IS62WV12816ALL IS62WV12816BLL 128K x 16 LOW VOLTAGE, ULTRA LOW POWER CMOS STATIC RAM MAY 2011 FEATURES DESCRIPTION * High-speed access time: 45ns, 55ns, 70ns The ISSI IS62WV12816ALL/ IS62WV12816BLL are highspeed, 2M bit static RAMs organized as 128K words by 16 bits. It is fabricated using ISSI's high-performance CMOS technology. This highly reliable process coupled with innovative circuit design techniques, yields highperformance and low power consumption devices. * CMOS low power operation - 36 mW (typical) operating - 9 W (typical) CMOS standby * TTL compatible interface levels When CS1 is HIGH (deselected) or when CS2 is LOW (deselected) or when CS1 is LOW, CS2 is HIGH and both LB and UB are HIGH, the device assumes a standby mode at which the power dissipation can be reduced down with CMOS input levels. * Single power supply - 1.65V--2.2V VDD (62WV12816ALL) - 2.5V--3.6V VDD (62WV12816BLL) Easy memory expansion is provided by using Chip Enable and Output Enable inputs. The active LOW Write Enable (WE) controls both writing and reading of the memory. A data byte allows Upper Byte (UB) and Lower Byte (LB) access. * Fully static operation: no clock or refresh required * Three state outputs * Data control for upper and lower bytes The IS62WV12816ALL and IS62WV12816BLL are packaged in the JEDEC standard 48-pin mini BGA (6mm x 8mm) and 44-Pin TSOP (TYPE II). * Industrial temperature available * 2CS Option Available * Lead-free available FUNCTIONAL BLOCK DIAGRAM A0-A16 DECODER 128K x 16 MEMORY ARRAY I/O DATA CIRCUIT COLUMN I/O VDD GND I/O0-I/O7 Lower Byte I/O8-I/O15 Upper Byte CS2 CS1 OE WE UB LB CONTROL CIRCUIT Copyright (c) 2011 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products. Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 1 IS62WV12816ALL, IS62WV12816BLL PIN CONFIGURATIONS 48-Pin mini BGA (6mm x 8mm) 2 CS Option (Package Code B2) 48-Pin mini BGA (6mm x 8mm) (Package Code B) 1 2 3 4 5 6 1 2 3 4 5 6 A LB OE A0 A1 A2 N/C A LB OE A0 A1 A2 CS2 B I/O8 UB A3 A4 CSI I/O0 B I/O8 UB A3 A4 CS1 I/O0 C I/O9 I/O10 A5 A6 I/O1 I/O2 C I/O9 I/O10 A5 A6 I/O1 I/O2 D GND I/O11 NC A7 I/O3 VDD D GND I/O11 NC A7 I/O3 VDD E VDD I/O12 NC A16 I/O4 GND E VDD I/O12 NC A16 I/O4 GND F I/O14 I/O13 A14 A15 I/O5 I/O6 F I/O14 I/O13 A14 A15 I/O5 I/O6 G I/O15 NC A12 A13 WE I/O7 G I/O15 NC A12 A13 WE I/O7 H NC A8 A9 A10 A11 NC H NC A8 A9 A10 A11 NC PIN DESCRIPTIONS 44-Pin mini TSOP (Type II) (Package Code T) A4 A3 A2 A1 A0 CS1 I/O0 I/O1 I/O2 I/O3 VDD GND I/O4 I/O5 I/O6 I/O7 WE A16 A15 A14 A13 A12 2 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 A5 A6 A7 OE UB LB I/O15 I/O14 I/O13 I/O12 GND VDD I/O11 I/O10 I/O9 I/O8 NC A8 A9 A10 A11 NC A0-A16 Address Inputs I/O0-I/O15 Data Inputs/Outputs CS1, CS2 Chip Enable Input OE Output Enable Input WE Write Enable Input LB Lower-byte Control (I/O0-I/O7) UB Upper-byte Control (I/O8-I/O15) NC No Connection VDD Power GND Ground Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 IS62WV12816ALL, IS62WV12816BLL TRUTH TABLE I/O PIN I/O0-I/O7 I/O8-I/O15 WE CS1 CS2 OE LB UB Not Selected X X X H X X X L X X X X X X H X X H High-Z High-Z High-Z High-Z High-Z High-Z ISB1, ISB2 ISB1, ISB2 ISB1, ISB2 Output Disabled H H L L H H H H L X X L High-Z High-Z High-Z High-Z ICC ICC Read H H H L L L H H H L L L L H L H L L DOUT High-Z DOUT High-Z DOUT DOUT ICC Write L L L L L L H H H X X X L H L H L L DIN High-Z DIN High-Z DIN DIN ICC Mode VDD Current ABSOLUTE MAXIMUM RATINGS(1) Symbol VTERM TSTG PT Parameter Terminal Voltage with Respect to GND Storage Temperature Power Dissipation Value -0.2 to VDD+0.3 -65 to +150 1.0 Unit V C W Note: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. OPERATING RANGE (VDD) Range Commercial Industrial Ambient Temperature IS62WV12816ALL IS62WV12816BLL 0C to +70C -40C to +85C 1.65V - 2.2V 1.65V - 2.2V 2.5V - 3.6V 2.5V - 3.6V Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 3 IS62WV12816ALL, IS62WV12816BLL DC ELECTRICAL CHARACTERISTICS (Over Operating Range) Symbol Parameter Test Conditions VDD Min. Max. Unit VOH Output HIGH Voltage IOH = -0.1 mA IOH = -1 mA 1.65-2.2V 2.5-3.6V 1.4 2.2 -- -- V V VOL Output LOW Voltage IOL = 0.1 mA IOL = 2.1 mA 1.65-2.2V 2.5-3.6V -- -- 0.2 0.4 V V VIH Input HIGH Voltage 1.65-2.2V 2.5-3.6V 1.4 2.2 VDD + 0.2 VDD + 0.3 V V VIL(1) Input LOW Voltage 1.65-2.2V 2.5-3.6V -0.2 -0.2 0.4 0.8 V V ILI Input Leakage GND VIN VDD -1 1 A ILO Output Leakage GND VOUT VDD, Outputs Disabled -1 1 A Notes: 1. VIL (min.) = -1.0V for pulse width less than 10 ns. CAPACITANCE(1) Symbol Parameter CIN Input Capacitance COUT Input/Output Capacitance Conditions Max. Unit VIN = 0V 8 pF VOUT = 0V 10 pF Note: 1. Tested initially and after any design or process changes that may affect these parameters. 4 Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 IS62WV12816ALL, IS62WV12816BLL IS62WV12816ALL, POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range) Symbol ICC ICC1 ISB1 ISB2 Parameter Test Conditions VDD Dynamic Operating Supply Current Operating Supply Current TTL Standby Current (TTL Inputs) VDD = Max., Com. IOUT = 0 mA, f = fMAX Ind. VDD = Max., Com. IOUT = 0 mA, f = 0 Ind. VDD = Max., Com. VIN = VIH or VIL Ind. CS1 = VIH , CS2 = VIL, f = 1 MHZ OR ULB Control VDD = Max., VIN = VIH or VIL CS1 = VIL, f = 0, UB = VIH, LB = VIH VDD = Max., Com. Ind. CS1 VDD - 0.2V, CS2 0.2V, VIN VDD - 0.2V, or VIN 0.2V, f = 0 OR CMOS Standby Current (CMOS Inputs) ULB Control Max. 70 15 20 3 3 0.3 0.3 Unit 5 10 A mA mA mA VDD = Max., CS1 = VIL, CS2=VIH VIN 0.2V, f = 0; UB / LB = VDD - 0.2V IS62WV12816BLL, POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range) Symbol Parameter Test Conditions ICC VDD Dynamic Operating Supply Current VDD = Max., IOUT = 0 mA, f = fMAX ICC1 Operating Supply Current TTL Standby Current (TTL Inputs) VDD = Max., IOUT = 0 mA, f = 0 VDD = Max., VIN = VIH or VIL CS1 = VIH , CS2 = VIL, f = 1 MHZ ISB1 ULB Control ISB2 CMOS Standby Current (CMOS Inputs) ULB Control Com. Ind. typ.(2) Com. Ind. Com. Ind. Max. 45 35 40 25 3 3 0.3 0.3 Max. 55 25 30 20 3 3 0.3 0.3 Unit 10 10 3 10 10 3 A mA mA mA OR VDD = Max., VIN = VIH or VIL CS1 = VIL, f = 0, UB = VIH, LB = VIH VDD = Max., Com. CS1 VDD - 0.2V, Ind. CS2 0.2V, typ.(2) VIN VDD - 0.2V, or VIN 0.2V, f = 0 OR VDD = Max., CS1 = VIL, CS2=VIH VIN 0.2V, f = 0; UB / LB = VDD - 0.2V Note: 1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change. 2. Typical values are measured at VDD = 3.0V, TA = 25oC and not 100% tested. Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 5 IS62WV12816ALL, IS62WV12816BLL AC TEST CONDITIONS Parameter Input Pulse Level Input Rise and Fall Times Input and Output Timing and Reference Level Output Load 62WV12816ALL (Unit) 0.4V to VDD-0.2V 5 ns VREF 62WV12816BLL (Unit) 0.4V to VDD-0.3V 5ns VREF See Figures 1 and 2 See Figures 1 and 2 1.65-2.2V 2.5V - 3.6V R1() ) 3070 3070 R2() ) 3150 3150 VREF 0.9V 1.5V VTM 1.8V 2.8V AC TEST LOADS R1 VTM OUTPUT OUTPUT 30 pF Including jig and scope Figure 1 6 R1 VTM R2 5 pF Including jig and scope R2 Figure 2 Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 IS62WV12816ALL, IS62WV12816BLL READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range) Symbol Parameter 45 ns Min. Max. 55 ns Min. Max. 70 ns Min. Max. Unit tRC Read Cycle Time 45 -- 55 -- 70 -- ns tAA Address Access Time -- 45 -- 55 -- 70 ns tOHA Output Hold Time 10 -- 10 -- 10 -- ns tACS1/tACS2 CS1/CS2 Access Time -- 45 -- 55 -- 70 ns tDOE OE Access Time -- 20 -- 25 -- 35 ns OE to High-Z Output -- 15 -- 20 -- 25 ns tHZOE (2) OE to Low-Z Output 5 -- 5 -- 5 -- ns (2) tHZCS1/tHZCS2 CS1/CS2 to High-Z Output 0 15 0 20 0 25 ns (2) tLZCS1/tLZCS2 CS1/CS2 to Low-Z Output 10 -- 10 -- 10 -- ns tBA LB, UB Access Time -- 45 -- 55 -- 70 ns tHZB LB, UB to High-Z Output 0 15 0 20 0 25 ns tLZB LB, UB to Low-Z Output 0 -- 0 -- 0 -- ns tLZOE(2) Notes: 1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 0.9V, input pulse levels of 0.4 to 1.4V and output loading specified in Figure 1. 2. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage. Not 100% tested. Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 7 IS62WV12816ALL, IS62WV12816BLL AC WAVEFORMS READ CYCLE NO. 1(1,2) (Address Controlled) (CS1 = OE = VIL, CS2 = WE = VIH, UB or LB = VIL) tRC ADDRESS tAA tOHA tOHA DOUT DATA VALID PREVIOUS DATA VALID AC WAVEFORMS READ CYCLE NO. 2(1,3) (CS1, CS2, OE, AND UB/LB Controlled) tRC ADDRESS tAA tOHA OE tDOE CS1 tHZOE tLZOE tACE1/tACE2 CS2 tLZCE1/ tLZCE2 tHZCS1/ tHZCS2 LB, UB tBA tHZB tLZB DOUT HIGH-Z DATA VALID Notes: 1. WE is HIGH for a Read Cycle. 2. The device is continuously selected. OE, CS1, UB, or LB = VIL. CS2=WE=VIH. 3. Address is valid prior to or coincident with CS1 LOW transition. 8 Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 IS62WV12816ALL, IS62WV12816BLL WRITE CYCLE SWITCHING CHARACTERISTICS(1,2) (Over Operating Range) Symbol tWC Parameter Write Cycle Time tSCS1/tSCS2 CS1/CS2 to Write End tAW Address Setup Time to Write End 45ns Min. Max. 55 ns Min. Max. 70 ns Min. Max. Unit 45 -- 55 -- 70 -- ns 35 -- 45 -- 60 -- ns 35 -- 45 -- 60 -- ns tHA tSA Address Hold from Write End 0 -- 0 -- 0 -- ns Address Setup Time 0 -- 0 -- 0 -- ns tPWB tPWE LB, UB Valid to End of Write 35 -- 45 -- 60 -- ns WE Pulse Width 35 -- 40 -- 50 -- ns tSD tHD Data Setup to Write End 20 -- 25 -- 30 -- ns Data Hold from Write End 0 -- 0 -- 0 -- ns tHZWE(3) tLZWE(3) WE LOW to High-Z Output -- 20 -- 20 -- 20 ns WE HIGH to Low-Z Output 5 -- 5 -- 5 -- ns Notes: 1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 0.9V, input pulse levels of 0.4V to 1.4V and output loading specified in Figure 1. 2. The internal write time is defined by the overlap of CS1 LOW, CS2 HIGH and UB or LB, and WE LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the write. 3. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage. Not 100% tested. Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 9 IS62WV12816ALL, IS62WV12816BLL AC WAVEFORMS WRITE CYCLE NO. 1(1,2) (CS1 Controlled, OE = HIGH or LOW) tWC ADDRESS tHA tSCS1 CS1 tSCS2 CS2 tAW tPWE WE tPWB LB, UB tSA DOUT tHZWE DATA UNDEFINED tLZWE HIGH-Z tSD DIN tHD DATA-IN VALID Notes: 1. WRITE is an internally generated signal asserted during an overlap of the LOW states on the CS1 , CS2 and WE inputs and at least one of the LB and UB inputs being in the LOW state. 2. WRITE = (CS1) [ (LB) = (UB) ] (WE). 10 Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 IS62WV12816ALL, IS62WV12816BLL AC WAVEFORMS WRITE CYCLE NO. 2 (WE Controlled: OE is HIGH During Write Cycle) tWC ADDRESS OE tHA tSCS1 CS1 tSCS2 CS2 tAW t PWE WE LB, UB tSA DOUT DATA UNDEFINED tHZWE tLZWE HIGH-Z tSD DIN DATA-IN VALID Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 tHD 11 IS62WV12816ALL, IS62WV12816BLL AC WAVEFORMS WRITE CYCLE NO. 3 (WE Controlled: OE is LOW During Write Cycle) tWC ADDRESS OE tHA tSCS1 CS1 tSCS2 CS2 tAW t PWE WE LB, UB tSA DOUT tHZWE DATA UNDEFINED tLZWE HIGH-Z tSD DIN 12 tHD DATA-IN VALID Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 IS62WV12816ALL, IS62WV12816BLL AC WAVEFORMS WRITE CYCLE NO. 4 (UB/LB Controlled) t WC ADDRESS t WC ADDRESS 1 ADDRESS 2 OE t SA CS1 LOW CS2 HIGH t HA t SA WE UB, LB t HA t PBW t PBW WORD 1 WORD 2 t HZWE DOUT t LZWE HIGH-Z DATA UNDEFINED t HD t SD DIN t HD t SD DATAIN VALID DATAIN VALID UB_CSWR4.eps Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 13 IS62WV12816ALL, IS62WV12816BLL DATA RETENTION SWITCHING CHARACTERISTICS Symbol Parameter Test Condition Min. Max. Unit VDR VDD for Data Retention See Data Retention Waveform 1.0 3.6 V IDR Data Retention Current VDD = 1.0V, CS1 VDD - 0.2V -- 10 A tSDR tRDR Data Retention Setup Time See Data Retention Waveform 0 -- ns Recovery Time See Data Retention Waveform tRC -- ns DATA RETENTION WAVEFORM (CS1 Controlled) Data Retention Mode tSDR tRDR VDD VDR CS1 VDD - 0.2V CS1 GND DATA RETENTION WAVEFORM (CS2 Controlled) Data Retention Mode VDD CS2 tSDR tRDR VDR CS2 0.2V GND 14 Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 IS62WV12816ALL, IS62WV12816BLL ORDERING INFORMATION: IS62WV12816ALL (1.65V - 2.2V) Commercial Range: 0C to +70C Speed (ns) 70 Order Part No. Package IS62WV12816ALL-70T TSOP (Type II) Industrial Range: -40C to +85C Speed (ns) Order Part No. Package 70 70 70 IS62WV12816ALL-70TI IS62WV12816ALL-70BI IS62WV12816ALL-70BLI TSOP (Type II) mini BGA (6mm x 8mm) mini BGA (6mm x 8mm), Lead-free 70 IS62WV12816ALL-70B2I mini BGA (6mm x 8mm), 2 CS Option ORDERING INFORMATION: IS62WV12816BLL (2.5V - 3.6V) Commercial Range: 0C to +70C Speed (ns) Order Part No. Package 45 45 IS62WV12816BLL-45B IS62WV12816BLL-45B2 mini BGA (6mm x 8mm) mini BGA (6mm x 8mm), 2 CS Option 55 IS62WV12816BLL-55T TSOP (Type II) Industrial Range: -40C to +85C Speed (ns) Order Part No. Package 45 IS62WV12816BLL-45TLI TSOP (Type II), Lead-free 55 55 55 55 55 55 IS62WV12816BLL-55TI IS62WV12816BLL-55TLI IS62WV12816BLL-55BI IS62WV12816BLL-55BLI IS62WV12816BLL-55B2I IS62WV12816BLL-55B2LI TSOP (Type II) TSOP (Type II), Lead-free mini BGA (6mm x 8mm) mini BGA (6mm x 8mm), Lead-free mini BGA (6mm x 8mm), 2 CS Option mini BGA (6mm x 8mm), 2 CS Option, Lead-free Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 15 16 08/12/2008 Package Outline 1. CONTROLLING DIMENSION : MM . 2. Reference document : JEDEC MO-207 IS62WV12816BLL NOTE : IS62WV12816ALL, Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774 Rev. I 05/20/2011 Package Outline 06/04/2008 3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION/INTRUSION. 2. DIMENSION D AND E1 DO NOT INCLUDE MOLD PROTRUSION. 1. CONTROLLING DIMENSION : MM NOTE : IS62WV12816ALL, IS62WV12816BLL 17