MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output Features and Benefits Application Examples Surface mounted device Analog ratiometric output Measurement range from 6mT to 650mT bipolar full scale Digital IIR filtering for accurate bandwidth Offset trimming possible outside output range 1st and 2nd order magnet TC compensation Reverse polarity and overvoltage protection Extensive diagnostic features Rotary position sensor Linear position sensor Proximity sensor Ordering Information Part No. MLX90288 Temperature Code L (-40C to 150C) Package Code DC (SOIC-8) Option code - 1 Functional Diagram Figure 1: Block diagram of the MLX90288 3901090288 Rev 001 Page 1 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 2 Table of Contents 1 Functional Diagram ..........................................................................................................................................1 2 Table of Contents .............................................................................................................................................2 3 General Description ..........................................................................................................................................3 4 Glossary of Terms ............................................................................................................................................3 5 Specification .....................................................................................................................................................3 5.1 Absolute Maximum Ratings .......................................................................................................................3 5.2 Electrical Specification ...............................................................................................................................4 5.3 Timing Specification...................................................................................................................................5 5.4 Transfer Characteristic Specification .........................................................................................................5 5.5 Accuracy Specification...............................................................................................................................6 5.6 Diagnostic Specification.............................................................................................................................7 5.7 Startup, Undervoltage, Overvoltage and Reset Specification ...................................................................7 5.8 EMC/ESD Specification .............................................................................................................................8 6 EEPROM Mapping ...........................................................................................................................................9 6.1 EEPROM Description ................................................................................................................................9 6.2 Melexis Programmable Parameters ..........................................................................................................9 6.3 End User Programmable Parameters .....................................................................................................11 7 Thermal Sensitivity Drift Compensation .........................................................................................................13 7.1 Introduction ..............................................................................................................................................13 7.2 Linear Compensation (1st Order) .............................................................................................................13 7.3 Quadratic Compensation (2nd Order).......................................................................................................13 7.4 Additional Information ..............................................................................................................................14 8 Standard information regarding manufacturability of Melexis products with different soldering processes ..14 9 Package Specification ....................................................................................................................................15 9.1 Package Dimensions ...............................................................................................................................15 9.2 Package Marking .....................................................................................................................................15 9.3 Pinout .......................................................................................................................................................16 10 Recommended Application Diagram ............................................................................................................17 11 Disclaimer .....................................................................................................................................................18 3901090288 Rev 001 Page 2 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 3 General Description The MLX90288 is a cost-effective monolithic programmable linear Hall sensor which provides an analog ratiometric output signal proportional to the magnetic flux density that is applied perpendicular to the die surface. The MLX90288 is fully programmable (offset, sensitivity, clamping levels, magnet temperature drift, digital IIR filtering ...) through the connector, using the PTC-04 programming tool. It supports both linear and quadratic magnet TC compensation. 4 Glossary of Terms Tesla (T) TC IC SMD N/C ADC DAC PTC ECU POR INL DNL CRC ESD EMC OBD Unit for the magnetic flux density, 1 mT = 10 Gauss Temperature Coefficient (in ppm/C) Integrated Circuit Surface Mounted Device Not Connected Analog-to-Digital Converter Digital-to-Analog Converter Programming Through Connector Engine Control Unit Power on Reset Integral Non Linearity Differential Non Linearity Cyclic Redundancy Check Electro-Static Discharge Electro-Magnetic Compatibility On-Board Diagnostics 5 Specification 5.1 Absolute Maximum Ratings Item Symbol Supply Forward-Voltage VDDFWD Supply Forward-Current IDDFWD Supply Reverse-Voltage VDDREV Supply Reverse-Current Output Forward-Voltage Output Forward-Current Output Reverse-Voltage Output Reverse-Current Storage Temperature Range (Non Operating) Operating Ambient Temperature Range Junction Temperature Package Thermal Resistance Maximum Flux Density IDDREV VOUTFWD IOUTFWD VOUTREV IOUTREV TS TA TJ RTH BMAX Rating + 30 V (continuous) (Breakdown at + 40 V) + 20 mA - 14.5 V (continuous) (Breakdown at - 19 V) - 2 mA + 18 V - 60 mA - 14 V + 20 mA -55C to +165C -40C to +150C +165C 100 K/W 2T Table 1: Absolute Maximum Ratings 3901090288 Rev 001 Page 3 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output Exposing a part to absolute maximum ratings for extended periods of time may affect device reliability. 5.2 Electrical Specification Operating parameter valid for TA = - 40C to + 150C & VDD = + 4.5V to + 5.5V (unless specified otherwise). Item Supply Voltage Symbol VDD Supply Current IDD Regulated Voltage Reset Voltage Undervoltage Threshold Programming Voltage(1) Overvoltage Threshold(2) Load Resistance Range Load capacitor range Output Saturation Voltage(3) Output Current Limitation(4) Supply Current Limitation Output Diagnostic Band Leakage Current(5) Output Diagnostic Level VREG VPORRISE VPORFALL VUNDERRISE VUNDERFALL VPROGRISE VPROGFALL VOVER RPD CL VSATHI VSATLO IOUTLIMGND IOUTLIMVDD IVDDLIM IDIAGLO VDIAGLO Remark Guaranteed spec operation Worst case (min RPD, max VDD) Internal voltage Output is high impedant for VPOR < VDD < VUNDER Operating if VDD > VUNDER Device not locked Disconnect VPROT from VDD Pull-down to GND Between OUT and GND Including RPD Including RPD Output amplifier sourcing strength Output amplifier sinking strength Same condition as above Leakage current over TA VDD=5V Leakage current over TA and VDD span Min 4.5 Typ 5 Max 5.5 Unit V - 8.8 10 mA 3.0 2.5 2.4 3.4 3.3 6.2 6.1 8.4 8 47 96 0 3.3 3.6 3.4 3.3 4.4 4.3 7.2 7.1 14 330 1000 100 2 V V V V V V V V k nF %VDD %VDD 2 5 8 mA 2 5 8 mA 18 mA 500 nA RPD x IDIAGLO V 5 10 Table 2: Electrical Specification (1) The programming voltage defines the threshold at which the ASIC goes into PTC mode, where the output pin becomes bidirectional. Write access is eventually defined by the locking bits as described in Section 6.1 (2) The overvoltage threshold will disconnect all internal supplies (Vana, Vdig & Vprot) from VDD; the output becomes high impedant. (3) The saturation voltage is the rail voltage the output amplifier can reach actively with RPD connected. (4) The maximum current the output stage can deliver to keep its DC value, in case the output is pulled to one of the rails by means of an external power supply, while VDD = 5V. (5) The leakage current is in fact the current sourced by the output in case of an OBD detection (broken ground), where the output goes into high-Z mode. For better contacting at the connectors over lifetime and bigger rail-to-rail operation, the smaller pull-down resistors from this specification are recommended at ECU side. 3901090288 Rev 001 Page 4 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 5.3 Timing Specification Operating parameter valid for TA = - 40C to + 150C & VDD = + 4.5V to + 5.5V (unless specified otherwise). Item Power Supply Slew Rate Startup time(1) Main Oscillator Frequency Conversion Rate Symbol VDDSR tSTARTUP FOSC tCONV fCONV (2) Programmable Filtering Output Amplifier Rise Time (10%-90%)(3) Output Amplifier Fall Time (90%-10%)(3) BW tFALLPP Calibration Time(4) tCALIB tRISEPP Remark External supply VDD Tolerance 10% Acquisition of Hall and Temperature signals (no digital filtering) Tempsensor enabled RL = 8 k to Ground CL = 330 nF to Ground RL = 330 k to Ground CL = 330 nF to Ground EE Full Erase + Write EE Full Read RAM Write Min 5e-6 200 900 130 6.33 Typ 500 1000 144 Max 5 800 1100 158 Unit V/s s kHz s 7 7.7 kHz 1.114 kHz 0.004 300 s 200 s 6 180 3 ms ms ms Table 3: Timing Specification (1) Startup time is defined as the time between crossing the POR level and having the first DAC output update. It includes loading of the parameters from EEPROM, checking the CRC validity, initializations and the signal latency between the first Hall plate acquisition and the DAC output update. (2) Filtering is programmable with the FILTCODE parameter in EEPROM. The filter consists of an IIR filter in the digital. For more details about the corresponding bandwidths, see Section 6.3.3. (3) Rise and fall times are measured for worst case conditions, hence the difference in Rload for both parameters. These specifications are only defined by the output amplifier and its load. The output amplifier (Gain=2) is given a step response at the input from 5%VDD to 45%VDD and the rise/fall times are measured as the time between reaching 10% and 90% of the step response DC output voltages (10%VDD to 90%VDD). (4) Calibration times measured at room temperature with PTC-04 and DB-HALL03 daughterboard, FIR090288AAMLX firmware loaded onto the PTC-04 and on a MLX90288 in the recommended application diagram from Section 10 at 10kbit/s. 5.4 Transfer Characteristic Specification Operating parameter valid for TA = - 40C to + 150C & VDD = + 4.5V to + 5.5V (unless specified otherwise). Item Output Clamping Range Output Quiescent (Offset) Voltage Range Sensitivity Range Symbol CLAMPLO CLAMPHI VOQ Remark 9 bits(1) 10 bits (1) 14 bits (YA setting) (1) (1) S RG[2] = 1 (2) For full-scale output Min 0 0 Typ Max 50 100 Unit %VDD %VDD - 200 200 %VDD 0.04 0.4 %VDD/G Table 4: Transfer Characteristic Specification (1) Please refer to Section 6.2 for more detailed information. (2) The full-scale output corresponds to 100%Vdd output range. This corresponds to 100% of the ADC range when FINEGAIN is set to 1 (1024LSB) in a bipolar application. 3901090288 Rev 001 Page 5 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 5.5 Accuracy Specification Operating parameter valid for TA = - 40C to + 150C & VDD = + 4.5V to + 5.5V (unless specified otherwise). Item Output DAC Resolution Output DAC Linearity Ratiometric Error(1) Output Noise(2) Symbol LSBDAC DNLDAC INLDAC OUTratiom OUTnoise Thermal Output Quiescent (Offset) Drift VOQ Thermal Sensitivity Drift(3) T S Sensitivity Thermal Hysteresis H S T Remark 12 bits with TEMPTC=0 with TEMPTC=128 RG = 4, FG = 800 FILTCODE = 4 RG = 7, FG = 800 FILTCODE = 4 RG = 4, FG = 4095 FILTCODE = 4 RG = 7, FG = 4095 FILTCODE = 4 RG = 4 RG = 5 RG = 6 RG = 7 No magnet TC Using 1st and 2nd order magnet TC After full thermal excursion Min Typ 0.0244 +1 +2 + 0.1 + 0.2 Unit %VDD LSBDAC LSBDAC %VDD %VDD 0.12 0.18 mVRMS 0.13 0.2 mVRMS 0.75 1.1 mVRMS 1 1.5 mVRMS - 10 - 10 - 15 - 20 - 150 0 + 10 + 10 + 15 + 20 + 150 LSBDAC LSBDAC LSBDAC LSBDAC ppm/C - 200 0 + 200 ppm/C - 0.5 0.2 + 0.5 % -1 -2 - 0.1 - 0.2 Max Table 5: Accuracy Specification (1) Ratiometric performance of the IC is measured as a difference in output voltage (expressed as %VDD) between the nominal case with VDD = 5V and the limits of the supply ratiometric operating range (4.5V and 5.5V). The difference between TEMPTC = 0 (or TEMPSENSOR disabled altogether) and TEMPTC = 128 originates in the fact that the on-chip temperature is also a function of the supply voltage. Since the TEMPTC changes the gain of the IC to compensate for the magnet TC, and it relies on the fact that the on-chip temperature is the same as the magnet temperature, an extra error occurs compared to TEMPTC = 0 case. (2) The noise measurements are performed on the recommended application diagram depicted under Section 10, with a supply voltage of 5V at room temperature. Increased capacitance values compared to the recommended application diagram, contribute to lower output noise. For peak-topeak values, the RMS value is typically multiplied by a factor of 6. (3) The Sensitivity Thermal Drift is within these boundaries for all ICs with the default setting for gain compensation i.e. fixed to 1, which is obtained by setting TEMPTC to 0, but leaving the TEMPSENSOR bit set (see Section 7). If the value is not fixed to 1, the sensitivity of the IC will exhibit a sensitivity thermal drift curve such as the one shown in Figure 3 (if SECONDORDERTC is set) or with a linear temperature coefficient (if SECONDORDERTC is cleared) depending on the setting of TEMPTC, but 150ppm/C. The total system sensitivity drift is specified as 200ppm/C to cover resolution errors and non-linearities. 3901090288 Rev 001 Page 6 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 5.6 Diagnostic Specification Operating rating valid for TA = - 40C to + 85C & VDD = + 4.5V to + 5.5V (unless specified otherwise). Item ADC Clipping Signaling Symbol (1) ADC Clipping Criterion(1) DIAGCLIP NCLIP CRC Fail Signaling DIAGPAR CRC Fail Criterion NCRC Broken VSS(2) Broken VDD(2) VOUTbrVSS VOUTbrVDD Remarks DIAGINFAULT = 0 DIAGINFAULT = 1 ADC clipping count before Diagnostic is set DIAGINFAULT = 0 DIAGINFAULT = 1 CRC Fail count before Diagnostic is set Over RPD range Over RPD range Min VSATHI Typ - Max VSATLO - Unit %VDD %VDD - 4 - Count VSATHI - VSATLO - %VDD %VDD - 3 - Count - - VDIAGLO VDIAGLO %VDD %VDD Table 6: Diagnostic Specification (1) ADC clipping is only flagged if the FAULTONCLIP bit in EEPROM is set. If the bit is cleared, the ADC will clamp at either the maximum code or the minimum code, depending on the clipping condition. Reporting after 4 sequential clipping conditions is required for an EMC robust design. Clipping reporting does not apply to ADC values of the temperature signal. (2) Diagnostics that are the result of a passive settling because the output stage becomes high impedant (such as broken wire) are governed by the RC time constant of the capacitive load on the output and the RPD resistor at ECU side. The OBD detection time is negligible in comparison to the settling time in case of a broken wire. The settling time should be taken as 4 times the RC time constant. E.g. with a load of 330nF and 330kOhm, the RC time constant equals 109ms. Settling time then corresponds to 4 RC time constants, i.e. 436ms. 5.7 Startup, Undervoltage, Overvoltage and Reset Specification During power-up (supply rising from 0V upwards) the MLX90288 remains in a zone where the output is undefined (grey triangular area in the plot) because there is no active circuitry putting the output stage in a specific condition. Most likely the output remains close to the low rail because of the passive external pulldown, but it can not be predicted what happens exactly inside the IC at this point. This is also depicted in the signal waveforms of Figure 2. The POR phase is the phase where the supply is still below VPORRISE, but above the undefined region. In this case the digital is in a reset state, which puts all flip-flops in a known state, and the output is high impedant. Due to the external pull-down resistive load, the output is at the low rail. When the supply rises above the VPORRISE threshold (which has built-in hysteresis: for the falling edge, VPORFALL), an initialization occurs which includes loading all EEPROM settings into RAM. After this initialization phase, the chip will start its FSM program and provide a valid output signal, for as long as the supply voltage is above the VUNDERRISE threshold (which has built-in hysteresis: for the falling edge, VUNDERFALL). If the supply is below this threshold, the output remains in high impedant state, corresponding to an output voltage at the low rail. Whenever the MLX90288 goes from normal operation to undervoltage or via undervoltage to reset state, and vice versa, the output has a settling time which is a function of both the output load and the driving capability. On top of this, there is a startup time (tSTARTUP) in case the chip comes out of reset. 3901090288 Rev 001 Page 7 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output Vdd Vunderrise Vunderfall Vporrise Vporfall time Vout tSTARTUP INIT undefined time tSTARTUP ratiometric normal operation (RNO) underV (uV) RNO POR POR INIT uV uV Figure 2: Operating, undervoltage and reset functionality In case the supply is raised above the VPROGRISE threshold (which has built-in hysteresis: for the falling edge, VPROGFALL), but below the VOVER threshold, the IC goes in programming mode: the output becomes high impedant and after proper commands coming from the programming unit (PTC04), the IC can respond on the output pin as well. The communication protocol on the output (PTC-04 communication) is bi-directional. If the supply is higher than the VOVER threshold, the internal regulated supply is disconnected from the external supply, as are most blocks of the IC. A reset will be the result when the supply is restored. 5.8 EMC/ESD Specification Operating parameter valid for TA = - 40C to + 150C & VDD = + 4.5V to + 5.5V (unless specified otherwise). Item Micro-interrupt without reset(1) ESD Human Body Model(2) ESD Charged Device Model(3) Symbol I ESDHBM ESDCDM Remarks Min - Typ 2 500 Max 0.1 Unit s kV V Table 7: EMC/ESD Specification (1) If the digital regulated voltage drops below POR level, the ASIC will reset nearly immediately; this is a necessity from a DFMEA point of view. The only way to make the ASIC immune for longer microinterrupts is to have external components (Rseries and Csupply) filtering these micro-interrupts for the ASIC. Introducing an Rseries in the supply line will have a negative impact on ratiometricity. (2) ESD HBM test performed on all pins according to JEDEC-22-A-114 standard. (3) ESD CDM test performed on all pins according to AEC-Q100-011 standard. 3901090288 Rev 001 Page 8 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 6 EEPROM Mapping 6.1 EEPROM Description All calibration parameters on the MLX90288 are stored in a 32 x 16bit non-volatile EEPROM. The EEPROM parameters from the first 29 addresses are stored with triple redundancy, to correct if any EEPROM bit would loose its content, by using majority voting. Consequently, an EEPROM word in this part of EEPROM only holds the information of 5 calibration bits + 1 locking bit at index 15. The EEPROM word stored at address 0 thus looks like this: {LOCK0,PARAM[4:0],PARAM[4:0],PARAM[4:0]} If bit index 15 is set, the EEPROM word is permanently locked, making it impossible to overwrite the given address in PTC mode. ID bits from the last 3 addresses are not stored with redundancy. The MLXID is not programmable in PTC mode, hence guaranteeing traceability of the parts. There are no constraints on the EEPROM readout in PTC mode. 6.2 Melexis Programmable Parameters 6.2.1 OSCTRIM [4:0] Will be calibrated at MLX production Trims oscillator frequency around 1 MHz 6.2.2 TRIMCTAT [4:0] Will be calibrated at MLX production Trims PTAT and CTAT to have both current sources at the same level at 25C This calibration is necessary to allow correct TC1 trimming with a single measurement at either hot or cold The calibration compensates mismatch in both PTAT and CTAT current sources 6.2.3 ITRIM[2:0] Will be calibrated at MLX production Trims the current reference used throughout the analog part to a predefined value 6.2.4 IPLATE[3:0] Will be calibrated at MLX production Defines the current through the Hall plates, impacting the total gain 6.2.5 TC1ST[6:0] Will be calibrated at MLX production Programming first order sensitivity temperature drift compensation Piecewise linear compensation between hot and cold temperatures = TC1ST 3901090288 Rev 001 Page 9 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 6.2.6 TC2ND[5:0] Will be calibrated at MLX production Programming piecewise linear sensitivity temperature drift compensation It is like an additional TC1 starting at 25 C +/-30 C Piecewise linear compensation for hot temperatures = TC1ST + TC2ND 6.2.7 TC3RD[2:0] Will be calibrated at MLX production Programming piecewise linear sensitivity temperature drift compensation It is like an additional TC1 starting at - 5 C Piecewise linear compensation for cold temperatures = TC1ST + TC2ND + 2*TC3RD 6.2.8 PLATEPOL Will be calibrated at MLX production Changes the polarity of the Hall plates, inverting the sensing nodes Changing the plate polarity will make the MLX production calibration void Changing the polarity of the output signal is recommended to be achieved by changing the FINEGAIN MSB 6.2.9 OFFCST[4:0] Will be calibrated at MLX production Residual offset calibration (at Integrator stage) to make sure that the ADC input is at half of the ADC span when no field is applied Analog compensation, sign magnitude number 6.2.10 OFFDRIFT[5:0] Will be calibrated at MLX production Compensates linearly for residual offset temperature drift at the Integrator stage Analog compensation, sign magnitude number 6.2.11 ROUGHGAIN[2] Set by default to 1 by Melexis 6.2.12 XA[13:0] Will be calibrated at MLX production Gain-dependent offset, should not be modified after calibration Removes the residual offset of the ADC output when no field is applied 6.2.13 MLXID[31:0] Melexis ID bits for traceability Can no be overwritten in PTC mode 3901090288 Rev 001 Page 10 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 6.2.14 CRC[9:0] Standard CRC10 for data integrity Polynomial is x10+x9+x5+x4+x1+1 EEPROM data is fed LSB first, per address (5bits, after majority voting) sequentially The CRC integrity will be preserved by the PSF software when using the PTC04. It could not be changed manually. 6.3 End User Programmable Parameters 6.3.1 FAULTONCLIP Enable error reporting if ADC is clipping for 4 or more successive times The diagnostic side for this error is defined by DIAGINFAULT 6.3.2 DIAGINFAULT Defines to which side the output will go in case of an active error such as CRC fail or ADC clipping, the latter only in case FAULTONCLIP is set The thresholds are specified under Section 5.6 6.3.3 FILTCODE[3:0] The digital IIR filter offers noise reduction and low pass filtering with programmable cut off frequency FILTCODE[3:0] 0 1 2 3 4 5 6 7 8 Cut-off frequency [Hz] 1114 557 279 139 70 35 17 9 4 Table 8: Filter cut-off frequencies For Filter code from 9 to 15, the rounding error becomes too high versus the resolution so those codes are not to be used. This table only applies in case the temperature sensor is enabled, otherwise the cut-off frequency should be multiplied by a factor of 2 since no more temperature ADC's are performed anymore. 6.3.4 TEMPSENSOR Enables digital gain compensation over temperature (GainMag) Requires proper calibration of TEMPOFF and TEMPTC, as well as the SECONDORDERTC 3901090288 Rev 001 Page 11 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 6.3.5 SECONDORDERTC Chooses between linear gain compensation over temperature (cleared) and ROM based 2nd order compensation (set) as described under Section 5.5 6.3.6 TEMPOFF[9:0] Will be calibrated at MLX production Defines the offset of the GainMag temperature compensation as described under Section 5.5 6.3.7 TEMPTC[7:0] Will be calibrated at MLX production Defines the slope of the GainMag temperature compensation as described under Section 5.5 6.3.8 CLPLow[8:0] Low clamp level programmability range from 0% to 50% of VDD Resolution is 1/4th of the outDAC resolution, i.e. 0.098% of VDD 6.3.9 CLPHigh[9:0] High clamp level programmability range from 0% to 100% of VDD Resolution is 1/4th of the outDAC resolution, i.e. 0.098% of VDD 6.3.10 ROUGHGAIN[1:0] These 2 bits control the gain of the MAIN AMPLIFIER 6.3.11 ATTN2P5 Enables the attenuation in the analog chain by a factor of 4.5 6.3.12 FINEGAIN[12:0] Sign-magnitude 13bit digital fine gain (not 2's complement!) The code 1024 (400h) corresponds to a gain of 1 The code 5120 (1400h) corresponds to a gain of -1 The MSB is a sign bit FINEGAIN range is therefore from -4095 (1FFFh) to +4095 (FFFh), which corresponds to a gain range of -3.999 to +3.999 6.3.13 YA[13:0] Output offset programming, not gain dependent Defines the offset on the output in case no field is applied, inside a range of -200%Vdd to +200% Vdd with the 12-bit resolution of the output DAC, i.e. 0.0244% of VDD 6.3.14 CSTID[15:0] Customer ID bits for traceability 3901090288 Rev 001 Page 12 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 7 Thermal Sensitivity Drift Compensation 7.1 Introduction The embedded temperature sensor is digitized via the main path ADC before each analog amplified Hall sensor voltage ADC in case TEMPSENSOR is enabled. This temperature information is used to generate either an address for a ROM Look-up Table in order to obtain a quadratic temperature compensation (SECONDORDERTC=1), or a value proportional to the temperature that allows a linear IC gain compensation (SECONDORDERTC=0). Both compensations rely on the TEMPOFF and TEMPTC parameters. 7.2 Linear Compensation (1st Order) The conventional linear temperature compensation proves to be adequate for small application temperature ranges and/or small magnet temperature coefficients. In such cases the error induced by the linear approach are limited and prove to be good enough for the desired system sensitivity drift. 7.3 Quadratic Compensation (2nd Order) This look up table is stored in ROM and contains the inverse transfer function of a specific magnetic flux density over temperature. It should be used for magnets with temperature coefficients lower than -1500 ppm/degC, as is typically the case for plastic bonded magnets. Such magnet temperature coefficients can not optimally be compensated by the linear method (see Application Note "Temperature Compensation for Linear Programmable Hall effect sensors" on the Melexis webpage). By multiplying the output of the ROM table with the amplified magnetic flux density signal in the digital domain, the magnet temperature drift is compensated for, resulting in a (nearly) temperature independent sensitivity of the whole system (magnet + IC). Gain compensation 1.3 1.25 1.2 1.15 1.1 1.05 1 0.95 0.9 -50.00 -30.00 0.85 -10.00 10.00 30.00 50.00 70.00 90.00 110.00 130.00 150.00 Temperature [Degree] Figure 3: ROM table - 2nd order gain compensation 3901090288 Rev 001 Page 13 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output The factory calibration performed by Melexis targets a specific magnet TC, which serves as accurate basis for any delta calibration that should be performed when using a magnet with a different TC. This is performed via the solver software provided by Melexis. The TEMPOFF parameter defines for which temperature the gain compensation should be 1 (i.e. no compensation), whereas the TEMPTC parameter defines which temperature range of the curve presented in Figure 3 is mapped onto the application temperature range. Higher TEMPTC codes will use a bigger range, which corresponds to more gain compensation and thus bigger magnet temperature coefficients. 7.4 Additional Information Please refer to the application note "Thermal Sensitivity Drift Compensation on MLX90288" on http://www.melexis.com (coming soon). 8 Standard information regarding manufacturability of Melexis products with different soldering processes Our products are classified and qualified regarding soldering technology, solderability and moisture sensitivity level according to following test methods: Reflow Soldering SMD's (Surface Mount Devices) IPC/JEDEC J-STD-020 Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices (classification reflow profiles according to table 5-2) EIA/JEDEC JESD22-A113 Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing (reflow profiles according to table 2) Wave Soldering SMD's (Surface Mount Devices) and THD's (Through Hole Devices) EN60749-20 Resistance of plastic- encapsulated SMD's to combined effect of moisture and soldering heat EIA/JEDEC JESD22-B106 and EN60749-15 Resistance to soldering temperature for through-hole mounted devices Solderability SMD's (Surface Mount Devices) and THD's (Through Hole Devices) EIA/JEDEC JESD22-B102 and EN60749-21 Solderability For all soldering technologies deviating from above mentioned standard conditions (regarding peak temperature, temperature gradient, temperature profile etc) additional classification and qualification tests have to be agreed upon with Melexis. The application of Wave Soldering for SMD's is allowed only after consulting Melexis regarding assurance of adhesive strength between device and board. Melexis is contributing to global environmental conservation by promoting lead free solutions. For more information on qualifications of RoHS compliant products (RoHS = European directive on the Restriction Of the use of certain Hazardous Substances) please visit the quality page on our website: http://www.melexis.com/quality.asp. 3901090288 Rev 001 Page 14 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 9 Package Specification 9.1 Package Dimensions Package Type: SOIC-8 (8-pin Small Outline Integrated Circuit Package) Die placement accuracy is 2 mils = 50 microns. Figure 4: Package Dimensions 9.2 Package Marking The package is labelled for traceability purposes, as depicted in Figure 5. The first line is reserved for the project number at Melexis, 90288 followed by the ASIC silicon version. The line below refers to the wafer fab. The bottom line is the date code indicating when the bare dies were packaged at the assembly house. The black dot indicates the position of pin #1. MXXXXX YYWW 3901090288 Rev 001 = = 5-digit lot number (M = wafer fab) last 2 digits of the year, followed by the calendar week Page 15 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 8 5 1 4 Figure 5: Package markings 9.3 Pinout Pin # 1 2 3 4 5 6 7 8 Name VDD VSS N/C OUT IDDQ TESTOUT MUST0 MUST1 Direction POWER GND / OUT/IN OUT/IN OUT IN IN Type Supply Ground Not connected Analog + PTC communication Test Test Test Test Table 9: Pinout The pinout of the MLX90288 of the global pins is identical to that of the MLX90291 (PWM output), making drop-in replacements possible for multi-protocol applications. Both ICs have differences in architecture, apart from the protocol only. 3901090288 Rev 001 Page 16 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 10 Recommended Application Diagram Figure 6: Recommended Application Diagram The testpins (#5, #6, #7, #8) need to be grounded to avoid the risk of the chip going into testmode because of RF/noise entering the test controller on these pins. The test input pins have an internal pull-down resistor. The recommended application diagram is not a mandatory design guide. For better ESD and EMC performance external components can be modified for as long as the electrical specifications are followed under Section 5.2. For good EMC performance the components should be placed as close as possible to the IC. 3901090288 Rev 001 Page 17 of 18 Jun/11 MLX90288 SMD Programmable Linear Hall Sensor IC Featuring Analog Ratiometric Output 11 Disclaimer Devices sold by Melexis are covered by the warranty and patent indemnification provisions appearing in its Term of Sale. Melexis makes no warranty, express, statutory, implied, or by description regarding the information set forth herein or regarding the freedom of the described devices from patent infringement. Melexis reserves the right to change specifications and prices at any time and without notice. Therefore, prior to designing this product into a system, it is necessary to check with Melexis for current information. This product is intended for use in normal commercial applications. Applications requiring extended temperature range, unusual environmental requirements, or high reliability applications, such as military, medical lifesupport or life-sustaining equipment are specifically not recommended without additional processing by Melexis for each application. The information furnished by Melexis is believed to be correct and accurate. However, Melexis shall not be liable to recipient or any third party for any damages, including but not limited to personal injury, property damage, loss of profits, loss of use, interrupt of business or indirect, special incidental or consequential damages, of any kind, in connection with or arising out of the furnishing, performance or use of the technical data herein. No obligation or liability to recipient or any third party shall arise or flow out of Melexis' rendering of technical or other services. (c) 2011 Melexis NV. All rights reserved. For the latest version of this document, go to our website at www.melexis.com Or for additional information contact Melexis Direct: Europe, Africa, Asia: Phone: +32 1367 0495 E-mail: sales_europe@melexis.com America: Phone: +1 603 223 2362 E-mail: sales_usa@melexis.com ISO/TS 16949 and ISO14001 Certified 3901090288 Rev 001 Page 18 of 18 Jun/11