Features Applications
IMAGE SENSOR
CCD area image sensor
Back-thinned FFT-CCD for high-speed application
S7960/S7961-1008
S7960/S7961-1008 are FFT-CCD area image sensors specifically designed for high speed operation. A high frame rate is attained by employing
a wide band width on-chip amplifier. In binning operation, S7960/S7961-1008 can be used as a linear image sensor having a long aperture in the
direction of the device length. The binning operation offers significant improvement in signal-to-noise ratio and signal processing speed compared
to conventional methods by which signals are digitally added by an external circuit. In area scan operation, S7960/S7961-1008 can be used as a
high frame rate camera. S7960/S7961-1008 also feature low dark signal (MPP mode operation). S7960/S7961-1008 have an effective pixel size
of 24 × 24 µm and is available in image areas of 24.576 (H) × 6.000 (V) mm.
One-stage peltier cooler is built into the package for thermoelectric cooling (S7961-1008). At room temperature operation, the device can be
cooled down to -10 ˚C (Typ.) without using any other cooling technique. In addition, since both the CCD chip and the peltier cooler are
hermetically sealed, no dry air is required, thus allowing easy handling.
Selection and order guide
Type No. Cooling Number of
total pixels
Number of
active pixels
Active area
[mm (H) × mm (V)]
S7960-1008 Non-cooled
S7961-1008 One-stage TE-cooled 1044 × 256 1024 × 250 24.576 × 6.000
A window material can be selected upon need, and the following is available.
AR-coated sapphire (standard): expressed by S #
Quart: expressed by Q #
Temporary window: expressed by N #
# This should be added at the end of a type No. when ordered.
ex. S7960-1008S: AR-coated sapphire
General ratings
Parameter Specification
CCD structure Full frame transfer
Fill factor 100 %
Number of active pixels 1024 (H) × 250 (V)
Pixel size 24 (H) × 24 (V) µm
Active area 24.576 (H) × 6.000 (V) mm
Vertical clock phase 2 phase
Horizontal clock phase 2 phase
Output circuit Two-stage MOSFET source follower
Package 24 pin ceramic package
Window AR coated sapphire
Quartz, temporary window are available upon request
High-speed on-chip amplifier
Greater than 90 % quantum efficiency
Wide spectral response range
Built-in TE-cooler
MPP operation
Non-cooled type: S7960-1008
One-stage TE-cooled type: S7961-1008
(Two-stage TE-cooled type is optional)
High-speed spectrometer
High-speed UV imaging
Optical and spectrophotometric analyzer
1
CCD area image sensor
S7960/S7961-1008
Absolute maximum ratings (Ta=25 °C)
Parameter Symbol Min. Typ. Max. Unit
Operating temperature Topr -50 - +30 °C
Storage temperature Tstg -50 -+70 °C
OD voltage VOD -0.5 - +25 V
RD voltage VRD -0.5 -+18 V
ISV voltage VISV -0.5 - +18 V
ISH voltage VISH -0.5 -+18 V
IGV voltage VIG1V, VIG2V -10 - +15 V
IGH voltage VIG1H, VIG2H -10 -+15 V
SG voltage VSG -10 - +15 V
OG voltage VOG -10 -+15 V
RG voltage VRG -10 - +15 V
TG voltage VTG -10 -+15 V
Vertical clock voltage VP1V, VP2V -10 - +15 V
Horizontal clock voltage VP1H, VP2H -10 -+15 V
Operating conditions (MPP mode, Ta=25 °C)
Parameter Symbol Min. Typ. Max. Unit
Output transistor drain voltage VOD 12 15 18 V
Reset drain voltage VRD 11.5 12 12.5 V
Output gate voltage VOG 135V
Substrate voltage VSS - 0 - V
Test point (vertical input source) VISV -V
RD -V
Test point (horizontal input source) VISH - VRD - V
Test point (vertical input gate) VIG1V, VIG2V -8 0 - V
Test point (horizontal input gate) VIG1H, VIG2H -8 0 - V
High VP1VH, VP2VH 468
Vertical shift register
clock voltage Low VP1VL, VP2VL -9 -8 -7 V
High VP1HH, VP2HH 468
Horizontal shift register
clock voltage Low VP1HL, VP2HL -9 -8 -7 V
High VSGH 468
Summing gate voltage Low VSGL -9 -8 -7 V
High VRGH 468
Reset gate voltage Low VRGL -9 -8 -7 V
High VTGH 468
Transfer gate voltage Low VTGL -9 -8 -7 V
Electrical characteristics (Ta=25 °C)
Parameter Symbol Remark Min. Typ. Max. Unit
Signal output frequency fc - - 1 10 MHz
Reset clock frequency frg - - 1 10 MHz
Vertical shift register capacitance CP1V, CP2V - - 6,400 - pF
Horizontal shift register capacitance CP1H, CP2H - - 300 -pF
Summing gate capacitance CSG --7-pF
Reset gate capacitance CRG - - 7 - pF
Transfer gate capacitance CTG - - 150 - pF
Transfer efficiency CTE *10.99995 0.99999 - -
DC output level Vout *271013V
Output impedance Zo *2-500 -W
Power dissipation P *2, *3- 100 - mW
*1: Charge transfer efficiency per pixel, measured at half of the full well capacity.
*2: VOD=15 V, Load resistance=2.2 kW
*3: Power dissipation of the on-chip amplifier.
2
CCD area image sensor
S7960/S7961-1008
Electrical and optical characteristics (Ta=25 °C, unless otherwise noted)
Parameter Symbol Remark Min. Typ. Max. Unit
Saturation output voltage Vsat - Fw × Sv - V
Vertical 150 300 -
Full well
capacity Horizontal Fw *4
150 300 - ke-
CCD node sensitivity Sv *51.8 2.2 -µV/e-
25 °C - 4,000 12,000
Dark current
(MPP mode) 0 °C DS *6
- 200 600 e-/pixel/s
Readout noise Nr *7-60 120 e-rms
Line binning 1,250 5,000 -
Dynamic range Area scanning DR *8
1,250 5,000 - -
Spectral response range l- - 200 to 1,100 -nm
Photo response non-uniformity PRNU *9--±10%
*4: Large horizontal full well for line binning operation.
*5: VOD=15 V , Load resistance=2.2 kW
*6: Dark current nearly doubles for every 5 to7 °C increase in temperature.
*7: -40 °C, operating frequency is 1 MHz.
*8: DR = Fw / Nr
*9: Measured at half of the full well capacity.
PRNU (%) = noise / signal × 100
Noise: fixed pattern noise (peak to peak)
Pin connections
S7960 series S7961 seriesPin
No. Symbol Description Symbol Description Remark
1RD Reset drain RD Reset drain
2OS Output transistor source OS Output transistor source
3OD
Output transistor drain OD Output transistor drain
4OG Output gate OG Output gate
5SG Summing gate SG Summing gate Same timing as P2H
6NC NC
7NC NC
8P2H CCD horizontal register clock-2 P2H CCD horizontal register clock-2
9P1H
CCD horizontal register clock-1 P1H CCD horizontal register clock-1
10 IG2H Test point (horizontal input gate-2) IG2H Test point (horizontal input gate-2) Shorted to 0 V
11 IG1H Test point (horizontal input gate-1) IG1H Test point (horizontal input gate-1) Shorted to 0 V
12 ISH Test point (horizontal input source) ISH Test point (horizontal input source) Shorted to RD
13 TG Transfer gate TG Transfer gate Same timing as P2V *10
14 P2V CCD vertical register clock-2 P2V CCD vertical register clock-2
15 P1V CCD vertical register clock-1 P1V CCD vertical register clock-1
16 NC Th1 Thermistor
17 NC Th2 Thermistor
18 NC P- TE-cooler-
19 NC P+ TE-cooler+
20 SS Substrate (GND) SS Substrate (GND)
21 ISV Test point (vertical input source) ISV Test point (vertical input source) Shorted to RD
22 IG2V Test point (vertical input gate-2) IG2V Test point (vertical input gate-2) Shorted to 0 V
23 IG1V Test point (vertical input gate-1) IG1V Test point (vertical input gate-1) Shorted to 0 V
24 RG Reset gate RG Reset gate
*10: TG is an isolation gate between vertical register and horizontal resister.
In standard operation, the same pulse of P2V should be applied to the TG.
3
CCD area image sensor
S7960/S7961-1008
QUANTUM EFFICIENCY (%)
WAVELENGTH (nm)
(Typ. Ta=25 ˚C)
0
200 400 600 800 1000 1200
10
20
30
40
50
60
70
80
90
100
FRONT-SIDED
FRONT-SIDED
(UV COAT)
BACK-THINNED
KMPDB0058EA
Spectral response without window
0
10
100 200
WAVELENGTH (nm)
TRANSMITTANCE (%)
300 400 500 600 700 800 900
1000 1100 1200
20
30
40
50
60
70
80
90
100 (Typ. Ta=25 ˚C)
QUARTZ WINDOW
AR COATED SAPPHIRE
KMPDB0110EA
KMPDA0106EA
3.0
PHOTOSENSITIVE SURFACE
4.0
2.4
4.8
3.4
WINDOW 28.6
22.9
22.4
ACTIVE AREA 24.576
6.000
8.2
44.0
2.54
1st PIN INDEX MARK
(24 ×) 0.5
1 2
24 23
INDEX MARK
(24 ×) 0.5
6.9
1.0
3.0
6.3
4.8
PHOTOSENSITIVE SURFACE
7.7
1st PIN INDEX MARK
6.000
4.0
19.0
22.4
22.9
44.0
52.0
60.0
2.54
WINDOW 28.6
ACTIVE AREA 24.576
8.2
TE-COOLER
1 2
24 23
INDEX MARK
KMPDA0105EA
Dimensional outlines (unit: mm)
Spectral transmittance characteristic
of window material
S7960-1008 S7961-1008
4
CCD area image sensor
S7960/S7961-1008
KMPDC0096EA
Device structure, line output format
23
22
21
20
14
15
1
3
11
9
2 BEVEL
250 SIGNAL OUT
4 BLANK 4 BLANK
V=250
H=1024
4 BEVEL
THINNING
THINNING
12345
2
3
4
5
V
H
6 BEVEL
1024
SIGNAL OUT
13
10
6 BEVEL
24
45
8
12
2
...
...
...
...
...
...
Pixel format
Left ¬ Horizontal direction ® Right
Blank Bevel Effective Bevel Blank
4 6 1024 6 4
Top ¬ Vertical direction ® Bottom
Bevel Effective Bevel
22504
KMPDC0097EA
Timing chart
Area scanning 1 (low dark current mode)
P1V
P2V
TG
P1H
P2H, SG
RG
Vos
P1H
P2H, SG
RG
Vos
INTEGRATION PERIOD
(Shutter must be opened)
Tpwv
READOUT PERIOD
(Shutter must be closed)
123
EXPANDED VIEW
DARK SIGNAL
PHOTO GENERATED SIGNAL
D1 D2
1 HORIZONTAL-SCANNING READOUT PERIOD
P2V
TG
Tovr
Tpwh, Tpws
Tpwr
5
CCD area image sensor
S7960/S7961-1008
Parameter Symbol Remark Min. Typ. Max. Unit
Pulse width Tpwv 11 - - µs
P1V, P2V, TG Rise and fall time Tprv, Tpfv *
20 - - ns
Pulse width Tpwh 50 - - ns
Rise and fall time Tprh, Tpfh 10 - - nsP1H, P2H
Duty ratio -
*
-50 - %
Pulse width Tpws 50 - - ns
Rise and fall time Tprs, Tpfs 10 - - ns
SG
Duty ratio -
-
-50- %
Pulse width Tpwr 15 - - ns
RG Rise and fall time Tprr, Tpfr -5 - - ns
TG  P1H Overlap time Tovr - 3 - - µs
*11: Symmetrical pulses should be overlapped at 50 % of maximum amplitude.
KMPDC0104EA
Area scanning 2 (large full well mode)
P1V
P2V
TG
P1H
P2H, SG
RG
Vos
P1H
P2H, SG
RG
Vos
123
EXPANDED VIEW
Tpwr
DARK SIGNAL
PHOTO GENERATED SIGNAL
D1 D2
1 HORIZONTAL-SCANNING READOUT PERIOD
P2V
TG
Timing
Chart:
Area
Scanning
2
(S7960/S7961
Serie )
INTEGRATION PERIOD
(Shutter must be opened)
Tpwv
READOUT PERIOD
(Shutter must be closed)
Tovr
Tpwh, Tpws
Parameter Symbol Remark Min. Typ. Max. Unit
Pulse width Tpwv 11 - - µs
P1V, P2V, TG Rise and fall time Tprv, Tpfv *
20 - - ns
Pulse width Tpwh 50 - - ns
Rise and fall time Tprh, Tpfh 10 - - nsP1H, P2H
Duty ratio -
*
-50 - %
Pulse width Tpws 50 - - ns
Rise and fall time Tprs, Tpfs 10 - - ns
SG
Duty ratio -
-
-50- %
Pulse width Tpwr 15 - - ns
RG Rise and fall time Tprr, Tpfr -5 - - ns
TG  P1H Overlap time Tovr - 3 - - µs
*12: Symmetrical pulses should be overlapped at 50 % of maximum amplitude.
6
CCD area image sensor
S7960/S7961-1008
KMPDC0017EA
Line binning
P1V
P2V
P1H
P2H, SG
RG
Vos
LINE BINNING PERIOD
D1 D2
TG
READOUT PERIOD
Tpwv
Tpwh, Tpws
Tpwr
Parameter Symbol Remark Min. Typ. Max. Unit
Pulse width Tpwv 11 - - µs
P1V, P2V, TG Rise and fall time Tprv, Tpfv *!
20 - - ns
Pulse width Tpwh 50 - - ns
Rise and fall time Tprh, Tpfh 10 - - nsP1H, P2H
Duty ratio -
*!
-50 - %
Pulse width Tpws 50 - - ns
Rise and fall time Tprs, Tpfs 10 - - ns
SG
Duty ratio -
-
-50- %
Pulse width Tpwr 15 - - ns
RG Rise and fall time Tprr, Tpfr -5 - - ns
TG  P1H Overlap time Tovr - 3 - - µs
*13: Symmetrical pulses should be overlapped at 50 % of maximum amplitude.
Specifications of built-in TE-cooler (S7961-1008)
Parameter Symbol Condition Min. Typ. Max. Unit
Internal resistance Rint Ta=27 °C - 1.2 - W
Maximum current *" Imax Th *#=27 °C
DT *$= DTmax - - 3.0 A
Maximum voltage Vmax
Th *#=27 °C
DT = DTmax
I = Imax
--3.6V
Maximum heat absorption *% Qmax Tc * &=Th *#=27 °C
I=Imax - - 5.0 W
Maximum temperature at hot side - - - 70 °C
CCD temperature -Ta=25 °C --10 0°C
*14: If the current is greater than Imax, the heat absorption begins to decrease due to the Joule heat. It should be noted that this
value is not a damage threshold. To protect the thermoelectric cooler and maintain stable operation, the supply current
should be less than 60 % of this maximum current.
*15: Temperature at hot side of thermoelectric cooler.
*16: DT = Th - Tc
*17:This is a theoretical heat absorption level that offsets the temperature difference in the TE-cooler element when the
maximum current is supplied to the unit.
*18: Temperature at cool side of thermoelectric cooler.
7
CCD area image sensor
S7960/S7961-1008
(Typ. Ta=25 ˚C)
10 k
220 240 260
TEMPERATURE (K)
RESISTANCE
280 300
100 k
1 M
Precaution for use (Electrostatic countermeasures)
Handle these sensors with bare hands or wearing cotton gloves. In addition, wear anti-static clothing or use a wrist band with
an earth ring, in order to prevent electrostatic damage due to electrical charges from friction.
Avoid directly placing these sensors on a work-desk or work-bench that may carry an electrostatic charge.
Provide ground lines or ground connection with the work-floor, work-desk and work-bench to allow static electricity to dis-
charge.
Ground the tools used to handle these sensors, such as tweezers and soldering irons.
It is not always necessary to provide all the electrostatic measures stated above. Implement these measures according to the
amount of damage that occurs.
Heating/cooling rate
The heating/cooling rate should be set at less than 5 K/min.
Specifications of built-in temperature sensor (S7961-1008)
A
chip thermistor is built in the same package with a CCD chip, and the CCD chip temperature can be monitored with it. A relation
between the thermistor resistance and absolute temperature is expressed by the following equation.
R1 = R2 × expB (1 / T1 - 1 / T2)
where R1 is the resistance at absolute temperature T1 (K)
R2 is the resistance at absolute temperature T2 (K)
B is so-called the B constant (K)
The characteristics of the thermistor used are as follows.
R (298K) = 10 kW
B (298K / 323K) = 3450 K
KMPDB0111EA
HAMAMATSU PHOTONICS K.K., Solid State Division
1126-1 Ichino-cho, Hamamatsu City, 435-8558 Japan, Telephone: (81) 053-434-3311, Fax: (81) 053-434-5184, http://www.hamamatsu.com
U.S.A.: Hamamatsu Corporation: 360 Foothill Road, P.O.Box 6910, Bridgewater, N.J. 08807-0910, U.S.A., Telephone: (1) 908-231-0960, Fax: (1) 908-231-1218
Germany: Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D-82211 Herrsching am Ammersee, Germany, Telephone: (49) 08152-3750, Fax: (49) 08152-2658
France: Hamamatsu Photonics France S.A.R.L.: 8, Rue du Saule Trapu, Parc du Moulin de Massy, 91882 Massy Cedex, France, Telephone: 33-(1) 69 53 71 00, Fax: 33-(1) 69 53 71 10
United Kingdom: Hamamatsu Photonics UK Limited: 2 Howard Court, 10 Tewin Road, Welwyn Garden City, Hertfordshire AL7 1BW, United Kingdom, Telephone: (44) 1707-294888, Fax: (44) 1707-325777
North Europe: Hamamatsu Photonics Norden AB: Smidesvägen 12, SE-171 41 Solna, Sweden, Telephone: (46) 8-509-031-00, Fax: (46) 8-509-031-01
Italy: Hamamatsu Photonics Italia S.R.L.: Strada della Moia, 1/E, 20020 Arese, (Milano), Italy, Telephone: (39) 02-935-81-733, Fax: (39) 02-935-81-741
Information furnished by HAMAMATSU is believed to be reliable. However, no responsibility is assumed for possible inaccuracies or omissions.
Specifications are subject to change without notice. No patent rights are granted to any of the circuits described herein. ©2003 Hamamatsu Photonics K.K.
Cat. No. KMPD1034E07
Feb. 2003 DN
0
1
2
3
VOLTAGE (V)
CCD TEMPERATURE (˚C)
4
7
6
5
-40
-30
432
CURRENT (A)
10
-20
-10
0
10
20
30
(Typ. Ta=25 ˚C)
VOLTAGE vs. CURRENT
CCD TEMPERATURE vs. CURRENT
KMPDB0179EA
8