®
AS7C1024
AS7C31024
9/19/01; v.1.4 Alliance Semico nductor P. 2 of 9
Functional description
The AS7C1024 and AS7C31024 are high performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) devices
organized as 131,072 words × 8 bits. It is designed for memory applications where fast data access, low power, and simple
interfacing are desired.
Equal address access and cycle times (tAA, tRC, tWC) of 12/1 5/20 ns with outpu t enable access time s (tOE) of 6, 7,8 ns are ideal
for high performance applications. Active high and low c hip enables (CE1, CE2) permit easy memory expansion with multiple-
bank systems.
When C E1 is high o r CE 2 is low th e d evices en te r standb y mode. If inp u ts are s ti l l toggling, the d evice will consume ISB po wer. If
the bus is static, then full standby power is reached (ISB1 or ISB2). For example, the AS7C31024 is guaranteed not to exceed
0.33mW under nominal full standby conditions. All devices in this family will retain data when VCC is reduced as low as 2.0V.
A write cycle is accomplished by asserting write enable (WE) and bo th chip e nables (CE1, CE2). Data on the input pins I/O0-I/
O7 is written on the rising edge of WE (write cycle 1) or the active-to-inactive edge of CE1 or CE2 (write cycle 2). To avoid bus
contention, external de vices should drive I/O pins only after outputs have been disabled with output enable (OE) or write ena b le
(WE).
A read cycle is accomplished by asserting output enable (OE) and both chip enables (CE1, CE 2), with w rite enable (WE) high.
The chips dr ive I/O pins with the data word referenced by the input address. When either chip enable is inactive, output enable
is inactive, or write enable is active, output drivers stay in high-impedance mode.
Absolute maximum ratings
Note: Stresses greater than those listed under Abso lute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional opera-
tion of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
Truth table
Ke y: X = Don’t Care, L = Low, H = High
Parameter Symbol Min Max Unit
Voltage on VCC relative to GND AS7C1024 Vt1 –0.50 +7.0 V
AS7C31024 Vt1 -0.50 +5.0 V
Voltage on any pin relative to GND Vt2 –0.50 VCC +0.50 V
Powe r dis sipation P D–1.0W
Storage te mperature (plastic) Tstg –65 +150 °C
Ambient te mperat ure with VCC appli ed Tbias –55 +125 °C
DC current into outputs (low) IOUT –20mA
CE1
CE2
WE OE
Data Mode
HXXX High Z Standby (I
SB, ISB1)
XLXX High Z Standby (I
SB, ISB1)
L H H H High Z Outpu t disable (ICC)
LHHL D
OUT Read (ICC)
LHLX D
IN Write (ICC)