TC7SH126FE
2004-05-12
1
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7SH126FE
Bus Buffer
Features
Weight: 0.003 g (typ.)
High speed: tpd = 3.8 ns (typ.) at VCC = 5 V
Low power dissipation: ICC = 2 µA (max) at T a = 25°C
High noise immunity: VNIH = VNIL = 28% VCC (min)
5.5V tolerant input.
Wide operating voltage range: VCC (opr) = 2~5.5 V
Marking Pin Assignment
(top view)
1
2
5
4
VCC
OUT Y
3
Type name
H C G
IN A
GND
Maximum Ratings (Ta = 25°C)
Characteristics Symbol Rating Unit
Supply voltage range VCC −0.5~7 V
DC input voltage VIN −0.5~7 V
DC output voltage VOUT −0.5~VCC + 0.5 V
Input diode current IIK −20 mA
Output diode current IOK ±20 mA
DC output current IOUT ±25 mA
DC VCC/ground current ICC ±50 mA
Power dissipation PD150 mW
Storage temperature Tstg −65~150 °C
TC7SH126FE
2004-05-12
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Logic Diagram Truth Table
G A Y
L X Z
H L L
H H H
EN OUT
Y
G
IN
A
Recommended Operating Conditions
Characteristics Symbol Rating Unit
Supply voltage VCC 2～5.5 V
Input voltage VIN 0~5.5 V
Output voltage VOUT 0~ VCC V
Operating temperature Topr −40~85 °C
0~100 ( VCC = 3.3 V ± 0.3 V )
Input rise and fall time dt/dv 0~20 ( VCC = 5 V ± 0.5 V ) ns/V
Electrical Characteristics
DC Characteristics
Ta = 25°C Ta = −40~85°C
Characteristics Symbol Test
Circuit Test Condition VCC (V) Min Typ. Max Min Max Unit
2.0 1.5 ⎯ ⎯ 1.5 ⎯
High-level input
voltage VIH ⎯ ⎯ 3.0~5.5 VCC
× 0.7 ⎯ ⎯ VCC
× 0.7 ⎯ V
2.0 ⎯ ⎯ 0.5 ⎯ 0.5
Low-level input
voltage VIL ⎯ ⎯ 3.0~5.5 ⎯ ⎯ VCC
× 0.3 ⎯ VCC
× 0.3 V
2.0 1.9 2.0 ⎯ 1.9 ⎯
3.0 2.9 3.0 ⎯ 2.9 ⎯
IOH = −50 µA
4.5 4.4 4.5 ⎯ 4.4 ⎯
IOH = −4 mA 3.0 2.58 ⎯ ⎯ 2.48 ⎯
High-level
output voltage VOH ⎯ VIN = VIH
IOH = −8 mA 4.5 3.94 ⎯ ⎯ 3.80 ⎯
V
2.0 ⎯ 0 0.1 ⎯ 0.1
3.0 ⎯ 0 0.1 ⎯ 0.1
IOL = 50 µA
4.5 ⎯ 0 0.1 ⎯ 0.1
IOL = 4 mA 3.0 ⎯ ⎯ 0.36 ⎯ 0.44
Low-level output
voltage VOL ⎯ VIN = VIH
or VIL
IOL = 8 mA 4.5 ⎯ ⎯ 0.36 ⎯ 0.44
V
Input leakage
current IIN ⎯ VIN = 5.5 V or GND 0~5.5 ⎯ ⎯ ±0.1 ⎯ ±1.0 µA
Quiescent
supply current ICC ⎯ VIN = VCC or GND 5.5 ⎯ ⎯ 2.0 ⎯ 20.0 µA
TC7SH126FE
2004-05-12
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AC Characteristics (input: tr = tf = 3 ns)
Test Condition Ta = 25°C Ta = −40~85°C
Characteristics Symbol
Test
Circuit V
CC (V) CL (pF) Min Typ. Max Min Max Unit
15 ⎯ 5.6 8.0 1.0 9.5
3.3 ± 0.3 50 ⎯ 8.1 11.5 1.0 13.0
15 ⎯ 3.8 5.5 1.0 6.5
Propagation delay
time tpLH
tpHL ⎯ ⎯
5.0 ± 0.5 50 ⎯ 5.3 7.5 1.0 8.5
ns
15 ⎯ 5.4 8.0 1.0 9.5
3.3 ± 0.3 50 ⎯ 7.9 11.5 1.0 13.0
15 ⎯ 3.6 5.1 1.0 6.0
3-state output
enable time tpZL
tpZH ⎯ ⎯
5.0 ± 0.5 50 ⎯ 5.1 7.1 1.0 8.0
ns
3.3 ± 0.3 50 ⎯ 9.5 13.2 1.0 15.0
3-state output
disable time tpLZ
tpHZ ⎯ ⎯ 5.0 ± 0.5 50 ⎯ 6.1 8.8 1.0 10.0 ns
Input capacitance CIN ⎯ ⎯ ⎯ 4 10 ⎯ 10 pF
Output
capacitance COUT ⎯ ⎯ ⎯ 6 ⎯ ⎯ ⎯ pF
Power dissipation
capacitance CPD ⎯ (Note) ⎯ 14 ⎯ ⎯ ⎯ pF
Note: CPD is defined as the value of the internal equivalent cap acitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation.
ICC (opr) = CPD･VCC･fIN + ICC
TC7SH126FE
2004-05-12
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Package Dimensions
Weight: 0.003 g (typ.)
TC7SH126FE
2004-05-12
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RESTRICTIONS ON P RODUCT USE 030619EB
A
• The information contained herein is subject to change without notice.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of
TOSHIBA or others.
• TOSHIBA is continually working to improv e the quality and reliability of its products. Nevertheless, semicond uctor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your desig ns, please ensure that TOSHIBA products ar e used within specified operating ra nges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipm ent, office equipment, measuri ng equipment, industrial r obotics, domestic applianc es,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
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