IKW15T120
TrenchStop®Series
IFAG IPC TD VLS 8 Rev. 2.4 12.06.2013
E,SWITCHING ENERGY LOSSES
Ets*
Eoff
*) Eon and Etsinclude losses
due to diode recovery
Eon*
E,SWITCHING ENERGY LOSSES
0 mJ
1 mJ
2 mJ
3 mJ
4 mJ
5 mJ Ets*
Eon*
*) Eon and Ets include losses
due to diode recovery
Eoff
IC,COLLECTOR CURRENT RG,GATE RESISTOR
Typical switching energy losses
as a function of collector current
(inductive load, TJ=150°C,
VCE=600V, VGE=0/15V, RG=56Ω,
Dynamic test circuit in Figure E)
Figure 14. Typical switching energy losses
as a function of gate resistor
(inductive load, TJ=150°C,
VCE=600V, VGE=0/15V, IC=15A,
Dynamic test circuit in Figure E)
E,SWITCHING ENERGY LOSSES
50°C 100°C 150°C
Ets*
Eon*
*) Eon and Ets include losses
due to diode recovery
Eoff
E,SWITCHING ENERGY LOSSES
400V 500V 600V 700V 800V
0mJ
1mJ
2mJ
3mJ
4mJ
5mJ
6mJ
Ets*
Eon*
*) Eon and Ets include losses
due to diode recovery
Eoff
TJ,JUNCTION TEMPERATURE VCE,COLLECTOR-EMITTER VOLTAGE
Typical switching energy losses
as a function of junction
temperature
(inductive load, VCE=600V,
VGE=0/15V, IC=15A, RG=56Ω,
Dynamic test circuit in Figure E)
Typical switching energy losses
as a function of collector emitter
voltage
(inductive load, TJ=150°C,
VGE=0/15V, IC=15A, RG=56Ω,
Dynamic test circuit in Figure E)