Rev. 1.2 5/11 Copyright © 2011 by Silicon Labo ratories Si530/531
Si530/531
CRYSTAL OSCILLATOR (XO) (10 MHZ TO 1.4 GHZ)
Features
Applications
Description
The Si530/531 XO utilizes Silicon Laboratories’ advanced DSPLL
®
circuitry
to provide a low jitter clock at high frequencies. The Si530/531 is available
with any-rate output freque nc y fro m 10 to 945 MHz and select freque nc ies to
1400 MHz. Unlike a traditional XO, where a different crystal is required for
each output frequency, the Si530/531 uses one fixed crystal to provide a
wide range of output frequencies. This IC based approach allows the crystal
resonato r to pro vide excep tiona l freque nc y st a bility and relia bility. In addition,
DSPLL clock synthesis provides superior supply noise rejection, simplifying
the task of generating low jitter clocks in noisy environments typically found in
communicatio n systems . The Si530/ 531 IC based XO is fact ory conf igurable
for a wide variety of user specifications including frequency, supply voltage,
output format, and temperature stability. Specific configurations are factory
programmed at time of shipment, thereby eliminating long lead times
associated with custom oscillators.
Functional Block Diagram
Available with any-rate output
frequencies from 10 MHz to 945 MHz
and select frequencies to 1.4 GHz
3rd generation DSPLL® with superior
jitter performance
3x better frequency stability than
SAW-based oscillators
Internal fixed crystal frequency
ensures high reliability and low
aging
Available CMOS, LVPECL,
LVDS, and CML outputs
3.3, 2.5, and 1.8 V supply options
Industry-standard 5 x 7 mm
package and pinout
Pb-free/RoHS-compliant
SONET/SDH
Networking
SD/HD video
Test and measurement
Clock and data recovery
FPGA/ASIC clock generation
Fixed
Frequency
XO
Any-rate
10–1400 MHz
DSPLL®
Clock
Synthesis
VDD CLK+CLK–
OE GND
Ordering Information:
See page 7.
Pin Assignments:
See page 6.
(Top View)
Si5602
1
2
3
6
5
4GND
OE
VDD
CLK+
CLK–
NC
1
2
3
6
5
4GND
NC
VDD
CLK
NC
OE
1
2
3
6
5
4GND
NC
VDD
CLK+
CLK–
OE
Si530 (LVDS/LVPECL/CML)
Si530 (CMOS)
Si531 (LVDS/LVPECL/CML)
REVISION D
Si530/531
2 Rev. 1.2
1. Electrical Specifications
Table 1. Recommended Operating Conditions
Parameter Symbol Test Condition Min Typ Max Units
Supply Voltage1VDD 3.3 V op tio n 2.97 3.3 3.63 V
2.5 V option 2.25 2.5 2.75 V
1.8 V option 1.71 1.8 1.89 V
Supply Current IDD Output enabled
LVPECL
CML
LVDS
CMOS
—
—
—
—
111
99
90
81
121
108
98
88
mA
Tristate mode — 60 75 mA
Output Enable (OE)2VIH 0.75 x VDD ——V
VIL ——0.5V
Operating Temperature Range TA–40 — 85 ºC
Notes:
1. Selectable parameter specified by part number. See Section 3. "Ordering Information" on page 7 for further details.
2. OE pin includes a 17 k pullup resistor to VDD.
Table 2. CLK± Output Frequency Characteristics
Parameter Symbol Test Condition Min Typ Max Units
Nominal Frequency1,2 fOLVPECL/LVDS/CML 10 — 945 MHz
CMOS 10 — 160 MHz
Initial Accuracy fiMeasured at +25 °C at time of
shipping — ±1.5 — ppm
Temperature Stability1,3 –7
–20
–50
—
—
—
+7
+20
+50 ppm
Aging fa
Frequency drift over first year — — ±3 ppm
Frequency drif t over 20 year
life — — ±10 ppm
Notes:
1. See Section 3. "Ordering Information" on page 7 for further details.
2. Specified at time of order by part number. Also avai lable in frequencies from 970 to 1134 MHz and 1213 to 1417 MHz.
3. Selectable parameter specified by part number.
4. Time from powerup or tristate mode to fO.
Si530/531
Rev. 1.2 3
Total Stability Temp stability = ±7 ppm — — ±20 ppm
Temp stability = ±20 ppm — — ±31.5 ppm
Temp stability = ±50 ppm — — ±61.5 ppm
Powerup Time4tOSC ——10ms
Table 3. CLK± Output Levels and Symmetry
Parameter Symbol Test Condition Min Typ Max Units
LVPECL Output Option1VOmid-level VDD – 1.42 — VDD – 1.25 V
VOD swing (diff) 1.1 —1.9 VPP
VSE swing (single-ended) 0.55 —0.95 VPP
LVDS Output Option2VOmid-level 1.125 1.20 1.275 V
VOD swing (diff) 0.5 0.7 0.9 VPP
CML Output Option2VO2.5/3.3 V option mid-level — VDD – 1.30 — V
1.8 V option mid-level — VDD – 0.36 — V
VOD 2.5/3.3 V option swing (diff) 1.10 1.50 1.90 VPP
1.8 V option swing (diff) 0.35 0.425 0.50 VPP
CMOS Output Option3VOH IOH =32mA 0.8 x VDD —VDD V
VOL IOL =32mA — — 0.4 V
Rise/Fall time (20/80%) tR, tFLVPECL/LVDS/CML — — 350 ps
CMOS with CL=15pF — 1 — ns
Symmetry (duty cycle) SYM LVPECL: VDD – 1.3 V
(diff)
LVDS: 1.25 V (diff)
CMOS: VDD/2
45 — 55 %
Notes:
1. 50 to VDD – 2.0 V.
2. Rterm = 100 (differential).
3. CL = 15 pF
Table 2. CLK± Output Frequency Characteristics (Continued)
Parameter Symbol Test Condition Min Typ Max Units
Notes:
1. See Section 3. "Ordering Information" on page 7 for further details.
2. Specified at time of order by part number. Also avai lable in frequencies from 970 to 1134 MHz and 1213 to 1417 MHz.
3. Selectable parameter specified by part number.
4. Time from powerup or tristate mode to fO.
Si530/531
4 Rev. 1.2
Table 4. CLK± Output Phase Jitter
Parameter Symbol Test Condition Min Typ Max Units
Phase Jitter (RMS)1
for FOUT > 500 MHz J12 kHz to 20 MHz (OC-48) — 0.25 0.40 ps
50 kHz to 80 MHz (OC-192) — 0.26 0.37 ps
Phase Jitter (RMS)1
for FOUT of 125 to 500 MHz J12 kHz to 20 MHz (OC-48) — 0.36 0.50 ps
50 kHz to 80 MHz (OC-192)2— 0.34 0.42 ps
Phase Jitter (RMS)
for FOUT of 10 to 160 MHz
CMOS Output Only
J12 kHz to 20 MHz (OC-48)2—0.62—ps
50 kHz to 20 MHz2—0.61—ps
Notes:
1. Refer to AN256 for further information.
2. Max offset frequencies: 80 MHz for FOUT > 250 MHz, 20 MHz for 50 MHz < FOUT <250 MHz,
2 MHz for 10 MHz < FOUT <50 MHz.
Table 5. CLK± Output Period Jitter
Parameter Symbol Test Condition Min Typ Max Units
Period Jitter* JPER RMS — 2 — ps
Peak-to-Peak — 14 — ps
*Note: Any output mode, including CMOS, LVPECL, LVDS, CML. N = 1000 cycles. Refer to AN279 for further information.
Table 6. CLK± Output Phase Noise (Typical)
Offset Frequency (f) 120.00 MHz
LVDS 156.25 MHz
LVPECL 622.08 MHz
LVPECL Units
100 Hz
1kHz
10 kHz
100 kHz
1MHz
10 MHz
100 MHz
–112
–122
–132
–137
–144
–150
n/a
–105
–122
–128
–135
–144
–147
n/a
–97
–107
–116
–121
–134
–146
–148
dBc/Hz
Si530/531
Rev. 1.2 5
Table 7. Environmental Compliance
The Si530/531 meets the following qualification test requirements.
Parameter Conditions/Test Method
Mechanical Shock MIL-STD-883, Method 2002
Mechanical Vibration MIL-STD-883, Method 2007
Solderability MIL-STD-883, Method 2003
Gross & Fine Leak MIL-STD-883, Method 1014
Resistance to Solder Heat MIL-STD-883, Method 2036
Moisture Sensitivity Level J-STD-020, MSL1
Contact Pads Gold over Nickel
Table 8. Absolute Maximum Ratings1
Parameter Symbol Rating Units
Maximum Operating Temperature TAMAX 85 ºC
Supply Voltage, 1.8 V Option VDD –0.5 to +1.9 V
Supply Voltage, 2.5/3.3 V Option VDD –0.5 to +3.8 V
Input Voltage (any input pin) VI–0.5 to VDD + 0.3 V
Storage Temperature TS–55 to +125 ºC
ESD Sensitivity (HBM, per JESD22-A114) ESD 2500 V
Soldering Temperature (Pb-free profile)2TPEAK 260 ºC
Soldering Temperature Time @ TPEAK (Pb-free profile)2tP20–40 seconds
Notes:
1. Stresses beyond th ose listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional
operation or specification compliance is not implied at these conditions. Exposure to maximum rating conditions for
extended periods may affect device reliability.
2. The device is compliant with JEDEC J-STD-020C. Refer to Si5xx Packaging FAQ available for download at
www.silabs.com/VCXO for further information, including soldering profiles.
Si530/531
6 Rev. 1.2
2. Pin Descriptions
Table 9. Pinout for Si530 Series
Pin Symbol LVDS/LVPECL/CML Function CMOS Function
1 OE (CMOS only)* No connection Output enable
0 = clock output disabled (outputs tristated)
1 = clock output enabled
2OE
(LVPECL,LVDS,
CML)*
Output enable
0 = clock output disabled (output s trist ated )
1 = clock output enabled No connection
3 GND Electrical and Case Ground Electrical and Case Ground
4 CLK+ Oscillator Output Oscillator Output
5 CLK– Complementary Output No connection
6V
DD Power Supply Voltage Power Supply Voltage
*Note: OE includes a 17 k pullup resistor to VDD.
Table 10. Pinout for Si531 Series
Pin Symbol LVDS/LVPECL/CML Function
1 OE (LVPECL, LVDS, CML)* Output enable
0 = clock output disabled (outputs tristated)
1 = clock output enabled
2 No connection No connection
3 GND Electrical and Case Ground
4 CLK+ Oscillator Output
5 CLK– Complemen tary outp ut
6V
DD Power Supply Voltage
*Note: OE includes a 17 k pullup resistor to VDD.
1
2
3
6
5
4GND
NC
VDD
CLK
NC
OE
(Top View)
1
2
3
6
5
4GND
OE
VDD
CLK+
CLK–
NC
1
2
3
6
5
4GND
NC
VDD
CLK+
CLK–
OE
Si530
LVDS/LVPECL/CML Si530
CMOS Si531
LVDS/LVPECL/CML
Si530/531
Rev. 1.2 7
3. Ordering Information
The Si530/531 XO supports a variety of options including frequency, temperature stability, output format, and VDD.
Specific device configurations are programmed into the Si530/531 at time of shipment. Configurations can be
specified using the Part Number Configuration chart below. Silicon Laboratories provides a web browser-based
part number configuration utility to simplify this process. Refer to www.silabs.com/VCXOPartN umber to access t his
tool and for further ordering instructions. The Si530 and Si531 XO series are supplied in an industry-standard,
RoHS compliant, 6-pad, 5 x 7 mm package. The Si531 Series supports an alternate OE pinout (pin #1) for the
LVPECL, LVDS, and CML output formats. See Tables 9 and 10 for the pinout differences between the Si530 and
Si531 series.
Figure 1. Part Number Convention
Si530/531
8 Rev. 1.2
4. Outline Diagram and Suggested Pad Layout
Figure 2 illustrates the package details for the Si530/531. Table 11 lis ts the values for the dimensions shown in the
illustration.
Figure 2. Si530/531 Outline Diagram
Table 11. Package Diagram Dimensions (mm)
Dimension Min Nom Max
A 1.45 1.65 1.85
b1.21.41.6
c0.60 TYP.
D 7.00 BSC.
D1 6.10 6.2 6.30
e 2.54 BSC.
E 5.00 BSC.
E1 4.30 4.40 4.50
L 1.07 1.27 1.47
S 1.815 BSC.
R 0.7 REF.
aaa — — 0.15
bbb — — 0.15
ccc — — 0.10
ddd — — 0.10
Si530/531
Rev. 1.2 9
5. Si530/Si531 Mark Specification
Figure 3 illustrates the mark specification for the Si530/Si531. Table 12 lists the line information.
Figure 3. Mark Specification
Table 12. Si53x Top Mark Description
Line Position Description
1 1–10 “SiLabs"+ Part Family Number, 53x (First 3 characters in part number where x = 0
indicates a 530 device and x = 1 indicates a 531 device).
2 1–10 Si530, Si531: Option1 + Option2 + Freq(7) + Temp
Si532, Si533, Si534, Si530/Si531 w/ 8-digit resolution:
Option1 + Option2 + ConfigNum(6) + Temp
3 Trace Code
Position 1 Pin 1 orientation mark (dot)
Position 2 Product Revision (D)
Position 3–6 Tiny Trace Code (4 alphanumeric characters per assembly release instructions)
Position 7 Year (least significant year digit), to be assigned by assembly site (ex: 2007 = 7)
Position 8–9 Calendar Work Week number (1–53), to be assigned by assembly site
Position 10 “+” to indicate Pb-Free and RoHS-compliant
Si530/531
10 Rev. 1.2
6. 6-Pin PCB Land Pattern
Figure 4 illustrates the 6-pin PCB land pattern for the Si530/531. Table 13 lists the values for the dimensions shown
in the illustration.
Figure 4. Si530/531 PCB Land Pattern
Table 13. PCB Land Pattern Dimensions (mm)
Dimension Min Max
D2 5.08 REF
e 2.54 BSC
E2 4.15 REF
GD 0.84 —
GE 2.00 —
VD 8.20 REF
VE 7.30 REF
X1.70 TYP
Y2.15 REF
ZD — 6.78
ZE — 6.30
Notes:
1. Dimensioning and tolerancing per th e ANSI Y14.5M-1994 specification.
2. Land pattern design based on IPC-7351 guidelines.
3. All dimensions shown are at maximum material condition (MMC).
4. Controlling dimension is in millime ters (mm).
Si530/531
Rev. 1.2 11
DOCUMENT CHANGE LIST
Revision 0.4 to Revision 0.5
Updated Table 1, “Recommended Operating
Conditions,” on page 2.
Added maximum supply current specifications.
Specified relationship between temperatur e at startup
and operation temperature.
Updated Ta ble 4, “CLK± Ou tp ut Phas e Jitt er,” on
page 4 to include maximum rms jitter generation
specifications and updated typical rms jitter
specifications.
Added Table 6, “CLK± Ou tp ut Phas e Nois e
(Typical),” on page 4.
Added Output Enable active polarity as an option in
Figure 1, “Part Number Convention,” on page 7.
Revision 0.5 to Revision 1.0
Updated Note 3 in Table 1, “Recommended
Operating Conditions,” on page 2.
Updated Figure 1, “Part Number Convention,” on
page 7.
Revision 1.0 to Revision 1.1
Updated Table 1, “Recommended Operating
Conditions,” on page 2.
Device maintains stable operation over –40 to +85 º C
operating temperature range.
Supply current specifications updated for revision D.
Updated Table 2, “CLK± Output Frequency
Characteristics,” on page 2.
Added specification for ±20 ppm lifetime stability
(±7 ppm temperature stability) XO.
Updated Table 3, “CLK± Output Levels and
Symmetry,” on page 3.
Updated LVDS differential peak-peak swing
specifications.
Updated Ta ble 4, “CLK± Ou tp ut Phas e Jitt er,” on
page 4.
Updated Table 5, “CLK± Output Period Jitter,” on
page 4.
Revised period jitter specifications.
Updated Table 8, “Absolute Maximum Ratings1,” on
page 5 to reflect the soldering temperature time at
260 ºC is 20–40 sec per JEDEC J-STD-020C.
Updated 3. "Ordering Information" on page 7.
Changed ordering instructions to revision D.
Added 5. "Si530/Si531 Mark Specification" on page
9.
Revision 1.1 to Revision 1.2
Updated 2.5 V/3.3 V and 1.8 V CML output level
specifications for Table 3 on page 3.
Added footnotes clarifying max offset frequency test
conditions for Table 4 on page 4.
Added CMOS phase jitter specs to Table 4 on
page 4.
Removed the words "Differential Modes:
LVPECL/LVDS/CML" in the footnote referring to
AN256 in Table 4 on page 4.
Separated 1.8 V, 2.5 V/3.3 V supply voltage
specifications in Table 8 on page 5.
Updated and clarified Table 8 on page 5 to include
the "Moisture Sensitivity Level" and "Contact Pads"
rows.
Updated Figure 3 on p age 9 and Table 12 on page 9
to reflect specific marking information. Previously,
Figure 3 was generic.
Si530/531
12 Rev. 1.2
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