MLX90288LDC - Melexis, Inc.

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 1 of 18

Rev 001 Jun/11

Features and Benefits

 Surface mounted device

 Analog ratiometric output

 Measurement range from 6mT to 650mT

bipolar full scale

 Digital IIR filtering for accurate bandwidth

 Offset trimming possible outside output range

 1

st and 2nd order magnet TC compensation

 Reverse polarity and overvoltage protection

 Extensive diagnostic features

Application Examples

 Rotary position sensor

 Linear position sensor

 Proximity sensor

Ordering Information

Part No. Temperature Code Package Code Option code

MLX90288 L (-40°C to 150°C) DC (SOIC-8) -

1 Functional Diagram

Figure 1: Block diagram of the MLX90288

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 2 of 18

Rev 001 Jun/11

2 Table of Contents

1 Functional Diagram .......................................................................................................................................... 1

2 Table of Contents ............................................................................................................................................. 2

3 General Description .......................................................................................................................................... 3

4 Glossary of Terms ............................................................................................................................................ 3

5 Specification ..................................................................................................................................................... 3

5.1 Absolute Maximum Ratings ....................................................................................................................... 3

5.2 Electrical Specification ............................................................................................................................... 4

5.3 Timing Specification ................................................................................................................................... 5

5.4 Transfer Characteristic Specification ......................................................................................................... 5

5.5 Accuracy Specification ............................................................................................................................... 6

5.6 Diagnostic Specification ............................................................................................................................. 7

5.7 Startup, Undervoltage, Overvoltage and Reset Specification ................................................................... 7

5.8 EMC/ESD Specification ............................................................................................................................. 8

6 EEPROM Mapping ........................................................................................................................................... 9

6.1 EEPROM Description ................................................................................................................................ 9

6.2 Melexis Programmable Parameters .......................................................................................................... 9

6.3 End User Programmable Parameters ..................................................................................................... 11

7 Thermal Sensitivity Drift Compensation ......................................................................................................... 13

7.1 Introduction .............................................................................................................................................. 13

7.2 Linear Compensation (1st Order) ............................................................................................................. 13

7.3 Quadratic Compensation (2nd Order) ....................................................................................................... 13

7.4 Additional Information .............................................................................................................................. 14

8 Standard information regarding manufacturability of Melexis products with different soldering processes .. 14

9 Package Specification .................................................................................................................................... 15

9.1 Package Dimensions ............................................................................................................................... 15

9.2 Package Marking ..................................................................................................................................... 15

9.3 Pinout ....................................................................................................................................................... 16

10 Recommended Application Diagram ............................................................................................................ 17

11 Disclaimer ..................................................................................................................................................... 18

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 3 of 18

Rev 001 Jun/11

3 General Description

The MLX90288 is a cost-effective monolithic programmable linear Hall sensor which provides an analog

ratiometric output signal proportional to the magnetic flux density that is applied perpendicular to the die

surface. The MLX90288 is fully programmable (offset, sensitivity, clamping levels, magnet temperature drift,

digital IIR filtering …) through the connector, using the PTC-04 programming tool. It supports both linear and

quadratic magnet TC compensation.

4 Glossary of Terms

Tesla (T) Unit for the magnetic flux density, 1 mT = 10 Gauss

TC Temperature Coefficient (in ppm/°C)

IC Integrated Circuit

SMD Surface Mounted Device

N/C Not Connected

ADC Analog-to-Digital Converter

DAC Digital-to-Analog Converter

PTC Programming Through Connector

ECU Engine Control Unit

POR Power on Reset

INL Integral Non Linearity

DNL Differential Non Linearity

CRC Cyclic Redundancy Check

ESD Electro-Static Discharge

EMC Electro-Magnetic Compatibility

OBD On-Board Diagnostics

5 Specification

5.1 Absolute Maximum Ratings

Item Symbol Rating

Supply Forward-Voltage VDDFWD

+ 30 V (continuous)

(Breakdown at + 40 V)

Supply Forward-Current IDDFWD + 20 mA

Supply Reverse-Voltage VDDREV

– 14.5 V (continuous)

(Breakdown at – 19 V)

Supply Reverse-Current IDDREV – 2 mA

Output Forward-Voltage VOUTFWD + 18 V

Output Forward-Current IOUTFWD – 60 mA

Output Reverse-Voltage VOUTREV – 14 V

Output Reverse-Current IOUTREV + 20 mA

Storage Temperature Range (Non Operating) TS -55°C to +165°C

Operating Ambient Temperature Range TA -40°C to +150°C

Junction Temperature TJ +165°C

Package Thermal Resistance RTH 100 K/W

Maximum Flux Density BMAX 2T

Table 1: Absolute Maximum Rating s

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 4 of 18

Rev 001 Jun/11

Exposing a part to absolute maximum ratings for extended periods of time may affect device reliability.

5.2 Electrical Specification

Operating parameter valid for TA = – 40°C to + 150°C & VDD = + 4.5V to + 5.5V (unless specified otherwise).

Item Symbol Remark Min Typ Max Unit

Supply Voltage VDD Guaranteed spec operation 4.5 5 5.5 V

Supply Current IDD Worst case (min RPD, max

VDD) - 8.8 10 mA

Regulated Voltage VREG Internal voltage 3.0 3.3 3.6 V

Reset Voltage VPORRISE Output is high impedant for

VPOR < VDD < VUNDER

2.5 3.4 V

VPORFALL 2.4 3.3 V

Undervoltage Threshold VUNDERRISE Operating if VDD > VUNDER 3.4 4.4 V

VUNDERFALL 3.3 4.3 V

Programming Voltage(1) VPROGRISE Device not locked 6.2 7.2 V

VPROGFALL 6.1 7.1 V

Overvoltage Threshold

(2)

OVER Disconnect VPROT from VDD 8.4 14 V

Load Resistance Range RPD Pull-down to GND 8 10 330 kΩ

Load capacitor range CL Between OUT and GND 47 1000 nF

Output Saturation

Voltage(3)

VSATHI Including RPD 96 100 %VDD

VSATLO Including RPD 0 2 %VDD

Output Current

Limitation(4)

IOUTLIMGND Output amplifier sourcing

strength 2 5 8 mA

IOUTLIMVDD Output amplifier sinking

strength 2 5 8 mA

Supply Current

Limitation IVDDLIM Same condition as above 5 18 mA

Output Diagnostic Band

Leakage Current(5) IDIAGLO Leakage current over TA

VDD=5V 500 nA

Output Diagnostic Level VDIAGLO Leakage current over TA

and VDD span

RPD x

IDIAGLO V

Table 2: Electrical Specification

(1) The programming voltage defines the threshold at which the ASIC goes into PTC mode, where the

output pin becomes bidirectional. Write access is eventually defined by the locking bits as described

in Section 6.1

(2) The overvoltage threshold will disconnect all internal supplies (Vana, Vdig & Vprot) from VDD; the

output becomes high impedant.

(3) The saturation voltage is the rail voltage the output amplifier can reach actively with RPD connected.

(4) The maximum current the output stage can deliver to keep its DC value, in case the output is pulled

to one of the rails by means of an external power supply, while VDD = 5V.

(5) The leakage current is in fact the current sourced by the output in case of an OBD detection (broken

ground), where the output goes into high-Z mode. For better contacting at the connectors over

lifetime and bigger rail-to-rail operation, the smaller pull-down resistors from this specification are

recommended at ECU side.

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 5 of 18

Rev 001 Jun/11

5.3 Timing Specification

Operating parameter valid for TA = – 40°C to + 150°C & VDD = + 4.5V to + 5.5V (unless specified otherwise).

Item Symbol Remark Min Typ Max Unit

Power Supply Slew Rate VDDSR External supply VDD 5e-6 5 V/µs

Startup time

(1)

STARTUP 200 500 800 µs

Main Oscillator Frequency FOSC Tolerance



10% 900 1000 1100 kHz

Conversion Rate

tCONV Acquisition of Hall and

Temperature signals

(no digital filtering)

130 144 158 µs

fCONV 6.33 7 7.7 kHz

Programmable Filtering

(2)

BW Tempsensor enabled 0.004 1.114 kHz

Output Amplifier Rise Time

(10%-90%)(3) tRISEPP RL = 8 k



to Ground

CL = 330 nF to Ground 300 µs

Output Amplifier Fall Time

(90%-10%)(3) tFALLPP RL = 330 k



to Ground

CL = 330 nF to Ground 200 µs

Calibration Time(4) t

CALIB

EE Full Erase + Write 6 ms

EE Full Read 180 ms

RAM Write 3 ms

Table 3: Timing Specification

(1) Startup time is defined as the time between crossing the POR level and having the first DAC output

update. It includes loading of the parameters from EEPROM, checking the CRC validity, initializations

and the signal latency between the first Hall plate acquisition and the DAC output update.

(2) Filtering is programmable with the FILTCODE parameter in EEPROM. The filter consists of an IIR

filter in the digital. For more details about the corresponding bandwidths, see Section 6.3.3.

(3) Rise and fall times are measured for worst case conditions, hence the difference in Rload for both

parameters. These specifications are only defined by the output amplifier and its load. The output

amplifier (Gain=2) is given a step response at the input from 5%VDD to 45%VDD and the rise/fall times

are measured as the time between reaching 10% and 90% of the step response DC output voltages

(10%VDD to 90%VDD).

(4) Calibration times measured at room temperature with PTC-04 and DB-HALL03 daughterboard,

FIR090288AAMLX firmware loaded onto the PTC-04 and on a MLX90288 in the recommended

application diagram from Section 10 at 10kbit/s.

5.4 Transfer Characteristic Specification

Operating parameter valid for TA = – 40°C to + 150°C & VDD = + 4.5V to + 5.5V (unless specified otherwise).

Item Symbol Remark Min Typ Max Unit

Output Clamping Range CLAMPLO 9 bits

(1)

0 50 %VDD

CLAMPHI 10 bits

(1)

0 100 %VDD

Output Quiescent (Offset)

Voltage Range VOQ 14 bits (YA setting) (1) – 200 200 %VDD

Sensitivity Range S RG[2] = 1

(1)

For full-scale output(2) 0.04 0.4 %VDD/G

Table 4: Transfer Characteristic Specification

(1) Please refer to Section 6.2 for more detailed information.

(2) The full-scale output corresponds to 100%Vdd output range. This corresponds to 100% of the ADC

range when FINEGAIN is set to 1 (1024LSB) in a bipolar application.

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 6 of 18

Rev 001 Jun/11

5.5 Accuracy Specification

Operating parameter valid for TA = – 40°C to + 150°C & VDD = + 4.5V to + 5.5V (unless specified otherwise).

Item Symbol Remark Min Typ Max Unit

Output DAC Resolution LSBDAC 12 bits 0.0244 %VDD

Output DAC Linearity DNLDAC – 1 + 1 LSBDAC

INLDAC – 2 + 2 LSBDAC

Ratiometric Error(1) OUTratiom with TEMPTC=0 – 0.1 + 0.1 %VDD

with TEMPTC=128 – 0.2 + 0.2 %VDD

Output Noise(2) OUTnoise

RG = 4, FG = 800

FILTCODE = 4 0.12 0.18 mVRMS

RG = 7, FG = 800

FILTCODE = 4 0.13 0.2 mVRMS

RG = 4, FG = 4095

FILTCODE = 4 0.75 1.1 mVRMS

RG = 7, FG = 4095

FILTCODE = 4 1 1.5 mVRMS

Thermal Output Quiescent

(Offset) Drift ΔT VOQ

RG = 4 – 10 + 10 LSBDAC

RG = 5 – 10 + 10 LSBDAC

RG = 6 – 15 + 15 LSBDAC

RG = 7 – 20 + 20 LSBDAC

Thermal Sensitivity Drift(3) ΔT S

No magnet TC – 150 0 + 150 ppm/°C

Using 1s

and 2n

order magnet TC – 200 0 + 200 ppm/°C

Sensitivity Thermal

Hysteresis ΔH S After full thermal

excursion – 0.5  0.2 + 0.5 %

Table 5: Accuracy Specification

(1) Ratiometric performance of the IC is measured as a difference in output voltage (expressed as

%VDD) between the nominal case with VDD = 5V and the limits of the supply ratiometric operating

range (4.5V and 5.5V). The difference between TEMPTC = 0 (or TEMPSENSOR disabled altogether)

and TEMPTC = 128 originates in the fact that the on-chip temperature is also a function of the supply

voltage. Since the TEMPTC changes the gain of the IC to compensate for the magnet TC, and it

relies on the fact that the on-chip temperature is the same as the magnet temperature, an extra error

occurs compared to TEMPTC = 0 case.

(2) The noise measurements are performed on the recommended application diagram depicted under

Section 10, with a supply voltage of 5V at room temperature. Increased capacitance values

compared to the recommended application diagram, contribute to lower output noise. For peak-to-

peak values, the RMS value is typically multiplied by a factor of 6.

(3) The Sensitivity Thermal Drift is within these boundaries for all ICs with the default setting for gain

compensation i.e. fixed to 1, which is obtained by setting TEMPTC to 0, but leaving the

TEMPSENSOR bit set (see Section 7). If the value is not fixed to 1, the sensitivity of the IC will

exhibit a sensitivity thermal drift curve such as the one shown in Figure 3 (if SECONDORDERTC is

set) or with a linear temperature coefficient (if SECONDORDERTC is cleared) depending on the

setting of TEMPTC, but 150ppm/°C. The total system sensitivity drift is specified as 200ppm/°C to

cover resolution errors and non-linearities.

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 7 of 18

Rev 001 Jun/11

5.6 Diagnostic Specification

Operating rating valid for TA = – 40°C to + 85°C & VDD = + 4.5V to + 5.5V (unless specified otherwise).

Item Symbol Remarks Min Typ Max Unit

ADC Clipping Signaling(1) DIAGCLIP DIAGINFAULT = 0 - - VSATLO %VDD

DIAGINFAULT = 1 VSATHI - - %VDD

ADC Clipping Criterion(1) N

CLIP ADC clipping count

before Diagnostic is set - 4 - Count

CRC Fail Signaling DIAGPAR DIAGINFAULT = 0 - - VSATLO %VDD

DIAGINFAULT = 1 VSATHI - - %VDD

CRC Fail Criterion NCRC CRC Fail count before

Diagnostic is set - 3 - Count

Broken VSS

(2)

OUTbrVSS Over RPD range - - VDIAGLO %VDD

Broken VDD

(2)

OUTbrVDD Over RPD range - - VDIAGLO %VDD

Table 6: Diagnostic Specification

(1) ADC clipping is only flagged if the FAULTONCLIP bit in EEPROM is set. If the bit is cleared, the ADC

will clamp at either the maximum code or the minimum code, depending on the clipping condition.

Reporting after 4 sequential clipping conditions is required for an EMC robust design. Clipping

reporting does not apply to ADC values of the temperature signal.

(2) Diagnostics that are the result of a passive settling because the output stage becomes high impedant

(such as broken wire) are governed by the RC time constant of the capacitive load on the output and

the RPD resistor at ECU side. The OBD detection time is negligible in comparison to the settling time

in case of a broken wire. The settling time should be taken as 4 times the RC time constant. E.g. with

a load of 330nF and 330kOhm, the RC time constant equals 109ms. Settling time then corresponds

to 4 RC time constants, i.e. 436ms.

5.7 Startup, Undervoltage, Overvoltage and Reset Specification

During power-up (supply rising from 0V upwards) the MLX90288 remains in a zone where the output is

undefined (grey triangular area in the plot) because there is no active circuitry putting the output stage in a

specific condition. Most likely the output remains close to the low rail because of the passive external pull-

down, but it can not be predicted what happens exactly inside the IC at this point. This is also depicted in the

signal waveforms of Figure 2.

The POR phase is the phase where the supply is still below VPORRISE, but above the undefined region. In this

case the digital is in a reset state, which puts all flip-flops in a known state, and the output is high impedant.

Due to the external pull-down resistive load, the output is at the low rail.

When the supply rises above the VPORRISE threshold (which has built-in hysteresis: for the falling edge,

VPORFALL), an initialization occurs which includes loading all EEPROM settings into RAM. After this

initialization phase, the chip will start its FSM program and provide a valid output signal, for as long as the

supply voltage is above the VUNDERRISE threshold (which has built-in hysteresis: for the falling edge,

VUNDERFALL). If the supply is below this threshold, the output remains in high impedant state, corresponding to

an output voltage at the low rail.

Whenever the MLX90288 goes from normal operation to undervoltage or via undervoltage to reset state, and

vice versa, the output has a settling time which is a function of both the output load and the driving capability.

On top of this, there is a startup time (tSTARTUP) in case the chip comes out of reset.

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 8 of 18

Rev 001 Jun/11

Vdd

time

Vout

time

tSTARTUP

Vporrise

Vporfall

Vunderrise

Vunderfall

INIT ratiometric normal operation (RNO) underV (uV) RNO INITPOR

tSTARTUP

uVundefined POR

Figure 2: Operating, undervoltage and reset functionality

In case the supply is raised above the VPROGRISE threshold (which has built-in hysteresis: for the falling edge,

VPROGFALL), but below the VOVER threshold, the IC goes in programming mode: the output becomes high

impedant and after proper commands coming from the programming unit (PTC04), the IC can respond on the

output pin as well. The communication protocol on the output (PTC-04 communication) is bi-directional. If the

supply is higher than the VOVER threshold, the internal regulated supply is disconnected from the external

supply, as are most blocks of the IC. A reset will be the result when the supply is restored.

5.8 EMC/ESD Specification

Operating parameter valid for TA = – 40°C to + 150°C & VDD = + 4.5V to + 5.5V (unless specified otherwise).

Item Symbol Remarks Min Typ Max Unit

Micro-interrupt without reset

(1)

µI - - 0.1 µs

ESD Human Body Model

(2)

ESDHBM  2 kV

ESD Charged Device Model

(3)

ESDCDM  500 V

Table 7: EMC/ESD Specification

(1) If the digital regulated voltage drops below POR level, the ASIC will reset nearly immediately; this is a

necessity from a DFMEA point of view. The only way to make the ASIC immune for longer micro-

interrupts is to have external components (Rseries and Csupply) filtering these micro-interrupts for

the ASIC. Introducing an Rseries in the supply line will have a negative impact on ratiometricity.

(2) ESD HBM test performed on all pins according to JEDEC-22-A-114 standard.

(3) ESD CDM test performed on all pins according to AEC-Q100-011 standard.

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 9 of 18

Rev 001 Jun/11

6 EEPROM Mapping

6.1 EEPROM Description

All calibration parameters on the MLX90288 are stored in a 32 x 16bit non-volatile EEPROM.

The EEPROM parameters from the first 29 addresses are stored with triple redundancy, to correct if any

EEPROM bit would loose its content, by using majority voting. Consequently, an EEPROM word in this part

of EEPROM only holds the information of 5 calibration bits + 1 locking bit at index 15. The EEPROM word

stored at address 0 thus looks like this:

{LOCK0,PARAM[4:0],PARAM[4:0],PARAM[4:0]}

If bit index 15 is set, the EEPROM word is permanently locked, making it impossible to overwrite the given

address in PTC mode.

ID bits from the last 3 addresses are not stored with redundancy. The MLXID is not programmable in PTC

mode, hence guaranteeing traceability of the parts.

There are no constraints on the EEPROM readout in PTC mode.

6.2 Melexis Programmable Parameters

6.2.1 OSCTRIM [4:0]

 Will be calibrated at MLX production

 Trims oscillator frequency around 1 MHz

6.2.2 TRIMCTAT [4:0]

 Will be calibrated at MLX production

 Trims PTAT and CTAT to have both current sources at the same level at 25°C

 This calibration is necessary to allow correct TC1 trimming with a single measurement at either hot or

cold

 The calibration compensates mismatch in both PTAT and CTAT current sources

6.2.3 ITRIM[2:0]

 Will be calibrated at MLX production

 Trims the current reference used throughout the analog part to a predefined value

6.2.4 IPLATE[3:0]

 Will be calibrated at MLX production

 Defines the current through the Hall plates, impacting the total gain

6.2.5 TC1ST[6:0]

 Will be calibrated at MLX production

 Programming first order sensitivity temperature drift compensation

 Piecewise linear compensation between hot and cold temperatures = TC1ST

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 10 of 18

Rev 001 Jun/11

6.2.6 TC2ND[5:0]

 Will be calibrated at MLX production

 Programming piecewise linear sensitivity temperature drift compensation

 It is like an additional TC1 starting at 25 °C +/-30 °C

 Piecewise linear compensation for hot temperatures = TC1ST + TC2ND

6.2.7 TC3RD[2:0]

 Will be calibrated at MLX production

 Programming piecewise linear sensitivity temperature drift compensation

 It is like an additional TC1 starting at - 5 °C

 Piecewise linear compensation for cold temperatures = TC1ST + TC2ND + 2*TC3RD

6.2.8 PLATEPOL

 Will be calibrated at MLX production

 Changes the polarity of the Hall plates, inverting the sensing nodes

 Changing the plate polarity will make the MLX production calibration void

 Changing the polarity of the output signal is recommended to be achieved by changing the

FINEGAIN MSB

6.2.9 OFFCST[4:0]

 Will be calibrated at MLX production

 Residual offset calibration (at Integrator stage) to make sure that the ADC input is at half of the ADC

span when no field is applied

 Analog compensation, sign magnitude number

6.2.10 OFFDRIFT[5:0]

 Will be calibrated at MLX production

 Compensates linearly for residual offset temperature drift at the Integrator stage

 Analog compensation, sign magnitude number

6.2.11 ROUGHGAIN[2]

 Set by default to 1 by Melexis

6.2.12 XA[13:0]

 Will be calibrated at MLX production

 Gain-dependent offset, should not be modified after calibration

 Removes the residual offset of the ADC output when no field is applied

6.2.13 MLXID[31:0]

 Melexis ID bits for traceability

 Can no be overwritten in PTC mode

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 11 of 18

Rev 001 Jun/11

6.2.14 CRC[9:0]

 Standard CRC10 for data integrity

 Polynomial is x10+x9+x5+x4+x1+1

 EEPROM data is fed LSB first, per address (5bits, after majority voting) sequentially

 The CRC integrity will be preserved by the PSF software when using the PTC04. It could not be

changed manually.

6.3 End User Programmable Parameters

6.3.1 FAULTONCLIP

 Enable error reporting if ADC is clipping for 4 or more successive times

 The diagnostic side for this error is defined by DIAGINFAULT

6.3.2 DIAGINFAULT

 Defines to which side the output will go in case of an active error such as CRC fail or ADC clipping,

the latter only in case FAULTONCLIP is set

 The thresholds are specified under Section 5.6

6.3.3 FILTCODE[3:0]

 The digital IIR filter offers noise reduction and low pass filtering with programmable cut off frequency

FILTCODE[3:0] Cut-off frequency [Hz]

0 1114

1 557

2 279

3 139

4 70

5 35

6 17

7 9

8 4

Table 8: Filter cut-off frequencies

 For Filter code from 9 to 15, the rounding error becomes too high versus the resolution so those

codes are not to be used.

 This table only applies in case the temperature sensor is enabled, otherwise the cut-off frequency

should be multiplied by a factor of 2 since no more temperature ADC’s are performed anymore.

6.3.4 TEMPSENSOR

 Enables digital gain compensation over temperature (GainMag)

 Requires proper calibration of TEMPOFF and TEMPTC, as well as the SECONDORDERTC

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 12 of 18

Rev 001 Jun/11

6.3.5 SECONDORDERTC

 Chooses between linear gain compensation over temperature (cleared) and ROM based 2nd order

compensation (set) as described under Section 5.5

6.3.6 TEMPOFF[9:0]

 Will be calibrated at MLX production

 Defines the offset of the GainMag temperature compensation as described under Section 5.5

6.3.7 TEMPTC[7:0]

 Will be calibrated at MLX production

 Defines the slope of the GainMag temperature compensation as described under Section 5.5

6.3.8 CLPLow[8:0]

 Low clamp level programmability range from 0% to 50% of VDD

 Resolution is 1/4th of the outDAC resolution, i.e. 0.098% of VDD

6.3.9 CLPHigh[9:0]

 High clamp level programmability range from 0% to 100% of VDD

 Resolution is 1/4th of the outDAC resolution, i.e. 0.098% of VDD

6.3.10 ROUGHGAIN[1:0]

 These 2 bits control the gain of the MAIN AMPLIFIER

6.3.11 ATTN2P5

 Enables the attenuation in the analog chain by a factor of 4.5

6.3.12 FINEGAIN[12:0]

 Sign-magnitude 13bit digital fine gain (not 2’s complement!)

 The code 1024 (400h) corresponds to a gain of 1

 The code 5120 (1400h) corresponds to a gain of -1

 The MSB is a sign bit

 FINEGAIN range is therefore from -4095 (1FFFh) to +4095 (FFFh), which corresponds to a gain

range of -3.999 to +3.999

6.3.13 YA[13:0]

 Output offset programming, not gain dependent

 Defines the offset on the output in case no field is applied, inside a range of -200%Vdd to +200%

Vdd with the 12-bit resolution of the output DAC, i.e. 0.0244% of VDD

6.3.14 CSTID[15:0]

 Customer ID bits for traceability

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 13 of 18

Rev 001 Jun/11

7 Thermal Sensitivity Drift Compensation

7.1 Introduction

The embedded temperature sensor is digitized via the main path ADC before each analog amplified Hall

sensor voltage ADC in case TEMPSENSOR is enabled. This temperature information is used to generate

either an address for a ROM Look-up Table in order to obtain a quadratic temperature compensation

(SECONDORDERTC=1), or a value proportional to the temperature that allows a linear IC gain

compensation (SECONDORDERTC=0). Both compensations rely on the TEMPOFF and TEMPTC

parameters.

7.2 Linear Compensation (1st Order)

The conventional linear temperature compensation proves to be adequate for small application temperature

ranges and/or small magnet temperature coefficients. In such cases the error induced by the linear approach

are limited and prove to be good enough for the desired system sensitivity drift.

7.3 Quadratic Compensation (2nd Order)

This look up table is stored in ROM and contains the inverse transfer function of a specific magnetic flux

density over temperature. It should be used for magnets with temperature coefficients lower than -1500

ppm/degC, as is typically the case for plastic bonded magnets. Such magnet temperature coefficients can not

optimally be compensated by the linear method (see Application Note “Temperature Compensation for Linear

Programmable Hall effect sensors” on the Melexis webpage). By multiplying the output of the ROM table with

the amplified magnetic flux density signal in the digital domain, the magnet temperature drift is compensated

for, resulting in a (nearly) temperature independent sensitivity of the whole system (magnet + IC).

Figure 3: ROM table - 2nd order gain compensa tion

G ai n com pensa t i on

0.85

0.9

0.95

1.05

1.1

1.15

1.2

1.25

1.3

-50.00 -30.00 -10.00 10.00 30.00 50.00 70.00 90.00 110.00 130.00 150.00

Temperature [Degree]

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 14 of 18

Rev 001 Jun/11

The factory calibration performed by Melexis targets a specific magnet TC, which serves as accurate basis

for any delta calibration that should be performed when using a magnet with a different TC. This is performed

via the solver software provided by Melexis. The TEMPOFF parameter defines for which temperature the

gain compensation should be 1 (i.e. no compensation), whereas the TEMPTC parameter defines which

temperature range of the curve presented in Figure 3 is mapped onto the application temperature range.

Higher TEMPTC codes will use a bigger range, which corresponds to more gain compensation and thus

bigger magnet temperature coefficients.

7.4 Additional Information

Please refer to the application note “Thermal Sensitivity Drift Compensation on MLX90288” on

http://www.melexis.com (coming soon).

8 Standard information regarding manufacturability of Melexis products

with different soldering processes

Our products are classified and qualified regarding soldering technology, solderability and moisture sensitivity

level according to following test methods:

Reflow Soldering SMD’s (Surface Mount Devices)

 IPC/JEDEC J-STD-020

Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices

(classification reflow profiles according to table 5-2)

 EIA/JEDEC JESD22-A113

Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing

(reflow profiles according to table 2)

Wave Soldering SMD’s (Surface Mount Devices) and THD’s (Through Hole Devices)

 EN60749-20

Resistance of plastic- encapsulated SMD’s to combined effect of moisture and soldering heat

 EIA/JEDEC JESD22-B106 and EN60749-15

Resistance to soldering temperature for through-hole mounted devices

Solderability SMD’s (Surface Mount Dev ices) and THD’s (Through Hole Devices)

 EIA/JEDEC JESD22-B102 and EN60749-21

Solderability

For all soldering technologies deviating from above mentioned standard conditions (regarding peak

temperature, temperature gradient, temperature profile etc) additional classification and qualification tests

have to be agreed upon with Melexis.

The application of Wave Soldering for SMD’s is allowed only after consulting Melexis regarding assurance of

adhesive strength between device and board.

Melexis is contributing to global environmental conservation by promoting lead free solutions. For more

information on qualifications of RoHS compliant products (RoHS = European directive on the Restriction Of

the use of certain Hazardous Substances) please visit the quality page on our website:

http://www.melexis.com/quality.asp.

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 15 of 18

Rev 001 Jun/11

9 Package Specification

9.1 Package Dimensions

 Package Type: SOIC-8 (8-pin Small Outline Integrated Circuit Package)

 Die placement accuracy is ± 2 mils = ± 50 microns.

Figure 4: Package Dimensions

9.2 Package Marking

The package is labelled for traceability purposes, as depicted in Figure 5.

The first line is reserved for the project number at Melexis, 90288 followed by the ASIC silicon version. The

line below refers to the wafer fab. The bottom line is the date code indicating when the bare dies were

packaged at the assembly house. The black dot indicates the position of pin #1.

 MXXXXX = 5-digit lot number (M = wafer fab)

 YYWW = last 2 digits of the year, followed by the calendar week

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 16 of 18

Rev 001 Jun/11

1 4

Figure 5: Package markings

9.3 Pinout

Pin # Name Direction Type

1 VDD POWER Supply

2 VSS GND Ground

3 N/C / Not connected

4 OUT OUT/IN Analog + PTC communication

5 IDDQ OUT/IN Test

6 TESTOUT OUT Test

7 MUST0 IN Test

8 MUST1 IN Test

Table 9: Pinout

The pinout of the MLX90288 of the global pins is identical to that of the MLX90291 (PWM output), making

drop-in replacements possible for multi-protocol applications. Both ICs have differences in architecture, apart

from the protocol only.

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 17 of 18

Rev 001 Jun/11

10 Recommended Application Diagram

Figure 6: Recommended Application Diagram

The testpins (#5, #6, #7, #8) need to be grounded to avoid the risk of the chip going into testmode because of

RF/noise entering the test controller on these pins. The test input pins have an internal pull-down resistor.

The recommended application diagram is not a mandatory design guide. For better ESD and EMC

performance external components can be modified for as long as the electrical specifications are followed

under Section 5.2. For good EMC performance the components should be placed as close as possible to the

IC.

MLX90288

SMD Programmable Linear Hall Sensor IC

Featuring Analog Ratiometric Output

3901090288 Page 18 of 18

Rev 001 Jun/11

11 Disclaimer

Devices sold by Melexis are covered by the warranty and patent indemnification provisions appearing in its

Term of Sale. Melexis makes no warranty, express, statutory, implied, or by description regarding the

information set forth herein or regarding the freedom of the described devices from patent infringement.

Melexis reserves the right to change specifications and prices at any time and without notice. Therefore, prior

to designing this product into a system, it is necessary to check with Melexis for current information. This

product is intended for use in normal commercial applications. Applications requiring extended temperature

range, unusual environmental requirements, or high reliability applications, such as military, medical life-

support or life-sustaining equipment are specifically not recommended without additional processing by

Melexis for each application.

The information furnished by Melexis is believed to be correct and accurate. However, Melexis shall not be

liable to recipient or any third party for any damages, including but not limited to personal injury, property

damage, loss of profits, loss of use, interrupt of business or indirect, special incidental or consequential

damages, of any kind, in connection with or arising out of the furnishing, performance or use of the technical

data herein. No obligation or liability to recipient or any third party shall arise or flow out of Melexis’ rendering

of technical or other services.

For the latest version of this document, go to our website at

www.melexis.com

Or for additional information contact Melexis Direct:

Europe, Africa, Asia: America:

Phone: +32 1367 0495 Phone: +1 603 223 2362

E-mail: sales_europe@melexis.com E-mail: sales_usa@melexis.com

ISO/TS 16949 and ISO14001 Certified