1
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Document Title
128M: 8M x 16 Mobile DDR SDRAM
Revision History
Revision No. Date History
0.0 Jun 4, 2007 Initial Draft
0.1 Nov 8, 2007 - Table 8 Operating AC Parameter updated for tCKE and tWR
- Table 2 Bonding Pad Location and Identification Table deleted
- Signal names unified to /CK, /CS, /RAS, /CAS, /WE respectively
(Ex.) CK#, CK, CKB unified to /CK
- Corrected IDD6 value in Table 16
1.0 May 26, 2008 Release
- Table 6 DC CHARACTERISTICS updated for IDD3P, IDD3N, IDD6
- Table 8 OPERATING AC PARAMETER updated for tDS, tDH, tQH, tRC
Emerging Memory & Logic Solutions Inc.
4F Korea Construction Financial Coop eration B/D, 301-1 Yeon-Dong, Jeju-Do, Korea Zip Code : 690-717
Tel : +82-64-740-1700 Fax : +82-64-740- 1750 / Homepage : www.emlsi.com
The attached datasheets provided by EMLSI reserve the right to change the specifications and products.
EMLSI will answer to your questions about device. If you have any questions, please contact the EMLSI
office.
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
128M : 8M x 16bit Mobile DDR SDRAM
Table 1: ORDERING INFORMATION
NOTE :
1. EMLSI is not designed or manufactured for use in a device or system that is used under circumstance in which human life is potentially at stake.
Please contact to the memory marketing team in EMLSI when considering the use of a product contained herein for any specific purpose,
such as medical, aerospace, nuclear, military, vehicular or undersea repeater use.
Part No. Max Freq. Interface Package Remark
EMD28164PA-60(DDR333) 166㎒(CL3), 111㎒(CL2)
LVCMOS Wafer Biz.
EMD28164PA-75(DDR266) 133㎒(CL3), 83㎒(CL2)
EMD28164PA-90(DDR222) 111㎒(CL3), 66㎒(CL2)
FEATURES
· 1.8V power supply, 1.8V I/O power
·LVCMOS compatible with multiplexed address.
· Double-data-rate architecture; two data transfers per clock
cycle
· Bidirectional data strobe(DQS)
· Four banks operation.
· MRS cycle with address key programs.
· CAS latency (2, 3 & 4).
·Burst length (2, 4, 8 & 16).
· Burst type (Sequential & Interleave).
· Differential clock inputs(CK and /CK).
· EMRS cycle with address key programs.
· PASR(Partial Array Self Refresh).
· DS (Driver Strength)
· Internal auto TCSR
(Temperature Compensated Self Refresh)
· Deep power-down(DPD) mode.
·DM for write masking only.
·Auto refresh and self refresh modes.
·64㎳ refresh period (4K cycle).
·Operating temperature range (-25℃ ~ 85℃).
GENERAL DESCRIPTION
This EMD28164PA is 134,217,728 bits synchronous double data
rate Dynamic RAM. Each 33,554,432 bits bank is organized as
4,096 rows by 512 columns by 16 bits, fabricated with EMLSI’s
high performance CMOS technology.
This device uses a double data rate architecture to achieve high-
speed operation. The double data rate architecture is essentially
a 2n-prefetch architecture with an interface designed to transfer
two data words per clock cycle at the I/O balls.
Range of operating frequencies, programmable burst lengths
and programmable latencies allow the same device to be useful
for a variety of high bandwidth and high performance memory
system applications.
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Table 2: Pad Description
Symbol Type Descriptions
CK, /CK Input Clock : CK and /CK are differential clock inputs. All address and control input signals are sampled on
the crossing of the positive edge of CK and negative edge of /CK. Input and output data is referenced to
the crossing of CK and /CK(both directions of crossing). Internal clock signals are derived from CK//CK.
CKE Input
Clock Enable : CKE HIGH activates, and CKE LOW deactivates internal clock signals, and device input
buffers and output drivers. Taking CKE LOW provides PRECHARGE POWER-DOWN and SELF
REFRESH operation(all banks idle), or ACTIVE POWER-DOWN(row ACTIVE in any bank). CKE is
synchronous for all functions except for SELF REFRESH EXIT, which is achieved asynchronously.
Input buffers, excluding CK, /CK and CKE, are disabled during power-down and self refr esh mode
which are contrived for low standby power consumption.
/CS Input Chip Select : /CS enables (registered LOW) and disables (registered HIGH) the command decoder. All
commands are masked when /CS is registered HIGH. /CS provides for external bank selection on sys-
tems with multiple banks. /CS is considered part of the command code.
/RAS, /CAS, /WE Input Command Inputs: /CAS, /RAS, and /WE(along with /CS) define the command being entered.
LDM, UDM Input
Input Data Mask : DM is an input mask signal for write data. Input data is masked when DM is sampled
HIGH along with that input data during a WRITE access. DM is sampled on both edges of DQS.
Although DM pins are input-only, the DM loading matches the DQ and DQS loading. For x16 devices,
LDM corresponds to the data on DQ0-DQ7, UDM corresponds to the data on DQ8-DQ15.
BA0, BA1 Input Bank Address Inputs: BA0 and BA1 define to which bank an ACTIVE, READ, WRITE or PRECHARGE
command is being applied.
A0 - A11 Input
Address Inputs: provide the row address for ACTIVE commands, and the column address and AUTO
PRECHARGE bit for READ / WRITE commands, to select one location out of the memory array in the
respective bank. The address inputs also provide the op-code during a MODE REGISTER SET com-
mand.
DQ0-DQ15 I/O Data Bus: Input / Output
LDQS, UDQS I/O Data Strobe: Output with read data, input with write data. Edge-aligned with read data, centered with
write data. Used to capture write data. For x16 device, LDQS corresponds to the data on DQ0-DQ7,
UDQS corresponds to the data on DQ8-DQ15.
VDD Supply Power Supply
VSS Supply Ground
VDDQ Supply I/O Power Supply
VSSQ Supply I/O Ground
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Device Operation
Simplified State Diagram
Power
On
Deep
Power
Down
Precharge
All Banks
Idle
All banks
precharged
Self
Refresh
MRS
EMRS Auto
Refresh
Precharge
Power
Down
Active
Power
Down
Row
Active Burst
Stop
WRITE
WRITE A
Precharge
PREALL
READ A
READ
Power
applied DPDSX
MRS
DPDS
ACT
REFA
BST
READ
READA
WRITEA
PRE
REFSX
REFS
CKEL
CKEH
CKEL
CKEH
WRITE
READ
READA
READA
PRE PRE
PRE
WRITEA
Automatic Sequence
Command Sequence
ACT = Active
BST = Burst Terminate
CKEL = Ent er Power- D own
CKEH =Exit Power-Down
DPDS = Enter Deep Power-Down
DPDSX = Exit Deep Power-Down
EMRS = Ext. Mode Reg. Set
MRS = Mode Register Set
PRE = Precharge
PREALL = Precharge All Banks
REFA = Auto Refresh
REFS = Enter Self Refresh
REFSX = Exit Self Refresh
READ = Read w/o Auto Precharge
READA = Read with Auto Precharge
WRITE = Write w/o Aut o Precharge
WRITEA = Write wi th Auto Precharge
READ
WRITE
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
FUNCTIONAL BLOCK DIAGRAM
ADDRESS
DECODER
BANK
CONTROL
Din
DQS
Dout
Parallel
ROW -
ADDRESS
DECODER
COLUMN -
DM MASK LOGIC
I/O GATING
SENSE AMPLIFIERS
LOGIC
REFRESH
COUNTER
DM
to
Serial
Din
Serial
to
Parallel
DQS
GENERATOR DQS
A0 - A11
BA0, BA1
CKE
CK
/CK
/CS
/RAS
/CAS
/WE
STANDARD MODE
REGISTER
EXTENDED MODE
REGISTER
COMMAND
DECODE
CONTROL
LOGIC
○
○
○
○
○
○
○
4,096
256
14
○
○
○
DQ0 -
DQ15
LDQS
UDQS
LDM
UDM
BANK
MEMORY
ARRAY
(4,096 x 256 x 32)
x 4
x 4
x 4
32
32
8 1
2
2
12
12
16
16
2
2
2
2 2
16
16
2
ADDRESS
REGISTER
14
32
32
DRIVER
INPUT BUF.
INPUT BUF.
INPUT BUF.
Dout
DRIVER
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Electrical Specifications
Table 3: ABSOLUTE MAXIMUM RATINGS
NOTE :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condit i on.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
Table 4: DC OPERATING CONDITIONS
Recommended operating conditions (Voltage referenced to VSS = 0V, TA = -25oC~ 85oC for Extended)
NOTE :
1. Under all conditions, VDDQ must be less than or equal to VDD.
2. These parameters should be tested at the pin on actual components and may be checked at either the pin or the pad in simulation.
Table 5: CAPACITANCE (VDD = 1.8V, VDDQ = 1.8V, TA = 25℃, f=1㎒)
Parameter Symbol Value Unit
Voltage on any pin relative to VSS VIN,VOUT -0.5 ~ 2.5 V
Voltage on VDD and VDDQ supply relative to VSS VDD, VDDQ -0.5 ~ 2.5 V
Storage temperature TSTG -55 ~ +150 ℃
Power dissipation PD1.0 W
Short circuit current IOS 50 ㎃
Parameter Symbol Min Typ Max Unit Note
Supply voltage VDD 1.7 1.8 1.95 V 1
VDDQ 1.7 1.8 1.95 V 1
Input logic high voltage VIH 0.8 x VDDQ 1.8 VDDQ + 0.3 V2
Input logic low voltage VIL -0.3 0 0.3 V 2
Output logic high voltage VOH 0.9 x VDDQ --V
IOH = -0.1㎃
Output logic low voltage VOL --
0.1 x VDDQ VIOL = 0.1㎃
Input leakage current ILI -2 - 2 ㎂
Output leakage current ILO -5 - 5 ㎂
Pin Symbol Min Max Unit Note
Input capacitance
(ADD, BA0~1, /RAS, /CAS, /WE, /CS, CKE) CIN1 1.5 3.0 ㎊
Input capacitance(CK, /CK) CIN2 1.5 3.5 ㎊
Data & DQS input/output capacitance Cout 2.0 4.5 ㎊
Input capacitance(DM) CIN3 2.0 4.5 ㎊
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Table 6: DC CHARACTERISTICS
Recommended operating conditions (Voltage referenced to VSS = 0V, TA = -25℃ to 85℃)
Parameter Symbol Test Condition Version Unit
-60 -75 -90
Operating one bank
active-precharge
current IDD0
tRC = tRCmin; tCK = tCKmin; CKE is HIGH; /CS is HIGH
between valid commands; address inputs are SWITCH-
ING; data bus inputs are STABLE 50 40 35 mA
Precharge power-down
standby current IDD2P
all banks idle, CKE is LOW; /CS is HIGH, tCK = tCKmin;
address and control inputs are SWITCHING; data bus
inputs are STABLE 0.3
mA
Precharge power-down
standby current with
clock stop IDD2PS all banks idle, CKE is LOW; /CS is HIGH, CK = LOW,
/CK = HIGH; address and control inputs are SWITCH-
ING; data bus inputs are STABLE 0.3
Precharge non power-
down standby current IDD2N
all banks idle, CKE is HIGH; /CS is HIGH, tCK = tCKmin;
address and control inputs are SWITCHING; data bus
inputs are STABLE 15 12 10
mA
Precharge non power-
down standby current
with clock stop IDD2NS all banks idle, CKE is HIGH; /CS is HIGH, CK = LOW, /
CK = HIGH; address and control inputs are SWITCHING;
data bus inputs are STABLE 666
Active power-down
standby current IDD3P
one bank active, CKE is LOW; /CS is HIGH, tCK =
tCKmin; address and control inputs are SWITCHING; data
bus inputs are STABLE 2
mA
Active power-down
standby current with
clock stop IDD3PS one bank active, CKE is LOW; /CS is HIGH, CK = LOW,
/CK = HIGH; address and control inputs are SWITCH-
ING; data bus inputs are STABLE 2
Active non power-down
standby current IDD3N
one bank active, CKE is HIGH; /CS is HIGH, tCK =
tCKmin; address and control inputs are SWITCHING; data
bus inputs are STABLE 25 20 15 mA
Active non power-down
standby current with
clock stop IDD3NS one bank active, CKE is HIGH; /CS is HIGH, CK = LOW,
/CK = HIGH; address and control inputs are SWITCH-
ING; data bus inputs are STABLE 888mA
Operating burst read
current IDD4R
one bank active; BL=4; CL=3; tCK = tCKmin; continuous
read bursts; Iout = 0 mA; address inputs are SWITCH-
ING; 50% data change each burst transfer 90 80 70 mA
Operating burst write
current IDD4W
one bank active; tCK = tCKmin; continuous write bursts;
address inputs are SWITCHING; 50% data change each
burst transfer 90 80 70 mA
Auto-Refresh current IDD5
tRC = tRFCmin; burst refresh; CKE is HIGH;
address and control inputs are SWITCHING; data bus
inputs are STABLE 90 90 80 mA
Self Refresh Current IDD6
CKE is LOW, CK = LOW, /CK
= HIGH; Extended Mode Reg-
ister set to all 0s; address and
control inputs are STABLE;
data bus inputs are STABLE
TCSR Range 45*185 °C
Full Array 150 200
µA1/2 of Full Array 120 160
1/4 of Full Array 100 140
Deep Power-Down
Current IDD8 Address and Control inputs are STABLE;
data bus inputs are STABLE 10 10 10 µA
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
NOTE :
1. IDD specifications are tested after the device is properly initialized
2. Input slew rate is 1V/ns.
3. Definitions for IDD:
LOW is defined as VIN ≤ 0.1 * VDDQ ;
HIGH is defined as VIN ≥ 0.9 * VDDQ ;
STABLE is defined as inputs st able at a HIGH or LOW level ;
SWITCHING is defined as :
- address and command : inputs changing between HIGH and LOW once per two clock cycles ;
- data bus inputs : DQ changing between HIGH and LOW once per clock cycle ; DM and DQS are STABLE
Table 7: AC OPERATING TEST CONDITIONS
(VDD = 1.7V ~ 1.95V, TA = -25℃ ~85℃ for Extended)
NOTE :
1. Under all conditions, VDDQ must be less than or equal to VDD.
2. These parameters should be tested at the pin on actual components and may be checked at either the pin or the pad in simulation.
3. CK and /CK crossing voltage.
Parameter Value Unit Note
AC input levels(Vih/Vil) 0.8 × VDDQ / 0.2 × VDDQ V
Input timing measurement reference level 0.5 ×VDDQ V
Input rise and fall time 1.0 V/㎱
Output timing measurement reference level 0.5 ×VDDQ V
Vix 0.4 ×VDDQ(Min) / 0.6 ×VDDQ(Max) V3
Output load condition See Figure 2
1.8V
13.9㏀
VOH (DC) = 0.9 × VDDQ, IOH = -0.1㎃
VOL (DC) = 0.1 × VDDQ, IOL = 0.1 ㎃
20㎊
Z0=50Ω
Vtt=0.5 × VDDQ
50Ω
20㎊
Figure 1. DC Output Load Circuit Figure 2. AC Output Load Circuit
Output
Output
10.6㏀
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Table 8: OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)
Parameter Sym-
bol
-60 -75 -90 Unit Note
Min Max Min Max Min Max
DQ output access time from CK//CK tAC 2 5 2.5 6.0 2.5 7.0 ns 3
DQS output access time from CK//CK tDQSCK 2 5 2.5 6.0 2.5 7.0 ns
Clock high-level width tCH 0.45 0.55 0.45 0.55 0.45 0.55 tCK
Clock low-level width tCL 0.45 0.55 0.45 0.55 0.45 0.55 tCK
Clock half period tHP min
(tCL,tCH)min
(tCL,tCH)min
(tCL,tCH)ns
Clock cycle time CL = 3 tCK 6 100 7.5 100 9 100 ns
CL = 2 9 100 12 100 15 100 ns
DQ and DM input setup time tDS 0.6 0.75 1.0 ns 4,5
DQ and DM input hold time tDH 0.6 0.75 1.0 ns 4,5
DQ and DM input pulse width tDIPW 1.8 1.8 2.0 ns
Address and control input setup time tIS 1.1 1.3 1.5 ns 1
Address and control input hold time tIH 1.1 1.3 1.5 ns 1
Address and control input pulse width tIPW 2.6 2.6 3.0 ns
DQ & DQS low-impedance time from CK//CK tLZ 1.0 1.0 1.0 ns
DQ & DQS high-impedance time from CK//CK tHZ 56.07.0
ns
DQS - DQ skew tDQSQ 0.5 0.6 0.7 ns
Data output hold time from DQS tQH tHP-tQHS tHP-tQHS tHP-tQHS ns
Data hold skew factor tQHS 0.65 0.75 1.0 ns
Write command to 1st DQS latching transition tDQSS 0.75 1.25 0.75 1.25 0.75 1.25 tCK
DQS input high-level width tDQSH 0.4 0.6 0.4 0.6 0.4 0.6 tCK
DQS input low-level width tDQSL 0.4 0.6 0.4 0.6 0.4 0.6 tCK
DQS falling edge to CK rising - setup time tDSS 0.2 0.2 0.2 tCK
DQS falling edge from CK rising - hold time tDSH 0.2 0.2 0.2 tCK
MODE REGISTER SET command period tMRD 222t
CK
Write preamble setup time tWPRES 000ns
Write postamble tWPST 0.4 0.6 0.4 0.6 0.4 0.6 tCK
Write preamble tWPRE 0.25 0.25 0.25 tCK
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Note:
Table 9: Input Setup /Hol d Sle w Ra te
1. This derating table is used to increase tIS/tIH in the case where the input slew rate is below 1.0V/ns.
2. Minimum 5CK of tDAL (= tWR + tRP) is required because it need minimum 2CK for tWR and minimum 3CK for tRP.
3. tAC(min) value is measured at the high Vdd(1.95V) and cold temperature(-25°C).
tAC(max) value is measured at the low Vdd(1.7V) and hot temperature(85°C).
tAC is measured in the device with half driver strength and under the AC output load condition (Fig.2 in Page 8).
Parameter Sym-
bol
-60 -75 -90 Unit Note
Min Max Min Max Min Max
Read preamble CL = 2 tRPRE 0.5 1.1 0.5 1.1 0.5 1.1 tCK
CL = 3 0.9 1.1 0.9 1.1 0.9 1.1 tCK
Read postamble tRPST 0.4 0.6 0.4 0.6 0.4 0.6 tCK
ACTIVE to PRECHARGE command period tRAS 42 100,000 45 100,000 54 100,000 ns
ACTIVE to ACTIVE command period tRC 60 67.5 90 ns
AUTO REFRESH to
ACTIVE / AUTO REFRESH command period tRFC 80 80 90 ns 6
ACTIVE to READ or WRITE delay tRCD 22.5 22.5 27 ns
PRECHARGE command period tRP 18 22.5 27 ns
ACTIVE bank A to ACTIVE bank b delay tRRD 12 15 15 ns
Column address to Column address delay tCCD 111
tCK
WRITE recovery time tWR 15 15 15 ns
Auto precharge write recovery + precharge time tDAL tWR+tRP tWR+tRP tWR+tRP 2
Internal write to Read command delay tWTR 111
tCK
Self refresh exit to next valid command delay tXSR 120 120 120 ns
Exit power down to next valid command delay tXP tCK+tIS tCK+tIS tCK+tIS
CKE min. pulse width(high and low pulse width) tCKE 111
tCK
Refresh Period tREF 64 64 64 ms
Input Setup/Hold Slew Rate ∆tIS ∆tIH
(V/ns) (ps) (ps)
1.0 0 0
0.8 +50 +50
0.6 +100 +100
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Table 10: I/O Setup/Hold Slew Rate
4. This derating table is used to increase tDS/tDH in the case where the I/O slew rate is below 1.0V/ns.
Table 11: I/O Delta Rise/Fall Rate(1/slewrate)
5. This derating table is used to increase tDS/tDH in the case where the DQ and DQS slew rates differ. The Delta Rise/Fall Rate is calculated as
1/SlewRate1-1/SlewRate2. For example, if slew rate 1 = 1.0V/ns and slew rate 2 = 0.8V/ns, then the Delta Rise/Fall Rate = -0.25ns/V.
6. Maximum burst refresh cycle : 8
I/O Setup/Hold Slew Rate ∆tDS ∆tDH
(V/ns) (ps) (ps)
1.0 0 0
0.8 +75 +75
0.6 +150 +150
Delta Rise/Fall Rate ∆tDS ∆tDH
(ns/V) (ps) (ps)
000
±0.25 +50 +50
±0.5 +100 +100
12
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Functional Description
The 128Mb Mobile DDR SDRAM is a high-speed CMOS, dynamic random-access memory containing 134,217,728-
bits. It is internally configured as a quad-ba nk DRAM. Each of the 33,554,432-bit banks is organized as 4,096 rows by
512 columns by 16 bits.
The 128Mb Mobile DDR SDRAM uses a double data rate architecture to achieve high-speed operation. The double
data rate architecture is essentially a 2n-prefetch architecture, with an interface designed to transfer two data words
per clock cycle at the I/O balls. single read or write access for the 128Mb Mobile DDR SDRAM consists of a single 2n-
bit wide, one-clock-cycle data transfer at the internal DRAM core and two corresponding n-bit wide, one-half-clock-
cycle data transfers at the I/O balls.
Read and write accesses to the Mobile DDR SDRAM are burst oriented; accesses start at a selected location and con-
tinue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an
ACTIVE command, which is then followed by a READ or WRITE command. The address bits registered coincident
with the ACTIVE command are used to se lect the bank and row to be accessed (BA0, BA1 select the bank; A0-A11
select the row). The address bits registered coincident with the READ or WRITE command are used to select the start-
ing column location for the burst access.
It should be note d that the DLL signal that is typically used on standard DDR devices is not necessary on the Mobile
DDR SDRAM. It has been omitted to save power. Prior to no rmal operation, the Mobile DDR SDRAM must b e initial-
ized. The following sections provide detailed information covering device initialization, register definition, command
descriptions and device operation.
Initialization
Mobile DDR SDRAMs must be powere d up and initialized in a predefi ned mann er. Operational pro cedures other than
those specified may result in undefined op eration. If there is an interruption to the devi ce power, the ini tialization rou-
tine should be followed to ensure proper fu nctionality of the Mobile DDR SDRAM. The clock stop feature is not avail-
able until the device has been properly initi alized.
To properly initialize the Mobile DDR SDRAM, this sequence must be followed:
1. To prevent device latch-up, it is recommended the core power (VDD) and I/O power (VDDQ) be from the same
power source and brought up simultaneously. If separate power sources are used, VDD must lead VDDQ.
2. Once power supply voltages are stable and the CKE has been driven HIGH, it is safe to apply the clock.
3. Once the clock is stable, a 200µs (minimum) delay is required by the Mobile DDR SDRAM prior to applying an exe
cutable command. During this time, NOP or DESELECT commands must be issued on the command bus.
4. Issue a PRECHARGE ALL command.
5. Issue NOP or DESELECT commands for at least tRP time.
6. Issue an AUTO REFRESH command followed by NOP or DESELECT commands for at least tRFC time. Issue a
second AUTO REFRESH command followed by NOP or DESELECT commands for at least tRFC time. As part of
the initialization sequence, two AUTO REFRESH commands must be issued. Typically, both of these com
mands are issued at this stage as described above. Alternately, the second AUTO-REFRESH command and NOP
or DESELECT sequence can be issued between steps 10 and 11.
7. Using the LOAD MODE REGISTER command, load the standard mode register as desired.
8. Issue NOP or DESELECT commands for at least tMRD time.
9. Using the LOAD MODE REGISTER command, load the extended mode register to the desired operating modes.
Note that the sequence in which the standard and extended mode registers are programmed is not critical.
10. Issue NOP or DESELECT commands for at least tMRD time.
11. The Mobile DDR SDRAM has been properly initialized and is ready to receive any va lid command.
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EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Register Definition
Mode Registers
The mode registers are used to define the specific mode of operation of the Mobile DDR SDRAM. There are two mode
registers used to specify the operational characteristi cs of the device. The standard mode registe r, which exists for all
SDRAM devices, and the extended mode register, which exists on all Mobile SDRAM devices.
Standard Mode Register
The standard mode register definition includes the selection of a burst length, a burst type, a CAS latency and an oper-
ating mode, as shown in page 15. The standard mode register is programmed via th e LOAD MODE REGISTER SET
command (with BA0 = 0 and BA1 = 0) and will re tain the stored in formation un til it is programmed again. Reprogra m-
ming the standard mode register will not alter the contents of the memory, provided it is performed correctly. The mode
register must be loaded (reloaded) when all banks are idle and no bursts are in progress, and the controller must wait
the specified time before initiating the subsequent operation. Violating either of these requirements will result in
unspecified operation. Mode register bits A0-A2 specify the burst length, A3 s pecifies the type of burst (sequential or
interleaved), A4-A6 specify the CAS latency, and A7-A11 specify the operating mode.
Note: Standard refe rs to meeting JEDEC-standard mode register definitions.
Burst Length
Read and write accesses to the Mobile DDR SDRAM are burst oriented, with the burst length being programmable, as
shown in page 15. The burst length d etermines the maximum number of column locations that can be accessed for a
given READ or WRITE command. Burst lengths of 2, 4, 8 or 16 are available for both the sequential and the inter-
leaved burst types.
Reserved states should not be used, as unknown operation or incompatibility with future versions may result.
Burst Type
Accesses within a given burst may be programmed to be either sequential or interleaved; this is referred to as the burst
type and is selected by A3. The ordering of acce sses within a burst is determined by the burst length, the burst type
and the starting column address. See Table 17~20 on page 17,18 for more information.
CAS Latency
The CAS latency is the delay, in clock cycles, between the registration of a READ command and th e availabi lity of the
first bit of output data. The latency can be set to 2, 3 or 4 clocks, as shown in page 15.
For CL = 3, if the READ command is registered at clock edge n, then the data will nominally be available at (n + 2
clocks + tAC). For CL = 2, if the READ command is registered at clock edge n, then the data will be nominally be avail-
able at (n + 1 clock + tAC).
Reserved states should not be used as unknown operation or inco mpatibil ity with future versions may result.
Operating Mode
The normal operating mo de is selected by issuing a LOAD MODE REGISTER SET command with bits A7-A11 each
set to zero, and bits A0-A6 set to the desired values. All other combinations of values for A7-A11 are reserved for
future use and/or test modes. Test modes and reserved states should not be used because unknown operation or
incompatibility with future versions may result.
14
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Extended Mode Register
The extended mode register controls functions specific to low power operation. These additional functions include
drive strength, temperature compensated self refresh, and partial array self refresh.
This device has default values for the extended mode register (if not programmed, the device will operate with the
default values . PASR = Full Array, DS = Full Drive).
Temperature Compensated Self Refresh
On this version of the Mobile DDR SDRAM, a temperature sensor is implemented for automatic control of the self
refresh oscillator on the device. Programming of the temperature compensated self refresh (TCSR) bits will have no
effect on the device. The self refresh oscillator will continue refresh at the factory programmed optimal rate for the
device te mp erature.
Partial Array Self Refresh
For further power savings during SELF REFRESH, the PASR feature allows the controller to select the amount of
memory that will be refreshed during SELF REFRESH. Low Power DDR SDRAM supports 3 kinds of PASR in self
refresh mode : Full Array, 1/2 of Full Array and 1/4 of Full Array.
Output Driver Strength
Because the Mobile DDR SDRAM is designed for use in smaller systems that are mostly point to point, an option to
control the drive strength of the output buffers is available. Drive strength should be se lected based on the expected
loading of the memory bus. Bits A5 and A6 of the extended mode reg ister ca n be used to select the driver strength o f
the DQ outputs.
Stopping the External Clock
One method of controlling the power efficiency in applications is to throttle the clock which controls the Mobile DDR
SDRAM. There are two basic ways to control the clock:
1. Change the clock frequency, when the data transfers req uire a different rate of speed.
2. Stopping the clock altogether.
Both of these are specific to the application and its requirements and both allow power savings due to possible less
transitions on the clock path.
The Mobile DDR SDRAM allows the clock to change frequency du ring operation, only i f all the timing parameters are
met with respect to that change and all refresh requirements are satisfied.
The clock can also be stopped all together, if there are no data accesses in progress, either WRITEs or READs that
would be effected by this change; i.e., if a WRITE or a READ is in progress the entire data burst must be through the
pipeline prior to stopping the clock. CKE must be held HIGH with CK = LOW and /CK = HIGH for the full duration of the
clock stop mode. One clock cycle and at least one NOP is required after the clock is restarted before a valid command
can be issued.
It is recommended that the Mobile DDR SDRAM should be in a precharged state if any changes to the clock frequency
are expected. This will eliminate timing violations that may otherwise occur during normal operational accesses.
BA1=0
BA0=0 BA0=1
BA1=0
BA1=0 BA1=0
BA0=0 BA1=1
BA1=1
BA0=0 BA0=1
- Full Array - 1/2 Arr a y - 1/4 Array
BA1=1
BA1=1
BA1=0 BA1=0
BA0=0
BA0=1
BA1=1
BA0=1
BA0=0
BA0=0 BA0=1
BA1=1 BA0=1
Partial Self
Refresh Area
15
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Table 12: MODE REGISTER FIELD TABLE TO PROGRAM MODES
Register Programmed with Normal MRS
NOTE :
1. RFU(Reserved for future use) should stay “0” during MRS cycle.
Table 13: Normal MRS Mode
NOTE :
1. MRS can be issued only at all bank precharge state.
2. Minimum tRP is required to issue MRS command.
Address BA0 ~ BA1 A11 ~ A10/AP A9 A8 A7 A6 A5 A4 A3 A2 A1 A0
Function "0" Setting for
Normal MRS RFU*1 Operating
Mode CAS Latency BT Burst Length
Operating Mode CAS Latency Burst Type Burst Length
A8 A7 Type A6 A5 A4 Latency A3 Type A2 A1 A0 DDR
00Mode Register Set 000Reserved 0Sequential 000Reserved
01 Reserved 001Reserved 1Interleave 001 2
10 Reserved 010 2Mode Select 0 1 0 4
11 Reserved 011 3BA1 BA0 Mode 0 1 1 8
-- -100 4
00
Setting
for Nor-
mal
MRS
100 16
-- -101Reserved 101Reserved
-- -110Reserved 110Reserved
-- -111Reserved 111Reserved
Mode
Register Set Any
Command
*1
tCK
/CK
CK
tRP 2 Clock min.
Command Precharge
All Banks
012345678
*2
Mode Register Set
16
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Table 14: Register Programmed with Extended MRS
NOTE :
1. RFU(Reserved for future use) should stay “0” during MRS and EMRS cycle.
Table 15: EMRS for PASR(Partial Array Self Refresh) & DS(Driver Strength)
Table 16: Internal Temperature Compensated Self Refresh (TCSR)
NOTE :
1. In order to save power consumption, Mobile DDR SDRAM includes the internal temperature sensor and control units to control the
self refresh cycle automatically according to the two temperature range : Max 85℃, Max 45℃
2. If the EMRS for external TCSR is issued by the controller, this EMRS code for TCSR is ignored.
3. It has +/- 5 ℃ tolerance.
Address BA1 BA0 A11 ~ A10/AP A9 A8 A7 A6 A5 A4 A3 A2 A1 A0
Function Mode Select RFU*1 DS RFU*1 PASR
Mode Select Driver Strength PASR
BA1 BA0 MODE A6 A5 Driver
Strength A2 A1 A0 Size of Refreshed Array
00 Normal MRS 00 Full 000 Full Array
01 Reserved 01 1/2 001 1/2 of Full Array
10EMRS for DDR SDRAM 10 1/4 010 1/4 of Full Array
11 Reserved 11 1/8 011 Reserved
100 Reserved
101 Reserved
110 Reserved
111 Reserved
Temperature Range Self Refresh Current (IDD 6) Unit
Full Array 1/2 of Full Array 1/4 of Full Array
Max 85℃200 160 140
㎂
Max 45℃150 120 100
17
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
BURST SEQUENCE
Table 17: BURST LENGTH = 2
Table 18: BURST LENGTH = 4
Table 19: BURST LENGTH = 8
Initial Address Sequential Interleave
A0
00101
11010
Initial Address Sequential Interleave
A1 A0
0001230123
0112301032
1023012301
1130123210
Initial Address Sequential Interleave
A2 A1 A0
0000123456701234567
0011234567010325476
0102345670123016745
0113456701232107654
1004567012345670123
1015670123454761032
1106701234567452301
1117012345676543210
18
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Table 20: BURST LENGTH = 16
Initial Address Sequential Interleave
A3 A2 A1 A0
0 0 0 001234567891011121314150123456789101112131415
0 0 0 112345678910111213141501032547698111013121514
0 0 1 023456789101112131415012301674510118914151213
0 0 1 134567891011121314150123210765411109815141312
0 1 0 045678910111213141501234567012312131415891011
0 1 0 156789101112131415012345476103213121514981110
0 1 1 067891011121314150123456745230114151213101189
0 1 1 178910111213141501234567654321015141312111098
1 0 0 089101112131415012345678910111213141501234567
1 0 0 191011121314150123456789811101312151410325476
1 0 1 010111213141501234567891011891415121323016745
1 0 1 111121314150123456789101110981514131232107654
1 1 0 012131415012345678910111213141589101145670123
1 1 0 113141501234567891011121312151498111054761032
1 1 1 014150123456789101112131415121310118967452301
1 1 1 115012345678910111213141514131211109876543210
19
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Commands
DESELECT
The DESELECT function (/CS HIGH) prevents new commands from being executed by the Mobile DDR SDRAM. The
Mobile DDR SDRAM is effectively deselected. Operations already in progress are not affected.
NO OPERATION (NOP)
The NO OPERATION (NOP) command is used to instruct the selecte d DDR SDRAM to perform a NOP (/CS = LOW, /
RAS = /CAS = /WE = HIGH). This prevents unwanted commands from being registered during idle or wait states.
Operations already in progress are not affected.
LOAD MODE REGISTER
The mode register is loaded via inputs A0-A11, BA0, BA1. The LOAD MODE REGISTER and LOAD EXTENDED
MODE REGISTER commands can only be issued when all banks are idle, and a subsequent executable command
cannot be issued until tMRD is met.
The values of the mode register and extended mode register will be retained even when exiting deep power-down.
ACTIVE
The ACTIVE command is u sed to open (or activate) a row in a particular bank for a su bsequent a cce ss. The val ue on
the BA0, BA1 inputs selects the bank, and the address provided on inputs A0-A11 selects the row. This row remains
active (or open) for accesses until a PRECHARGE command is issued to that bank. A PRECHARGE command must
be issued before opening a different row in the same bank.
READ
The READ command is used to initiate a burst read access to an active row . The value on the BA0, BA1 inputs selects
the bank, and the address provided on inputs A0-A8 selects the starting column location. The value on input A10
determines whether or not auto precharg e is used. If auto precharge is sele cted, the row being accessed will be pre-
charged at the end of the READ burst; if auto precharge is not selected, the row will remain open for subsequent
accesses.
WRITE
The WRITE command is used to initiate a burst write access to an active row. The value on the BA0, BA1 inputs
selects the bank, and the address provided o n inputs A0-A8 selects the starting column location. The value on i nput
A10 determines wheth er or not auto precharge is used. If auto precha rge is selected, the row being accessed will be
precharged at the end of the WRITE burst; if auto precharge is not selected, the row will remain ope n for subsequent
accesses. Input da ta app earing on the DQ s is written to the memory array subject to the DM input logic level appearing
coincident with the data. If a given DM signal is registe red LOW, the corresponding data will be written to memory; if
the DM signal is registered HIGH, the correspondi ng data inputs will be ignored, a nd a WRITE w ill not be executed to
that byte/column location.
PRECHARGE
The PRECHARGE command is used to deactivate the open row in a particular bank or the open row in all banks. The
bank(s) will be available for a subsequent row access a specified time (tRP) after the precharge command is issued .
Except in the case of concurrent auto precharge, where a READ or WRITE command to a different bank is allowed as
long as it does not interrupt the data transfer in the current bank and does not violate any other timing parameters.
Input A10 determines whether one or all banks are to be precharged, and in the case where only one bank is to be pre-
charged, inputs BA0, BA1 select the bank. Otherwise BA0, BA1 are treated as “Don’t Care”. Once a bank has been
precharged, it is in the idl e state and must be activated p rior to any READ or WRITE commands being issued to that
bank. A PRECHARGE command will be treated as a NOP if there is no open row in that bank (idle state), or if the pre-
viously open row is already in the process of precharging.
20
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
AUTO PRECHARGE
AUTO PRECHARGE is a feature which performs the same individual-bank precharge function described above, but
without requiring an explicit command. This is accomplished by using A10 to enable auto precharge in conjunction with
a specific READ or WRITE command. A precharge of the bank/row that is addressed with the READ or WRITE com-
mand is automatically performed upon completion of the READ or WRITE burst. Auto precharge is nonpersistent in
that it is either enabled or disabled for each individual READ or WRITE command. This device supports concurrent
auto precharge if the command to the other bank does not interrupt the data transfe r to the current bank.
AUTO PRECHARGE ensures that the precharge is initiated at the earliest valid stage within a burst. This “earliest valid
stage” is determined as if an explicit PRECHARGE command was issued at the earliest possible time, without violating
tRAS (MIN), as described for each burst type in “Operations”. The user must not issue another command to the same
bank until the precharge time (tRP ) is completed.
BURST TERMINATE
The BURST TERMINATE command is used to truncate READ bursts (with auto precharge disabled). The most
recently registered READ command prior to the BURST TERMINATE command will be trunca ted, as shown i n “Oper-
ations”. The open page which the READ burst was terminated from remains open.
AUTO REFRESH
AUTO REFRESH is used during normal operation of the Mobile DDR SDRAM and is analogous to CAS-BEFORE-
RAS (CBR) REFRESH in FPM/EDO DRAMs. This command is nonpersistent, so it must be issued each time a refresh
is required.
The addressing is generated by the internal refresh controller. This makes the address bits a “Don’t Care” during an
AUTO REFRESH command. The 128Mb Mobile DDR SDRAM requires AUTO REFRESH cycles at an average inter-
val of 15.625µs (maximum).
To allow for improved efficiency in scheduling and switching between tasks, some flexibility in the absolute refresh
interval is provided. Although not a JEDEC requirement, to provide for future functionality features, CKE must be
active (HIGH) during the a uto refresh pe riod. The auto re fresh period be gins whe n the AUTO REFRESH command is
registered and ends tRFC later.
PRE
/CK
CK
Command
CKE = High
Auto
Refresh CMD
tRP tRFC
Auto Refresh
21
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
SELF REFRESH
The SELF REFRESH command can be used to retain data in the Mobile DDR SDRAM, even if the rest of the system
is powered down. When in the self refresh mode, the Mobile DDR SDRAM retains data without external clocking. The
SELF REFRESH command is initiated like an AUTO REFRESH command except CKE is disabled (LOW). All com-
mand and address input signals except CKE are “Don’t Care” during SELF REFRESH.
During SELF REFRESH, the device is refreshed as identified in the external mode register (see PASR setting). For
the full array refresh, all four banks are refreshed simultaneously with the refresh frequency set by an internal self
refresh oscillator . This oscillator changes due to the temperature sensor’s input. As the case temperature of the Mobile
DDR SDRAM increases, the oscillation frequency wi ll change to accommodate the chang e of temperature. Th is hap-
pens because the DRAM capacitors lose charge faster at higher temperatures. To ensure efficient power dissipation
during self refresh, the oscillator will change to refresh at the slowest rate possible to maintain the devices data.
The procedure for exiting SELF REF RESH requires a sequence of command s. First, CK must be stable prior to CKE
going back HIGH. Once CKE is HIGH, the Mobile DDR SDRAM must have NOP commands issued for tXSR is
required for the completion of any internal refresh in progress.
DEEP POWER-DOWN
The operating mode deep power-down achieves maximum power reduction by eliminating the power of the whole
memory array of the device. Array data will not be retained once the device enters deep power-down mode.
This mode is entered by having all banks idle then /CS and /WE held LOW with /RAS and /CAS held HIGH at the rising
edge of the clock, while CKE is LOW. This mode is exited by asserting CKE HIGH.
Self
/CK
CK
Command
CKE = High
CMD
tXSR
Active
Refresh
Self Refresh
tIS
22
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Operations
Bank/Row Activation
The Bank Activation command is issued by holding /CAS and /WE high with /CS and /RAS low at the rising edge of the
clock(CK). The DDR SDRAM has four independent banks, so two bank select addresses(BA0, BA1) are required. The
Bank Activation command must be applied before any READ or WRITE operation is executed. The delay from the
Bank Activation command to the first READ or WRITE command must meet or exceed the minimum of RAS to CAS
delay time(tRCD min). Once a bank has been activated, it must be precharge d before another Bank Activation com-
mand can be applied to the same bank. The minimum time interval between interleaved Bank Activation com-
mands(Bank A to Bank B and vice versa) is the Bank to Bank delay time(tRRD min).
Bank Activation Command Cycle
/CK
CK
Address
Command
012Tn Tn+1 Tn+2
Bank B
Row Addr. Bank A
Row. Addr.
3
Bank A
Row Address Bank A
Col. Addr.
Bank A
Activate NOP NOP Write
with Auto
Precharge
Bank B
Activate NOP Bank A
Activate
Row Cycle Time(tRC) : Don't care
RAS - CAS delay(tRCD)RAS - RAS delay time(tRRD)
23
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
READs
READ bursts are initiated with a READ command.
The starting column and bank addresses are provided w ith the READ comma nd a nd au to precharg e is either e nabl ed
or disabled for that burst access. If auto precharge is enabled, the row being accessed is precharged at the completion
of the burst. For the READ commands used in the following illustrations, auto precharge is disabled.
During READ bursts, the valid data-out element from the starting column address w ill be available following the CAS
latency after the READ command. Each subsequent data-out element will be valid nominally at the next positive or
negative clock edge (i.e., at the next crossing of CK and /CK). DQS is drive n by the Mobile DDR SDRAM along with
output data. The initial LOW state on DQS is known as the read preamble; the LOW state coincident with the last data-
out element is known as the read postamble.
Upon completion of a burst, assuming no other commands have been initiated, the DQs will go High-Z.
Data from any READ burst may be concatenated with or truncated with data from a subsequent READ command. In
either case, a continuous flo w of data can be maintained. The first data element from the new burst follows either the
last element of a completed burst or the last desired da ta element of a longer burst which is being truncated. The new
READ command should be issued x cycles after the first READ command, where x equals the number of desired data
element pairs (pairs are required by the 2n-prefetch architecture).
A READ command can be initiated on any clock cycle following a previous READ command.
/CK
CK
013456782
Command
DQS
DQ’s
DQS
DQ’s
READ NOP NOP NOP NOP NOP NOP NOP NOP
Dout 0 Dout 1 Dout 2 Dout 3
Dout 0 Dout 1 Dout 2 Dout 3
tRPRE tRPST
CL2
CL3
Burst Read Operation < Burst Length=4, CAS Latency=2, 3) >
tRPRE
24
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Truncated READs
Data from any READ burst may be truncated with a BURST TERMINA TE command. The BURST TERMINATE latency
is equal to the READ (CAS) latency, i.e., the BURST TERMINATE command should be issued x cycles after the READ
command, where x equal s the number of desired data element pairs (pairs are required by the 2n-prefetch architec-
ture).
Data from any READ burst must be completed or truncated before a subseque nt WRITE command can be issued. If
truncation is necessary, the BU RST TERMINATE command must be used.
A READ burst may be followed by, or truncated wi th, a PRECHARGE comma nd to the same bank provided that auto
precharge was not activated. The PRECHARGE command should be issued x cycles after the READ command,
where x equals th e number of desired d ata element pairs (pairs are required by the 2n-prefetch architecture). Follow-
ing the PRECHARGE command, a subsequent command to the same bank cannot be issued until tRP is met.
Note: Part of the row precharge time is hidden during the access of the last data elements.
Read Interrupted by a Read < Burst Length=4, CAS Latency = 2 >
/CK
CK
013456782
Command
DQS
DQ’s
READ A READ B NOP NOP NOP NOP NOP NOP NOP
Dout a0
CL2
Dout a1Dout b0 Dout b1 Dout b2Dout b3
Read Interrupted by a Write & Burst Stop < Burst Length=4, CAS Latency = 2 >
/CK
CK
013456782
Command
DQS
DQ’s
READ Burst Stop NOP WRITE NOP NOP NOP NOP NOP
Dout 0
CL2
Dout 1 Din 0 Din 1 Din 2 Din 3
Read Interrupted by a Precharge < Burst Length=8, CAS Latency = 2 >
/CK
CK
013456782
Command
DQS
DQ’s
READ Precharge NOP NOP NOP NOP NOP NOP NOP
Dout 0
CL2
Dout 1 Dout 4 Dout 5 Dout 6 Dout 7
Dout 2 Dout 3
Interrupted by precharge
1tCK
25
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
WRITEs
WRITE bursts are initiated with a WRITE command. The starting column and bank addresses are provided with the
WRITE command, and auto precharge is either enab led or disabled for that access. If auto precharge i s enabled, the
row being accessed is precharged at the completion of the burst. For the WRITE commands used in the following illus-
trations, auto precharg e is disabled . During WRITE bursts, th e first valid da ta-in element will be registered on the first
rising edge of DQS following the WRITE command, and subsequent data elements will be registered on successive
edges of DQS. The LOW state on DQS between the WRITE command and the first rising edge is kn own as the write
preamble; the LOW state on DQS following the last data-in element is known as the write postamble.
The time between the WRITE command and the first corresponding rising edge of DQS (tDQSS) is specified with a rel-
atively wide range (from 75 percent to 125 percent of one clock cycle). Upon completion of a burst, assuming no other
commands have been initiated, the DQs will remain High-Z and an y additional input data will be ignored.
Data for any WRITE burst may be concatenated with or truncated with a subsequent WRITE command. In either case,
a continuous flow of input data can be maintained. The n ew WRITE command can be issued on any posi tive edge of
clock following the previous WRITE command. The first data element from the new burst is applied after either the last
element of a completed burst or the last desired data element of a longer burst which is being truncated. The new
WRITE command should be issued x cycles after the first WRITE command, where x equals the number of desired
data element pairs (pairs are required by the 2n-prefetch architecture).
Burst Write Operation < Burst Length=4 >
/CK
CK
013456782
Command
DQS
DQ’s
NOP WRITE A NOP WRITE B NOP NOP NOP NOP NOP
Din a0 Din a1 Din a2 Din a3 Din b0 Din b1 Din b2 Din b3
tDQSSmax
tWPREStDSH
tDSS
26
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Write Interr upted by a Write < Burst Length=4 >
/CK
CK
013456782
Command
DQS
DQ’s
NOP WRITE A NOP
WRITE B NOP NOP NOP NOP NOP
Din a0 Din a1 Din b0 Din b1 Din b2 Din b3
1tCK
Writ e Interrupted by a Read & DM < Burst Length=8, CAS Latency =2 >
/CK
CK
013456782
Command
DQS
DQ’s
NOP WRITE NOP
NOP NOP READ NOP NOP NOP
Din 0
Din 1 Din 2 Din 3 Din 4 Din 5
DQS
DQ’s
Din 0 Din 1 Din 2
Din 3 Din 4 Din 5
DM
DM
Din 6 Din 7 Dout 0 Dout 1 Dout 2 Dout 3
tWTR
tWTR
tDQSSmax
tWPRES
tDQSSmin
tWPRE
Din 6 Din 7 Dout 1Dout 0 Dout 2 Dout 3
CL2
CL2
tWPRES
tDSS
tDSS
tWPRE
27
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
NOP WRITE A NOP NOP NOP NOP Precharge A WRITE B NOP
Write Interrupted by a Precharge & DM < Burst Length = 8 >
01234
5 6 7 8
Din a0 Din a1 Din a2 Din a3 Din b0
Din a0 Din a1 Din a2 Din a3 Din b0 Din b1
tDQSSmax
tDQSSmin
/CK
CK
Command
DQS
DQ’s
DM
DQS
DQ’s
DM
tWR
Din a4 Din a5 Din a6 Din a7
Din a4 Din a5 Din a6 Din a7
tDQSSmax
Din
b
tDQSSmin
Din
b
READ Burst Stop NOP NOP NOP NOP NOP NOP NOP
Burst Stop < Burst Length = 4, CAS Latency = 2, 3 >
012345 6 7 8
Dout0 Dout1
Dout0 Dout1
CL = 3
/CK
CK
Command
DQS
DQ’s
DQS
DQ’s
The burst ends after a delay equal to the CAS latency.
CL = 2
WRITE NOP NOP NOP NOP NOP NOP NOP NOP
DM Masking < Burst Length = 8 >
012345 6 7 8
tDQSS
/CK
CK
Command
DQS
DQ’s
DM
Din 4 Din 5 Din 6 Din 7
Din 0 Din 1 Din 2 Din 3
tDS tDH
Masked by DM = H
28
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
PRECHARGE
The PRECHARGE command is used to deactivate the open row in a particular bank or the open row in all banks. The
bank(s) will be available for a sub sequent row access some specified time (tR P) after the PRECHARGE command is
issued. Input A10 determin es whether one or all banks are to be precharged, a nd in the case where only one bank is
to be precharged, inputs BA0, BA1 select the bank. When all banks are to be precharged, inputs BA0, BA1 are treated
as Don’t Care. Once a bank has been precharged, it is in the idle state and must be activated prior to any READ or
WRITE commands being issued to that bank.
BANK A
NOP NOP NOP NOP NOP NOP NOP
Read with Auto Precharge < Burst Length = 4, CAS Latency = 2, 3 >
012345 6 7 8
CL = 2
/CK
CK
Command
DQS
DQ’s Dout0 Dout1 Dout2 Dout3
ACTIVE READ
Auto Precharge
9
NOP
DQS
DQ’s Dout0 Dout1 Dout2 Dout3
CL = 3
tRAS(min.)
t
RP
Begin Auto-Precharge
BANK A NOP NOP NOP NOP NOP NOP NOP
Write with Auto Precharge < Burst Length = 4 >
012345 6 7 8
/CK
CK
Command
DQS
DQ’s Din 0 Din 1 Din 2 Din 3
ACTIVE WRITE
Auto Precharge
9
NOP
tWR
Bank can be reactivated at
completion of tRP
10
NOP
tRP
tDAL
Internal precharge start
11
NOP
29
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
POWER-DOWN
Power-down is entered when CKE is registered LOW. If power-down occurs when all banks are idle, this mode is
referred to as precharge power-down; if power-down occurs when there is a row active in any bank, this mode is
referred to as active power-down. Entering power-down deactivates the input and output buffers, including CK and /
CK. Exiting power-down requires the device to be at the same voltage as when it entered power-down and a stable
clock.
Note: The power-down duration is limited by the refresh requirements of the device.
While in power-down, CKE LOW must be maintained at the inputs of the Mobile DDR SDRAM, while all other input sig-
nals are Don’t Care. The power-down state is synchronously exited when CKE is registered HIGH (in conjunction with
a NOP or DESELECT command). NOPs or DESELECT commands must be maintained on the command bus until tXP
is satisfied.
/CK
CK
Command
CKE = High tIS
Active
Precharge Precharge
power
down
Entry
Active
power
down
Entry Read
Active
power
down
Exit
tXP
Power down
30
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Table 21: SIMPLIFIED TRUTH TABLE
(V=Valid, X =Don't care, H=Logic High, L=Logic Low)
NOTE :
1. OP Code : Operand Code
A0 ~ A11 & BA0 ~ BA1 : Program keys. (@EMRS/MRS)
2. EMRS/MRS can be issued only at all banks precharge state.
A new command can be issued 2 CLK cycles after EMRS or MRS.
3. Auto refresh functions are the same as CBR refresh of DRAM.
Auto/self refresh can be issued only at all banks precharge state.
4. BA0 ~BA1 : Bank select addresses.
5. If A10/AP is “High” at row precharge, BA0 and BA1 are ignored and all banks are selected.
6. During burst write with auto precharge, new read/write command can not be issued.
Another bank read/write command can be issued after the end of burst.
New row active of the associated bank can be issued at tRP after the end of burst.
7. Burst stop command is valid at every burst length.
8. DM sampled at the rising and falling edges of the DQS and Data-in are masked at the both edges(Write DM l atency is 0).
9. This combination is not defined for any funct ion, which means “No Operation(NOP)” in DDR SDRAM.
10. The Deep Power Down Mode is exited by asserting CKE high and full initialization is required after exiting Deep Power Down Mode.
COMMAND CKEn-1 CKEn /CS /RAS /CAS /WE BA0,1 A10/AP A11,
A9 ~ A0 Note
Register Mode Register Set H X L L L L OP CODE 1, 2
Refresh
Auto Refresh HHLL LH X 3
Self
Refresh
Entry L 3
Exit L H LH HH X3
HX XX 3
Bank Active & Row Addr. H X L L H H V Row Address
Read &
Column
Address
Auto Precharge Disable HXLHLHV LColumn
Address
(A0~A8)
4
Auto Precharge Enable H4
Write &
Column
Address
Auto Precharge Disable HXLHLLV LColumn
Address
(A0~A8)
4
Auto Precharge Enable H4, 6
Burst Stop H X L H H L X 7
Precharge Bank Selection HXLLHL
VL X
All Banks XH 5
Active Power Down
Entry H L HX XX X
LH HH
Exit L H HX XX
LH HH
Precharge
Power Down
Entry H L HX XX
X
LH HH
Exit L H HX XX
LH HH
Deep Power Down Entry H L L H H L X
Exit L H H X X X 10
DM H X X 8
No Operation Command(NOP) H X HX XX X9
LH HH 9
31
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Timing Diagrams
Basic Timing (Setup, Hold and Access Time @ BL=4, CL=2)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
ACTIVE READ WRITE
BAbBAaBAa
Ra Ca Cb
Qa0 Qa1 Qa2 Qa3 Db0 Db1 Db2 Db3
tCH tCL
tCK
tIS tIH
tDStDHtDStDH
tDQSS tDSC
tDQSH
tDQSL
tRPST tWPRE
tRPRE Hi-Z
Hi-Z
DQS
DQ
Q0 Q1 Q2 Q3
tRPRE
tDQSQ tQHS tRPST DQS
DQ
D0 D1 D2 D3
tWPRE tWPST
tDS tDH
tDSC
READ Operation WRITE Operation
DISABLE AUTO PRECHARGE DISABLE AUTO PRECHARGE
Ra
(A0-A9,A11)
: Don’t care
32
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Multi Bank Interleaving READ (@ BL=4, CL=2)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
ACTIVE READ
Qa0 Qa1 Qa2 Qa3 Qb0 Qb1 Qb2 Qb3
tCH tCL
tCK
ACTIVE READ
BAa
Ra
BAb BAa BAb
Rb Ca Cb
DISABLE A UTO PRECHARGE DISABLE AUTO PRECHARGE
Ra Rb
(A0-A9,A11)
33
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Multi Bank Interleaving WRITE (@ BL=4)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
ACTIVE WRITE
Da0 Da1 Da2 Da3 Db0 Db1 Db2 Db3
tCH tCL
tCK
ACTIVE WRITE
BAa
Ra
BAb BAa BAb
Rb Ca Cb
tRCD
DISABLE AUTO PRECHARGE DISABLE AUTO PRECHARGE
Ra Rb
(A0-A9,A11)
34
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
READ with Auto Precharge (@ BL=8, CL=2)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
READ
Qa0 Qa1 Qa2 Qa3 Qa4 Qa5 Qa6 Qa7
tCH tCL
tCK
ACTIVE
BAa
Ca
BAa
Ra
tRP
Auto Precharge start(Not e 1)
Note 1 The row active command of the precharged bank can be issued after tRP fr om this point
The new read/write command of another activated bank can be issued from this point
At burst read/write with auto precharge, CAS interrupt of the same is illegal
ENABLE AUTO PRECHARGE
Ra
(A0-A9,A11)
35
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
WRITE with Auto Precharge (@ BL=8)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
WRITE
tCH tCL
tCK
ACTIVE
BAa
Ca
BAa
Ra
Auto Precharge start(Not e 1)
Da0 Da1 Da2 Da3 Da4 Da5 Da6 Da7
tRP
tWR
tDAL
Note 1 The row active command of the precharged bank can be issued after tRP from this point
The new read/write command of another activated bank can be issued from this point
At burst read/write with auto precharge, CAS interrupt of the same bank/ another bank is illegal
ENABLE AUTO PRECHARGE
Ra
(A0-A9,A11)
36
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
WRITE followed by Precharge (@ BL=4)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
WRITE
tCH tCL
tCK
PRE
BAa
Ca
BAa
Da0 Da1 Da2 Da3
tWR
CHARGE
SINGLE BANKDISABLE AUTO PRECHARGE
(A0-A9,A11)
37
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
WRITE Interrupted by Precharge & DM (@ BL=8)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
WRITE
tCH tCL
tCK
Ca Cc
Da0 Da1 Da2 Da3 Da4 Da5 Da6 Da7
Cb
BAa BAcBAbBAa
PRE
CHARGE WRITE WRITE
tCCD
Db0 Db1 Dc0 Dc1 Dc2 Dc3 Dc4 Dc5
DISABLE AUTO PRECHARGE SINGLE BANK DISABLE AUTO PRECHARGE
(A0-A9,A11)
38
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
WRITE Interrupted by a READ (@ BL=8, CL=2)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
READ
Qb0 Qb1 Qb2 Qb3 Qb4 Qb5 Qb6 Qb7
tCH tCL
tCK
WRITE
Ca Cb
BAa BAb
tWTR
Da0 Da1 Da2 Da3 Da4 Da5
DISABLE A UTO PRECHARGE DISABLE AUTO PRECHARGE
(A0-A9,A11)
39
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
READ Interrupted by Precharge (@ BL=8, CL=2)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
READ
Qa0 Qa1 Qa2 Qa3 Qa4 Qa5
tCH tCL
tCK
BAa
Ca
PRE
CHARGE
2 tCK valid
When a burst Read command is issued to a DDR SDRAM, a Prechcrge command may be issued to the same bank before the Read burst is
complete. The following f unctiona lity determin es when a Pre charge command may be given duri ng a Rea d burst and when a new Ban k Activate
command may be issued to the same bank.
1. For the earliest possible Precharge command without interrupting a Read burst, the Precharge command may be given on the rising clock
edge which is CL clock cycles before the end of the Read burst where CL is the CAS Latency. A new Bank Activate command may be issued
to the same bank after tRP.
2. When a Precharge command interrupts a Read burst operation, the Precharge command may be given on the rising clock edge which is CL
clock cycles before the last data from the interrupted Read burst where CL is the CAS Lat ency. Once the last data word has been output, the
output buffers are tristated. A new Bank Activate command may be issued to the same bank after tRP.
DISABLE AUTO PRECHARGE
ALL BANK
(A0-A9,A11)
BAa
40
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
READ Interrupted by a WRITE & Burst Stop (@ BL=8, CL=2)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
READ
Qa0 Qa1
tCH tCL
tCK
BAa BAb
Burst
stop
Ca Cb
WRITE
Db0 Db1 Db2 Db3 Db4 Db5 Db6 Db7
DISABLE AUTO PRECHARGE DISABLE AUTO PRECHARGE
(A0-A9,A11)
41
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
READ Interrupted by READ (@ BL=8, CL=2)
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
HIGH
READ
Qa0 Qa1 Qb0 Qb1 Qb2 Qb3 Qb4 Qb5
tCH tCL
tCK
BAa BAb
Ca Cb
Qb6 Qb7
READ
tCCD
DISABLE AUTO PRECHARGE
(A0-A9,A11)
42
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
DM Function (@BL=8) only for write
0 1 2 3 4 5 6 7 8 9 10
HIGH
WRITE
BAa
Ca
Da0 Da1 Da2 Da3 Da4 Da5 Da6 Da7
tCH tCL
tCK
DISABLE AUTO PRECHARGE
(A0-A9,A11)
CK
/CK
CKE
/CS
/RAS
/CAS
BA0,BA1
A10/AP
ADDR
/WE
DQS
DQ
DM
COMMAND
43
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Power up & Initialization Sequence
CK
/CK
CKE
VDD
DQS
DQ
DM
LVCMOS HIGH LEVEL
VDDQ
COMMAND
A0-A9,
A11
NOP PRE AR AR MRS EMRS ACT NOP3NOP
CODE CODE RA
A10
CODE CODE RA
BA0, BA1 BA0=L BA
BA1=L BA0=H
BA1=L
High-Z
High-Z
tCH tCL
tCK
tIS tIH
tIS tIH
tIS tIH
tIS tIH
T=200us
Power-up:
VDD and CK stable
tRP4tRFC4tRFC4tMRD4
Extended
Mode
Register
Load
Mode
Register
Notes: 1. PRE = PRECHARGE command, MRS = LOAD MODE REGISTER c ommand, AR = AUTO REFRESH comma nd
ACT = ACTIVE command, RA = Row address, BA = Bank address
2. NOP or DESELECT commands are required for at least 200us.
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
~
tMRD4
3. Other valid commands are possible.
4. NOPs or DESELECTs are required during this time.
NOP2
44
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
Mode Register Set
0 1 2 3 4 5 6 7 8 9 10
CK
/CK
CKE
/CS
/RAS
/CAS
/WE
BA0, BA1
A10/AP
ADDR
DM
DQ
DQS
HIGH
tCH tCL
tCK
2 Clock min.
High-Z
High-Z
High-Z
tRP
Precharge
Command
All Bank Mode Register Set
Command
Any Command
(A0-A9,A11)
Note 1 Power & Clock must be stable for 200us before precharge all banks
45
EMD28164PA
128M: 8M x 16 Mobile DDR SDRAM
Rev 1.0
EM X XX XX X X X - XX X X X
1. EMLSI Memory
2. Device Type
3. Density
5. Bank
6. Interface ( VDD,VDDQ )
8. Package
9. Speed
1. Memory Component
2. Device Type
8 ------------------------ Low Power SDRAM
9 ------------------------ SDRAM
D ------------------------ Mobile DDR
3. Density
32 ----------------------- 32M
64 ----------------------- 64M
28 ----------------------- 128M
56 ----------------------- 256M
12 ----------------------- 512M
1G ----------------------- 1G
4. Organization
04 ---------------------- x4 bit
08 ---------------------- x8 bit
16 ---------------------- x16 bit
32 ---------------------- x32 bit
5. Bank
2 ----------------------- 2 Bank
4 ----------------------- 4 Bank
6. Interface ( VDD,VDDQ )
V ------------------------- LVTTL ( 3.3V,3.3V )
H------------------------- LVTTL ( 3.3V,2.5V )
K ------------------------- LVTTL ( 3.0V,3.0V )
X ------------------------- LVTTL ( 3.0V,2.5V )
U ------------------------- P-LVTTL ( 3.0V,1.8V )
S ------------------------- LVCMOS ( 2.5V,2.5V )
R ------------------------- LVCMOS ( 2.5V,1.8V )
P ------------------------- LVCMOS ( 1.8V,1.8V )
7. Version
Blank ----------------- 1st generation
A ------------------------2nd generation
B ----------------------- 3rd generation
C ----------------------- 4th generation
D ----------------------- 5th generation
8. Package
Blank ----------------- KGD
U ------------------------44 TSOP2
P ----------------------- 48 FpBGA
Z ----------------------- 52 FpBGA
Y ----------------------- 54 FpBGA
V ----------------------- 90 FpBGA
9. Speed
60 ---------------------- 6.0ns (166MHz CL=3)
70 ---------------------- 7.0ns (143MHz CL=3)
75 ---------------------- 7.5ns (133MHz CL=3)
7C ---------------------- 7.5ns (133MHz CL=2)
80 ---------------------- 8.0ns (125MHz CL=3)
8C ---------------------- 8.0ns (125MHz CL=2)
90 ---------------------- 9.0ns (111MHz CL=3)
10 ---------------------- 10.0ns (100MHz CL=3)
1C ---------------------- 10.0ns (100MHz CL=2)
12 ---------------------- 12.0ns (83MHz CL=2)
1L ---------------------- 25.0ns (40MHz CL=1)
10. Power
U ---------------------- Low Low Power
L ---------------------- Low Power
S ---------------------- Standard Power
11. Temperature
C ---------------------- Commercial ( 0’C ~ 70’C )
E ---------------------- Extended (-25’C ~ 85’C )
I ---------------------- Industrial (-40’C ~ 85’C )
4. Organization
10. Power
SDRAM FUNCTION GUIDE
7. Version
11. Temperature
