS =0Vdc) IDSS — — 5 Adc
Gate--Source Leakage Current
(VGS =5Vdc,V
DS =0Vdc) IGSS — — 1 Adc
On Characteristics -- Side A (Carrier)
Gate Threshold Voltage (5)
(VDS =6Vdc,I
D= 146 Adc) VGS(th) 0.8 1.2 1.6 Vdc
Gate Quiescent Voltage (5)
(VDD =28Vdc,I
DA = 750 mAdc, Measured in Functional Test) VGS(Q) 1.4 1.8 2.2 Vdc
Drain--Source On--Voltage (4)
(VGS =10Vdc,I
D=4.0Adc) VDS(on) 0.1 0.2 0.3 Vdc
On Characteristics -- Side B (Peaking)
Gate Threshold Voltage (5)
(VDS =6Vdc,I
D= 303 Adc) VGS(th) 0.8 1.2 1.6 Vdc
Drain--Source On--Voltage (4)
(VGS =10Vdc,I
D=4.0Adc) VDS(on) 0.1 0.2 0.3 Vdc
1. Continuous use at maximum temperature will affect MTTF.
2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes -- AN1955
4. Side A and Side B are tied together for these measurements.
5. Each side of device measured separately.
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