PD - 97049B IRF5210SPbF IRF5210LPbF HEXFET(R) Power MOSFET l l l l l l l l Advanced Process Technology Ultra Low On-Resistance 150C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax Some Parameters are Different from IRF5210S/L P-Channel Lead-Free D VDSS = -100V RDS(on) = 60m G ID = -38A S D Description Features of this design are a 150C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in a wide variety of other applications. D G D S G D2Pak IRF5210SPbF D S TO-262 IRF5210LPbF G D S Gate Drain Source Absolute Maximum Ratings Max. Units Continuous Drain Current, VGS @ -10V Parameter -38 A ID @ TC = 100C Continuous Drain Current, VGS @ -10V -24 IDM Pulsed Drain Current Maximum Power Dissipation -140 PD @TA = 25C PD @TC = 25C Maximum Power Dissipation 170 Linear Derating Factor Gate-to-Source Voltage 1.3 20 W/C V 120 mJ ID @ TC = 25C VGS EAS c IAR Single Pulse Avalanche Energy Avalanche Current EAR Repetitive Avalanche Energy dv/dt TJ Operating Junction and TSTG Storage Temperature Range c 3.1 d c Peak Diode Recovery dv/dt e Parameter Junction-to-Case RJA Junction-to-Ambient (PCB Mount, steady state) www.irf.com -23 A 17 mJ -7.4 -55 to + 150 V/ns C 300 (1.6mm from case ) Soldering Temperature, for 10 seconds Thermal Resistance RJC W g Typ. Max. Units --- 0.75 40 C/W --- 1 08/04/09 IRF5210S/LPbF Electrical Characteristics @ TJ = 25C (unless otherwise specified) Parameter V(BR)DSS VDSS/TJ RDS(on) VGS(th) Min. Typ. Max. Units Qg Qgs Qgd td(on) tr td(off) tf LD Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Internal Drain Inductance -100 --- --- -2.0 9.5 --- --- --- --- --- --- --- --- --- --- --- --- --- -0.11 --- --- --- --- --- --- --- 150 22 81 14 63 72 55 4.5 --- --- 60 -4.0 --- -50 -250 100 -100 230 33 120 --- --- --- --- --- LS Internal Source Inductance --- 7.5 --- Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance --- --- --- 2780 800 430 --- --- --- gfs IDSS IGSS Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Drain-to-Source Leakage Current Conditions V VGS = 0V, ID = -250A V/C Reference to 25C, ID = -1mA m VGS = 10V, ID = -38A V VDS = VGS, ID = -250A S VDS = -50V, ID = -23A A VDS = -100V, VGS = 0V VDS = -80V, VGS = 0V, TJ = 125C nA VGS = 20V VGS = -20V nC ID = -23A VDS = -80V VGS = -10V ns VDD = -50V ID = -23A RG = 2.4 VGS = -10V nH Between lead, f f f 6mm (0.25in.) from package pF and center of die contact VGS = 0V VDS = -25V = 1.0MHz, See Fig. 5 Source-Drain Ratings and Characteristics Parameter Min. Typ. Max. Units IS Continuous Source Current --- --- -38 ISM (Body Diode) Pulsed Source Current --- --- -140 VSD trr Qrr ton (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time --- --- --- --- 170 1180 -1.6 260 1770 c Notes: Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11) Starting TJ = 25C, L = 0.46mH RG = 25, IAS = -23A. (See Figure 12) ISD -23A, di/dt -650A/s, VDD V(BR)DSS, TJ 150C. 2 Conditions MOSFET symbol A V ns nC showing the integral reverse p-n junction diode. TJ = 25C, IS = -23A, VGS = 0V TJ = 25C, IF = -23A, VDD = -25V di/dt = -100A/s f f Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Pulse width 300s; duty cycle 2%. When mounted on 1" square PCB (FR-4or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994. www.irf.com IRF5210S/LPbF 1000 1000 100 BOTTOM TOP -ID, Drain-to-Source Current (A) -ID, Drain-to-Source Current (A) TOP VGS -15V -10V -8.0V -7.0V -6.0V -5.5V -5.0V -4.5V 100 10 -4.5V 1 60s PULSE WIDTH BOTTOM VGS -15V -10V -8.0V -7.0V -6.0V -5.5V -5.0V -4.5V 10 -4.5V 1 60s PULSE WIDTH Tj = 25C Tj = 150C 0.1 0.1 0.1 1 10 0.1 100 10 100 -V DS, Drain-to-Source Voltage (V) -V DS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 1000 2.0 RDS(on) , Drain-to-Source On Resistance (Normalized) -I D, Drain-to-Source Current (A) 1 T J = 25C 100 T J = 150C 10 1 VDS = -50V 60s PULSE WIDTH 0.1 ID = -38A VGS = -10V 1.5 1.0 0.5 2 4 6 8 10 12 -VGS, Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com 14 -60 -40 -20 0 20 40 60 80 100120140160180 T J , Junction Temperature (C) Fig 4. Normalized On-Resistance vs. Temperature 3 IRF5210S/LPbF 100000 12.0 VGS = 0V, f = 1 MHZ C iss = C gs + C gd, C ds SHORTED ID= -23A -V GS, Gate-to-Source Voltage (V) C rss = C gd C, Capacitance(pF) C oss = C ds + C gd 10000 Ciss Coss 1000 Crss VDS= -80V VDS= -50V 10.0 VDS= -20V 8.0 6.0 4.0 2.0 100 0.0 1 10 100 0 -VDS, Drain-to-Source Voltage (V) 75 100 125 150 Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage 1000 1000 -I D, Drain-to-Source Current (A) -I SD, Reverse Drain Current (A) 50 QG, Total Gate Charge (nC) Fig 5. Typical Capacitance vs. Drain-to-Source Voltage 100 T J = 150C OPERATION IN THIS AREA LIMITED BY R DS(on) 100 T J = 25C 10 1 100sec 10 0.1 1msec Tc = 25C Tj = 150C Single Pulse VGS = 0V 10msec 1 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 -VSD, Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 25 1.8 1 10 100 1000 -VDS, Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRF5210S/LPbF RD VDS 40 V GS D.U.T. RG 35 - -I D, Drain Current (A) + VDD 30 -10V 25 Pulse Width 1 s Duty Factor 0.1 % 20 Fig 10a. Switching Time Test Circuit 15 10 td(on) 5 tr t d(off) tf VGS 10% 0 25 50 75 100 125 150 T C , Case Temperature (C) 90% VDS Fig 10b. Switching Time Waveforms Fig 9. Maximum Drain Current vs. Case Temperature 1 Thermal Response ( Z thJC ) D = 0.50 0.20 0.1 0.10 J 0.05 R1 R1 J 1 0.02 0.01 0.01 R2 R2 1 2 2 Ci= i/Ri Ci= i/Ri 1E-005 0.0001 Ri (C/W) C 3 3 (sec) 0.128309 0.000069 0.377663 0.001772 0.244513 0.010024 SINGLE PULSE ( THERMAL RESPONSE ) 0.001 1E-006 R3 R3 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRF5210S/LPbF L VDS IAS -20V tp VDD A DRIVER 0.01 15V Fig 12a. Unclamped Inductive Test Circuit I AS EAS , Single Pulse Avalanche Energy (mJ) 500 D.U.T RG ID -8.7A -14A BOTTOM -23A 450 TOP 400 350 300 250 200 150 100 50 0 25 50 75 100 125 150 Starting T J , Junction Temperature (C) Fig 13. Maximum Avalanche Energy vs. Drain Current tp V(BR)DSS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. QG -10V QGS .2F .3F QGD D.U.T. +VDS VGS VG -3mA Charge Fig 14a. Basic Gate Charge Waveform 6 50K 12V IG ID Current Sampling Resistors Fig 14b. Gate Charge Test Circuit www.irf.com IRF5210S/LPbF Peak Diode Recovery dv/dt Test Circuit D.U.T* + Circuit Layout Considerations * Low Stray Inductance * Ground Plane * Low Leakage Inductance Current Transformer + - - + RG V GS * + * dv/dt controlled by RG * ISD controlled by Duty Factor "D" * D.U.T. - Device Under Test -V DD Reverse Polarity of D.U.T for P-Channel Driver Gate Drive P.W. Period D= P.W. Period [ VGS=10V ] *** D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode [ VDD ] Forward Drop Inductor Curent Ripple 5% [ ISD ] *** VGS = 5.0V for Logic Level and 3V Drive Devices Fig 15. For P-Channel HEXFETS www.irf.com 7 IRF5210S/LPbF D2Pak (TO-263AB) Package Outline Dimensions are shown in millimeters (inches) D2Pak (TO-263AB) Part Marking Information 7+,6,6$1,5)6:,7+ /27&2'( $66(0%/('21:: ,17+($66(0%/