D
GQ
D
GQ
D
GQ
D
GQ
D
GQ
D
GQ
D
G
Q
D
G
Q
D
G
Q
D
G
Q
D
G
Q
D
G
Q
D
G
Q
D
G
Q
ANALOG INPUT 4
+REFERENCE 6
DIGITAL GROUND 2
ANALOG GROUND 7
RANGE MIDPOINT 5
R/2
R
R
R
R
R/2
R/2
–REFERENCE 3
CS1 8
9
+5V SUPPLY 18
+VDD
1 CLOCK INPU
T
CLOCK
GENERATOR
10 OVERFLOW
11 BIT 1 (MSB)
12 BIT 2
13 BIT 3
14 BIT 4
15 BIT 5
16 BIT 6
17 BIT 7 (LSB)
128-TO-7
ENCODER
CS2
D
GQ
D
GQ
D
GQ
D
GQ
Æ1
Æ2Æ2
Æ1
Figure 1. ADC-207 Functional Block Diagram (DIP Pinout)
PRODUCT OVERVIEW
FEATURES
7-bit fl ash A/D converter
20MHz sampling rate
Low power (250mW)
Single +5V supply
1.2 micron CMOS technology
7-bit latched 3-state output with overfl ow bit
Surface-mount versions
High-reliability version
No missing codes
The ADC-207 is the industry’s first 7-bit flash
converter using an advanced high-speed VLSI
1.2 micron CMOS process. This process offers
some very distinctive advantages over other
processes, making the ADC-207 unique. The
smaller geometrics of the process achieve high
speed, better linearity and superior temperature
performance.
Since the ADC-207 is a CMOS device, it also
has very low power consumption (250mW). The
device draws power from a single +5V supply and
is conservatively rated for 20MHz operation. The
ADC-207 allows using sampling apertures as small
as 12ns, making it more closely approach an ideal
sampler. The small sampling apertures also let the
device operate at greater than 20MHz.
The ADC-207 has 128 comparators which are
auto-balanced on every conversion to cancel out
any offsets due to temperature and/or dynamic
effects. The resistor ladder has a midpoint tap for
use with an external voltage source to improve
integral linearity beyond 7 bits. The ADC-207 also
provides the user with 3-state outputs for easy
interfacing to other components.
There are eight models of the ADC-207
covering three operating temperature ranges: 0 to
+70°C, –40 to +100°C, and –55 to +125°C. Two
high-reliability “QL models are also available.
INPUT/OUTPUT CONNECTIONS
DIP Pins FUNCTION LCC Pins
1CLOCK INPUT 1
2DIGITAL GROUND 4
3–REFERENCE 5
4ANALOG INPUT 6
5MIDPOINT 7
6+REFERENCE 8
7ANALOG GROUND 9
8CS1 11
9CS2 12
10 OVERFLOW 13
11 BIT 1 (MSB) 14
12 BIT 2 16
13 BIT 3 17
14 BIT 4 19
15 BIT 5 20
16 BIT 6 21
17 BIT 7 (LSB) 23
18 +5V SUPPLY 24
®®
DATEL 11 Cabot Boulevard, Mansfi eld, MA 02048-1151 USA • Tel: (508) 339-3000 • www.datel.com • e-mail: help@datel.com
ADC-207
7-Bit, 20MHz, CMOS Flash A/D Converters
MDA_ADC-207.B03 Page 1 of 6
PHYSICAL/ENVIRONMENTAL
PARAMETERS MIN. TYP. MAX. UNITS
Operating Temp. Range, Case:
LC/MC Versions 0 +70 °C
LE/ME Versions -40 +100 °C
MM/LM/QL Versions –55 +125 °C
Storage Temp. Range –65 +150 °C
Package Type
DIP 18-pin ceramic DIP
LCC 24-pin ceramic LCC
Functional Specifi cations
(Typical at +5V power, +25°C, 20MHz clock, +REFERENCE = +5V,
–REFERENCE = ground, unless noted)
ANALOG INPUT MIN. TYP. MAX. UNITS
Input Type Single-ended, non-isolated
Input Range (dc-20MHz) 0 +5 Volts
Input Impedance1000 Ohms
Input Capacitance
(Full Range)
10 pF
DIGITAL INPUTS
Logic Levels
Logic "1" +3.2 Volts
Logic "0" +0.8 Volts
Logic Loading "1" ±1 ±5 microamps
Logic Loading "0" ±1 ±5 microamps
Sample Pulse Width
(During Sampling Portion of Clock)
12 ns
Reference Ladder Resistance 225 330 Ohms
PERFORMANCE
Conversion Rate 20 25 MHz
Harmonic Distortion
(8MHz 2nd Order Harmonic) –40 dB
Differential Gain 3 %
Differential Phase 1.5 degrees
Aperture Delay8 ns
Aperture Jitter50 ps
No Missing Codes
LC/MC grade 0 +70 °C
LE/ME grade –40 +100 °C
LM/MM grade –55 +125 °C
Integral Linearity ±0.8 ±1 LSB
Over Temperature Range±1 LSB
Differential Nonlinearity±0.3 ±0.5 LSB
Over Temperature Range±0.4 ±0.6 LSB
Power Supply Rejection±0.02
%FSR/%Vs
DIGITAL OUTPUTS
Data Coding Straight binary
Data Output Resolution 7 Bits
Logic Levels
Logic "1" +2.4 +4.5 Volts
Logic "0" (at 1.6mA) +0.4 Volts
Logic Loading "1" –4 mA
Logic Loading "0" +4 mA
Output Data Valid Delay
(From Rising Edge) 15 17 ns
POWER REQUIREMENTS
Power Supply Range (+VDD) +3.0 +5.0 +5.5 Volts
Power Supply Current+50 +70 mA
Power Dissipation250 385 mW
Footnotes:
At full power input and chip selects enabled.
At 4MHz input and 20MHz clock.
For 10-step, 40 IRE NTSC ramp test.
Adjustable using reference ladder midpoint tap. See ADC-207 Operation.
(MSB)
0.1µF
0
.1µF
4.7µF
0.01µF
+5V
+15
+
+
–15
47µF
11
12
10
5
HA-5033
10
W
+5V
20MHz
CLOCK
(LSB)
B7
B6
B5
B4
B3
B2
B1
OF
OF
B1
B2
B3
B4
B5
B6
B7
+VDD
CS2
CS1
+REFERENCE
MID
VIN
–REFERENCE
DIGITAL GND
ANALOG GND
CLOCK 18
1
2
3
4
5
6
7
8
9
0
.1µF +
47µF
17
16
15
14
13
12
11
10
PARAMETERS LIMITS UNITS
Power Supply Voltage (+VDD) –0.5 to +7 Volts
Digital Inputs –0.5 to +5.5 Volts
Analog Input –0.5 to (+VDD +0.5) Volts
Reference Inputs –0.5 to +VDD Volts
Digital Outputs –0.5 to +5.5 Volts
(short circuit protected to ground)
Lead Temperature (10 sec. max.) +300 °C
ABSOLUTE MAXIMUM RATINGS
Figure 2. Typical Connections for Using the ADC-207
TECHNICAL NOTES
1.
Input Buffer Amplifi er – Since the ADC-207 has a switched capacitor type input, the input
impedance of the 207 is dependent on the clock frequency. At relatively slow conversion rates,
a general purpose type input buffer can be used; at high conversion rates DATEL recommends
either the HA-5033 or Elantec 2003. See Figure 2 for typical connections.
2. Reference Ladder – Adjusting the voltage at +REFERENCE adjusts the gain of the ADC-207.
Adjusting the voltage at –REFERENCE adjusts the offset or zero of the ADC-207. The midpoint
pin is usually bypassed to ground through a 0.1µF capacitor, although it can be tied to a precision
voltage halfway between +REFERENCE and –REFERENCE. This would improve integral linearity
beyond 7 bits.
3.
Clock Pulse Width – To improve performance at Nyquist bandwidths, the clock duty cycle can
be adjusted so that the low portion of the clock pulse is 12ns wide. The smaller aperture allows
the ADC-207 to closely resemble an ideal sampler. See Figure 4.
4. At sampling rates less than 100kHz, there may be some degradation in offset and differential
nonlinearity. Performance may be improved by increasing the clock duty cycle (decreasing the
time spent in the sample mode).
CAUTION
Since the ADC-207 is a CMOS device, normal precautions against static electricity should be
taken. Use ground straps, grounded mats, etc. The Absolute Maximum Ratings of the device
MUST NOT BE EXCEEDED as irrevocable damage to the ADC-207 will occur.
®®
DATEL 11 Cabot Boulevard, Mansfi eld, MA 02048-1151 USA • Tel: (508) 339-3000 • www.datel.com • e-mail: help@datel.com
ADC-207
7-Bit, 20MHz, CMOS Flash A/D Converters
MDA_ADC-207.B03 Page 2 of 6
OUTPUT CODING
(+REFERENCE = +5.12V, –REFERENCE = ground, MIDPOINT = no connection)
NOTE: The reference should be held to ±0.1% accuracy or better. Do not use the +5V
power supply as a reference input without precision regulation and high frequency
decoupling.
Values shown here are for a +5.12V reference. Scale other references proportionally.
Calibration equipment should test for code changes at the midpoints between these
center values shown in Table 1. For example, at the half-scale major carry, set the
input to 2.54V and adjust the reference until the code fl ickers equally between 63 and
64. Note also that the weighting for the comparator resistor network leaves the fi rst
and last thresholds within 1/2LSB of the end points to adjust the code transition to the
proper midpoint values.
two enable lines, CS1 and CS2. Table 2 shows the truth table for chip select
signals. CS1 has the function of enabling/disabling bits 1 through 7. CS2
has the function of enabling/disabling bits 1 through 7 and the overfl ow bit.
Also, a full-scale input produces all ones, including the overfl ow bit at the
output. The ADC-207 has an adjustable resistor ladder string. The top end,
idle point, and bottom end are brought out for use with applications circuits.
These pins are called +REFERENCE, MIDPOINT and –REFERENCE,
respectively. In typical operation +REFERENCE is tied to +5V, –REFERENCE
is tied to ground, and MIDPOINT is bypassed to ground. Such a confi gura-
tion results in a 0 to +5V input voltage range. The MIDPOINT pin can also
be tied to a +2.5V source to further improve integral linearity. This is usually
not necessary unless better than 7-bit linearity is needed.
ADC-207 OPERATION
The ADC-207 uses a switched capacitor scheme in which there is an auto-
zero phase and a sampling phase. See Figure 1 and Timing Diagram. The
ADC-207 uses a single clock input. When the clock is at a high state (logic
1), the ADC-207 is in the auto-zero phase (Ø1). When the clock is at a low
state (logic 0), the ADC-207 is in the sampling phase (Ø2). During phase
1, the 128 comparator outputs are shorted to their inputs through CMOS
switches. This serves the purpose of bringing the inputs and outputs to the
transition levels of the respective comparators. The inputs to the compara-
tors are also connected to 128 sampling capacitors. The other end of the
128 capacitors are also shorted to 128 taps of a resistor ladder, via CMOS
switches. Therefore, during phase 1 the sampling capacitors are charged to
the differential voltage between a resistor tap and its respective comparator
transition voltage.
This eliminates offset differences between comparators and yields better
temperature performance. During phase 2 (Ø2) the input voltage is applied to
the 128 capacitors, via CMOS switches. This forces the comparators to trip
either high or low. Since the comparators during phase 1 were sitting at their
transition point, they can trip very quickly to the correct state. Also during
phase 2, the outputs of the comparators are loaded into internal latches
which in turn feed a128-to-7 encoder. When going back into phase 1, the
output of the encoder is loaded into an output latch. This latch then feeds the
3-state output buffer.
This means that the ADC-207 is of pipeline design. To do a single con-
version, the ADC-207 requires a positive pulse followed by a negative pulse
followed by a positive pulse. Continuous conversion requires one cycle/
sample (one positive pulse and one negative pulse). The 3-state buffer has
CLOCK
OUTPUT
DATA
AUTO
ZERO
N DATA
N+1 DATA
SAMPLE
N
SAMPLE
N + 1
SAMPLE
N + 2
AUTO
ZERO
AUTO
ZERO
17ns max.
17ns max.
Æ1Æ2Æ1Æ1Æ2Æ2
TIMING DIAGRAM
Analog Input
(Center Value) Code Overfl ow 1234567 Decimal Hexadecimal
(Incl. 0V)
MSB LSB
0.00V Zero 0 0000000 0 00
+0.04V +1LSB 0 0000001 1 01
+1.28V +1/4FS 0 0100000 32 20
+2.52V +1/2FS – 1LSB 0 0111111 63 3F
+2.56V +1/2FS 0 1000000 64 40
+2.60V +1/2FS + 1LSB 0 1000001 65 41
+3.84V +3/4FS 0 1100000 96 60
+5.08V +FS 0 1111111 127 7F
+5.12V Overfl ow 1 1111111 255* FF
*Note that the overfl ow code does not clear the data bits.
Table 1. ADC-207 Output Coding
Table 2. Chip Select Truth Table
CS1 CS2 Bits 1-7 Overfl ow Bit
0 0 3-State Mode 3-State Mode
1 0 3-State Mode 3-State Mode
0 1 Data Outputed Data Outputed
1 1 3-State Mode Data Outputed
NOTE: Reduce the sample time (sample pulse) to 12ns to improve performance
above 20MHz. Such a confi guration will closely resemble an ideal sampler.
®®
DATEL 11 Cabot Boulevard, Mansfi eld, MA 02048-1151 USA • Tel: (508) 339-3000 • www.datel.com • e-mail: help@datel.com
ADC-207
7-Bit, 20MHz, CMOS Flash A/D Converters
MDA_ADC-207.B03 Page 3 of 6
USING TWO ADC-207s FOR 8-BIT RESOLUTION
Two ADC-207s (A and B) are cascadable for applications requiring 8-bit
resolution. The device A provides a typical 7-bit output. The OVERFLOW
signal of device A turns off device A and turns on the device B. The OVER-
FLOW signal of device A is also used as MSB for 8-bit operation. The device
B provides the other seven bits from the input signal. Figure 4 shows the
circuit connections for the application.
BEAT FREQUENCY AND ENVELOPE TESTS
Figure 5 shows an actual ADC-207 plot of the Beat Frequency Test. This
test uses a 20MHz clock input to the ADC-207 with a 20.002MHz full-scale
sine wave input. Although the converter would not normally be used in this
mode because the input frequency violates Nyquist criteria for full recovery
of signal information, the test is an excellent demonstration of the ADC-
207’s high-frequency performance.
The effect of the 2kHz frequency difference between the input and the
clock is that the output will be a 2kHz sinusoidal digital data array which
"walks" along the actual input at the 2kHz beat note frequency. Any inabil-
ity to follow the 20.002MHz input will be immediately obvious by plotting
the digital data array. Further arithmetic analysis may be done on the data
array to determine spectral purity, harmonic distortion, etc. This test is an
excellent indication of:
1. Full power input bandwidth of all 128 comparators.
(Any gain loss would show as signal distortion.)
2. Phase response linearity vs. instantaneous signal magnitude.
(Phase problems would show as
improper codes.)
3. Comparator slew rate limiting.
Figure 6 shows an actual ADC-207 plot of the Envelope Test. This test
is a variation of the previous test but uses a 10.002MHz sinewave input to
give two overlapping cycles when the data is reconstructed by a D/A con-
verter output to an oscilloscope. The scope is triggered by the 20MHz clock
used by the A/D. Any asymmetry between positive and negative portions of
the signal will be very obvious. This test is an excellent indication of slew
rate capability. At the peaks of the envelope, consecutive samples swing
completely through the input voltage range.
NOTE: The output data bit numbering is offset by a
bit to the device B’s output.
9
CLOCK IN
GROUND
+5 VOLTS
8
1
23
13
12 11 CLOCK OUT
20k
6
4
5
0.01µF
10pF
18
6
10
TURN
+5V
8
4
1
9
3
6
8
1
4
+5V
REFERENCE
GROUND
9
18
3
7
7
10
OVERFLOW
ANALOG IN
CLOCK IN
OPTIONAL
MIDSCALE
ADJUST
+5.12
REFERENCE
IN
BIT 1 (MSB)
BIT2
BIT3
BIT4
BIT5
BIT6
BIT7
BIT8 (LSB)
11
12
13
14
15
16
17
+REFERENCE
+V
DD
OF
B1
B2
B3
B4
B5
B6
B7
DIG GND
CS1
ANALOG INPUT
CLOCK
CS2
–REFERENCE
ANALOG GROUND
+REFERENCE OF
B1
B2
B3
B4
B5
B6
B7
CS1
CLOCK
ANALOG INPUT
+V
DD
CS2
–REFERENCE
2
10
11
12
13
14
15
16
17
2
ANALOG GROUND
DIG GND
Figure 3. Optional Pulse Shaping Circuit
Figure 4. Using Two ADC-207s for 8-Bit Operation
®®
DATEL 11 Cabot Boulevard, Mansfi eld, MA 02048-1151 USA • Tel: (508) 339-3000 • www.datel.com • e-mail: help@datel.com
ADC-207
7-Bit, 20MHz, CMOS Flash A/D Converters
MDA_ADC-207.B03 Page 4 of 6
0 1 2 3 4 5 6 7 8 9 10
FREQUENCY (MHz)
70
65
60
55
50
45
40
35
30
25
20
15
10
5
0
–5
–10
AMPLITUDE (dB)
69.2
27.3
SAMPLE PU L S E WIDTH 25ns 4MHz FUNDAMENTAL
Figure 5. Beat Frequency Test at 20MHz Figure 6. 10MHz Envelope Test
FFT TEST
This test actually produces an amplitude versus frequency graph (Figure 7) which indicates harmonic distortion and signal-to-noise ratio. The theoretical rms
signal-to-noise ration for a 7-bit converter is +43.8dB.
0 1 2 3 4 5 6 7 8 9 10
70
65
60
55
50
45
40
35
30
25
20
15
10
0
–5
–10
SAMPLE PULSE = 25ns
69.2
27.3
4MHz FUNDAMENTAL
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2
NUMBER OF SAMPLES(X10 )
3
OUTPUT
CODES
120
110
100
90
80
70
60
50
40
30
20
10
0
OUTPUT
CODES
120
110
100
90
80
70
60
50
40
30
20
10
00 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 1.5
NUMBER OF SAMPLES(X10 )
3
Figure 7. FFT Test Using the ADC-207
®®
DATEL 11 Cabot Boulevard, Mansfi eld, MA 02048-1151 USA • Tel: (508) 339-3000 • www.datel.com • e-mail: help@datel.com
ADC-207
7-Bit, 20MHz, CMOS Flash A/D Converters
MDA_ADC-207.B03 Page 5 of 6
ORDERING INFORMATION
MODEL TEMP. RANGE PACKAGE
ADC-207MC 0 to +70°C 18-pin DIP
ADC-207ME –40 to +100°C 18-pin DIP
ADC-207MM –55 to +125°C 18-pin DIP
ADC-207MM-QL –55 to +125°C 18-pin DIP
ADC-207LC 0 to +70°C 24-pin CLCC
ADC-207LE –40 to +100°C 24-pin CLCC
ADC-207LM –55 to +125°C 24-pin CLCC
ADC-207LM-QL –55 to +125°C 24-pin CLCC
ACCESSORIES
ADC-B207/208 Evaluation Board for DIP Version
(without ADC-207)
MECHANICAL DIMENSIONS INCHES (mm)
0.400
(10.16 )
0.250 ±0.005
(6.35 ±0.13)
0.050
(1.270)
TYP.
0.020 ±0.005
(0.51 ±0.13)
1
24
16
10
4
0.090 MAX.
(2.29 MAX.)
+0.010
–0.005
+0.25
–0.13
0.400
(10.16 )
+0.010
–0.005
+0.25
–0.13
0.250 ±0.005
(
6.35 ±0.13
)
PIN 1
INDEX
TOP VIEW
24-Pin Ceramic LCC
18-Pin Ceramic DIP
0.960 MAX.
(24.38 MAX.)
0.220 / 0.3 10
(5.59 / 7.87)
DATEL
ADC-207MC
PIN 1
IDENTIFIER
1
18 10
9
0
.200 MAX.
(5.1 MAX.)
0.100 TYP.
(2.540)
0.014 / 0. 023
(0.35 / 0.58)
0.015 / 0.060
(0.38 /1.52)
0.290 / 0.320
(7.36 / 8.13)
SEATING
PLANE
0.035
(0.889)
0.008 / 0.01
5
(0.20 / 0.38)
. makes no representation that the use of its products in the circuits described herein, or the use of other
technical information contained herein, will not infringe upon existing or future patent rights. The descriptions contained herein do not
imply the granting of licenses to make, use, or sell equipment constructed in accordance therewith. Specifi cations are subject to change
without notice.
www.datel.com • e-mail: help@datel.com
®®
DATEL
11 Cabot Boulevard, Mansfi eld, MA 02048-1151 USA
ITAR and ISO 9001/14001 REGISTERED
ADC-207
7-Bit, 20MHz, CMOS Flash A/D Converters
MDA_ADC-207.B03 Page 6 of 6